CN112859163A - Method and device for determining stratum quality factor change of fracturing area by using scattered waves - Google Patents

Method and device for determining stratum quality factor change of fracturing area by using scattered waves Download PDF

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CN112859163A
CN112859163A CN202110018852.3A CN202110018852A CN112859163A CN 112859163 A CN112859163 A CN 112859163A CN 202110018852 A CN202110018852 A CN 202110018852A CN 112859163 A CN112859163 A CN 112859163A
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waves
scattered
quality factor
formation quality
time periods
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CN112859163B (en
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唐有彩
王丽华
刘航
张凯文
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China University of Petroleum Beijing
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    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V1/00Seismology; Seismic or acoustic prospecting or detecting
    • G01V1/28Processing seismic data, e.g. for interpretation or for event detection
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    • G01V1/307Analysis for determining seismic attributes, e.g. amplitude, instantaneous phase or frequency, reflection strength or polarity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V1/00Seismology; Seismic or acoustic prospecting or detecting
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    • G01V1/288Event detection in seismic signals, e.g. microseismics

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Abstract

The application provides a method and a device for determining stratum quality factor change of a fracturing area by using scattered waves, wherein the method comprises the following steps: acquiring scattered waves in seismic waves in N different time periods in a target area, wherein the seismic waves are seismic waves generated by microseismic points in the target area; acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves; determining stratum quality factors corresponding to N different time periods of a target area according to the amplitude spectrums of the scattered waves in the N different time periods; and acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir. The method estimates the change of the formation quality factor of the fracturing area by using the amplitude spectrum of the scattered wave, reduces the parameter calculation amount compared with the prior art, can accurately and quickly obtain the formation quality factor, and is more favorable for guiding the exploitation of an oil-gas reservoir.

Description

Method and device for determining stratum quality factor change of fracturing area by using scattered waves
Technical Field
The embodiment of the application relates to the technical field of seismic exploration, in particular to a method and a device for determining stratum quality factor change of a fracturing area by using scattered waves.
Background
During the process of seismic wave propagation, energy attenuation is caused to the seismic wave due to the viscoelasticity and non-uniformity of the formation medium, and the attenuation is called inherent attenuation. Intrinsic attenuation is determined by the influence parameters of the lithologic structure, porosity, saturation, permeability and the like of the underground medium. Formation attenuation characteristics are typically expressed in terms of a formation quality factor Q, which may therefore be used as a medium parameter to analyze lithology such as sandstone and indications of hydrocarbon reservoirs.
The method for obtaining the formation quality factor in the prior art is mainly realized by the following steps: s1, acquiring seismic reflection data of the seismic record, and obtaining a smooth local time-frequency amplitude spectrum by utilizing a shaping regularization and least square inversion technology according to the seismic reflection data; s2, calculating according to the local time-frequency amplitude spectrum to obtain the peak frequency based on the Rake wavelet decomposition; and S3, estimating the formation quality factor according to the relation between the peak frequency of the Rake wavelet and the Q value of the formation quality factor.
However, the processing method described above requires a large amount of parameter calculation, and thus the processing procedure becomes complicated.
Disclosure of Invention
The application provides a method and a device for determining stratum quality factor change in a fracturing area by using scattered waves, which aim to solve the problem that the processing process is complex due to large parameter calculation amount in the prior art.
In a first aspect, the present application provides a method for determining formation quality factor changes in a fracture zone using scattered waves, comprising:
and acquiring scattered waves in seismic waves in the target area within N different time periods, wherein the seismic waves are seismic waves generated by microseismic points in the target area.
And acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves.
And determining formation quality factors corresponding to N different time periods of the target area according to the amplitude spectrums of the scattered waves in the N different time periods, wherein N is an integer greater than or equal to 2.
And acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir.
Optionally, determining formation quality factors corresponding to N different time periods of the target region according to the amplitude spectra of the scattered waves in the N different time periods, including:
for each microseismic event e within the ith of N different time periodsijBased on microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe value of i is an integer from 1 to N, and the value of j is the number M of all microseismic events which can be clearly recorded in the time period from 1 to the ithi(ii) a According to each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
Optionally, based on microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe method comprises the following steps:
microseismic events eijThe scattered waves are divided into K sections, the amplitude spectrum of each section of scattered waves in the K sections is obtained, and corresponding stratum quality factors are obtained according to the amplitude spectrum of each section of scattered waves; summing and averaging the stratum quality factors corresponding to each scattered wave in the K scattered waves to obtain a microseismic event eijCorresponding formation quality factor QijWherein K is an integer of 1 or more.
Optionally, microseismic events eijThe method comprises the following steps of dividing scattered waves into K sections, obtaining an amplitude spectrum of each section of scattered waves in the K sections, and obtaining corresponding formation quality factors according to the amplitude spectrum of each section of scattered waves, wherein the method comprises the following steps:
acquiring a stratum quality factor corresponding to each section of scattered waves according to the following formula 1;
Figure BDA0002887658660000021
in the formula 1, the first and second groups of the compound,
Figure BDA0002887658660000022
representing microseismic events eijThe amplitude spectrum of the K-th section of the scattered wave, K being an integer from 1 to K,
Figure BDA0002887658660000023
represents the travel time of the scattered wave of the k-th section relative to the direct wave,
Figure BDA0002887658660000024
representing microseismic events eijThe formation quality factor, S, obtained at the k-th section of the scattered waveij(f) The amplitude spectrum of the k-th direct wave is shown, and f is the frequency of the scattered wave.
Optionally, based on each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodiThe method comprises the following steps:
positioning M by reverse time migrationiEach of the microseismic events eijCorresponding formation quality factor QijMapping to a corresponding position of the target area; mapping all formation quality factors Q to corresponding locations of a target zoneijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
Optionally, before obtaining the amplitude spectra of the scattered waves in N different time periods according to the scattered waves, the method further includes:
acquiring direct waves in seismic waves; and acquiring an amplitude spectrum of the direct wave according to the direct wave.
Acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves, wherein the amplitude spectrums comprise:
and acquiring the amplitude spectrums of the scattered waves in N different time periods according to the amplitude spectrums of the direct waves and the scattered waves.
In a second aspect, the present application provides an apparatus for determining formation quality factor variation in a fracture zone using scattered waves, comprising:
the first acquisition module is used for acquiring scattered waves in seismic waves in N different time periods in a target area, wherein the seismic waves are seismic waves generated by microseismic points in the target area; and acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves.
And the determining module is used for determining stratum quality factors corresponding to N different time periods of the target area according to the amplitude spectrums of the scattered waves in the N different time periods, wherein N is an integer greater than or equal to 2.
And the second acquisition module is used for acquiring the change of the stratum quality factor of the fracturing area in the target area along with time according to the stratum quality factors respectively corresponding to the N different time periods, and the change is used for guiding the exploitation of the oil and gas reservoir.
Optionally, the determining module is specifically configured to:
for each microseismic event e within the ith of N different time periodsijBased on microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe value of i is an integer from 1 to N, and the value of j is the number M of all microseismic events which can be clearly recorded in the time period from 1 to the ithi(ii) a According to each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
Optionally, the determining module is specifically configured to:
microseismic events eijThe scattered waves are divided into K sections, the amplitude spectrum of each section of scattered waves in the K sections is obtained, and corresponding stratum quality factors are obtained according to the amplitude spectrum of each section of scattered waves; summing and averaging the stratum quality factors corresponding to each scattered wave in the K scattered waves to obtain a microseismic event eijCorresponding formation quality factor QijWherein K is an integer of 1 or more.
Optionally, the determining module is specifically configured to:
acquiring a stratum quality factor corresponding to each section of scattered waves according to the following formula 1;
Figure BDA0002887658660000031
in the formula 1, the first and second groups of the compound,
Figure BDA0002887658660000032
representing microseismic events eijThe amplitude spectrum of the K-th section of the scattered wave, K being an integer from 1 to K,
Figure BDA0002887658660000041
represents the travel time of the scattered wave of the k-th section relative to the direct wave,
Figure BDA0002887658660000042
representing microseismic events eijThe formation quality factor, S, obtained at the k-th section of the scattered waveij(f) The amplitude spectrum of the k-th direct wave is shown, and f is the frequency of the scattered wave.
Optionally, the determining module is specifically configured to:
positioning M by reverse time migrationiEach of the microseismic events eijCorresponding formation quality factor QijMapping to a corresponding position of the target area; mapping all formation quality factors Q to corresponding locations of a target zoneijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
Optionally, before the first obtaining module obtains the amplitude spectra of the scattered waves in N different time periods according to the scattered waves, the first obtaining module is further configured to:
acquiring direct waves in seismic waves; and acquiring an amplitude spectrum of the direct wave according to the direct wave.
And acquiring the amplitude spectrums of the scattered waves in N different time periods according to the amplitude spectrums of the direct waves and the scattered waves.
In a third aspect, the present application provides an electronic device, comprising:
a memory for storing program instructions;
a processor for calling program instructions in the memory to perform a method for determining changes in formation quality factor of a fractured zone using scattered waves according to the first aspect of the present application.
In a fourth aspect, the present application provides a computer readable storage medium storing a computer program which, when executed by a processor, implements a method for determining changes in a formation quality factor of a fracture zone using scattered waves as described in the first aspect of the present application.
In a fifth aspect, the present application provides a computer program product comprising a computer program which, when executed by a processor, performs a method of determining changes in a formation quality factor of a fracture zone using scattered waves as described in the first aspect of the present application.
According to the method and the device for determining the stratum quality factor change in the fracturing area by using the scattered waves, the scattered waves in seismic waves in a target area within N different time periods are obtained, and the seismic waves are seismic waves generated by microseismic points in the target area; acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves; determining stratum quality factors corresponding to N different time periods of a target area according to the amplitude spectrums of the scattered waves in the N different time periods, wherein N is an integer greater than or equal to 2; and acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir. The method estimates the formation quality factor of the fracturing area by using the amplitude spectrum of the scattered wave, reduces the amount of parameter calculation compared with the prior art, can accurately and quickly obtain the formation quality factor, and is more favorable for guiding the exploitation of an oil-gas reservoir.
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In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
FIG. 1 is a schematic flow chart illustrating a method for determining changes in formation quality factors in a fractured zone using scattered waves according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of an in-well microseismic monitoring architecture according to an embodiment of the present application;
FIG. 3 is a schematic flow chart illustrating a method for determining changes in formation quality factors in a fractured zone using scattered waves according to another embodiment of the present disclosure;
FIG. 4 is a schematic diagram of an amplitude spectrum waveform of a scattering wave according to an embodiment of the present application;
FIG. 5 is a schematic structural diagram illustrating an apparatus for determining a change in a formation quality factor of a fractured zone using scattered waves according to an embodiment of the present disclosure;
fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application;
fig. 7 is a schematic structural diagram of an electronic device according to another embodiment of the present application.
Detailed Description
Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present application, as detailed in the appended claims.
In the following, some terms in the present application are explained to facilitate understanding by those skilled in the art:
microseismic monitoring: the geophysical method for evaluating underground fractures and the anisotropy of the stratum is carried out by researching seismic waves generated by the change of an underground stress field caused by the artificial fractures generated when the stratum is hydraulically fractured, the fracture of the stratum and the like.
Scattered wave: physically, if the formation interface is rugged, scattering occurs when the dimensions of the concave (or convex) parts of the formation are small relative to the wavelength of the scattered wave, forming a scattered wave. The fractures generated by microseismic fracture monitoring are strong scatterers to incident seismic waves to generate scattered waves.
Formation quality factor Q: seismic waves propagate in the earth formations with attenuation, the property of which is often characterized by the formation quality factor Q. Is commonly defined by the following equation one: after the seismic wave propagates for a distance of one wavelength, 2 pi times of the ratio of the initial energy E to the consumed energy delta E is the formation quality factor Q.
Figure BDA0002887658660000061
Amplitude spectrum: the amplitude of a wave or wave train varies with frequency.
The embodiment of the application can be applied to electronic equipment, and the electronic equipment can comprise: computers, tablets, etc., to which this application is not limited.
The method for obtaining the formation quality factor in the prior art is mainly realized by the following steps: s1, acquiring seismic reflection data of the seismic record, and obtaining a smooth local time-frequency amplitude spectrum by utilizing a shaping regularization and least square inversion technology according to the seismic reflection data; s2, calculating according to the local time-frequency amplitude spectrum to obtain the peak frequency based on the Rake wavelet decomposition; and S3, estimating the formation quality factor according to the relation between the peak frequency of the Rake wavelet and the Q value of the formation quality factor. However, the processing method described above requires a large amount of parameter calculation, and thus the processing procedure becomes complicated.
Based on the technical problem, the method for fracturing underground by using the microseismic monitoring equipment is mainly considered to generate scattered waves, further obtain the amplitude spectrum of the scattered waves, and then obtain the formation quality factor of a fracturing area through the amplitude spectrum of the scattered waves. Therefore, compared with the prior art, the method reduces the parameter calculation amount, can accurately and quickly obtain the formation quality factor, and is more beneficial to guiding the exploitation of the oil and gas reservoir.
The technical solution of the present application is described below with reference to several specific embodiments.
Fig. 1 is a schematic flowchart of a method for determining a change in a formation quality factor of a fractured zone by using scattered waves according to an embodiment of the present disclosure, where as shown in fig. 1, the method according to an embodiment of the present disclosure may include:
s101, acquiring scattered waves in seismic waves in N different time periods in a target region.
In this embodiment, the seismic wave is a seismic wave generated by a microseismic point in the target region. And acquiring seismic waves and direct waves generated in the target area according to a microseismic monitoring method. The microseismic monitoring method comprises a ground monitoring method and an in-well monitoring method. Because the ground monitoring method has high requirements on seismic exploration instruments and the stratum has serious absorption and attenuation on seismic waves, the borehole monitoring method is adopted in the embodiment of the application, fig. 2 is a schematic diagram of a borehole microseismic monitoring structure provided by the embodiment of the application, as shown in fig. 2, a geophone in fig. 2 is a receiving device in microseismic monitoring equipment, and a monitoring borehole is a borehole in which a target area is located. The in-well monitoring means that when fracturing well operation is carried out, microseismic monitoring equipment is arranged in a monitoring well to receive generated seismic waves. The microseismic monitoring device transmits the received seismic waves to electronic devices on the ground, such as a computer, wherein the seismic waves include direct waves, scattered waves, diffracted waves and the like. Finally, the electronic equipment carries out excision processing on the received seismic waves, such as diffraction waves and the like, according to the travel time difference of the seismic waves, and obtains scattering waves in the seismic waves. The above-mentioned cutting processing of the seismic waves, such as diffracted waves, belongs to the prior art, and is not described herein again. Therefore, scattered waves in the seismic waves in the target area within N different time periods can be acquired according to the seismic waves in the target area.
S102, acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves.
In this embodiment, amplitude spectra of the scattered waves in N different time periods are obtained according to the Aki-Richards theory and the scattered waves obtained in S101, and the amplitude spectra of the scattered waves can be represented by the following formula two. The amplitude spectrum of the scattered wave obtained according to the Aki-Richards theory belongs to the prior art, and is not described herein again.
R (f) ═ G (h), (f) · s (f) formula two
In the second formula, G represents parameters irrelevant to frequency, such as the coupling degree of a seismic source of seismic waves and a stratum, instrument response, geometric diffusion, reflection and transmission coefficients and the like; h (f) a subterranean medium affecting parameter; s (f) represents the amplitude spectrum of the direct wave, and R (f) represents the amplitude spectrum of the scattered wave.
S103, determining stratum quality factors corresponding to N different time periods of the target area according to the amplitude spectrums of the scattered waves in the N different time periods.
In this embodiment, after the amplitude spectrums of the scattered waves in N different time periods are acquired according to S102, formation quality factors corresponding to the N different time periods in the target area are determined. Optionally, the formation quality factor is represented by a Q value, and accordingly, the Q values of the formation quality factors corresponding to N different time periods of the target region are determined according to the amplitude spectra of the scattered waves in the N different time periods.
And S104, acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir.
In this embodiment, after obtaining the formation quality factors corresponding to N different time periods, the change of the formation quality factor of the fracturing zone in the target area over time may be obtained according to the formation quality factors corresponding to N different time periods.
Optionally, the formation quality factor of the fracture zone in the target area varies with time, such as: the smaller the formation quality factor Q value is, the more scattering times of scattered waves are represented, the greater attenuation is, the more fractures corresponding to the fracturing area are, so that the range of the fracturing area in the target area can be determined, the exploitation of the oil and gas reservoir is guided according to the range of the fracturing area in the target area, and the exploitation strategy of the oil and gas reservoir is determined, for example: the oil and gas can be circulated through the fracturing area to exploit the oil and gas reservoir.
In addition, after the exploitation strategy of the oil and gas reservoir is determined, the exploitation strategy of the oil and gas reservoir can be output. Specific output modes are as follows: the electronic device implementing the embodiments of the method may display the production strategy of the reservoir via a display screen, or the electronic device implementing the embodiments of the method may send the production strategy of the reservoir to other devices.
In the embodiment, scattering waves in seismic waves in N different time periods in a target area are obtained, and the seismic waves are seismic waves generated by microseismic points in the target area; acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves; determining stratum quality factors corresponding to N different time periods of a target area according to the amplitude spectrums of the scattered waves in the N different time periods, wherein N is an integer greater than or equal to 2; and acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir. The method estimates the formation quality factor of the fracturing area by using the amplitude spectrum of the scattered wave, reduces the amount of parameter calculation compared with the prior art, can accurately and quickly obtain the formation quality factor, and is more favorable for guiding the exploitation of an oil-gas reservoir.
In some embodiments, fig. 3 is a schematic flowchart of a method for determining a change of a formation quality factor of a fractured zone by using scattered waves according to another embodiment of the present disclosure, as shown in fig. 3, and based on the embodiment shown in fig. 1, the method according to an embodiment of the present disclosure may include:
s301, acquiring scattered waves in seismic waves in the target area in N different time periods.
In this embodiment, the specific implementation process of S301 may refer to the related description in the embodiment shown in fig. 1, and is not described herein again.
S302, acquiring direct waves in the seismic waves.
In this embodiment, the electronic device performs, for example, cutting processing on diffracted waves in the received seismic waves according to the travel time difference of the seismic waves, and obtains direct waves in the seismic waves. The above-mentioned cutting processing of the seismic waves, such as the diffracted waves, belongs to the prior art, and is not described herein again.
Optionally, the execution sequence of S301 and S302 is not sequential, S301 and then S302 may be executed first, or S302 and then S301 may be executed first.
And S303, acquiring an amplitude spectrum of the direct wave according to the direct wave.
In this embodiment, an amplitude spectrum of the direct waves is obtained according to the direct waves in the seismic waves obtained in S302. Specifically, an amplitude spectrum of the direct wave is obtained according to the following formula three.
Figure BDA0002887658660000091
In the third formula, A represents a constant of the amplitude of the direct wave, f represents the frequency of the direct wave, n represents a symmetry index for controlling the symmetry of the amplitude spectrum of the direct wave, and f represents0Is a bandwidth factor that controls the amplitude spectral bandwidth of the direct wave, and s (f) represents the amplitude spectrum of the direct wave.
S304, acquiring the amplitude spectrums of the scattered waves in N different time periods according to the amplitude spectrums of the direct waves and the scattered waves.
In this embodiment, according to the amplitude spectrum and the scattered wave of the direct wave obtained in S303, the amplitude spectra of the scattered wave in N different time periods may be obtained according to a formula two. FIG. 4 is a schematic diagram of an amplitude spectrum waveform of a scattering wave provided by an embodiment of the present application, as shown in FIG. 4, R in FIG. 41To RnRespectively, showing the amplitude spectrum of the scattered wave at different times.
S305, aiming at each microseismic event e in the ith time period in N different time periodsijBased on microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor Qij
In this embodiment, the value of i is an integer from 1 to N, and the value of j is the number M of all clearly recordable microseismic events in a time period from 1 to the ithiEach microseismic event corresponds to a different scattered wave. M is in the ith time period of N different time periodsiA microseismic event wherein MiIndicating that all of the data in the ith time period can be clearly recordedThe number of microseismic events. By the method provided in step S102, microseismic event e can be obtainedijThus, according to microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor Qij
Optionally, microseismic events eijThe scattered waves are divided into K sections, the amplitude spectrum of each section of scattered waves in the K sections is obtained, and corresponding stratum quality factors are obtained according to the amplitude spectrum of each section of scattered waves; summing and averaging the stratum quality factors corresponding to each scattered wave in the K scattered waves to obtain a microseismic event eijCorresponding formation quality factor QijWherein K is an integer of 1 or more.
In this embodiment, microseismic events eijAfter the scattered wave is divided into K segments, the amplitude spectrum of each segment of the scattered wave in the K segments can be obtained by the method provided in step S102. Therefore, according to the amplitude spectrum of each scattered wave in the K sections, the corresponding formation quality factor can be obtained.
Optionally, the formation quality factor corresponding to each segment of scattered wave is obtained according to the following formula four.
Figure BDA0002887658660000101
In the formula four, the first step is carried out,
Figure BDA0002887658660000102
representing microseismic events eijThe amplitude spectrum of the K-th section of the scattered wave, K being an integer from 1 to K,
Figure BDA0002887658660000103
represents the travel time of the scattered wave of the k-th section relative to the direct wave,
Figure BDA0002887658660000104
representing microseismic events eijThe formation quality factor, S, obtained at the k-th section of the scattered waveij(f) Denotes the amplitude spectrum of the k-th direct wave, f denotes the scatteringThe frequency of the wave.
After the stratum quality factor corresponding to each section of scattered wave in the K sections of scattered waves is obtained according to the fourth formula, the stratum quality factors corresponding to each section of scattered waves in the K sections of scattered waves are summed and averaged according to the fifth formula to obtain the microseismic event eijCorresponding formation quality factor Qij
Figure BDA0002887658660000105
In the formula five, K is an integer from 1 to K,
Figure BDA0002887658660000106
representing microseismic events eijThe formation quality factor, Q, obtained at the k-th section of the scattered waveijRepresenting microseismic events eijCorresponding formation quality factor.
S306, according to each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
In this embodiment, each microseismic event e is acquired during the ith time periodijCorresponding formation quality factor QijThereafter, and therefore, according to each microseismic event e within the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
Optionally, M is positioned by reverse time migration positioning methodiEach of the microseismic events eijCorresponding formation quality factor QijMapping to a corresponding position of the target area; mapping all formation quality factors Q to corresponding locations of a target zoneijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
In this embodiment, there is M in the ith time periodiA microseismic event. Scattered wave acquisition in seismic waves acquired by the microseismic monitoring methodAnd (3) obtaining the position of the fracturing area in the target area by using a reverse time migration positioning method. The reverse time migration positioning method belongs to the prior art, and is not described herein again. In the process of mixing MiEach of the microseismic events eijCorresponding formation quality factor QijMapping all the stratum quality factors Q mapped to the corresponding positions of the target areaijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
S307, obtaining the change of the stratum quality factor of the fracturing area in the target area along with time according to the stratum quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir.
In this embodiment, a specific implementation process of S307 may refer to related descriptions in the embodiment shown in fig. 1, and details are not described here.
Optionally, the scattered waves in the above embodiment include longitudinal waves and transverse waves, and after the positions of the fracture zones in the target area are obtained by using an inverse time migration positioning method for the scattered waves, the fracture zone range may be determined by using the difference value between the formation quality factors of the longitudinal waves and the transverse waves. If the difference value of the formation quality factors of the longitudinal wave and the transverse wave is larger, the fracturing fluid needed in the microseismic monitoring is more, and the fracturing range of the fracturing area is larger.
In the embodiment, after the stratum quality factor of the fracturing area in the target area is obtained, the position of the fracturing area in the target area is obtained by adopting an inverse time migration positioning method for the scattered wave, and then the stratum quality factor of the fracturing area is obtained according to the obtained stratum quality factor of the target area and the position of the fracturing area in the target area.
Fig. 5 is a schematic structural diagram of an apparatus for determining a change in a formation quality factor of a fractured zone by using scattered waves according to an embodiment of the present disclosure, and as shown in fig. 5, an apparatus 500 for determining a change in a formation quality factor of a fractured zone by using scattered waves according to this embodiment may include: a first obtaining module 510, a determining module 520, and a second obtaining module 530.
A first obtaining module 510, configured to obtain scattered waves in seismic waves in N different time periods in a target area, where the seismic waves are seismic waves generated by microseismic points in the target area; and acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves.
A determining module 520, configured to determine formation quality factors corresponding to N different time periods of the target region according to the amplitude spectrums of the scattered waves in the N different time periods, where N is an integer greater than or equal to 2.
And a second obtaining module 530, configured to obtain, according to the formation quality factors corresponding to the N different time periods, a change over time of the formation quality factor of the fracturing area in the target area, where the change is used to guide production of the hydrocarbon reservoir.
Optionally, the determining module 520 is specifically configured to:
for each microseismic event e within the ith of N different time periodsijBased on microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe value of i is an integer from 1 to N, and the value of j is the number M of all microseismic events which can be clearly recorded in the time period from 1 to the ithi(ii) a According to each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
Optionally, the determining module 520 is specifically configured to:
microseismic events eijThe scattered waves are divided into K sections, the amplitude spectrum of each section of scattered waves in the K sections is obtained, and corresponding stratum quality factors are obtained according to the amplitude spectrum of each section of scattered waves; summing and averaging the stratum quality factors corresponding to each scattered wave in the K scattered waves to obtain a microseismic event eijCorresponding formation quality factor QijWherein K is an integer of 1 or more.
Optionally, the determining module 520 is specifically configured to:
acquiring a stratum quality factor corresponding to each section of scattered waves according to the following formula 1;
Figure BDA0002887658660000121
in the formula 1, the first and second groups of the compound,
Figure BDA0002887658660000122
representing microseismic events eijThe amplitude spectrum of the K-th section of the scattered wave, K being an integer from 1 to K,
Figure BDA0002887658660000123
represents the travel time of the scattered wave of the k-th section relative to the direct wave,
Figure BDA0002887658660000124
representing microseismic events eijThe formation quality factor, S, obtained at the k-th section of the scattered waveij(f) The amplitude spectrum of the k-th direct wave is shown, and f is the frequency of the scattered wave.
Optionally, the determining module 520 is specifically configured to:
positioning M by reverse time migrationiEach of the microseismic events eijCorresponding formation quality factor QijMapping to a corresponding position of the target area; mapping all formation quality factors Q to corresponding locations of a target zoneijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
Optionally, before the obtaining the amplitude spectra of the scattered waves in N different time periods according to the scattered waves, the first obtaining module 510 is further configured to:
acquiring direct waves in seismic waves; and acquiring an amplitude spectrum of the direct wave according to the direct wave.
And acquiring the amplitude spectrums of the scattered waves in N different time periods according to the amplitude spectrums of the direct waves and the scattered waves.
The apparatus of this embodiment may be configured to implement the technical solutions of the above method embodiments, and the implementation principle and the technical effect are similar, which are not described herein again.
Fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application, and as shown in fig. 6, an electronic device 600 according to this embodiment may include: memory 610, processor 620.
A memory 610 for storing program instructions.
A processor 620, for calling the program instructions in the memory 610, and executing:
acquiring scattered waves in seismic waves in N different time periods in a target area, wherein the seismic waves are seismic waves generated by microseismic points in the target area; acquiring amplitude spectrums of the scattered waves in N different time periods according to the scattered waves; determining stratum quality factors corresponding to N different time periods of a target area according to the amplitude spectrums of the scattered waves in the N different time periods, wherein N is an integer greater than or equal to 2; and acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir.
Optionally, the processor 620 is specifically configured to:
for each microseismic event e within the ith of N different time periodsijBased on microseismic events eijObtaining microseismic events e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe value of i is an integer from 1 to N, and the value of j is the number M of all microseismic events which can be clearly recorded in the time period from 1 to the ithi(ii) a According to each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
Optionally, the processor 620 is specifically configured to:
microseismic events eijThe scattered waves are divided into K sections, the amplitude spectrum of each section of scattered waves in the K sections is obtained, and corresponding stratum quality factors are obtained according to the amplitude spectrum of each section of scattered waves; summing the stratum quality factors corresponding to each scattered wave in the K scattered wavesTaking an average value to obtain a microseismic event eijCorresponding formation quality factor QijWherein K is an integer of 1 or more.
Optionally, the processor 620 is specifically configured to:
acquiring a stratum quality factor corresponding to each section of scattered waves according to the following formula 1;
Figure BDA0002887658660000131
in the formula 1, the first and second groups of the compound,
Figure BDA0002887658660000132
representing microseismic events eijThe amplitude spectrum of the K-th section of the scattered wave, K being an integer from 1 to K,
Figure BDA0002887658660000133
represents the travel time of the scattered wave of the k-th section relative to the direct wave,
Figure BDA0002887658660000134
representing microseismic events eijThe formation quality factor, S, obtained at the k-th section of the scattered waveij(f) The amplitude spectrum of the k-th direct wave is shown, and f is the frequency of the scattered wave.
Optionally, the processor 620 is specifically configured to:
positioning M by reverse time migrationiEach of the microseismic events eijCorresponding formation quality factor QijMapping to a corresponding position of the target area; mapping all formation quality factors Q to corresponding locations of a target zoneijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
Optionally, before obtaining the amplitude spectra of the scattered waves in N different time periods according to the scattered waves, the processor 620 is further configured to:
acquiring direct waves in seismic waves; and acquiring an amplitude spectrum of the direct wave according to the direct wave.
And acquiring the amplitude spectrums of the scattered waves in N different time periods according to the amplitude spectrums of the direct waves and the scattered waves.
The electronic device of this embodiment may be configured to execute the technical solutions of the above method embodiments, and the implementation principle and the technical effect are similar, which are not described herein again.
Fig. 7 is a schematic structural diagram of an electronic device according to another embodiment of the present application. Referring to fig. 7, electronic device 700 includes a processing component 722 that further includes one or more processors, and memory resources, represented by memory 732, for storing instructions, such as applications, that are executable by processing component 722. The application programs stored in memory 732 may include one or more modules that each correspond to a set of instructions. Further, the processing component 722 is configured to execute instructions to perform the schemes in the various method embodiments described above.
The electronic device 700 may also include a power component 726 that is configured to perform power management of the electronic device 700, a wired or wireless network interface 750 that is configured to connect the electronic device 700 to a network, and an input output (I/O) interface 758. The electronic device 700 may operate based on an operating system stored in memory 732, such as Windows Server, Mac OS XTM, UnixTM, LinuxTM, FreeBSDTM, or the like.
A non-transitory computer-readable storage medium, wherein instructions of the storage medium, when executed by a processor of an electronic device, enable the electronic device to perform the schemes of the above-described method embodiments.
The present application also provides a computer program product comprising a computer program which, when executed by a processor, implements the method for determining changes in formation quality factor for a fracture zone using scattered waves as described above.
Those of ordinary skill in the art will understand that: all or a portion of the steps of implementing the above-described method embodiments may be performed by hardware associated with program instructions. The program may be stored in a computer-readable storage medium. When executed, the program performs steps comprising the method embodiments described above; and the aforementioned storage medium includes: various media capable of storing program codes, such as a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, and an optical disk.
Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.

Claims (10)

1. A method for determining formation quality factor changes in a fracture zone using scattered waves, comprising:
acquiring scattered waves in seismic waves in N different time periods in a target area, wherein the seismic waves are seismic waves generated by microseismic points in the target area;
acquiring amplitude spectrums of the scattered waves in the N different time periods according to the scattered waves;
determining stratum quality factors corresponding to the N different time periods of the target area according to the amplitude spectrums of the scattered waves in the N different time periods, wherein N is an integer greater than or equal to 2;
and acquiring the change of the formation quality factor of the fracturing area in the target area along with time according to the formation quality factors respectively corresponding to the N different time periods, wherein the change is used for guiding the exploitation of the oil and gas reservoir.
2. The method of claim 1, wherein the determining formation quality factors corresponding to the N different time periods of the target region according to the amplitude spectra of the scattered waves in the N different time periods comprises:
for each microseismic event e within the ith of the N different time periodsijAccording to saidMicroseismic event eijObtaining said microseismic event e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe value of i is an integer from 1 to N, and the value of j is the number M of all microseismic events which can be clearly recorded in the time period from 1 to the ithi
According to each microseismic event e in the ith time periodijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodi
3. The method of claim 2, wherein the method is based on the microseismic event eijObtaining said microseismic event e from the amplitude spectrum of the scattered waveijCorresponding formation quality factor QijThe method comprises the following steps:
the microseismic event eijThe scattering wave is divided into K sections, the amplitude spectrum of each section of scattering wave in the K sections is obtained, and a corresponding stratum quality factor is obtained according to the amplitude spectrum of each section of scattering wave;
summing and averaging the stratum quality factors corresponding to each section of scattered waves in the K sections of scattered waves to obtain the microseismic event eijCorresponding formation quality factor QijWherein K is an integer of 1 or more.
4. The method of claim 3, wherein obtaining the corresponding formation quality factor from the amplitude spectrum of each segment of the scattered wave comprises:
acquiring a stratum quality factor corresponding to each scattered wave according to the following formula 1;
Figure FDA0002887658650000021
in the formula 1, the first and second groups of the compound,
Figure FDA0002887658650000022
representing the microseismic eventeijThe amplitude spectrum of the K-th section of the scattered wave, K being an integer from 1 to K,
Figure FDA0002887658650000023
represents the travel time of the scattered wave of the k-th section relative to the direct wave,
Figure FDA0002887658650000024
representing the microseismic event eijThe formation quality factor, S, obtained at the k-th section of the scattered waveij(f) Represents the amplitude spectrum of the k-th direct wave, and f represents the frequency of the scattered wave.
5. The method of claim 2, wherein said determining each of said microseismic events e during said ith time period is based on a time duration of said microseismic event eijCorresponding formation quality factor QijDetermining the formation quality factor Q of the target area corresponding to the ith time periodiThe method comprises the following steps:
positioning the M by reverse time migrationiEach of the microseismic events eijCorresponding formation quality factor QijMapping to respective locations of the target region;
mapping all formation quality factors Q to corresponding locations of the target regionijSumming and averaging to determine the formation quality factor Q of the target region corresponding to the ith time periodi
6. The method according to any one of claims 1-5, wherein before obtaining the amplitude spectra of the scattered waves in the N different time periods from the scattered waves, the method further comprises:
acquiring direct waves in seismic waves;
acquiring an amplitude spectrum of the direct wave according to the direct wave;
the obtaining, according to the scattered wave, amplitude spectra of the scattered wave in the N different time periods includes:
and acquiring the amplitude spectrums of the scattered waves in the N different time periods according to the amplitude spectrums of the direct waves and the scattered waves.
7. An apparatus for determining formation quality factor changes in a fracture zone using scattered waves, comprising:
the first acquisition module is used for acquiring scattered waves in seismic waves in N different time periods in a target area, wherein the seismic waves are seismic waves generated by microseismic points in the target area; acquiring amplitude spectrums of the scattered waves in the N different time periods according to the scattered waves;
a determining module, configured to determine, according to the amplitude spectra of the scattered waves in the N different time periods, formation quality factors corresponding to the N different time periods of the target region, where N is an integer greater than or equal to 2;
and the second acquisition module is used for acquiring the change of the stratum quality factor of the fracturing area in the target area along with time according to the stratum quality factors respectively corresponding to the N different time periods, and the change is used for guiding the exploitation of the oil and gas reservoir.
8. An electronic device, comprising:
a memory for storing program instructions;
a processor for invoking and executing program instructions in the memory to perform the method of determining a change in a formation quality factor of a fractured zone using scattered waves according to any one of claims 1 to 6.
9. A computer-readable storage medium, characterized in that the computer storage medium stores a computer program which, when being executed by a processor, implements the method for determining changes in a formation quality factor of a fracture zone using scattered waves according to any of claims 1 to 6.
10. A computer program product comprising a computer program, wherein the computer program, when executed by a processor, implements the method for determining changes in a formation quality factor for a fracture zone using scattered waves according to any of claims 1 to 6.
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