CN113219060A - Analysis method of counting type ultrasonic flaw detection measurement system - Google Patents
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- 238000005259 measurement Methods 0.000 title claims abstract description 24
- 238000004458 analytical method Methods 0.000 title claims abstract description 17
- 238000011156 evaluation Methods 0.000 claims abstract description 12
- 230000007547 defect Effects 0.000 claims description 42
- 238000012360 testing method Methods 0.000 claims description 38
- 239000000523 sample Substances 0.000 claims description 32
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
- G01N29/4409—Processing the detected response signal, e.g. electronic circuits specially adapted therefor by comparison
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Abstract
The invention provides an analysis method of a counting type ultrasonic flaw detection measurement system, relates to an analysis method of a measurement system, particularly relates to an analysis method of a counting type ultrasonic flaw detection measurement system, and belongs to the field of ultrasonic flaw detection. Firstly, carrying out flaw detection on a sample by using an ultrasonic flaw detector, recording a detection result, and taking the detection result as a reference value; secondly, a plurality of testers respectively detect the samples, record the detection result of each sample of each worker, and count and analyze the detection results; and finally, calculating the self-evaluation consistency of the testers according to the detection result, the consistency among the testers and the consistency between the testers and the reference value. The technical problems that the consistency, the difference and the accuracy of a measuring system can not be quantified in the prior art are solved, gap points can be quickly and visually found, the measuring system is promoted to be quickly improved, and the accuracy of the measuring system is improved.
Description
Technical Field
The application relates to a measuring system analysis method, in particular to a counting type ultrasonic flaw detection measuring system analysis method, and belongs to the field of ultrasonic flaw detection.
Background
In the ultrasonic flaw detection process, an ultrasonic measurement system is formed by a flaw detector and an ultrasonic flaw detector, and how to judge the consistency, the difference and the accuracy of the quantitative measurement system is in the absence of a method and a judgment standard. Therefore, there is a need for a test method to assess measurement system consistency, including test consistency between triakers, consistency between triakers and standard values, and to quantify them.
Disclosure of Invention
In order to solve the technical problems that the consistency, the difference and the accuracy of a measuring system can not be quantified in the prior art, the invention provides a counting type ultrasonic flaw detection measuring system analysis method, which can evaluate the consistency of the ultrasonic measuring system according to a Kappa value, wherein the consistency comprises the consistency of the sizes of detected defects among flaw detectors, the consistency of the sizes of the detected defects of the flaw detectors and the consistency between the flaw detectors and a reference.
A method for analyzing a counting type ultrasonic flaw detection measuring system comprises the following steps:
s1, carrying out flaw detection on a sample by using an ultrasonic flaw detector, recording a detection result, and taking the detection result as a reference value;
s2, detecting the samples by a plurality of testers respectively, recording the detection result of each sample of each tester, and counting and analyzing the detection results;
and S3, calculating the self-evaluation consistency of the testers according to the detection result of the step S2, and calculating the consistency between the testers and the reference value.
Preferably, the method for performing flaw detection on a sample using an ultrasonic flaw detector in step S1 includes the steps of:
s1.1, setting initial sensitivity, and calculating an initial sensitivity equivalent value deltaGet up；
S1.2, moving the probe to a position without defects on the detection surface, and moving the bottom wave B1Adjusted to 40% wave height on screen and then the attenuator releases the initial sensitivity equivalent value deltaGet up；
S1.3, moving the probe to the defect position of the detection surface, moving the probe to find out the highest point of the defect wave, adjusting the highest point to 40% of the wave height of the screen display, and recording the attenuation value deltafThen a isB·f＝ΔGet up-Δf；
S1.4. calculating the defect depth XfAnd a defect equivalent value Df。
Preferably, the initial sensitivity equivalent value Δ is calculated as described in step S1.1Get upSpecific formulaThe following were used:
wherein: dfIs the diameter of the flat bottom hole; xBIs the thickness of the workpiece; λ is the wavelength.
Preferably, the defect depth X is calculated as described in step S1.4fAnd a defect equivalent value DfThe specific method comprises the following steps:
s1.4.1, aligning the leading edge of the initial pulse to 0 lattice of the screen display, B1The front edge is aligned with 10 grids of the screen display, the display position of the defect front edge alignment screen is X, and the defect depth X is calculatedf(ii) a The specific formula is as follows:
s1.4.2. calculating a defect equivalent value DfThe concrete formula is as follows:
Df＝√2λXf 2/∏XB10ΔB·f/20
wherein: dfIs the diameter of the flat bottom hole; xBIs the thickness of the workpiece; xfThe distance from the flat bottom hole to the probe; λ is the wavelength; deltaB·fIs the decibel difference between the large flat bottom and the defect.
Preferably, the step S2 records the inspection result of each sample of each person, specifically including the sample, inspector, defect equivalent, defect reference value, error value, allowable difference value, inspection conclusion and measurement system output.
Preferably, the analysis result of step S2 includes, in particular, sample number, inspector, number of tests, sample number, reference determination, and system output.
Preferably, the output of the measuring system in step S2 specifically includes that the output "1" of the measuring system indicates that the product is qualified according to the acceptance criterion, the output "0" of the measuring system indicates that the product is not qualified according to the acceptance criterion, the output "+" of the measuring system indicates that the same test inspection value and the result of the acceptance criterion are consistent and both are qualified, the output "-" of the measuring system indicates that the same test inspection value and the result of the acceptance criterion are inconsistent and both are not qualified, and the output "X" of the measuring system indicates that the same test inspection value and the result of the acceptance criterion are inconsistent.
Preferably, the formula for calculating the self-rating consistency of the examiner in step S3 is as follows:
Kappa＝PO-Pe/1-Pe
wherein: kappa is consistency test evaluation value; pODividing the sum of the number of qualified samples and the number of unqualified samples by the total number of samples; peThe expected number of qualified samples plus the expected number of unqualified samples divided by the total number of samples.
Preferably, the expected number is the product of the number of consistent samples and the sum of the number of inconsistent samples between the crossed terms divided by the total number of samples after the samples are crossed.
Preferably, the calculation of step S3 is to test the human self-rating consistency specifically, Kappa is less than 0.4, and the consistency is not good; kappa is more than 0.75, and the consistency is good; kappa-1, complete identity.
The invention has the following beneficial effects: by utilizing the analysis method of the counting type ultrasonic flaw detection measurement system, the consistency of the ultrasonic measurement system can be evaluated according to the Kappa value, including the consistency of the sizes of the detected defects among operators, the consistency of the sizes of the detected defects of the operators and the consistency between the operators and the reference, and the difference points can be quickly and visually found through the quantification of the Kappa value, so that the quick improvement of the measurement system is promoted, and the accuracy of the measurement system is improved.
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The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic flow chart of an analysis method according to the present embodiment;
fig. 2 is a schematic flowchart of a flaw detection method according to this embodiment.
Detailed Description
In order to make the technical solutions and advantages of the embodiments of the present application more apparent, the following further detailed description of the exemplary embodiments of the present application with reference to the accompanying drawings makes it clear that the described embodiments are only a part of the embodiments of the present application, and are not exhaustive of all embodiments. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict.
Embodiment, referring to fig. 1-2, this embodiment is described, and an analysis method of a counting-type ultrasonic flaw detection measurement system of this embodiment includes the following steps:
s1, carrying out flaw detection on a sample by using an ultrasonic flaw detector, recording a detection result, and taking the detection result as a reference value; the initial sensitivity was set at FBH 2.0mm, and 50 samples were sample samples, and the defect equivalent size was measured at an initial sensitivity of 2.0mm, which was used as a reference.
S1.1, setting initial sensitivity, and calculating an initial sensitivity equivalent value deltaGet up(ii) a Calculating the initial sensitivity equivalent value DeltaGet upThe specific formula is as follows:
wherein: dfIs the diameter of the flat bottom hole; xBIs the thickness of the workpiece; λ is the wavelength.
S1.2, moving the probe to a position without defects on the detection surface, and moving the bottom wave B1Adjusted to 40% wave height on screen and then the attenuator releases the initial sensitivity equivalent value deltaGet up；
S1.3, moving the probe to the defect position of the detection surface, moving the probe to find out the highest point of the defect wave, adjusting the highest point to 40% of the wave height of the screen display, and recording the attenuation value deltafThen a isB·f＝ΔGet up-Δf；
S1.4. calculating the defect depth XfAnd a defect equivalent value DfThe method comprises the following steps:
s1.4.1, aligning the leading edge of the initial pulse to 0 lattice of the screen display, B1The front edge is aligned with 10 grids of the screen display, the display position of the defect front edge alignment screen is X, and the defect depth X is calculatedf(ii) a The specific formula is as follows:
s1.4.2. calculating a defect equivalent value DfThe concrete formula is as follows:
Df＝√2λXf 2/∏XB10ΔB·f/20
wherein: dfIs the diameter of the flat bottom hole; xBIs the thickness of the workpiece; xfThe distance from the flat bottom hole to the probe; λ is the wavelength; deltaB·fIs the decibel difference between the large flat bottom and the defect.
And S2, detecting the samples by a plurality of testers respectively, recording the detection result of each sample of each tester, and counting and analyzing the detection results. Referring to tables 1 and 2, table 1 summarizes the test results, and table 2 is an analysis report table of the counting type measurement system.
The 50 samples were tested 3 times by 3 testers, the test results of each sample were recorded, and the test results were counted and analyzed.
The detection result specifically comprises a test sample, an inspector, a defect equivalent, a defect reference value, an error value, an allowable difference value, an inspection conclusion and a measurement system output.
TABLE 1 summary of test results
And analyzing the detection result, specifically comprising the sample code, the inspector, the test times, the sample quantity, the reference decision and the measurement system output.
The output of the measuring system specifically comprises that the output of the measuring system is 1, which indicates that the product is qualified according to the acceptance standard, the output of the measuring system is 0, which indicates that the product is not qualified according to the acceptance standard, the output of the measuring system is +, which indicates that the same test inspection value is consistent with the inspection result of the acceptance standard and both the test values are qualified, the output of the measuring system is-, which indicates that the same test inspection value is inconsistent with the inspection result of the acceptance standard and both the test values are not qualified, and the output of the measuring system is X, which indicates that the same test inspection value is inconsistent with the inspection result of the acceptance standard.
TABLE 2 analysis report table of counting type measuring system
And S3, calculating the self-evaluation consistency of the testers according to the detection result of the step S2, and calculating the consistency between the testers and the reference value.
The formula for calculating the self-evaluation consistency of the examiners is as follows:
Kappa＝PO-Pe/1-Pe
wherein: kappa is consistency test evaluation value; pODividing the sum of the number of qualified samples and the number of unqualified samples by the total number of samples; peThe expected number of qualified samples plus the expected number of unqualified samples divided by the total number of samples.
Wherein, the expected number refers to the product of the number of consistent samples and the sum of the number of inconsistent samples among cross terms divided by the total number of samples after the cross of the testers.
Wherein, the standard for calculating and checking the self-evaluation consistency of the human is specifically that Kappa is less than 0.4 and the consistency is not good; kappa is more than 0.75, and the consistency is good; kappa-1, complete identity.
Referring to table 3, the results of the consistency between the examiners and the consistency between the examiner and the reference value described in this embodiment are described in detail; table 3 shows the Kappa test evaluation value tables of test person A and test person B.
TABLE 3 Kappa test evaluation value Table for tester A and tester B
Table 3 shows the results of the consistency test evaluation of the tester a and the tester B, wherein "1.00" indicates pass, "0.00" indicates fail, and the number 75 in the figure indicates the number of samples with failed consistency tested by the tester a and the tester B; the number 2 in the figure represents the inconsistent sample number tested by the tester A and the tester B; number 73 in the figure represents the number of consistency-qualified samples tested by tester a and tester B. The expected number is the product of the number of consistent samples and the sum of the number of inconsistent samples between cross terms divided by the total number of samples after human testing crosses.
By the formula Kappa ═ PO-Pe/1-PeCalculating to obtain Kappa of 0.97 and more than 0.75; the result of the judgment was that the consistency was good.
The result of the correspondence between the examiner and the reference value is calculated in the same manner as the correspondence between the examiners.
It should be noted that, in the above embodiments, as long as the technical solutions can be aligned and combined without contradiction, those skilled in the art can exhaust all possibilities according to the mathematical knowledge of the alignment and combination, and therefore, the present invention does not describe the technical solutions after alignment and combination one by one, but it should be understood that the technical solutions after alignment and combination have been disclosed by the present invention.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art.
Claims (10)
1. A method for analyzing a counting type ultrasonic flaw detection measuring system is characterized by comprising the following steps:
s1, carrying out flaw detection on a sample by using an ultrasonic flaw detector, recording a detection result, and taking the detection result as a reference value;
s2, detecting the samples by a plurality of testers respectively, recording the detection result of each sample of each tester, and counting and analyzing the detection results;
and S3, calculating the self-evaluation consistency of the testers according to the detection result of the step S2, and testing the consistency between the testers and the reference value.
2. The method of analyzing according to claim 1, wherein the method of inspecting a test specimen with an ultrasonic flaw detector in step S1 specifically includes the steps of:
s1.1, setting initial sensitivity, and calculating an initial sensitivity equivalent value deltaGet up；
S1.2, moving the probe to a position without defects on the detection surface, and moving the bottom wave B1Adjusted to 40% wave height on screen and then the attenuator releases the initial sensitivity equivalent value deltaGet up；
S1.3, moving the probe to the defect position of the detection surface, moving the probe to find out the highest point of the defect wave, and adjusting the highest point to 40% of the screen displayWave height, recorded attenuation value deltafThen a isB·f＝ΔGet up-Δf；
S1.4. calculating the defect depth XfAnd a defect equivalent value Df。
3. The assay of claim 2, wherein step S1.1 calculates an initial sensitivity equivalent value ΔGet upThe specific formula is as follows:
wherein: dfIs the diameter of the flat bottom hole; xBIs the thickness of the workpiece; λ is the wavelength.
4. Analysis method according to claim 3, characterised in that step S1.4 consists in calculating the defect depth XfAnd a defect equivalent value DfThe specific method comprises the following steps:
s1.4.1, aligning the leading edge of the initial pulse to 0 lattice of the screen display, B1The front edge is aligned with 10 grids of the screen display, the display position of the defect front edge alignment screen is X, and the defect depth X is calculatedf(ii) a The specific formula is as follows:
s1.4.2. calculating a defect equivalent value DfThe concrete formula is as follows:
Df＝√2λXf 2/∏XB10ΔB·f/20
wherein: dfIs the diameter of the flat bottom hole; xBIs the thickness of the workpiece; xfThe distance from the flat bottom hole to the probe; λ is the wavelength; deltaB·fIs the decibel difference between the large flat bottom and the defect.
5. The method of claim 2, 3 or 4, wherein the step S2 records the detection results of each sample of each person, specifically including the sample, inspector, defect equivalent, defect reference, error value, allowable difference, inspection conclusion and measurement system output.
6. The method of claim 5, wherein the step S2 of analyzing the test results includes, in particular, sample number, examiner, number of tests, number of samples, reference decision and system output.
7. The analysis method according to claim 6, wherein the measurement system output of step S2 specifically includes that the measurement system output "1" indicates that the test result is acceptable according to the acceptance criteria, the measurement system output "0" indicates that the test result is not acceptable according to the acceptance criteria, the measurement system output "+" indicates that the same test value and the same test result are both acceptable, the measurement system output "-" indicates that the same test value and the same test result are both not acceptable, and the measurement system output "X" indicates that the same test value and the same test result are both inconsistent.
8. The analysis method according to claim 7, wherein the formula for calculating the self-rating consistency of the examiner at step S3 is as follows:
Kappa＝PO-Pe/1-Pe
wherein: kappa is consistency test evaluation value; pODividing the sum of the number of qualified samples and the number of unqualified samples by the total number of samples; peThe expected number of qualified samples plus the expected number of unqualified samples divided by the total number of samples.
9. The method of claim 8, wherein the desired number is the product of the number of consistent samples and the total number of inconsistent samples between the cross terms divided by the total number of samples after the samples have crossed.
10. The assay of claim 9, wherein the calculation of step S3 is performed to verify the human self-assessed identity by comparing Kappa < 0.4, which is poor; kappa is more than 0.75, and the consistency is good; kappa-1, complete identity.
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