CN113092507A - High-efficiency intelligent identification and analysis method for microstructure of material - Google Patents
High-efficiency intelligent identification and analysis method for microstructure of material Download PDFInfo
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- CN113092507A CN113092507A CN202110295244.7A CN202110295244A CN113092507A CN 113092507 A CN113092507 A CN 113092507A CN 202110295244 A CN202110295244 A CN 202110295244A CN 113092507 A CN113092507 A CN 113092507A
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- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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Abstract
The invention provides a high-efficiency intelligent identification and analysis method for a material microstructure, and relates to the technical field of material microstructure analysis. The high-efficiency intelligent identification and analysis method for the microstructure of the material comprises the following specific contents: s1, placing a material to be detected in an X-ray single crystal diffractometer, turning off light in the X-ray single crystal diffractometer, and starting an X-ray scanning mechanism of the X-ray single crystal diffractometer, so that the surface of the material to be detected is scanned and analyzed by the X-ray scanning mechanism; s2, importing the material crystal structure data obtained after the X-ray single crystal diffractometer scans into a computer file folder for storage and standby; and S3, taking the material to be detected after the X-ray scanning out of the X-ray single crystal diffractometer. By designing a simple intelligent recognition analysis method, the crystal structure and related defects of the material can be rapidly analyzed, and meanwhile, the distribution condition of the surface components of the material can be observed by combining with the graph information, so that the overall working efficiency is greatly improved.
Description
Technical Field
The invention relates to the technical field of material microstructure analysis, in particular to a high-efficiency intelligent identification and analysis method for a material microstructure.
Background
Materials are substances used by humans to make machines, components, devices, and other products. Not all substances may be referred to as materials, such as fuels and chemical feedstocks, industrial chemicals, foods and pharmaceuticals, and generally do not count as materials. Materials can be classified in a variety of ways; the material is divided into metal material, inorganic non-metal material, organic high molecular material and composite material according to physical and chemical properties. Electronic materials, aerospace materials, building materials, energy materials, biological materials and the like according to the application; in practice, the materials are often classified into structural materials and functional materials. The structural material is based on mechanical properties and is used for manufacturing a component mainly stressed; the structural material also has the requirements of physical properties or chemical properties, such as gloss, thermal conductivity, radiation resistance, oxidation resistance, corrosion resistance and the like, and the requirements on the performance are different according to different material applications. The functional material is mainly a material prepared by utilizing different reactions of physical and chemical properties or biological phenomena of substances to external changes; such as semiconductor materials, superconducting materials, optoelectronic materials, magnetic materials, and the like, and microstructures relate to many fields such as chemistry, biology, physics, and the like, and refer to structures of substances, organisms, and cells under a microscope, and structures of molecules, atoms, and even sub-atoms.
The analysis of the microstructure of a material is one of material science researches, the most common analysis methods of the microstructure of the material at present comprise an X-ray analysis method and a spectrum analysis method, and although the X-ray analysis method can be used for analyzing the crystal structure and related defects of the material, the distribution condition of the surface components of the material cannot be observed, so a novel high-efficiency intelligent identification analysis method of the microstructure of the material is developed.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides a high-efficiency intelligent identification and analysis method for a microstructure of a material, and solves the problem that the distribution condition of surface components of the material cannot be observed although an X-ray analysis method can be used for analyzing the crystal structure and related defects of the material.
(II) technical scheme
In order to achieve the purpose, the invention is realized by the following technical scheme: a high-efficiency intelligent identification and analysis method for microstructure of material comprises the following specific contents:
s1, placing a material to be detected in an X-ray single crystal diffractometer, turning off light in the X-ray single crystal diffractometer, and starting an X-ray scanning mechanism of the X-ray single crystal diffractometer, so that the surface of the material to be detected is scanned and analyzed by the X-ray scanning mechanism;
s2, importing the material crystal structure data obtained after the X-ray single crystal diffractometer scans into a computer file folder for storage and standby;
s3, taking the material to be detected after X-ray scanning out of the X-ray single crystal diffractometer, placing the material on a carrier of a physical optical microscope, magnifying and imaging the microstructure on the surface of the material by utilizing the magnifying and imaging principle of the physical optical microscope, intercepting partial area of the microstructure by utilizing computer equipment to form graphic information, and guiding the graphic information into a computer folder for storage;
s4, uniformly importing the material crystal structure data information and the graphic information obtained by utilizing the optical microscope for magnifying imaging into computer material analysis software, and performing information cutting on the material crystal structure data information obtained by utilizing the X-ray scanning according to the graphic information obtained by utilizing the optical microscope for magnifying imaging, wherein only the material crystal structure data of the graphic information part is reserved;
and S5, performing data analysis on the processed material crystal structure data and the graphic information by using computer equipment, so that the graphic structure and the crystal structure analysis of the material are combined, and more comprehensive distribution conditions of the surface components of the material are conveniently obtained.
Preferably, in S1, after the material to be measured is placed in the X-ray single crystal diffractometer, besides turning off the lights in the X-ray single crystal diffractometer, the light source outside the apparatus needs to be isolated by using a shielding device.
Preferably, in S3, the microscope magnification of the physical optical microscope needs to be adjusted to 500 or more.
Preferably, in S3, when the computer device is used to intercept a part of the region to form the graphic information, the part of the image with homogeneous texture and regular and ordered crystal distribution needs to be intercepted.
Preferably, when information is clipped from the material crystal structure data information obtained by the X-ray scanning in S4, the clipped material crystal structure data needs to be slightly larger than the data of the graphic information portion.
Preferably, in S5, when the pattern structure and the crystal structure of the material are combined, both the analysis of the overall microstructure and the analysis of the partial single-crystal microstructure are required.
(III) advantageous effects
The invention provides a high-efficiency intelligent identification and analysis method for a microstructure of a material. The method has the following beneficial effects:
1. according to the high-efficiency intelligent identification and analysis method for the microstructure of the material, by adopting an analysis method combining material crystal structure data and graphic information, the distribution condition of the surface components of the material can be more conveniently and more accurately obtained, and meanwhile, more accurate detection data can be obtained.
2. According to the high-efficiency intelligent identification and analysis method for the microstructure of the material, through designing a simple intelligent identification and analysis method, the crystal structure and related defects of the material can be rapidly analyzed, and meanwhile, the distribution condition of the surface components of the material can be observed by combining with graphic information, so that the overall working efficiency is greatly improved, and the method is worthy of being widely popularized.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example (b):
the embodiment of the invention provides a high-efficiency intelligent identification and analysis method for a microstructure of a material, which comprises the following specific contents:
s1, placing a material to be detected in an X-ray single crystal diffractometer, turning off light in the X-ray single crystal diffractometer, and starting an X-ray scanning mechanism of the X-ray single crystal diffractometer, so that the surface of the material to be detected is scanned and analyzed by the X-ray scanning mechanism;
a small crystal diffracts X-rays with a diffraction direction related to the periodicity d of the crystal, and a diffraction always finds a family HKL of crystal planes which are in reflection relation with incident rays on the family, and the symbol HKL of the family is used as an index of the diffraction. The relationship is expressed by the bragg equation: 2dHKLsin theta HKL is equal to n lambda, wherein theta HKL is an included angle between an incident ray or a reflection ray and a crystal face family, lambda is the wavelength of the incident X-ray, and n is the reflection order.
S2, importing the material crystal structure data obtained after the X-ray single crystal diffractometer scans into a computer file folder for storage and standby;
s3, taking the material to be detected after X-ray scanning out of the X-ray single crystal diffractometer, placing the material on a carrier of a physical optical microscope, magnifying and imaging the microstructure on the surface of the material by utilizing the magnifying and imaging principle of the physical optical microscope, intercepting partial area of the microstructure by utilizing computer equipment to form graphic information, and guiding the graphic information into a computer folder for storage;
s4, uniformly importing the material crystal structure data information and the graphic information obtained by utilizing the optical microscope for magnifying imaging into computer material analysis software, and performing information cutting on the material crystal structure data information obtained by utilizing the X-ray scanning according to the graphic information obtained by utilizing the optical microscope for magnifying imaging, wherein only the material crystal structure data of the graphic information part is reserved;
and S5, performing data analysis on the processed material crystal structure data and the graphic information by using computer equipment, so that the graphic structure and the crystal structure analysis of the material are combined, and more comprehensive distribution conditions of the surface components of the material are conveniently obtained.
After the material to be measured is placed in the X-ray single crystal diffractometer in S1, besides the need to turn off the light in the X-ray single crystal diffractometer, the device external light source needs to be isolated by the shielding device, and by turning off the light in the X-ray single crystal diffractometer and isolating the device external light source, the material to be measured can be prevented from being interfered by the external light source, so that the scanning structure and data of X-rays are more accurate and clear.
In S3, the microscopic magnification of the physical optical microscope is required to be adjusted to 500 times or more, and the microscopic magnification of the physical optical microscope is required to be adjusted to 500 times or more, so that the optical microscope can observe the image information of the crystal on the surface of the material more clearly.
In the step S3, when the image information is formed by intercepting a part of the image area by using a computer device, the part of the image with uniform texture and ordered crystal distribution rule is intercepted, and the part of the image with uniform texture and ordered crystal distribution rule is intercepted, so that the image is more representative, and a more accurate and uniform image structure is conveniently obtained, thereby facilitating subsequent detection and research.
In S4, when the material crystal structure data information obtained by X-ray scanning is used for information cropping, the cropped material crystal structure data needs to be slightly larger than the data of the graphic information portion, and by making the material crystal structure data slightly larger than the data of the graphic information portion during cropping, it is possible to prevent large deviation of simple results due to data corruption in the process of combination analysis.
In S5, when the pattern structure and the crystal structure of the material are analyzed, the overall microstructure analysis is required, and the partial single crystal microstructure analysis is also required, so that the distribution of the surface components of the material is more comprehensive.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. A high-efficiency intelligent identification and analysis method for microstructure of material is characterized in that: the method comprises the following specific contents:
s1, placing a material to be detected in an X-ray single crystal diffractometer, turning off light in the X-ray single crystal diffractometer, and starting an X-ray scanning mechanism of the X-ray single crystal diffractometer, so that the surface of the material to be detected is scanned and analyzed by the X-ray scanning mechanism;
s2, importing the material crystal structure data obtained after the X-ray single crystal diffractometer scans into a computer file folder for storage and standby;
s3, taking the material to be detected after X-ray scanning out of the X-ray single crystal diffractometer, placing the material on a carrier of a physical optical microscope, magnifying and imaging the microstructure on the surface of the material by utilizing the magnifying and imaging principle of the physical optical microscope, intercepting partial area of the microstructure by utilizing computer equipment to form graphic information, and guiding the graphic information into a computer folder for storage;
s4, uniformly importing the material crystal structure data information and the graphic information obtained by utilizing the optical microscope for magnifying imaging into computer material analysis software, and performing information cutting on the material crystal structure data information obtained by utilizing the X-ray scanning according to the graphic information obtained by utilizing the optical microscope for magnifying imaging, wherein only the material crystal structure data of the graphic information part is reserved;
and S5, performing data analysis on the processed material crystal structure data and the graphic information by using computer equipment, so that the graphic structure and the crystal structure analysis of the material are combined, and more comprehensive distribution conditions of the surface components of the material are conveniently obtained.
2. The method for high-efficiency intelligent recognition and analysis of the microstructure of the material as claimed in claim 1, wherein: in S1, after the material to be measured is placed in the X-ray single crystal diffractometer, besides turning off the lights in the X-ray single crystal diffractometer, the light source outside the apparatus needs to be isolated by using a shielding device.
3. The method for high-efficiency intelligent recognition and analysis of the microstructure of the material as claimed in claim 1, wherein: in S3, the microscope magnification of the physical optical microscope needs to be adjusted to 500 or more.
4. The method for high-efficiency intelligent recognition and analysis of the microstructure of the material as claimed in claim 1, wherein: in S3, when the image information is formed by intercepting part of the region with a computer device, the part of the image with uniform texture and regular and ordered crystal distribution needs to be intercepted.
5. The method for high-efficiency intelligent recognition and analysis of the microstructure of the material as claimed in claim 1, wherein: when information cutting is performed on the material crystal structure data information obtained after the X-ray scanning in S4, the cut material crystal structure data needs to be slightly larger than the data of the graphic information portion.
6. The method for high-efficiency intelligent recognition and analysis of the microstructure of the material as claimed in claim 1, wherein: in the step S5, when the pattern structure and the crystal structure of the material are combined, both the overall microstructure analysis and the partial single-crystal microstructure analysis are required.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1073014A (en) * | 1992-10-28 | 1993-06-09 | 复旦大学 | Obtain the method for element distribution diagram on solid surface |
| JP2005326261A (en) * | 2004-05-14 | 2005-11-24 | Japan Synchrotron Radiation Research Inst | Rapid x-ray structure analysis method for ultrafine structure |
| CN103323470A (en) * | 2013-01-13 | 2013-09-25 | 赵景红 | Toilet powder and detection method of asbestos in talcum powder |
| US20160245738A1 (en) * | 2014-12-17 | 2016-08-25 | Instituto Mexicano Del Petróleo | Methodology for three-dimensional morphological and quantitative determination of micro and nanocavities produced by chemical and microbiological corrosion in metallic materials |
| CN111678927A (en) * | 2020-06-08 | 2020-09-18 | 首钢集团有限公司 | Method for analyzing oxide on surface of steel |
-
2021
- 2021-03-19 CN CN202110295244.7A patent/CN113092507A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1073014A (en) * | 1992-10-28 | 1993-06-09 | 复旦大学 | Obtain the method for element distribution diagram on solid surface |
| JP2005326261A (en) * | 2004-05-14 | 2005-11-24 | Japan Synchrotron Radiation Research Inst | Rapid x-ray structure analysis method for ultrafine structure |
| CN103323470A (en) * | 2013-01-13 | 2013-09-25 | 赵景红 | Toilet powder and detection method of asbestos in talcum powder |
| US20160245738A1 (en) * | 2014-12-17 | 2016-08-25 | Instituto Mexicano Del Petróleo | Methodology for three-dimensional morphological and quantitative determination of micro and nanocavities produced by chemical and microbiological corrosion in metallic materials |
| CN111678927A (en) * | 2020-06-08 | 2020-09-18 | 首钢集团有限公司 | Method for analyzing oxide on surface of steel |
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Application publication date: 20210709 |