CN112818530B - Electromagnetic characteristic visualization method based on Processing - Google Patents
Electromagnetic characteristic visualization method based on Processing Download PDFInfo
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- 238000012545 processing Methods 0.000 title claims abstract description 25
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Abstract
The invention provides a Processing-based electromagnetic property visualization method, wherein a horizontal axis represents the length of a cross section, and a vertical axis represents the direction and the size of electromagnetic properties, so that a superconductor cross section model is constructed; calculating the space distribution of flux line density, critical current density and alternating current loss on the cross section of the superconductor based on a Bean model; and displaying the magnetic flux density distribution of the cross section, the critical current density distribution of the cross section, the alternating current loss density distribution and the alternating current loss density color distribution based on the Processing visualization. The invention has simple calculation formula, and the change of the electromagnetic property of the simulated image is clear at a glance.
Description
Technical Field
The invention relates to a data visualization technology, in particular to an electromagnetic characteristic visualization method based on Processing.
Background
The superconducting technology plays an important role in the fields of energy conservation, low-carbon economy and renewable energy. In superconductor applications, electromagnetic properties, such as critical current density and ac losses, must be properly understood. However, the visual representation of these electromagnetic properties is very difficult.
Disclosure of Invention
The invention aims to provide a Processing-based electromagnetic characteristic visualization method.
The technical solution for realizing the purpose of the invention is as follows: a Processing-based electromagnetic characteristic visualization method comprises the following steps:
and 3, visually displaying the magnetic flux density distribution, the critical current density distribution, the alternating current loss density distribution and the alternating current loss density color distribution of the cross section based on the Processing.
Further, based on a Bean model, spatial distribution of flux line density, critical current density and alternating current loss on the cross section of the superconductor is calculated, and the specific calculation method comprises the following steps:
based on a Bean model, calculating the spatial distribution of flux line density, critical current density and alternating current loss on the cross section of the superconductor, wherein the specific calculation method comprises the following steps:
establishing a Maxwell formula:
the solution formula for the ac loss is:
p=E·J (3)
wherein p represents an ac loss density;
since the bean model is used and the critical current density is constant, let:
J=α c (4)
based on equations 1, 2, and 3, the flux line density is obtained as:
δB=δ 0 B 0 -μ 0 α c x (5)
and an ac loss density of:
p=(dH 0 /dt)(δB-δ b B b ) (6)
wherein x represents the penetration depth of the flux lines, δ represents the direction of flux line density, if the positive direction δ is 1, otherwise-1, B represents the flux line density value, δ 0 Indicates the direction of an applied AC magnetic field, B 0 Represents the value of the applied alternating magnetic field, μ 0 Denotes the vacuum permeability, α c Represents the critical current density and is a known constant value, i.e. the critical current density is the slope of the flux line density, B b Denotes the turning point of the flux line density, and is b Indicates the direction of flux line density at the turning point, H 0 Representing the superconductor boundary magnetic field strength.
A Processing-based electromagnetic property visualization system is characterized in that the Processing-based electromagnetic property visualization is carried out based on the method.
A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the method for Processing based visualization of electromagnetic properties when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method for Processing-based visualization of electromagnetic properties.
Compared with the prior art, the invention has the following remarkable advantages: 1) compared with a complex electromagnetic formula, the change of the electromagnetic property of the simulated image is clear at a glance; 2) through simulation of the Bean model, experience is provided for researchers to other critical state models based on the Kim model and the like.
Drawings
FIG. 1 is a basic configuration of a superconductor according to an embodiment of the present invention, where 2d is the length of the cross section and B is the applied magnetic field.
FIG. 2 is a cross-section of a superconductor according to an embodiment of the present invention, wherein the centerline is line 0, the ends of the cross-section are symmetrical, the horizontal axis is the length of the cross-section, and the vertical axis is the value of the electromagnetic property.
Fig. 3 is a simulation diagram of one-dimensional superconducting characteristics of a superconductor cross section in a first stage, where (a) is a magnetic flux density distribution of the cross section, (b) is a critical current density distribution of the cross section, (c) is an ac loss density distribution, and (d) is an RGB image based on ac loss color.
Fig. 4 is a diagram showing a simulation of one-dimensional superconducting characteristics of a superconductor in a second stage in cross section, where (a) is a magnetic flux density distribution of the cross section, (b) is a critical current density distribution of the cross section, (c) is an ac loss density distribution, and (d) is an RGB image based on ac loss color.
Fig. 5 is a simulation diagram of one-dimensional superconducting characteristics of a cross section of a third-stage superconductor, where (a) is a magnetic flux density distribution of the cross section, (b) is a critical current density distribution of the cross section, (c) is an ac loss density distribution, and (d) is an RGB image based on ac loss color.
Fig. 6 is a simulation diagram of one-dimensional superconducting characteristics of a superconductor cross section in a fourth stage, where (a) is a magnetic flux density distribution of the cross section, (b) is a critical current density distribution of the cross section, (c) is an ac loss density distribution, and (d) is an RGB image based on ac loss color.
Fig. 7 is a diagram showing a simulation of one-dimensional superconducting characteristics of a superconductor in a cross section in a fifth stage, where (a) is a magnetic flux density distribution of the cross section, (b) is a critical current density distribution of the cross section, (c) is an ac loss density distribution, and (d) is an RGB image based on ac loss color.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The invention provides a Processing-based electromagnetic characteristic visualization method, which is characterized in that a java-language-based simulation tool Processing is used for establishing a one-dimensional model and a two-dimensional model of a superconductor, and the spatial distribution of flux density, critical current density and alternating current loss in the superconductor is shown in a simulation mode under the assumption that the outside has a changing alternating magnetic field.
Assuming that a parallel applied ac magnetic field exists outside the superconductor and the length of the superconductor is much greater than the width and height, as shown in fig. 1, only the change in the magnetic properties of the superconductor in cross section needs to be analyzed. A cross-sectional model may be constructed as shown in fig. 2, in which the horizontal axis represents the length of the cross-section and the vertical axis represents the direction and magnitude of the electromagnetic property.
establishing a Maxwell formula:
the solution formula of the ac loss is:
p=E·J (3)
the Bean model is considered as the simplest critical state model, and is a simplified model for explaining the magnetization phenomenon of the second type of superconductor, and the change curve of the model is a straight line. The actual superconductor is a non-ideal II-type superconductor. The Bean model indicates that the critical current density of a superconductor is a constant. The current density in a superconductor can only take three values, namely zero (J ═ 0) or the critical current density (J ═ α) c ). Therefore, the current density J in the magnetic field distribution region is the critical current density. + -. α c The current density in the region where there is no magnetic field distribution is zero. Because the invention uses bean model, the critical current density is constant, so order:
J=α c (4)
based on equations 1, 2, and 3, the flux line density is obtained as:
δB=δ 0 B 0 -μ 0 α c x (5)
and an ac loss density of:
p=(dH 0 /dt)(δB-δ b B b ) (6)
wherein x represents the penetration depth of the flux lines, δ represents the direction of the flux line density, if the positive direction δ is 1, otherwise it is-1, B represents the flux line density value, δ 0 Indicates the direction of an applied AC magnetic field, B 0 Represents the value of the applied alternating magnetic field, μ 0 Denotes the vacuum permeability, α c Representing the critical current density, i.e. criticalThe boundary current density is the slope of the flux line density, and p represents the AC loss density B b Representing the turning point, delta, of the flux line density b Indicates the direction of flux line density at the turning point, H 0 Representing the superconductor boundary magnetic field strength. Note: in the first stage of simulation, turning point (phase 1) B b Is absent, at this time B b Calculate for 0 substitution
And 3, programming in the Processing, and substituting the known data of the external magnetic field intensity and the critical current density to obtain the magnetic flux density distribution of the cross section, the critical current density distribution of the cross section, the alternating current loss density distribution and the alternating current loss density color distribution.
The invention also provides a system for visualizing the electromagnetic property based on the Processing, which is characterized in that the system is used for visualizing the electromagnetic property based on the Processing based on the method.
A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the method for Processing based visualization of electromagnetic properties when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method for Processing-based visualization of electromagnetic properties.
Examples
To verify the validity of the scheme of the present invention, the following simulation experiment was performed.
First, assume a fringe magnetic field B 0 80 sint. When t is gradually increased, the external magnetic field continuously changes in a sine function with the amplitude of 80. B is 0 The positive and negative of (b) indicate the direction of the magnetic field. When the applied magnetic field reaches a peak value, the magnetic field near the edge is reduced first due to the existence of the flux pinning, and the internal magnetic field is reduced later, so that a peak value is formed. The variation process is divided into five stages depending on the direction (i.e., positive and negative) of the external magnetic field and the peak magnetic field. The stage shown in fig. 3 only appears once in the simulation process, and the following four stages are changed circularly.
In the first stage, as shown in FIG. 3, where the applied field is in the positive direction, no peak field is formed because the superconductor has a symmetrical cross-section across the superconductor when only the applied field is present. The distribution of the inside of the magnetic field can be changed according to the formula 3, the external magnetic field is gradually reduced from the outside to the inside, because the critical current density is α c, and the density direction of the magnetic flux lines is kept unchanged all the time, the critical current density is α c only under the condition that the magnetic flux lines exist, and because the slopes of the left side and the right side of the density of the magnetic flux lines are opposite, the directions of the critical current densities of the two sides are also opposite. According to B 0 =μ 0 H 0 At this stage, there is no peak B b Then, the ac loss density at the flux line distribution is p ═ dH (dH) 0 And dt) B, the distribution of the AC loss is easily obtained, and the change interval of the RGB image is 0-255, wherein the color is the darkest at 0 and the color is the lightest at 255, so that the size of the AC loss density is easily represented by the change of the color. Therefore, the present invention indicates the magnitude of the ac loss with the color depth of the RGB image. The darker the color, the greater the ac loss density and vice versa.
In the second stage, as shown in fig. 4, the applied magnetic field gradually decreases from the peak value, because of the existence of the flux pinning, the peak magnetic field is formed, but the value of the applied magnetic field is still positive, only the value is decreased at this time, and the direction is still unchanged.
The distribution of the critical current density can be obtained by the slope distribution of the flux line density, and the distribution of the ac loss density p can be obtained by solving according to equation 6.
In the third stage, as shown in FIG. 5, the applied magnetic field is reduced to below 0, this time B 0 Negative, peak magnetic field B b Still positive, i.e. the direction of the applied magnetic field changes. The distribution of the critical current density can be obtained by the slope distribution of the flux line density, and the distribution of the ac loss density p can be obtained by solving according to the formula 6.
In the fourth stage, as shown in FIG. 6, the applied magnetic field increases but B is now present 0 Still negative, peak magnetic field B b Also negative, i.e. the direction of the peak magnetic field changes. By the gradient distribution of the flux line densityThe distribution of the ac loss density p can be obtained by solving the distribution of the critical current density according to equation 6.
In the fifth stage, as shown in FIG. 7, the applied magnetic field increases to a positive value, but the peak magnetic field remains negative. The distribution of the critical current density can be obtained by the slope distribution of the flux line density, and the distribution of the ac loss density p can be obtained by solving according to the formula 6.
After the fifth phase, the change is cycled from the second phase.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, and these are all within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (4)
1. A Processing-based electromagnetic characteristic visualization method is characterized by comprising the following steps:
step 1, using a horizontal axis to represent the length of a cross section, and using a vertical axis to represent the direction and the size of electromagnetic characteristics, and constructing a superconductor cross section model;
step 2, calculating the spatial distribution of flux line density, critical current density and alternating current loss on the cross section of the superconductor based on a Bean model;
step 3, visually displaying the magnetic flux density distribution, the critical current density distribution, the alternating current loss density distribution and the alternating current loss density color distribution of the cross section based on the Processing;
the method comprises the following steps of calculating the spatial distribution of flux line density, critical current density and alternating current loss on the cross section of the superconductor based on a Bean model, wherein the specific calculation method comprises the following steps:
establishing a Maxwell formula:
equation 1 represents a differential form of the law of general current, indicating that the differential of the magnetic field strength H is equal to the current density critical current density at a point, equation 2 represents a differential form of electromagnetic induction, indicating that the differential of the electric field strength E is equal to the negative of the time rate of change of the magnetic flux density B at that point;
the solution formula of the ac loss is:
p=E·J (3)
wherein p represents an ac loss density;
since the bean model is used and the critical current density is constant, let:
J=α c (4)
based on equations 1, 2, and 3, the flux line density is obtained as:
δB=δ 0 B 0 -μ 0 α c x (5)
and an ac loss density of:
p=(dH 0 /dt)(δB-δ b B b ) (6)
wherein x represents the penetration depth of the flux lines, δ represents the direction of flux line density, if the positive direction δ is 1, otherwise-1, B represents the flux line density value, δ 0 Indicates the direction of an applied AC magnetic field, B 0 Represents the value of the applied alternating magnetic field, μ 0 Denotes the vacuum permeability, α c Representing the critical current density at a known constant value, i.e. the critical current density is the slope of the flux line density, B b Represents the turning point of the flux line density, and is b Indicating a turnDirection of point flux line density, H 0 Representing the superconductor boundary magnetic field strength.
2. A Processing-based electromagnetic property visualization system, characterized in that the Processing-based electromagnetic property visualization is performed based on the method of claim 1.
3. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the method of claim 1 for Processing-based visualization of electromagnetic properties when executing the computer program.
4. A computer-readable storage medium, having stored thereon a computer program which, when executed by a processor, implements the method of claim 1 for Processing-based electromagnetic property visualization.
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