CN113125911A - Direct current aging test device - Google Patents
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- CN113125911A CN113125911A CN202110453433.2A CN202110453433A CN113125911A CN 113125911 A CN113125911 A CN 113125911A CN 202110453433 A CN202110453433 A CN 202110453433A CN 113125911 A CN113125911 A CN 113125911A
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- 238000012360 testing method Methods 0.000 title claims abstract description 108
- 230000032683 aging Effects 0.000 title claims abstract description 25
- 230000015556 catabolic process Effects 0.000 claims abstract description 33
- 239000000835 fiber Substances 0.000 claims abstract description 27
- 238000012544 monitoring process Methods 0.000 claims abstract description 15
- 230000001681 protective effect Effects 0.000 claims abstract 2
- 238000005070 sampling Methods 0.000 claims description 52
- 230000003287 optical effect Effects 0.000 claims description 7
- 230000005611 electricity Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 12
- 239000007787 solid Substances 0.000 abstract description 8
- 239000011810 insulating material Substances 0.000 abstract 2
- 238000011156 evaluation Methods 0.000 abstract 1
- 230000008569 process Effects 0.000 description 10
- 230000008859 change Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 230000035772 mutation Effects 0.000 description 2
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- 230000009471 action Effects 0.000 description 1
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- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000013100 final test Methods 0.000 description 1
- 238000012886 linear function Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
Abstract
Direct current aging test device belongs to and relates to insulating material ageing evaluation field. The problem of current solid dielectric's electrical ageing test in-process must cut off the power supply to total power supply when removing the puncture branch road, influence the running state of other branch roads is solved. The high-voltage direct-current power supply supplies power to N test circuits through a protective resistor R1, wherein each test circuit is used for providing high voltage power for 1 tested sample, monitoring the breakdown state of the tested sample and sending the monitoring result to a fiber grating demodulator; the fiber grating demodulator demodulates the monitoring result output by each test circuit to obtain a demodulation result; the control circuit is used for judging whether the tested sample in the test circuit corresponding to the demodulation result is broken down or not according to the received demodulation result; and when the breakdown is determined, the power supply of the test circuit where the tested sample is positioned is cut off. The invention is mainly used for carrying out the aging test of the insulating material.
Description
Technical Field
The present invention relates to the field of insulation aging assessment.
Background
The process by which a solid dielectric loses its ability to electrically insulate from an insulating state to a good conducting state under the action of a strong electric field is called breakdown. In a uniform electric field, the ratio of the breakdown voltage to the thickness of the solid dielectric is called the breakdown field strength, also called the dielectric strength, which reflects the dielectric strength of the solid dielectric itself. The breakdown field strength of the solid dielectric is a function of time, the longer the pressurization time is, the lower the breakdown field strength of the insulation is, through an electrical aging test, the functional relation between the breakdown field strength of the solid dielectric and the time can be tested, and only if the functional relation is obtained, the insulation structure can be designed more reasonably.
The electrical aging test method of the solid dielectric is to carry out long-term withstand voltage test on a plurality of groups of samples and record the time required for each sample to break down under different test voltages. In order to reduce errors, multiple groups of data need to be measured, a common method is that multiple samples are connected with the same test power supply in parallel, if the sample of a certain branch circuit is punctured, the current of the branch circuit where the test power supply is located will increase rapidly, a protection mechanism of the power supply is triggered immediately, a tester records the puncture time, then the punctured branch circuit is removed from a test loop, and power supply is recovered to continue testing. The test means has the disadvantages that the time required for sample breakdown can reach months or even years, two samples made of the same material are tested under the same test condition, the obtained breakdown time can be different from dozens of hours or even hundreds of hours, and if the manpower is adopted to record each test data, a great deal of energy is required in the process; another disadvantage is that the total power supply must be powered off when the breakdown branch is removed in the test process, which affects the operating states of other branches and may affect the final test result; therefore, the above problems need to be solved.
Disclosure of Invention
The invention aims to solve the problem that the running states of other branches are influenced because a main power supply is required to be powered off when a breakdown branch is removed in the electrical aging test process of the conventional solid dielectric medium.
The direct current aging test device comprises a high-voltage direct current power supply, a control circuit, a fiber grating demodulator, a sampling circuit, a protection resistor R1 and N test circuits; n is an integer greater than or equal to 2;
the high-voltage direct-current power supply supplies power to the N test circuits through a protection resistor R1, and the N test circuits are connected in parallel;
each test circuit is used for providing high voltage electricity for 1 tested sample, monitoring the breakdown state of the tested sample and sending the monitoring result to the fiber bragg grating demodulator in the form of optical signals;
the fiber grating demodulator is used for demodulating the monitoring result output by each test circuit to obtain a demodulation result and simultaneously transmitting the obtained demodulation result to the control circuit and the sampling circuit;
a sampling circuit for recording the arrival time of the received demodulation result;
the control circuit is used for judging whether the tested sample in the test circuit corresponding to the demodulation result is broken down or not according to the received demodulation result; and when the tested sample is determined to be broken down, the power supply of the test circuit where the tested sample is located is cut off.
Preferably, each test circuit comprises a high-voltage switch K1, a sampling resistor R2, an upper electrode, a lower electrode and a grating voltage sensor;
the high-voltage switch K1, the sampling resistor R2, the upper electrode, the sample to be tested and the lower electrode are sequentially connected in series to form a branch circuit, wherein the head end of the high-voltage switch K1 is used as the voltage input end of the branch circuit and is used for receiving the test voltage output by the high-voltage direct-current power supply, and the voltage output end of the lower electrode serving as the branch circuit is connected to the power ground;
the control circuit is also used for controlling the switching state of the high-voltage switch K1;
and the grating voltage sensor is used for collecting the voltage at two ends of the sampling resistor R2 and sending the optical signal obtained by sampling to the fiber grating demodulator as the monitoring result of the test circuit.
Preferably, the sampling resistors R2 in the N test circuits have the same resistance value.
Preferably, the implementation manner of the control circuit determining whether the sample to be tested in the test circuit corresponding to the demodulation result is broken down according to the received demodulation result is as follows:
the control circuit compares the received demodulation result with a preset threshold value, and when the demodulation result is greater than the threshold value, the tested sample in the test circuit is judged to be broken down;
wherein the threshold is 0.
The direct current aging test device has the beneficial effects that when the direct current aging test device is applied specifically, the control circuit is used for judging whether the tested sample in the test circuit corresponding to the demodulation result is punctured or not according to the received demodulation result, then cutting off the power supply loop of the test circuit where the punctured tested sample is located, so that the power supply state of the test circuit where each tested sample is located is controlled, and the branches where each test circuit is located do not interfere with each other when the test experiment is carried out. The high-voltage direct-current power supply is not powered off in the whole test process, and no manpower is needed in the whole test process.
In the embodiment, the direct current aging test device is additionally provided with a sampling circuit, and the sampling circuit can record the breakdown time of each tested sample, so that the automatic measurement of the direct current aging test device is realized.
Drawings
FIG. 1 is a schematic diagram of the DC aging test apparatus of the present invention;
FIG. 2 is a diagram showing the relationship between the input voltage of the detection resistor and the demodulation result output by the FBG demodulator;
FIG. 3 is a waveform diagram of a 2V step voltage applied to a sampling resistor;
FIG. 4 is a schematic diagram of the change in center wavelength of the demodulator output under the step voltage excitation of FIG. 3;
fig. 5 is a graph of breakdown time versus breakdown field strength obtained from 5 sets of experimental data, where t represents time and E represents breakdown field strength.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
Referring to fig. 1, the direct current aging test apparatus according to the present embodiment includes a high voltage direct current power supply 1, a control circuit 2, a fiber grating demodulator 3, a sampling circuit 4, a protection resistor R1, and N test circuits 5; n is an integer greater than or equal to 2;
the high-voltage direct-current power supply 1 supplies power to the N test circuits 5 through the protection resistor R1, and the N test circuits 5 are connected in parallel;
each test circuit 5 is used for providing high voltage electricity for 1 tested sample 6, monitoring the breakdown state of the tested sample 6 and sending the monitoring result to the fiber grating demodulator 3 in the form of optical signals;
the fiber grating demodulator 3 is used for demodulating the monitoring result output by each test circuit 5 to obtain a demodulation result, and simultaneously transmitting the obtained demodulation result to the control circuit 2 and the sampling circuit 4;
a sampling circuit 4 for recording the arrival time of the received demodulation result;
the control circuit 2 is used for judging whether the tested sample 6 in the test circuit 5 corresponding to the demodulation result is broken down or not according to the received demodulation result; when the tested sample 6 is determined to be broken down, the power supply of the test circuit 5 where the tested sample 6 is located is cut off.
When the dc aging test apparatus according to this embodiment is applied specifically, the control circuit 2 is configured to determine whether the tested sample 6 in the test circuit 5 corresponding to the demodulation result is broken down according to the received demodulation result, and then cut off the power supply loop of the test circuit 5 where the tested sample 6 that is broken down is located, so as to control the power supply state of the test circuit 5 where each tested sample 6 is located, and the branches where each test circuit 5 is located do not interfere with each other when performing a test experiment. The high-voltage direct-current power supply 1 is not powered off in the whole test process, and no manpower is needed in the whole test process.
In the embodiment, the sampling circuit 4 is additionally arranged, and the sampling circuit 4 can record the breakdown time of each tested sample 6, so that the automatic measurement of the direct current aging test device is realized.
In this embodiment, the sampling circuit 4 and the control circuit 2 can be implemented by using the prior art.
Furthermore, each test circuit 5 comprises a high-voltage switch K1, a sampling resistor R2, an upper electrode 5-1, a lower electrode 5-2 and a grating voltage sensor 5-3;
the upper electrode 5-1 and the lower electrode 5-2 are used for clamping a sample 6 to be tested, and the high-voltage switch K1, the sampling resistor R2, the upper electrode 5-1, the sample 6 to be tested and the lower electrode 5-2 are sequentially connected in series to form a branch circuit, wherein the head end of the high-voltage switch K1 is used as the voltage input end of the branch circuit and is used for receiving the test voltage output by the high-voltage direct-current power supply 1, and the voltage output end of the branch circuit, which is used as the voltage output end of the lower electrode 5-2, is connected to the power ground;
the control circuit 2 is also used for controlling the switching state of the high-voltage switch K1;
and the grating voltage sensor 5-3 is used for collecting the voltage at two ends of the sampling resistor R2 and sending the optical signal obtained by sampling to the fiber grating demodulator 3 as the monitoring result of the test circuit 5.
In the preferred embodiment, the grating voltage sensor 5-3 is implemented by using the prior art, and includes a grating and piezoelectric ceramics: when PZT is used, when the tested sample 6 is not punctured, the voltage drop is almost completely distributed on the tested sample 6; when breakdown occurs, the sampling resistor R2 is subjected to voltage drop, a voltage signal is input to the grating voltage sensor 5-3, after the grating voltage sensor 5-3 receives the voltage signal, PZT in the grating voltage sensor 5-3 expands and contracts, the grating displacement sensor adhered to the PZT converts displacement into change of optical signal center wavelength, the signal is demodulated by the fiber grating demodulator 3 and outputs a demodulation result to the sampling circuit 4 and the control circuit 2, the sampling circuit 4 records breakdown time, after the control circuit 2 receives the electric signal, a trigger signal is sent to turn on the high-voltage switch K1 to cut off power supply of the branch. The direct current aging test device of the preferred embodiment can realize automatic measurement of direct current aging.
The demodulation result output by the fiber grating demodulator 3 is an electrical signal, the electrical signal corresponds to the change of the central wavelength of the grating voltage sensor 5-3 caused by the voltage change, and in particular, in application, the electrical signal output by the fiber grating demodulator 3 can be expressed as a relationship between the voltage and the central wavelength by using a linear function, which is specifically shown in fig. 2.
Further, the sampling resistors R2 in the N test circuits 5 have the same resistance value.
Furthermore, the implementation manner of the control circuit 2 determining whether the sample 6 under test in the test circuit 5 corresponding to the demodulation result is broken down according to the received demodulation result is as follows:
the control circuit 2 compares the received demodulation result with a preset threshold value, and when the demodulation result is greater than the threshold value, the tested sample 6 in the test circuit 5 is judged to be broken down;
wherein the threshold is 0.
Before specific application, the reliability of the response time of the fiber grating demodulator to the step signal is verified, and the specific process is as follows: and applying a voltage signal on the sample and the sampling serial branch, collecting the voltage on the sampling resistor by adopting a grating voltage sensor, and transmitting the collected result to a fiber grating demodulator, wherein when the sample is not broken down, the current on the sampling resistor is almost 0, and the voltage drop is 0. When the branch sample is broken down, the branch current is increased sharply, so that a voltage drop is formed on the sampling resistor. The relationship between the input voltage on the sampling resistor and the demodulation result output by the fiber grating demodulator is specifically shown in fig. 2, wherein in fig. 2, the change of the demodulation result output by the fiber grating demodulator is converted into the change of the central wavelength of the grating voltage sensor; as can be seen from fig. 2, the output center wavelength is linearly related to the input voltage between 0V and 3.5V, and has excellent static characteristics. Therefore, the grating voltage sensor can be designed to work under the input signal in specific application, so that the demodulation result of the fiber grating demodulator is more reliable.
In order to verify the relationship between the voltage drop of the sampling resistor and the output electrical signal of the demodulator, 2V step voltage is continuously applied to the sampling resistor, and the waveform is as shown in fig. 3, so that the voltage on the sampling resistor rises to the peak value within 0.1 ms. The time-varying central wavelength modulated by the fiber grating demodulator is shown in fig. 4, and it can be seen from fig. 4 that the central wavelength reaches a peak value and tends to be stable after 0.7ms, and the central wavelength varies by about 0.1nm at 0.1 ms; the step voltage on the sampling resistor, the tail time of the step voltage in fig. 3 is about 0.1ms, and the output waveform of the demodulator in fig. 4 is basically consistent with the input step voltage signal in fig. 3, which shows that the grating voltage sensor has good response under the frequency, excellent dynamic characteristics and meets the actual use requirements.
In the specific application of the invention, firstly, a flat plate sample is prepared as the tested sample 6, the size is 100 multiplied by 0.1mm, and each group of tests needs at least 4 tested samples 6. After 4 samples 6 to be tested were placed between each pair of the upper electrode 5-1 and the lower electrode 5-2, respectively, a voltage boosting test was prepared. The highest output voltage of the high-voltage direct-current power supply 1 is at least 20kV, the maximum power is 300W, and accurate results can be fitted only by completing tests under at least five different field strengths. The fiber grating demodulator 3 has the wavelength resolution of 0.001nm, the sampling rate of 10kHz, the central wavelength data is output to the sampling circuit 4 in real time,such as data storage and timing in a computer. The test voltage of the first group is 20kV, the protection resistor R1 is 100M omega, the resistance values of the sampling resistors R2 in all the test circuits 5 are all 10K omega, after preparation is completed, all the high-voltage switches K1 are firstly turned on, the high-voltage direct-current power supply 1 is turned on, and linear boosting is carried out to 20kV at the rate of 5 kV/s. When the sample is not broken down, the insulation resistance is about 109M omega is far larger than the protection resistor R1 and the sampling resistor R2, so that the voltage drop of the sampling resistor R2 is always 0 when the fiber grating demodulator is not broken down, and the central wavelength output by the fiber grating demodulator 3 is always 1550.0 nm. Upon breakdown, the current through sampling resistor R2 is about 0.2mA, resulting in a step voltage of about 2V in magnitude.
With the continuous increase of the pressurization time, a certain branch circuit is subjected to breakdown phenomenon, the voltage drop of the sampling resistor R2 of the branch circuit is stepped to 2V, the central wavelength of the fiber grating demodulator 3 is subjected to 0.1nm change within 0.1ms, and the control circuit 2 controls the high-voltage switch K1 of the branch circuit to rapidly turn off the switch and disconnect the branch circuit after detecting the signal mutation. After the process, a region of the demodulation result stored in the sampling circuit 4 changes suddenly, and the sampling interval of each data point is 0.1ms, so that the breakdown time can be converted according to the position of the data mutation point. And after all four tested samples 6 are punctured, finishing the first group of tests, respectively carrying out corresponding puncture time on 4 samples in the first group of tests, carrying out corresponding mathematical statistics on a plurality of puncture times, and obtaining data, namely obtaining an estimated value of the puncture time of the sample under the voltage of 20 kV.
The second set of test voltages was 16kV and the protection resistance was 80M Ω, and breakdown time data were obtained in the same manner, i.e.: obtaining an estimated value of the sample breakdown time under the voltage of 16 kV; the test voltage of the third group is 12kV, the protection resistance is 60 Μ Ω, and the obtained breakdown data are: an estimate of the breakdown time of the sample at 16kV voltage; the test voltage of the fourth group is 10kV, the protection resistance is 50M omega, and the obtained breakdown data is as follows: an estimate of the breakdown time of the sample at 10kV voltage; the test voltage of the fifth group is 9kV, and the protection resistance is 45 MOmega; the breakdown data obtained were: the estimated value of the breakdown time of the sample under the voltage of 9kV, specifically referring to FIG. 5, the protection resistance is continuously reduced along with the test voltage, and the step voltage with the amplitude of 2V can be obtained on the sampling resistance.
As can be seen from fig. 5, the electrical aging test was performed using the direct current aging test apparatus of the present invention. The test results obtained by the test prove the reliability of the device, and based on the test results, the service life index can be estimated, and the service life of the product can be predicted.
Although the invention herein has been described with reference to particular embodiments, it is to be understood that these embodiments are merely illustrative of the principles and applications of the present invention. It is therefore to be understood that numerous modifications may be made to the illustrative embodiments and that other arrangements may be devised without departing from the spirit and scope of the present invention as defined by the appended claims. It should be understood that features described in different dependent claims and herein may be combined in ways different from those described in the original claims. It is also to be understood that features described in connection with individual embodiments may be used in other described embodiments.
Claims (4)
1. The direct current aging test device is characterized by comprising a high-voltage direct current power supply (1), a control circuit (2), a fiber grating demodulator (3), a sampling circuit (4), a protection resistor R1 and N test circuits (5); n is an integer greater than or equal to 2;
the high-voltage direct-current power supply (1) supplies power to the N test circuits (5) through the protective resistor R1, and the N test circuits (5) are connected in parallel;
each test circuit (5) is used for providing high voltage electricity for 1 tested sample (6), monitoring the breakdown state of the tested sample (6), and sending the monitoring result to the fiber grating demodulator (3) in the form of optical signals;
the fiber grating demodulator (3) is used for demodulating the monitoring result output by each test circuit (5) to obtain a demodulation result and simultaneously transmitting the obtained demodulation result to the control circuit (2) and the sampling circuit (4);
a sampling circuit (4) for recording the arrival time of the received demodulation result;
the control circuit (2) is used for judging whether the tested sample (6) in the test circuit (5) corresponding to the demodulation result is broken down or not according to the received demodulation result; and when the tested sample (6) is determined to be broken down, the power supply of the test circuit (5) where the tested sample (6) is located is cut off.
2. The direct current aging test apparatus according to claim 1, wherein each test circuit (5) comprises a high voltage switch K1, a sampling resistor R2, an upper electrode (5-1), a lower electrode (5-2), and a grating voltage sensor (5-3);
the device comprises an upper electrode (5-1), a lower electrode (5-2), a high-voltage switch K1, a sampling resistor R2, the upper electrode (5-1), a sample (6) to be tested and the lower electrode (5-2) which are sequentially connected in series to form a branch circuit, wherein the head end of the high-voltage switch K1 serves as a voltage input end of the branch circuit and is used for receiving a test voltage output by a high-voltage direct-current power supply (1), and the voltage output end of the branch circuit, serving as the lower electrode (5-2), is connected to a power ground;
the control circuit (2) is also used for controlling the switching state of the high-voltage switch K1;
and the grating voltage sensor (5-3) is used for collecting the voltage at two ends of the sampling resistor R2 and sending the optical signal obtained by sampling to the fiber grating demodulator (3) as the monitoring result of the test circuit (5).
3. The dc burn-in test apparatus according to claim 2, wherein the sampling resistors R2 in the N test circuits (5) have the same resistance.
4. The dc burn-in test apparatus according to claim 1, wherein the control circuit (2) determines whether the sample (6) under test in the test circuit (5) corresponding to the demodulation result is broken down according to the received demodulation result by:
the control circuit (2) compares the received demodulation result with a preset threshold value, and when the demodulation result is larger than the threshold value, the tested sample (6) in the test circuit (5) is judged to be broken down;
wherein the threshold is 0.
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| CN112197886A (en) * | 2020-07-06 | 2021-01-08 | 廖旺才 | Fiber Bragg grating demodulator and demodulation method |
| CN112578236A (en) * | 2020-11-27 | 2021-03-30 | 深圳供电局有限公司 | Insulation material electrical aging test system |
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