CN112857598A

CN112857598A - External GPU chip testing device

Info

Publication number: CN112857598A
Application number: CN202110200053.8A
Authority: CN
Inventors: 黄永
Original assignee: Zhongtian Xingxing Shanghai Technology Co ltd
Current assignee: Zhongtian Xingxing Shanghai Technology Co ltd
Priority date: 2021-02-23
Filing date: 2021-02-23
Publication date: 2021-05-28

Abstract

The invention discloses an external GPU chip testing device, and belongs to the technical field of computers. An external GPU chip testing device comprises a testing shell, a sliding plate is connected in the testing shell in a sliding mode, a testing seat is connected to the outer wall of the sliding plate, a GPU main body is connected in the testing seat, a U-shaped plate is connected to the top of the testing shell, a first motor is connected to the outer wall of the U-shaped plate, the output end of the first motor is connected with a rotating shaft, one end, away from the first motor, of the rotating shaft penetrates through the U-shaped plate and is connected with a first rotating rod, a first bevel gear is connected to the outer wall of the first rotating rod, an L-shaped plate is connected to the bottom wall of the first rotating rod; the temperature probe is abutted against the GPU to accurately measure the temperature of the GPU, and the temperature probe moves spirally to dynamically measure the temperature of each position of the GPU, so that the error in temperature measurement is reduced.

Description

External GPU chip testing device

Technical Field

The invention relates to the technical field of computers, in particular to an external GPU chip testing device.

Background

The GPU is a microprocessor which is specially used for image operation work on personal computers, workstations, game machines and some mobile devices (such as tablet computers, smart phones and the like), the GPU is designed according to the characteristics of image calculation, hundreds to thousands of lightweight computing cores are usually integrated on one GPU device, the GPU has extremely high computing capability aiming at mutually independent SIMD and MIMD computing, and the GPU is already applied to various fields due to the characteristics of parallel acceleration and the like.

The performance of the GPU needs to be tested during production, temperature indexes in the performance indexes of the GPU are important, the influence of the temperature on the GPU is the greatest, but most of the GPU is open testing temperature in the testing process, the GPU is in a relatively closed case in the using environment, and the temperature and the outside have certain difference, so that the error in the temperature testing process is large.

The invention discloses a GPU performance testing device which comprises a testing table, wherein a mounting opening is formed in one side of the outer wall of the top of the testing table, a case is fixed to the inner wall of the mounting opening through bolts, rectangular openings are formed in the outer walls of the two sides of the case, air inlet grids are fixed to the inner walls of the two rectangular openings through bolts, air holes distributed at equal intervals are formed in the inner wall of the bottom of the case, and a testing seat is fixed to the inner wall of the bottom of the case through bolts.

Disclosure of Invention

The invention aims to solve the problems in the prior art and provides an external GPU chip testing device.

In order to achieve the purpose, the invention adopts the following technical scheme:

an external GPU chip testing device comprises a testing shell, a sliding plate is connected in the testing shell in a sliding way, the outer wall of the sliding plate is connected with a test seat, the test seat is internally connected with a GPU main body, the top of the test shell is connected with a U-shaped plate, the outer wall of the U-shaped plate is connected with a first motor, the output end of the first motor is connected with a rotating shaft, one end of the rotating shaft, which is far away from the first motor, penetrates through the U-shaped plate and is connected with a first rotating rod, the outer wall of the first rotating rod is connected with a first bevel gear, the bottom wall of the first rotating rod is connected with an L-shaped plate, the outer wall of the L-shaped plate is connected with a second bevel gear which is meshed with the first bevel gear, the outer wall of the second bevel gear is connected with a first screw rod, the outer wall of the first screw rod is in threaded connection with a sleeve, the bottom of the sleeve is connected with a temperature measuring mechanism, and the outer wall of the test shell is connected with a display screen.

Preferably, the temperature measuring mechanism comprises a pipe body, the pipe body is connected to the bottom of the sleeve, the inner wall of the pipe body is connected with an elastic element, one end, away from the inner wall of the pipe body, of the elastic element is connected with a temperature probe, the temperature probe is connected into the pipe body in a sliding mode, the temperature probe movably abuts against the GPU main body, and the temperature probe is electrically connected with the display screen.

Preferably, the outer walls of the two sides of the temperature probe are both connected with limiting blocks, and limiting grooves matched with the limiting blocks are formed in the tube body in a chiseling mode.

Preferably, the outer wall of the temperature probe is sleeved with a rubber sleeve, the bottom wall of the rubber sleeve is provided with an arc-shaped surface, and the rubber sleeve is movably abutted to the GPU main body.

Preferably, the outer wall of the U-shaped plate is connected with an alarm, and the alarm is electrically connected with the temperature probe.

Preferably, U-shaped plate outer wall is connected with the second motor, the second motor links to each other with the alarm electrical property, the output of second motor is connected with the second bull stick, the one end that the second motor was kept away from to the second bull stick passes the U-shaped plate and is connected with first gear, the sleeve pipe has been cup jointed to first bull stick outer wall, sleeve pipe outer wall is connected with the second gear with first gear matched with, sleeve pipe outer wall is connected with rotates the seat, it has the flabellum to rotate a seat outer wall connection.

Preferably, the outer walls of the two sides of the test shell are provided with radiating holes which are uniformly distributed, the outer wall of the test shell is connected with a dustproof plate, and the dustproof plate is arranged outside the radiating holes.

Preferably, a third rotating rod is rotatably connected in the U-shaped plate through a bearing, the outer wall of the third rotating rod is connected with a worm wheel, and the outer wall of the first rotating rod is connected with a worm meshed with the worm wheel.

Preferably, the both ends of third bull stick all are connected with first link plate, first link plate outer wall rotates and is connected with the second and links the board, the second links the board and keeps away from the one end of first even board and is connected with the movable plate, the diapire of movable plate is connected with the brush board, the outer wall activity counterbalance of brush board and dust guard.

Preferably, the outer wall of the test shell is connected with a limiting frame, and the moving plate is connected in the limiting frame in a sliding mode.

Compared with the prior art, the invention provides an external GPU chip testing device, which has the following beneficial effects:

1. this external GPU chip testing arrangement simulates quick-witted incasement GPU's operational environment through the test shell, and then reduces the error of test, offsets with GPU through temperature probe, and accurate measurement GPU's temperature, and makes temperature probe be the temperature that the heliciform motion removed each position of dynamic measurement GPU, and then error when reducing the temperature measurement.

2. This external GPU chip testing arrangement, through set up elastic element between body inner wall and temperature probe, make temperature probe be applicable to GPU main part surface, improve temperature probe's suitability, and set up the rubber sleeve in temperature probe's both sides, avoid temperature probe to collide with the GPU main part outside at the in-process that removes, cause the damage to temperature probe or GPU main part.

3. This external GPU chip testing arrangement through set up the alarm in the U-shaped board outside, when temperature probe detected the temperature of GPU main part during operation too high, can remind the staff.

4. This external GPU chip testing arrangement, when the alarm was reported an emergency and asked for help or increased vigilance, the second motor operation made the output of second motor drive first gear and the second gear intermeshing in the sleeve pipe outside through the second bull stick, made the second gear drive sleeve pipe and rotated, the sleeve pipe drives the flabellum work that rotates the seat outside, dispels the heat fast to the GPU main part that the temperature is too high, avoided the overheated impaired of GPU main part.

5. This external GPU chip testing arrangement, through the worm in the first bull stick outside and the worm wheel intermeshing in the third bull stick outside, makes the third bull stick drive first link and rotate, and first link drives the second and links the board and use and rotate as the centre of a circle with first link handing-over department, and then drives movable plate reciprocating motion from top to bottom, makes the brush board handle the impurity dust of dust guard outside adhesion, avoids influencing the radiating effect of test shell.

Drawings

FIG. 1 is a first schematic structural diagram of the present invention;

FIG. 2 is a second schematic structural view of the present invention;

FIG. 3 is a schematic structural view of portion A of FIG. 2 according to the present invention;

FIG. 4 is a schematic view of the internal structure of the test housing of the present invention;

FIG. 5 is a first external view of the first rotating rod of the present invention;

FIG. 6 is a second external view of the first rotating shaft according to the present invention;

FIG. 7 is a schematic structural diagram of the temperature measuring mechanism of the present invention.

In the figure: 1. testing the housing; 2. a slide plate; 201. a test seat; 3. a GPU main body; 4. a U-shaped plate; 5. a first motor; 501. a first rotating lever; 5011. a first bevel gear; 6. an L-shaped plate; 601. a second bevel gear; 602. a first lead screw; 6021. a sleeve; 7. a display screen; 8. a pipe body; 801. an elastic element; 802. a temperature probe; 8021. a limiting block; 8022. a rubber sleeve; 803. a limiting groove; 9. an alarm; 10. a second motor; 11. a second rotating rod; 111. a first gear; 12. a sleeve; 121. a second gear; 122. a rotating seat; 1221. a fan blade; 13. heat dissipation holes; 131. a dust-proof plate; 14. a third rotating rod; 141. a worm gear; 142. a first connecting plate; 143. a second connecting plate; 144. moving the plate; 15. a worm; 16. brushing the board; 17. and a limiting frame.

Detailed Description

The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention; it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments, and all other embodiments obtained by those skilled in the art without any inventive work are within the scope of the present invention.

In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "top/bottom", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "sleeved/connected," "connected," and the like are to be construed broadly, e.g., "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; the two components can be directly connected or indirectly connected through an intermediate medium, and the two components can be communicated with each other; the specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Example 1:

referring to fig. 1-7, an external GPU chip testing device comprises a testing shell 1, a sliding plate 2 is slidably connected in the testing shell 1, a testing base 201 is connected to the outer wall of the sliding plate 2, a GPU main body 3 is connected in the testing base 201, a U-shaped plate 4 is connected to the top of the testing shell 1, a first motor 5 is connected to the outer wall of the U-shaped plate 4, an output end of the first motor 5 is connected to a rotating shaft, one end, away from the first motor 5, of the rotating shaft penetrates through the U-shaped plate 4 and is connected with a first rotating rod 501, a first bevel gear 5011 is connected to the outer wall of the first rotating rod 501, an L-shaped plate 6 is connected to the bottom wall of the first rotating rod 501, a second bevel gear 601 meshed with the first bevel gear 5011 is connected to the outer wall of the L-shaped plate 6, a first lead screw 602 is connected to the outer wall of the second bevel.

Temperature measurement mechanism includes body 8, and body 8 is connected in the bottom of sleeve 6021, and body 8 inner wall is connected with elastic element 801, and elastic element 801 keeps away from the one end of body 8 inner wall and is connected with temperature probe 802, and temperature probe 802 sliding connection is in body 8, and temperature probe 802 offsets with GPU main part 3 activity, and temperature probe 802 and display screen 7 electric connection.

The outer walls of the two sides of the temperature probe 802 are both connected with a limit block 8021, and a limit groove 803 matched with the limit block 8021 is formed in the pipe body 8 in a chiseling mode.

When the device is used, the GPU is arranged on the test seat 201, then the GPU is electrified to normally detect, the GPU generates heat when in work, the temperature of the GPU is different under different working environments, the output end of the first motor 5 drives the first rotating rod 501 to rotate by controlling the operation of the first motor 5, the first rotating rod 501 drives the L-shaped plate 6 to rotate, in the process, the first bevel gear 5011 is meshed with the second bevel gear 601, the second bevel gear 601 drives the first screw rod 602 to rotate, the sleeve 6021 moves outside the first screw rod 602, the temperature measuring mechanism can move spirally to dynamically measure the temperature of each position of the GPU, the measured temperature is displayed on the display screen 7, the elastic element 801 is arranged between the inner wall of the pipe 8 and the temperature probe 802, the temperature probe 802 is suitable for the surface of the GPU main body 3, the applicability of the temperature probe 802 is improved, and the damage to the temperature probe 802 or the GPU main body 3 is avoided, the working environment of the GPU in the case is simulated by testing the shell 1, so that the testing error is reduced, the temperature of the GPU is accurately measured by abutting the temperature probe 802 against the GPU, the temperature probe 802 moves spirally to dynamically measure the temperature of each position of the GPU, and the error in temperature measurement is reduced.

Example 2:

referring to fig. 2-5, an external GPU chip testing device is substantially the same as that in embodiment 1, and further, an alarm 9 is connected to an outer wall of the U-shaped plate 4, and the alarm 9 is electrically connected to the temperature probe 802.

The outer wall of U-shaped plate 4 is connected with second motor 10, second motor 10 links to each other with alarm 9 electrical property, the output of second motor 10 is connected with second bull stick 11, the one end that second motor 10 was kept away from to second bull stick 11 passes U-shaped plate 4 and is connected with first gear 111, sleeve pipe 12 has been cup jointed to first bull stick 501 outer wall, sleeve pipe 12 outer wall is connected with second gear 121 with first gear 111 matched with, sleeve pipe 12 outer wall is connected with rotates seat 122, it has flabellum 1221 to rotate seat 122 outer wall.

Through setting up alarm 9 in the U-shaped plate 4 outside, when temperature probe 802 detects the temperature of GPU main part 3 during operation too high, can remind the staff, when alarm 9 sends out the police dispatch newspaper, second motor 10 moves, make the output of second motor 10 drive the second gear 121 intermeshing in first gear 111 and the sleeve pipe 12 outside through second bull stick 11, make second gear 121 drive sleeve pipe 12 and rotate, sleeve pipe 12 drives the work of flabellum 1221 who rotates the seat 122 outside, dispel the heat fast to the too high GPU main part 3 of temperature, avoid GPU main part 3 overheated impaired.

Example 3:

referring to fig. 1 to 7, an external GPU chip testing apparatus is substantially the same as that in embodiment 2, and further, a rubber sleeve 8022 is sleeved on an outer wall of the temperature probe 802, a bottom wall of the rubber sleeve 8022 is provided with an arc-shaped surface, and the rubber sleeve 8022 is movably abutted to the GPU main body 3; the temperature probe 802 is prevented from colliding with the outer side of the GPU body 3 in the moving process, and damage to the temperature probe 802 or the GPU body 3 is avoided.

The outer walls of two sides of the test shell 1 are provided with radiating holes 13 which are uniformly distributed, the outer wall of the test shell 1 is connected with a dustproof plate 131, and the dustproof plate 131 is arranged outside the radiating holes 13; the heat generated inside the test shell 1 is dissipated through the heat dissipation holes 13, and the dust guard 131 is arranged outside the heat dissipation holes 13, so that dust is prevented from entering the test shell 1 and falling on the GPU body 3 to affect the temperature test of the GPU body 3.

Example 4:

referring to fig. 1 to 4, an external GPU chip testing device is substantially the same as in embodiment 3, and further, a third rotating rod 14 is rotatably connected inside the U-shaped plate 4 through a bearing, a worm wheel 141 is connected to an outer wall of the third rotating rod 14, and a worm 15 meshed with the worm wheel 141 is connected to an outer wall of the first rotating rod 501.

The two ends of the third rotating rod 14 are connected with first connecting plates 142, the outer wall of each first connecting plate 142 is rotatably connected with a second connecting plate 143, one end, far away from the first connecting plate 142, of each second connecting plate 143 is connected with a moving plate 144, the bottom wall of each moving plate 144 is connected with a brush plate 16, and each brush plate 16 is movably abutted to the outer wall of the dust guard 131.

The outer wall of the test housing 1 is connected with a limit frame 17, and the moving plate 144 is slidably connected in the limit frame 17.

When the first rotating rod 501 rotates, the worm 15 on the outer side of the first rotating rod is meshed with the worm wheel 141 on the outer side of the third rotating rod 14, so that the third rotating rod 14 drives the first connecting plate 142 to rotate, the first connecting plate 142 drives the second connecting plate 143 to rotate by taking the joint of the second connecting plate and the first connecting plate 142 as the center of a circle, and further the moving plate 144 is driven to reciprocate up and down, so that the brush plate 16 can treat impurity and dust adhered to the outer side of the dust guard 131, and the influence on the heat dissipation effect of the test housing 1 is avoided.

The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.

Claims

1. The external GPU chip testing device comprises a testing shell (1) and is characterized in that a sliding plate (2) is connected in the testing shell (1) in a sliding mode, a testing seat (201) is connected to the outer wall of the sliding plate (2), a GPU main body (3) is connected in the testing seat (201), a U-shaped plate (4) is connected to the top of the testing shell (1), a first motor (5) is connected to the outer wall of the U-shaped plate (4), a rotating shaft is connected to the output end of the first motor (5), one end, far away from the first motor (5), of the rotating shaft penetrates through the U-shaped plate (4) and is connected with a first rotating rod (501), a first bevel gear (5011) is connected to the outer wall of the first rotating rod (501), an L-shaped plate (6) is connected to the bottom wall of the first rotating rod (501), a second bevel gear (601) meshed with the first bevel gear (5011) is, the outer wall of the second bevel gear (601) is connected with a first screw rod (602), the outer wall of the first screw rod (602) is in threaded connection with a sleeve (6021), the bottom of the sleeve (6021) is connected with a temperature measuring mechanism, and the outer wall of the test shell (1) is connected with a display screen (7).

2. The external GPU chip testing device according to claim 1, wherein the temperature measuring mechanism comprises a tube body (8), the tube body (8) is connected to the bottom of the sleeve (6021), an elastic element (801) is connected to the inner wall of the tube body (8), a temperature probe (802) is connected to one end, away from the inner wall of the tube body (8), of the elastic element (801), the temperature probe (802) is connected to the inside of the tube body (8) in a sliding mode, the temperature probe (802) is movably abutted to the GPU main body (3), and the temperature probe (802) is electrically connected with the display screen (7).

3. The external GPU chip testing device of claim 2, wherein the outer walls of the two sides of the temperature probe (802) are connected with limit blocks (8021), and limit grooves (803) matched with the limit blocks (8021) are formed in the tube body (8) in a chiseled mode.

4. The external GPU chip testing device according to claim 3, characterized in that a rubber sleeve (8022) is sleeved on the outer wall of the temperature probe (802), the bottom wall of the rubber sleeve (8022) is provided with an arc-shaped surface, and the rubber sleeve (8022) is movably abutted against the GPU main body (3).

5. The external GPU chip testing device according to claim 4, characterized in that an alarm (9) is connected to the outer wall of the U-shaped plate (4), and the alarm (9) is electrically connected with the temperature probe (802).

6. The external GPU chip testing device of claim 5, wherein a second motor (10) is connected to the outer wall of the U-shaped plate (4), the second motor (10) is electrically connected with the alarm (9), the output end of the second motor (10) is connected with a second rotating rod (11), one end, far away from the second motor (10), of the second rotating rod (11) penetrates through the U-shaped plate (4) and is connected with a first gear (111), a sleeve (12) is sleeved on the outer wall of the first rotating rod (501), a second gear (121) matched with the first gear (111) is connected to the outer wall of the sleeve (12), a rotating seat (122) is connected to the outer wall of the sleeve (12), and fan blades (1221) are connected to the outer wall of the rotating seat (122).

7. The external GPU chip testing device of claim 1, wherein the external heat dissipation holes (13) are uniformly distributed on the outer walls of the two sides of the testing housing (1), a dust guard (131) is connected to the outer wall of the testing housing (1), and the dust guard (131) is arranged outside the heat dissipation holes (13).

8. The external GPU chip testing device of claim 7, wherein a third rotating rod (14) is rotatably connected in the U-shaped plate (4) through a bearing, a worm wheel (141) is connected to the outer wall of the third rotating rod (14), and a worm (15) meshed with the worm wheel (141) is connected to the outer wall of the first rotating rod (501).

9. The external GPU chip testing device of claim 8, wherein two ends of the third rotating rod (14) are connected with first connecting plates (142), the outer walls of the first connecting plates (142) are rotatably connected with second connecting plates (143), one ends, far away from the first connecting plates (142), of the second connecting plates (143) are connected with moving plates (144), the bottom walls of the moving plates (144) are connected with brush plates (16), and the brush plates (16) are movably abutted to the outer walls of the dust-proof plates (131).

10. The external GPU chip testing device of claim 9, wherein a limiting frame (17) is connected to the outer wall of the testing casing (1), and the moving plate (144) is slidably connected in the limiting frame (17).