CN112858818A - Method and device for calculating single event effect fault rate of avionic device - Google Patents
Method and device for calculating single event effect fault rate of avionic device Download PDFInfo
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Abstract
The invention provides a method and a device for calculating the single event effect fault rate of avionic equipment, wherein the method comprises the following steps: acquiring effective task section radiation stress and effective device sensitive section of the avionic device; calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section; and acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate. According to the method, the effective soft failure rate and the effective hard failure rate of the avionic device are further obtained by obtaining the effective task profile radiation stress and the effective device sensitive section of the avionic device, and finally the effective single event effect failure rate of the avionic device is obtained, so that the defects that at present, no mature program and method for calculating the single event effect failure rate of the avionic device exist at home and abroad are overcome.
Description
Technical Field
The invention relates to the technical field of aviation equipment, in particular to a method and a device for calculating a single event effect fault rate of avionic equipment.
Background
After the cosmic rays of the silver river are incident into the atmosphere, the cosmic rays interact with nitrogen, oxygen and other atoms in the atmosphere to form various charged particles or neutral particles, wherein the radiation environment below 3.5 kilometers is mainly atmospheric neutrons, and the neutron fluence is generally higher at higher latitudes and higher at higher altitudes. Atmospheric neutrons can cause single event effects of sensitive devices such as a CPU, an FPGA, a DSP and a memory in the avionic device, the single event effects are propagated in the avionic device, and the device is caused to have fault phenomena such as crash, reset and the like, and the device has the characteristic of being unknown in cause and irreproducible.
With the higher integration level of integrated circuits, neutron single event effect influences are more and more serious, and the neutron single event effect influences become main fault sources influencing avionic devices gradually, so that an atmospheric neutron single event effect fault rate prediction method for the avionic devices is urgently needed to be formulated, and the atmospheric radiation hazard of the avionic devices is quantitatively evaluated.
At present, no mature avionic device single event effect fault rate calculation program and method exist at home and abroad, and the avionic device single event effect fault rate cannot be accurately predicted and calculated at a system level according to different task target requirements. Therefore, how to find a method for calculating the single event effect failure rate of the avionic device becomes an urgent problem to be solved.
Disclosure of Invention
The invention provides a method and a device for calculating the single event effect fault rate of avionic equipment, which are used for solving the defect that no mature programs and methods for calculating the single event effect fault rate of the avionic equipment exist in the prior art and realizing the calculation of the single event effect fault rate of the avionic equipment.
In a first aspect, the invention provides a method for calculating a single event effect failure rate of avionic equipment, comprising the following steps:
acquiring effective task section radiation stress and effective device sensitive section of the avionic device;
calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section;
and acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
According to the method for calculating the single event effect fault rate of the avionic device, which is disclosed by the embodiment of the invention, the method for acquiring the effective task section radiation stress and the effective device sensitive section of the avionic device specifically comprises the following steps:
acquiring a device task target;
acquiring the effective task section radiation stress by adopting a preset task section radiation stress algorithm based on the equipment task target;
and acquiring the sensitive section of the effective device by adopting a preset device sensitive section algorithm based on the equipment task target.
According to the method for calculating the single event effect fault rate of the avionic device, the effective soft fault rate and the effective hard fault rate of the single event effect of the avionic device are calculated based on the effective task profile radiation stress and the effective device sensitive section, and the method also comprises the following steps:
and acquiring a list of the single event effect sensitive devices, a soft failure rate derating factor and a hard failure rate derating factor.
According to the method for calculating the single event effect fault rate of the avionic device, the effective soft fault rate and the effective hard fault rate of the single event effect of the avionic device are calculated based on the effective task profile radiation stress and the effective device sensitive section, and the method specifically comprises the following steps:
calculating to obtain the effective soft fault rate based on the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the soft fault rate derating factor;
and calculating to obtain the effective hard failure rate based on the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the hard failure rate derating factor.
According to the method for calculating the single event effect fault rate of the avionic device, the effective soft fault rate is calculated and obtained on the basis of the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the soft fault rate derating factor, and the method specifically comprises the following steps:
acquiring a turnover event rate, a turnover event safeguard measure effectiveness factor, a resource utilization rate, a transient event safeguard measure effectiveness factor, a suspension event rate, a suspension event safeguard measure effectiveness factor, a latch event rate, a latch event safeguard measure effectiveness factor and a soft fault overall design mitigation factor;
and carrying out weighted summation calculation to obtain the effective soft fault rate based on the upset event rate, the upset event safeguard effectiveness factor, the resource utilization rate, the transient event safeguard effectiveness factor, the suspension event rate, the suspension event safeguard effectiveness factor, the latch event rate, the latch event safeguard effectiveness factor and the soft fault overall design mitigation factor.
According to the method for calculating the single event effect fault rate of the avionic device, the effective hard fault rate is calculated and obtained on the basis of the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the hard fault rate derating factor, and the method specifically comprises the following steps:
acquiring a latch-up event rate, a latch-up event protection measure effective factor, a burnout event rate and a burnout event protection measure effective factor;
and carrying out weighted summation calculation to obtain the effective hard failure rate based on the latching event rate, the latching event protection measure effective factor, the burning event rate and the burning event protection measure effective factor.
According to the method for calculating the single event effect fault rate of the avionic device, the method for obtaining the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate specifically comprises the following steps:
and calculating the sum of the effective soft fault rate and the effective hard fault rate to obtain the effective single event effect fault rate of the avionic device.
In a second aspect, the present invention further provides a single event effect failure rate calculation apparatus for avionic devices, including:
the first acquisition module is used for acquiring the effective mission profile radiation stress and the effective device sensitive section of the avionic device;
the second acquisition module is used for calculating and obtaining the effective soft fault rate and the effective hard fault rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section;
and the third acquisition module is used for acquiring the single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
In a third aspect, the present invention further provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the method for calculating a single event effect failure rate of an avionic device according to any one of the above methods when executing the program.
In a fourth aspect, the present invention also provides a non-transitory computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, implements the steps of the method for calculating a single event effect failure rate of an avionics device as described in any one of the above.
According to the method and the device for calculating the single event effect fault rate of the avionic device, provided by the invention, the soft fault rate and the hard fault rate of the avionic device are further obtained by obtaining the task profile radiation stress and the device sensitive section of the avionic device, and the single event effect fault rate of the avionic device is finally obtained, so that the defects that no mature program and method for calculating the single event effect fault rate of the avionic device exist at home and abroad at present are overcome.
Drawings
In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a schematic flow chart of a method for calculating a single event effect failure rate of avionic equipment according to the present invention;
FIG. 2 is a schematic structural diagram of a single event effect failure rate calculation device for avionic equipment provided by the invention;
fig. 3 is a schematic structural diagram of an electronic device provided in the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention provides a prediction method of atmospheric neutron single event effect fault rate of avionic equipment, which comprises a single event effect fault rate prediction model and a prediction program, and provides a quantitative evaluation method for atmospheric radiation hazards of devices, board levels and equipment in equipment process management.
The method is suitable for predicting the atmospheric neutron single event effect fault rate of airborne equipment with the altitude of less than 3.5 kilometers (including adjacent space), and can be applied to the processes of equipment design, development, test, maintenance and the like, wherein the simple prediction method for the single event effect fault rate of the equipment is suitable for the primary design stage of product development with the minimum amount of known product information, the detailed prediction method for the single event effect fault rate of the equipment is suitable for the product with a detailed component list and corresponding test data, and neutron single event effect mitigation measures and the development stage of known task atmospheric neutron radiation stress are adopted in the design process.
Fig. 1 is a schematic flow chart of a method for calculating a single event effect failure rate of avionic devices, shown in fig. 1, and including:
specifically, the calculation program of the single event effect failure rate of the equipment comprises three steps of input, process and output, and based on the confirmation of the whole calculation program, the effective task section radiation stress f needs to be calculated firstlyiAnd effective device sensitive cross section σi。
By acquiring the effective task profile radiation stress and the effective device sensitive section of the avionic device, a precondition is created for further acquiring the effective soft failure rate and the effective hard failure rate of the avionic device.
102, calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section;
specifically, the avionic device comprises a single event effect sensitive device and an atmospheric neutron single event effect non-sensitive device, and the effective soft failure rate and the effective hard failure rate of the single event effect are obtained based on the effective task profile radiation stress and the sensitive section of the effective device.
Calculating the effective task section radiation stress fiAnd effective device sensitive cross section sigmaiOn the basis, the single event effect soft error event rate SEERAte is further calculated and obtainedsoft-iAnd SEERAtehard-iThen obtaining the soft failure rate lambda of the single event effect of the equipmentsoft-iAnd the hard failure rate lambda of the single event effect of the equipmenthard-i。
And 103, acquiring the single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
Specifically, according to the obtained effective soft fault rate and effective hard fault rate of the avionic device, the single event effect fault rate of the avionic device is further calculated and obtained
According to the method, the effective soft failure rate and the effective hard failure rate of the avionic device are further obtained by obtaining the effective task profile radiation stress and the effective device sensitive section of the avionic device, and finally the effective single event effect failure rate of the avionic device is obtained, so that the defects that at present, no mature program and method for calculating the single event effect failure rate of the avionic device exist at home and abroad are overcome.
Based on the above embodiment, step 101 in the method specifically includes:
acquiring a device task target;
acquiring the effective task section radiation stress by adopting a preset task section radiation stress algorithm based on the equipment task target;
and acquiring the sensitive section of the effective device by adopting a preset device sensitive section algorithm based on the equipment task target.
Specifically, when effective task section radiation stress calculation is performed according to actual requirements, an appropriate calculation method may be selected according to a task target, or an appropriate combination method may be adopted according to a task purpose and a task index requirement, and common calculation methods include, but are not limited to, a typical value method, an average value method, a key point method, a peak value method, and an extreme value method.
It can be understood that, inputting the task purpose and the task index requirement needs to provide quantitative input basis for the device single event effect fault rate calculation, for example, the index requirement of an MTBF (Mean Time Between Failure) of a certain device is T1 hours, or the index requirement of an MTBUR (Mean Time Between Unit Replacement Time) is T2 hours.
The mission profile is generally referred to as a full life cycle mission profile, and may be a specific mission profile consistent with mission objectives or mission criteria requirements, such as a flight schedule defined at T3 hours in china.
The list of components adopted by the equipment is used for preliminarily obtaining neutron single event effect sensitive devices and sensitive effect lists in the equipment device list, and the details are shown in table 1. The atmospheric neutron radiation induces the sensitive electronic device to generate SEL, SEGR, SEB, SEU, SET, SEFI, MBU/MCU and other single event effects, and the single event effect sensitivity characteristics of the devices with different processes and types can be seen in Table 1.
TABLE 1
Here, typical value methods are specifically: the fluence rate of atmospheric neutrons is 6000/cm at a height of 12.2km, a north latitude of 45 degrees and a height of more than 10MeV2H is calculated.
The average method specifically comprises the following steps: the calculation of the atmospheric neutron fluence rate comprises the working states of 3 stages of takeoff, cruising and descending of an airplane, the neutron fluence of a flight path is obtained by integrating the atmospheric neutron fluence rate under the flight path, and the atmospheric neutron fluence rate is obtained by dividing the neutron fluence rate by the duration time.
The calculation of the atmospheric neutron fluence rate comprises the working states of 3 stages of takeoff, cruising and descending of an airplane, the neutron fluence of a flight path is obtained by integrating the atmospheric neutron fluence rate under the flight path, and the atmospheric neutron fluence rate is obtained by dividing the neutron fluence rate by the duration time.
Wherein, flux (x (t), y (t), z (t)) is the atmospheric neutron fluence rate of the aircraft at the x, y, z position at the time t; x represents longitude; y represents the latitude; z represents height; t is t1The moment of power-on before takeoff; t is t2The moment of shutdown after landing; fluence is the atmospheric neutron Fluence of the aircraft under the airline.
And then dividing the neutron fluence by the flight time to obtain the atmospheric neutron average fluence rate of the avionic device on a preset air route:
the key point method specifically comprises the following steps: the calculation of flux (x (t), y (t), z (t)) can be performed by referring to the Boeing model, the NASA model and the correction model. Wherein the Boeing model and the NASA model calculate the atmospheric neutron fluence rate of 1-10MeV, and when the atmospheric neutron fluence rate is used, the atmospheric neutron fluence rate is converted into the atmospheric neutron fluence rate larger than 10MeV, and the ratio of the atmospheric neutron fluence rate larger than 10MeV in IEC62396-1 to the atmospheric neutron fluence rate of 1-10MeV is fixed and is 60/32. When the modified model is used, the effective fluence rate in atmospheric neutrons is calculated.
The correction model is as follows:
f＝f0×AE×AXY×AZ
wherein f is the effective fluence rate of atmospheric neutrons; f. of0The height is 12.2km, the north latitude is 45 degrees, and the fluence rate (/ cm) of atmospheric neutrons is more than 10MeV2·h-1) A value of 6000; a. theEThe height is 12.2km, and the ratio of the atmospheric neutron fluence rate above the threshold energy of the microcircuit to the atmospheric neutron fluence rate above 10MeV is 45 degrees in north latitude; a. theXYThe height is 12.2km, the different cut-off rigidity, the ratio of the atmospheric neutron fluence rate to 6000, the cut-off rigidity is determined by looking up a table according to the global longitude and latitude, and A is obtained by looking up the table according to the cut-off rigidityXYA coefficient; a. theZThe ratio of the neutron fluence rate of the atmosphere at different heights to 6000 is 45 degrees north latitude.
The peak value method specifically comprises the following steps: and selecting the neutron fluence rate of the peak point in the key points by looking up the table.
The extreme value method specifically comprises the following steps: taking the value of an extreme event, such as solar flare of 2 months in 1956, the SEE rate increases 263 times in areas with a cut-off stiffness of 0GV at 12 KM.
F300(AD774 event)≈2,4x 109proton cm-2(30x Feb’56)
The 2 nd month event in 1956 here is a known extreme event, with an enhancement factor of 1000 times, the extreme values of neutron flux are:
Fneutron(ESW level 1)＝6x 106neutron·cm-2·h-1(>10MeV at 12km)
further, common calculation methods for effective device sensitivity cross-section include, but are not limited to, simple device class typical value method, detailed process class typical value method, and test value method.
The invention creates a precondition for further acquiring the effective soft failure rate and the effective hard failure rate of the avionic device by acquiring the effective task profile radiation stress and the effective device sensitive section of the avionic device.
Based on any of the above embodiments, the calculating, based on the effective mission profile radiation stress and the effective device sensitive cross section, to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device further includes:
and acquiring a list of the single event effect sensitive devices, a soft failure rate derating factor and a hard failure rate derating factor.
Specifically, a list of single event effect sensitive devices of the equipment is obtained according to a list of components for the equipment, wherein the sensitive list describes the structure of the equipment, the sensitive devices contained in each circuit board in detail, general attribute information of each sensitive device, including the device model, the device type, the manufacturer and the device number, and process information including storage capacity, technical process, resource utilization rate and protective measures of the device. And finally, counting to generate a list of the single event effect sensitive devices in the avionic equipment.
And the single event effect fault of the equipment is originated from a semiconductor integrated circuit and other single event effect sensitive devices in the equipment. The sensitive devices can generate single event effect events under the influence of atmospheric neutron stress. Due to the difference of resource utilization rate, protection measure effectiveness, overall design retarding capability and the like, only a part of single event effect events can finally cause equipment single event effect faults. Therefore, a general calculation method for the failure rate of the single event effect at the equipment level, the board level and the device level is as follows:
λ＝SEERATE×Π＝f×σ×Π
SEERATE＝f×σ
wherein, λ is equipment level, plate levelOr the failure rate of the single event effect at the device level, and the unit is times/hour; SEERATEThe single event effect event rate of the sensitive device is expressed in unit of times/hour; pi is a derating factor, and only a part of single event effect events can finally cause single event effect faults of the equipment due to different resource utilization rates, protective measure effectiveness, overall design retarding capacity and the like, so that the derating factor pi is used for indicating the conversion degree of the event rate into the fault rate; f is the atmospheric neutron radiation stress with the unit of time/square centimeter-hour; and sigma is the sensitive section of the sensitive device with the single event effect, and the unit is square centimeter/bit or square centimeter/device.
Further, the single event effect faults of the device include soft single event effect faults of the device and hard single event effect faults of the device, and the calculation of the single event effect fault rate (times/hour) of the device needs to consider the influence of the following factors: task profile, equipment safety design assurance level, atmospheric neutron particle energy range: thermal neutrons, 1MeV-10MeV neutrons, neutrons above 10MeV and the like, and the types of single event effect sensitive devices are as follows: CPU, FPGA, etc., the sensitive single event effect variety of the device: SEU, SET, SEFI, SEL, SEB, etc., and the list of single event effect sensitive devices. The method for calculating the total failure rate of the single event effect of the equipment is as follows:
wherein, the lambda is the total failure rate of the single event effect of the equipment, and the unit is times/hour; BOM is a list of single event effect sensitive devices of the equipment; i is a single event effect sensitive device of the device; lambda [ alpha ]soft-iThe single event effect soft failure rate of the device i is expressed in units of times/hour; lambda [ alpha ]hard-iThe single event effect hard failure rate of the device i is expressed in units of times/hour; f. ofsoft-iThe unit is sub/square centimeter-hour for atmospheric neutron radiation stress causing single event effect soft failure of the sensing device; sigmasoft-iThe single event effect sensitive section of the single event effect soft fault sensitive device is in units of square centimeter/bit or square centimeter/device; II typesoft-iSoft cause of single event effectDerating factor of the failure rate; f. ofhard-iThe unit is sub/square centimeter-hour for atmospheric neutron radiation stress causing single event effect hard failure; sigmahard-iThe unit of the sensitive section of the sensitive device is square centimeter/bit or square centimeter/device, which causes the single event effect hard fault; II typehard-iIs a de-rating factor for the event rate that results in single event effect hard failures.
It will be appreciated that for a particular classification method, when the soft fault rate de-rating factor Πsoft-iCalculating the single event effect soft error event rate for 1 hour, derating the hard error rate by a factor of pihard-iThe single event effect hard error event rate was calculated for 1 hour.
Based on any of the above embodiments, step 102 in the method specifically includes:
calculating to obtain the effective soft fault rate based on the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the soft fault rate derating factor;
and calculating to obtain the effective hard failure rate based on the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the hard failure rate derating factor.
Specifically, the method for acquiring the soft failure rate of the avionic device includes the steps of respectively calculating the soft failure rates of all the single event effect sensitive devices in the list of the single event effect sensitive devices in the avionic device, and calculating and acquiring the sum of the soft failure rates of all the single event effect sensitive devices in the list of the single event effect sensitive devices in the avionic device.
The method for acquiring the hard failure rate of the avionic device comprises the steps of respectively calculating the hard failure rates of all the single event effect sensitive devices in the list of the single event effect sensitive devices in the avionic device, and calculating and acquiring the sum of the hard failure rates of all the single event effect sensitive devices in the list of the single event effect sensitive devices in the avionic device.
The method creates conditions for obtaining the soft failure rate of the avionic device by obtaining the soft failure rate of each single event effect sensitive device in the list of the single event effect sensitive devices in the avionic device; the method creates conditions for obtaining the hard failure rate of the avionic device by obtaining the hard failure rate of each single event effect sensitive device in the list of the single event effect sensitive devices in the avionic device.
Based on any of the above embodiments, the calculating the effective soft failure rate based on the effective task profile radiation stress, the effective device sensitive cross section, the single event effect sensitive device list, and the soft failure rate derating factor specifically includes:
acquiring a turnover event rate, a turnover event safeguard measure effectiveness factor, a resource utilization rate, a transient event safeguard measure effectiveness factor, a suspension event rate, a suspension event safeguard measure effectiveness factor, a latch event rate, a latch event safeguard measure effectiveness factor and a soft fault overall design mitigation factor;
and carrying out weighted summation calculation to obtain the effective soft fault rate based on the upset event rate, the upset event safeguard effectiveness factor, the resource utilization rate, the transient event safeguard effectiveness factor, the suspension event rate, the suspension event safeguard effectiveness factor, the latch event rate, the latch event safeguard effectiveness factor and the soft fault overall design mitigation factor.
Specifically, the single event effect soft fault of the device mainly originates from a single event upset event (SEU), a single event transient event (SET), a single event functional interruption event (SEFI) and a single event latch-up event (SEL) of the limited flow protection generated by a semiconductor integrated circuit in the device.
Wherein, a single event upset event (SEU) is converted into a single event upset fault and is influenced by the effectiveness of protection measures, the resource interest rate and the overall design retarding capacity; the single-event transient event (SET) is converted into a single-event transient fault and is influenced by the effectiveness of protection measures and the overall design retarding capability; converting a single event functional termination event (SEFI) into a single event functional termination fault, and being influenced by the effectiveness of protection measures; the single event latch-up event (SEL) disappears after restarting or resetting under the current-limiting slow-down measure, and is converted into a single event latch-up soft fault.
The method for calculating the single event effect soft failure rate of the equipment is as follows:
wherein SEErate-SEU-iThe single event upset event rate of the sensitive device is expressed in unit of times/hour; II typeSEU-iThe value range of the effectiveness of the protection measures for the single event upset event is [0, 1 ]]；Πused-iThe value range of the resource utilization rate of the single event upset sensitive device is [0, 1 ]]；SEErate-SET-iThe unit is the single-event transient event rate and is times/hour; II typeSET-iThe effectiveness of the protection measures of the single event transient event is in the value range of [0, 1%]；ΠerrorDesigning a retarding capacity for the whole single-particle soft fault; SEErate-SEFI-iThe single event function termination event rate of the device is expressed in units of times/hour; II typeSEFI-iThe value range of the effectiveness of the measures for preventing the single event function suspension event is [0, 1 ]]；SEErate-SEL-iThe single event function latch-up event rate of the device is expressed in units of times/hour; II typeSEL-iThe value range of the effectiveness of the protective measures for the single event function latch-up event is [0, 1 ]]。
Furthermore, single-event multi-bit upset events (MBUs) and other single-event soft error events that are subsequently discovered can also be referenced.
Based on any of the above embodiments, the calculating to obtain the effective hard failure rate based on the effective task profile radiation stress, the effective device sensitive cross section, the single event effect sensitive device list, and the hard failure rate derating factor specifically includes:
acquiring a latch-up event rate, a latch-up event protection measure effective factor, a burnout event rate and a burnout event protection measure effective factor;
and carrying out weighted summation calculation to obtain the hard failure rate based on the latching event rate, the latching event protection measure effective factor, the burnout event rate and the burnout event protection measure effective factor.
Specifically, the single event effect hard fault of the device mainly originates from a single event latch-up event (SEL), a single event burnout event (SEB) and the like of infinite flow protection generated by a semiconductor integrated circuit in the device, and the single event is converted into the single event effect hard fault and is mainly influenced by the effectiveness of protection measures.
The method for calculating the single event effect hard failure rate of the equipment is as follows:
wherein λ ishardThe single event effect failure rate of the equipment is expressed in unit of times/hour; SEErate-SEL-iThe single event latch-up event rate of the sensitive device i is expressed in units of times/hour/device; SEErate-SEB-iThe single event burnout event rate of the sensitive device i is expressed in units of times/hour/device; II typeSEB-iThe effectiveness of the protection measures for the single event burnout event of the sensitive device i is within the value range of 0, 1]。
Furthermore, a single-particle hard error event such as a single-particle gate-through event (SEGR) may be calculated by reference.
Based on any of the above embodiments, step 103 in the method specifically includes:
and calculating the sum of the effective soft fault rate and the effective hard fault rate to obtain the effective single event effect fault rate of the avionic device.
Specifically, the effective soft failure rate of the avionic device and the effective hard failure rate of the avionic device are added to obtain the effective single event effect failure rate of the avionic device.
λ＝λsoft+λhardt
The method realizes the detailed description of the reliability index of the avionic product in the whole life cycle, has accurate reliability prediction result, can be applied to different equipment platforms, covers all kinds of components, and has stress effect covering space radiation stress.
The avionics device single event effect fault rate calculation device provided by the invention is described below, and the avionics device single event effect fault rate calculation device described below and the avionics device single event effect fault rate calculation method described above can be referred to correspondingly.
Fig. 2 is a schematic structural diagram of a single event effect failure rate calculation apparatus for avionic devices, shown in fig. 2, including: a first acquisition module 21, a second acquisition module 22 and a third acquisition module 23; wherein:
the first acquisition module 21 is used for acquiring effective mission profile radiation stress and effective device sensitive cross section of the avionic device; the second obtaining module 22 is configured to calculate, based on the effective task profile radiation stress and the effective device sensitive cross section, an effective soft failure rate and an effective hard failure rate of a single event effect of the avionic device; the third obtaining module 23 is configured to obtain an effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
According to the method, the effective soft failure rate and the effective hard failure rate of the avionic device are further obtained by obtaining the effective task profile radiation stress and the effective device sensitive section of the avionic device, and finally the effective single event effect failure rate of the avionic device is obtained, so that the defects that at present, no mature program and method for calculating the single event effect failure rate of the avionic device exist at home and abroad are overcome.
Fig. 3 illustrates a physical structure diagram of an electronic device, which may include, as shown in fig. 3: a processor (processor)310, a communication interface (communication interface)320, a memory (memory)330 and a communication bus 340, wherein the processor 310, the communication interface 320 and the memory 330 communicate with each other via the communication bus 340. The processor 310 may invoke logic instructions in the memory 330 to perform each of the provided avionics device single event effect failure rate calculation methods described above, the methods comprising: acquiring effective task section radiation stress and effective device sensitive section of the avionic device; calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section; and acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
In addition, the logic instructions in the memory 330 may be implemented in the form of software functional units and stored in a computer readable storage medium when the software functional units are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-only memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
In another aspect, the present invention also provides a computer program product, including a computer program stored on a non-transitory computer-readable storage medium, the computer program including program instructions, when the program instructions are executed by a computer, the computer being capable of executing the method for calculating a single event effect failure rate of an avionics device provided by the above methods, the method including: acquiring effective task section radiation stress and effective device sensitive section of the avionic device; calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section; and acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
In yet another aspect, the present invention also provides a non-transitory computer-readable storage medium, on which a computer program is stored, the computer program being implemented by a processor to perform the method for calculating a single event effect failure rate of an avionics device provided in each of the above aspects, the method comprising: acquiring effective task section radiation stress and effective device sensitive section of the avionic device; calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section; and acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. The method for calculating the single event effect fault rate of the avionic device is characterized by comprising the following steps:
acquiring effective task section radiation stress and effective device sensitive section of the avionic device;
calculating to obtain the effective soft failure rate and the effective hard failure rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section;
and acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
2. The method for calculating the single event effect failure rate of the avionic device according to claim 1, wherein the obtaining of the effective mission profile radiation stress and the effective device sensitive section of the avionic device specifically comprises:
acquiring a device task target;
acquiring the effective task section radiation stress by adopting a preset task section radiation stress algorithm based on the equipment task target;
and acquiring the sensitive section of the effective device by adopting a preset device sensitive section algorithm based on the equipment task target.
3. The method for calculating the single event effect fault rate of the avionic device according to claim 1, wherein the effective soft fault rate and the effective hard fault rate of the single event effect of the avionic device are calculated based on the effective mission profile radiation stress and the effective device sensitive section, and the method comprises the following steps:
and acquiring a list of the single event effect sensitive devices, a soft failure rate derating factor and a hard failure rate derating factor.
4. The method for calculating the single event effect fault rate of the avionic device according to claim 3, wherein the calculating based on the effective mission profile radiation stress and the effective device sensitive cross section to obtain the effective soft fault rate and the effective hard fault rate of the single event effect of the avionic device specifically comprises:
calculating to obtain the effective soft fault rate based on the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the soft fault rate derating factor;
and calculating to obtain the effective hard failure rate based on the effective task profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the hard failure rate derating factor.
5. The method for calculating the single event effect fault rate of the avionic device according to claim 4, wherein the effective soft fault rate is calculated based on the effective mission profile radiation stress, the effective device sensitive section, the single event effect sensitive device list and the soft fault rate derating factor, and specifically comprises:
acquiring a turnover event rate, a turnover event safeguard measure effectiveness factor, a resource utilization rate, a transient event safeguard measure effectiveness factor, a suspension event rate, a suspension event safeguard measure effectiveness factor, a latch event rate, a latch event safeguard measure effectiveness factor and a soft fault overall design mitigation factor;
and carrying out weighted summation calculation to obtain the effective soft fault rate based on the upset event rate, the upset event safeguard effectiveness factor, the resource utilization rate, the transient event safeguard effectiveness factor, the suspension event rate, the suspension event safeguard effectiveness factor, the latch event rate, the latch event safeguard effectiveness factor and the soft fault overall design mitigation factor.
6. The method according to claim 4, wherein the effective hard failure rate is calculated based on the effective mission profile radiation stress, the effective device sensitive cross section, the single event effect sensitive device list and the hard failure rate derating factor, and specifically comprises:
acquiring a latch-up event rate, a latch-up event protection measure effective factor, a burnout event rate and a burnout event protection measure effective factor;
and carrying out weighted summation calculation to obtain the effective hard failure rate based on the latching event rate, the latching event protection measure effective factor, the burning event rate and the burning event protection measure effective factor.
7. The method for calculating the single event effect fault rate of the avionic device according to claim 1, wherein the obtaining of the effective single event effect fault rate of the avionic device based on the soft fault rate and the hard fault rate specifically comprises:
and calculating the sum of the soft failure rate and the hard failure rate to obtain the effective single event effect failure rate of the avionic device.
8. The single event effect fault rate calculation device of the avionic device is characterized by comprising the following components:
the first acquisition module is used for acquiring the effective mission profile radiation stress and the effective device sensitive section of the avionic device;
the second acquisition module is used for calculating and obtaining the effective soft fault rate and the effective hard fault rate of the single event effect of the avionic device based on the effective task profile radiation stress and the effective device sensitive section;
and the third acquisition module is used for acquiring the effective single event effect fault rate of the avionic device based on the effective soft fault rate and the effective hard fault rate.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the steps of the method for calculating the single event effect failure rate of an avionic device according to any one of claims 1 to 7 when executing the computer program.
10. A non-transitory computer-readable storage medium, on which a computer program is stored, wherein the computer program, when being executed by a processor, implements the steps of the avionics device single event effect failure rate calculation method according to any one of claims 1 to 7.
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