CN113177388B - 用于ip核测试与验证的装置、系统及方法 - Google Patents
用于ip核测试与验证的装置、系统及方法 Download PDFInfo
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- 238000012360 testing method Methods 0.000 title claims abstract description 336
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- 238000012795 verification Methods 0.000 claims abstract description 219
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CN116860536B (zh) * | 2023-09-05 | 2023-11-28 | 武汉凌久微电子有限公司 | Gpu芯片的快速ft测试系统、测试设备及测试方法 |
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CN101131710A (zh) * | 2007-09-13 | 2008-02-27 | 南京大学 | 基于可编程门阵列的低密度奇偶校验编解码硬件仿真系统 |
CN111123083A (zh) * | 2019-12-06 | 2020-05-08 | 国家电网有限公司 | 一种针对fpga pll ip核的测试系统及方法 |
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US9483266B2 (en) * | 2013-03-15 | 2016-11-01 | Intel Corporation | Fusible instructions and logic to provide OR-test and AND-test functionality using multiple test sources |
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CN101131710A (zh) * | 2007-09-13 | 2008-02-27 | 南京大学 | 基于可编程门阵列的低密度奇偶校验编解码硬件仿真系统 |
CN111123083A (zh) * | 2019-12-06 | 2020-05-08 | 国家电网有限公司 | 一种针对fpga pll ip核的测试系统及方法 |
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Address after: 100192 building 3, A District, Dongsheng science and Technology Park, Zhongguancun, 66 Haidian District West Road, Beijing. Patentee after: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee after: BEIJING INSTITUTE OF TECHNOLOGY Patentee after: INFORMATION COMMUNICATION COMPANY OF STATE GRID SHANDONG ELECTRIC POWER Co. Patentee after: Qingdao Zhixin Semiconductor Technology Co.,Ltd. Patentee after: STATE GRID CORPORATION OF CHINA Patentee after: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. Address before: 100192 building 3, A District, Dongsheng science and Technology Park, Zhongguancun, 66 Haidian District West Road, Beijing. Patentee before: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee before: BEIJING INSTITUTE OF TECHNOLOGY Patentee before: INFORMATION COMMUNICATION COMPANY OF STATE GRID SHANDONG ELECTRIC POWER Co. Patentee before: State Grid Sigi Ziguang (Qingdao) Microelectronics Technology Co.,Ltd. Patentee before: STATE GRID CORPORATION OF CHINA Patentee before: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. |