CN112986286B - X-ray double-view-field microscopic imaging detection system and imaging method thereof - Google Patents
X-ray double-view-field microscopic imaging detection system and imaging method thereof Download PDFInfo
- Publication number
- CN112986286B CN112986286B CN202110188595.8A CN202110188595A CN112986286B CN 112986286 B CN112986286 B CN 112986286B CN 202110188595 A CN202110188595 A CN 202110188595A CN 112986286 B CN112986286 B CN 112986286B
- Authority
- CN
- China
- Prior art keywords
- image
- view
- adjusting
- resolution
- optical path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/03—Investigating materials by wave or particle radiation by transmission
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
- G01N2223/1016—X-ray
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)
Abstract
The invention provides an X-ray double-view microscopic imaging detection system, which comprises: an optical path lengthening device for extending the application of the system to enable a majority of the microscope objective to be integrated into the system; the double-view imaging device is used for acquiring images with different resolutions under two views; and the registration adjusting device is used for obtaining the registered original image. The invention also provides an imaging method based on the truncated data correction reconstruction of the X-ray double-field microscopic imaging detection system. The method corrects the bright ring artifact of the truncated data reconstruction image, so that the numerical value of the region-of-interest reconstruction image is closer to the true value. The invention realizes the reconstruction of the global image of the large sample, and the reconstructed image comprises the interested region with high resolution.
Description
Technical Field
The invention relates to the field of X-ray radiation imaging, in particular to an X-ray double-view microscopic imaging detection system formed by double light paths and a reconstruction imaging method for truncated correction of double-view data.
Background
X-ray Computed Tomography (CT) is widely used as a non-destructive evaluation technique for internal sample detection in different fields, such as biomedical, aerospace, construction, and geological fields. When a larger sample is imaged in a limited X-ray imaging field of view (FOV), the sampled data is truncated. In medicine, truncated data is also generated when only the internal ROI is imaged in order to reduce the radiation dose. The truncated sample data used for reconstruction can produce severe artifacts including cupping artifacts and bright outer rings. To date, many methods of reconstructing a region of interest (ROI) using truncated data have been proposed. One such class is the use of Back Projection Filtering (BPF) based reconstruction algorithms (BPF-POCS). The BPF-POCS reconstruction algorithm can reconstruct both-end truncated data, but requires that the image of a small portion of the sample be known in advance, which is usually not readily available a priori. Another type of method is an extrapolation-based preprocessing method. The method processes truncated data based on fitting elliptical boundary line segments or using symmetric mirroring and smoothing. Truncated data is typically supplemented with non-truncated data. The reconstructed image obtained by the method can reduce the cupping artifact and the bright outer ring artifact, but the reconstructed data obtained by the method is not accurate enough in quantification. Other methods, such as the offset detector method, require a balance between sample data acquisition time or radiation dose and computational complexity. Therefore, accurate imaging of truncation data and truncation artifact correction remain a challenge for X-ray CT imaging.
Disclosure of Invention
In view of the above, the present invention provides an X-ray dual-field microscopic imaging detection system and an imaging method thereof, which are intended to solve at least one of the above technical problems.
In order to achieve the above object, as an aspect of the present invention, there is provided an X-ray dual-field microscopic imaging detection system, including:
an optical path lengthening device for extending the application of the system to enable a majority of the microscope objective to be integrated into the system;
the double-view imaging device is used for acquiring images with different resolutions in two views;
and the registration adjusting device is used for obtaining the registered original image.
Wherein, the light path extension apparatus includes:
the relay lens is used for enlarging the space in front of the objective lens, and is convenient for installing the beam splitter and adjusting the light path;
the length-adjustable sleeve is used for connecting the scintillator and the relay lens in the double-field-of-view imaging device and comprises a fixing ring, an adjusting ring and a locking ring.
The fixed ring is clamped and fixed on the relay lens through a screw, the other end of the fixed ring is in threaded connection with a sleeve adjusting ring, a scintillator is installed on the front end face of the adjusting ring, and the adjusting ring can move back and forth to adjust the relative distance between the scintillator and the relay lens.
Wherein the dual field of view imaging device comprises two parts of light path:
the total light path consists of a scintillator, a sleeve, a relay lens and a beam splitter;
the beam splitter separates two branch optical paths formed after visible light.
Wherein the imaging fields of view and the resolution of the two branch optical paths are different; the method is realized by using a beam splitter to split light beams before objective imaging, and then using objective lenses with different magnifications, and a tube lens and a CCD (charge coupled device) matched with the objective lenses in two branch light paths.
Wherein the scintillator is located at a relay working distance; the distance between the objective lens and the relay lens is the sum of the working distance of the objective lens and the working distance of the relay lens; the beam splitter is arranged at any optional position between the relay lens and the objective lens, which is convenient for installation; the CCD is positioned at the working distance of the tube lens.
The focus adjusting method of the double-field-of-view imaging device comprises the following steps:
adjusting a front-end total optical path and a reflection branch optical path; the method specifically comprises the steps that the relative position of a scintillator and a relay lens is changed by rotating a sleeve adjusting ring until a clear image is collected by a CCD (charge coupled device) of a light path; along with different times of installation and adjustment, an infinite or finite optical path is formed between the optical path objective lens and the tube lens;
adjusting the transmission branch optical path; the method specifically comprises the steps that an electric precision displacement table is used for adjusting the position of a magnification objective lens on a transmission branch optical path until the optical path is imaged clearly; with different installation adjustment times, an infinite or limited optical path can be formed between the optical path objective lens and the tube lens.
Wherein the registration adjustment apparatus includes:
a mirror;
the mounting and adjusting bracket comprises a thickening table and an adjusting mechanism capable of realizing pitching and left-right rotation; the adjusting mechanism is fixed on a dark box body of the detection system by two diagonal screws, and the rotating direction is adjusted by the other two screws.
The registration adjusting method of the registration adjusting device comprises the following steps:
processing the large-view low-resolution image by using an interpolation method;
directly subtracting the processed large-view low-resolution image and the small-view high-resolution image to obtain a difference graph to calculate the offset of the rows and the columns;
adjusting a registration adjusting device according to the offset, and then acquiring a sampling image calculation difference chart; iterative adjustment is thus performed.
As another aspect of the present invention, there is provided an imaging method of the X-ray dual-field microscopic imaging detection system as described above, including the steps of:
acquiring double-view sampling data on an X-ray double-view microscopic imaging detection system, wherein one set of the data is non-truncated large-view low-resolution data, and the other set of the data is truncated small-view high-resolution data;
respectively carrying out differential back projection calculation on the double-view sampling data to obtain two sets of differential back projection images;
in the differential back projection image, the differential back projection image of the small-view high-resolution data is used as a reference template image, and the large-view low-resolution image is used as an input image; carrying out registration calculation by using a registration algorithm to obtain an affine transformation matrix corresponding to the input image and using the affine transformation matrix to the input image to obtain a double-view differential back projection image finely registered by the algorithm;
calculating the average value of the region of interest of the two sets of registered data, and taking the ratio of the average value of the small-field differential back projection images divided by the average value of the large-field differential back projection images as a weighting coefficient to be multiplied by the large-field differential back projection images;
using the non-truncated large-view low-resolution differential back projection image to supplement the truncated small-view high-resolution differential back projection image to obtain the non-truncated small-view high-resolution differential back projection image and finish the correction of truncated data;
and performing Hilbert transform and weighting on the non-truncated small-field high-resolution differential back projection image to complete reconstruction.
Based on the technical scheme, compared with the prior art, the X-ray double-view-field microscopic imaging detection system and the imaging method thereof have at least one part of the following beneficial effects:
the invention realizes the accurate imaging of the truncated data and simultaneously corrects the truncation artifacts well. Namely, the bright ring artifact of the ROI reconstructed image is removed, and the value of the ROI reconstructed image is closer to the true value.
The invention provides an X-ray double-view imaging detector which can simultaneously obtain a global image and a local high-resolution image of an ROI (region of interest) of a detected sample and solve the problem that details are not clear due to the fact that the ROI of a low-resolution global image is too low in resolution. The detector can be used for digital ray imaging or CT imaging and the like.
The invention provides an X-ray image fusion method which is used for correcting high-resolution ROI truncated data, assisting in correcting bright ring artifacts of a reconstructed image and improving accuracy of reconstructed values. The method can be used for sampling images of the X-ray dual-field imaging detector provided by the method, and can also be used for images acquired by any detector for multiple times under different resolutions.
Drawings
FIG. 1 is an X-ray dual-field microscopic imaging detection system of the present invention;
FIG. 2 schematically illustrates the mirror of FIG. 1 used for mechanical registration and its mounting adjustment bracket;
FIG. 3 schematically illustrates an adjustable length sleeve of the optical path lengthening device of FIG. 1;
FIG. 4 is a flow chart of the truncated data correction method based on data fusion for ROI imaging according to the present invention.
In the above drawings, the reference numerals have the following meanings:
1. a sleeve; 2. a relay lens; 3. a beam splitter; 4. an objective lens displacement stage; 5-1, an objective lens; 5-2, an objective lens; 6. a tube mirror; 7. a reflector and a mounting and adjusting bracket; 8. a CCD; 9. a dark box device; 10. an angle fine-tuning device; 11-1, a pitching angle fine adjustment device; 11-2, a left and right angle fine adjustment device; 12. mounting holes of the angle fine-tuning device; 13. a thickening table; 14. a reflective mirror; 15. a sleeve cover; 16. adjusting the ring; 17. a locking ring; 18. and a fixing ring.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the accompanying drawings in combination with the embodiments.
The purpose of the invention is: the sampling data of a large sample is obtained based on an X-ray micro-CT imaging system, a high-resolution image of an ROI in the sample is reconstructed without prior information and without obviously increasing the calculated amount, and the application range of the X-ray micro-CT is expanded.
The invention discloses a double-view X-ray microscopic imaging detection system. In this system, a relay lens is added to enlarge the space in front of the objective lens, facilitating the installation of the beam splitter and the optical path adjustment. The beam splitter separates light rays to form two imaging branch light paths, each branch light path uses an objective lens, the magnification and the visual field of the objective lenses of the two branch light paths are different, so that double visual fields are formed, and non-truncated low-resolution sampling data and truncated high-resolution sampling data can be obtained at the same time. In addition, in order to obtain a registered image, a reflector and a mounting and adjusting bracket thereof are added in a transmission branch optical path of the detection system, and the registration of the double-vision system is realized by adjusting the pose of the reflector. The addition of the reflector makes the light sensing chip of the light path CCD not face the ray source, so that the CCD is protected.
The invention also discloses a truncated data correction method for data fusion. The method comprises data registration and fusion. The primary registration of the transmission and reflection sub-paths is realized by mechanical adjustment, and the registration adjustment replaces the common down-sampling rough registration calculation. In order to reduce the data processing amount, save time and storage space and avoid the accumulation of calculation errors caused by respective registration and fusion on hundreds of sampling images, the fine registration and fusion of the algorithm are not completed on the sampling images but on Differential Back Projection (DBP) data obtained in the process of a BPF reconstruction algorithm. Firstly, differential back projection calculation is respectively carried out on sampling data to obtain two sets of DBP data. And performing algorithm fine registration on the truncated high-resolution DBP data and the non-truncated low-resolution DBP data. And then calculating the ratio of the average values of the ROI areas of the non-truncated low-resolution and truncated high-resolution DBP data, and multiplying the truncated high-resolution DBP data by the ratio to ensure that the gray ranges of the two sets of DBP data are consistent. And then, supplementing the edge data of the truncated high-resolution DBP image completely by using the non-truncated low-resolution DBP image to obtain the non-truncated high-resolution DBP image to complete the fusion. And finally, performing Hilbert transform and weighting to obtain a reconstructed image.
As shown in fig. 1, the system for detecting double-field X-ray microscopic imaging comprises a sleeve 1, a relay lens 2, a beam splitter 3, an objective lens displacement table 4, an objective lens 5-1, an objective lens 5-2, a tube lens 6, a reflector, an installation adjusting bracket 7, a CCD8 and a camera bellows device 9; the sleeve 1 and the relay lens 2 form a light path lengthening device, wherein the scintillator is located on the front end face of the sleeve 1. The optical fiber laser also comprises two branch optical paths formed by separating visible light by the beam splitter 3. The branch optical paths comprise an objective lens 5-1 or 5-2, a tube lens 6 and a CCD 8. The reflector and the mounting and adjusting bracket 7 thereof form a mechanical registration adjusting device which is positioned on the transmission branch optical path. The light path systems behind the light path lengthening device are all sealed in the dark box device 9, so that light is avoided, and the installation of components is facilitated.
Different from a common X-ray optical coupling detection system, the beam splitter is arranged in an infinite optical path at the front end of the objective lens instead of the rear end of the objective lens, so that the purpose that each of two branch optical paths comprises one objective lens is achieved. The objective lens is a core element for realizing double visual fields, and the objective lenses with different magnifications and visual fields are arranged in the two branch optical paths to simultaneously obtain small visual field high-resolution data and large visual field low-resolution data.
In a particular design, the side length of the beamsplitter cube is preferably 25.4 mm, depending on the imaging system parameters, thus requiring the working distance of the objective lens to be large enough to mount the beamsplitter. The working distance of the micro objective is generally several millimeters to thirty and more millimeters, and in order to enable most objectives to be used for the optical path system, the invention adds the optical path lengthening device at the front end of the objective, thereby expanding the available space for installing the beam splitter and facilitating the adjustment of the optical path.
The magnification of the common objective lens is 1X, 2X, 4X, 5X, 10X, 20X, 40X and the like. In theory, the double-view detection can be combined by any two magnifications of objective lenses of any brand. The difference of the working distances of the objective lenses of different types and brands is large, and the problems of focus adjustment and image distortion of the two branch optical paths need to be considered when the objective lenses are selected. Preferably, the two objective lenses of the branch optical paths of the optical path use the same brand and type of objective lenses with different magnifications. In this example, sigma multiplanopo 2X and multiplanopo 5X objectives were chosen. The working distances were 34mm and 41mm, and the actual fields of view (camera element 1/2 inches) were 2.4X 3.2mm and 0.96X 1.28 mm.
Preferably, the relay lens of the optical path lengthening device of the system uses a double cemented lens. In this example, an Etermont C interface achromatic lens pair was used with a magnification ratio of 1: 1, a working distance of 60mm, a suitable length, and a working wavelength of 425 and 675nm, which highly matched the wavelength of the light emitted by the scintillator (central wavelength 550 nm).
The ratio of the reflected light to the transmitted light of the common beam splitter is 1: 1, 2: 3, 3: 7 and the like, and the common beam splitter can be theoretically used for the double-field X-ray microscopic imaging detection system. Preferably, a beam splitter having a 1: 1 ratio of reflected light to transmitted light is used to reduce the difference in the number of photons of the two optical paths and the difference in noise and the like.
As shown in fig. 2, the mirror and its mounting and adjusting bracket are used for mechanical registration to obtain a registered original image, which is beneficial for subsequent processing. The device is composed of an angle adjusting device 10, a thickening table 11 and a reflector 12. The fixing structure 12 fixes the mechanical register adjustment device on the rear panel of the dark box device 9. The thickness of the thickening table 11 is determined according to the working distance of the tube lens.
The angle adjusting device 10 is composed of two screws and three adjusting plates. And screwing the pitch angle adjusting screw 11-1 to drive the reflector to deflect in the pitch direction, so as to change the imaging position of the image line. Similarly, the left and right angle adjusting screws 11-2 are screwed to drive the reflective mirror to deflect in the left and right directions, so as to change the imaging position of the image array. The angle scales are designed around the pitch angle adjusting screw 11-1 and the left and right angle adjusting screw 11-2, so that the pose of the reflector can be adjusted more accurately.
The reflective branch uses a small magnification objective lens, and the transmissive branch uses a large magnification objective lens. Otherwise the adjustment method is similar. And selecting a simple sample such as a small ball with the diameter of 0.5-1 micrometer as an imaging sample for the registration adjustment process. The mechanical registration method based on the mechanical registration adjusting device specifically comprises the following steps:
step 1: and acquiring a reflection branch optical path image as a reference image. And adjusting the position of the sample on the sample stage to enable the image center to be positioned at or near the center of the reflection branch optical path image, and obtaining a low-resolution image of the reflection branch optical path. Interpolation is used in obtaining the image to obtain a "high" resolution image. And cutting off the peripheral pixels to make the retained image pixel points consistent with the original image, wherein the image is used as a reference image. In this example, bilinear interpolation is used, but other suitable interpolation methods may be used.
Step 2: and (3) acquiring an image through the transmission branch optical path, and subtracting the image from the reference image obtained in the step (1) to obtain a difference image. The amount of row and column position deviation is calculated on the difference image. And calculating the required rotation angle of the corresponding screw in the registration adjusting device according to the deviation amount.
And 3, step 3: the position of the light reaching the detector is changed by rotating a pitch angle adjusting screw 11-1 and a left-right angle adjusting screw 11-2 of the registration adjusting device and changing the pose of the reflector. An image of the transmission branch path is acquired once per adjustment.
And 4, step 4: steps 2 and 3 are repeated until the amount of positional deviation of the rows and columns in the difference image is 0.
Fig. 3 is a schematic structural diagram of the adjustable length sleeve of the optical path lengthening device. The invention designs the light path lengthening device in the double-view X-ray microscopic imaging detection system so that most of the microscope objectives (including a flat field achromatic objective, a flat field fluorite objective, a super-achromatic objective, a long working distance achromatic objective and the like) can be integrated into the system, thereby expanding the application of the system. The optical path lengthening device comprises a telescopic sleeve and a relay lens. The sleeve is connected with the relay lens and the scintillator and comprises a sleeve cover 15, an adjusting ring 16, a locking ring 17 and a fixing ring 18. The adjusting ring 16 and the locking ring 17 have internal threads, and the fixing ring 18 has corresponding external threads. The scintillator is arranged at the front end of the adjusting ring 16, and the sleeve cover 15 is screwed on the adjusting ring 16 for protecting the scintillator and avoiding light. The adjustment ring 16 and the locking ring 17 are screwed to a fixing ring 18, and the fixing ring 18 is fixed to the relay lens by screw fastening.
The telescopic sleeve is also used for focusing adjustment of the light path, and the adjusting ring 16 spirally advances or retreats to adjust the position of the scintillator in the light path until the reflecting branch light path is imaged clearly. The scintillator is now located at the working distance of the relay lens.
Furthermore, the transmission branch optical path realizes clear imaging by adjusting the position of the objective lens of the optical path, specifically, the objective lens is arranged on the objective lens displacement table 4, and the electric displacement table drives the objective lens to move by control software until clear images are acquired by the branch optical path. Due to the factors such as the installation errors of the objective lens, the tube lens and the CCD and the like, an infinite or finite optical path can be formed between the objective lens and the tube lens of the two branch optical paths when the optical path is clearly imaged.
Fig. 4 is a flow chart of a truncated data correction method based on data fusion for ROI imaging. The method is based on the truncated high-resolution ROI data, uses non-truncated low-resolution data for correction to obtain the non-truncated high-resolution ROI data, and the correction process comprises data fine registration and fusion. The method proposes reconstructing the sampled data using a Back Projection Filtering (BPF) algorithm that first computes the DBP image and then performs a one-dimensional filtering on the DBP image along the PI line to reconstruct the image. The BPF algorithm may only compute the image of the PI line where the selected ROI is located. Therefore, the registration and fusion of the method are not completed in the sampled data but in the DBP image, so that a large amount of data storage and processing time is avoided, and meanwhile, the accumulation of calculation errors caused by respective registration and fusion in the sampled data is avoided.
The specific process of the truncated data correction method is as follows: firstly, the preliminary registration truncated high-resolution sampling data and non-truncated low-resolution sampling data are obtained based on the X-ray double-field microscopic detection device provided by the invention. Differential back projection is then performed to obtain DBP images, denoted as DBP1 and DBP2, respectively. And then, carrying out registration algorithm iteration on the DBP1 and the DBP2 to obtain finely registered images, namely DBPf1 and DBPf 2. And then, matching pixel value gray levels of the images after fine registration during fusion, calculating the ratio of the average gray levels of ROI areas of the fine registration images DBPf1 and DBPf2, and weighting the ratio to the DBPf1 image to obtain images with consistent pixel gray level ranges, wherein the images are marked as DBPw1 and DBPw 2. And then, supplementing the edge of the small-field high-resolution image DBPw1 with the large-field low-resolution DBPw2 image to obtain a non-truncated small-field high-resolution image, and finishing fusion correction, wherein the non-truncated small-field high-resolution image is marked as DBPr 1. And performing Hilbert transform and weighting processing on the corrected DBPr1 image to obtain an ROI reconstructed image.
In the example, the Lucas-Kanade algorithm is adopted for fine registration, and the small-field high-resolution image is used as a template image, and the large-field low-resolution image is used as an image to be transformed for operation.
The correction method of the invention can be used for two-dimensional images and three-dimensional images of slices of a certain layer. For example, when the algorithm is finely matched, a two-dimensional or three-dimensional Lucas-Kanade algorithm is used, and a corresponding bilinear interpolation or trilinear interpolation is used in the operation process. The two-dimensional image is the same as the three-dimensional image in the rest of the processing. The algorithmic fine registration step in the present invention may use any suitable registration algorithm to achieve registration on the DBP image.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (4)
1. An X-ray dual field microscopic imaging detection system, comprising:
the optical path lengthening device is used for expanding the application of the system so that various microobjectives can be integrated into the system;
wherein, the light path extension apparatus includes:
the relay lens is used for enlarging the space in front of the objective lens, and is convenient for installing the beam splitter and adjusting the light path;
the length-adjustable sleeve is used for connecting a scintillator and a relay lens in the double-view imaging device and comprises a fixing ring, an adjusting ring and a locking ring;
the fixed ring is clamped and fixed on the relay lens through a screw, the other end of the fixed ring is connected with an adjusting ring through threads, a scintillator is installed on the front end face of the adjusting ring, and the adjusting ring can move back and forth to adjust the relative distance between the scintillator and the relay lens;
the double-view imaging device is used for acquiring images with different resolutions under two views;
wherein the dual field of view imaging device comprises two parts of light path:
the total light path consists of a scintillator, a sleeve, a relay lens and a beam splitter;
the beam splitter separates the visible light to form two branch light paths;
wherein the imaging fields of view and the resolution of the two branch optical paths are different; the method is realized by separating light beams by using a beam splitter before objective imaging, and then using objective lenses with different magnifications, and a tube lens and a CCD (charge coupled device) matched with the objective lenses in two branch optical paths;
the focus adjusting method of the double-field-of-view imaging device comprises the following steps:
adjusting a front-end total optical path and a reflection branch optical path; the method specifically comprises the steps that the relative position of a scintillator and a relay lens is changed by rotating a sleeve adjusting ring until a clear image is collected by a CCD (charge coupled device) of a light path; an infinite or finite optical path is formed between the optical path objective lens and the tube lens along with different times of installation and adjustment;
adjusting the transmission branch optical path; the method specifically comprises the steps that an electric precision displacement table is used for adjusting the position of an objective lens on a transmission branch optical path until the optical path is imaged clearly; an infinite or finite optical path is formed between the optical path objective lens and the tube lens along with different times of installation and adjustment;
a registration adjustment means for obtaining a registered original image;
wherein the registration adjustment apparatus includes:
the mounting and adjusting bracket comprises a thickening table and an adjusting mechanism capable of realizing pitching and left-right rotation; the adjusting mechanism is fixed on a dark box body of the detection system by two diagonal screws, and then the rotating direction is adjusted by the other two screws.
2. The X-ray dual-field microscopic imaging detection system according to claim 1, wherein the scintillator is located at a relay working distance; the distance between the objective lens and the relay lens is the sum of the working distance of the objective lens and the working distance of the relay lens; the beam splitter is arranged at any optional position between the relay lens and the objective lens, which is convenient for installation; the CCD is positioned at the working distance of the tube lens.
3. The X-ray dual-field microscopic imaging detection system according to claim 1, wherein the registration adjusting method of the registration adjusting device comprises:
processing the large-view low-resolution image by using an interpolation method;
directly subtracting the processed large-view low-resolution image and the small-view high-resolution image to obtain a difference image to calculate the offset of rows and columns;
adjusting a registration adjusting device according to the offset, and then acquiring a sampling image to calculate a difference image; iterative adjustment is thus performed.
4. An imaging method using truncated data corrected reconstruction of an X-ray dual field microscopic imaging detection system according to any of claims 1-3, comprising the steps of:
acquiring double-view sampling data on an X-ray double-view microscopic imaging detection system, wherein one set of the data is non-truncated large-view low-resolution data, and the other set of the data is truncated small-view high-resolution data;
respectively carrying out differential back projection calculation on the double-view sampling data to obtain two sets of differential back projection images;
in the differential back projection image, the differential back projection image of the small-visual-field high-resolution data is used as a reference template image, and the large-visual-field low-resolution image is used as an input image; carrying out registration calculation by using a registration algorithm to obtain an affine transformation matrix corresponding to the input image and using the affine transformation matrix to the input image to obtain a double-view differential back projection image finely registered by the algorithm;
calculating the average value of the region of interest of the two sets of registered data, and taking the ratio of the average value of the small-field differential back projection images divided by the average value of the large-field differential back projection images as a weighting coefficient to be multiplied by the large-field differential back projection images;
using the non-truncated large-view low-resolution differential back projection image to supplement the truncated small-view high-resolution differential back projection image to obtain the non-truncated small-view high-resolution differential back projection image and finish the correction of truncated data;
and performing Hilbert transform and weighting on the non-truncated small-field high-resolution differential back projection image to complete reconstruction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110188595.8A CN112986286B (en) | 2021-02-19 | 2021-02-19 | X-ray double-view-field microscopic imaging detection system and imaging method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110188595.8A CN112986286B (en) | 2021-02-19 | 2021-02-19 | X-ray double-view-field microscopic imaging detection system and imaging method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112986286A CN112986286A (en) | 2021-06-18 |
| CN112986286B true CN112986286B (en) | 2022-09-30 |
Family
ID=76393432
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110188595.8A Active CN112986286B (en) | 2021-02-19 | 2021-02-19 | X-ray double-view-field microscopic imaging detection system and imaging method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112986286B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113866192A (en) * | 2021-09-27 | 2021-12-31 | 中国科学院高能物理研究所 | Microscopic imaging method and system based on transparent scintillator film |
| CN114199907B (en) * | 2021-12-06 | 2024-02-09 | 清华大学 | Multi-resolution CT imaging system and method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000072330A1 (en) * | 1999-05-24 | 2000-11-30 | Jmar Research, Inc. | Parallel x-ray nanotomography |
| WO2021000466A1 (en) * | 2019-07-01 | 2021-01-07 | 中国科学院苏州生物医学工程技术研究所 | Optical coherence tomography augmented reality-based surgical microscope imaging system and method |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2210801C (en) * | 1995-02-03 | 2007-08-21 | The Regents Of The University Of California | Method and apparatus for three-dimensional microscopy with enhanced depth resolution |
| US7286640B2 (en) * | 2004-04-09 | 2007-10-23 | Xradia, Inc. | Dual-band detector system for x-ray imaging of biological samples |
| US7170675B2 (en) * | 2004-05-19 | 2007-01-30 | Celloptic, Inc. | Method and system for wide-field multi-photon microscopy having a confocal excitation plane |
| US20060291042A1 (en) * | 2005-05-17 | 2006-12-28 | Alfano Robert R | Optical scanning zoom microscope with high magnification and a large field of view |
| US20110142316A1 (en) * | 2009-10-29 | 2011-06-16 | Ge Wang | Tomography-Based and MRI-Based Imaging Systems |
| WO2013090360A2 (en) * | 2011-12-15 | 2013-06-20 | President And Fellows Of Harvard College | High resolution dual-objective microscopy |
| US11058388B2 (en) * | 2016-05-20 | 2021-07-13 | Perimeter Medical Imaging, Inc. | Method and system for combining microscopic imaging with X-Ray imaging |
| WO2019148158A1 (en) * | 2018-01-29 | 2019-08-01 | Duke University | Systems and methods for enhanced resolution imaging based on multiple cross-sectional images acquired at different angles |
-
2021
- 2021-02-19 CN CN202110188595.8A patent/CN112986286B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000072330A1 (en) * | 1999-05-24 | 2000-11-30 | Jmar Research, Inc. | Parallel x-ray nanotomography |
| WO2021000466A1 (en) * | 2019-07-01 | 2021-01-07 | 中国科学院苏州生物医学工程技术研究所 | Optical coherence tomography augmented reality-based surgical microscope imaging system and method |
Non-Patent Citations (1)
| Title |
|---|
| Towards task-based assessment of CT performance: System and object MTF across different reconstruction algorithms;Samuel Richarda.et al;《Medical Physics》;20120611;全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112986286A (en) | 2021-06-18 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112986286B (en) | X-ray double-view-field microscopic imaging detection system and imaging method thereof | |
| Holloway et al. | Toward long-distance subdiffraction imaging using coherent camera arrays | |
| CN101952855B (en) | Method and camera for the real-time acquisition of visual information from three-dimensional scenes | |
| US9679360B2 (en) | High-resolution light-field imaging | |
| JP5489897B2 (en) | Stereo distance measuring device and stereo distance measuring method | |
| JP6570991B2 (en) | Diversification of lenslet, beam walk (BEAMWALK), and tilt for forming non-coplanar (ANISOLANATIC) images in large aperture telescopes | |
| Mouillet et al. | A stellar coronograph for the COME-ON-PLUS adaptive optics system. II. First astronomical results. | |
| JP7198457B2 (en) | Interior CT phase imaging X-ray microscope equipment | |
| CN111694016B (en) | Non-interference synthetic aperture super-resolution imaging reconstruction method | |
| CN112261315B (en) | High-resolution calculation imaging system and method based on camera array aperture synthesis | |
| CN114463251B (en) | Method and device for measuring deformation of inner surface of intermediate case of aero-engine | |
| Le Goff et al. | Focal plane AIT sequence: evolution from HRG-Spot 5 to Pleiades HR | |
| CN113327211B (en) | Correction method and device for large-field-of-view high-resolution light field microscope system | |
| CN114219866A (en) | Binocular structured light three-dimensional reconstruction method, reconstruction system and reconstruction equipment | |
| Yoo et al. | Improvements in the scanning long-wave optical test system | |
| CN108132266B (en) | X-ray light path cascade microscopic imaging system | |
| CN109754435B (en) | Camera online calibration method based on small target fuzzy image | |
| Lattanzi et al. | Accurate optical-to-radio registration of Seyfert galaxies with HST images. Absolute astrometry of HST images. | |
| CN104143179B (en) | Method for enhancing moving target through multi-linear-array time difference scanning expansion sampling | |
| US20230284883A9 (en) | Endoscopic three-dimensional imaging systems and methods | |
| Luo et al. | Geometric calibration based on a simple phantom for multi-lens microscopic CT | |
| CN109875589B (en) | Method and device for measuring centering error of vascular machine system | |
| CN107194874A (en) | Super-resolution imaging system and method based on bias image stabilization | |
| CN114001676A (en) | Optical axis automatic alignment method for detecting optical element by knife edge instrument | |
| CN112233040A (en) | Fourier laminated microscopic imaging method for automatic defocusing correction |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |