CN112985604A - Error correction method and system for spectrum analyzer - Google Patents
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The present disclosure provides a method and a system for correcting errors of a spectrum analyzer, wherein the method comprises: inputting input light with preset wavelength to a silicon-based thermal light phase modulation Mach-Zehnder interference type spectrum analyzer, and applying thermal power within a preset range; acquiring an optical power output signal of the spectrum analyzer; preprocessing the optical power output signal; fitting the preprocessed optical power output signal by using a preset nonlinear fitting function to obtain error data; obtaining error data corresponding to input light with at least 3 different wavelengths; performing linear fitting according to a preset error expression, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to the target interference arm; and correcting the dispersion and nonlinear errors of the spectrum analyzer according to the fitting result, and compared with the prior art, correcting errors caused by thermo-optic in the spectrum analyzer, and improving the accuracy of spectrum restoration.
Description
Technical Field
The disclosure relates to the technical field of spectral analysis, in particular to an error correction method and system for a spectral analyzer.
Background
The spectrum analysis technology is an important optical detection perception means and can be applied to a plurality of application fields such as material detection, biomedicine, sensing analysis and the like. The general spectrometer is based on discrete optical-mechanical components, and has the disadvantages of large volume and weight, high manufacturing cost and poor flexibility, thereby limiting the application field of the spectrometer. In order to meet the application requirements of integration, a chip-level spectrum light splitting technology is provided, and the system of a spectrometer is reduced to the size of a chip level by means of micro-nano processing, so that the spectrometer can be directly integrated on micro platforms such as smart phones and designed mobile products and can be directly served to consumers.
The silicon-based spectrum analysis technology provides an effective solution for the realization of a chip-level spectrometer. The silicon-based chip spectrometer mainly has two types of dispersion and interference, and the interference-type silicon-based chip spectrometer mainly has a structure based on a Michelson interferometer and a Mach-Zehnder interferometer, so that the spectral resolution of the type of spectrometer is easy to improve, the anti-interference capability is strong, and the application prospect is good. The silicon-based on-chip spectrometer based on the Mach-Zehnder interferometer structure is a spatial spectrometer, the improvement of resolution depends on the maximum optical path difference which can be realized, and the improvement is mainly realized by increasing the arm length difference of the Mach-Zehnder interferometer. The increase of the arm length difference can be realized by increasing the number of the Mach-Zehnder interferometers, but the layout area is increased inevitably. Therefore, the introduction of thermo-optic phase modulation is considered, the arm length difference of the Mach-Zehnder interferometer is dynamically adjusted in a thermo-optic mode, and the spectral resolution of the spectrometer can be improved on the premise of not increasing the layout area.
The on-silicon-chip spectrometer based on thermo-optic phase modulation needs to heat an arm of a Mach-Zehnder interferometer in the working process, so that errors are introduced due to heating, including nonlinear errors, arm length difference errors caused by chip expansion caused by heating, and dispersion errors of the spectrometer are increased along with heating. Among various errors, the nonlinear error and the dispersion error are not negligible, and the influence of the nonlinear error and the dispersion error needs to be eliminated through correction, so that a foundation is laid for the restoration of a subsequent spectrum.
Disclosure of Invention
The purpose of the present disclosure is to provide an error correction method and system for a spectrum analyzer, so as to correct errors caused by thermal light in the spectrum analyzer, and improve the accuracy of spectrum recovery.
An embodiment of the first aspect of the present disclosure provides an error correction method for a spectrum analyzer, where the spectrum analyzer is of a silicon-based thermal photo-phase mach-zehnder interference type, and the method includes:
inputting input light with preset wavelength to the spectrum analyzer, and applying thermal power in a preset range to a target interference arm of the spectrum analyzer;
acquiring an optical power output signal of the spectrum analyzer, wherein the optical power output signal refers to a curve of output optical power of the spectrum analyzer along with thermal power change;
preprocessing the optical power output signal, wherein the preprocessing comprises smoothing, direct current removal and normalization processing;
fitting the preprocessed optical power output signal by using a preset nonlinear fitting function according to a preset optical power output signal expression to obtain error data;
inputting input light with at least 3 different wavelengths into the spectrum analyzer, and repeating the steps for the input light with each wavelength to obtain error data corresponding to the input light with at least 3 different wavelengths;
performing linear fitting on the error data corresponding to the input light with at least 3 different wavelengths according to a preset error expression to obtain a fitting result, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to a target interference arm;
and correcting the dispersion and nonlinear error of the spectrum analyzer according to the fitting result.
According to some embodiments of the present disclosure, the dc removal and normalization in the preprocessing are performed by an envelope extraction method.
According to some embodiments of the present disclosure, the nonlinear fitting function employs a simulated annealing optimization algorithm.
An embodiment of a second aspect of the present disclosure provides an error correction system for a spectrum analyzer, where the spectrum analyzer is of a silicon-based thermal photo-phase mach-zehnder interference type, and the system includes:
the light source is used for inputting input light with preset wavelength to the spectrum analyzer;
the heating module is used for applying thermal power within a preset range to a target interference arm of the spectrum analyzer;
a control module for implementing the steps of:
acquiring an optical power output signal of the spectrum analyzer, wherein the optical power output signal refers to a curve of output optical power of the spectrum analyzer along with thermal power change;
preprocessing the optical power output signal, wherein the preprocessing comprises smoothing, direct current removal and normalization processing;
fitting the preprocessed optical power output signal by using a preset nonlinear fitting function according to a preset optical power output signal expression to obtain error data;
controlling the light source to input at least 3 input light with different wavelengths into the spectrum analyzer, and repeating the steps for the input light with each wavelength to obtain error data corresponding to the input light with at least 3 different wavelengths;
performing linear fitting on the error data corresponding to the input light with at least 3 different wavelengths according to a preset error expression to obtain a fitting result, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to a target interference arm;
and correcting the dispersion and nonlinear error of the spectrum analyzer according to the fitting result.
According to some embodiments of the present disclosure, the dc removal and normalization in the preprocessing are performed by an envelope extraction method.
According to some embodiments of the present disclosure, the nonlinear fitting function employs a simulated annealing optimization algorithm.
In some embodiments according to the present disclosure, the light source is a tunable laser.
This disclosure compares advantage with prior art and lies in:
(1) the method corrects nonlinear errors and dispersion errors of the large-arm long silicon-based thermo-optic phase modulation Mach-Zehnder interference type spectrum analyzer, establishes an error correction model, calibrates errors caused by thermo-optic, and improves the accuracy of spectrum recovery.
(2) The error correction method of the spectrum analyzer can be applied to error correction of similar spectrum analyzers.
(3) The error correction method provided by the disclosure can reduce the influence of errors introduced by thermal light modulation, improve the temperature regulation range in the silicon-based thermal light modulation spectrum analyzer and improve the resolution of the spectrum analyzer.
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Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the disclosure. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a schematic diagram of an error correction method for a spectrum analyzer provided by the present disclosure;
FIG. 2 is a schematic diagram showing a silicon-based thermo-optic phase modulation Mach-Zehnder interference type spectrum spectrometer;
FIG. 3 is a graph showing the output optical power of the spectrum analyzer as a function of thermal power when the upper interference arm of the spectrum analyzer of FIG. 2 is heated;
FIG. 4 is a graph showing the output optical power as a function of thermal power for a single wavelength input light after envelope and normalization;
FIG. 5 shows the error coefficients of the two arms of a Mach-Zehnder interference spectrum analyzer at 4 different input optical frequenciesKLinear fitting results;
FIG. 6 showsThe two-arm error coefficient of the Mach-Zehnder interference type spectrum analyzer under different light incidence frequencies under 4 different input light frequencies
And (5) distributing the results.
Detailed Description
Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It should be understood that the description is illustrative only and is not intended to limit the scope of the present disclosure. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present disclosure.
Various structural schematics according to embodiments of the present disclosure are shown in the figures. The figures are not drawn to scale, wherein certain details are exaggerated and possibly omitted for clarity of presentation. The shapes of various regions, layers, and relative sizes and positional relationships therebetween shown in the drawings are merely exemplary, and deviations may occur in practice due to manufacturing tolerances or technical limitations, and a person skilled in the art may additionally design regions/layers having different shapes, sizes, relative positions, as actually required.
In the context of the present disclosure, when a layer/element is referred to as being "on" another layer/element, it can be directly on the other layer/element or intervening layers/elements may be present. In addition, if a layer/element is "on" another layer/element in one orientation, then that layer/element may be "under" the other layer/element when the orientation is reversed.
In order to solve the problems in the prior art, embodiments of the present disclosure provide a method and a system for correcting an error of a spectrum analyzer, which are described below with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of an error correction method for a spectrum analyzer provided by the present disclosure; the optical spectrum analyzer in this embodiment is a silicon-based thermo-optic phase modulation mach-zehnder interference type optical spectrum analyzer (abbreviated as MZI), fig. 2 shows a schematic structural diagram of the silicon-based thermo-optic phase modulation mach-zehnder interference type optical spectrum analyzer, the thermo-optic phase modulation MZI generally includes two interference arms, namely an upper interference arm and a lower interference arm, a heater (or a heating electrode) is covered around each interference arm, and the heater is used for heating, so that the temperature around the interference arms changes, the refractive index of the interference arms is further changed, the upper and lower interference arms generate an optical path difference, and the input light is subjected to interference light splitting. In actual operation, in order to ensure the accuracy of the test, the dispersion error, the nonlinear error and the thermal efficiency can be respectively calibrated by using the error correction method shown in fig. 1 for the upper and lower interference arms.
As shown in fig. 1, the method for correcting errors of a spectrum analyzer provided by the present disclosure includes:
step S101: inputting input light with preset wavelength to the spectrum analyzer, and applying thermal power in a preset range to a target interference arm of the spectrum analyzer;
step S102: acquiring an optical power output signal of the spectrum analyzer, wherein the optical power output signal refers to a curve of output optical power of the spectrum analyzer along with thermal power change, as shown in fig. 3;
FIG. 3 is a graph showing the output optical power of the spectrum analyzer varying with the thermal power when the upper interference arm of the spectrum analyzer shown in FIG. 2 is heated, the input end of the spectrum analyzer is connected to the tunable laser, the input optical wavelength is 1550nm, and the range of the thermal power applied to the upper interference arm of the spectrum analyzer is 0-4W. In the output optical power-thermal power curve shown in fig. 3, it can be seen that as the thermal power increases, the average output optical power decreases, and the amplitude of the output optical power also decreases, which is mainly caused by the alignment and vibration errors of the input/output end optical fiber during the heating process of the interference arm, and in the error correction process, the output optical power needs to be preprocessed first to eliminate the influence of the error.
Step S103: preprocessing the optical power output signal, wherein the preprocessing comprises smoothing, direct current removal and normalization processing;
specifically, the smoothing process is to eliminate the influence of small jitter errors caused by measurement accuracy errors of the measuring instrument and the like; the de-direct current and normalization are used for eliminating the alignment and vibration errors of the input/output end optical fiber, wherein the de-direct current and normalization adopt a method of extracting envelope to process data. Fig. 4 shows the output optical power of the single-wavelength input light as a function of thermal power after envelope and normalization.
Step S104: fitting the preprocessed optical power output signal by using a preset nonlinear fitting function according to a preset optical power output signal expression to obtain error data;
in practical application, nonlinear fitting of data can be realized by using a simulated annealing optimization algorithm method, and the numerical value of the undetermined coefficient is calculated. The simulated annealing algorithm is a method adopted in the process of fitting the preprocessed optical power output signal by using a preset nonlinear fitting function to obtain error data. In addition, the algorithm is adopted in the process of fitting the optical power output signals after the corresponding preprocessing of the input light with 3 different wavelengths. In the application, a simulated annealing optimization algorithm is adopted for fitting, and compared with an nlifit function, the method is higher in speed and easier to obtain the optimal value of the parameter.
Specifically, the preset optical power output signal expression is as follows:
wherein the content of the first and second substances,K(ν) And
is the error data;
uindicating the introduced dispersion coefficient
The latter input optical frequency;κrepresents a thermal efficiency coefficient; γ represents a nonlinear coefficient;Wrepresents thermal power; v represents the input optical frequency; a is a constant and represents the amplitude value of the output optical power;
indicating the initial phase.
The following describes a process of constructing the optical power output signal expression (which may also be referred to as an error theory analysis model), and the specific process is as follows:
aiming at a silicon-based thermal light phase modulation Mach-Zehnder interference type spectrum analyzer, under an ideal condition, an output light power expression is as follows:
wherein the content of the first and second substances,Ioutputting optical power for the spectrum analyzer;
a is a constant and outputs the amplitude value of optical power; v is the input optical frequency; tau is the time delay of two arms of the spectrum analyzer caused by the change of thermal power;
constant, initial phase;
Lis the arm length of the spectrum analyzer;
c is the speed of light;
is the change in refractive index of the interference arm caused by thermal power.
Ideally, when thermal power is applied to one interference arm of the spectrum analyzer, the refractive index of the silicon waveguide changes along with the change of temperature, and the change is
(ii) a Further, the Mach-Zehnder interferometer has an equivalent arm length changed by an amount of
(ii) a The arm length difference between the two arms of the Mach-Zehnder interferometer is
The resulting phase delay between the two arms of the Mach-Zehnder interferometer is
Wherein
In the wavelength of the incident light,
. Therefore, the output optical power of the Mach-Zehnder interference type spectrum analyzer can be expressed as
。
Various errors are introduced during thermo-optic phase modulation. For example, mode dispersion of a silicon waveguide can cause different changes in refractive index due to heating for input light of different wavelengths; the nonlinearity of thermo-optic can be caused by large temperature change, and the change of the arm length of the Mach-Zehnder interferometer can be caused by the thermal expansion of the chip caused by heating; process errors also introduce differences between the two arms of the mach-zehnder interferometer.
Comprehensively considering the above errors, introducing dispersion coefficient
And a nonlinear coefficient gamma, at which the broadened optical frequencyuAnd corrected time delayTComprises the following steps:
after introducing the error, the output optical power of the spectrum analyzer is:
aiming at the correction and calibration of the error of the silicon-based thermo-optic phase modulation spectrum analyzer, the introduced error coefficient needs to be determined
And gamma. The tunable laser with narrow line width is adopted for correction, and in the correction process, the error coefficient can be determined, and the thermal efficiency of the interference arm of the thermo-optical Mach-Zehnder type spectrum analyzer can be calibratedκ，κCharacterizing the thermal power applied to the heater (cW) In relation to the interference arm time delay (τ), τ =κW. After introducing thermal efficiency, the output optical power of the spectrum analyzer can be expressed as:
setting:
the spectrum analyzer output optical power can be expressed as:
when single-wavelength light is incident and thermal power is changed, output optical power of the upper arm and the lower arm of the optical spectrum analyzer can be measured by experiments to obtain a curve along with the change of the thermal power, and the upper arm and the lower arm can be obtained by nonlinear fitting according to the formulaK(ν) And
. By changing the frequency (or wavelength) of the input light, different frequencies can be obtainedK(ν) And
(ii) a According to
For different incident frequencies of lightK(ν) Linear fitting is carried out to obtainκAnd
(ii) a ByκAnd
according to
γ can be calculated. So far, through experimental correction, the dispersion error coefficients of the upper arm and the lower arm of the Mach-Zehnder interference type spectrum analyzer caused by heating can be obtained
And a nonlinear error coefficient gamma, and simultaneously, the thermal efficiency coefficients of the upper arm and the lower arm can be obtained by calibrationκ。
By "fitting", we mean studying what functional relationship this set of data has on the premise that there is a set of experimental data — the end result is to "find" the rules that can be expressed by mathematical expressions from this set of seemingly irregular data points.
Step S105: inputting input light with at least 3 different wavelengths into the spectrum analyzer, and repeating the steps for the input light with each wavelength to obtain error data corresponding to the input light with at least 3 different wavelengths;
step S106: performing linear fitting on the error data corresponding to the input light with at least 3 different wavelengths according to a preset error expression to obtain a fitting result, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to a target interference arm;
step S107: and correcting the dispersion and nonlinear error of the spectrum analyzer according to the fitting result.
The optical power output signal curve after the pretreatment meets the requirement in the establishment process of the optical power output signal expression
Fitting the pretreated optical power output signal according to the formula, and selecting a simulated annealing algorithm for optimization fitting according to the characteristics of a target function in the fitting to obtainK(ν) And
. In the actual correction process, light with output wavelengths of 1530nm, 1540nm, 1550nm and 1560nm of the tunable laser is respectively selected as input light, output light power of the spectrometer along with thermal power change curves under 4 different wavelengths are obtained, and preprocessing and fitting are respectively carried out on the output light power along with the thermal power change curves to obtain upper and lower arms of the interferometer with different input light frequenciesK(ν) And
。
referring to FIG. 5, the two-arm error coefficients of a Mach-Zehnder interference type spectrum analyzer at 4 different input optical frequencies are shownKLinear fitting results, analysis of the model according to error theory
The thermal efficiency can be obtained by fittingκAnd coefficient of dispersion
。
Referring to FIG. 6, the error coefficients of the two arms of the Mach-Zehnder interference spectrum analyzer at 4 different input optical frequencies and at different optical incidence frequencies are shown
Distribution result according to
Combined with fitted thermal efficiencyκThe nonlinear coefficient γ can be calculated.
According to the above process, the dispersion coefficient of the spectrum analyzer shown in FIG. 2 can be obtained
Is 43.5X 10-2The nonlinear coefficient gamma is 12.6 x 10-3ps-1Thermal efficiency of upper and lower armsκAre respectively 103X 10-3ps×W-1、97×10-3ps×W-1. The dispersion coefficient, the nonlinear coefficient and the thermal efficiency coefficient obtained by the process can correct dispersion and nonlinear errors of the spectrum analyzer shown in FIG. 2, and simultaneously calibrate the two-arm thermo-optic coefficient. When the spectrum analyzer is used for testing, error correction is carried out in a spectrum restoration link according to the established error theoretical analysis model and the calibrated coefficient, so that accurate input spectrum can be obtained through restoration, and the measurement accuracy of the spectrum analyzer is improved.
The error correction method of the spectrum analyzer has the following advantages:
(1) the method corrects nonlinear errors and dispersion errors of the large-arm long silicon-based thermo-optic phase modulation Mach-Zehnder interference type spectrum analyzer, establishes an error correction model, calibrates errors caused by thermo-optic, and improves the accuracy of spectrum recovery.
(2) The error correction method of the spectrum analyzer can be applied to error correction of similar spectrum analyzers.
(3) The error correction method provided by the disclosure can reduce the influence of errors introduced by thermal light modulation, improve the temperature regulation range in the silicon-based thermal light modulation spectrum analyzer and improve the resolution of the spectrum analyzer.
The present disclosure also provides an error correction system for a spectrum analyzer, wherein the spectrum analyzer is of a silicon-based thermo-optic phase modulation mach-zehnder interference type, and the system comprises:
the light source is used for inputting input light with preset wavelength to the spectrum analyzer;
the heating module is used for applying thermal power within a preset range to a target interference arm of the spectrum analyzer;
a control module for implementing the steps of:
acquiring an optical power output signal of the spectrum analyzer, wherein the optical power output signal refers to a curve of output optical power of the spectrum analyzer along with thermal power change;
preprocessing the optical power output signal, wherein the preprocessing comprises smoothing, direct current removal and normalization processing;
fitting the preprocessed optical power output signal by using a preset nonlinear fitting function according to a preset optical power output signal expression to obtain error data;
controlling the light source to input at least 3 input light with different wavelengths into the spectrum analyzer, and repeating the steps for the input light with each wavelength to obtain error data corresponding to the input light with at least 3 different wavelengths;
performing linear fitting on the error data corresponding to the input light with at least 3 different wavelengths according to a preset error expression to obtain a fitting result, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to a target interference arm;
and correcting the dispersion and nonlinear error of the spectrum analyzer according to the fitting result.
Specifically, the expression of the predetermined optical power output signal is shown in the above embodiment.
According to some embodiments of the present application, the dc removal and normalization in the preprocessing both use an envelope extraction method for data processing.
According to some embodiments of the present application, the nonlinear fitting function employs a simulated annealing optimization algorithm.
According to some embodiments of the present application, the light source is a tunable laser.
The system for correcting the error of the spectrum analyzer provided by the embodiment of the application and the method for correcting the error of the spectrum analyzer provided by the embodiment of the application have the same beneficial effects from the same inventive concept.
The embodiments of the present disclosure have been described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be devised by those skilled in the art without departing from the scope of the present disclosure, and such alternatives and modifications are intended to be within the scope of the present disclosure.
Claims (9)
1. An error correction method for a spectrum analyzer, wherein the spectrum analyzer is of a silicon-based thermo-optic phase Mach-Zehnder interference type, the method comprising:
inputting input light with preset wavelength to the spectrum analyzer, and applying thermal power in a preset range to a target interference arm of the spectrum analyzer;
acquiring an optical power output signal of the spectrum analyzer, wherein the optical power output signal refers to a curve of output optical power of the spectrum analyzer along with thermal power change;
preprocessing the optical power output signal, wherein the preprocessing comprises smoothing, direct current removal and normalization processing;
fitting the preprocessed optical power output signal by using a preset nonlinear fitting function according to a preset optical power output signal expression to obtain error data;
inputting input light with at least 3 different wavelengths into the spectrum analyzer, and repeating the step of inputting input light with preset wavelengths into the spectrum analyzer to obtain error data aiming at the input light with each wavelength so as to obtain error data corresponding to the input light with at least 3 different wavelengths;
performing linear fitting on the error data corresponding to the input light with at least 3 different wavelengths according to a preset error expression to obtain a fitting result, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to a target interference arm;
and correcting the dispersion and nonlinear error of the spectrum analyzer according to the fitting result.
2. The method for error correction of a spectrum analyzer as claimed in claim 1, wherein the predetermined optical power output signal is expressed as follows:
wherein the content of the first and second substances,K(ν) And
is the error data;
uindicating the introduced dispersion coefficient
The latter input optical frequency;κrepresents a thermal efficiency coefficient; γ represents a nonlinear coefficient;Wrepresents thermal power; v represents the input optical frequency; a is a constant and represents the amplitude value of the output optical power;
indicating the initial phase.
3. The method for error correction of a spectrum analyzer as claimed in claim 1, wherein the pre-processing is performed by envelope extraction for both de-dc and normalization.
4. The method for error correction of a spectrum analyzer as defined in claim 1, wherein the nonlinear fitting function employs a simulated annealing optimization algorithm.
5. An error correction system of a spectrum analyzer, wherein the spectrum analyzer is of a silicon-based thermo-optic phase Mach-Zehnder interference type, the system comprising:
the light source is used for inputting input light with preset wavelength to the spectrum analyzer;
the heating module is used for applying thermal power within a preset range to a target interference arm of the spectrum analyzer;
a control module for implementing the steps of:
acquiring an optical power output signal of the spectrum analyzer, wherein the optical power output signal refers to a curve of output optical power of the spectrum analyzer along with thermal power change;
preprocessing the optical power output signal, wherein the preprocessing comprises smoothing, direct current removal and normalization processing;
fitting the preprocessed optical power output signal by using a preset nonlinear fitting function according to a preset optical power output signal expression to obtain error data;
controlling the light source to input at least 3 input light with different wavelengths into the spectrum analyzer, and repeating the step of inputting input light with preset wavelengths into the spectrum analyzer to obtain error data aiming at the input light with each wavelength so as to obtain error data corresponding to the input light with at least 3 different wavelengths;
performing linear fitting on the error data corresponding to the input light with at least 3 different wavelengths according to a preset error expression to obtain a fitting result, wherein the fitting result comprises a thermal efficiency coefficient, a dispersion coefficient and a nonlinear coefficient corresponding to a target interference arm;
and correcting the dispersion and nonlinear error of the spectrum analyzer according to the fitting result.
6. The optical spectrum analyzer error correction system as claimed in claim 5, wherein the preset optical power output signal is expressed as follows:
wherein the content of the first and second substances,K(ν) And
is the error data;
uindicating the introduced dispersion coefficient
The latter input optical frequency;κrepresents a thermal efficiency coefficient; γ represents a nonlinear coefficient;Wrepresents thermal power; v represents the input optical frequency; a is a constant and represents the amplitude value of the output optical power;
indicating the initial phase.
7. The system of claim 5, wherein the pre-processing is performed by envelope extraction for both de-DC and normalization.
8. The spectrum analyzer error correction system as claimed in claim 5, wherein the non-linear fitting function employs a simulated annealing optimization algorithm.
9. The spectrum analyzer error correction system of claim 5, wherein the light source is a tunable laser.
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