CN113128074B - Electromagnetic transient simulation method and system, storage medium and electronic equipment - Google Patents
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Abstract
The application provides an electromagnetic transient simulation method, an electromagnetic transient simulation system, a storage medium and electronic equipment. When the electromagnetic transient simulation system at the end of the time step generates a preset working condition, adjusting the default admittance matrix according to the preset working condition to obtain an adjusted admittance matrix; performing second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data; the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of a time step, the interval time length is preset time, the length of the preset time is smaller than that of the time step, a second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step. The time scale of the step when the non-state quantity suddenly changes is greatly reduced, so that the area of a volt-second energy loss area is reduced, and the problem of energy loss caused by the sudden change of the non-state quantity is solved.
Description
Technical Field
The application relates to the technical field of dynamic simulation and modeling of power systems, in particular to an electromagnetic transient simulation method, an electromagnetic transient simulation system, a storage medium and electronic equipment.
Background
Transient analysis of a traditional large-scale power system is performed in an electromechanical transient stability program, because the traditional power system is mainly an alternating current power grid, and power grid operation and maintenance mainly focuses on fundamental frequency components of the system and power angle stability of the system. As power systems evolve, more and more components are included in the systems. Such as new energy power generation equipment and high voltage direct current transmission equipment. With the increasing number of elements in the power grid, the complexity of the transient process is increased, and the dynamic performance of the system cannot be accurately analyzed by the traditional electromechanical transient simulation program. For example, the electromechanical transient simulation program cannot accurately analyze complex conditions such as commutation failure and subsynchronous oscillation. Therefore, modern power systems must analyze the dynamic behavior of the system by means of electromagnetic transient simulation programs.
On the basis, how to improve the accuracy of the analysis result of the electromagnetic transient simulation program becomes a difficult problem which puzzles the technical personnel in the field.
Disclosure of Invention
It is an object of the present application to provide an electromagnetic transient simulation method, system, storage medium and electronic device to at least partially improve the above problems.
In order to achieve the above purpose, the embodiments of the present application employ the following technical solutions:
in a first aspect, an embodiment of the present application provides an electromagnetic transient simulation method, where the method includes:
under the condition that the electromagnetic transient simulation system at the end of the time step has a preset working condition, adjusting the default admittance matrix according to the type of the preset working condition to obtain a corresponding adjusted admittance matrix;
the preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes;
performing second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data;
the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first time, the first time is before the end of the time step, the interval time length is preset time, the length of the preset time is smaller than the length of the time step, the second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first time to the end of the time step.
In a second aspect, an embodiment of the present application provides an electromagnetic transient simulation system, which includes:
the processing unit is used for adjusting the default admittance matrix according to the type of the preset working condition under the condition that the electromagnetic transient simulation system at the end of the time step has the preset working condition so as to obtain a corresponding adjusted admittance matrix;
the preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes;
the integration unit is used for carrying out second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data;
the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first time, the first time is before the end of the time step, the interval time length is preset time, the length of the preset time is smaller than the length of the time step, the second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first time to the end of the time step.
In a third aspect, the present application provides a storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the method described above.
In a fourth aspect, an embodiment of the present application provides an electronic device, where the electronic device includes: a processor and memory for storing one or more programs; the one or more programs, when executed by the processor, implement the methods described above.
Compared with the prior art, the electromagnetic transient simulation method, the electromagnetic transient simulation system, the storage medium and the electronic device provided by the embodiment of the application have the beneficial effects that firstly, under the condition that the electromagnetic transient simulation system at the end of a time step has a preset working condition, the default admittance matrix is adjusted according to the type of the preset working condition to obtain a corresponding adjusted admittance matrix; the preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes; performing second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data; the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of a time step, the interval time length is preset time, the length of the preset time is smaller than that of the time step, a second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step. The time scale of the step when the non-state quantity suddenly changes is greatly reduced, so that the area of a volt-second energy loss area is reduced, and the problem of energy loss caused by the sudden change of the non-state quantity is solved.
In order to make the aforementioned objects, features and advantages of the present application more comprehensible, preferred embodiments accompanied with figures are described in detail below.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and it will be apparent to those skilled in the art that other related drawings can be obtained from the drawings without inventive effort.
Fig. 1a is a schematic view of a voltage-second product loss at a fault time under a large step length (a trapezoidal integration method) provided by an embodiment of the present application;
fig. 1b is a schematic diagram of the loss of the volt-second product at the fault time under a large step length (backward euler integration method) provided by the embodiment of the present application;
fig. 2 is a schematic structural diagram of an electronic device according to an embodiment of the present application;
fig. 3 is a schematic flowchart of an electromagnetic transient simulation method according to an embodiment of the present application;
FIG. 4 is a schematic diagram of a first timing provided by an embodiment of the present application;
FIG. 5 is a plot of the volt-second product energy loss area for three curves provided by an embodiment of the present application;
FIG. 6 is a schematic flow chart of an electromagnetic transient simulation method according to an embodiment of the present disclosure;
FIG. 7 is a diagram illustrating comparison results of different simulation step sizes in a single machine test algorithm provided in an embodiment of the present application;
fig. 8 is a schematic diagram of a unit of an electromagnetic transient simulation system according to an embodiment of the present application.
In the figure: 10-a processor; 11-a memory; 12-a bus; 13-a communication interface; 201-a processing unit; 202-an integration unit.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. The components of the embodiments of the present application, as generally described and illustrated in the figures herein, could be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures. Meanwhile, in the description of the present application, the terms "first", "second", and the like are used only for distinguishing the description, and are not to be construed as indicating or implying relative importance.
It should be noted that, in this document, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a … …" does not exclude the presence of another identical element in a process, method, article, or apparatus that comprises the element.
In the description of the present application, it should be noted that the terms "upper", "lower", "inner", "outer", and the like indicate orientations or positional relationships based on orientations or positional relationships shown in the drawings or orientations or positional relationships conventionally found in use of products of the application, and are used only for convenience in describing the present application and for simplification of description, but do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present application.
In the description of the present application, it is also to be noted that, unless otherwise explicitly specified or limited, the terms "disposed" and "connected" are to be interpreted broadly, e.g., as being either fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood in a specific case by those of ordinary skill in the art.
Some embodiments of the present application will be described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.
In order to improve the accuracy of electromagnetic transient simulation, the inventor creates a possible implementation manner, please refer to the following, and the specific process is as follows:
firstly, performing example entry after the beginning;
secondly, initializing each element in the electromagnetic transient simulation system to generate a node admittance matrix Y n ；
Thirdly, calculating the Norton equivalent current of each element;
wherein, I h Indicating the Norton equivalent current, V, of the element at the current time step (t-k△t) Characterizing the branch voltage of the element at time (t-k. DELTA.t), I (t-m△t) Characterizing the branch current, P, of the element at the time (t-m Δ t) k And Q m Is constant and is determined by the dynamic characteristics of the element, e.g. differential equation of inductance, k, m =1,2,3 ….
Fourthly, calculating a node voltage signal through a node voltage equation;
wherein, U n Vector combinations representing node voltages of different elements in the whole network at the same time point; i is n Indicating I of different elements in the whole network at the same point in time h A vector combination of (1); y is n Representing the equivalent admittance matrix of the entire network.
Fifthly, calculating a branch current signal of each element;
I(t)＝GV(t)+I h ；
wherein V (t) represents the branch voltage of the element at the time t, and V (t) can pass through U n The recorded node voltages at the two ends of the element are obtained by difference; g represents the equivalent admittance of the element, yn is composed of G corresponding to different elements, and I (t) represents the branch current of the element at the time t.
Sixth, wait for the next time step to be entered, t = t +. DELTA.t.
Seventhly, judging whether the current t is larger than tend; if yes, ending; if not, returning to execute the third corresponding step.
After a great deal of experiments and summarization, the inventor finds that: in the simulation of working conditions such as switching action, line fault, voltage drop and the like, numerical value mutation of certain non-state quantities (such as power supply voltage, fault point-to-ground resistance and other variables) in the system at a certain moment is prevented. If the fixed-step integration algorithm is adopted to simulate the process, along with the increase of the integration step length, the simulation precision after the mutation moment is reduced.
Specifically, the inventors introduced the concept of "volt-second product (V · S)" loss to analyze the source of error. The summary of the invention shows that not only the trapezoidal integration method has the problem of volt-second product loss, but also the backward euler method (as long as the current difference equation is applied to the current time voltage value) has the problem of volt-second product loss. Referring to fig. 1a and 1b, fig. 1a is a schematic view of the volt-second product loss at the fault time under a large step length (trapezoidal integration method), and fig. 1b is a schematic view of the volt-second product loss at the fault time under a large step length (backward euler integration method).
Fig. 1a and 1b show graphs of the loss area in volt-second product for both large step-size conventional frequency-shifted electromagnetic transient simulation and ideal curves in simulating a short-to-ground fault condition. The shaded part in the figure is a volt-second product loss area, and the loss directly causes the sudden change of the state quantity.
The inventor has made a great deal of thought about the cause of the problem of volt-second product loss and the improvement method, and has made creative work for this purpose. The inventor finds that, in the previous integration method, when some non-state quantities in the system have sudden changes, the admittance matrix is directly adjusted, and the integration operation is performed by using the adjusted admittance matrix, so as to obtain final state data (including branch current and branch voltage of the element). The inventors have found that at small steps the energy loss in this part will be negligible. However, under the simulation of large step size, the error of this part will be very considerable.
In order to overcome the above problems, the embodiments of the present application provide a possible implementation manner, please refer to the following.
The embodiment of the application provides an electronic device which can be a computer device or a server device. Please refer to fig. 2, a schematic structural diagram of an electronic device. The electronic device comprises a processor 10, a memory 11, a bus 12. The processor 10 and the memory 11 are connected by a bus 12, and the processor 10 is configured to execute an executable module, such as a computer program, stored in the memory 11.
The processor 10 may be an integrated circuit chip having signal processing capabilities. In implementation, the steps of the electromagnetic transient simulation method may be performed by integrated logic circuits of hardware or instructions in the form of software in the processor 10. The Processor 10 may be a general-purpose Processor, and includes a Central Processing Unit (CPU), a Network Processor (NP), and the like; the Integrated Circuit may also be a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic device, or discrete hardware components.
The Memory 11 may comprise a high-speed Random Access Memory (RAM) and may further comprise a non-volatile Memory (non-volatile Memory), such as at least one disk Memory.
The bus 12 may be an ISA (Industry Standard Architecture) bus, a PCI (Peripheral Component Interconnect) bus, an EISA (Extended Industry Standard Architecture) bus, or the like. Only one bi-directional arrow is shown in fig. 2, but this does not indicate only one bus 12 or one type of bus 12.
The memory 11 is used for storing a program, for example a program corresponding to the electromagnetic transient simulation system. The electromagnetic transient simulation system includes at least one software functional module which may be stored in the form of software or firmware (firmware) in the memory 11 or solidified in an Operating System (OS) of the electronic device. The processor 10, upon receiving the execution instruction, executes the program to implement the electromagnetic transient simulation method.
Possibly, the electronic device provided by the embodiment of the present application further includes a communication interface 13. The communication interface 13 is connected to the processor 10 via a bus.
It should be understood that the structure shown in fig. 2 is merely a structural schematic diagram of a portion of an electronic device, which may also include more or fewer components than shown in fig. 2, or have a different configuration than shown in fig. 2. The components shown in fig. 2 may be implemented in hardware, software, or a combination thereof.
The electromagnetic transient simulation method provided in the embodiment of the present application can be applied to, but is not limited to, the electronic device shown in fig. 2, and please refer to fig. 3 for a specific process:
and S104, under the condition that the electromagnetic transient simulation system at the end of the time step has a preset working condition, adjusting the default admittance matrix according to the type of the preset working condition to obtain a corresponding adjusted admittance matrix.
The preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes. Different non-state quantities change, the different types of the working conditions are represented, the corresponding adjusting modes are different, and the working conditions comprise the working conditions of switching action, line faults, voltage drop and the like.
The default admittance matrix may be the equivalent admittance matrix Y of the entire network as described above n 。
And S105, carrying out second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data.
The intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of the time step, the interval time length is preset time, the length of the preset time is smaller than the length of the time step, the second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step.
Optionally, as shown in fig. 4, when the normal integration reaches the end time t of the current time step, the electromagnetic transient simulation system generates a preset working condition, and interpolates the back preset time (δ t) at the fault point, so as to obtain the state data of each element in the electromagnetic transient simulation system at the first time (t- δ t).
And carrying out time step simulation by using a small step length (delta t) according to the adjusted admittance matrix, wherein the length of the small step length is less than one time step, and carrying out second integration on the intermediate interpolation value to obtain target state data. The continuous model after frequency shift is discretized through a root matching method, and the simulation accuracy of the transient model is improved.
The electromagnetic transient simulation method provided by the embodiment of the present application can reduce the area of the volt-second product loss (energy loss in voltage/time), specifically, as shown in fig. 5.
Fig. 5 shows a volt-second energy loss area diagram of three curves of a large-step conventional frequency shift electromagnetic transient simulation, an electromagnetic transient simulation method provided in the embodiment of the present application (frequency shift electromagnetic transient simulation of a small-step embedding algorithm, small-step Embedding (ESS)), and an ideal curve under the condition of a simulated ground short circuit fault. Therefore, the essence of the ESS embedding algorithm is to reduce the area of the volt-second energy loss region by greatly reducing the time scale of the non-state quantity mutation time step, thereby solving the energy loss problem caused by the non-state quantity mutation.
To sum up, the embodiment of the present application provides an electromagnetic transient simulation method, which includes, first, under a condition that a preset working condition occurs in an electromagnetic transient simulation system at the end of a time step, adjusting a default admittance matrix according to a type of the preset working condition to obtain a corresponding adjusted admittance matrix; the preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes; performing second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data; the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of a time step, the interval time length is preset time, the length of the preset time is smaller than that of the time step, a second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step. The time scale of the step when the non-state quantity suddenly changes is greatly reduced, so that the area of a volt-second energy loss area is reduced, and the problem of energy loss caused by the sudden change of the non-state quantity is solved.
On the basis of fig. 3, how to obtain intermediate interpolation; referring to fig. 6, an electromagnetic transient simulation method further includes, when a preset condition does not occur, how to perform simulation, and a possible implementation manner is further provided in an embodiment of the present application:
s101, under the condition that the time step is ended, performing first integration on state data of each element in the electromagnetic transient simulation system before the time step according to a default admittance matrix to obtain first state data.
The first integral is trapezoidal integral or backward Euler integral, the integral interval of the first integral is from the head end to the tail end of the time step, and the first state data is the state data of each element in the electromagnetic transient simulation system at the tail end of the time step, which is obtained by performing the first integral according to a default admittance matrix.
And S102, judging whether the electromagnetic transient simulation system has a preset working condition at the end of the time step. If yes, go to step S103; if not, S101 is executed.
Optionally, when the electromagnetic transient simulation system at the end of the time step has a preset working condition, if the electromagnetic transient simulation system continues to use the conventional integration method for performing large step length processing, the problem of volt-second product loss as shown in fig. 1a and 1b may occur, and in order to overcome this problem, an intermediate socket needs to be obtained, and S103 is executed; and otherwise, determining the first state data as target state data, wherein the target state data is the final state data of each element in the electromagnetic transient simulation system at the end of the time step. And S101 is repeatedly executed after the next time step is waited to enter.
And S103, acquiring intermediate interpolation according to the first state data and preset time.
Alternatively, the state quantities in all elements of the simulation system are linearly interpolated back to before one hour step (typically around 1 microsecond), i.e. at time t- δ t, to obtain an intermediate interpolation.
Specifically, the interpolation process can be expressed as:
where x (t) is the state quantity vector in all the elements of the simulation system at time t, i.e. the first state data obtained by calculation in S101, and x (t- δ t) is the intermediate interpolation.
Optionally, please continue to refer to fig. 6, after S105, a possible implementation manner is further provided in the embodiments of the present application, as shown in fig. 6.
After S105, waiting for entering the next time step, repeating S101, and when the end of the time step is reached, performing first integration on state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix to obtain first state data.
Optionally, the absolute value of the difference between the preset time and 1us is less than the error threshold.
Referring to FIG. 7, FIG. 7 is a comparison result of different simulation step sizes in the single machine test example. Wherein, ESS represents the electromagnetic transient simulation method provided by the embodiment of the present application, and 1ms and 5ms represent the step size of the normal integration, respectively. The result shows that the house result of the electromagnetic transient simulation method provided by the embodiment of the application is superior to that of the conventional electromagnetic transient simulation algorithm.
The frequency shift electromagnetic transient simulation algorithm embedded with small step length provided by the electromagnetic transient simulation method provided by the embodiment of the application solves the problem of energy loss caused by sudden change of the non-state quantity, thereby ensuring accurate simulation of electric quantity at the moment of fault and parameter sudden change, improving the calculation precision of the traditional electromagnetic transient model under large-step-length simulation, and expanding the application scene of electromagnetic transient simulation in multi-time-scale transient analysis of a large-scale alternating-current system.
Referring to fig. 8, fig. 8 is a schematic diagram of an electromagnetic transient simulation system according to an embodiment of the present application, where the electromagnetic transient simulation system is optionally applied to the electronic device described above.
The electromagnetic transient simulation system comprises: a processing unit 201 and an integrating unit 202.
And the processing unit 201 is configured to, when a preset working condition occurs in the electromagnetic transient simulation system at the end of the time step, adjust the default admittance matrix according to the type of the preset working condition to obtain a corresponding adjusted admittance matrix. Alternatively, the processing unit 201 may execute S104 described above.
The preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes.
And an integrating unit 202, configured to perform a second integration on the intermediate interpolation according to the adjusted admittance matrix, so as to obtain target state data. Alternatively, the integration unit 202 may perform S104 described above.
The intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of a time step, the interval time length is preset time, the length of the preset time is smaller than that of the time step, a second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step.
Optionally, the processing unit 201 is further configured to, when the end of the time step is reached, perform first integration on state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix, so as to obtain first state data.
The first integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the first integral is from the head end to the tail end of the time step.
The processing unit 201 is further configured to obtain an intermediate interpolation value according to the first state data and the preset time when the electromagnetic transient simulation system occurs a preset condition at the end of the time step.
The processing unit 201 is further configured to determine whether a preset working condition occurs in the electromagnetic transient simulation system at the end of the time step after the first state data is acquired; if so, acquiring intermediate interpolation according to the first state data and preset time; if not, waiting for entering the next time step, and repeatedly performing first integration on the state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix under the condition that the end of the time step is reached to obtain first state data.
Alternatively, the processing unit 201 may execute S104 described above.
It should be noted that the electromagnetic transient simulation system provided in this embodiment may execute the method flows shown in the above method flow embodiments to achieve the corresponding technical effects. For the sake of brevity, the corresponding contents in the above embodiments may be referred to where not mentioned in this embodiment.
The embodiment of the application also provides a storage medium, wherein the storage medium stores computer instructions and a program, and the computer instructions and the program execute the electromagnetic transient simulation method of the embodiment when being read and run. The storage medium may include memory, flash memory, registers, or a combination thereof, etc.
The following provides an electronic device, which may be a computer device or a server device, and as shown in fig. 2, the electronic device may implement the electromagnetic transient simulation method described above; specifically, the electronic device includes: processor 10, memory 11, bus 12. The processor 10 may be a CPU. The memory 11 is used for storing one or more programs which, when executed by the processor 10, perform the electromagnetic transient simulation method of the above-described embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The apparatus embodiments described above are merely illustrative and, for example, the flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, functional modules in the embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application or portions thereof that substantially contribute to the prior art may be embodied in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
It will be evident to those skilled in the art that the present application is not limited to the details of the foregoing illustrative embodiments, and that the present application may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the application being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Claims (6)
1. An electromagnetic transient simulation method, the method comprising:
under the condition that the electromagnetic transient simulation system at the end of the time step generates a preset working condition, adjusting the default admittance matrix according to the type of the preset working condition to obtain a corresponding adjusted admittance matrix;
the preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes;
performing second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data;
the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of the time step, the interval time length is preset time, the length of the preset time is smaller than the length of the time step, the second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step;
the method further comprises the following steps:
under the condition that the time step is ended, performing first integration on state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix to obtain first state data;
the first integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the first integral is from the head end to the tail end of the time step;
under the condition that the electromagnetic transient simulation system has a preset working condition at the end of the time step, the method further comprises the following steps:
acquiring the intermediate interpolation value according to the first state data and preset time;
after acquiring the first state data, the method further comprises:
judging whether the electromagnetic transient simulation system generates the preset working condition at the end of the time step;
if so, acquiring the intermediate interpolation value according to the first state data and preset time;
if not, waiting for entering the next time step, and repeatedly performing first integration on state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix under the condition that the end of the time step is reached to obtain first state data.
2. The electromagnetic transient simulation method of claim 1, wherein after obtaining target state data by second integrating the intermediate interpolation according to the adjusted admittance matrix, the method further comprises:
and waiting for entering the next time step, and repeatedly performing first integration on the state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix under the condition of reaching the end of the time step to obtain first state data.
3. The electromagnetic transient simulation method of claim 1, wherein an absolute value of a difference between the preset time and 1us is less than an error threshold.
4. An electromagnetic transient simulation system, the system comprising:
the processing unit is used for adjusting the default admittance matrix according to the type of the preset working condition under the condition that the electromagnetic transient simulation system at the end of the time step has the preset working condition so as to obtain a corresponding adjusted admittance matrix;
the preset working condition is a working condition that the non-state quantity in the electromagnetic transient simulation system changes;
the integration unit is used for carrying out second integration on the intermediate interpolation according to the adjusted admittance matrix to obtain target state data;
the intermediate interpolation represents state data of each element in the electromagnetic transient simulation system at a first moment, the first moment is before the end of the time step, the interval time length is preset time, the length of the preset time is smaller than the length of the time step, the second integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the second integral is from the first moment to the end of the time step;
the processing unit is further used for performing first integration on state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix under the condition that the end of the time step is reached, and acquiring first state data;
the first integral is a trapezoidal integral or a backward Euler integral, and the integral interval of the first integral is from the head end to the tail end of the time step;
the processing unit is further used for acquiring the intermediate interpolation value according to the first state data and preset time under the condition that a preset working condition occurs in the electromagnetic transient simulation system at the end of the time step;
the processing unit is further used for judging whether the preset working condition occurs to the electromagnetic transient simulation system at the end of the time step after the first state data is acquired; if so, acquiring the intermediate interpolation value according to the first state data and preset time; if not, waiting for entering the next time step, and repeatedly performing first integration on state data of each element in the electromagnetic transient simulation system before the time step according to the default admittance matrix under the condition that the end of the time step is reached to obtain first state data.
5. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-3.
6. An electronic device, comprising: a processor and memory for storing one or more programs; the one or more programs, when executed by the processor, implement the method of any of claims 1-3.
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