CN112904089A - Optical dielectric response tester and test method for optical dielectric material - Google Patents
Optical dielectric response tester and test method for optical dielectric material Download PDFInfo
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- CN112904089A CN112904089A CN202110060080.XA CN202110060080A CN112904089A CN 112904089 A CN112904089 A CN 112904089A CN 202110060080 A CN202110060080 A CN 202110060080A CN 112904089 A CN112904089 A CN 112904089A
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- 230000003287 optical effect Effects 0.000 title claims abstract description 43
- 230000004044 response Effects 0.000 title claims abstract description 36
- 239000003989 dielectric material Substances 0.000 title claims abstract description 12
- 238000010998 test method Methods 0.000 title abstract description 3
- 238000012360 testing method Methods 0.000 claims abstract description 42
- 238000013519 translation Methods 0.000 claims abstract description 9
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 claims description 10
- 229910052805 deuterium Inorganic materials 0.000 claims description 10
- 229910052736 halogen Inorganic materials 0.000 claims description 6
- 229910052721 tungsten Inorganic materials 0.000 claims description 6
- 239000010937 tungsten Substances 0.000 claims description 6
- 150000002367 halogens Chemical class 0.000 claims description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 5
- 238000005286 illumination Methods 0.000 claims description 4
- 238000012545 processing Methods 0.000 claims description 2
- -1 tungsten halogen Chemical class 0.000 claims 1
- 230000008859 change Effects 0.000 abstract description 5
- 238000000034 method Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2682—Measuring dielectric properties, e.g. constants using optical methods or electron beams
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
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- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention discloses an optical dielectric response tester and a test method of an optical dielectric material, the tester comprises a computer, a variable wavelength light source, a sample stage capable of translating in multiple directions, a light shielding plate and an LCR meter, wherein the light shielding plate is fixed on a rotating shaft, the rotating shaft drives the light shielding plate to rotate, light transmitting parts and light shielding parts are distributed on the light shielding plate, light filters are arranged on the light transmitting parts of the light shielding plate, and a sample stage translation controller, a light shielding plate rotating shaft controller, the variable wavelength light source and the LCR meter are controlled by the computer. The invention can test the optical dielectric response of different test frequencies under a single light source, can also test the optical dielectric response under different wavelengths and different light intensities, can realize the test of the switch characteristic by utilizing the light shielding plate, is a set of complete optical dielectric test system, and comprises various change factors of different light wavelengths, different light intensities, different signal frequencies and the like, thereby saving the test time and reducing the labor intensity of the test.
Description
Technical Field
The invention relates to the field of material performance testing, in particular to an optical dielectric response tester and an optical dielectric response testing method for an optical dielectric material.
Background
The optical dielectric material is a material with an optical dielectric effect, the optical dielectric effect is a physical effect, and refers to the change of dielectric constant caused by response of the material under the excitation of light, the change is generally expressed by dielectric adjustable rate n, the optical dielectric material provides an implementation way for developing a non-contact photoelectric coupling device, and provides technical support for the design of a novel photoelectric device.
At present, the research on the optical dielectric is very little, matched test equipment is lacked, the light source is manually replaced depending on the test of simple assembly, and the measurement process takes a lot of time and labor; the light source and the sample which are tested at each time cannot be ensured to be positioned at the same position, the accuracy of the test result is influenced to a certain degree, and the performance which can be tested is relatively single.
Disclosure of Invention
The invention aims to provide a tester for accurately measuring the optical dielectric response (dielectric adjustable rate and switch response) parameters of an optical dielectric material and a corresponding testing method.
The technical scheme of the optical dielectric response tester is as follows:
the tester includes computer and variable wavelength light source, but multidirectional translation's sample platform, the light screen, the LCR table, the plane center of light screen is fixed with the planar rotation axis of perpendicular to light screen, the rotation axis drives the light screen rotation, it has printing opacity position and shading position to distribute on the light screen, the light filter has been arranged to the printing opacity position of light screen, sample platform translation controller, light screen rotation axis controller, variable wavelength light source and LCR table all are connected to on the computer, the professional software of computer operation can adopt current control software, also can customize specially.
The method for testing the optical dielectric response of the dielectric material by using the tester comprises the following steps:
(1) fixing the test sample on the sample table, and communicating the two electrodes of the sample with the LCR meter.
(2) Testing capacitance and loss of samples using LCR meter, CpAnd (4) data.
(3) Switching deuterium lamp, halogen tungsten lamp and optical filter and their combination under computer control to control the wavelength and intensity of light source entering the sample stage, and testing the C of sample under different wavelengths and different intensity light sourcespData, and varying the frequency of the test signal to test CpAnd (4) data.
(4) According to measured CpData, using formulas
And
processing to obtain dielectric tunable rate n, wherein d is the thickness of the sample, S is the area of the electrode, and epsilon1Is the dielectric constant after illumination, epsilon0Is the dielectric constant before light irradiation.
(5) The same type of optical filters are adopted, the light shielding plate is controlled to rotate at a certain speed, the dielectric property difference generated by the sample in the presence or absence of illumination is measured, and the switch response parameters of the optical dielectric material are obtained.
Drawings
FIGS. 1a and 1b are schematic views of an apparatus according to an embodiment of the present invention;
FIG. 2 depicts the optical dielectric response at different wavelengths of light recorded by an embodiment of the present invention;
FIG. 3 depicts the photo-dielectric response at different light intensities recorded by an embodiment of the present invention;
FIG. 4 depicts the optical dielectric response at different test signal frequencies recorded by an embodiment of the present invention;
FIG. 5 depicts the optical dielectric response of a switched mode light source recorded under an embodiment of the present invention;
in FIG. 1 a: 1. a variable light source; 2. a visor; 3. a sample stage; LCR meter; 5. testing the sample; 6. a computer system.
Detailed Description
The structure, operation and effect of the present invention will be further described below with reference to an embodiment.
The tester mainly comprises a computer, a set of variable wavelength light source, a sample stage capable of multi-directionally translating, a light shielding plate and an LCR meter. The variable wavelength light source consists of a deuterium lamp and a halogen tungsten lamp, wherein the deuterium lamp generates light with the wavelength of 190-400nm, and the halogen tungsten lamp generates light with the wavelength of 400-2000 nm; the sample stage can be used for placing a plurality of samples and meets the requirement of multidirectional translation through a track or other modes; the shading plate is uniformly provided with 4 light holes along the center, different (or same) types of light filters are respectively arranged in the light holes, the shading plate is fixed on a rotating shaft, the rotating shaft is vertical to the plane of the shading plate, and the shading plate is driven to rotate by the rotating shaft; the sample stage translation controller, the light screen rotating shaft controller, the variable wavelength light source and the LCR meter are all connected to a computer, and the computer running software adopts the existing control software and is used for coordinating and controlling the translation of the sample stage, the rotation of the light screen and the transformation of the variable wavelength light source, recording corresponding data through the LCR meter and storing the data; a set of refrigerating and heating equipment is arranged in the sample table and used for adjusting the temperature of the sample to be measured on the sample table to be (-60 ℃ to 400 ℃).
The specific test working process is as follows:
(1) fixing the test sample on the sample table, and communicating the two electrodes of the sample with the LCR meter.
(2) The computer controls the variable light source to control the on-off and brightness of the deuterium lamp and the halogen tungsten lamp.
(3) The rotation of the shading plate is controlled by a computer to select different filters and to allow the light source to penetrate through the shading plate.
(4) The translation of the sample stage is controlled by a computer, the sample to be tested is selected, and the temperature is set.
(5) Reading and storing C of sample by computer controlled LCR meterpAnd (4) data.
(6)Stored for computer CpData passing formula
And
and calculating the dielectric tunable rate n of the material.
This tester has contained multiple variation factors such as different optical wavelength, different luminous intensity, different frequencies, and the test content that can go on has:
(1) optical dielectric response at different wavelengths of light;
(2) optical dielectric response at different light intensities;
(3) optical dielectric response at different test signal frequencies;
(4) the photo-dielectric response of the light source is switched.
The following describes the operation process of the present invention by taking the optical dielectric response under different light wavelengths, different light intensities, different frequencies and open light sources as an example:
(1) the test sample is fixed on the sample stage, and light with specific wavelength can be irradiated to the sample surface through the light shielding sheet by switching the deuterium lamp (190-.
(2) The test sample is fixed on a sample stage, and the light dielectric response data under different light intensities is recorded by switching the brightness of a deuterium lamp and using a specific 365nm filter, and the result is shown in fig. 3.
(3) Fixing the test sample on the sample stage, fixing the brightness of the deuterium lamp, using a specific 365nm filter, changing the frequency of the test electrical signal through the LCR meter, and recording the photo-dielectric response data under different test signal frequencies, wherein the result is shown in FIG. 4.
(4) Fixing the test sample on a sample table, fixing the brightness of a deuterium lamp, using a specific 365nm filter, recording the change of the photo-dielectric response with time until the photo-dielectric response is saturated, then turning off a light source through a computer, and recording the change of the photo-dielectric response with time until the photo-dielectric response is faded, wherein the result is shown in fig. 5.
Compared with the prior art, the invention has the following advantages and prominent effects: the invention is a complete set of optical dielectric response test system, it includes many kinds of variable factors such as different optical wavelength, different light intensity, different frequency, etc., and has provided a measuring method, can not only measure the optical dielectric response under different frequency, can also measure different light intensity, optical dielectric response and switching characteristic under different wavelength, etc., it is a set of automatic test instruments, can substitute the manual work to measure, has saved the test time, has reduced the labour intensity tested; meanwhile, the testing steps are fixed, so that the testing is standardized, and the error of manual operation is reduced.
Claims (4)
1. The utility model provides a light dielectric response tester of light dielectric material, includes variable wavelength light source and computer, its characterized in that still includes sample platform, light screen and LCR table that can multidirectional translation, and the plane center of light screen is fixed on the rotation axis, and it has printing opacity position and shading position to distribute on the light screen, and the light filter has been arranged at the printing opacity position of light screen, and sample platform translation controller, light screen rotation axis controller, variable wavelength light source and LCR table all are connected to on the computer.
2. The apparatus of claim 1, wherein the variable wavelength light source is generated by a deuterium lamp and a tungsten halogen lamp, and the wavelength of the light is 190nm-2000 nm.
3. The optical dielectric response tester according to claim 1 or 2, wherein the multi-direction translatable sample stage is arranged with a temperature adjusting device for adjusting the temperature of the sample placed on the stage surface of the sample stage.
4. An optical dielectric response testing method of an optical dielectric material, which adopts the optical dielectric response tester of claim 1, and is characterized by comprising the following steps:
(1) fixing a test sample on a sample table, and communicating two electrodes of the sample with an LCR meter;
(2) testing capacitance and loss of samples using LCR meter, CpData;
(3) switching deuterium lamp, halogen tungsten lamp and optical filter and their combination under computer control to control the wavelength and intensity of light source entering the sample stage, and testing the C of sample under different wavelengths and different intensity light sourcespData, and varying the frequency of the test signal to test CpData;
(4) according to measured CpData, using formulas
And
processing to obtain dielectric tunable rate n, wherein d is the thickness of the sample, S is the area of the electrode, and epsilon1Is the dielectric constant after illumination, epsilon0Dielectric constant before light irradiation;
(5) the same type of optical filters are adopted, the light shielding plate is controlled to rotate at a certain speed, the dielectric property difference generated by the sample in the presence or absence of illumination is measured, and the switch response parameters of the optical dielectric material are obtained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202110060080.XA CN112904089A (en) | 2021-01-18 | 2021-01-18 | Optical dielectric response tester and test method for optical dielectric material |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110060080.XA CN112904089A (en) | 2021-01-18 | 2021-01-18 | Optical dielectric response tester and test method for optical dielectric material |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104297573A (en) * | 2014-10-27 | 2015-01-21 | 西北工业大学 | Multi-atmosphere high-temperature dielectric temperature spectrum testing method |
| CN104483104A (en) * | 2014-12-25 | 2015-04-01 | 中国科学院半导体研究所 | Spectral response analysis system for photoelectric detector |
| JP2017111686A (en) * | 2015-12-17 | 2017-06-22 | 国立大学法人東京工業大学 | Photoresponsive dielectric and capacity change detection element comprising photoresponsive dielectric |
| CN109283394A (en) * | 2018-10-23 | 2019-01-29 | 中山大学 | A kind of brightness conductivity and activation energy measuring system and method |
| CN109406416A (en) * | 2018-10-23 | 2019-03-01 | 中山大学 | A kind of photoconduction spectrum automatic measurement system and method |
-
2021
- 2021-01-18 CN CN202110060080.XA patent/CN112904089A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104297573A (en) * | 2014-10-27 | 2015-01-21 | 西北工业大学 | Multi-atmosphere high-temperature dielectric temperature spectrum testing method |
| CN104483104A (en) * | 2014-12-25 | 2015-04-01 | 中国科学院半导体研究所 | Spectral response analysis system for photoelectric detector |
| JP2017111686A (en) * | 2015-12-17 | 2017-06-22 | 国立大学法人東京工業大学 | Photoresponsive dielectric and capacity change detection element comprising photoresponsive dielectric |
| CN109283394A (en) * | 2018-10-23 | 2019-01-29 | 中山大学 | A kind of brightness conductivity and activation energy measuring system and method |
| CN109406416A (en) * | 2018-10-23 | 2019-03-01 | 中山大学 | A kind of photoconduction spectrum automatic measurement system and method |
Non-Patent Citations (1)
| Title |
|---|
| 浙江大学: "光电检测技术", 30 April 1993, 机械工业出版社, pages: 39 - 40 * |
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