CN113204497A - Test case generation method and device, electronic equipment and computer storage medium - Google Patents
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Abstract
The application provides a test case generation method, a test case generation device, electronic equipment and a computer storage medium, wherein the test case generation method comprises the following steps: acquiring target test parameter configuration; wherein the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain; generating at least one test data of the domain according to the value type of the domain and the normal value of the domain; and combining all the test data to generate at least one normal test case. Therefore, the purpose of efficiently generating the test case is achieved.
Description
Technical Field
The present disclosure relates to the field of automated testing, and in particular, to a method and an apparatus for generating a test case, an electronic device, and a computer storage medium.
Background
At present, in the process of realizing automatic testing, all functional scenarios need to be covered, and test data needs to be artificially simulated by development and testing personnel according to business contents, and the data types may not be completely covered.
Moreover, with the further development of the business, the data content to be tested may be increased or decreased, and then each test case needs to be changed again, so that the difficulty of later maintenance is relatively high. Therefore, it takes a lot of time.
Disclosure of Invention
In view of the above, the present application provides a method and an apparatus for generating a test case, an electronic device, and a computer storage medium, which are used to generate a test case efficiently.
The first aspect of the present application provides a method for generating a test case, including:
acquiring target test parameter configuration; wherein the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain;
generating at least one test data of the domain according to the value type of the domain and the normal value of the domain;
and combining all the test data to generate at least one normal test case.
Optionally, after the combining all the test data to generate at least one normal test case, the method further includes:
and calculating the domains with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
Optionally, the target test parameter configuration further includes an abnormal value of a domain, and after calculating the domain with relevance according to the target test parameter configuration and all the normal test cases and generating a complete test case, the method further includes:
randomly selecting a test case for replacement according to the abnormal value of the domain to generate at least one abnormal test case;
and recalculating the domain with the relevance according to the target test parameter configuration and all the abnormal test cases to generate a complete abnormal test case.
Optionally, the method for generating a test case further includes:
and storing the complete normal test case and the complete abnormal test case into a database.
A second aspect of the present application provides a test case generation apparatus, including:
the acquisition unit is used for acquiring target test parameter configuration; wherein the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain;
the first generation unit is used for generating at least one type of test data of the domain according to the value type of the domain and the normal value of the domain;
and the combination unit is used for combining all the test data to generate at least one normal test case.
Optionally, the device for generating a test case further includes:
and the second generating unit is used for calculating the domain with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
Optionally, the device for generating a test case further includes:
the third generation unit is used for randomly selecting a test case for replacement according to the abnormal value of the domain to generate at least one abnormal test case;
and the fourth generation unit is used for recalculating the domain with the relevance according to the target test parameter configuration and all the abnormal test cases to generate a complete abnormal test case.
Optionally, the device for generating a test case further includes:
and the storage unit is used for storing the complete normal test case and the complete abnormal test case into a database.
A third aspect of the present application provides an electronic device comprising:
one or more processors;
a storage device having one or more programs stored thereon;
the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method for generating test cases as defined in any of the first aspects.
A fourth aspect of the present application provides a computer storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the method for generating a test case according to any one of the first aspects.
According to the scheme, the application provides a test case generation method, a test case generation device, electronic equipment and a computer storage medium, wherein the test case generation method comprises the following steps: acquiring target test parameter configuration; wherein the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain; generating at least one test data of the domain according to the value type of the domain and the normal value of the domain; and combining all the test data to generate at least one normal test case. Therefore, the purpose of efficiently generating the test case is achieved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a specific flowchart of a method for generating a test case according to an embodiment of the present disclosure;
fig. 2 is a flowchart illustrating a method for generating a test case according to another embodiment of the present disclosure;
fig. 3 is a schematic diagram of a test case generation apparatus according to another embodiment of the present application;
fig. 4 is a schematic diagram of a test case generation apparatus according to another embodiment of the present application;
fig. 5 is a schematic view of an electronic device implementing a method for generating a test case according to another embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The term "include" and variations thereof as used herein are open-ended, i.e., "including but not limited to". The term "based on" is "based, at least in part, on". The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions for other terms will be given in the following description.
It should be noted that the terms "first", "second", and the like in the present application are only used for distinguishing different devices, modules or units, and are not used for limiting the order or interdependence relationship of the functions performed by the devices, modules or units.
It is noted that references to "a", "an", and "the" modifications in this application are intended to be illustrative rather than limiting, and that those skilled in the art will recognize that reference to "one or more" unless the context clearly dictates otherwise.
The embodiment of the application provides a method for generating a test case, which specifically includes the following steps as shown in fig. 1:
s101, obtaining target test parameter configuration.
Wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain.
It should be noted that, the target test parameter configuration may be, but is not limited to, input by a tester from a terminal, ipad, pc, or the like.
S102, generating at least one test data of the domain according to the value type of the domain and the normal value of the domain.
Specifically, at least one test data corresponding to the domain is obtained by querying in a preset corresponding relationship according to the value type of the domain and the normal value of the domain.
And S103, combining all the test data to generate at least one normal test case.
It should be noted that the manner of generating at least one normal test case by combining all the test data is very diverse, for example: if the test data A, the test data B, the test data C, the test data D and the test data E exist, the test data A, the test data B, the test data C, the test data D and the test data E can be combined to generate a normal test case X; or combining the test data A, the test data D and the test data E to generate a normal test case Y; or combining the test data A and the test data D to generate a normal test case Z; the test data a may also be used as a normal test case, and the like, which is not described herein again.
Optionally, in another embodiment of the present application, an implementation manner after step S103 further includes:
and calculating the domains with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
Therefore, more complete test cases can be obtained, and the test cases of different request domains in the actual application process can be met.
According to the scheme, the application provides a test case generation method which comprises the following steps: acquiring target test parameter configuration; wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain; generating at least one test data of the domain according to the value type of the domain and the normal value of the domain; and combining all the test data to generate at least one normal test case. Therefore, the purpose of efficiently generating the test case is achieved.
Another embodiment of the present application provides a method for generating a test case, as shown in fig. 2, which specifically includes the following steps:
s201, obtaining target test parameter configuration.
Wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain, the abnormal value of the domain and the normal value of the domain.
S202, generating at least one test data of the domain according to the value type of the domain and the normal value of the domain.
And S203, combining all the test data to generate at least one normal test case.
And S204, calculating the domains with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
It should be noted that, for specific implementation of steps S201, S202, S203, and S204, reference may be made to corresponding contents in the foregoing embodiments, and details are not described herein again.
S205, randomly selecting the test cases to replace according to the abnormal values of the domain, and generating at least one abnormal test case.
It can be understood that, although the selection is random, the selection is performed as many as possible, so that more abnormal test cases can be generated, and therefore, the subsequent test personnel can use the test cases more conveniently and quickly, and the test result is more accurate.
And S206, recalculating the domains with the relevance according to the target test parameter configuration and all the abnormal test cases to generate a complete abnormal test case.
Specifically, reference may be made to the corresponding content in the above embodiment for generating a complete normal test case, which is not described herein again.
Optionally, in another embodiment of the present application, an implementation manner after step S206 further includes:
and storing the complete normal test cases and the complete abnormal test cases into a database. For use by the user.
According to the scheme, the application provides a test case generation method which comprises the following steps: acquiring target test parameter configuration; wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain, the abnormal value of the domain and the normal value of the domain; generating at least one test data of the domain according to the value type of the domain and the normal value of the domain; combining all the test data to generate at least one normal test case; calculating the domains with relevance according to the target test parameter configuration and all normal test cases to generate a complete normal test case; randomly selecting a test case for replacement according to the abnormal value of the domain to generate at least one abnormal test case; and recalculating the domains with the relevance according to the target test parameter configuration and all the abnormal test cases to generate a complete abnormal test case. Therefore, the purpose of efficiently generating the test case is achieved.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The names of messages or information exchanged between a plurality of devices in the embodiments of the present application are for illustrative purposes only, and are not intended to limit the scope of the messages or information.
Computer program code for carrying out operations for aspects of the present application may be written in any combination of one or more programming languages, including but not limited to an object oriented programming language such as Python, Java, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider).
Another embodiment of the present application provides a device for generating a test case, as shown in fig. 3, specifically including:
an obtaining unit 301, configured to obtain target test parameter configuration.
Wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain.
A first generating unit 302, configured to generate at least one type of test data of a domain according to the value type of the domain and the normal value of the domain.
The combining unit 303 is configured to combine all the test data to generate at least one normal test case.
For a specific working process of the unit disclosed in the above embodiment of the present application, reference may be made to the content of the corresponding method embodiment, as shown in fig. 1, which is not described herein again.
Optionally, in another embodiment of the present application, an implementation manner of the apparatus for generating a test case further includes:
and the second generating unit is used for calculating the domain with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
For specific working processes of the units disclosed in the above embodiments of the present application, reference may be made to the contents of the corresponding method embodiments, which are not described herein again.
According to the scheme, the application provides a test case generation device: the obtaining unit 301 obtains target test parameter configuration; wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain; the first generating unit 302 generates at least one test data of the domain according to the value type of the domain and the normal value of the domain; the combining unit 303 combines all the test data to generate at least one normal test case. Therefore, the purpose of efficiently generating the test case is achieved.
Another embodiment of the present application provides a device for generating a test case, as shown in fig. 4, specifically including:
an obtaining unit 401, configured to obtain target test parameter configuration.
Wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain, the abnormal value of the domain and the normal value of the domain.
A first generating unit 402, configured to generate at least one type of test data of a domain according to the value type of the domain and the normal value of the domain.
And a combining unit 403, configured to combine all the test data to generate at least one normal test case.
The second generating unit 404 is configured to calculate a domain with correlation according to the target test parameter configuration and all normal test cases, so as to generate a complete normal test case.
And a third generating unit 405, configured to randomly select a test case for replacement according to the domain abnormal value, so as to generate at least one abnormal test case.
And a fourth generating unit 406, configured to recalculate the domain with relevance according to the target test parameter configuration and all the abnormal test cases, so as to generate a complete abnormal test case.
For a specific working process of the unit disclosed in the above embodiment of the present application, reference may be made to the content of the corresponding method embodiment, as shown in fig. 2, which is not described herein again.
Optionally, in another embodiment of the present application, an implementation manner after step S206 further includes:
and the storage unit is used for storing the complete normal test cases and the complete abnormal test cases into the database.
For specific working processes of the units disclosed in the above embodiments of the present application, reference may be made to the contents of the corresponding method embodiments, which are not described herein again.
According to the scheme, the application provides a test case generation device: the obtaining unit 401 obtains target test parameter configuration; wherein, the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain; the first generating unit 402 generates at least one test data of the domain according to the value type of the domain and the normal value of the domain; the combination unit 403 combines all the test data to generate at least one normal test case; the second generating unit 404 calculates the domains with relevance according to the target test parameter configuration and all normal test cases to generate complete normal test cases; the third generating unit 405 randomly selects a test case for replacement according to the abnormal value of the domain to generate at least one abnormal test case; the fourth generating unit 406 recalculates the domain with correlation according to the target test parameter configuration and all the abnormal test cases, and generates a complete abnormal test case. Therefore, the purpose of efficiently generating the test case is achieved.
The units described in the embodiments of the present application may be implemented by software or hardware. Where the name of a unit does not in some cases constitute a limitation of the unit itself, for example, the first retrieving unit may also be described as a "unit for retrieving at least two internet protocol addresses".
The functions described herein above may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), systems on a chip (SOCs), Complex Programmable Logic Devices (CPLDs), and the like.
Another embodiment of the present application provides an electronic device, as shown in fig. 5, including:
one or more processors 501.
A storage device 502 on which one or more programs are stored.
The one or more programs, when executed by the one or more processors 501, cause the one or more processors 501 to implement the method of generating test cases as described in any of the above embodiments.
Another embodiment of the present application provides a computer storage medium, on which a computer program is stored, wherein the computer program, when executed by a processor, implements the method for generating a test case as described in any one of the above embodiments.
In the context of this application, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
It should be noted that the computer readable medium mentioned above in the present application may be a computer readable signal medium or a computer readable storage medium or any combination of the two. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples of the computer readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present application, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. In this application, however, a computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: electrical wires, optical cables, RF (radio frequency), etc., or any suitable combination of the foregoing.
The computer readable medium may be embodied in the electronic device; or may exist separately without being assembled into the electronic device.
Another embodiment of the present application provides a computer program product for performing any one of the methods for generating test cases described above when the computer program product is executed.
In particular, according to embodiments of the application, the processes described above with reference to the flow diagrams may be implemented as computer software programs. For example, embodiments of the present application include a computer program product comprising a computer program carried on a non-transitory computer readable medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network via the communication means, or installed from a storage means, or installed from a ROM. The computer program, when executed by a processing device, performs the above-described functions defined in the method of the embodiments of the present application.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
While several specific implementation details are included in the above discussion, these should not be construed as limitations on the scope of the application. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination.
The above description is only a preferred embodiment of the application and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the application referred to in the present application is not limited to the embodiments with a particular combination of the above-mentioned features, but also encompasses other embodiments with any combination of the above-mentioned features or their equivalents without departing from the scope of the application. For example, the above features may be replaced with (but not limited to) features having similar functions as those described in this application.
Claims (10)
1. A method for generating a test case is characterized by comprising the following steps:
acquiring target test parameter configuration; wherein the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain;
generating at least one test data of the domain according to the value type of the domain and the normal value of the domain;
and combining all the test data to generate at least one normal test case.
2. The method of generating as claimed in claim 1, wherein after the combining all the test data to generate at least one normal test case, further comprises:
and calculating the domains with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
3. The generation method of claim 2, wherein the target test parameter configuration further includes an abnormal value of a domain, and after the domain having the correlation is calculated according to the target test parameter configuration and all the normal test cases to generate a complete test case, the generation method further includes:
randomly selecting a test case for replacement according to the abnormal value of the domain to generate at least one abnormal test case;
and recalculating the domain with the relevance according to the target test parameter configuration and all the abnormal test cases to generate a complete abnormal test case.
4. The generation method according to claim 3, further comprising:
and storing the complete normal test case and the complete abnormal test case into a database.
5. An apparatus for generating test cases, comprising:
the acquisition unit is used for acquiring target test parameter configuration; wherein the target test parameter configuration comprises: the name of the domain, the value type of the domain and the normal value of the domain;
the first generation unit is used for generating at least one type of test data of the domain according to the value type of the domain and the normal value of the domain;
and the combination unit is used for combining all the test data to generate at least one normal test case.
6. The generation apparatus according to claim 5, characterized by further comprising:
and the second generating unit is used for calculating the domain with the relevance according to the target test parameter configuration and all the normal test cases to generate a complete normal test case.
7. The generation apparatus according to claim 6, further comprising:
the third generation unit is used for randomly selecting a test case for replacement according to the abnormal value of the domain to generate at least one abnormal test case;
and the fourth generation unit is used for recalculating the domain with the relevance according to the target test parameter configuration and all the abnormal test cases to generate a complete abnormal test case.
8. The generation apparatus according to claim 7, further comprising:
and the storage unit is used for storing the complete normal test case and the complete abnormal test case into a database.
9. An electronic device, comprising:
one or more processors;
a storage device having one or more programs stored thereon;
the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of generating test cases of any of claims 1-4.
10. A computer storage medium, on which a computer program is stored, wherein the computer program, when being executed by a processor, carries out a method of generating test cases as claimed in any one of claims 1 to 4.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6560721B1 (en) * | 1999-08-21 | 2003-05-06 | International Business Machines Corporation | Testcase selection by the exclusion of disapproved, non-tested and defect testcases |
| CN109815147A (en) * | 2019-01-21 | 2019-05-28 | 深圳乐信软件技术有限公司 | Test cases generation method, device, server and medium |
| CN112527649A (en) * | 2020-12-15 | 2021-03-19 | 建信金融科技有限责任公司 | Test case generation method and device |
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- 2021-06-03 CN CN202110620574.9A patent/CN113204497A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6560721B1 (en) * | 1999-08-21 | 2003-05-06 | International Business Machines Corporation | Testcase selection by the exclusion of disapproved, non-tested and defect testcases |
| CN109815147A (en) * | 2019-01-21 | 2019-05-28 | 深圳乐信软件技术有限公司 | Test cases generation method, device, server and medium |
| CN112527649A (en) * | 2020-12-15 | 2021-03-19 | 建信金融科技有限责任公司 | Test case generation method and device |
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