CN113125856A - Resistance testing device, method and equipment - Google Patents
Resistance testing device, method and equipment Download PDFInfo
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- CN113125856A CN113125856A CN202110240520.XA CN202110240520A CN113125856A CN 113125856 A CN113125856 A CN 113125856A CN 202110240520 A CN202110240520 A CN 202110240520A CN 113125856 A CN113125856 A CN 113125856A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
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Abstract
The invention discloses a resistance testing device, a method and equipment, wherein the resistance testing device comprises a power supply conversion unit, a charging and discharging unit, a detection unit and a display unit, wherein the power supply conversion unit is used for carrying out preset conversion on input current and inputting the current after the preset conversion into the charging and discharging unit so as to realize the charging of the charging and discharging unit; the detection unit is used for detecting the current flowing through the charge and discharge unit, presetting the detection result and sending the result after the presetting to the display unit; the display unit is used for generating a discharge control instruction when the preset processed result reaches a set voltage, and sending the discharge control instruction to the charging and discharging unit; and the charging and discharging unit discharges according to the discharging control instruction so as to realize the test of the resistance to be tested.
Description
Technical Field
The invention relates to the technical field of testing, in particular to a resistance testing device, method and equipment.
Background
With the rapid development of power systems, large generator sets installed in China are increasing. In large-scale power generating units, a field suppression system composed of a nonlinear resistor as a field suppression resistor is mostly adopted. For the nonlinear resistor, written data provided by foreign manufacturers is only available, and no effective means is available for verifying the actual working characteristics.
The current common resistance test method is as follows: the energy equivalent to the magnetic energy of the generator rotor is stored in a large-capacity inductor, and then the nonlinear resistance component is discharged to test the actual working characteristics of the nonlinear resistance component. The testing device has the advantages of large energy, capability of testing the temperature rise characteristic of the nonlinear resistor and testing the limit capability of the element, and the defects of large field space and high-power supply, high testing cost and long testing period, and can be implemented only in a specially-constructed laboratory. In addition, each link such as assembly disassembly and assembly, transportation and the like in the implementation process also brings heavier organization and management burden to users. Therefore, the method has poor reproducibility and high test cost, and is inconvenient to popularize.
Disclosure of Invention
The embodiment of the invention provides a resistance testing device, method and equipment, and aims to solve the problems of poor reproducibility, high testing cost and high popularization difficulty in the process of testing a resistance in the related technology.
In order to solve the technical problem, the invention is realized as follows:
in a first aspect, a resistance testing device is provided, where the device includes a power conversion unit, a charging and discharging unit, a detection unit, and a display unit, where the charging and discharging unit is connected to the power conversion unit, the detection unit, and the display unit respectively; the detection unit is connected with the display unit;
the power supply conversion unit is used for performing preset conversion on input current and inputting the current after the preset conversion to the charge and discharge unit so as to charge the charge and discharge unit;
the detection unit is used for detecting the current flowing through the charge and discharge unit, presetting the detection result and sending the result after the presetting to the display unit;
the display unit is used for generating a discharge control instruction when the preset processed result reaches a set voltage, and sending the discharge control instruction to the charging and discharging unit;
and the charging and discharging unit discharges according to the discharging control instruction so as to realize the test of the resistance to be tested.
In a second aspect, a resistance testing method based on the device of the first aspect is provided, where the method includes:
the charging and discharging unit charges according to the current input by the test power supply, and discharges the resistor to be tested after the charging is finished so as to test the resistor to be tested.
In a third aspect, there is provided an apparatus comprising a resistance testing device as described above in relation to the first aspect.
In a fourth aspect, there is provided an apparatus comprising resistance testing means which when in use carries out the steps of the resistance testing method as described in the second aspect above.
In a fifth aspect, a computer-readable storage medium is provided, having stored thereon a computer program which, when executed by a processor, carries out the steps of the resistance testing method according to the second aspect.
The at least one technical scheme provided by the embodiment of the invention can achieve the following technical effects:
the testing device in the embodiment of the invention can firstly slowly charge the charging and discharging unit, and then discharge after the charging reaches a certain condition so as to realize the test of the resistance to be tested, so that the testing device can determine that the requirements on a test field, a test space, a power supply power and the like are not required in the embodiment of the invention, and therefore, the embodiment of the invention has the advantages of low popularization difficulty, high reproducibility and low test cost, and can effectively solve the problems in the prior art.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic block diagram of a resistance testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic flow chart of a resistance testing method according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the specific embodiments of the present invention and the accompanying drawings. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The technical solutions provided by the embodiments of the present invention are described in detail below with reference to the accompanying drawings.
Referring to fig. 1, fig. 1 is a schematic diagram illustrating a module composition of a resistance testing apparatus according to an embodiment of the present invention.
In the embodiment of the present invention, the resistance testing apparatus may be applied to an excitation system, and may also be applied to other systems, which is not limited in the embodiment of the present invention.
As shown in fig. 1, the resistance testing apparatus according to the embodiment of the present invention may include a power conversion unit, a charging/discharging unit, a detecting unit, and a display unit. The charging and discharging unit can be respectively connected with the power supply conversion unit, the detection unit and the display unit; and the detection unit may be connected to the display unit.
In the embodiment of the present invention, the power conversion unit may be connected to a power supply, the power supply may input current into the power conversion unit, and the power conversion unit may convert the input current.
In one example, the current provided by the power supply may be either alternating current or direct current. For example, the power supply may be a commercial power, and in this case, the current provided by the power supply may be an alternating current.
In one embodiment, when the power conversion unit converts the input current, the power conversion unit may boost the input current first, and then rectify the boosted input current to obtain the high-voltage direct current.
In one embodiment, the power conversion unit may include a power extension, a step-up transformer, and a rectifier. Wherein, the power expansion port can be a common delta-shaped power expansion port.
In the embodiment of the invention, after the power conversion unit changes the input current, the converted current can be input into the charge and discharge unit, so as to charge the charge and discharge unit.
In one example, the charge and discharge unit may include at least a capacitor, a triac, and a power supply board supplying power to the triac.
In this example, the capacitor may be charged according to the current converted by the power conversion unit. When the capacitor is charged or the charging reaches a preset condition, if a preset voltage value is reached, the bidirectional triode thyristor can control the capacitor to discharge according to the power supply provided by the power supply board.
In the embodiment of the present invention, the charging and discharging unit may be connected to the detecting unit, and the detecting unit may detect a charging voltage of the charging and discharging unit.
In one example, the detection unit may be further connected to the power conversion unit, and in this case, the power conversion unit may be indirectly connected to the charge and discharge unit through the detection unit.
The detection unit may be configured to detect a current flowing through the charge and discharge unit, preset a detection result, and then transmit the preset result to the display unit.
In the embodiment of the present invention, the preset processing may at least include hall sensor detection current and operational amplifier filtering processing.
In one embodiment, the detection unit may include a current detection plate, and may perform voltage detection on the current flowing through the charge and discharge unit according to the current detection plate to obtain a detected charging voltage, and then, the detection unit may perform resistance voltage division processing on the detected charging voltage to obtain a millivolt signal, and perform operational amplifier filtering processing on the millivolt signal through chip isolation to obtain a signal after the operational amplifier filtering processing, and use the signal as a result after the preset processing.
In one example, the detection unit may perform resistance voltage division processing on the detected charging voltage according to a resistance voltage division detection circuit provided when performing the resistance voltage division processing on the detected charging voltage.
Specifically, the resistance voltage division detection circuit connected with the detection unit can be preset, after the detection unit detects the charging voltage, the charging voltage can be input into the resistance voltage division detection circuit, so that the resistance voltage division detection circuit obtains a millivolt signal according to the charging voltage, and then the resistance voltage division detection circuit can feed back the obtained millivolt signal to the detection unit, so that the detection unit obtains the millivolt signal.
For example, the detection unit may input a voltage signal with a charging voltage value of 3KV into the resistance voltage division detection circuit, and obtain a voltage signal of 250mV fed back by the resistance voltage division detection circuit through the above process.
In another example, the detection unit may perform current detection on the current flowing through the charging and discharging unit, convert the detected charging and discharging current into a low-voltage signal, perform operational amplifier filtering processing on the low-voltage signal through chip isolation to obtain a signal after the operational amplifier filtering processing, and use the signal as a result after the preset processing.
In one example, the detection unit may convert the detected current signal into a low voltage value, such as 5V, corresponding to a low voltage signal through the hall sensor when converting the detected charge and discharge current into the low voltage signal.
For example, the detection unit may convert a current signal having a current value of 200A into a 5V low voltage signal through a hall sensor.
In the embodiment of the present invention, the detection unit may send the result after the preset processing to the display unit. The display unit can receive the result after the preset processing, judge whether the result after the preset processing reaches the set voltage, and when the result after the preset processing reaches the set voltage, the display unit can generate a discharge control instruction and send the discharge control instruction to the charging and discharging unit.
In the embodiment of the present invention, the display unit may set a voltage in advance. The set voltage can be a default voltage or a voltage manually set by a parameter setting display window provided by a relevant person through a display unit.
In one example, the display unit may provide a parameter setting display window, wherein a "set voltage text box" and a "set" button may be provided on the parameter setting display window, a user may input a voltage in the "set voltage text box", and if the input voltage is correct, the "set" button may be clicked to perform voltage setting; if the input voltage is wrong, the voltage input and voltage modification in the set voltage text box can be continued until the voltage input is correct, and at this time, the set button can be clicked to set the voltage.
After the voltage setting is completed, a "start charging" button may also be provided on the display unit, at which time the display unit may be activated according to the set voltage and display the set voltage in a "test voltage" text box.
When the preset result sent by the detection unit reaches the set voltage, the display unit can generate a discharge control instruction and send the discharge control instruction to the charge and discharge unit, so that the charge and discharge unit discharges according to the discharge control instruction, and the test of the resistance to be tested is realized.
In the embodiment of the invention, the resistor to be measured can be a nonlinear resistor.
In the process of testing the resistance to be tested, namely after the display unit sends a discharge control instruction to the charge and discharge unit, if the display unit is abnormal, relevant personnel can click a 'stop charging' button provided by the display unit, and then click a 'start discharging' button, so that the charge and discharge process of the charge and discharge unit is manually controlled. After the test is finished, relevant personnel can search the abnormal reason.
In the embodiment of the invention, the display unit can be provided with a Bluetooth communication module and a microprocessor control chip, and the microprocessor control chip can develop the Bluetooth module through a host control interface to realize specific functions. Therefore, in the embodiment of the present invention, the microprocessor control chip may implement communication with the bluetooth module through a serial port, and then the bluetooth module establishes connection with the bluetooth mobile phone or the notebook computer with bluetooth, so as to implement wireless communication between the resistance testing device and the bluetooth mobile phone or the notebook computer with bluetooth, so as to achieve the purpose of controlling the resistance testing device through the bluetooth mobile phone or the notebook computer with bluetooth.
After the detection unit sends the preprocessed result to the display unit, the display unit can record and store the preprocessed result in the SD card, and record, compare, analyze and calculate resistance characteristics of test waveform data through a waveform display comparison tool of the interface.
In the embodiment of the invention, the display unit can be connected with the charge and discharge unit through the flat cable. After receiving the discharge control instruction, the charge and discharge unit can discharge based on the instruction to realize the test of the resistance to be tested.
In one embodiment, the charge and discharge unit may include a capacitor, a triac, and a power board; the capacitor can be used for charging according to the current converted by the power conversion unit, and the power panel can be used for supplying power to the bidirectional thyristor after receiving the discharge control instruction, so that the bidirectional thyristor controls the capacitor to discharge, and the test of the resistor to be tested is realized.
As can be seen from the above, the testing apparatus in the embodiment of the present invention may first slowly charge the charge and discharge unit, and then discharge after the charge reaches a certain condition, so as to implement the test of the resistance to be tested, and thus it may be determined that the requirements on the test site, space, power supply, and the like are not required in the embodiment of the present invention, so that the embodiment of the present invention has low popularization difficulty, high reproducibility, and low test cost, and thus the problems in the prior art may be effectively solved.
The embodiment of the invention also provides a resistance testing method corresponding to the resistance testing device.
Referring to fig. 2, fig. 2 is a schematic flow chart of a resistance testing method according to an embodiment of the present invention, which is applied to a resistance testing apparatus in the previous embodiment. The method comprises the following steps:
step 202: the charging and discharging unit charges according to the current input by the test power supply, and discharges the resistor to be tested after the charging is finished so as to test the resistor to be tested.
In the embodiment of the present invention, the charging and discharging unit in the embodiment of the present invention may receive the current flowing in and out of the test power supply, perform charging according to the current input by the test power supply, and perform discharging after the charging is completed, so as to implement the test on the resistance to be tested. Specifically, the discharge can be performed at a test port connected with the resistor to be tested, so that the test of the resistor to be tested is realized.
In one embodiment, before discharging, the charging and discharging unit may further determine whether charging is completed. When the charging is determined to be completed, whether the voltage subjected to the preset processing reaches the preset voltage when the charging and discharging unit is charged by the current input by the test power supply can be judged. When the voltage is judged to be yes, namely the voltage of the current input by the test power supply after the preset processing reaches the preset voltage, the charging is determined to be finished; and when the judgment is negative, namely the voltage of the current input by the test power supply after the preset treatment does not reach the preset voltage, determining that the charging is not finished.
The preset processing may at least include resistance voltage division processing and operational amplifier filtering processing. Since the content has been described in detail in the above embodiment, the embodiment of the present invention is not described herein again.
As can be seen from the above, in the embodiment of the present invention, the charge and discharge unit may be slowly charged first, and then discharged after the charge is completed, so as to implement the test of the resistance to be tested, and therefore, it can be determined that the embodiment of the present invention does not require a test site, a test space, a power supply power, and the like, so that the embodiment of the present invention has low popularization difficulty, high reproducibility, and low test cost, and thus, the problems in the prior art can be effectively solved.
Corresponding to the resistance testing device, an embodiment of the invention also provides resistance testing equipment.
The resistance testing device may be a terminal device or a server for testing resistance provided in the above embodiments.
The resistance testing apparatus may comprise a resistance testing device, wherein the resistance testing device may be a resistance testing device as described in the embodiments of the resistance testing device above.
In the embodiment of the invention, the charge and discharge unit can be slowly charged firstly, and then the discharge unit is discharged after the charge reaches a certain condition so as to realize the test of the resistance to be tested, so that the embodiment of the invention can be ensured without the requirements on a test field, a test space, power supply power and the like, and the embodiment of the invention has low popularization difficulty, high reproducibility and low test cost, thereby effectively solving the problems in the prior art.
Corresponding to the resistance testing method, another resistance testing device is provided in an embodiment of the invention.
The resistance testing device may be a terminal device or a server for testing resistance provided in the above embodiments.
The resistance testing apparatus may comprise a resistance testing device, wherein the resistance testing device when in use may perform the steps of the resistance testing method as described in the embodiments of the resistance testing method above.
In the embodiment of the invention, the charge and discharge unit can be slowly charged firstly, and then the discharge unit is discharged after the charge reaches a certain condition so as to realize the test of the resistance to be tested, so that the embodiment of the invention can be ensured without the requirements on a test field, a test space, power supply power and the like, and the embodiment of the invention has low popularization difficulty, high reproducibility and low test cost, thereby effectively solving the problems in the prior art.
In the 90 s of the 20 th century, improvements in a technology could clearly distinguish between improvements in hardware (e.g., improvements in circuit structures such as diodes, transistors, switches, etc.) and improvements in software (improvements in process flow). However, as technology advances, many of today's process flow improvements have been seen as direct improvements in hardware circuit architecture. Designers almost always obtain the corresponding hardware circuit structure by programming an improved method flow into the hardware circuit. Thus, it cannot be said that an improvement in the process flow cannot be realized by hardware physical modules. For example, a Programmable Logic Device (PLD), such as a Field Programmable Gate Array (FPGA), is an integrated circuit whose Logic functions are determined by programming the Device by a user. A digital system is "integrated" on a PLD by the designer's own programming without requiring the chip manufacturer to design and fabricate application-specific integrated circuit chips. Furthermore, nowadays, instead of manually making an Integrated Circuit chip, such Programming is often implemented by "logic compiler" software, which is similar to a software compiler used in program development and writing, but the original code before compiling is also written by a specific Programming Language, which is called Hardware Description Language (HDL), and HDL is not only one but many, such as abel (advanced Boolean Expression Language), ahdl (alternate Hardware Description Language), traffic, pl (core universal Programming Language), HDCal (jhdware Description Language), lang, Lola, HDL, laspam, hardward Description Language (vhr Description Language), vhal (Hardware Description Language), and vhigh-Language, which are currently used in most common. It will also be apparent to those skilled in the art that hardware circuitry that implements the logical method flows can be readily obtained by merely slightly programming the method flows into an integrated circuit using the hardware description languages described above.
The controller may be implemented in any suitable manner, for example, the controller may take the form of, for example, a microprocessor or processor and a computer-readable medium storing computer-readable program code (e.g., software or firmware) executable by the (micro) processor, logic gates, switches, an Application Specific Integrated Circuit (ASIC), a programmable logic controller, and an embedded microcontroller, examples of which include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicone Labs C8051F320, the memory controller may also be implemented as part of the control logic for the memory. Those skilled in the art will also appreciate that, in addition to implementing the controller as pure computer readable program code, the same functionality can be implemented by logically programming method steps such that the controller is in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, embedded microcontrollers and the like. Such a controller may thus be considered a hardware component, and the means included therein for performing the various functions may also be considered as a structure within the hardware component. Or even means for performing the functions may be regarded as being both a software module for performing the method and a structure within a hardware component.
The systems, devices, modules or units illustrated in the above embodiments may be implemented by a computer chip or an entity, or by a product with certain functions. One typical implementation device is a computer. In particular, the computer may be, for example, a personal computer, a laptop computer, a cellular telephone, a camera phone, a smartphone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.
For convenience of description, the above devices are described as being divided into various units by function, and are described separately. Of course, the functions of the units may be implemented in the same software and/or hardware or in a plurality of software and/or hardware when implementing the invention.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The invention may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The invention may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including memory storage devices.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
The above description is only an example of the present invention, and is not intended to limit the present invention. Various modifications and alterations to this invention will become apparent to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the scope of the claims of the present invention.
Claims (10)
1. The resistance testing device is characterized by comprising a power supply conversion unit, a charging and discharging unit, a detection unit and a display unit, wherein the charging and discharging unit is respectively connected with the power supply conversion unit, the detection unit and the display unit; the detection unit is connected with the display unit;
the power supply conversion unit is used for performing preset conversion on input current and inputting the current after the preset conversion to the charge and discharge unit so as to charge the charge and discharge unit;
the detection unit is used for detecting the current flowing through the charge and discharge unit, presetting the detection result and sending the result after the presetting to the display unit;
the display unit is used for generating a discharge control instruction when the preset processed result reaches a set voltage, and sending the discharge control instruction to the charging and discharging unit;
and the charging and discharging unit discharges according to the discharging control instruction so as to realize the test of the resistance to be tested.
2. The apparatus of claim 1, wherein the predetermined transformation comprises at least a boost transformation and a rectifier transformation.
3. The apparatus of claim 1, wherein the predetermined process at least comprises a resistor voltage division process and an operational amplifier filtering process.
4. The device according to claim 1, wherein the detection unit is configured to perform voltage detection on the voltage of the charge and discharge unit, perform resistance voltage division processing on the detected charge voltage to obtain a millivolt signal, and perform operational amplifier filtering processing on the millivolt signal through chip isolation to obtain a preset processed result.
5. The device according to claim 1, wherein the detection unit is configured to perform current detection on the current flowing through the charging and discharging unit, convert the detected charging and discharging current into a low-voltage signal, and perform operational amplifier filtering on the low-voltage signal through chip isolation to obtain a result after preset processing.
6. The apparatus of claim 1, wherein the charge and discharge unit comprises a capacitor, a triac, and a power board; the capacitor is used for charging according to the current converted by the power conversion unit; the power panel is used for supplying power to the bidirectional controllable silicon after receiving the discharge control instruction, so that the bidirectional controllable silicon controls the capacitor to discharge.
7. A resistance testing method applied to the apparatus according to any one of claims 1 to 6, the method comprising:
the charging and discharging unit charges according to the current input by the test power supply, and discharges the resistor to be tested after the charging is finished so as to test the resistor to be tested.
8. The method of claim 7, wherein before discharging the resistor to be tested after the charging is completed, the method further comprises:
and when the voltage of the current input by the test power supply after the preset treatment reaches the set voltage, the charging and discharging unit determines that the charging is finished.
9. A resistance testing apparatus comprising a resistance testing device according to any one of claims 1 to 6.
10. An apparatus comprising resistance testing means which when in use implements the steps of the resistance testing method of any one of claims 7 to 8.
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