CN113194248A - Equipment applied to high-temperature test and video jitter elimination method of high-temperature test - Google Patents
Equipment applied to high-temperature test and video jitter elimination method of high-temperature test Download PDFInfo
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- CN113194248A CN113194248A CN202110425240.6A CN202110425240A CN113194248A CN 113194248 A CN113194248 A CN 113194248A CN 202110425240 A CN202110425240 A CN 202110425240A CN 113194248 A CN113194248 A CN 113194248A
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- 238000012360 testing method Methods 0.000 title claims abstract description 83
- 238000000034 method Methods 0.000 title claims abstract description 37
- 230000008030 elimination Effects 0.000 title claims abstract description 13
- 238000003379 elimination reaction Methods 0.000 title claims abstract description 13
- 238000012545 processing Methods 0.000 claims abstract description 24
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 12
- 238000003786 synthesis reaction Methods 0.000 claims abstract description 12
- 239000003550 marker Substances 0.000 claims description 26
- 230000009466 transformation Effects 0.000 claims description 9
- 238000013519 translation Methods 0.000 claims description 6
- 230000008569 process Effects 0.000 abstract description 13
- 230000008859 change Effects 0.000 abstract description 6
- 238000002679 ablation Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010191 image analysis Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/68—Control of cameras or camera modules for stable pick-up of the scene, e.g. compensating for camera body vibrations
- H04N23/682—Vibration or motion blur correction
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/68—Control of cameras or camera modules for stable pick-up of the scene, e.g. compensating for camera body vibrations
- H04N23/682—Vibration or motion blur correction
- H04N23/684—Vibration or motion blur correction performed by controlling the image sensor readout, e.g. by controlling the integration time
- H04N23/6845—Vibration or motion blur correction performed by controlling the image sensor readout, e.g. by controlling the integration time by combination of a plurality of images sequentially taken
Abstract
The application relates to equipment applied to a high-temperature test and a video jitter elimination method of the high-temperature test, wherein at least three marking points which are not linearly arranged are arranged on one side of a sample fixing device, the collection direction of an image collection device faces towards the sample and the marking points, through obtaining an un-vibrated image collected before the high-temperature test and a multi-frame vibrated image collected during the high-temperature test, the un-vibrated image and the vibrated image both comprise the sample and the marking points, according to the position of each marking point in the un-vibrated image and the position of each marking point in the vibrated image, motion compensation is carried out on each vibrated image, video synthesis is carried out on the multi-frame vibrated image after motion compensation, and a stable video is obtained. Because the sample fixing device, the mark point and the sample have consistent vibration frequency in the high-temperature test process, the jitter of the sample can be effectively eliminated by correcting the mark point to eliminate the jitter, the motion estimation of the whole image is simplified into the change relation of the position of the mark point, and the processing speed and the accuracy are improved.
Description
Technical Field
The application relates to the technical field of data processing, in particular to equipment applied to a high-temperature test and a video jitter elimination method of the high-temperature test.
Background
Under the high-temperature test environment, due to the influence of high-temperature airflow and equipment operation, a camera and a test sample can vibrate, so that the phenomenon of shaking of an acquired video image is caused, and observation and post-calculation processing are inconvenient. Most of the current methods for eliminating video jitter are based on motion estimation of a whole image to eliminate jitter, and can only be used in an environment where a target is not deformed, and under a high-temperature environment, the target is ablated and deformed, so that the traditional method cannot well eliminate jitter. Therefore, there is a need for an apparatus and method for eliminating video jitter during high temperature testing to meet the requirements of observation and post-calculation processing during high temperature testing.
Disclosure of Invention
In order to solve the technical problems, the application provides equipment applied to a high-temperature test and a video jitter elimination method applied to the high-temperature test.
In order to solve the technical problem, the present application provides an apparatus for high temperature tests, which includes a sample fixing device, an image collecting device and an image processing device, wherein the sample fixing device is used for fixing a sample for high temperature tests, one side of the sample fixing device is provided with at least three non-linearly arranged mark points, the collecting direction of the image collecting device faces to the sample and the mark points, and can collect an image containing the sample and the mark points at the same time, and the image collecting device is connected with the image processing device; and the image processing device is used for performing motion compensation on the vibration image acquired by the image acquisition device during the high-temperature test according to the non-vibration image acquired by the image acquisition device before the high-temperature test.
Optionally, the number of the marking points is three.
Optionally, the marker dot is a different color than the sample fixation device; or the color of the center of the mark point is different from that of the edge of the mark point.
Optionally, the side of the sample fixing device facing the high temperature loading device is used for fixing the sample, and the mark point is arranged beside the sample mounting side.
Optionally, one side of the sample fixing device facing the high-temperature loading device is used for fixing the sample, the sample fixing device is provided with a bracket on a sample mounting side, the sample is juxtaposed with the bracket, and the marking point is arranged on one side of the bracket facing the image acquisition device.
Optionally, the image processing apparatus is specifically configured to acquire the non-vibration image acquired by the image acquisition apparatus before the high-temperature test and multiple frames of vibration images acquired during the high-temperature test, perform motion compensation on each frame of the vibration image according to the position of each mark point in the non-vibration image and the position of each mark point in each frame of the vibration image, and perform video synthesis on the multiple frames of vibration images after the motion compensation to obtain a stable video.
The application also provides a video jitter elimination method for the high-temperature test, which comprises the following steps:
s10, acquiring an undilated image acquired before the high-temperature test and a multi-frame vibrated image acquired during the high-temperature test, wherein the undilated image and the vibrated image both comprise a sample and at least three non-linearly arranged mark points positioned on a sample fixing device;
s20, performing motion compensation on each frame of vibration image according to the positions of the marker points in the non-vibration image and the positions of the marker points in each frame of vibration image;
and S30, carrying out video synthesis on the vibration images of the plurality of frames after motion compensation to obtain a stable video.
Optionally, step S20, includes:
s21, calculating the center position of each mark point in the non-vibration image;
s22, sequentially acquiring each frame of vibration image, and calculating the central position of each mark point in each frame of vibration image;
s23, calculating motion compensation parameters of each frame of the vibration image according to the central position of each mark point in the non-vibration image and the central position of each mark point in each frame of the vibration image, wherein the motion compensation parameters comprise at least one of rotation parameters, translation parameters and scaling parameters;
and S24, performing motion compensation on each frame of vibration image according to the motion compensation parameters of each frame of vibration image, so that each mark point in each frame of vibration image is stable relative to each mark point position in the non-vibration image.
Alternatively, the steps S21 and S22 respectively include:
extracting a mark point area;
and carrying out hough transformation on the marking point area to obtain the center position coordinates of each marking point.
Optionally, step S23, includes:
and according to the acquisition time of each frame of vibration image, sequentially solving the motion compensation parameters of the central position of each mark point in each frame of vibration image relative to the central position of each mark point in the non-vibration image through least square fitting.
The application discloses a device applied to a high-temperature test and a video jitter elimination method of the high-temperature test, at least three marking points which are not arranged in a straight line are arranged on one side of a sample fixing device, the collection direction of an image collection device faces towards a sample and the marking points, through obtaining an un-vibrated image collected before the high-temperature test and a multi-frame vibrated image collected during the high-temperature test, the un-vibrated image and the vibrated image both comprise the sample and the marking points, according to the positions of the marking points in the un-vibrated image and the positions of the marking points in the vibrated image, each frame of vibrated image is subjected to motion compensation, and then video synthesis is carried out on the multi-frame vibrated image after the motion compensation, so that a stable video is obtained. Because the sample fixing device, the mark point and the sample have consistent vibration frequency in the high-temperature test process, the jitter of the sample can be effectively eliminated by correcting the mark point to eliminate the jitter, the motion estimation of the whole image is simplified into the change relation of the position of the mark point, and the processing speed and the accuracy are improved.
Drawings
FIG. 1 is a schematic side view of an apparatus for high temperature testing according to a first embodiment;
FIG. 2 is a schematic top view of the sample holding device of FIG. 1;
FIG. 3 is a schematic top view of a sample holding device of an apparatus for high temperature testing shown in accordance with a second embodiment;
FIG. 4 is one of the flow charts of the video judder removal method for the high temperature test according to the third embodiment;
fig. 5 is a second flowchart of the video jitter elimination method for the high temperature test according to the third embodiment.
Detailed Description
The following description of the embodiments of the present application is provided for illustrative purposes, and other advantages and capabilities of the present application will become apparent to those skilled in the art from the present disclosure.
In the following description, reference is made to the accompanying drawings that describe several embodiments of the application. It is to be understood that other embodiments may be utilized and that mechanical, structural, electrical, and operational changes may be made without departing from the spirit and scope of the present application. The following detailed description is not to be taken in a limiting sense, and the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
Although the terms first, second, etc. may be used herein to describe various elements in some instances, these elements should not be limited by these terms. These terms are only used to distinguish one element from another.
Also, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context indicates otherwise. It will be further understood that the terms "comprises," "comprising," "includes" and/or "including," when used in this specification, specify the presence of stated features, steps, operations, elements, components, items, species, and/or groups, but do not preclude the presence, or addition of one or more other features, steps, operations, elements, components, species, and/or groups thereof. The terms "or" and/or "as used herein are to be construed as inclusive or meaning any one or any combination. Thus, "A, B or C" or "A, B and/or C" means "any of the following: a; b; c; a and B; a and C; b and C; A. b and C ". An exception to this definition will occur only when a combination of elements, functions, steps or operations are inherently mutually exclusive in some way.
First embodiment
Fig. 1 is a schematic side view of an apparatus for high temperature testing according to a first embodiment. As shown in fig. 1, the apparatus for high temperature test of this embodiment includes a sample fixing device 11, an image collecting device 12 and an image processing device 13, wherein a side of the sample fixing device 11 facing the high temperature loading device 16 is used for fixing a sample 14, and the image collecting device 12 is connected to the image processing device 13, and may be connected wirelessly or by wire.
Optionally, the side of the sample fixing device 11 facing the high temperature loading device 16 is used for fixing the sample 14, and the side of the sample installation side is provided with the marking point 15. In this embodiment, the sample fixing device 11 includes a supporting column 111 and a fixing head 112, the supporting column 111 is connected to the fixing head 112, a side of the fixing head 112 facing the high temperature loading device 16 is used for fixing the sample 14, and the marking point 15 is disposed beside a sample mounting side of the fixing head 112. Therefore, the vibration frequencies of the sample fixing device 11, the mark point 15 and the sample 14 are consistent in the high-temperature test process, and the jitter is eliminated by correcting the mark point 15, so that the jitter of the sample 14 can be effectively eliminated. The mark points 15 are made of high-temperature-resistant composite materials, can bear ablation in a high-temperature environment and are not deformed, and the effectiveness of image acquisition in the test process is guaranteed.
Referring to fig. 1 and fig. 2, the number of the mark points 15 is at least three and is not linearly arranged, and in the present embodiment, the number of the mark points 15 is three, so that the mark points are arranged in a triangle. Therefore, the connecting line of the mark points 15 is in a planar shape, and when the position of the image collected in the high-temperature environment deviates, zooms or rotates, the jitter can be eliminated by correcting the position of the mark points 15. Alternatively, the marker 15 is colored differently from the sample holding device 11, or the center of the marker 15 is colored differently from the edge of the marker 15, and the shape of the marker 15 is preferably circular or other regular shape. Therefore, the areas of the mark points 15 can be conveniently extracted, hough transformation is carried out on the areas of the mark points 15, and the coordinates of the center positions of the mark points 15 are obtained. The basic principle of Hough transformation is to transform a curve (including a straight line) in an image space into a parameter space, determine a description parameter of the curve by detecting an extreme point in the parameter space, so as to extract a regular curve in the image, thus, by performing Hough transformation on an area of a mark point 15, an edge shape curve, namely a circular curve, of the shape of the mark point 15 can be detected, and then the coordinates of a dot, namely the coordinates of the center position of the mark point 15, are calculated through the circular curve.
The image acquisition device 12 is oriented toward the sample 14 and the mark point 15, and can acquire an image containing both the sample 14 and the mark point 15. The image capturing device 12 may be provided with a storage unit for storing the non-vibration image captured by the image capturing device 12 before the high temperature test and the multi-frame vibration image captured during the high temperature test (i.e., the image captured when the sample 14 is vibrated due to high temperature), and a wireless communication unit connected to the storage unit for transmitting the non-vibration image and the vibration image to an external device, such as the image processing device 13 or other device having data processing capability, so as to facilitate image analysis and video synthesis.
In this embodiment, the image processing device 13 is configured to obtain an un-vibration image acquired by the image acquisition device 12 before the high-temperature test and a plurality of frames of vibration images acquired during the high-temperature test, perform motion compensation on the vibration images according to the positions of the marker points 15 in the un-vibration image and the positions of the marker points 15 in the vibration images, and perform video synthesis on the motion-compensated plurality of frames of vibration images to obtain a stable video. The specific operation of the image processing apparatus 13 will be described in detail in the third embodiment.
The utility model provides an equipment for high temperature test, one side of sample fixing device is equipped with three at least nonlinear arrangement's mark point, image acquisition device's collection direction is towards sample and mark point, can gather before high temperature test not vibration image and gather multiframe vibration image when high temperature test, not vibration image and vibration image all contain sample and mark point simultaneously, through this equipment, can make sample fixing device, mark point, the sample three vibration frequency is unanimous in high temperature test process, the image that obtains through image acquisition can be applied to video jitter elimination better and handle, mark point reasonable in design, moreover, the steam generator is simple in structure.
Second embodiment
Fig. 3 is a schematic top view of a sample holding device of an apparatus for high temperature testing according to a second embodiment. As shown in fig. 3, the present embodiment is different from the first embodiment mainly in the structure of the sample holding means 21 and the position of the marker 25. In this embodiment, the sample 14 is fixed on the side of the sample fixing device 21 facing the high temperature loading device, the sample fixing device 21 is provided with a holder 213 on the sample mounting side, the sample 14 is juxtaposed with the holder 213, and the marking point 25 is provided on the side of the holder 213 facing the image pickup device. Preferably, the end of the bracket 213 facing the high temperature loading device has a streamlined structure.
For the sample 14 easy to ablate, the ablation object will continuously flow along the air flow direction in the high temperature test process, and cover the surface of the sample 14 and the sample fixing device 21, and further cover the mark point 25, therefore, by designing the sample 14 and the bracket 213 in parallel, the mark point 25 is arranged on the bracket 213, and the influence of the mark point 25 covered by the ablation object on the imaging effect can be effectively avoided, meanwhile, the end of the bracket 213 facing the high temperature loading device is a tip, the cross-sectional area of the tip is gradually increased from the end to the direction far away from the high temperature loading device, so that the influence of the high temperature air flow can be reduced, and the vibration frequencies of the bracket 213, the sample fixing device 21 and the sample 14 are basically kept consistent.
Other structures of the device applied to the high temperature test in this embodiment are the same as those of the first embodiment, and are described in detail in the description of the first embodiment, and are not repeated herein.
Third embodiment
Fig. 4 is one of the flow charts of the video judder removal method in the high temperature test according to the third embodiment. As shown in fig. 4, the video jitter elimination method of the high temperature test of the present embodiment can be applied to the image processing apparatus or other devices with data processing capability in the first embodiment, and includes the following steps:
and S10, acquiring an undilated image acquired before the high-temperature test and a multi-frame vibrated image acquired during the high-temperature test, wherein the undilated image and the vibrated image both comprise a sample and at least three non-linearly arranged marking points positioned on the sample fixing device.
Before the high-temperature test, the image acquisition device acquires at least one frame of image, the temperature is low, the sample is basically stable and does not vibrate, and the acquired image is called as an 'un-vibrated image'. After the high-temperature test is started, the image acquisition device can continuously acquire multi-frame images in the test process, at the moment, the sample generates a vibration phenomenon due to the fact that the test temperature is high, and the acquired images are called vibration images. In the non-vibration image and the vibration image, the sample and at least three non-linear arranged marking points positioned on the sample fixing device are simultaneously contained, and by adopting the equipment provided by the first embodiment and the second embodiment, the sample fixing device, the marking points and the sample can have consistent vibration frequency in the high-temperature test process, so that the relative position relationship among the sample fixing device, the marking points and the sample is fixed in each collected image.
And S20, performing motion compensation on each frame of vibration image according to the position of each mark point in the non-vibration image and the position of each mark point in each frame of vibration image.
In the vibration process, the positions of all the marking points in the vibration image are changed relative to the positions of all the marking points in the non-vibration image, and the change of the positions of the samples in the vibration image relative to the positions of the samples in the non-vibration image is corresponding to the position change of the marking points, so that the positions of the samples can be corrected by correcting the positions of the marking points, the vibration of the samples is effectively eliminated, and the problem that the vibration cannot be well eliminated by a traditional method due to high-temperature ablation or deformation of the samples is solved.
Optionally, step S20, includes:
s21, calculating the center position of each mark point in the non-vibration image;
s22, sequentially acquiring each frame of vibration image, and calculating the central position of each mark point in each frame of vibration image;
s23, calculating motion compensation parameters of each frame of vibration image according to the central position of each mark point in the non-vibration image and the central position of each mark point in each frame of vibration image, wherein the motion compensation parameters comprise at least one of rotation parameters, translation parameters and scaling parameters;
and S24, performing motion compensation on each frame of vibration image according to the motion compensation parameters of each frame of vibration image, so that each mark point in each frame of vibration image is stable relative to each mark point position in the non-vibration image.
Because the connecting line of the mark points is in a surface shape, when the position of the collected image in a high-temperature environment deviates, zooms or rotates, the motion compensation parameters can be obtained by correcting the position between the two image mark points. Optionally, the color of the marker point is different from that of the sample holding device, or the color of the center of the marker point is different from that of the edge of the marker point, and the shape of the marker point is preferably a circle or other regular shape. Therefore, the marker region can be conveniently extracted, hough transformation is carried out on the marker region, and the central position coordinates of each marker are obtained through detection. When the motion compensation parameters are calculated, according to the acquisition time of each frame of vibration image, the motion compensation parameters of the central positions of the mark points in each frame of vibration image at the corresponding time relative to the central positions of the mark points in the non-vibration image are solved through least square fitting in sequence.
And S30, performing video synthesis on the multi-frame vibration images after motion compensation to obtain stable videos.
And the positions of the mark points and the sample of each frame of vibration image after motion compensation are stable relative to the positions of the vibration images which are not subjected to motion compensation, and at the moment, the multi-frame vibration images after motion compensation are subjected to video synthesis to obtain a stable video. Because the method for correcting the mark points is adopted to eliminate the jitter, each frame of video image only needs to calculate the image transformation relation of 3 mark points, and does not need to carry out motion estimation on the whole image, thereby improving the processing speed and efficiency of the video image, having small time delay, being capable of eliminating the jitter of the real-time image and being convenient for experimental observation.
Fig. 5 is a second flowchart of the video jitter elimination method for the high temperature test according to the third embodiment. The following describes the procedure of the video jitter elimination method of the high temperature test according to the present embodiment with reference to fig. 1, fig. 2 and fig. 5.
(1) Before the high-temperature test, the sample and the image acquisition device are both in a static state, and an undilated image I0 in the initial state of the sample is acquired through the image acquisition device;
(2) extracting a marker point area from the acquired image I0;
(3) carrying out hough transformation circle detection on the marker region of the image I0 to obtain circle center coordinates PC1(x0, y0), PC2(x0, y0) and PC3(x0, y0) of the 3 markers;
(4) after the high-temperature test is started, acquiring a series of vibration images I1-In the loading process by an image acquisition device In the high-temperature loading process;
(5) processing the images I1-In the same way as In the step (2) and (3) to obtain circle center coordinates PC1(x1, y1), PC2(x1, y1), PC3(x1, y1), PC1(xn, yn), PC2(xn, yn) and PC3(xn, yn) of 3 marking points corresponding to the images I1-In the sample vibration process;
(6) according to the 3 circle center coordinates corresponding to the image I0 and the 3 circle center coordinates corresponding to the image I1, image scaling, rotation and translation parameters of the image I1 relative to the mark points of the image I0 are solved through least square fitting, and In the same way, the image scaling, rotation and translation parameters of the image In relative to the mark points of the image I0 can be solved, so that the motion compensation parameters are obtained;
(7) and motion compensation: according to the solved parameters, carrying out image scaling, rotation and translation transformation on the whole image I1-In, so that all the images I1-In are stable images relative to the image I0 finally;
(8) and performing video synthesis on the stable image to finally obtain the stable video with the jitter eliminated.
In the method for eliminating video jitter in a high temperature test, a non-vibration image collected before the high temperature test and a plurality of frames of vibration images collected during the high temperature test are obtained, the non-vibration image and the vibration images both comprise a sample and a mark point, each frame of vibration image is subjected to motion compensation according to the position of each mark point in the non-vibration image and the position of each mark point in the vibration image, and then a plurality of frames of vibration images subjected to motion compensation are subjected to video synthesis to obtain a stable video. Because the sample fixing device, the mark point and the sample have consistent vibration frequency in the high-temperature test process, the jitter of the sample can be effectively eliminated by correcting the mark point to eliminate the jitter, the motion estimation of the whole image is simplified into the change relation of the position of the mark point, and the processing speed and the accuracy are improved.
The above embodiments are merely illustrative of the principles and utilities of the present application and are not intended to limit the application. Any person skilled in the art can modify or change the above-described embodiments without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical concepts disclosed in the present application shall be covered by the claims of the present application.
Claims (10)
1. The equipment applied to the high-temperature test is characterized by comprising a sample fixing device, an image acquisition device and an image processing device, wherein the sample fixing device is used for fixing a sample for the high-temperature test, at least three marker points which are not arranged in a straight line are arranged on one side of the sample fixing device, the acquisition direction of the image acquisition device faces to the sample and the marker points, an image containing the sample and the marker points simultaneously can be acquired, and the image acquisition device is connected with the image processing device; and the image processing device is used for performing motion compensation on the vibration image acquired by the image acquisition device during the high-temperature test according to the non-vibration image acquired by the image acquisition device before the high-temperature test.
2. The apparatus for high temperature test application according to claim 1, wherein the number of the marking points is three.
3. The apparatus for high temperature testing according to claim 1, wherein the marking point is different in color from the sample holding means; or the color of the center of the mark point is different from that of the edge of the mark point.
4. The apparatus for high temperature test application according to claim 1, wherein the sample fixing device is used for fixing the sample on the side facing the high temperature loading device, and the marking point is arranged on the side of the sample mounting side.
5. The apparatus for high temperature test application according to claim 1, wherein the sample fixing device is provided with a bracket on the sample mounting side, the sample is juxtaposed with the bracket, and the marking point is provided on the side of the bracket facing the image collecting device.
6. The apparatus according to claim 1, wherein the image processing device is specifically configured to obtain the non-vibration image acquired by the image acquisition device before the high temperature test and a plurality of frames of vibration images acquired during the high temperature test, perform motion compensation on each frame of vibration image according to positions of the respective marker points in the non-vibration image and the respective marker points in each frame of vibration image, and perform video synthesis on the plurality of frames of vibration images after the motion compensation to obtain a stable video.
7. A video jitter elimination method for high temperature test is characterized by comprising the following steps:
s10, acquiring an undilated image acquired before the high-temperature test and a multi-frame vibrated image acquired during the high-temperature test, wherein the undilated image and the vibrated image both comprise a sample and at least three non-linearly arranged mark points positioned on a sample fixing device;
s20, performing motion compensation on each frame of vibration image according to the positions of the marker points in the non-vibration image and the positions of the marker points in each frame of vibration image;
and S30, carrying out video synthesis on the vibration images of the plurality of frames after motion compensation to obtain a stable video.
8. The video judder removal method in the high temperature test according to claim 7, wherein the step S20 comprises:
s21, calculating the center position of each mark point in the non-vibration image;
s22, sequentially acquiring each frame of vibration image, and calculating the central position of each mark point in each frame of vibration image;
s23, calculating motion compensation parameters of each frame of the vibration image according to the central position of each mark point in the non-vibration image and the central position of each mark point in each frame of the vibration image, wherein the motion compensation parameters comprise at least one of rotation parameters, translation parameters and scaling parameters;
and S24, performing motion compensation on each frame of vibration image according to the motion compensation parameters of each frame of vibration image, so that each mark point in each frame of vibration image is stable relative to each mark point position in the non-vibration image.
9. The video judder removal method for high temperature testing according to claim 8, wherein steps S21 and S22 respectively comprise:
extracting a mark point area;
and carrying out hough transformation on the marking point area to obtain the center position coordinates of each marking point.
10. The video judder removal method in the high temperature test as set forth in claim 8, wherein the step S23 comprises:
and according to the acquisition time of each frame of vibration image, sequentially solving the motion compensation parameters of the central position of each mark point in each frame of vibration image relative to the central position of each mark point in the non-vibration image through least square fitting.
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| CN202110425240.6A CN113194248A (en) | 2021-04-20 | 2021-04-20 | Equipment applied to high-temperature test and video jitter elimination method of high-temperature test |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113721806A (en) * | 2021-08-27 | 2021-11-30 | 北京字节跳动网络技术有限公司 | Cursor position updating method and device and electronic equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113721806A (en) * | 2021-08-27 | 2021-11-30 | 北京字节跳动网络技术有限公司 | Cursor position updating method and device and electronic equipment |
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