CN113218527A - Thermistor-based temperature detection method, device, equipment, medium and system - Google Patents
Thermistor-based temperature detection method, device, equipment, medium and system Download PDFInfo
- Publication number
- CN113218527A CN113218527A CN202110518818.2A CN202110518818A CN113218527A CN 113218527 A CN113218527 A CN 113218527A CN 202110518818 A CN202110518818 A CN 202110518818A CN 113218527 A CN113218527 A CN 113218527A
- Authority
- CN
- China
- Prior art keywords
- thermistor
- value
- voltage
- temperature
- theoretical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The invention provides a temperature detection method, a temperature detection device, electronic equipment, a medium and a temperature detection system based on a thermistor, which are applied to a terminal, wherein the method comprises the following steps: terminal obtaining voltage measured value V of thermistortThe terminal being dependent on the voltage measurement VtDetermining a voltage measurement value V in a first correspondence relationship with a voltage error amounttCorresponding voltage error magnitude VdThe terminal being dependent on the voltage measurement VtAnd the voltage error amount VdCalculating the actual resistance R of the thermistorCAnd finally, the terminal is based on the actual resistance R of the thermistorCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCCorresponding to the real-time temperature T, based on the voltage measurement VtDetermining an actual resistance value R of the thermistor in a first correspondence relationship with the voltage error amountCThen according to the factResistance value RCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCThe corresponding real-time temperature T improves the precision of temperature detection.
Description
Technical Field
The invention relates to the technical field of temperature detection, in particular to a thermistor-based temperature detection method, device, equipment, medium and system.
Background
Measuring temperature based on thermistors is a very popular and cost-effective solution. The actual temperature detection needs to be realized by matching with a circuit, so that the accuracy of the temperature detection is not only influenced by the accuracy of the thermistor of the temperature detection, but also influenced by the accuracy of a pull-up power supply, the accuracy of a voltage dividing resistor and the detection accuracy deviation of an analog-to-digital converter (ADC) in the actual detection circuit.
The reference voltage and the terminal ADC can be calibrated separately by means of an external high-precision power supply device at present, but the high-precision calibration device is very expensive, resulting in too high calibration cost.
Therefore, it is desirable to provide a thermistor-based temperature detection method to improve the accuracy of the temperature detection result.
Disclosure of Invention
The invention aims to provide a temperature detection method, a temperature detection device, equipment, a medium and a temperature detection system based on a thermistor, which are used for improving the accuracy of a temperature detection result.
In order to achieve the above object, in a first aspect, the present invention provides a thermistor-based temperature detection method, which can be applied to a terminal, including:
terminal obtaining voltage measured value V of thermistortThe terminal being dependent on the voltage measurement VtDetermining a voltage measurement value V in a first correspondence relationship with a voltage error amounttCorresponding voltage error magnitude VdThe terminal being dependent on the voltage measurement VtAnd the voltage error amount VdCalculating to obtain the actual resistance value R of the thermistorCAnd finally, the terminal is based on the actual resistance R of the thermistorCAnd a voltage measurement value V of said thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T.
The invention has the beneficial effects that: based on voltage measurement VtDetermining an actual resistance value R of the thermistor in a first correspondence relationship with the voltage error amountCThen according to the actual resistance value RCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T, increased temperatureAccuracy of degree detection.
In one possible implementation, the actual resistance value R of the thermistor is determinedCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCThe corresponding real-time temperature T comprises: based on the voltage measurement V of the thermistortThe theoretical resistance value R of the thermistor is determined.
Determining the actual resistance value R of the thermistorCAnd determining a theoretical temperature value T 'corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relation between the theoretical temperature value and the theoretical resistance value of the thermistor, determining a temperature variation delta T corresponding to the resistance difference value delta R under the condition of the theoretical temperature value T' according to a third corresponding relation between the unit centigrade degree variation of the thermistor and the resistance variation of the thermistor under the condition of the theoretical temperature value T ', and adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
In another possible implementation, the method further comprises: connecting a standard resistor for replacing the thermistor through the test jig, receiving a test command from the PC, and responding to the test command by using the standard resistor to measure a voltage V of the thermistortCalibrating to obtain voltage measurement value V of thermistortAnd voltage error magnitude VdA first correspondence relationship therebetween. The beneficial effects are that: the voltage measured value V of the thermistor is obtained by checking the standard resistortAnd voltage error magnitude VdThe first corresponding relation between the two is convenient for searching and utilizing during temperature detection.
In another possible implementation, the voltage measurement V of the thermistor is measured by means of the reference resistortPerforming a calibration comprising: at any one temperature value, the following processing is performed: according to the resistance value, the reference voltage and the pull-up resistor of the standard resistor, the theoretical voltage division value V of the standard resistor at the temperature value is calculatediMeasure the subscript of the temperature valueTest voltage division value V of quasi-resistorRBased on the measured partial pressure value VRAnd the theoretical value of partial pressure ViThe difference between the voltage measured value and the voltage error amount of the thermistor at the temperature value is determined.
In another possible implementation, the thermistor is a positive temperature coefficient thermistor PTC or a negative temperature coefficient thermistor NTC.
In a second aspect, a thermistor-based temperature sensing device, the device comprising: an acquisition module for acquiring the voltage measurement value V of the thermistortA processing module for processing the voltage measurement value VtDetermining a voltage measurement value V in a first correspondence relationship with a voltage error amounttCorresponding voltage error magnitude VdThen based on the voltage measurement VtAnd the voltage error amount VdCalculating the actual resistance R of the thermistorCFinally, according to the actual resistance value R of the thermistorCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T.
The invention has the beneficial effects that: based on voltage measurement VtDetermining an actual resistance value R of the thermistor in a first correspondence relationship with the voltage error amountCThen according to the actual resistance value RCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCThe corresponding real-time temperature T improves the precision of the temperature detection result.
In one possible implementation, the processing module is specifically configured to: determining theoretical resistance value R of the thermistor according to the voltage error Vd, and determining actual resistance value R of the thermistorCAnd determining a theoretical temperature value T 'corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relation between the theoretical temperature value and the theoretical resistance value of the thermistor, and determining the theoretical temperature value T' corresponding to the theoretical resistance value R of the thermistor according to a third corresponding relation between the unit degree centigrade variation of the thermistor and the resistance variation of the thermistor under the condition of the theoretical temperature value TAnd finally, adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
In another possible implementation, the test fixture further comprises a transceiver module and a calibration module, wherein the transceiver module is used for receiving a test command from the PC after the standard resistor is connected through the test fixture. The standard resistor is used to replace the thermistor, and the calibration module is used to utilize the standard resistor to measure the voltage V of the thermistor according to the test command of the PCtCalibrating to obtain voltage measurement value V of thermistortAnd voltage error magnitude VdA first correspondence relationship therebetween.
In another possible implementation, the calibration module is specifically configured to perform the following processing at any one temperature value: calculating the theoretical voltage division value V of the standard resistor at the temperature value according to the resistance value, the reference voltage and the pull-up resistor of the standard resistoriThen measuring the test voltage division value V of the standard resistor at the temperature valueRAccording to the measured partial pressure value VRAnd the theoretical value of partial pressure ViThe difference between the voltage measured value and the voltage error amount of the thermistor at the temperature value is determined.
In another possible implementation, the thermistor is a positive temperature coefficient thermistor, PTC, or a negative temperature coefficient thermistor, NTC.
In a third aspect, an embodiment of the present invention provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the method when executing the computer program.
In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps of the above-mentioned method.
In a fifth aspect, an embodiment of the present invention provides a chip system, which is coupled to a memory and configured to read and execute program instructions stored in the memory to implement the steps of the foregoing method.
Drawings
FIG. 1 is a diagram of a conventional NTC resistance temperature measurement circuit;
FIG. 2 is a flow chart of a thermistor-based temperature sensing method of the present disclosure;
FIG. 3 is a circuit diagram of a standard resistor replacing an NTC resistor according to the present disclosure;
FIG. 4 is a second graph illustrating a theoretical temperature value versus a theoretical resistance value of a thermistor according to the present disclosure;
FIG. 5 is a block diagram of a thermistor-based temperature detection device according to the present disclosure;
fig. 6 is a schematic structural diagram of an electronic device according to the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention. Unless defined otherwise, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this invention belongs. As used herein, the word "comprising" and similar words are intended to mean that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items.
Thermistors are a class of sensitive elements, and are classified into Positive Temperature Coefficient (PTC) thermistors and Negative Temperature Coefficient (NTC) thermistors according to their temperature coefficients. Thermistors are typically temperature sensitive and exhibit different resistance values at different temperatures. The positive temperature coefficient thermistor has a higher resistance value at a higher temperature, and the negative temperature coefficient thermistor has a lower resistance value at a higher temperature. In the present invention, in the following description of the present invention, a negative temperature coefficient thermistor is exemplarily used for the description of the temperature detection method, and it should be noted that the temperature detection method provided by the present invention is also applicable to a positive temperature coefficient thermistor.
Referring to fig. 1, fig. 1 shows a conventional circuit for measuring temperature by a resistance voltage dividing NTC resistor, where a reference voltage is VDD, Rpu is a pull-up resistor, and an ADCI voltage signal divided by the NTC resistor is input to a terminal for measurement, and different voltage values reflect different temperature states of the NTC resistor, and it can be known from fig. 1 that temperature measurement errors mainly come from the following aspects: the accuracy of VDD, the accuracy of Rpu pull-up resistor, the accuracy of Rpd pull-down resistor, the self error of NTC resistor and the measurement accuracy of terminal. If the reference voltage and the terminal ADC are calibrated separately by means of an external high-precision power supply device in order to improve the accuracy of temperature detection, the high-precision calibration device is very expensive, which results in high calibration cost.
In view of the problems in the prior art, an embodiment of the present invention provides a thermistor-based temperature detection method, which can be applied to a terminal, and is shown in fig. 2, and the method includes:
s201: terminal obtaining voltage measured value V of thermistort。
Wherein, the terminal can directly detect and obtain the voltage measurement value V of the thermistortThe voltage measured value V of the thermistor can be obtained from other devicestAnd is not limited herein.
S202: the terminal being dependent on the voltage measurement VtDetermining a voltage measurement value V in a first correspondence relationship with a voltage error amounttCorresponding voltage error magnitude Vd。
It should be noted that the first corresponding relationship is obtained by calibrating the thermistor with the standard resistor in advance, and the first corresponding relationship is stored in the terminal, and the terminal can be based on the voltage measured value VtThe corresponding voltage error amount is found from the first correspondence.
S203: the terminal being dependent on the voltage measurement VtAnd the voltage error amount Vd,Calculating the actual resistance R of the thermistorC。
Illustratively, the actual resistance valueWhere the values of VDD and Rpu are known, the actual resistance value R can be calculated from this equationC。
S204: the terminal is based on the actual resistance R of the thermistorCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T.
In this S204, in the first possible embodiment, the terminal may be according to the voltage error amount VdDetermining the theoretical resistance value R of the thermistor, and then determining the actual resistance value R of the thermistorCAnd determining a theoretical temperature value T 'corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relation between the theoretical temperature value and the theoretical resistance value of the thermistor, determining a temperature variation delta T corresponding to the resistance difference value delta R under the condition of the theoretical temperature value T' according to a third corresponding relation between the unit-degree-centigrade variation of the thermistor and the resistance variation of the thermistor under the condition of the theoretical temperature value T ', and finally adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
In a second possible embodiment, the terminal may also be calibrated by using the standard resistor in advance in the calculation manner in the first possible embodiment, and a corresponding relationship between the actual resistance value of the thermistor, the voltage measurement value of the thermistor, and the temperature is established, so that the terminal may determine the actual resistance value R of the thermistor by querying the corresponding relationshipCCorresponding real-time temperature T
It can be seen that in this embodiment, the voltage measurement V is usedtAnd the voltage error amount VdA first corresponding relation between them to adjust the voltage measurement value VtDue to the amount of voltage error VdIs based on the offset calibration of the thermistor, soCan be obtained by using the voltage error amount VdFor voltage measured value VtCalibration is carried out so that the actual resistance value R of the thermistor can be obtained on the basis thereofCTo thereby accurately determine the actual resistance value RCThe corresponding temperature.
In the embodiment of the present invention, the first correspondence relationship between the voltage measurement value and the voltage error amount may be obtained by the following calibration method. Specifically, the terminal is connected to a Personal Computer (PC) in a communication manner, a standard resistor is first connected to the PC through a test jig, the standard resistor is used to replace a thermistor, the terminal receives a test command from the PC, and in response to the test command, the terminal uses the standard resistor to measure a voltage V of the thermistortAnd (6) carrying out calibration. Referring to fig. 3, fig. 3 is a circuit diagram of a standard resistor replacing an NTC resistor, where the standard resistor is a high-precision resistor on the market, and the precision of the high-precision resistor can reach 0.01%, so that the error generated by the resistor itself can be greatly reduced. Because the resistance values of the resistors corresponding to different temperatures are different, the resistance value of the standard resistor is selected in advance according to the temperature value to be detected, so that in order to obtain the calibration result at any temperature value, the following operations are required to be executed at any temperature value in advance:
first, referring to Table 1, resistance value R according to standard resistanceCALReference voltage and pull-up resistor, and calculating the voltage division value V of the standard resistor at the temperature valueiSpecifically, a formula is adopted: vi=VDD*RCAL/(Rpu+RCAL) Calculating to obtain a partial pressure value ViThen the terminal directly tests the voltage division value V of the standard resistort. It should be noted that the voltage measurement V of the thermistor is previously tested by the terminal before the thermistor is replaced by the standard resistortI.e. determining the voltage measurement V of the thermistor at that temperaturetCorresponding to the voltage-dividing value Vt of the standard and standard resistors, and then according to the voltage-dividing value VtAnd the theoretical value of partial pressure ViThe difference between the two values is used to obtain a voltage error quantity, so that the voltage measured value V of the thermistor at any temperature is determinedtAnd a first corresponding relation between the voltage error quantities。
TABLE 1
Meanwhile, reverse verification is carried out on the basis, the resistance value of the resistor corresponding to the theoretical NTC resistor at the temperature of 40 ℃ is 50.65K omega, but the resistance value of the resistor is not 50.65K omega in the market, so that a standard resistor with the resistance value close to 50.65K omega is adopted, the resistance value of the standard resistor is 51K omega, and the temperature corresponding to 51K omega is about 39.155 ℃ as shown in figure 2.
Assuming that the reference voltage VDD is 1.8V and the pull-up resistor Rpu is 56K Ω, the theoretical voltage division value V of the standard resistor isiV was obtained by 1.8 × 51(56+51)iIs approximately 858 millivolts. Assuming a measured partial pressure value VRAt 880 mV, V is obtaineddThe voltage error V can be obtained by this method when the voltage is 22 mVdThe value of (c).
The error in VDD and Rpu in actual temperature sensing is approximately between 2% -3%, assuming, for example, a voltage error magnitude VdThe resistance value of Rpu is 10mV, the error of 3% exists in the resistance value of Rpu 56K omega, the actual corresponding resistance value of Rpu is calculated to be 57.68K omega, the error of 3% exists in the VDD voltage of 1.8V, the actual corresponding voltage value of VDD is calculated to be 1854mV, and therefore the voltage measurement value V can be reversely deducedt. Concrete correspondence
The relationship can look at table 2.
TABLE 2
Theoretical temperature C | Theoretical resistance value R | Back-derived voltage measurement Vt |
39.15 | 51 | 880.0220832 |
25 | 100 | 1185.799087 |
26 | 95.39 | 1165.373751 |
27 | 91.02 | 1144.842502 |
28 | 86.87 | 1124.195642 |
29 | 82.94 | 1103.519841 |
30 | 79.2 | 1082.741087 |
31 | 72.28 | 1041.141274 |
32 | 69.08 | 1020.368571 |
33 | 66.03 | 999.5693153 |
34 | 63.14 | 978.8922364 |
35 | 60.39 | 958.2769543 |
36 | 57.77 | 937.7226505 |
37 | 55.28 | 917.3045326 |
38 | 52.91 | 897.0163668 |
39 | 50.65 | 876.8429798 |
40 | 48.51 | 856.9492419 |
41 | 46.46 | 837.1254081 |
42 | 44.51 | 817.5304824 |
43 | 42.65 | 798.1301704 |
44 | 40.88 | 778.9886364 |
45 | 39.2 | 760.1734104 |
46 | 37.59 | 741.519471 |
It will be appreciated that the voltage measurement V is derived by the formula backtThe value of (A) is the voltage measurement value V of the thermistor obtained when the thermistor is not calibratedtBy the formula:can yield Rb,RbThe resistance value of the thermistor before calibration. The voltage measurement V is obtained according to this equationtAnd RbThe table 3 can be viewed as the correspondence table.
TABLE 3
A second step of obtaining a voltage error VdDetermining the theoretical resistance value R of the thermistor and then passing the actual resistance value RCAnd the theoretical resistance value R of the thermistor, calculating a resistance difference value delta R, and then determining a theoretical temperature value T' corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relationship between the theoretical temperature value and the theoretical resistance value of the thermistor, wherein the second corresponding relationship can be specifically checked in fig. 4.
Further, with reference to the resistance value variation data of 24-46 ℃ provided by the NCT manufacturer, the value of the resistance value difference per 1 ℃ interval can be referred to in table 4, so as to obtain a third corresponding relationship between the unit degree celsius variation of the thermistor and the resistance value variation of the thermistor.
TABLE 4
And determining the temperature variation delta T corresponding to the resistance difference delta R under the condition of the theoretical temperature value T'. Specifically, a formula is adopted: and calculating the calibrated temperature variation delta T, specifically looking at the table 5, and finally adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
TABLE 5
Similarly, the error temperature before calibration is calculated in the manner mentioned in the above embodiment, so that it can be compared that the temperature detected after calibration is improved by about 1 ℃ compared with the temperature detected without calibration. It is to be understood that tables 1 to 5 are for convenience of understanding the change of the respective data corresponding to the enumerated partial temperatures.
In another embodiment of the present disclosure, a thermistor-based temperature sensing device is connected to a PC and receives a test command from the PC. Referring to fig. 5, the apparatus includes: an obtaining module 501 and a processing module 502, wherein the obtaining module 501 is used for obtaining a voltage measurement value V of the thermistort. In the embodiment, the obtaining module is an analog-to-digital converter (ADC). A processing module 502 based on the voltage measurement VtDetermining a voltage measurement value V in a first correspondence relationship with a voltage error amounttCorresponding voltage error magnitude VdThe processing module 502 then processes the voltage measurement VtAnd the voltage error amount Vd,Calculating the actual resistance R of the thermistorCFinally, the processing module 502 is based on the actual resistance R of the thermistorCAnd a voltage measurement value V of the thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T.
Specifically, the processing module 502 is configured to determine the voltage error amount VdDetermining the theoretical resistance value R of the thermistor, and then calculating the actual resistance value R of the thermistorCAnd the theoretical resistance value R of the thermistor.
Next, the processing module 502 determines a theoretical temperature value T 'corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relationship between the theoretical temperature value and the theoretical resistance value of the thermistor, and determines a temperature variation Δ T corresponding to the resistance difference Δ R under the condition of the theoretical temperature value T' according to a third corresponding relationship between a unit degree celsius variation of the theoretical thermistor and a resistance variation of the thermistor. And finally, adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
In one possible implementationIn this example, the apparatus further comprises a calibration module 503 and a transceiver module 504. It should be noted that, the standard resistor is connected in advance through the test fixture, the transceiver module 504 receives the test command from the PC, and then the voltage measurement value V of the thermistor is measured by using the standard resistortCalibrating to obtain voltage measurement value V of thermistortAnd voltage error magnitude VdA first correspondence relationship therebetween. The calibration module 503 then stores the first correspondence. It is understood that the calibration module 503 is also used to store the second corresponding relationship and the third corresponding relationship, which facilitates the search application in calibration.
In detail, at any temperature value, the calibration module 503 calculates the theoretical voltage-dividing value V of the standard resistor at the temperature value according to the resistance value of the standard resistor, the reference voltage and the pull-up resistor, and the processing module 502 calculates the theoretical voltage-dividing value V of the standard resistor at the temperature valueiThen, the obtaining module 501 obtains the voltage-dividing value Vt of the reference resistor, and then the processing module 502 calculates the difference between the voltage-dividing value Vt and the theoretical voltage-dividing value Vi, thereby determining the first corresponding relationship between the voltage measurement value and the voltage error amount of the thermistor at the temperature value.
It should be noted that the voltage measurement value V of the thermistor is tested in advance by the terminal device before the thermistor is replaced with the standard resistortI.e. determining the voltage measurement V of the thermistor at that temperaturetAnd obtaining a voltage error amount from a difference between the divided voltage value Vt and the theoretical divided voltage value Vi, thereby determining a first correspondence between the voltage measurement value Vt and the voltage error amount of the thermistor at an arbitrary temperature.
In another embodiment of the present disclosure, a computer-readable storage medium is further disclosed on the basis of the above embodiments, on which a computer program is stored, which when executed by a processor implements the steps of the above method.
In another embodiment of the present disclosure, a chip system is further disclosed on the basis of the above embodiment, and the chip system is coupled to the memory and configured to read and execute the program instructions stored in the memory to implement the steps of the above method.
In other embodiments of the present application, an embodiment of the present application discloses an electronic device, which may include, as shown in fig. 6: one or more processors 601; a memory 602; a display 603; one or more application programs (not shown); and one or more computer programs 604, which may be connected via one or more communication buses 605. Wherein the one or more computer programs 604 are stored in the memory 602 and configured to be executed by the one or more processors 601, the one or more computer programs 604 comprising instructions which may be used to perform the steps as in the respective embodiment of fig. 2.
Through the above description of the embodiments, it is clear to those skilled in the art that, for convenience and simplicity of description, the foregoing division of the functional modules is merely used as an example, and in practical applications, the above function distribution may be completed by different functional modules according to needs, that is, the internal structure of the device may be divided into different functional modules to complete all or part of the above described functions. For the specific working processes of the system, the apparatus, and the module described above, reference may be made to the corresponding processes in the foregoing method embodiments, which are not described herein again.
Each functional module in the embodiments of the present application may be integrated into one processing module, or each module may exist alone physically, or two or more modules are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.
The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the embodiments of the present application may be essentially implemented or make a contribution to the prior art, or all or part of the technical solutions may be implemented in the form of a software product stored in a storage medium and including several instructions for causing a computer device (which may be a personal computer, a server, or a network device) or a processor to execute all or part of the steps of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: flash memory, removable hard drive, read only memory, random access memory, magnetic or optical disk, and the like.
The above description is only a specific implementation of the embodiments of the present application, but the scope of the embodiments of the present application is not limited thereto, and any changes or substitutions within the technical scope disclosed in the embodiments of the present application should be covered by the scope of the embodiments of the present application. Therefore, the protection scope of the embodiments of the present application shall be subject to the protection scope of the claims.
Claims (13)
1. A temperature detection method based on a thermistor is applied to a terminal and is characterized by comprising the following steps:
obtaining the voltage measurement value V of the thermistort;
According to said voltage measurement value VtDetermining the voltage measurement value V in a first corresponding relationship with a voltage error amounttCorresponding voltage error magnitude Vd;
According to said voltage measurement value VtWith said voltage error magnitude VdCalculating to obtain the actual resistance value R of the thermistorC;
According to the actual resistance value R of the thermistorCAnd a voltage measurement value V of said thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T.
2. The method of claim 1, wherein said determining is based on an actual resistance value R of said thermistorCAnd a voltage measurement value V of said thermistortDetermining the actual resistance value R of the thermistorCThe corresponding real-time temperature T comprises:
according to the voltage error quantity VdDetermining a theoretical resistance value R of the thermistor;
determining the actual resistance value R of the thermistorCAnd a resistance difference value Δ R between a theoretical resistance value R of the thermistor;
determining a theoretical temperature value T' corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relation between the theoretical temperature value and the theoretical resistance value of the thermistor;
determining a temperature variation delta T corresponding to the resistance difference value delta R under the theoretical temperature value T' according to a third corresponding relation between the unit-degree-centigrade variation of the thermistor and the resistance variation of the thermistor under the theoretical temperature value T;
and adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
3. The method of claim 2, further comprising:
connecting a standard resistor through a test fixture, wherein the standard resistor is used for replacing the thermistor;
receiving a test command from a PC;
in response to the test command, using the standard resistor to measure V the voltage of the thermistortCarrying out calibration;
obtaining the voltage measured value V of the thermistor according to the calibration resulttAnd said voltage error magnitude VdThe first correspondence relationship therebetween.
4. The method of claim 3, wherein the voltage measurement V of the thermistor using the reference resistortPerforming a calibration comprising:
at any one temperature value, the following processing is performed:
calculating a theoretical voltage division value V of the standard resistor under the temperature value according to the resistance value, the reference voltage and the pull-up resistor of the standard resistori;
Measuring the standard at the temperature valueTest voltage division value V of resistorR;
According to the measured partial pressure value VRAnd the theoretical partial pressure value ViThe difference between the voltage measured value and the voltage error amount of the thermistor at the temperature value is determined.
5. The method according to any of claims 1-4, wherein the thermistor is a positive temperature coefficient thermistor, PTC, or a negative temperature coefficient thermistor, NTC.
6. A thermistor-based temperature sensing device, comprising:
an acquisition module for acquiring the voltage measurement value V of the thermistort;
A processing module for measuring the voltage V according to the voltagetDetermining the voltage measurement value V in a first corresponding relationship with a voltage error amounttCorresponding voltage error magnitude Vd(ii) a According to said voltage measurement value VtWith said voltage error magnitude VdCalculating the actual resistance value R of the thermistorC(ii) a According to the actual resistance value R of the thermistorCAnd a voltage measurement value V of said thermistortDetermining the actual resistance value R of the thermistorCCorresponding real-time temperature T.
7. The apparatus of claim 6, wherein the processing module is specifically configured to:
determining a theoretical resistance value R of the thermistor according to the voltage error Vd;
determining the actual resistance value R of the thermistorCAnd a resistance difference value Δ R between a theoretical resistance value R of the thermistor;
determining a theoretical temperature value T' corresponding to the theoretical resistance value R of the thermistor according to a second corresponding relation between the theoretical temperature value and the theoretical resistance value of the thermistor;
determining a temperature variation delta T corresponding to the resistance difference value delta R under the theoretical temperature value T' according to a third corresponding relation between the unit-degree-centigrade variation of the thermistor and the resistance variation of the thermistor under the theoretical temperature value T;
and adjusting the theoretical temperature value T' according to the temperature variation delta T to obtain the real-time temperature T of the thermistor.
8. The apparatus of claim 7, further comprising: a transceiver module and a calibration module;
the receiving and sending module is used for receiving a test command from a PC (personal computer) after a standard resistor is connected through a test fixture, and the standard resistor is used for replacing the thermistor;
the calibration module is used for utilizing the standard resistor to measure the voltage V of the thermistor according to the test command of the PCtCalibrating to obtain the voltage measurement value V of the thermistortAnd said voltage error magnitude VdThe first correspondence relationship therebetween.
9. The apparatus of claim 8, wherein the calibration module is specifically configured to:
at any one temperature value, the following processing is performed:
calculating a theoretical voltage division value V of the standard resistor under the temperature value according to the resistance value, the reference voltage and the pull-up resistor of the standard resistori;
Measuring the test voltage division value V of the standard resistor under the temperature valueR;
According to the test partial pressure value VRAnd the theoretical partial pressure value ViThe difference between the voltage measured value and the voltage error amount of the thermistor at the temperature value is determined.
10. The device of claim 9, wherein the thermistor is a positive temperature coefficient thermistor, PTC, or a negative temperature coefficient thermistor, NTC.
11. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the method according to any of claims 1 to 5 when executing the computer program.
12. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the method according to any one of claims 1 to 5.
13. A chip system, coupled to a memory, for reading and executing program instructions stored in the memory to implement the method of any of claims 1 to 5.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110518818.2A CN113218527B (en) | 2021-05-12 | 2021-05-12 | Thermistor-based temperature detection method, device, equipment, medium and system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110518818.2A CN113218527B (en) | 2021-05-12 | 2021-05-12 | Thermistor-based temperature detection method, device, equipment, medium and system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113218527A true CN113218527A (en) | 2021-08-06 |
CN113218527B CN113218527B (en) | 2023-01-31 |
Family
ID=77095274
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110518818.2A Active CN113218527B (en) | 2021-05-12 | 2021-05-12 | Thermistor-based temperature detection method, device, equipment, medium and system |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113218527B (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110106476A1 (en) * | 2009-11-04 | 2011-05-05 | Gm Global Technology Operations, Inc. | Methods and systems for thermistor temperature processing |
US20180035889A1 (en) * | 2016-08-05 | 2018-02-08 | Vital Connect, Inc. | Temperature sensor for measuring thermistor resistence |
CN110132444A (en) * | 2018-02-08 | 2019-08-16 | 展讯通信(上海)有限公司 | Temperature sensing circuit |
CN110608809A (en) * | 2018-06-14 | 2019-12-24 | 浙江智柔科技有限公司 | Temperature measuring device, module and method based on thermistor |
CN111506135A (en) * | 2020-05-08 | 2020-08-07 | 石燕燕 | Simple heating equipment temperature controller |
CN212301643U (en) * | 2020-05-25 | 2021-01-05 | 北京世特美测控技术有限公司 | Temperature compensation circuit of digital output open type direct current leakage current sensor |
CN112304466A (en) * | 2020-10-20 | 2021-02-02 | 武汉智能装备工业技术研究院有限公司 | Multichannel scanning formula temperature measuring device |
-
2021
- 2021-05-12 CN CN202110518818.2A patent/CN113218527B/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20110106476A1 (en) * | 2009-11-04 | 2011-05-05 | Gm Global Technology Operations, Inc. | Methods and systems for thermistor temperature processing |
CN102052973A (en) * | 2009-11-04 | 2011-05-11 | 通用汽车环球科技运作公司 | Methods and systems for thermistor temperature processing |
US20180035889A1 (en) * | 2016-08-05 | 2018-02-08 | Vital Connect, Inc. | Temperature sensor for measuring thermistor resistence |
CN110132444A (en) * | 2018-02-08 | 2019-08-16 | 展讯通信(上海)有限公司 | Temperature sensing circuit |
CN110608809A (en) * | 2018-06-14 | 2019-12-24 | 浙江智柔科技有限公司 | Temperature measuring device, module and method based on thermistor |
CN111506135A (en) * | 2020-05-08 | 2020-08-07 | 石燕燕 | Simple heating equipment temperature controller |
CN212301643U (en) * | 2020-05-25 | 2021-01-05 | 北京世特美测控技术有限公司 | Temperature compensation circuit of digital output open type direct current leakage current sensor |
CN112304466A (en) * | 2020-10-20 | 2021-02-02 | 武汉智能装备工业技术研究院有限公司 | Multichannel scanning formula temperature measuring device |
Also Published As
Publication number | Publication date |
---|---|
CN113218527B (en) | 2023-01-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107621279B (en) | Data processing method, sensor data calibration method and device | |
US20020078732A1 (en) | Method and apparatus for the calibration and compensation of sensors | |
CN110220945B (en) | Full-range temperature compensation method of semiconductor gas sensor | |
JPS5815133A (en) | Multiple probe temperature measuring device and probe for said device | |
JPH11507136A (en) | Calibration method of radiation thermometer | |
CN110006554B (en) | Thermometer calibration device and method | |
CN108344522A (en) | A kind of high-precision measurement circuit that band is calibrated automatically and method | |
CN112461406B (en) | Calibration method based on fiber grating type temperature sensor | |
CN116593060A (en) | Temperature compensation method, circuit and device for pressure sensor | |
CN115656775A (en) | Method and device for testing offset voltage of instrument amplifier | |
CN114156982B (en) | BMS system zero drift compensation circuit and method | |
CN110608809B (en) | Temperature measuring device, module and method based on thermistor | |
CN106197745A (en) | Clinical thermometer and measuring method thereof | |
CN114199451A (en) | Pressure detection method and system based on temperature compensation and storage medium | |
CN112578840B (en) | Method, system and storage medium for calibrating reference voltage by using temperature | |
CN113218527B (en) | Thermistor-based temperature detection method, device, equipment, medium and system | |
CN111637983B (en) | Detection system and method of resistance type temperature sensor | |
CN112945418B (en) | Temperature measuring device and temperature measuring method of integrated chip | |
CN106959170B (en) | For measuring the sensing element of material internal temperature and based on the temperature sensor of the sensing element | |
US9310261B2 (en) | Production-test die temperature measurement method and apparatus | |
Zhao et al. | The influence of axial temperature distribution on calibration accuracy based on dry block furnace | |
Li et al. | Research on the Adaptability of Thermistor Calibration Equations | |
Zhao et al. | Comparative experimental study on the stability of two brands of dry block furnace | |
CN114339052B (en) | Measured value compensation method, system and circuit, driving chip and shooting module | |
CN211373868U (en) | High-precision temperature measuring device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |