CN113063977B - Simulation test method, simulation test device and computer-readable storage medium - Google Patents
Simulation test method, simulation test device and computer-readable storage medium Download PDFInfo
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- CN113063977B CN113063977B CN202110298220.7A CN202110298220A CN113063977B CN 113063977 B CN113063977 B CN 113063977B CN 202110298220 A CN202110298220 A CN 202110298220A CN 113063977 B CN113063977 B CN 113063977B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/029—Software therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0209—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form in numerical form
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
Abstract
Embodiments of the present disclosure provide an analog testing method, apparatus, and computer-readable storage medium, the method comprising: receiving a front eye diagram, obtaining eye height data and eye width data of the front eye diagram, and performing eye balance (EQ) processing on the eye height data and the eye width data of the front eye diagram to obtain simulated back eye diagram eye height data and eye width data; acquiring a test temperature value, and calculating to obtain a temperature compensation value according to the test temperature value and a temperature compensation function obtained in advance; and compensating the simulated back eye image high data and the simulated eye width data by using the temperature compensation value to obtain the compensated simulated eye image high data and the simulated eye width data. By performing temperature compensation on the simulated back eye height and eye width data, the attenuation of eye transmission signals caused by the ambient temperature can be avoided, and the test result is more accurate.
Description
Technical Field
The embodiment of the disclosure relates to the technical field of display, in particular to an analog testing method, an analog testing device and a computer readable storage medium.
Background
The eye diagram is a graph displayed by accumulating a series of digital signals on an oscilloscope, contains rich information, can observe the influence of inter-code crosstalk and noise from the eye diagram, and reflects the integral characteristics of the digital signals, so that the system quality is estimated, and the eye diagram analysis is the core of the signal integrity analysis of the high-speed interconnection system.
When testing a Source driver (S-IC), an eye diagram before the SOC (SstemOn a Chip) is transmitted to the S-IC (Source IC) is a front eye diagram, an eye diagram processed by the S-IC is a rear eye diagram, and when in actual test, data received by the S-IC can be simulated through an eye diagram equalization (EQ, equaizer) algorithm, so that test evaluation of products is realized.
Disclosure of Invention
The embodiment of the disclosure provides a simulation test method, a simulation test device and a computer readable storage medium, which can obtain more accurate test results.
In one aspect, an embodiment of the present disclosure provides an analog testing method, including:
receiving a front eye diagram, obtaining eye height data and eye width data of the front eye diagram, and performing eye balance (EQ) processing on the eye height data and the eye width data of the front eye diagram to obtain simulated back eye diagram eye height data and eye width data;
acquiring a test temperature value, and calculating to obtain a temperature compensation value according to the test temperature value and a temperature compensation function obtained in advance;
and compensating the simulated back eye image high data and the simulated eye width data by using the temperature compensation value to obtain the compensated simulated eye image high data and the simulated eye width data.
In an exemplary embodiment, the acquiring a test temperature value includes:
and acquiring a temperature value of a test site or acquiring an environment temperature value to be simulated, which is set by a tester.
In an exemplary embodiment, the simulation test method is used to simulate data received by the source driving circuit.
In an exemplary embodiment, the temperature compensation function is:
wherein: t is the temperature in degrees centigrade, k 1 、k 2 Is the S-IC parameter.
In an exemplary embodiment, the compensating the simulated back eye height data and the eye width data with the temperature compensation value to obtain compensated simulated eye height data and simulated eye width data includes: the compensated simulated eye height data and simulated eye width data are obtained by adopting the following formulas:
V eye (rear) ’＝T(t)*V eye (rear) ，PE eye (rear) ’＝T(t)*PE eye (rear) ，
Wherein T (T) is a temperature compensation value, V eye (rear) ' is the compensated analog eye height data, V eye (rear) PE for simulated back eye height data eye (rear) ' PE for compensated analog eye width data eye (rear) Is simulated back eye width data.
In an exemplary embodiment, the method further comprises: and restoring the back eye image according to the compensated simulated eye height data and simulated eye width data.
In an exemplary embodiment, the simulation test method is used for performing a simulation test on a display panel satisfying any one or more of the following conditions:
first, the size is greater than or equal to 65 inches or 75 inches;
the second condition is that the horizontal resolution is greater than or equal to 4k or 8k;
condition three, the refresh frequency is greater than or equal to 120hz.
On the other hand, the embodiment of the disclosure also provides an analog testing device, which comprises a processor and a memory storing a computer program capable of running on the processor, wherein the processor executes the program to realize the steps of the analog testing method.
In an exemplary embodiment, the analog test device further includes a temperature acquisition unit.
In yet another aspect, the disclosed embodiments also provide a computer readable storage medium storing a computer program executable on a processor for implementing the above-described simulation test method when executed by the processor.
According to the simulation test method and device, through temperature compensation of simulated back eye height and eye width data, eye pattern signal attenuation caused by ambient temperature can be avoided, and test results are more accurate.
Of course, not all of the above-described advantages need be achieved simultaneously in practicing any one of the products or methods of the present disclosure. Additional features and advantages of the disclosure will be set forth in the description which follows, and in part will be apparent from the description, or may be learned by practice of the disclosure. The objectives and other advantages of the disclosed embodiments may be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The accompanying drawings are included to provide a further understanding of the disclosed embodiments and are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the description serve to explain, without limitation, the disclosed embodiments. The shapes and sizes of various components in the drawings are not to scale true, and are intended to be illustrative of the present disclosure.
FIG. 1 is a flow chart of a simulation test method according to an embodiment of the present disclosure;
FIG. 2 is a simulation test flow of an embodiment of the present disclosure;
fig. 3 is a schematic structural diagram of a simulation test apparatus according to an embodiment of the disclosure.
Detailed Description
The present disclosure describes several embodiments, but the description is illustrative and not limiting, and it will be apparent to those of ordinary skill in the art that many more embodiments and implementations are possible within the scope of the embodiments described in the present disclosure. Although many possible combinations of features are shown in the drawings and discussed in the embodiments, many other combinations of the disclosed features are possible. Any feature or element of any embodiment may be used in combination with or in place of any other feature or element of any other embodiment unless specifically limited.
The present disclosure includes and contemplates combinations of features and elements known to those of ordinary skill in the art. The embodiments, features and elements of the present disclosure that have been disclosed may also be combined with any conventional features or elements to form a unique inventive arrangement as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive arrangements to form another unique inventive arrangement as defined in the claims. Thus, it should be understood that any of the features shown and/or discussed in this disclosure may be implemented alone or in any suitable combination. Accordingly, the embodiments are not to be restricted except in light of the attached claims and their equivalents. Further, various modifications and changes may be made within the scope of the appended claims.
Furthermore, in describing representative embodiments, the specification may have presented the method and/or process as a particular sequence of steps. However, to the extent that the method or process does not rely on the particular order of steps set forth herein, the method or process should not be limited to the particular sequence of steps described. Other sequences of steps are possible as will be appreciated by those of ordinary skill in the art. Accordingly, the particular order of the steps set forth in the specification should not be construed as limitations on the claims. Furthermore, the claims directed to the method and/or process should not be limited to the performance of their steps in the order written, and one skilled in the art can readily appreciate that the sequences may be varied and still remain within the spirit and scope of the embodiments of the present disclosure.
Unless defined otherwise, technical or scientific terms used in this disclosure have the ordinary meaning as understood by one of ordinary skill in the art to which this disclosure belongs. The terms "first," "second," and the like, as used in this disclosure, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. In this disclosure, "a plurality" may mean two or more than two numbers. The word "comprising" or "comprises", and the like, means that elements or items preceding the word are included in the element or item listed after the word and equivalents thereof, but does not exclude other elements or items.
In order to keep the following description of the embodiments of the present disclosure clear and concise, the present disclosure omits a detailed description of some known functions and known components. The drawings of the embodiments of the present disclosure relate only to the structures related to the embodiments of the present disclosure, and other structures may refer to the general design.
The inventor finds that when the test pictures are respectively a non-reload picture and a reload picture, the quality of the front eye pattern is the same, and the rear eye pattern is the same after the same EQ treatment in theory, but the eye pattern failure condition is different in the actual test, the eye pattern failure is not generated under the non-reload picture, and the eye pattern failure is generated under the reload picture, namely the actual test result is inconsistent with the theory. Heavy-duty pictures generally refer to display testing of a display panel in some extreme cases. For example, in some specific pixel voltage inversion modes and corresponding special test pictures, the common electrode of the display panel is subjected to a capacitive coupling effect from the pixel charging data line, so that the common electrode voltage is unstable, and in severe cases, poor display occurs on the picture. These special display test pictures are called heavy-duty pictures, and can be understood as a limit test of display performance of the display screen under various "heavy-duty" conditions. Through extensive experiments and analysis of different S-ICs, it was found that the simulation results do not correspond to the actual test results because the Thin Film Transistors (TFTs) inside the S-ICs are affected by temperature when under heavy load conditions, thereby resulting in the actual test results being different from the theoretical simulation results. Therefore, the inventor considers that the simulation test method needs to be corrected, and adds an environmental temperature factor in the EQ algorithm to correct the test result and eliminate the influence of the temperature factor on the test result.
The embodiment of the disclosure provides an analog testing method, which can be used for simulating data received by a source driving circuit, namely simulating a rear eye diagram of a source driver, as shown in fig. 1, and comprises the following steps:
step 10, receiving a front eye diagram, obtaining eye height data and eye width data of the front eye diagram, and performing eye Equalization (EQ) processing on the eye height data and the eye width data of the front eye diagram, so as to obtain simulated back eye diagram eye height data and eye width data;
in an exemplary embodiment, the front eye pattern may be understood as front eye pattern data, which may be a pair of differential signal data including all data of the front eye pattern, and the eye height data and the eye width data in the front eye pattern may be obtained through algorithm functions mature in the related art. As shown in fig. 2, the input CEDSA and CEDSB are a pair of differential signal data, and eye height data and eye width data in the eye pattern can be obtained after the processing of the function F (t).
In an exemplary embodiment, the eye height data and the eye width data of the simulated rear eye pattern are respectively:
V eye (rear) ＝H(V eye (front) )；PE eye (rear) ＝L(PE eye (front) )；
Wherein V is eye (rear) H () is a simulation algorithm for calculating eye height, V eye (front) PE for front eye high data eye (rear) For simulated back eye width data, L () is a simulation algorithm for calculating eye width, PE eye (front) Is the anterior eye width data.
H () and L () may be implemented using an eye Equalization (EQ) algorithm, also known as an eye enhancement algorithm, mature in the related art, which may be used to model the back eye.
Step 20, obtaining a test temperature value, and calculating a temperature compensation value according to the test temperature value and a temperature compensation function obtained in advance;
in an exemplary embodiment, the temperature compensation function may be obtained in advance by testing different S-ICs at different temperatures to obtain front-eye pattern data and corresponding actually measured back-eye pattern data of different S-ICs at different temperatures, and comparing the eye height and the eye width data in the eye pattern data, respectively, including comparing the front-eye pattern data and the eye height in the back-eye pattern data of the same block of S-ICs at the same temperature, and the eye width in the front-eye pattern data and the back-eye pattern data, and by fitting a large number of comparison results, the following temperature compensation function may be obtained:
wherein: t is the temperature in degrees centigrade, k 1 、k 2 S-IC parameters are designed according to the design method of the S-IC, and the S-ICs of different manufacturers are designed differently, k 1 And k 2 And may be different according to the high Wen Yantu test result of the product design stage.
In an exemplary embodiment, there are various ways to obtain the test temperature value, for example, the temperature value of the test site may be collected as the test temperature value by a temperature collection unit (e.g., a temperature sensor), or the test temperature value may be an ambient temperature value set by a tester and intended to be simulated.
Step 30, compensating the simulated back eye pattern eye height data and the simulated eye width data by using the temperature compensation value to obtain the compensated simulated eye height data and simulated eye width data;
in an exemplary embodiment, the compensated simulated eye height data and simulated eye width data may be obtained using the following formulas:
V eye (rear) ’＝T(t)*V eye (rear) ＝T(t)*H(V eye (front) )；
PE eye (rear) ’＝T(t)*PE eye (rear) ＝T(t)*L(PE eye (front) )；
Wherein T (T) is a temperature compensation value, V eye (rear) ' is the compensated simulated eye height data, i.e. the compensated simulated back eye height data, H () is the simulation algorithm for calculating eye height, PE eye (rear) ' is the compensated simulated eye width data, i.e., the compensated simulated back eye width data, and L () is the simulation algorithm that calculates the eye width.
In an exemplary embodiment, after step 30, the method may further include restoring the post-eye image according to the compensated simulated eye height data and the simulated eye width data. The back eye pattern can be restored by a process of a function F' (t) in fig. 2, which is a process opposite to the F (t) process. In an exemplary embodiment, the back eye pattern may be restored from the eye height data and the eye width data using algorithms well established in the related art.
By adopting the simulation test method and the simulation test device, the simulated back eye height and eye width data are subjected to temperature compensation, so that the attenuation of eye transmission signals caused by the ambient temperature can be avoided, and the test result is more accurate. By adopting the method to test different multiple S-ICs, the simulation results meet the expectations.
Although the embodiments of the present disclosure will be described with reference to the back-eye simulation of the source driver, those skilled in the art will recognize that the methods of the embodiments of the present disclosure may be used to compensate for the temperature of the eye height data and the eye width data of the back-eye if there is a temperature effect when the back-eye simulation of other devices is required.
The method and the device are particularly suitable for testing large-size display panels, and for example, the display panels meeting any one or more of the following conditions can be subjected to simulation test:
first, the size is greater than or equal to 65 inches or 75 inches;
the second condition is that the horizontal resolution is greater than or equal to 4k or 8k;
the horizontal resolution of 4k refers to an image with a pixel value of 4096 pixels or close to 4096 pixels in each row in the horizontal direction, for example, 4096×2160 or 3840×2160, which can be regarded as 4k resolution. The horizontal resolution 8k refers to an image in which pixel values of each line in the horizontal direction reach or approach 8192 pixels, for example 7680x4320.
Condition three, the refresh frequency is greater than or equal to 120hz.
In an exemplary embodiment, the present disclosure also provides an analog testing apparatus, which may include a processor and a memory storing a computer program executable on the processor, wherein the processor implements the steps of the analog testing method in any of the above embodiments of the present disclosure when the computer program is executed by the processor.
In an exemplary embodiment, the analog test device may further include a temperature acquisition unit, such as a temperature sensor.
In one exemplary embodiment, fig. 3 is a schematic structural diagram of a simulation test apparatus in an embodiment of the present disclosure. As shown in fig. 3, the apparatus 50 includes: at least one processor 501; and at least one memory 502, bus 503 coupled to processor 501; wherein, the processor 501 and the memory 502 complete the communication with each other through the bus 503; the processor 501 is configured to invoke program instructions in the memory 502 to perform the steps of the simulation test method in any of the embodiments described above.
The processor may be a central processing unit (Central Processing Unit, CPU), microprocessor (Micro Processor Unit, MPU), digital signal processor (Digital Signal Processor, DSP), application Specific Integrated Circuit (ASIC), off-the-shelf programmable gate array (Field Programmable Gate Array, FPGA), transistor logic device, or the like, as this disclosure is not limited in this regard.
The Memory may include Read Only Memory (ROM) and random access Memory (Random Access Memory, RAM) and provides instructions and data to the processor. A portion of the memory may also include non-volatile random access memory. For example, the memory may also store information of the device type.
The buses may include, in addition to data buses, power buses, control buses, status signal buses, and the like. But for clarity of illustration the various buses are labeled as buses in fig. 3.
In implementation, the processing performed by the processing device may be performed by integrated logic circuits of hardware in a processor or by instructions in the form of software. That is, the method steps of the embodiments of the present disclosure may be embodied as hardware processor execution or as a combination of hardware and software modules in a processor. The software modules may be located in random access memory, flash memory, read only memory, programmable read only memory, or electrically erasable programmable memory, registers, and other storage media. The storage medium is located in a memory, and the processor reads the information in the memory and, in combination with its hardware, performs the steps of the above method. To avoid repetition, a detailed description is not provided herein.
In an exemplary embodiment, the disclosed embodiments also provide a non-transitory computer readable storage medium having stored thereon a computer program executable on a processor, which when executed by the processor, implements the steps of the aforementioned simulation test method.
Those of ordinary skill in the art will appreciate that all or some of the steps, systems, functional modules/units in the apparatus, and methods disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof. In a hardware implementation, the division between the functional modules/units mentioned in the above description is not a fraction; for example, one physical component may have multiple functions, or one function or step may be performed cooperatively by several physical components. Some or all of the components may be implemented as software executed by a processor, such as a digital signal processor or microprocessor, or as hardware, or as an integrated circuit, such as an application specific integrated circuit. Such software may be distributed on computer readable media, which may include computer storage media (or non-transitory media) and communication media (or transitory media). The term computer storage media includes both volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data, as known to those skilled in the art. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital Versatile Disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. Furthermore, as is well known to those of ordinary skill in the art, communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and includes any information delivery media.
While the embodiments disclosed in the present disclosure are described above, the embodiments are only employed for facilitating understanding of the present disclosure, and are not intended to limit the present disclosure. Any person skilled in the art to which this disclosure pertains will appreciate that numerous modifications and changes in form and details can be made without departing from the spirit and scope of the disclosure, but the scope of the disclosure is to be determined by the appended claims.
Claims (7)
1. A method of analog testing, comprising:
receiving a front eye diagram, obtaining eye height data and eye width data of the front eye diagram, and performing eye balance (EQ) processing on the eye height data and the eye width data of the front eye diagram to obtain simulated back eye diagram eye height data and eye width data;
acquiring a test temperature value, and calculating to obtain a temperature compensation value according to the test temperature value and a temperature compensation function obtained in advance; the temperature compensation function is:
wherein: t is the temperature in degrees centigrade, k 1 、k 2 Is a source driver parameter;
and compensating the simulated back eye pattern eye height data and the simulated eye width data by using the temperature compensation value to obtain compensated simulated eye pattern eye height data and simulated eye width data so as to avoid attenuation of back eye pattern transmission signals caused by ambient temperature, wherein the compensated simulated eye pattern eye height data and simulated eye width data are obtained by adopting the following formulas:
V eye (rear) ’＝T(t)*V eye (rear)
PE eye (rear) ’＝T(t)*PE eye (rear)
Wherein T (T) is a temperature compensation value, V eye (rear) ' is the compensated analog eye height data, V eye (rear) PE for simulated back eye height data eye (rear) ' PE for compensated analog eye width data eye (rear) Is simulated back eye width data;
and restoring the back eye image according to the compensated simulated eye height data and simulated eye width data.
2. The method of claim 1, wherein the obtaining a test temperature value comprises:
and acquiring a temperature value of a test site or acquiring an environment temperature value to be simulated, which is set by a tester.
3. The method of claim 1, wherein the analog test method is used to simulate data received by a source driver circuit.
4. A method according to claim 1 or 3, wherein the analogue test method is used for analogue testing of a display panel meeting any one or more of the following conditions:
first, the size is greater than or equal to 65 inches or 75 inches;
the second condition is that the horizontal resolution is greater than or equal to 4k or 8k;
condition three, the refresh frequency is greater than or equal to 120hz.
5. An analogue test device comprising a processor and a memory storing a computer program executable on the processor, wherein the processor implements the steps of the analogue test method as claimed in any one of claims 1 to 4 when the program is executed by the processor.
6. The analog testing device of claim 5, further comprising a temperature acquisition unit.
7. A computer readable storage medium, characterized in that it has stored thereon a computer program executable on a processor, which computer program, when executed by the processor, implements the steps of the simulation test method according to any of claims 1 to 4.
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Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102567692A (en) * | 2010-12-28 | 2012-07-11 | 上海贝尔股份有限公司 | Device and method for adaptive regulation on parameter set input into high-speed chip |
| CN106330296A (en) * | 2016-08-31 | 2017-01-11 | 无锡市电子仪表工业有限公司 | Method for calibrating, compensating and self-correcting parameters of optical module |
| CN107634447A (en) * | 2017-09-21 | 2018-01-26 | 武汉恒泰通技术有限公司 | A kind of acquisition device and its acquisition methods of optical module eye pattern compensated curve |
| CN107645120A (en) * | 2017-09-21 | 2018-01-30 | 武汉恒泰通技术有限公司 | A kind of eye pattern compensates optical module and its eye pattern automatic compensating method automatically |
| CN108234381A (en) * | 2017-12-29 | 2018-06-29 | 迈普通信技术股份有限公司 | Method for compensating signal and device |
| CN108535631A (en) * | 2018-04-02 | 2018-09-14 | 郑州云海信息技术有限公司 | A kind of test method and system of test chip internal signal eye pattern |
| CN109194460A (en) * | 2018-10-26 | 2019-01-11 | 光梓信息科技（上海）有限公司 | Clock data recovery circuit, adaptive adjustment module and method |
| CN209181997U (en) * | 2018-12-27 | 2019-07-30 | 上海航天科工电器研究院有限公司 | A kind of high/low temperature eye figure test device automatically switched for multichannel optical module |
| CN111416917A (en) * | 2020-03-30 | 2020-07-14 | 高拓讯达（北京）科技有限公司 | Analog television signal processing method and device |
| CN112416282A (en) * | 2020-11-30 | 2021-02-26 | Oppo广东移动通信有限公司 | Compensation method, terminal and computer storage medium |
| CN112436852A (en) * | 2020-12-07 | 2021-03-02 | 海光信息技术股份有限公司 | Method and device for searching parameters of analog front-end circuit of receiver |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6785622B2 (en) * | 2001-10-29 | 2004-08-31 | Agilent Technologies, Inc. | Method and apparatus for performing eye diagram measurements |
| TWI228850B (en) * | 2004-01-14 | 2005-03-01 | Asia Optical Co Inc | Laser driver circuit for burst mode and making method thereof |
| KR102148206B1 (en) * | 2013-11-26 | 2020-08-27 | 삼성디스플레이 주식회사 | Stereoscopic image display device and driving method thereof |
| KR102548857B1 (en) * | 2016-11-30 | 2023-06-29 | 삼성디스플레이 주식회사 | Display apparatus and method of driving display panel using the same |
-
2021
- 2021-03-19 CN CN202110298220.7A patent/CN113063977B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102567692A (en) * | 2010-12-28 | 2012-07-11 | 上海贝尔股份有限公司 | Device and method for adaptive regulation on parameter set input into high-speed chip |
| CN106330296A (en) * | 2016-08-31 | 2017-01-11 | 无锡市电子仪表工业有限公司 | Method for calibrating, compensating and self-correcting parameters of optical module |
| CN107634447A (en) * | 2017-09-21 | 2018-01-26 | 武汉恒泰通技术有限公司 | A kind of acquisition device and its acquisition methods of optical module eye pattern compensated curve |
| CN107645120A (en) * | 2017-09-21 | 2018-01-30 | 武汉恒泰通技术有限公司 | A kind of eye pattern compensates optical module and its eye pattern automatic compensating method automatically |
| CN108234381A (en) * | 2017-12-29 | 2018-06-29 | 迈普通信技术股份有限公司 | Method for compensating signal and device |
| CN108535631A (en) * | 2018-04-02 | 2018-09-14 | 郑州云海信息技术有限公司 | A kind of test method and system of test chip internal signal eye pattern |
| CN109194460A (en) * | 2018-10-26 | 2019-01-11 | 光梓信息科技（上海）有限公司 | Clock data recovery circuit, adaptive adjustment module and method |
| CN209181997U (en) * | 2018-12-27 | 2019-07-30 | 上海航天科工电器研究院有限公司 | A kind of high/low temperature eye figure test device automatically switched for multichannel optical module |
| CN111416917A (en) * | 2020-03-30 | 2020-07-14 | 高拓讯达（北京）科技有限公司 | Analog television signal processing method and device |
| CN112416282A (en) * | 2020-11-30 | 2021-02-26 | Oppo广东移动通信有限公司 | Compensation method, terminal and computer storage medium |
| CN112436852A (en) * | 2020-12-07 | 2021-03-02 | 海光信息技术股份有限公司 | Method and device for searching parameters of analog front-end circuit of receiver |
Non-Patent Citations (2)
| Title |
|---|
| H. Nishimoto等.New method analyzing eye patterns and its application to high-speed optical transmission system.《Journal of Lightwave Technology》.1988,第6卷(第5期),全文. * |
| 卢从俊.光示波器校准规范及眼图校准模块的研究.《中国优秀硕士学位论文全文数据库》.2010,(第6期),全文. * |
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