CN113138297A - Switch matrix structure for testing multichannel device and testing system - Google Patents

Switch matrix structure for testing multichannel device and testing system Download PDF

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Publication number
CN113138297A
CN113138297A CN202110557489.2A CN202110557489A CN113138297A CN 113138297 A CN113138297 A CN 113138297A CN 202110557489 A CN202110557489 A CN 202110557489A CN 113138297 A CN113138297 A CN 113138297A
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China
Prior art keywords
switch
port
pole
throw switch
channel device
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Chinese (zh)
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洪凯东
陈哲
袁涛
全智
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Shenzhen University
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Shenzhen University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/206—Switches for connection of measuring instruments or electric motors to measuring loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response

Abstract

The invention provides a switch matrix structure for testing a multi-channel device, which comprises an uplink port group for connecting test equipment and a downlink port group for connecting the multi-channel device to be tested, wherein the uplink port group is provided with at least four first ports, and each first port is composed of a first single-pole multi-throw switch; the downlink port group is provided with at least four second ports, and the second ports are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch; the input end of the first single-pole multi-throw switch is the external connection end of the first port, and the input end of the second single-pole multi-throw switch is the external connection end of the second port. After the structure is accessed, the test system can form a plurality of different test channels, and the corresponding test channels enter a working state through the switching of the switch to complete a plurality of tests.

Description

Switch matrix structure for testing multichannel device and testing system
Technical Field
The invention relates to the technical field of radio frequency testing, in particular to a switch matrix structure and a testing system for testing a multi-channel device.
Background
The traditional test of radio frequency transmission and reflection indexes is usually suitable for a two-port or four-port vector network analyzer. The current latest radio frequency communication technologies, such as 5G massive MIMO technology, WIFI 6 MU-MIMO technology, and multi-channel phased array radar in the field of national defense, have multi-channel requirements for modules and components, that is, have high requirements for reflection and transmission of channels and consistency and isolation between channels. In the product development verification stage, if verification tests are performed only on the basis of a traditional two-port or four-port network analyzer, verification of dozens of channels, even hundreds or even thousands of channels, becomes almost a bottleneck of verification; in the stage of mass production, it is also a great limitation to the productivity of the product.
In contrast, network analyzer manufacturers have also introduced test equipment with more ports, but the high selling price thereof causes the test cost to rise too much, and the multi-port test equipment is not smoothly upgraded from the traditional two-port or four-port test equipment, but is a brand-new test solution. If a multi-port network analyzer is selected for device verification or production testing, a large number of two-port or four-port network analyzers for early product testing will be discarded and left unused, which is an unacceptable cost waste for device manufacturers;
meanwhile, a test scheme for realizing multi-port equipment by using an existing two-port or four-port network analyzer and adding a switch matrix to expand ports is also provided in the market, and the test scheme is realized by adopting a method of calibrating two ports and storing a plurality of calibration states. However, since the number of the currently mainstream device ports is as large as tens of device ports or even hundreds of device ports, the test items are very large, and the calibration time becomes a very large bottleneck for the aforementioned scheme.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: a switching structure which does not affect the test result and can comprehensively utilize the existing two-port network analyzer and other equipment of an enterprise to simultaneously measure the performance of the multi-port equipment is designed.
In order to solve the technical problems, the invention adopts the technical scheme that:
a switch matrix structure for testing a multi-channel device comprises an uplink port group used for connecting test equipment and a downlink port group used for connecting the multi-channel device to be tested, wherein the uplink port group is provided with at least four first ports, and each first port is composed of a first single-pole multi-throw switch; the downlink port group is provided with at least four second ports, and the second ports are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch; the input end of the first single-pole multi-throw switch is the external connection end of the first port, and the input end of the second single-pole multi-throw switch is the external connection end of the second port.
Further, the switch matrix structure for testing the multi-channel device also comprises a switch switching controller; the input end of the first single-pole multi-throw switch is controlled to be connected or disconnected with a switch arm of the first single-pole multi-throw switch through the switch switching controller; the input end of the second single-pole multi-throw switch is controlled to be connected or disconnected with the switch arm of the second single-pole multi-throw switch through the switch switching controller.
Further, the first single-pole multi-throw switch is internally provided with a load circuit; the second single-pole multi-throw switch is internally provided with a load circuit.
Further, the number of the first single-pole multi-throw switches, the number of the switch arms of the first single-pole multi-throw switches, the number of the second single-pole multi-throw switches, and the number of the switch arms of the second single-pole multi-throw switches are all equal.
Furthermore, the uplink port group is composed of four first ports, and the downlink port group is composed of four second ports; the first single pole, multiple throw switch is SP4T and the second single pole, multiple throw switch is SP 4T.
Or further, the uplink port group is composed of eight first ports, and the downlink port group is composed of eight second ports; the first single pole, multiple throw switch is SP8T and the second single pole, multiple throw switch is SP 8T.
Further, the switch matrix structure for testing the multi-channel device also comprises a self-calibration controller which stores a self-calibration file; the signal of the second port calibrated by the self-calibration controller is output from the first port.
A test system comprises test equipment, a multi-channel device to be tested and the switch matrix structure; the test equipment is connected with the multi-channel device to be tested through the switch matrix structure.
Further, the external connection end of the first port is connected with or idled on the test equipment; and the external connection end of the second port is connected with or idled on the multi-channel device to be tested.
Furthermore, the test equipment is one or more of a two-port network analyzer, a four-port network analyzer, a signal analyzer and a signal generator; the multi-channel device to be tested is one or more of a multi-port radio frequency circuit, a multi-port filter and a multi-port antenna.
The invention has the beneficial effects that: because each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch, a plurality of different test channels can be formed, and the corresponding test channels enter a working state through the switching of the switches. Correspondingly, each switch arm of the same second single-pole multi-throw switch is also connected with one switch arm of each first single-pole multi-throw switch, namely only one test channel needs to be formed between the same first port and the same second port.
Because the load circuit is arranged in the single-pole multi-throw switch, the load insertion position does not need to be changed after the single-pole multi-throw switch is switched to another test channel in the test process.
Because the switch matrix is provided with a plurality of first ports, can connect a plurality of test equipment simultaneously, each test equipment can work simultaneously and mutual noninterference.
After each test device is inserted into the switch array and calibrated, the self-calibration controller is triggered to call the self-calibration file of the corresponding channel to perform automatic calibration respectively, namely in the test process, although the switch switching controller controls the switching to different test channels, as long as the position of the test device inserted into the switch array is unchanged, no matter how the multi-channel device to be tested is replaced, the calibration is not required to be performed again.
Drawings
The detailed structure of the invention is described in detail below with reference to the accompanying drawings
FIG. 1 is a schematic diagram of a switch matrix structure for multi-channel device testing according to the present invention;
FIG. 2 is a schematic diagram of a structural connection of a test system according to the present invention;
FIG. 3 is a second schematic diagram of the structural connection of a test system according to the present invention;
FIG. 4 is a graph of transmission coefficient results obtained from testing coaxial lines to be tested before and after using a switch matrix structure for multi-channel device testing in accordance with the present invention;
FIG. 5 is a graph of reflection coefficient results obtained from testing coaxial lines to be tested before and after using a switch matrix structure for multi-channel device testing in accordance with the present invention;
the device comprises a network analyzer 1, a signal analyzer 2, a signal generator 3, a first port 4, a first single-pole multi-throw switch 41, a first single-pole multi-throw switch 5, a switch matrix structure 6, a second port 61, a second single-pole multi-throw switch 61 and a multi-channel device to be tested 7.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example 1
Referring to fig. 1 and fig. 2, a switch matrix structure 5 for testing a multi-channel device includes an uplink port group for connecting a test apparatus and a downlink port group for connecting a multi-channel device 7 to be tested, where the uplink port group is provided with at least four first ports 4, and the first ports 4 are formed by first single-pole multi-throw switches; the downlink port group is provided with at least four second ports 6, and the second ports 6 are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch 41 is connected with one switch arm of each second single-pole multi-throw switch 61; the input end of the first single-pole multi-throw switch 41 is the external connection end of the first port 4, and the input end of the second single-pole multi-throw switch 61 is the external connection end of the second port 6. That is, the test channel path is the port of the test equipment-the input terminal of the first single-pole multi-throw switch 41-the switch arm of the second single-pole multi-throw switch 61-the input terminal of the second single-pole multi-throw switch 61-the port of the multi-channel device under test.
Since each switch arm of the same first single-pole multi-throw switch 41 is connected to one switch arm of each second single-pole multi-throw switch 61, a plurality of different test channels can be formed, and the corresponding test channels enter a working state by switching the switches. Correspondingly, each switch arm of the same second single-pole multi-throw switch 61 is also connected with one switch arm of each first single-pole multi-throw switch 41, i.e. only one test channel needs to be formed between the same first port 4 and the same second port 6.
Because the switch matrix is provided with a plurality of first ports 4, can connect a plurality of test equipment simultaneously, each test equipment can work simultaneously and mutual noninterference.
Example 2
On the basis of the structure, the switch matrix structure for testing the multi-channel device also comprises a switch switching controller; the input end of the first single-pole multi-throw switch 41 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the first single-pole multi-throw switch 41; the input end of the second single-pole multi-throw switch 61 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the second single-pole multi-throw switch 61. The switch switching controller is used for controlling the automatic switching to different testing channels, so that the testing process is accelerated.
Example 3
In addition to the above structure, the first single-pole-multi-throw switch 41 has a load circuit built therein; the second single-pole multi-throw switch 61 has a built-in load circuit, so that the load insertion position does not need to be changed after the switch is switched to another test channel in the test process.
Example 4
In addition to the above configuration, the number of the first single-pole multi-throw switches 41, the number of the switch arms of the first single-pole multi-throw switches 41, the number of the second single-pole multi-throw switches 61, and the number of the switch arms of the second single-pole multi-throw switches 61 are all equal.
Example 5
On the basis of the above structure, the upstream port group is composed of four first ports 4, and the downstream port group is composed of four second ports 6; the first single-pole multi-throw switch 41 is SP4T, and the second single-pole multi-throw switch 61 is SP 4T. At this time, a 4 × 4 switch matrix is formed, for a total of 16 test channels. The SP4T can be a commercially available product with a keysight 87104D or R594843417 model, a built-in load circuit is arranged in the SP, the working range reaches 40GHz, and the SP can be used for testing high-frequency radio frequency such as a millimeter wave antenna.
Example 6
In addition to the structure of embodiment 4, the upstream port group includes eight first ports 4, and the downstream port group includes eight second ports 6; the first single-pole multi-throw switch 41 is SP8T, and the second single-pole multi-throw switch 61 is SP 8T. At this time, an 8 × 8 switch matrix is formed, for 64 test channels. The SP8T can be selected from a commercially available product of MC88T-S18L24-0D model, and a built-in load circuit can be used for testing low-frequency radio frequency.
Example 7
On the basis of the structure, the switch matrix structure 5 for testing the multi-channel device further comprises a self-calibration controller storing a self-calibration file; the signal of the second port 6 calibrated by the self-calibration controller is output from the first port 4.
The self-calibration file is formed by the following method:
referring to FIG. 3, assume that the switch matrix is not connectedUnder the condition of the structure 5 and good calibration of the two ports of the network analyzer 1, the test data of the ith and jth ports of the multi-channel device to be tested is CiAnd Cj. Self-calibration file B with switch matrix structure 1 for ith and jth channelsiAnd Bj. When the two first ports 4 corresponding to the ith and jth channels are connected with the network analyzer 1, the two second ports 6 corresponding to the ith and jth channels are connected with the multi-channel device 7 to be tested. The result obtained in this test is AiAnd Aj。
In summary, the cascade principle of the multi-stage microwave network can be known as follows: a. thei＝BiCi
Then: b isi＝AiCi -1
The following can be obtained by the same method: b isj＝AjCj -1
By the method, the self-calibration file B of the ith and jth channels in the switch matrix can be obtainediAnd Bj。
Before use, the device to be tested 7 and the two-port network analyzer 1 which have known results and are used for calibration are accessed for calibration, the result displayed by the two-port network analyzer 1 is calibrated to be the result of the device to be tested 7 and used for calibration, and the self-calibration device is triggered to call the self-calibration file of the corresponding channel. After the device to be tested 7 is replaced, the result displayed by the two-port network analyzer 1 is the actual result of the device to be tested, i.e. the two-port network analyzer only needs to be calibrated once in the test system of the present invention.
In summary, after calibration, each test device is inserted into any first port 4 of the switch array structure 5, that is, the self-calibration controller is triggered to call the self-calibration file of the corresponding channel for automatic calibration, and during the test process, although the switch switching controller controls switching to a different test channel, calibration is not required again.
Example 8
Referring to fig. 2, a test system includes a test apparatus, a multi-channel device to be tested 7, and the switch matrix structure 5; the test equipment is connected with the multi-channel device to be tested through the switch matrix structure 5.
Example 9
On the basis of the structure, the external connection end of the first port 4 is connected with the test equipment or is idle; and the external connection end of the second port 6 is connected with or idled on the multi-channel device to be tested 7.
Example 10
On the basis of the structure, the test equipment is one or more of a two-port network analyzer 1, a four-port network analyzer, a signal analyzer 2 and a signal generator 3; the multi-channel device to be tested 7 is one or more of a multi-port radio frequency circuit, a multi-port filter and a multi-port antenna.
The switch switching controller can be remotely controlled, so that the switch matrix structure 5 provided by the invention can fully use the existing test equipment of an enterprise, avoid frequent calibration work, reduce the investment of manpower and material resources and improve the productivity.
To further discuss the feasibility of the present invention, the following test examples were used for comparative testing, and the results before and after insertion of the following test examples are shown in detail in fig. 4 and 5:
test example
A test system comprises a two-port network analyzer 1, a coaxial line to be tested and a switch matrix structure 5; the two-port network analyzer 1 is connected with the coaxial line to be tested through the switch matrix structure 5.
The switch matrix structure 5 comprises an uplink port group for connecting test equipment, a downlink port group for connecting a multichannel device to be tested 7, a switch switching controller and a self-calibration controller stored with a self-calibration file, wherein the uplink port group is provided with four first ports 4, and the first ports 4 are formed by first single-pole multi-throw switches 41; the downstream port group is provided with four second ports 6, and the second ports 6 are formed by a second single-pole multi-throw switch 61; each switch arm of the same first single-pole multi-throw switch 41 is connected with one switch arm of each second single-pole multi-throw switch 61; the input end of the first single-pole multi-throw switch 41 is the external connection end of the first port 4, and the input end of the second single-pole multi-throw switch 61 is the external connection end of the second port 6.
The input end of the first single-pole multi-throw switch 41 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the first single-pole multi-throw switch 41; the input end of the second single-pole multi-throw switch 61 is controlled by the switch switching controller to be connected with or disconnected from the switch arm of the second single-pole multi-throw switch 61. The first single-pole multi-throw switch 41 has a load circuit built therein; the second single-pole-multiple-throw switch 61 has a load circuit built therein.
The first single-pole multi-throw switch 41 is SP4T, and the second single-pole multi-throw switch 61 is SP 4T. The SP4T model is keysight 87104D.
And inserting the two-port network analyzer 1 into any two first ports 4 on the switch matrix structure 5, and leaving the other two first ports 4 idle. And inserting the coaxial line to be tested on any one second port 6 on the switch matrix structure 5, and leaving the other three second ports 6 unused.
The transmission coefficient and the reflection coefficient of the coaxial line were tested according to the test example structure, and the results are shown in detail in the RD8_ THRU curve in fig. 4 and the RD8_ THRU _ R curve in fig. 5.
Comparative example
The coaxial line to be tested in the test example is directly inserted into the port of the two-port network analyzer 1, and the transmission coefficient and the reflection coefficient of the coaxial line are directly tested, and the result is shown in detail in the VNA _ THRU curve in fig. 4 and the VNA _ THRU _ R curve in fig. 5.
As can be seen from fig. 4, the transmission coefficient results tested in the two cases of the test example and the comparative example are very consistent, and at 10.06GHz, the difference between the two cases is only 0.024dB (VNA _ THRU-2.349 dB, RD8_ THRU-2.325 dB), which indicates that the testing method of loading the switch matrix proposed by the present invention hardly affects the testing results of the multi-channel device to be tested.
As can be seen from fig. 5, the reflection coefficient results tested in the cases of the test example and the comparative example are very consistent at a wide frequency band of 0-20GHz, and at 13.77GHz, the difference between the two is only 0.049dB (VNA _ THRU _ R is 17.745dB, RD8_ THRU _ R is 17.696dB), which indicates that the testing method of loading the switch matrix proposed by the present invention hardly affects the testing results of the multi-channel device to be tested.
In summary, the switch matrix structure for testing a multi-channel device provided by the present invention is applied to a test system, when the switch matrix structure is used for calibrating a first test device, the self-calibration controller can be triggered, and the other test devices can be directly accessed. The device to be tested of multiple ports can be quickly tested under the condition that the test equipment is calibrated at one time, the test verification efficiency is greatly improved, the development period can be shortened in the product development verification stage, and the product productivity can be improved in the product mass production test stage. In addition, the test of the multi-port device to be tested can be completed by directly adopting the existing test equipment, and the investment of the production equipment cost is reduced.
The first … … and the second … … are only used for name differentiation and do not represent how different the importance and position of the two are.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (10)

1. A switch matrix structure for testing a multi-channel device comprises an uplink port group for connecting test equipment and a downlink port group for connecting the multi-channel device to be tested, and is characterized in that the uplink port group is provided with at least four first ports, and each first port is composed of a first single-pole multi-throw switch; the downlink port group is provided with at least four second ports, and the second ports are formed by second single-pole multi-throw switches; each switch arm of the same first single-pole multi-throw switch is respectively connected with one switch arm of each second single-pole multi-throw switch; the input end of the first single-pole multi-throw switch is the external connection end of the first port, and the input end of the second single-pole multi-throw switch is the external connection end of the second port.
2. The switch matrix structure for multi-channel device testing of claim 1, further comprising a switch switching controller; the input end of the first single-pole multi-throw switch is controlled to be connected or disconnected with a switch arm of the first single-pole multi-throw switch through the switch switching controller; the input end of the second single-pole multi-throw switch is controlled to be connected or disconnected with the switch arm of the second single-pole multi-throw switch through the switch switching controller.
3. The switch matrix structure for multi-channel device testing of claim 2, wherein the first single pole, multi-throw switch has a load circuit built in; the second single-pole multi-throw switch is internally provided with a load circuit.
4. The switch matrix structure for multi-channel device testing of claim 3, wherein the number of switch arms of the first single pole multi-throw switch, the number of switch arms of the second single pole multi-throw switch, and the number of switch arms of the second single pole multi-throw switch are all equal.
5. The switch matrix structure for multi-channel device testing of claim 4, wherein said upstream port set is comprised of four of said first ports and said downstream port set is comprised of four of said second ports; the first single pole, multiple throw switch is SP4T and the second single pole, multiple throw switch is SP 4T.
6. The switch matrix structure for multi-channel device testing of claim 4, wherein said upstream port set is comprised of eight of said first ports and said downstream port set is comprised of eight of said second ports; the first single pole, multiple throw switch is SP8T and the second single pole, multiple throw switch is SP 8T.
7. The switch matrix structure for multi-channel device testing of any of claims 1 to 6, further comprising a self-calibration controller storing a self-calibration file; the signal of the second port calibrated by the self-calibration controller is output from the first port.
8. A test system comprising test equipment, a multi-channel device under test and a switch matrix structure as claimed in any one of claims 1 to 7; the test equipment is connected with the multi-channel device to be tested through the switch matrix structure.
9. The test system of claim 8, wherein the terminated end of the first port is connected to or idle with the test equipment; and the external connection end of the second port is connected with or idled on the multi-channel device to be tested.
10. The test system according to any one of claims 8 or 9, wherein the test equipment is one or more of a two-port network analyzer, a four-port network analyzer, a signal analyzer, and a signal generator; the multi-channel device to be tested is one or more of a multi-port radio frequency circuit, a multi-port filter and a multi-port antenna.
CN202110557489.2A 2021-05-21 2021-05-21 Switch matrix structure for testing multichannel device and testing system Pending CN113138297A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4336192A1 (en) * 2022-09-06 2024-03-13 Rohde & Schwarz GmbH & Co. KG Measurement device and method for operating a measurement device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4336192A1 (en) * 2022-09-06 2024-03-13 Rohde & Schwarz GmbH & Co. KG Measurement device and method for operating a measurement device

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