CN113175883B - 一种光谱共焦测量系统的光源归一化处理方法 - Google Patents
一种光谱共焦测量系统的光源归一化处理方法 Download PDFInfo
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- CN113175883B CN113175883B CN202110452781.8A CN202110452781A CN113175883B CN 113175883 B CN113175883 B CN 113175883B CN 202110452781 A CN202110452781 A CN 202110452781A CN 113175883 B CN113175883 B CN 113175883B
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- 238000001228 spectrum Methods 0.000 title claims abstract description 32
- 238000010606 normalization Methods 0.000 title claims abstract description 27
- 238000003672 processing method Methods 0.000 title claims abstract description 11
- 238000005259 measurement Methods 0.000 title claims description 33
- 230000003595 spectral effect Effects 0.000 claims description 61
- 239000006185 dispersion Substances 0.000 claims description 21
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- 238000012545 processing Methods 0.000 claims description 6
- 238000012360 testing method Methods 0.000 claims description 3
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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CN116147526A (zh) * | 2023-04-20 | 2023-05-23 | 华中科技大学 | 一种线光谱共焦轮廓测量传感器及方法 |
CN116447988B (zh) * | 2023-06-16 | 2023-10-31 | 宁德微图智能科技有限公司 | 一种采用宽光谱光源的三角激光测量方法 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001074790A (ja) * | 1999-09-03 | 2001-03-23 | Matsushita Electric Ind Co Ltd | スペクトル表示装置 |
JP2013024570A (ja) * | 2011-07-15 | 2013-02-04 | Semiconductor Energy Lab Co Ltd | 燐光測定方法 |
CN104344890A (zh) * | 2014-11-07 | 2015-02-11 | 西安应用光学研究所 | 微弱光信号光谱的快速测试装置及方法 |
CN206724892U (zh) * | 2017-05-27 | 2017-12-08 | 宁波九纵智能科技有限公司 | 光谱共焦位移传感器系统 |
CN107631799A (zh) * | 2017-08-14 | 2018-01-26 | 中国科学院长春光学精密机械与物理研究所 | 已知目标相对光谱分布的成像光谱仪光谱杂散光修正算法 |
CN108474645A (zh) * | 2015-12-25 | 2018-08-31 | 株式会社基恩士 | 共焦位移计 |
CN111238383A (zh) * | 2020-01-21 | 2020-06-05 | 武汉工程大学 | 基于光谱共焦的胶体三维重建与厚度测量方法和系统 |
CN211234729U (zh) * | 2019-11-12 | 2020-08-11 | 姬玉龙 | 数字化红外焦平面探测器光谱响应测试装置 |
CN112462349A (zh) * | 2020-11-20 | 2021-03-09 | 武汉烽火凯卓科技有限公司 | 一种光谱共焦位移传感器波长计算方法、系统、服务器及存储介质 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7580131B2 (en) * | 2007-04-17 | 2009-08-25 | Asml Netherlands B.V. | Angularly resolved scatterometer and inspection method |
TWI697659B (zh) * | 2017-01-16 | 2020-07-01 | 台灣超微光學股份有限公司 | 光譜量測系統、光譜量測裝置、光學量測方法與光學校正方法 |
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- 2021-04-26 CN CN202110452781.8A patent/CN113175883B/zh active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001074790A (ja) * | 1999-09-03 | 2001-03-23 | Matsushita Electric Ind Co Ltd | スペクトル表示装置 |
JP2013024570A (ja) * | 2011-07-15 | 2013-02-04 | Semiconductor Energy Lab Co Ltd | 燐光測定方法 |
CN104344890A (zh) * | 2014-11-07 | 2015-02-11 | 西安应用光学研究所 | 微弱光信号光谱的快速测试装置及方法 |
CN108474645A (zh) * | 2015-12-25 | 2018-08-31 | 株式会社基恩士 | 共焦位移计 |
CN206724892U (zh) * | 2017-05-27 | 2017-12-08 | 宁波九纵智能科技有限公司 | 光谱共焦位移传感器系统 |
CN107631799A (zh) * | 2017-08-14 | 2018-01-26 | 中国科学院长春光学精密机械与物理研究所 | 已知目标相对光谱分布的成像光谱仪光谱杂散光修正算法 |
CN211234729U (zh) * | 2019-11-12 | 2020-08-11 | 姬玉龙 | 数字化红外焦平面探测器光谱响应测试装置 |
CN111238383A (zh) * | 2020-01-21 | 2020-06-05 | 武汉工程大学 | 基于光谱共焦的胶体三维重建与厚度测量方法和系统 |
CN112462349A (zh) * | 2020-11-20 | 2021-03-09 | 武汉烽火凯卓科技有限公司 | 一种光谱共焦位移传感器波长计算方法、系统、服务器及存储介质 |
Non-Patent Citations (2)
Title |
---|
Spectral pre-processing for biomedical vibrational spectroscopy and microspectroscopic imaging;Peter Lasch;《Chemometrics and Intelligent Laboratory Systems》;20121231;第100-114页 * |
基于白光LED的光谱共焦位移传感器;王津楠等;《中国测试》;20170131;第43卷(第1期);第69-73页 * |
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