CN112835755A - Test data acquisition method, device and equipment and computer storage medium - Google Patents
Test data acquisition method, device and equipment and computer storage medium Download PDFInfo
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Abstract
The invention discloses a test data acquisition method, a test data acquisition device, test data acquisition equipment and a computer storage medium. The method is applied to data testing equipment, the data testing equipment is respectively connected with a test generating device and equipment to be tested, the test generating device is connected with the equipment to be tested, and the method comprises the following steps: generating a plurality of test instructions of the equipment to be tested, wherein the plurality of test instructions correspond to a plurality of functions to be tested of the equipment to be tested; respectively sending a plurality of test instructions to a test generating device, so that the test generating device generates test control information for testing according to the test instructions, and the equipment to be tested generates test values; acquiring a test value generated by the to-be-tested equipment according to each piece of test control information; and generating a test report of the equipment to be tested according to the test value and the preset value of each function to be tested. According to the embodiment of the invention, the problems of complex operation and low test efficiency in the existing test process can be solved.
Description
Technical Field
The invention belongs to the technical field of automatic testing, and particularly relates to a test data acquisition method, a test data acquisition device, test data acquisition equipment and a computer storage medium.
Background
In recent years, rapid development of a data acquisition system is driven along with rapid development of scientific technology, and the functional test requirement of equipment is continuously increased during equipment production or equipment repair.
At present, in a function test method for a data acquisition system, a tester tests multiple functions of equipment to be tested one by one, and in the test process, a waveform generator with high price is required to provide a standard excitation signal or a specific sensor is required to be connected to provide target input, and even other test auxiliary equipment is required to be connected. The test method is not only complex in operation process and prone to errors, but also requires a tester to have a detailed understanding of the devices to be tested, thus resulting in high time and labor costs.
Aiming at the function test process of the equipment, how to improve the efficiency of the function test or the repair test of the production line of the equipment test is an urgent problem to be solved by technical personnel in the field.
Disclosure of Invention
The embodiment of the invention provides a test data acquisition method, a test data acquisition device, test data acquisition equipment and a computer storage medium, and can solve the problems of complex operation and low test efficiency in the existing test process.
In a first aspect, an embodiment of the present invention provides a test data acquisition method, where the method is applied to a data test device, the data test device is respectively connected to a test generation device and a device to be tested, and the test generation device is connected to the device to be tested, and the method includes:
generating a plurality of test instructions of the equipment to be tested, wherein the plurality of test instructions correspond to a plurality of functions to be tested of the equipment to be tested;
respectively sending a plurality of test instructions to a test generating device, so that the test generating device generates test control information for testing according to the test instructions, and the equipment to be tested generates test values;
acquiring a test value generated by the to-be-tested equipment according to each piece of test control information;
and generating a test report of the device to be tested according to the test value and the preset value of each function to be tested, wherein the test report comprises test results of a plurality of functions to be tested in the device to be tested.
In some implementations of the first aspect, generating a plurality of test instructions for the device under test includes:
generating a target test instruction of a target function to be tested according to a preset function test sequence;
sending a target test instruction to the test generating device, so that the test generating device generates target test control information of a target function to be tested according to the target test instruction, and the equipment to be tested generates a target test value of the target function to be tested;
acquiring a target test value sent by a device to be tested;
when the obtained target test value meets a preset value of a target function to be tested, generating a test result according to the target test value and the preset value;
and generating a test instruction of the next function to be tested of the equipment to be tested according to a preset function test sequence.
In some implementation manners of the first aspect, when the target test value corresponding to the target function to be tested, which is generated by the device to be tested, does not satisfy the preset value of the target function to be tested, and the test frequency of the target function to be tested is less than the preset test frequency, the target test instruction is re-generated.
In some implementation manners of the first aspect, when the target test value corresponding to the target function to be tested, generated by the device to be tested, does not meet the preset value of the target function to be tested, and the test frequency of the target function to be tested is greater than or equal to the preset test frequency, obtaining a test result of the target function to be tested;
generating a test exception record of the target function to be tested according to the test result;
and generating a test instruction of the next function to be tested of the equipment to be tested according to a preset function test sequence.
In some implementations of the first aspect, after generating a test exception record of the target function-to-be-tested from the test results, the method further includes: and generating prompt information.
In some implementation manners of the first aspect, generating a test report of the device to be tested according to the test value and the preset value of each function to be tested, further includes:
when the testing of a plurality of functions to be tested is completed, obtaining the testing result of each function to be tested;
and generating a test report according to each test result.
In a second aspect, an embodiment of the present invention provides a test data acquisition apparatus, including:
the device comprises an instruction generating module, a function setting module and a function setting module, wherein the instruction generating module is used for generating a plurality of test instructions of the device to be tested, and the test instructions correspond to a plurality of functions to be tested of the device to be tested;
the sending module is used for respectively sending a plurality of test instructions to the test generating device so that the test generating device generates test control information for testing according to the test instructions and enables the equipment to be tested to generate test values;
the acquisition module is used for acquiring a test value generated by the equipment to be tested according to each piece of test control information;
and the report generating module is used for generating a test report of the to-be-tested equipment according to the test value and the preset value of each to-be-tested function, wherein the test report comprises test results of a plurality of to-be-tested functions in the to-be-tested equipment.
In some implementation manners of the second aspect, the instruction generating module is further configured to generate a target test instruction of the target function to be tested according to a preset function test sequence;
the sending module is further used for sending a target test instruction to the test generating device so that the test generating device generates target test control information of the target function to be tested according to the target test instruction, and the equipment to be tested generates a target test value of the target function to be tested;
the acquisition module is also used for acquiring a target test value sent by the equipment to be tested;
the report generation module is further used for generating a test result according to the target test value and a preset value when the obtained target test value meets the preset value of the target function to be tested;
and the instruction generating module is also used for generating a test instruction of the next function to be tested of the equipment to be tested according to the preset function test sequence.
In a third aspect, the present invention provides a test data acquisition apparatus, comprising: a processor and a memory storing computer program instructions; the test data acquisition method described in the first aspect or any of the realizable manners of the first aspect is implemented when the processor executes the computer program instructions.
In a fourth aspect, the present invention provides a computer-readable storage medium, on which computer program instructions are stored, and the computer program instructions, when executed by a processor, implement the test data acquisition method described in the first aspect or any one of the implementable manners of the first aspect.
The embodiment of the invention provides a test data acquisition method, wherein data test equipment can be respectively connected with a test generation device and equipment to be tested, the test generation device is connected with the equipment to be tested, in the process of test data acquisition, the data test equipment sends a test instruction to control the test generation device to generate test control information, the data test equipment automatically acquires a test value generated by the equipment to be tested according to the test control information, automatically analyzes the test value, judges whether the function of the equipment to be tested corresponding to the test value meets the preset requirement or not, after the whole test process is started, manual intervention or configuration is not needed, a test report is automatically generated after the test is finished, the labor cost and the time cost investment of a production line are effectively saved, and the test efficiency is improved.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the embodiments of the present invention will be briefly described below, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a test data acquisition system according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a test data acquisition method according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a test generation apparatus according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a test data acquisition device according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a test data acquisition device according to an embodiment of the present invention.
Detailed Description
Features and exemplary embodiments of various aspects of the present invention will be described in detail below, and in order to make objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting. It will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present invention by illustrating examples of the present invention.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
In recent years, rapid development of a data acquisition system is driven along with rapid development of scientific technology, and the functional test requirement of equipment is continuously increased during equipment production or equipment repair.
At present, in a function test method for a data acquisition system, a tester tests multiple functions of equipment to be tested one by one, and in the test process, a waveform generator with high price is required to provide a standard excitation signal or a specific sensor is required to be connected to provide target input, and even other test auxiliary equipment is required to be connected. The test method is not only complex in operation process and prone to errors, but also requires a tester to have a detailed understanding of the devices to be tested, thus resulting in high time and labor costs.
Aiming at the function test process of the equipment, how to improve the efficiency of the function test or the repair test of the production line of the equipment test is an urgent problem to be solved by technical personnel in the field.
In order to solve the problems in the prior art, embodiments of the present invention provide a method, an apparatus, a device, and a computer storage medium for collecting test data. The test data acquisition method can be applied to data test equipment, in the test data acquisition process, the data test equipment sends a test instruction to control the test generation device to generate test control information, the data test equipment automatically acquires a test value generated by the equipment to be tested according to the test control information, automatically analyzes the test value, automatically generates a test report after the test is finished, and after the whole test flow is started, manual intervention or configuration is not needed, so that the labor cost and the time cost investment of a production line are effectively saved, and the test efficiency is improved.
Fig. 1 shows a schematic structural diagram of a test data acquisition system according to an embodiment of the present invention. As shown in fig. 1, a test data acquisition system may include data testing equipment, test generation equipment, and equipment under test. The data testing equipment can be respectively connected with the test generating device and the equipment to be tested, and the test generating device is connected with the equipment to be tested.
In some embodiments, the test data acquisition method may be applied to a data testing apparatus. Illustratively, the data testing device may be an electronic device such as a computer.
As a specific embodiment, the data testing device may include a display interface, and after the data testing device is connected to the device to be tested, the display interface may display a plurality of functions to be tested of the device to be tested, where the functions to be tested may include a device application function of the device to be tested and an external interface of the device to be tested.
A communication protocol, for example, an ARM communication protocol, can be preset between the test generation device and the data test equipment, and communication is performed through a network port, wherein the communication mode can be a wireless communication mode and a wired communication mode.
The test generating device can comprise an analog quantity output channel, a switching quantity input and output channel, an analog input channel, a serial interface, a communication interface, a debugging interface and the like, and can be connected with the equipment to be tested through an external interface of the equipment to be tested. The test generation device may also include a PT100 simulator, which may be used to test the PT100 conditioning circuit.
The passing test generating device provided by the embodiment of the invention can automatically generate standard excitation information or an interface test signal of the device to be tested. Other test auxiliary equipment does not need to be connected, and an expensive waveform generator does not need to be used, so that the cost is saved.
Fig. 2 is a schematic flow chart illustrating a test data acquisition method according to an embodiment of the present invention. As shown in fig. 2, the method may include S210-S240.
S210, generating a plurality of test instructions of the device to be tested.
The plurality of test instructions correspond to a plurality of functions to be tested of the equipment to be tested.
In some embodiments, after the data testing device, the test generating device, and the device to be tested are connected one by one, an automated testing process may be entered next, specifically, the step of generating, by the data testing device, a plurality of test instructions for the device to be tested may specifically include the following steps:
s211, generating a target test instruction of a target function to be tested according to a preset function test sequence;
s212, sending the target test instruction to the test generating device.
The test generating device generates target test control information of the target function to be tested according to the received target test instruction, so that the equipment to be tested generates a target test value of the target function to be tested.
The target test control information may be an excitation signal or an interface test signal of the device to be tested. The stimulus signal may be used to detect a configured function of the device under test and the interface test signal may be used to detect an external interface of the device under test.
As a specific example, as shown in fig. 3, the test generation apparatus may include an ARM processor, and the test generation apparatus further includes: the analog output channel, the PT100 simulator, the switching value input/output channel, and the analog input channel may all be integrated in a Field Programmable Gate Array (FPGA). A plurality of analog quantity output channels can be used as signal sources to provide excitation signals for input channels of the devices to be tested. There may be multiple PT100 simulators that may be used to test the PT100 conditioning circuits in the device under test. Each PT100 simulator comprises a pure resistor, and optionally, each PT100 simulator can be designed into a plurality of gears to test different PT100 conditioning circuits respectively, so as to verify the correctness of the PT100 conditioning circuit and the acquisition circuit in the device to be tested. The switching value Input/Output channels may be multiple, and may be used to test a digital Input/Output (I/O) interface, and in the test process, test control information in the Input direction or test control information in the Output direction may be generated according to a test instruction. The analog input channel can be used as a data acquisition channel to meet the requirement of analog input voltage value acquisition.
Continuing with fig. 3, serial port-1 may be a serial communication interface based on RS232, and serial port-1 may be expanded to obtain multiple serial port-1 paths, for example, the serial port-1 paths may be expanded by a Universal Asynchronous Receiver/Transmitter (UART) interface of an ARM processor. The serial port-2 can be a serial communication interface based on RS485, the serial port-2 can be expanded, and the serial port-1 can expand a serial UART interface of the ARM processor to obtain a plurality of serial port-2 passages.
The test generation device may also include a communications interface, illustratively an ethernet communications interface may be implemented using LAN8720AI as the PHY. The test generation means may also include a debug serial port, which may be extended, for example, by the serial UART interface of the ARM processor, and convert the serial interface to a UART interface using CH 340T.
Because the test generating device is directly connected with the equipment to be tested, the test generating device directly triggers the equipment to be tested to generate a test value after generating the target test control information.
The test generation device provided by the embodiment of the invention has rich interfaces and strong expansibility, and can automatically generate test control information based on the test instruction after a test environment is prepared, thereby reducing the time required by the test, improving the test efficiency and reducing the labor cost and time input cost.
After the test generation means generates the test control information based on the test instruction, next, the data test apparatus may perform S213.
S213, acquiring a target test value sent by the device to be tested.
The data testing equipment is directly connected with the equipment to be tested, so that the equipment to be tested can directly obtain the test value after generating the test value, and execute the analysis step to judge whether the tested function passes the test.
And S214, when the obtained target test value meets the preset value of the target function to be tested, generating a test result according to the target test value and the preset value.
Next, S215 may be performed.
S215, generating a test instruction of the next function to be tested of the equipment to be tested according to the preset function test sequence.
In the embodiment of the invention, when the acquired target test value meets the preset value of the target function to be tested, the test instruction of the next function to be tested can be automatically generated until all the functions to be tested are tested.
In some embodiments, in order to improve the accuracy of testing each function of the device to be tested, when the obtained target test value corresponding to the target function to be tested generated by the device to be tested does not satisfy the preset value of the target function to be tested, and the number of times of testing the target function to be tested is less than the preset number of times of testing, S216 may be executed.
And S216, regenerating the target test instruction.
That is, the test times of each function to be tested can be set in the data test system in advance, and when the test times are less than the preset test times, the function to be tested can be tested for multiple times, so that the test accuracy is improved.
In some embodiments, when the target test value corresponding to the target function to be tested generated by the device to be tested does not satisfy the preset value of the target function to be tested and the test frequency of the target function to be tested is greater than or equal to the preset test frequency, the test result of the target function to be tested is obtained.
The test result may be an evaluation of the function to be tested, for example: functional normality, functional abnormality, etc., again without specific limitation.
And generating a test exception record of the target function to be tested according to the test result, and then generating a test instruction of the next function to be tested in the target test equipment according to a preset function test sequence.
In some embodiments, after generating the test exception record of the target function to be tested according to the test result, the data test device may further generate a prompt message.
Illustratively, when the data testing device comprises the display interface, the display interface can display a plurality of functions to be tested of the device to be tested, and red prompt information can be generated corresponding to the function display with abnormal test.
Specifically, the prompt message may include a possible reason for failure, which is convenient for the tester to troubleshoot.
It is understood that the normal function of the device to be tested after testing may correspondingly display other colors, such as green, on the display interface, so as to be distinguished from the abnormal function, and is not limited specifically herein. In the testing process, the testing progress can be displayed on the display interface.
After the data test apparatus generates the test command, S220 may be executed next.
And S220, respectively sending a plurality of test commands to the test generating device.
The test generating device can generate test control information for testing according to the test instruction, so that the equipment to be tested generates a test value.
In some implementations, the data testing apparatus may generate a test command one at a time, and may immediately send the test command to the test generation device for the test generation device to generate the test control information.
It will be appreciated that when the data test apparatus regenerates the target test instruction, the data test apparatus correspondingly sends the newly generated target test instruction to the test generation means for retrieving the target test value of the target test function.
And S230, obtaining a test value generated by the to-be-tested equipment according to each piece of test control information.
Because the test generating device is directly connected with the equipment to be tested, the test generating device directly triggers the equipment to be tested to generate a test value after generating the target test control information.
After the device to be tested generates the test value, the test value can be directly obtained by the data test device, and the analysis step is executed. That is, S240 may be performed.
S240, generating a test report of the to-be-tested equipment according to the test value and the preset value of each to-be-tested function.
The test report comprises test results of a plurality of to-be-tested functions in the to-be-tested equipment.
Specifically, when a plurality of functions to be tested are tested, a test result of each function to be tested is obtained; and generating a test report according to each test result.
In some embodiments, the data testing device may analyze the test value every time the device to be tested generates one test value, that is, the data testing device determines that the test value satisfies the preset value corresponding to the function to be tested. For example, when the predicted value corresponding to the function to be tested is satisfied, the function to be tested is normal, and the test of the function is passed.
If the function in the device to be tested is abnormal, the test report can also include detailed test time, device number, failure number, abnormal test phenomenon and the like corresponding to the abnormal function, so that professional technicians can conveniently perform positioning analysis on the problems.
According to the test data acquisition method provided by the embodiment of the invention, the data test equipment can be respectively connected with the test generation device and the equipment to be tested, and meanwhile, the test generation device is connected with the equipment to be tested, in the test data acquisition process, the data test equipment sends the test instruction to control the test generation device to generate the test control information, and the data test equipment automatically acquires the test value generated by the equipment to be tested according to the test control information, automatically analyzes the test value, judges whether the function of the equipment to be tested corresponding to the test value meets the preset requirement, does not need manual intervention or configuration after the whole test process is started, automatically generates the test report after the test is finished, effectively saves the labor cost and time cost investment of a production line, and improves the test efficiency.
Fig. 4 is a schematic structural diagram of a test data acquisition apparatus according to an embodiment of the present invention, and as shown in fig. 4, the test data acquisition apparatus 400 may include: an instruction generating module 410, a sending module 420, an obtaining module 430 and a report generating module 440.
The instruction generating module 410 is configured to generate a plurality of test instructions of a device to be tested, where the plurality of test instructions correspond to a plurality of functions to be tested of the device to be tested;
a sending module 420, configured to send a plurality of test instructions to the test generating device, respectively, so that the test generating device generates test control information for testing according to the test instructions, and enables the device to be tested to generate a test value;
an obtaining module 430, configured to obtain a test value generated by the device to be tested according to each test control information;
the report generating module 440 is configured to generate a test report of the device to be tested according to the test value and the preset value of each function to be tested, where the test report includes test results of a plurality of functions to be tested in the device to be tested.
In some embodiments, the instruction generating module is further configured to generate a target test instruction of the target function to be tested according to a preset function test sequence;
the sending module 420 is further configured to send a target test instruction to the test generating device, so that the test generating device generates target test control information of the target function to be tested according to the target test instruction, and the device to be tested generates a target test value of the target function to be tested;
the obtaining module 430 is further configured to obtain a target test value sent by the device to be tested;
the report generating module 440 is further configured to generate a test result according to the target test value and a preset value when the obtained target test value meets the preset value of the target function to be tested;
the instruction generating module 410 is further configured to generate a test instruction of a next function to be tested of the device to be tested according to a preset function test sequence.
In some embodiments, the report generating module 440 is further configured to regenerate the target test instruction when the obtained target test value corresponding to the target function to be tested, generated by the device to be tested, does not satisfy the preset value of the target function to be tested, and the test frequency of the target function to be tested is less than the preset test frequency.
In some embodiments, the report generating module 440 is further configured to obtain a test result of the target function to be tested when the obtained target test value corresponding to the target function to be tested, generated by the device to be tested, does not meet the preset value of the target function to be tested, and the test frequency of the target function to be tested is greater than or equal to the preset test frequency;
generating a test exception record of the target function to be tested according to the test result;
and generating a test instruction of the next function to be tested of the equipment to be tested according to a preset function test sequence.
In some embodiments, the test data collection apparatus may further include a prompt module for generating a prompt message.
In some embodiments, the report generating module 440 is further configured to obtain a test result of each function to be tested when the plurality of functions to be tested are tested; and generating a test report according to each test result.
It is understood that the test data acquisition apparatus 400 according to the embodiment of the present invention may correspond to an execution main body of the test data acquisition method according to the embodiment of the present invention, and specific details of operations and/or functions of each module/unit of the test data acquisition apparatus 400 may refer to the descriptions of the corresponding parts in the test data acquisition method according to the embodiment of the present invention, and are not described herein again for brevity.
According to the test data acquisition device provided by the embodiment of the invention, the test data acquisition device can be arranged in data test equipment and is respectively connected with the test generation device and the equipment to be tested, meanwhile, the test generation device is connected with the equipment to be tested, in the test data acquisition process, the test data acquisition device sends out a test instruction to control the test generation device to generate test control information, the test data acquisition device automatically acquires a test value generated by the equipment to be tested according to the test control information, the test value is automatically analyzed, whether the function of the equipment to be tested corresponding to the test value meets the preset requirement is judged, after the whole test flow is started, manual intervention or configuration is not needed, a test report is automatically generated after the test is finished, the labor cost and the time cost input of a production line are effectively saved, and the test efficiency.
Fig. 5 is a schematic diagram of a hardware structure of a test data acquisition device according to an embodiment of the present invention.
As shown in fig. 5, the test data acquisition device 500 in the present embodiment includes an input device 501, an input interface 502, a central processing unit 503, a memory 504, an output interface 505, and an output device 506. The input interface 502, the central processing unit 503, the memory 504, and the output interface 505 are connected to each other through a bus 510, and the input device 501 and the output device 506 are connected to the bus 510 through the input interface 502 and the output interface 505, respectively, and further connected to other components of the test data acquisition device 500.
Specifically, the input device 501 receives input information from the outside and transmits the input information to the central processor 503 through the input interface 502; the central processor 503 processes input information based on computer-executable instructions stored in the memory 504 to generate output information, temporarily or permanently stores the output information in the memory 504, and then transmits the output information to the output device 506 through the output interface 505; output device 506 outputs the output information to the exterior of test data acquisition device 500 for use by a user.
That is, the test data collection apparatus shown in fig. 5 may also be implemented to include: a memory storing computer-executable instructions; and a processor, which when executing the computer-executable instructions, may implement the test data acquisition method provided by embodiments of the present invention.
In one embodiment, the test data acquisition device 500 shown in FIG. 5 includes: a memory 504 for storing programs; the processor 503 is configured to run the program stored in the memory to execute the test data acquisition method provided by the embodiment of the present invention.
An embodiment of the present invention further provides a computer-readable storage medium, where the computer-readable storage medium has computer program instructions stored thereon; the computer program instructions, when executed by a processor, implement the test data acquisition method provided by embodiments of the present invention.
It is to be understood that the invention is not limited to the specific arrangements and instrumentality described above and shown in the drawings. A detailed description of known methods is omitted herein for the sake of brevity. In the above embodiments, several specific steps are described and shown as examples. However, the method processes of the present invention are not limited to the specific steps described and illustrated, and those skilled in the art can make various changes, modifications and additions or change the order between the steps after comprehending the spirit of the present invention.
The functional blocks shown in the above-described structural block diagrams may be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, it may be, for example, an electronic Circuit, an Application Specific Integrated Circuit (ASIC), suitable firmware, plug-in, function card, or the like. When implemented in software, the elements of the invention are the programs or code segments used to perform the required tasks. The program or code segments may be stored in a machine-readable medium or transmitted by a data signal carried in a carrier wave over a transmission medium or a communication link. A "machine-readable medium" may include any medium that can store or transfer information. The machine-readable medium may include electronic circuits, semiconductor Memory devices, Read-Only memories (ROMs), flash memories, Erasable Read-Only memories (EROMs), floppy disks, Compact disk Read-Only memories (CD-ROMs), optical disks, hard disks, optical fiber media, Radio Frequency (RF) links, and so forth. The code segments may be downloaded via computer networks such as the internet, intranet, etc.
It should also be noted that the exemplary embodiments mentioned in this patent describe some methods or systems based on a series of steps or devices. However, the present invention is not limited to the order of the above-described steps, that is, the steps may be performed in the order mentioned in the embodiments, may be performed in an order different from the order in the embodiments, or may be performed simultaneously.
Aspects of the present disclosure are described above with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the disclosure. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions/acts specified in the flowchart and/or block diagram block or blocks. Such a processor may be, but is not limited to, a general purpose processor, a special purpose processor, an application specific processor, or a field programmable logic circuit. It will also be understood that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware for performing the specified functions or acts, or combinations of special purpose hardware and computer instructions.
As described above, only the specific embodiments of the present invention are provided, and it can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the system, the module and the unit described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again. It should be understood that the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive various equivalent modifications or substitutions within the technical scope of the present invention, and these modifications or substitutions should be covered within the scope of the present invention.
Claims (10)
1. A test data acquisition method is characterized in that the method is applied to data test equipment, the data test equipment is respectively connected with a test generation device and equipment to be tested, the test generation device is connected with the equipment to be tested, and the method comprises the following steps:
generating a plurality of test instructions of the device to be tested, wherein the plurality of test instructions correspond to a plurality of functions to be tested of the device to be tested;
respectively sending a plurality of test instructions to the test generating device, so that the test generating device generates test control information for testing according to the test instructions, and the device to be tested generates a test value;
acquiring a test value generated by the to-be-tested equipment according to each test control information;
and generating a test report of the to-be-tested equipment according to the test value and the preset value of each to-be-tested function, wherein the test report comprises test results of a plurality of to-be-tested functions in the to-be-tested equipment.
2. The method of claim 1, wherein the generating a plurality of test instructions for the device under test comprises:
generating a target test instruction of a target function to be tested according to a preset function test sequence;
sending the target test instruction to the test generating device, so that the test generating device generates target test control information of the target function to be tested according to the target test instruction, and the device to be tested generates a target test value of the target function to be tested;
acquiring a target test value sent by the device to be tested;
when the obtained target test value meets a preset value of the target function to be tested, generating a test result according to the target test value and the preset value;
and generating a test instruction of the next function to be tested of the equipment to be tested according to the preset function test sequence.
3. The method of claim 2, further comprising:
and when the target test value which is generated by the device to be tested and corresponds to the target function to be tested does not meet the preset value of the target function to be tested and the test frequency of the target function to be tested is less than the preset test frequency, regenerating the target test instruction.
4. A method according to claim 2 or 3, characterized in that the method further comprises:
when the target test value generated by the device to be tested and corresponding to the target function to be tested does not meet the preset value of the target function to be tested and the test frequency of the target function to be tested is greater than or equal to the preset test frequency, obtaining the test result of the target function to be tested;
generating a test exception record of the target function to be tested according to the test result;
and generating a test instruction of the next function to be tested of the equipment to be tested according to the preset function test sequence.
5. The method of claim 4, after generating a test exception record for the target function-under-test from the test results, the method further comprising: and generating prompt information.
6. The method of claim 4, wherein generating a test report for the device under test according to the test value and the preset value of each function under test further comprises:
when the plurality of functions to be tested are tested, obtaining a test result of each function to be tested;
and generating the test report according to each test result.
7. A test data acquisition device, the device comprising:
the instruction generating module is used for generating a plurality of test instructions of the equipment to be tested, wherein the test instructions correspond to a plurality of functions to be tested of the equipment to be tested;
the sending module is used for respectively sending a plurality of test instructions to the test generating device so that the test generating device generates test control information for testing according to the test instructions and the equipment to be tested generates test values;
the acquisition module is used for acquiring a test value generated by the to-be-tested equipment according to each piece of test control information;
and the report generating module is used for generating a test report of the to-be-tested equipment according to the test value and the preset value of each to-be-tested function, wherein the test report comprises test results of a plurality of to-be-tested functions in the to-be-tested equipment.
8. The apparatus of claim 7,
the instruction generating module is further used for generating a target test instruction of the target function to be tested according to a preset function test sequence;
the sending module is further configured to send the target test instruction to the test generating device, so that the test generating device generates target test control information of the target function to be tested according to the target test instruction, and the device to be tested generates a target test value of the target function to be tested;
the acquisition module is further used for acquiring a target test value sent by the device to be tested;
the report generation module is further configured to generate a test result according to the target test value and the preset value when the obtained target test value meets the preset value of the target function to be tested;
the instruction generating module is further configured to generate a test instruction of a next function to be tested of the device to be tested according to the preset function test sequence.
9. A test data acquisition device, characterized in that the device comprises: a processor, and a memory storing computer program instructions;
the processor reads and executes the computer program instructions to implement the test data acquisition method of any one of claims 1-6.
10. A computer storage medium having computer program instructions stored thereon which, when executed by a processor, implement the test data acquisition method of any one of claims 1-6.
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