CN112994786B - Optical module degradation testing method, system, equipment and storage medium - Google Patents
Optical module degradation testing method, system, equipment and storage medium Download PDFInfo
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
Abstract
The application provides an optical module degradation testing method, an optical module degradation testing system, optical module degradation testing equipment and a storage medium. The method comprises the following steps: determining the corresponding H polarization state error rate and V polarization state error rate according to the pre-acquired H polarization state error code count and V polarization state error code count of the optical module to be detected; determining corresponding H polarization state error code chi-square characterization quantity and V polarization state error code chi-square characterization quantity according to the H polarization state error code rate and the V polarization state error code rate; determining a polarization state signal quality difference characterization quantity according to the H polarization state error code chi-square characterization quantity and the V polarization state error code chi-square characterization quantity; and determining the degradation degree of the optical module to be detected according to the polarization state signal quality difference characterization quantity.
Description
Technical Field
The present application relates to testing, and in particular, to a method, a system, an apparatus, and a storage medium for testing degradation of an optical module.
Background
The optical module is composed of an optoelectronic device, a functional circuit, an optical interface and the like and is used for photoelectric conversion. Degradation of devices in an optical module is an important factor affecting the reliability of the outfield backbone network.
The test is performed under the condition of passing through the short fiber self-loop, namely, a signal is sent out by the sending end of the optical module, then the signal is received by the receiving end, and the degradation of the optical module is tested according to the result difference of the signal, but the result difference cannot be reflected due to extremely limited indexes, namely, the screening of the component level faults cannot be performed.
Disclosure of Invention
In view of this, the embodiments of the present application provide a method, a system, an apparatus, and a storage medium for testing degradation of an optical module, so as to implement fault screening at the level of components in the optical module.
The embodiment of the application provides an optical module degradation testing method, which comprises the following steps:
determining the corresponding H polarization state error rate and V polarization state error rate according to the pre-acquired H polarization state error code count and V polarization state error code count of the optical module to be detected;
determining corresponding H polarization state error code chi-square characterization quantity and V polarization state error code chi-square characterization quantity according to the H polarization state error code rate and the V polarization state error code rate;
determining a polarization state signal quality difference characterization quantity according to the H polarization state error code chi-square characterization quantity and the V polarization state error code chi-square characterization quantity;
and testing the degradation degree of the optical module to be tested according to the polarization state signal quality difference characterization quantity.
The embodiment of the application provides an optical module degradation testing system, which comprises: the testing machine frame, the switch and the optical module testing tooling plate; the optical module test tooling plate includes: an optical module to be tested and an optical module testing device;
the optical module testing device comprises: the optical fiber optical system comprises a wave combiner, a first optical amplifier, an optical fiber, a second optical amplifier and a wave separator; the transmitting end of the optical module to be tested is connected with the first end of the wave combiner, the first end of the first optical amplifier is connected with the second end of the wave combiner, the second end of the first optical amplifier is connected with the first end of the optical fiber, the first end of the second optical amplifier is connected with the second end of the optical fiber, the second end of the second optical amplifier is connected with the first end of the wave splitter, and the second end of the wave splitter is connected with the receiving end of the optical module to be tested;
the transmitting end of the optical module to be tested is connected to the upper port of the combiner through an optical fiber jumper, the combiner couples the transmitting light of the optical modules to be tested with different wavelengths into a main light path, and the transmitting light returns to the receiving end of the optical module to be tested from the lower port of the specific wavelength through the optical fiber jumper through the splitter after passing through a solid fiber system consisting of the optical amplifier and the optical fiber.
An embodiment of the present application provides an apparatus, including: a memory, and one or more processors; device for preventing and treating cancer
A memory arranged to store one or more programs;
the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the methods of any of the embodiments described above.
The present application provides a storage medium storing a computer program which, when executed by a processor, implements the method of any of the above embodiments.
Drawings
Fig. 1 is a flowchart of an optical module degradation testing method provided in an embodiment of the present application;
fig. 2 is a block diagram of an optical module degradation testing system according to an embodiment of the present application;
fig. 3 is a schematic diagram of connection between an optical module degradation testing system and a testing PC according to an embodiment of the present application;
fig. 4 is a connection schematic diagram of an optical module testing device provided in an embodiment of the present application;
fig. 5 is a schematic diagram of a position of a receiving end of an optical module to be tested for sampling a polarization state error count according to an embodiment of the present application;
FIG. 6 is a schematic diagram showing a test result according to an embodiment of the present application;
fig. 7 is a block diagram of an optical module degradation testing device according to an embodiment of the present application;
fig. 8 is a schematic structural diagram of an apparatus according to an embodiment of the present application.
Detailed Description
Embodiments of the present application will be described below with reference to the accompanying drawings. Embodiments and features of embodiments in this application may be combined with each other arbitrarily without conflict.
In the process of screening for degradation of devices in an optical module, the following difficulties exist: firstly, the test is carried out under the condition of passing through the self-loop of the short fiber, the test index is extremely limited, and the result difference cannot be reflected; secondly, the service link of the high-speed optical module is longer, and the digital signal processor (Digital Signal Processing, DSP), the high-speed socket, the high-speed wiring, the LD spectrum quality, the Drive (DRIVER), the modulator, the welding point and the like can influence the testing performance of the optical module to be tested, namely, the index difference between the modules is difficult to distinguish the difference between devices; thirdly, in order to screen the difference of the device degradation, it is necessary to ensure that the test is performed under the same test condition, for example, the external conditions are consistent: long-range optical system dispersion, optical signal-to-noise ratio, fiber-entering power and wavelength position; the internal conditions are consistent: signal shielding level, fiber coupling quality, DSP to optical device matching, etc.
In view of this, the application provides an optical module degradation testing method, which solves the problems that the existing optical module has poor testing and screening effects and cannot screen faults at the component level.
In an implementation manner, fig. 1 is a flowchart of an optical module degradation testing method provided in an embodiment of the present application. The embodiment is applied to the situation of screening the degradation degree of components in the optical module. The present embodiment may be performed by an optical module degradation testing system.
As shown in fig. 1, the method in the present embodiment includes S110 to S140.
S110, determining the corresponding H polarization state error rate and V polarization state error rate according to the pre-acquired H polarization state error count and V polarization state error count of the optical module to be detected.
In general, natural light, also called orthogonal light, can be decomposed into a vertical direction vibration portion and a horizontal direction vibration portion. In an embodiment, the H-polarization error count refers to an error count generated by a horizontal vibration portion; the V-polarization error count refers to the error count generated by the vertical vibration portion.
In an embodiment, the optical module to be tested is mounted on an optical module test tooling plate, and the optical module test tooling plate is inserted into a test machine frame to test the degradation degree of the optical module to be tested. In the test process, the H polarization state error code count and the V polarization state error code count of the optical module to be tested are continuously collected through the optical module test tooling plate, and the corresponding H polarization state error code rate and V polarization state error code rate are calculated according to the H polarization state error code count and the V polarization state error code count.
In an embodiment, the ratio between the polarization state error count and the signal rate x acquisition time may be used as the polarization state error rate, i.e. polarization state error rate=polarization state error count/(signal rate x acquisition time). In an embodiment, the H-polarization error rate is a ratio between the H-polarization error count and the signal rate x acquisition time; the V-polarization error rate is the ratio between the V-polarization error count and the signal rate x acquisition time. In an embodiment, the acquisition time taken for the H-polarization error count and the V-polarization error count are the same.
S120, determining corresponding H polarization state error code chi-square characterization quantity and V polarization state error code chi-square characterization quantity according to the H polarization state error code rate and the V polarization state error code rate.
In an embodiment, the H-polarization error chi-square characteristic quantity refers to a horizontal polarization signal quality characteristic quantity, and is used for representing signal quality in a horizontal direction; the V polarization state error code chi-square representation quantity refers to a vertical polarization state signal quality representation quantity used for representing the signal quality in the vertical direction. In the embodiment, a series of operations can be performed on the H polarization state error rate to obtain the corresponding H polarization state error chi-square characterization quantity; a series of operations can be performed on the V-polarization state error rate to obtain the corresponding V-polarization state error chi-square characterization quantity.
S130, determining a polarization state signal quality difference representation value according to the H polarization state error code chi-square representation value and the V polarization state error code chi-square representation value.
In an embodiment, after determining the H-polarization state error chi-square characteristic amount and the V-polarization state error chi-square characteristic amount of the optical module to be tested, the two chi-square characteristic amounts may be differenced, and the difference value is used as a polarization state signal quality difference characteristic amount. Illustratively, the H-polarization error chi-square token is denoted as Q H The method comprises the steps of carrying out a first treatment on the surface of the The V polarization state error code chi-square representation quantity is marked as Q V The method comprises the steps of carrying out a first treatment on the surface of the The polarization state signal quality difference characterization quantity is recorded as dQ, and dQ=Q H -Q V 。
And S140, determining the degradation degree of the optical module to be tested according to the polarization state signal quality difference characterization quantity.
In an embodiment, the polarization state signal quality difference characterization quantity is used for characterizing different degradation degrees of the optical module to be tested. In an embodiment, the larger the absolute value of the polarization state signal quality difference characterization quantity is, the more serious the degradation degree of the optical module to be tested is, namely, the more serious the degradation degree of the element device in the optical module to be tested is.
In an embodiment, in order to ensure the normal operation of each optical module to be tested, if the polarization state signal quality difference representation of the optical module to be tested exceeds the preset signal quality difference representation threshold, the degradation degree of components in the optical module to be tested is severe, and normal operation cannot be performed, the optical module to be tested can be directly screened out.
In the embodiment, an H polarization state and V polarization state error rate statistical difference value screening algorithm is adopted, data are adopted from the same optical module, and the optical module degradation testing system can provide consistent module internal conditions for screening of optical module device levels; and the sampling data belong to the same wavelength, so that the optical module degradation testing system can effectively avoid the large attenuation difference of individual wavelength channels in the production environment and the index difference of different optical modules to be tested caused by uneven distribution of introduced noise in the whole wave band, thereby improving the testing accuracy of the degradation degree of the optical modules to be tested.
In an embodiment, the optical module degradation testing method further includes: acquiring a frame number and a slot number of a testing frame where an optical module testing tooling plate is positioned, wherein the optical module testing tooling plate is used for loading an optical module to be tested; distributing Internet Protocol (IP) addresses according to the frame numbers and the slot numbers; and allocating corresponding wavelengths for the optical module testing tool plate according to the IP address.
In an embodiment, according to the packages of different optical modules to be tested, multiple wavelengths may be allocated to the optical module testing tool board, i.e. each optical module testing tool board may test multiple optical modules to be tested, or it may be understood that each optical module testing tool board may be provided with multiple optical modules to be tested. In the optical module degradation testing system, a machine frame number corresponding to a testing machine frame where an optical module testing tool plate is currently located is obtained, the position of the optical module testing tool plate in the testing machine frame is obtained, and a corresponding slot number is determined according to the position in the testing machine frame; distributing IP addresses according to the frame numbers and the slot numbers of the test frames where the optical module test tool plates are positioned; and then, each optical module to be tested installed on the optical module test tooling plate for acquiring the IP address acquires a specific allocated wavelength according to the IP address. In an embodiment, the allocation rule of wavelengths may cover the entire c+l band. Wherein, C+L wave band refers to in the optical communication field: 192.1 to 196.1THz (C band) and 186.9 to 190.9THz (L band).
In the embodiment, wavelength distribution is carried out through combination logic of a machine frame dialing number and a slot number, the whole C+L wave band is reasonably utilized, the stability of the optical module test tooling plate slot and the fiber receiving is kept, and the operation of production personnel is facilitated. Meanwhile, a specific wavelength is set for each optical module to be tested in the real fiber system by utilizing the relation between the machine frame and the slot position, so that wavelength conflict is avoided. At the same time, the correctness of the production operation is ensured by the fixed distribution relation.
In an embodiment, determining the corresponding H-polarization error rate and V-polarization error rate according to the pre-collected H-polarization error count and V-polarization error count of the optical module to be tested includes: calculating the ratio of the pre-collected H polarization state error code count and the collection time of the optical module to be detected to obtain a corresponding H polarization state error code rate; and calculating the ratio of the pre-collected V-polarization state error code count and the collection time of the optical module to be detected to obtain the corresponding V-polarization state error code rate.
In an embodiment, the ratio between the H-polarization error count and the signal rate of the optical module to be tested is used as the H-polarization error rate; and taking the ratio between the V polarization state error code count and the signal rate of the optical module to be tested as the V polarization state error code rate.
In an embodiment, determining the corresponding H-polarization state error chi-square characterization and V-polarization state error chi-square characterization according to the H-polarization state error rate and the V-polarization state error rate includes: performing inverse function calculation of right tail probability of chi-square distribution on the H polarization state error rate and the V polarization state error rate respectively to obtain a first value and a second value; and carrying out logarithmic conversion on the first numerical value and the second numerical value respectively to obtain a corresponding H polarization state error code chi-square representation and a corresponding V polarization state error code chi-square representation.
In the embodiment, the inverse function calculation of the right tail probability of chi-square distribution is performed on the error rates of the two polarization states respectively, and logarithmic conversion is performed to obtain QH of the H polarization state and QV of the V polarization state. Wherein QH represents the horizontal polarization state error code chi-square representation quantity, and QV represents the vertical polarization state error code chi-square representation quantity.
In an embodiment, determining the degradation degree of the optical module to be tested according to the polarization state signal quality difference characterization quantity includes: comparing the polarization state signal quality difference characterization quantity with a preset signal quality difference characterization quantity; and determining the degradation degree of the optical module to be tested according to the comparison result.
In an embodiment, the polarization state signal quality difference characterization quantity is used for characterizing quality differences of two polarization states of the optical module to be tested, so as to achieve the purpose of screening the degraded optical module to be tested. In an embodiment, after determining the polarization state signal quality difference characterization amount of the optical module to be tested, the polarization state signal quality difference characterization amount and the preset signal quality difference characterization amount are differenced, and if the difference between the polarization state signal quality difference characterization amount and the preset signal quality difference characterization amount is larger, the more serious the degradation degree of the optical module to be tested is indicated.
In an embodiment, a plurality of preset signal quality difference characterizations may be set, for example, 3 preset signal quality difference characterizations are A, B and C, respectively, where a < B < C. Meanwhile, the polarization state signal quality difference representation quantity of the optical module to be tested is D, and when D is smaller than A, the degradation degree of the optical module to be tested is indicated as level a; when D is between A and B, the degradation degree of the optical module to be detected is indicated as level B; when D is between B and C, the degradation degree of the optical module to be detected is indicated as level C; when D is greater than C, the degradation degree of the optical module to be tested is indicated as level D. That is, the degradation degree of the optical module to be tested corresponding to the level a is the least; the degradation degree of the optical module to be tested corresponding to the level d is the most serious.
Fig. 2 is a block diagram of an optical module degradation testing system according to an embodiment of the present application. As shown in fig. 2, the optical module degradation testing system includes: a test machine frame 10, a switch 20 and an optical module test tooling board 30; the optical module test tooling plate 30 includes: an optical module 301 to be tested and an optical module testing device 302;
the optical module testing device 302 includes: a combiner 3021, a first optical amplifier 3022, an optical fiber 3023, a second optical amplifier 3024, and a demultiplexer 3025; the transmitting end of the optical module 301 to be tested is connected with the first end of the multiplexer 3021, the first end of the first optical amplifier 3022 is connected with the second end of the multiplexer 3021, the second end of the first optical amplifier 3022 is connected with the first end of the optical fiber 3023, the first end of the second optical amplifier 3024 is connected with the second end of the optical fiber 3023, the second end of the second optical amplifier 3024 is connected with the first end of the demultiplexer 3025, and the second end of the demultiplexer 3025 is connected with the receiving end of the optical module 301 to be tested;
the transmitting end of the optical module 301 to be tested is connected to the upper port of the combiner 3021 through an optical fiber jumper, the combiner 3021 couples the transmitting light of the optical module 301 to be tested with different wavelengths into the main optical path, the transmitting light passes through the real fiber system formed by the first optical amplifier 3022 and the optical fiber 3023, and then returns to the receiving end of the optical module 301 to be tested from the lower port with specific wavelength through the optical fiber jumper via the splitter 3025.
In an embodiment, the test frame 10 is connected to its external test personal computer (Personal Computer, PC) through the switch 20. A plurality of test frames 10 may be included in the optical module degradation test system, and each test frame 10 is connected to a test PC through a switch 20, and an optical module test tooling board 30 is inserted on each test frame 10. A plurality of optical modules 301 to be tested can be inserted into each optical module test tooling plate 30, i.e. degradation test can be performed on the plurality of optical modules 301 to be tested.
In one embodiment, the system of the first optical amplifier and the optical fiber is referred to as an optical fiber system. In an embodiment, the optical fiber system may include one or more first optical amplifiers and one or more optical fibers, and the number of first optical amplifiers and the number of optical fibers are the same, that is, the optical fiber system is: (first optical amplifier+optical fiber) N, where N is an integer greater than or equal to 1.
In an embodiment, the first optical amplifier 1023 and the second optical amplifier 1025 may be the same type of optical amplifier, which are used for amplifying optical signals, but are not limited thereto.
In an embodiment, the optical module degradation testing system further comprises: the noise source is respectively connected with the second end of the second optical amplifier and the first end of the demultiplexer and is used for adding noise to the real fiber system and exciting error codes before error correction of the optical module to be tested. In the embodiment, noise is added to the real fiber system by utilizing a noise source, so that the signal-to-noise ratio of an optical path can be flexibly allocated, the test stress can be adjusted, the error rate before error correction of the optical module to be tested is stimulated, and the error rate before error correction under the specific noise condition is used as one of screening parameters.
In an embodiment, the optical module degradation testing system further comprises: and the optical attenuator is respectively connected with the second end of the combiner and the first end of the first optical amplifier and is used for controlling the optical signal-to-noise ratio. In an embodiment, a noise source in the optical module degradation testing system can be removed, and the optical signal-to-noise ratio can be controlled by adding an optical attenuator between the combiner and the first optical amplifier.
In one embodiment, the transmission dispersion is set by using an optical fiber, and the transmission dispersion is used for exciting an internal dispersion compensation algorithm of the optical module to be tested and running a dispersion compensation function. In the embodiment, the system transmission dispersion can be introduced into the optical module degradation test system, so that the related work of the dispersion compensation algorithm in the optical module to be tested can be excited, and the verification of the dispersion compensation function is realized. In an embodiment, system transmission dispersion is introduced into the optical module degradation testing system, that is, transmission dispersion is introduced into an optical fiber in the optical module testing device, so that a dispersion compensation function of an optical module to be tested is excited.
In an implementation manner, fig. 3 is a schematic diagram of connection between an optical module degradation testing system and a testing PC according to an embodiment of the present application. As shown in fig. 3, the optical module degradation test system includes: test subrack 310, switch 320, optical module test tooling board 330.
In an embodiment, test PC340 is connected to test subrack 310 through switch 320, and optical module test tooling board 330 also accesses switch 320 through the subrack. In an embodiment, the optical module degradation testing system may include: n test frames 310, namely frame 1, frame 2 … …, frame N.
In the process of building the optical module degradation testing system, firstly, the optical module to be tested is installed on the optical module testing tooling plate 320, and the optical module testing tooling plate 330 with the optical module to be tested installed is inserted into the testing machine frame 310 so as to test the optical module to be tested.
In an implementation manner, fig. 4 is a schematic connection diagram of an optical module testing apparatus provided in an embodiment of the present application. As shown in fig. 4, the optical module testing apparatus includes: a combiner 410, a first optical amplifier 420, an optical fiber 430, a second optical amplifier 440, a demultiplexer 450, and a noise source 460. In an embodiment, a transmitting end of an optical module 470 to be tested is connected to a first end of a combiner 410, a receiving end of the optical module 470 to be tested is connected to a second end of a demultiplexer 450, the transmitting end of the optical module 470 to be tested is connected to an add port of a specific wavelength of the combiner 410 through an optical fiber jumper, the combiner 410 couples optical transmissions of optical modules of different wavelengths into a main optical path, and after passing through a solid fiber system formed by the first optical amplifier 420 and the optical fiber 430 together, the optical transmission is returned to the receiving end of the optical module 470 to be tested from a drop port of the specific wavelength through the optical fiber jumper via the demultiplexer 450. Noise source 460 is used to add noise to the real fiber system and excite the pre-error correction code of the measured optical module 470.
In an embodiment, when the H-polarization state error count and the V-polarization state error count are collected and screened, and the test item of the polarization state error rate and the other test items (for example, the optical power test and the status register test) are performed in series, in order to ensure that the other test items are not affected by the time occupied by the collection of the H-polarization state error count and the V-polarization state error count, only a short time is collected each time, and the data collected multiple times are smoothed.
In the optical module degradation testing system, a testing PC numbers according to the number of each testing machine frame and the position of an optical module testing tool plate in the testing machine frame (namely, a slot number), an IP address is allocated to each optical module testing tool plate, a specific allocated wavelength is obtained according to the IP address by an optical module to be tested on each optical module testing tool plate for obtaining the IP address, and the rule of allocating the wavelength can cover the whole C+L wave band.
The optical module testing tooling plate continuously collects the H polarization state error code count and the V polarization state error code count of the optical module to be tested, and counts the error codes of the two polarization states after a period of collection time.
The test PC obtains Q of H polarization state by performing inverse function calculation of right tail probability of chi-square distribution on error rates of two polarization states respectively and performing logarithmic conversion H And Q of V polarization V . Wherein Q is H Representing the characteristic quantity of a horizontal polarization state error code chi-square and Q V Representing the vertical polarization state error chi-square characterization quantity.
Finally by calculating Q H And Q V The difference between the two, namely, the quality difference characterization quantity dQ=Q of the polarized signal of the coherent optical module H -Q V To characterize the quality difference of the two polarization states of the tested optical module 05 so as to screen the optical module to be tested.
Fig. 5 is a schematic diagram of a position of a receiving end of an optical module to be tested for sampling a polarization state error count according to an embodiment of the present application. As shown in fig. 5, the H-polarization error count is collected by the H-polarization error collection point of the DSP in the optical module to be tested, and the V-polarization error count is collected by the V-polarization error count collection point in the DSP.
Fig. 6 is a schematic diagram showing a test result provided in an embodiment of the present application. As shown in fig. 6, the difference between the H-polarization state error chi-square characteristic quantity and the V-polarization state error chi-square characteristic quantity is displayed, that is, the polarization state signal quality difference characteristic quantity is displayed, and the degradation degree of the optical module to be tested is determined according to the polarization state signal quality difference characteristic quantity. In fig. 6, the larger the number is, the more serious the corresponding optical module to be tested is.
In an embodiment, multiple wavelengths may be allocated to the optical module testing tool board according to the packages of different optical modules to be tested, i.e. each optical module testing tool board may test multiple optical modules to be tested.
In an embodiment, the distance of the real fiber system can be flexibly adjusted according to different types and types of the optical module to be tested, the distance range can be 0-2000 kilometers (Km), and the application range is wide.
In an embodiment, the process of collecting and calculating the bit error rate by the test PC can be directly realized by using the optical module test tooling plate, and then the test result is returned to the test PC, so that the test efficiency is effectively improved.
In one embodiment, the overall osnr of the optical module testing apparatus can be controlled to a uniform level of error (e.g., 10 -3 ) Therefore, the test PC can omit the process of carrying out inverse function calculation on the right tail probability of chi-square distribution by the H-polarization error rate and the V-polarization error rate, and directly control the error rate ratio, thereby effectively improving the calculation efficiency of the test PC.
In an embodiment, the optical module testing tool board can be changed to adapt to optical modules to be tested with different packaging types (for example, the models can be CFP, CFP2, CFP4, QSFP28, MSA320, MSA 168)), and adapt to different communication interfaces (for example, management data input Output (Management Data Input/Output, MDIO), integrated circuit bus (Inter-Integrated Circuit, I2C), and high-speed serial computer expansion bus standard (Peripheral Component Interconnect Express, PCIE)), so that the application range is enlarged.
Fig. 7 is a block diagram of an optical module degradation testing device according to an embodiment of the present application. The embodiment is applied to the situation that the degradation degree of components in the optical module is tested. As shown in fig. 7, the apparatus in this embodiment includes: the first determination module 510, the second determination module 520, the third determination module 530, and the fourth determination module 540.
The first determining module 510 is configured to determine the corresponding H-polarization state error rate and V-polarization state error rate according to the pre-collected H-polarization state error count and V-polarization state error count of the optical module to be tested;
the second determining module 520 is configured to determine the corresponding H-polarization state error card side characteristic amount and V-polarization state error card side characteristic amount according to the H-polarization state error rate and the V-polarization state error rate;
a third determining module 530 configured to determine a polarization signal quality difference characterization quantity according to the H-polarization error chi-square characterization quantity and the V-polarization error chi-square characterization quantity;
the fourth determining module 540 is configured to determine the degradation degree of the optical module to be tested according to the polarization state signal quality difference characterization quantity.
The optical module degradation testing device provided in this embodiment is configured to implement the optical module degradation testing method in the embodiment shown in fig. 1, and the implementation principle and the technical effect of the optical module degradation testing device provided in this embodiment are similar, and are not described herein again.
In an embodiment, the optical module degradation testing device further includes:
the acquisition module is used for acquiring a frame number and a slot number of a testing frame where the optical module testing tooling plate is located, and the optical module testing tooling plate is used for loading an optical module to be tested;
the first allocation module is used for allocating Internet Protocol (IP) addresses according to the frame numbers and the slot numbers;
and the second allocation module is used for allocating corresponding wavelengths to the optical module test tooling plate according to the IP address.
In one embodiment, the first determining module 510 includes:
the first calculating unit is used for calculating the ratio of the pre-collected H polarization state error code count and the signal rate of the optical module to be detected to obtain the corresponding H polarization state error code rate;
the second calculating unit is configured to calculate the ratio of the V-polarization state error code count and the signal rate of the pre-collected optical module to be tested to the collection time, so as to obtain the corresponding V-polarization state error code rate.
In one embodiment, the second determining module 520 includes:
the third calculation unit is arranged for respectively carrying out inverse function calculation on the right tail probability of chi-square distribution on the H polarization state error rate and the V polarization state error rate to obtain a first numerical value and a second numerical value;
and the fourth calculation unit is used for carrying out logarithmic conversion on the first numerical value and the second numerical value respectively to obtain corresponding H polarization state error code chi-square representation quantity and V polarization state error code chi-square representation quantity.
In an embodiment, the fourth determining module 540 includes:
the comparison unit is used for comparing the polarization state signal quality difference characterization quantity with a preset signal quality difference characterization quantity;
and the determining unit is used for determining the degradation degree of the optical module to be detected according to the comparison result.
Fig. 8 is a schematic structural diagram of an apparatus according to an embodiment of the present application. As shown in fig. 8, the apparatus provided in the present application includes: a processor 610 and a memory 620. The number of processors 610 in the device may be one or more, one processor 610 being illustrated in fig. 8. The amount of memory 620 in the device may be one or more, one memory 620 being illustrated in fig. 8. The processor 610 and memory 620 of the device are connected by a bus or otherwise, for example in fig. 8. The device may be a personal computer, for example.
The memory 620, as a computer-readable storage medium, may be configured to store a software program, a computer-executable program, and program instructions/modules corresponding to the apparatus of any embodiment of the present application (e.g., the first determining module 510, the second determining module 520, the third determining module 530, and the fourth determining module 540 in the optical module degradation testing device). Memory 620 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, at least one application program required for a function; the storage data area may store data created according to the use of the device, etc. In addition, memory 620 may include high-speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid-state storage device. In some examples, memory 620 may further include memory located remotely from processor 610, which may be connected to the device via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The device provided by the above may be configured to execute the optical module degradation testing method provided by any of the above embodiments, and have corresponding functions and effects.
The present embodiments also provide a storage medium containing computer-executable instructions, which when executed by a computer processor, are configured to perform a method of optical module degradation testing, the method comprising: determining the corresponding H polarization state error rate and V polarization state error rate according to the pre-acquired H polarization state error code count and V polarization state error code count of the optical module to be detected; determining corresponding H polarization state error code chi-square characterization quantity and V polarization state error code chi-square characterization quantity according to the H polarization state error code rate and the V polarization state error code rate; determining a polarization state signal quality difference characterization quantity according to the H polarization state error code chi-square characterization quantity and the V polarization state error code chi-square characterization quantity; and determining the degradation degree of the optical module to be detected according to the polarization state signal quality difference characterization quantity.
Those skilled in the art will appreciate that the term user equipment encompasses any suitable type of optical communications field.
In general, the various embodiments of the application may be implemented in hardware or special purpose circuits, software, logic or any combination thereof. For example, some aspects may be implemented in hardware, while other aspects may be implemented in firmware or software which may be executed by a controller, microprocessor or other computing device, although the application is not limited thereto.
Embodiments of the present application may be implemented by a data processor of a mobile device executing computer program instructions, e.g. in a processor entity, either in hardware, or in a combination of software and hardware. The computer program instructions may be assembly instructions, instruction set architecture (Instruction Set Architecture, ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages.
The block diagrams of any logic flow in the figures of this application may represent program steps, or may represent interconnected logic circuits, modules, and functions, or may represent a combination of program steps and logic circuits, modules, and functions. The computer program may be stored on a memory. The Memory may be of any type suitable to the local technical environment and may be implemented using any suitable data storage technology, such as, but not limited to, read-Only Memory (ROM), random access Memory (Random Access Memory, RAM), optical Memory devices and systems (digital versatile Disk (Digital Video Disc, DVD) or Compact Disk (CD)), and the like. The computer readable medium may include a non-transitory storage medium. The data processor may be of any type suitable to the local technical environment, such as, but not limited to, general purpose computers, special purpose computers, microprocessors, digital signal processors (Digital Signal Processing, DSPs), application specific integrated circuits (Application Specific Integrated Circuit, ASICs), programmable logic devices (Field-Programmable Gate Array, FGPA), and processors based on a multi-core processor architecture.
Claims (11)
1. An optical module degradation testing method, comprising:
determining the corresponding H polarization state error rate and V polarization state error rate according to the pre-acquired H polarization state error code count and V polarization state error code count of the optical module to be detected;
determining corresponding H polarization state error code chi-square characterization quantity and V polarization state error code chi-square characterization quantity according to the H polarization state error code rate and the V polarization state error code rate;
determining a polarization state signal quality difference characterization quantity according to the H polarization state error code chi-square characterization quantity and the V polarization state error code chi-square characterization quantity;
and determining the degradation degree of the optical module to be detected according to the polarization state signal quality difference characterization quantity.
2. The method according to claim 1, characterized in that the method further comprises:
acquiring a frame number and a slot number of a testing frame where an optical module testing tooling plate is located, wherein the optical module testing tooling plate is used for loading an optical module to be tested;
distributing an Internet Protocol (IP) address according to the frame number and the slot number;
and allocating corresponding wavelengths for the optical module testing tooling plate according to the IP address.
3. The method according to claim 1, wherein determining the corresponding H-polarization state error rate and V-polarization state error rate according to the pre-collected H-polarization state error count and V-polarization state error count of the optical module to be tested comprises:
calculating the ratio of the pre-collected H polarization state error code count and the signal rate of the optical module to be tested to obtain the corresponding H polarization state error code rate;
and calculating the ratio of the pre-collected V-polarization error code count and the signal rate of the optical module to be detected to obtain the corresponding V-polarization error code rate.
4. The method of claim 1, wherein determining the corresponding H-polarization state error chi-square token and V-polarization state error chi-square token according to the H-polarization state error rate and the V-polarization state error rate comprises:
performing inverse function calculation of right tail probability of chi-square distribution on the H polarization state error rate and the V polarization state error rate respectively to obtain a first numerical value and a second numerical value;
and carrying out logarithmic conversion on the first numerical value and the second numerical value respectively to obtain corresponding H polarization state error code chi-square representation quantity and V polarization state error code chi-square representation quantity.
5. The method according to claim 1, wherein determining the degradation degree of the optical module to be tested according to the polarization state signal quality difference characterization quantity comprises:
comparing the polarization state signal quality difference characterization quantity with at least two preset signal quality difference characterization quantities;
and determining the degradation degree of the optical module to be detected according to the comparison result.
6. An optical module degradation testing system that performs the optical module degradation testing method of any one of claims 1-5, comprising: the testing machine frame, the switch and the optical module testing tooling plate; the optical module test tooling plate includes: an optical module to be tested and an optical module testing device;
the optical module testing device comprises: the optical fiber optical system comprises a wave combiner, a first optical amplifier, an optical fiber, a second optical amplifier and a wave separator; the transmitting end of the optical module to be tested is connected with the first end of the wave combiner, the first end of the first optical amplifier is connected with the second end of the wave combiner, the second end of the first optical amplifier is connected with the first end of the optical fiber, the first end of the second optical amplifier is connected with the second end of the optical fiber, the second end of the second optical amplifier is connected with the first end of the wave splitter, and the second end of the wave splitter is connected with the receiving end of the optical module to be tested;
the transmitting end of the optical module to be tested is connected to the upper port of the combiner through an optical fiber jumper, the combiner couples the transmitting light of the optical modules to be tested with different wavelengths into a main light path, and the transmitting light is returned to the receiving end of the optical module to be tested from the lower port of the corresponding wavelength through the optical fiber jumper through the splitter after passing through a solid fiber system consisting of an optical amplifier and an optical fiber.
7. The system of claim 6, wherein the light module testing device further comprises: and the noise source is respectively connected with the second end of the second optical amplifier and the first end of the demultiplexer and is used for adding noise to the real fiber system and exciting the error code before error correction of the optical module to be tested.
8. The system of claim 6, wherein the light module testing device further comprises: and the optical attenuator is respectively connected with the second end of the combiner and the first end of the first optical amplifier and is used for controlling the optical signal-to-noise ratio.
9. The system of claim 6, wherein the optical fiber is used to set a transmission dispersion for exciting an internal dispersion compensation algorithm of the optical module under test and to run a dispersion compensation function.
10. An optical module degradation testing apparatus, comprising: a memory, and one or more processors;
a memory arranged to store one or more programs;
when executed by the one or more processors, causes the one or more processors to implement the method of any of claims 1-5.
11. A storage medium storing a computer program which, when executed by a processor, implements the method of any one of claims 1-5.
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| CN201911273288.9A CN112994786B (en) | 2019-12-12 | 2019-12-12 | Optical module degradation testing method, system, equipment and storage medium |
| PCT/CN2020/135846 WO2021115445A1 (en) | 2019-12-12 | 2020-12-11 | Method, system and apparatus for testing degradation of optical module, and storage medium |
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| CN201911273288.9A CN112994786B (en) | 2019-12-12 | 2019-12-12 | Optical module degradation testing method, system, equipment and storage medium |
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| CN112994786A (en) | 2021-06-18 |
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