CN113137150A - Push-pull structure and opening and closing degree detection method thereof - Google Patents
Push-pull structure and opening and closing degree detection method thereof Download PDFInfo
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- CN113137150A CN113137150A CN202110457223.0A CN202110457223A CN113137150A CN 113137150 A CN113137150 A CN 113137150A CN 202110457223 A CN202110457223 A CN 202110457223A CN 113137150 A CN113137150 A CN 113137150A
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- 238000001514 detection method Methods 0.000 title claims abstract description 194
- 238000000034 method Methods 0.000 claims description 25
- 238000005096 rolling process Methods 0.000 claims description 10
- 238000012360 testing method Methods 0.000 description 18
- 238000010586 diagram Methods 0.000 description 6
- 239000004020 conductor Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 230000008859 change Effects 0.000 description 4
- 239000011810 insulating material Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
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- E—FIXED CONSTRUCTIONS
- E05—LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
- E05D—HINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
- E05D15/00—Suspension arrangements for wings
- E05D15/06—Suspension arrangements for wings for wings sliding horizontally more or less in their own plane
- E05D15/0621—Details, e.g. suspension or supporting guides
- E05D15/0626—Details, e.g. suspension or supporting guides for wings suspended at the top
- E05D15/0652—Tracks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
Abstract
The utility model provides a push-and-pull structure and detection method of degree of opening and shutting thereof, push-and-pull structure includes: a plate, a top or bottom of the plate comprising a partially conductive surface; a slide rail slidably connected to the plate-like member, a surface of the slide rail contacting the conductive surface including at least one set of detection contacts, each set of detection contacts including a plurality of detection contacts; the detection contact is sequentially contacted with the conductive surface along with the movement of the plate-shaped member. According to the technical scheme, when the opening and closing degree of the push-pull structure is detected, the push-pull structure is not easily interfered by external factors, and the accuracy of a detection result is greatly improved.
Description
Technical Field
The application relates to the field of installation accessories, in particular to a push-pull structure and a method for detecting opening and closing degree of the push-pull structure.
Background
In the traditional door industry, a detection mode for detecting door shadow or identifying the opening and closing degree of the door does not exist at present, so that the situation that a person walks to open the door often occurs in the actual application scene of the door. At present, the common industry detection mode is generally a mode of using a Hall device or a distance sensor and the like, but the Hall device is easily interfered by a magnetic device, and the Hall device is easily failed after being used for a long time. When the distance sensor is used for detection, the distance sensor is easily interfered by external factors, for example, if a foreign object is shielded, the detection structure is inaccurate.
Disclosure of Invention
The technical problem that this application scheme will be solved is that the mode of current detection door degree of opening and shutting easily receives external factor to disturb, and the testing result is inaccurate.
In order to solve the technical problem, the present application discloses a push-pull structure, including: a plate, a top or bottom of the plate comprising a partially conductive surface; a slide rail slidably connected to the plate-like member, a surface of the slide rail contacting the conductive surface including at least one set of detection contacts, each set of detection contacts including a plurality of detection contacts; the detection contact is sequentially contacted with the conductive surface along with the movement of the plate-shaped member.
In some embodiments of the present application, the detection contacts of the same detection contact group equally divide the maximum distance the plate-like member can move into several portions.
In some embodiments of the present application, the electrically conductive surface is located on a top surface or a bottom surface of the plate.
In some embodiments of the present application, the bottom of the plate is mounted with a rolling member, and the surface of the rolling member is a conductive surface.
In some embodiments of the present application, a length of the conductive surface in a moving direction of the plate member is not less than a distance between adjacent detection contacts in the same group of detection contacts.
In some embodiments of the present application, the detection contact is electrically connected to a microcontroller for detecting the level of the detection contact.
In some embodiments of the present application, the conductive surface and each of the detection contacts are electrically connected to a microcontroller, an interface of the conductive surface and the microcontroller is an output port for outputting detection data, and an interface of each of the detection contacts and the microcontroller is an input port for receiving the detection data.
In order to solve the technical problem, the present application further discloses a method for detecting an opening/closing degree of the push-pull structure, including: and acquiring the opening and closing degree of the push-pull structure according to the level of the contact.
In some embodiments of the present application, the conductive surface is grounded and the detection contact is connected to the same power source; the method for acquiring the opening and closing degree of the push-pull structure comprises the following steps: and confirming that the level of the Nth detection contact is pulled down and the level of the (N + 1) th detection contact is not changed, wherein N is more than or equal to 1, and the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
In some embodiments of the present application, the conductive surface is connected to a power source and the sensing contact is connected to ground; the method for acquiring the opening and closing degree of the push-pull structure comprises the following steps: and confirming that the level of the Nth detection contact is pulled high and the level of the (N + 1) th detection contact is not changed, wherein N is more than or equal to 1, and the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
In order to solve the technical problem, the present application further discloses a method for detecting an opening/closing degree of the push-pull structure, where the method includes: and acquiring the opening and closing degree of the push-pull structure according to the detection data received by the input port and the detection data output by the output port.
In some embodiments of the present application, the obtaining the opening and closing degree of the push-pull structure includes: and confirming that the detection data received by the input port of the Nth detection contact is consistent with the detection data output by the output port, and the input port of the (N + 1) th detection contact has no data, wherein N is more than or equal to 1, so that the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
Compared with the prior art, the technical scheme of the application has at least the following beneficial effects:
the push-pull structure comprises a plate-shaped part and a sliding rail connected with the plate-shaped part in a sliding mode, wherein a partial conductive surface is arranged at the top or the bottom of the plate-shaped part, at least one group of detection contact sets are arranged on the surface, in contact with the conductive surface, of the sliding rail, and the detection contacts of the same detection contact set can be sequentially contacted with the conductive surface along with the movement of the plate-shaped part, so that the level of the detection contacts is changed, and the detection of the opening and closing degree of the plate-shaped part can be realized through the change of the level.
According to the method for detecting the opening and closing degree of the push-pull structure, the opening and closing degree of the push-pull structure can be obtained according to the level of the contact point, the detection process is not easily interfered by external factors, the accuracy of the detection result is greatly improved, and the detection process is simple and easy to operate.
On the other hand, the conductive surface and the detection contacts are electrically connected with the microcontroller, the interface of the conductive surface connected with the microcontroller is set as an output port for outputting detection data, the interface of the detection contacts connected with the microcontroller is set as an input port for receiving the detection data, the opening and closing degree of the push-pull structure can be known by comparing the detection data received by the input port with the detection data output by the output port, and meanwhile, the detection data of the output port and the input port can be collected in real time, so that the opening and closing degree of the push-pull structure can be monitored in real time.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a push-pull configuration according to an embodiment of the present application;
FIG. 2 is a schematic structural view (viewed from the bottom) of a plate member according to an embodiment of the present application;
fig. 3 is a schematic structural view (viewed from a top view) of a sliding rail according to an embodiment of the present application;
fig. 4 is a schematic structural view (viewed from a top view) of another sliding rail according to the embodiment of the present application;
FIG. 5 is a schematic diagram of a circuit for detecting an opening/closing degree of a push-pull structure according to an embodiment of the present disclosure;
FIG. 6 is a schematic diagram of a circuit for detecting an opening/closing degree of another push-pull structure according to an embodiment of the present disclosure;
fig. 7 is a schematic diagram of a circuit for detecting an opening/closing degree of another push-pull structure according to an embodiment of the present disclosure.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description of the present application, it is to be understood that the terms "upper", "lower", "top", "bottom", and the like, as used herein, refer to an orientation or positional relationship illustrated in the drawings, which is for convenience in describing the present application and simplifying the description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered limiting of the present application. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, a feature defined as "first", "second", may explicitly or implicitly include one or more of that feature. Moreover, the terms "first," "second," and the like are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein.
In view of hall device and distance sensor when detecting whether the door is the virtual cover or the degree of opening and shutting, be easily disturbed by external factor, lead to the testing result inaccurate. Therefore, the technical scheme of the application provides a push-pull structure and a detection method of opening and closing degree thereof, and the bottom of the plate-shaped part comprises a conductive surface, and the detection contact is arranged on the sliding track, so that the plate-shaped part can cause level change of the detection contact in the moving process, and further the opening and closing degree of the plate-shaped part is judged, the detection process is not interfered by external factors, and the accuracy of the detection result is improved.
The technical solution of the present application will be described in detail below with reference to the accompanying drawings and examples.
Referring to fig. 1, the push-pull structure 100 of the embodiment of the present application may be a common device that requires a push-pull operation to achieve opening and closing, such as a sliding door, a sliding window, a sliding cabinet, and the like, and is described below by taking the sliding door as an example. The push-pull structure 100 includes a plate 110 and a sliding rail 120, wherein the sliding rail 120 is slidably connected to the plate 110 to provide a guide for the movement of the plate 110. For example, the plate 110 may be a door, and the sliding assembly 120 may be a door slide.
Referring to fig. 2, in some embodiments, the top and bottom of the plate 110 are planar and the top or bottom of the plate 110 includes a conductive surface a and a non-conductive surface B. The conductive surface a is a surface having conductivity, and the non-conductive surface B is a surface having no conductivity, that is, an insulating surface. In some embodiments, the material of the plate-like member 110 is a conductive material, and is covered with an insulating film only at the non-conductive surface B. In some embodiments, the material of the plate-shaped member 110 is an insulating material, and only the conductive surface a is covered with a conductive film. In some embodiments, the structure of a part of the plate-like member 110 including the conductive surface a (the structure does not include the non-conductive surface B) is made of a conductive material, and the structure of the rest of the plate-like member 110 including the non-conductive surface B (the structure does not include the conductive surface a) is made of an insulating material. The conductive material and the insulating material may be selected from a common material type.
In some embodiments, the conductive surface a is located on a top surface or a bottom surface of the plate 110. The size of the conductive surface a and the specific position of the conductive surface a on the top surface or the bottom surface of the plate-like member 110 need to satisfy the following conditions: when the plate member 110, such as a door, moves from the closed state to the maximum width, all the sensing contacts TP (refer to fig. 3) can be sequentially brought into contact with the conductive surface a, and the conductive surface a is sized to simultaneously contact at least two sensing contacts TP. In the embodiment of the present application, the conductive surface is a quadrilateral, and the length of the conductive surface a in the moving direction of the plate-shaped member 110 is not less than the distance between adjacent detection contacts TP in the same group of detection contacts.
In some embodiments of the present application, in order to reduce the damping phenomenon, a rolling member, such as a roller, may be installed at the bottom of the plate member 110, and the rolling member may roll in the sliding rail 120, thereby achieving the movement of the plate member 110. In order to detect the opening and closing width of the plate member 110, the surface of the rolling member is made conductive, and in some embodiments, the rolling member is made of a conductive material. In other embodiments, the rolling members may be an insulating material, and the surfaces of the rolling members are coated with a conductive material.
Referring to fig. 3, the sliding rail 120 is schematically shown in a top view. The surface of the slide rail 120 contacting the conductive surface a includes at least one set of sensing contacts, each set of sensing contacts includes a plurality of sensing contacts TP, and the sensing contacts TP have conductivity. Fig. 3 shows the case where a set of test contacts is included and there are 10 test contacts TP in total. In other embodiments, two or more sets of sensing contacts may be included. The greater the number of test contacts TP per test contact set, the higher the test accuracy. Ideally, the number of the detection contacts TP can be increased without limitation to accurately position the plate-like member. The detection contacts TP of the same detection contact group equally divide the maximum movable distance of the plate-like member 110 into several parts, and each detection contact TP represents a distance capable of representing the opening and closing width of the plate-like member 110.
During detection, all detection contacts TP are connected with the same power supply, the conductive surface A is grounded, or all detection contacts TP are grounded, and the conductive surface is connected with the power supply. When the plate member 110 is not moved, for example, when the door is closed, the first sensing contact TP1 of the sensing contact set is in contact with the conductive surface a. With the movement of the plate-shaped member 110, the remaining detection contacts TP sequentially contact the conductive surface a, and the level of the detection contacts TP contacting the conductive surface a changes, so that the opening and closing degree of the plate-shaped member 110 can be known by detecting the level change of the detection contacts TP.
Referring to fig. 4, in some embodiments, the surface of the sliding rail 120 contacting the conductive surface a includes at least two sets of detection contacts, only two sets of detection contacts are shown, and when three, four or more sets of detection contacts are included, the detection contacts may be arranged in parallel and offset. By increasing the number of detection contact groups, detection accuracy can be improved. For example, the maximum opening/closing width of the door is 50cm, if two sets of detection contact sets are provided, one detection contact set (e.g., the lower set in fig. 4) includes ten detection contacts P, and the opening/closing widths of the door represented by the first detection contact to the tenth detection contact are 5cm, 10cm, 15cm, 20cm, 25cm, 30cm, 35cm, 40cm, 45cm, and 50cm, respectively. The other set of sensing contacts (the upper set in fig. 4) includes nine sensing contacts, and the opening and closing widths of the door represented by the first sensing contact to the ninth sensing contact are 7.5cm, 12.5cm, 17.5cm, 22.5cm, 27.5cm, 32.5cm, 37.5cm, 42.5cm, and 47.5cm, respectively. If the moving width of the door corresponds to a certain width between adjacent detection contacts, for example, when the door rotates to 12.5cm, the result of detection through the detection contact group of the lower group is that the opening and closing width of the door is between 10cm and 15 cm; if the detection contact group of the upper group is combined, the opening and closing width result of the door can be directly accurate to 12.5 cm.
Referring to fig. 5, the detection contact TP is electrically connected to a microcontroller MCU for detecting a level of the detection contact TP, and the microcontroller MCU may be disposed on the plate 110 (e.g., a door) or may be independently present outside the plate 110. The structure of the microcontroller MCU is not limited in the embodiment of the application, the structure can be any one of the existing microcontroller MCU structures, and only the readable and writable test interface GPIO is required to be ensured on the microcontroller MCU. Specifically, the microcontroller MCU includes n test interfaces, which are GPIO1, GPIO2, GPIO3, and GPIO, respectively, and the detection contact TP1, the detection contact TP2, and the detection contact TP3, and the detection contact TPn are respectively connected to the corresponding test interfaces. During detection, the detection contact TP1, the detection contact TP2 and the detection contact TP3 are connected with a power supply VCC, and the conductive surface A is grounded to form a detection loop. When the gate is in the closed state, the level detected at GPIO2, GPIO3, the GPIOn interface should be high and the level detected at GPIO1 interface should be low, since the detection contact TP1 contacts the conductive surface a when the gate is closed, so that the level at the GPIO1 interface is pulled low.
If it is detected that the level at the GPIO3 interface is pulled low and the level at the GPIO4 interface is not changed, it is proved that the 3 rd detection contact TP3 contacts the conductive surface a, the width of the opened and closed door is between the width of the opened and closed door represented by the detection contact TP4 and the width of the opened and closed door represented by the detection contact TP4, for example, the width of the opened and closed door represented by the detection contact TP3 is 15cm, the width of the opened and closed door represented by the detection contact TP4 is 20cm, and the width of the opened and closed door is 15cm-20cm as a final detection result.
Referring to fig. 6, during testing, test contact TP1, test contact TP2, test contact TP3, the test contact TPn may also be grounded, and conductive surface a may be connected to power source VCC. In this case, when the gate is in the closed state, the level detected at the GPIO2, the GPIO3, the GPIOn interface should be low, and since the detection contact TP1 is in contact with the conductive surface a, the level at the GPIO1 interface is pulled high, the level detected at the GPIO1 interface should be high, and the detection method is slightly different. For example, if the level at the GPIO3 interface is detected to be pulled high and the level at the GPIO4 interface is not changed, indicating that the 3 rd test contact TP3 contacts the conductive surface a, the width of the door opening/closing is between the width of the door opening/closing represented by the test contact TP3 and the width of the door opening/closing represented by the test contact TP 4.
Referring to fig. 7, in some embodiments, the microcontroller MCU includes a GPIO0 interface, the GPIO0 interface connects the conductive surface a and to a power supply, the GPIO0 interface is provided as an output port for outputting detection data, and the GPIO1, GPIO2, GPIO3, gpio.a., GPIOn interface on the microcontroller MCU connects the detection contacts TP1, TP2, TP3, gpio.a., TPn in parallel with ground, and the GPIO1, GPIO2, GPIO3, gpio.a., GPIO interface is provided as an input port for receiving the detection data. When the door moves for a certain width, the GPIO0 interface outputs preset detection data, and then compares whether the detection data received by the GPIO1, the GPIO2, the GPIO3, the GPIO. In some embodiments, the detection data of the GPIO0, the GPIO1, the GPIO2, the GPIO3, the.
Correspondingly, the embodiment of the application also provides a method for detecting the opening and closing degree of the push-pull structure, and a schematic diagram of a detection circuit is shown in fig. 5. The detection method obtains the opening and closing degree of the push-pull structure according to the level of the contact.
The detection method is slightly different depending on the connection mode of the conductive surface and the detection contact. When detecting, the conductive surface is grounded, the detection contact is connected with the same power supply, and the opening and closing degree of the push-pull structure is obtained by the following method: and confirming that the level of the Nth detection contact is pulled down and the level of the (N + 1) th detection contact is not changed, wherein N is more than or equal to 1, and the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact. Of course, in order to avoid misjudgment, the level of the (N + 2) th detection contact may be read, the level of the (N-1) th detection contact may be read, or the levels of all detection contacts may be read for judgment.
For example, a group of detection contacts includes ten detection contacts, and the opening and closing widths of the door represented by the first detection contact to the tenth detection contact are 5cm, 10cm, 15cm, 20cm, 25cm, 30cm, 35cm, 40cm, 45cm, and 50cm, respectively. If the level of the 4 th detection contact is pulled down and the level of the 5 th detection contact is not changed, the opening and closing width of the door is between 20cm and 25 cm. In order to avoid misjudgment, the level of the 6 th detection contact to the 10 th detection contact is not changed, so that the opening and closing width of the door is verified to be between 20cm and 25 cm. Multiple determinations, such as confirming whether the level of the 3 rd sense contact is pulled low, may also be made to further verify.
Referring to fig. 6, if the conductive surface is connected to a power supply and the detection contact is grounded during detection, the method for obtaining the opening and closing degree of the push-pull structure includes: and confirming that the level of the Nth detection contact is pulled high and the level of the (N + 1) th detection contact is not changed, wherein N is more than or equal to 1, and the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact. In some embodiments, to avoid misjudgment, the level of the (N + 2) th detection contact point may be read, the level of the (N-1) th detection contact point may be read, or the levels of all detection contact points may be read for judgment.
For example, a group of detection contacts includes ten detection contacts, and the opening and closing widths of the door represented by the first detection contact to the tenth detection contact are 5cm, 10cm, 15cm, 20cm, 25cm, 30cm, 35cm, 40cm, 45cm, and 50cm, respectively. If the level of the 2 nd detection contact is pulled high and the level of the 3 rd detection contact is not changed, the opening and closing width of the door is between 10cm and 15 cm. In order to avoid misjudgment, the level from the 4 th detection contact to the 10 th detection contact can be confirmed not to change, so as to further verify that the opening and closing width of the door is between 10cm and 15cm, or whether the level of the 1 st detection contact is pulled high can be confirmed, so as to further verify.
The application also provides another method for detecting the opening and closing degree of the push-pull structure, and the schematic diagram of the detection circuit is shown in fig. 7. The detection method comprises the following steps: and acquiring the opening and closing degree of the push-pull structure according to the detection data received by the input port and the detection data output by the output port.
In an embodiment of the present application, the acquiring the opening and closing degree of the push-pull structure includes: and confirming that the detection data received by the input port of the Nth detection contact is consistent with the detection data output by the output port, and the input port of the (N + 1) th detection contact has no data, wherein N is more than or equal to 1, so that the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
Assuming that the plate-shaped member moves by a certain width, the GPIO0 interface sends out detection data 01100001, and the comparison determines that the data received by the GPIO3 interface is also 01100001, and meanwhile, there is no data at the GPIO4 interface, it can be considered that the opening and closing width of the plate-shaped member is between the opening and closing width represented by the contact point TP3 and the opening and closing width represented by the contact point TP 4.
By adopting the push-pull structure and the method for detecting the opening and closing degree of the push-pull structure, the opening and closing width range of the plate-shaped part can be quickly and accurately obtained, and the opening and closing width range displayed by the detection result can be further reduced by increasing the detection contact, so that the plate-shaped part is positioned more accurately; meanwhile, the detection process is not interfered by external factors, and the accuracy of the detection result is greatly improved.
In conclusion, upon reading the present detailed disclosure, those skilled in the art will appreciate that the foregoing detailed disclosure can be presented by way of example only, and not limitation. Those skilled in the art will appreciate that the present application is intended to cover various reasonable variations, adaptations, and modifications of the embodiments described herein, although not explicitly described herein. Such alterations, improvements, and modifications are intended to be suggested by this disclosure, and are within the spirit and scope of the exemplary embodiments of this disclosure.
Claims (12)
1. A push-pull configuration, comprising:
a plate, a top or bottom of the plate comprising a partially conductive surface;
a slide rail slidably connected to the plate-like member, a surface of the slide rail contacting the conductive surface including at least one set of detection contacts, each set of detection contacts including a plurality of detection contacts;
the detection contact is sequentially contacted with the conductive surface along with the movement of the plate-shaped member.
2. The push-pull configuration as claimed in claim 1, wherein the sensing contacts of the same sensing contact group equally divide the maximum distance the plate-like member can move into several parts.
3. The push-pull configuration as claimed in claim 1, wherein the conductive surface is located on a top surface or a bottom surface of the plate.
4. The push-pull structure as claimed in claim 1, wherein a rolling member is installed at a bottom of the plate member, and a surface of the rolling member is a conductive surface. A
5. The push-pull configuration as claimed in claim 1, wherein the length of the conductive surface in the moving direction of the plate member is not less than the distance between adjacent ones of the sensing contacts in the same set of sensing contacts.
6. Push-pull configuration as claimed in claim 1, characterized in that the detection contact is electrically connected to a microcontroller for detecting the level of the detection contact.
7. The push-pull configuration as claimed in claim 1, wherein the conductive surface and each of the sensing contacts are electrically connected to a microcontroller, and wherein the interface of the conductive surface to the microcontroller is an output port for outputting sensing data, and the interface of each of the sensing contacts to the microcontroller is an input port for receiving the sensing data.
8. A method for detecting an opening/closing degree of a push-pull structure according to any one of claims 1 to 6, comprising: and acquiring the opening and closing degree of the push-pull structure according to the level of the contact.
9. The method for detecting the opening/closing degree of a push-pull structure according to claim 8, wherein the conductive surface is grounded, and the detection contacts are connected to a same power supply; the method for acquiring the opening and closing degree of the push-pull structure comprises the following steps:
and confirming that the level of the Nth detection contact is pulled down and the level of the (N + 1) th detection contact is not changed, wherein N is more than or equal to 1, and the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
10. The method for detecting the opening/closing degree of a push-pull structure according to claim 8, wherein the conductive surface is connected to a power supply, and the detection contact is grounded; the method for acquiring the opening and closing degree of the push-pull structure comprises the following steps:
and confirming that the level of the Nth detection contact is pulled high and the level of the (N + 1) th detection contact is not changed, wherein N is more than or equal to 1, and the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
11. A method for detecting an opening/closing degree of a push-pull structure according to claim 7, wherein the method comprises: and acquiring the opening and closing degree of the push-pull structure according to the detection data received by the input port and the detection data output by the output port.
12. The method for detecting the opening/closing degree of the push-pull structure according to claim 11, wherein the acquiring the opening/closing degree of the push-pull structure comprises: and confirming that the detection data received by the input port of the Nth detection contact is consistent with the detection data output by the output port, and the input port of the (N + 1) th detection contact has no data, wherein N is more than or equal to 1, so that the opening and closing width of the plate-shaped member is between the opening and closing width represented by the Nth detection contact and the opening and closing width represented by the (N + 1) th detection contact.
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| Publication number | Priority date | Publication date | Assignee | Title |
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