CN112816782A - Device for measuring multichannel on-resistance and insulation resistance by four-wire system - Google Patents
Device for measuring multichannel on-resistance and insulation resistance by four-wire system Download PDFInfo
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- G—PHYSICS
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- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
The invention discloses a device for measuring multi-channel on-resistance and insulation resistance in a four-wire system, which can improve the measurement precision of the multi-channel on-resistance and insulation resistance and improve the measurement stability. The technical scheme of the invention is as follows: the first switch card and the second switch card have the same structure and comprise two testing public ports and n pairs of testing bus port pairs, and the testing public ports and the testing bus port pairs in the switch cards are in gating connection; the public port is connected to the comprehensive control circuit; the test common port includes a test positive terminal and a test negative terminal. The circuit to be tested is connected between the first switch card and the second switch card. The comprehensive control circuit is used for adjusting the input of a test control signal of the test positive terminal on one hand, and is also used for obtaining the output of a test signal of the test negative terminal on the other hand. The data card is an AD sampling card and is used for carrying out AD sampling on the test signals acquired by the comprehensive control end and outputting the test signals. The measuring and controlling computer is used for controlling the comprehensive control circuit and the data card.
Description
Technical Field
The invention relates to the technical field of automatic measurement and control, in particular to a device for measuring multi-channel on-resistance and insulation resistance in a four-wire system.
Background
At present, on occasions where multi-channel continuous measurement of on-resistance and insulation resistance is needed, the problem that the measurement accuracy of the on-resistance of similar devices is not high in the actual use process is mainly solved. In the existing multi-channel on-resistance and insulation resistance test system, a two-wire system resistance measurement mode is generally adopted, the on-resistance measurement and the insulation resistance measurement share a test circuit, and the measurement mode switching is completed through a circuit.
The two-wire system device for measuring the multi-channel on-resistance and the insulation resistance generally comprises a computer, an analog signal sampling circuit, a low-voltage constant current source, a high-voltage excitation source, a current-limiting resistor, a standard resistor, a mode switching circuit, a 2-wire multi-way switch matrix circuit, a test bus interface, a feedback and voltage sampling circuit and the like. The test result of the device is influenced by the internal resistance of the test circuit and the relay matrix circuit, the actual measurement error is large, and the actual measurement error changes along with time.
Therefore, the problems of large measurement error and low measurement stability exist in the prior art aiming at occasions needing to continuously measure the multi-channel on-resistance and the insulation resistance.
Disclosure of Invention
In view of this, the invention provides a device for measuring multi-channel on-resistance and insulation resistance in a four-wire system, which can improve the measurement accuracy of the multi-channel on-resistance and insulation resistance and improve the measurement stability.
In order to achieve the purpose, the technical scheme of the invention is as follows: a device for measuring multi-channel on-resistance and insulation resistance in a four-wire system comprises a measurement and control computer, a data card, a comprehensive control circuit, a first switch card, a second switch card and a circuit to be measured.
The first switch card and the second switch card have the same structure, the front end comprises two testing public ports, the rear end comprises n pairs of testing bus port pairs, and the testing public ports and the testing bus port pairs in the switch cards are in gating connection; a test common port is connected to the integrated control circuit; the testing public port comprises a testing positive end and a testing negative end, wherein the testing positive end is used for inputting a testing signal, and the testing negative end is used for outputting the testing signal; one test bus port pair corresponds to one channel, and n is the total number of channels.
One end of the tested circuit is connected with a pair of test bus ports on the first switch card, and the other end of the tested circuit is connected with a pair of test bus ports on the second switch card.
The comprehensive control circuit is used for adjusting the input of a test control signal of the test positive terminal on one hand, and is also used for obtaining the output of a test signal of the test negative terminal on the other hand.
The data card is an AD sampling card and is used for carrying out AD sampling on the test signals acquired by the comprehensive control end and outputting the test signals.
The measuring and controlling computer is used for controlling the comprehensive control circuit and the data card.
Further, the comprehensive control circuit comprises a 250V power supply, a constant current source, an attenuator, a differential amplifier, a signal isolator, a first switch, a second switch and a resistor.
The first change-over switch is a single-pole double-throw switch and comprises a movable end and two immovable ends, and the movable end of the first change-over switch is connected with the test positive end COM1+ of the first switch card; one of the fixed terminals of the first switch is connected 250 to the power source through a first resistor, and the other fixed terminal of the first switch is connected to the constant current source through a second resistor.
The second change-over switch is a single-pole double-throw switch and comprises a movable end and two immovable ends, and the movable end of the second change-over switch is connected with the test positive end COM2+ of the second switch card; two fixed ends of the second change-over switch are grounded through a third resistor and a fourth resistor respectively.
A 250V power supply is connected with an attenuator; the attenuator leads out a first test signal sampling end.
The test negative terminal COM 1-of the first switch card and the test negative terminal COM 2-of the second switch card are both connected with the input end of the signal isolator.
The output end of the signal isolator is connected with a differential amplifier; and the output end of the differential amplifier leads out a second test signal sampling end.
And the second change-over switch is connected with the immobile end of the third resistor to lead out a third test signal sampling end, and the second change-over switch is connected with the immobile end of the fourth resistor to lead out a fourth test signal sampling end.
The first to fourth test signal sampling ends are connected to the AD sampling card.
Further, the first resistance is 1M Ω, the second resistance is 50 Ω, the third resistance is 50 Ω, and the fourth resistance is 10k Ω.
Furthermore, the measurement and control computer controls the first change-over switch to be connected to the second resistor in a switching mode, and the second change-over switch is connected to the third resistor in a switching mode; and obtaining the on-resistance detection circuit of the tested line.
Excitation current loop of on-resistance detection circuit: the constant current source → the second resistor → the first switch → the testing positive terminal COM1+ of the first switch card → the testing bus port pair of the channel selected by the first switch card → the line under test → the testing bus port pair of the channel selected by the second switch card → the testing positive terminal COM2+ of the second switch card → the third resistor → the power ground.
And the third test signal sampling end outputs the detection current of the tested line, and the detection current is acquired by the AD sampling card and is sent to the test and control computer.
The test negative terminal COM 1-of the first switch card and the test negative terminal COM 2-of the second switch card output feedback voltages, the detection voltages of the line to be tested are obtained after differential processing is carried out through a differential amplifier, the detection voltages are output through a second test signal sampling terminal, and the detection voltages are acquired by an AD sampling card and are sent to a test control computer.
And the test control computer calculates the on-resistance test value of the tested line according to the detection voltage and the detection current of the tested line.
Furthermore, the measurement and control computer controls the first switch to be connected to the first resistor in a switching mode, and the second switch to be connected to the fourth resistor in a switching mode.
The insulation resistance test loop is obtained: the 250V power supply → the first resistor → the first change-over switch → the testing positive terminal of the first switch card → the positive terminal of the testing bus port pair corresponding to the channel selected by the first switch card → the circuit to be tested → the positive terminal of the testing bus port pair corresponding to the channel selected by the second switch card → the testing positive terminal of the second switch card → the second change-over switch → the fourth resistor → the power ground.
At the moment, the detection current of the tested circuit is obtained at the sampling end of the fourth test signal; and obtaining a test value of the insulation resistor according to the resistance values of the 250V power supply, the first resistor and the fourth resistor.
Has the advantages that:
the device for measuring the multi-channel on-resistance and the insulation resistance in the four-wire system can achieve the effect of testing the voltage and the current of the tested line by arranging the multi-channel switch card, can realize the respective measurement of the on-resistance and the insulation resistance of the tested line under the condition that the circuit structure is not changed by arranging the change-over switch, has a simple structure, can eliminate the influence of the internal resistance of the measuring line and the multi-channel switch matrix line on the measuring result of the on-resistance, and has the effects of remarkably improving the measuring precision of the multi-channel on-resistance, and improving the longer-time measuring stability of the system and the credibility of the measuring result.
Drawings
Fig. 1 is a block diagram of a four-wire system apparatus for measuring multi-channel on-resistance and insulation resistance according to an embodiment of the present invention.
Fig. 2 is a detailed composition diagram of a four-wire system device for measuring multi-channel on-resistance and insulation resistance according to an embodiment of the present invention;
FIG. 3 is a block diagram of an implementation of the solution of the invention;
FIG. 4 is a schematic diagram of a set of 32-core test buses formed by combining 64 output signals of a switch card
Detailed Description
The invention is described in detail below by way of example with reference to the accompanying drawings.
An embodiment of the invention provides a four-wire system device for measuring multichannel on-resistance and insulation resistance, a schematic block diagram of the composition and connection relation of a specific embodiment of the device is shown in fig. 1, and the device comprises the following parts: the testing and controlling device comprises a testing and controlling computer, a data card, a comprehensive control circuit, a first switch card, a second switch card and a tested circuit.
The first switch card and the second switch card have the same structure, the front end comprises two testing public ports, and the rear end comprises n pairs of testing bus port pairs; the testing public port is in gating connection with the testing bus port pair, and the testing public port is connected to the comprehensive control circuit; the testing public port comprises a testing positive end and a testing negative end, wherein the testing positive end is used for inputting the testing control signal, and the testing negative end is used for outputting the testing signal; one test bus port pair corresponds to one channel, and n is the total number of channels.
One end of the tested circuit is connected with a pair of test bus ports on the first switch card, and the other end of the tested circuit is connected with a pair of test bus ports on the second switch card.
The comprehensive control circuit is used for adjusting the input of a test control signal of the test positive terminal on one hand, and is also used for obtaining the output of a test signal of the test negative terminal on the other hand.
The data card is an AD sampling card and is used for carrying out AD sampling on the test signals acquired by the comprehensive control end and outputting the test signals.
The measuring and controlling computer is used for controlling the comprehensive control circuit and the data card.
The integrated control circuit of the present invention can be realized in such a manner that, as shown in fig. 2, the integrated control circuit includes a 250V power supply, a constant current source, an attenuator, a differential amplifier, a signal isolator, a first switch, a second switch and a resistor.
The first change-over switch is a single-pole double-throw switch and comprises a movable end and two immovable ends, and the movable end of the first change-over switch is connected with the test positive end COM1+ of the first switch card; one of the fixed terminals of the first switch is connected 250 to the power source through a first resistor, and the other fixed terminal of the first switch is connected to the constant current source through a second resistor.
The second change-over switch is a single-pole double-throw switch and comprises a movable end and two immovable ends, and the movable end of the second change-over switch is connected with the test positive end COM2+ of the second switch card; two fixed ends of the second change-over switch are grounded through a third resistor and a fourth resistor respectively.
A 250V power supply is connected with an attenuator; the attenuator leads out a first test signal sampling end.
The test negative terminal COM 1-of the first switch card and the test negative terminal COM 2-of the second switch card are both connected with the input end of the signal isolator.
The output end of the signal isolator is connected with a differential amplifier; and the output end of the differential amplifier leads out a second test signal sampling end.
And the second change-over switch is connected with the immobile end of the third resistor to lead out a third test signal sampling end, and the second change-over switch is connected with the immobile end of the fourth resistor to lead out a fourth test signal sampling end.
The first to fourth test signal sampling ends are connected to the AD sampling card and used as sampling ends of the AD sampling card.
As shown in fig. 2, in the embodiment of the present invention, the first resistance is 1M Ω, the second resistance is 50 Ω, the third resistance is 50 Ω, and the fourth resistance is 10k Ω.
According to the device for measuring the multi-channel on-resistance and the multi-channel insulation resistance in the four-wire system, the switching positions of the first change-over switch and the second change-over switch are controlled through the measurement and control computer, so that the on-resistance and the insulation resistance are measured respectively.
The measurement and control computer controls the first change-over switch to be connected to the second resistor in a switching mode, and the second change-over switch is connected to the third resistor in a switching mode; and obtaining the on-resistance detection circuit of the tested line.
The detection principle of the on-resistance is as follows: the current excitation of a test loop is carried out by a second auxiliary resistor, namely a 50-ohm precision resistor through a constant current source, the current value of the constant current source is monitored through the sampling of a third resistor standard resistor and the A/D sampling, and the feedback voltage Ux is measured through a differential signal amplification and A/D sampling circuit; and calculating the measured voltage Ux and the constant current source current value I to obtain an on-resistance value (Rx ═ Ux/I), and switching the test line by the first switch card and the second switch card.
Excitation current loop of on-resistance detection circuit: the constant current source → the second resistor → the first switch → the testing positive terminal COM1+ of the first switch card → the testing bus port pair of the channel selected by the first switch card → the line under test → the testing bus port pair of the channel selected by the second switch card → the testing positive terminal COM2+ of the second switch card → the third resistor → the power ground;
the third test signal sampling end outputs the detection current of the tested line, and the detection current is acquired by the AD sampling card and is sent to the test control computer;
the test negative terminal COM 1-of the first switch card and the test negative terminal COM 2-of the second switch card output feedback voltages, the detection voltages of the line to be tested are obtained after differential processing is carried out through a differential amplifier, the detection voltages are output through a second test signal sampling terminal, and the detection voltages are acquired by an AD sampling card and are sent to a test control computer;
and the test control computer calculates the on-resistance test value of the tested line according to the detection voltage and the detection current of the tested line.
The measurement and control computer controls the first change-over switch to be connected to the first resistor in a switching mode, and the second change-over switch is connected to the fourth resistor in a switching mode; at this time, an insulation resistance test loop is obtained.
Insulation resistance detection principle: the insulation resistance of a selected line of a tested line is measured through a 250V direct current power supply, an auxiliary first resistor and an A/D sampling circuit, the measurement result is obtained through conversion of an A/D sampling voltage value Ux2, an excitation voltage value and a standard resistor (Rx is 250/I-1.01M omega, wherein I is Ux2/10k omega), and the test line switching is completed through a first switch card and a second switch card which are resistant to high voltage.
The insulation resistance test loop is as follows: 250V power supply → first resistor → first change-over switch → first switch card test positive terminal → positive terminal of test bus port pair corresponding to channel selected by first switch card → tested line →
The positive end of the test bus port pair corresponding to the channel selected by the second switch card → the test positive end of the second switch card → the second diverter switch → the fourth resistor → the power ground.
At the moment, the detection current of the tested circuit is obtained at the sampling end of the fourth test signal; and obtaining a test value of the insulation resistor according to the resistance values of the 250V power supply, the first resistor and the fourth resistor.
Measurement mode conversion: by controlling the on and off of the first changeover switch and the second changeover switch, the on-resistance detection mode and the insulation resistance detection mode can be switched. The two modes share a test line switching loop; and under the insulation resistance detection mode, the feedback voltage difference amplifying circuit is disconnected with the test loop.
The above scheme of the present invention can also be realized by the structure as shown in fig. 3: the system comprises a PXI bus case (1), a zero-slot controller (2), a multifunctional data acquisition card (3), two dual-channel multi-channel switch cards (4), an integrated control circuit board (5), a combined power supply (6), a test bus interface (7), measurement and control software (8), an integrated control box (9) and the like.
The PXI bus case is used for installing computer board cards of standard PXI interfaces such as a zero slot controller, a multifunctional data acquisition card and a multi-way switch card; the model selected in this embodiment is AMC57105B, which is an 18-slot PXI bus chassis.
(2) The PXI zero slot controller is used for operating an operating system, a board card driver, measurement and control software and the like and is a core component of the measurement and control computer; the model selected in this embodiment is AMC4198, which includes 2 network ports, 4 USB ports, 2 RS232 serial ports, etc.
(3) The multifunctional data acquisition card is used for realizing butt joint with the comprehensive control circuit board, realizing multi-path voltage signal acquisition, and completing the functions of measurement mode switching, on-resistance measurement, insulation resistance measurement and the like by matching with measurement and control software and the comprehensive control circuit board; the model selected in this embodiment is AMC4374, which includes 32-way 16-bit AI, 4-way AO, and 48-way DIO.
(4) The device comprises a two-channel multi-channel switch card, a switch card 1 and a switch card 2 in the figure, namely a first switch card and a second switch card, and is used for realizing two groups of external test bus interfaces, wherein four public ports of the two-channel multi-channel switch card are respectively connected with a measurement interface of a comprehensive control circuit board to complete the loop functions of current excitation, voltage feedback and the like in four-wire system measurement; the present embodiment selects model AMC4611B, a 2-wire switch with 32-way 2A, etc.
(5) The integrated control circuit board is used for being matched with the measurement and control software and the multifunctional data acquisition card to specifically realize a measurement mode switching circuit, an on-resistance measurement circuit, an insulation resistance measurement circuit and the like; the integrated control circuit board of the embodiment is self-made and mainly completes partial functions of a constant current source circuit, a high-voltage excitation voltage source circuit, a 4-wire system on-resistance measuring circuit, an insulation resistance measuring circuit, a measuring mode switching circuit and the like in a principle schematic diagram 2; the model of the relay used for mode switching is JZC-102M/015.
(6) The combined power supply is used for providing power supply required by work for the measurement and control computer, the comprehensive control circuit board and the like; the power supply types include a +5V power supply, a +24V power supply, a +/-12V power supply and the like.
(7) And the test bus interface is used for realizing an external test interface, and a test bus interface signal is formed by combining the outgoing lines of the two double-channel switch cards. FIG. 4 illustrates the principle of combining the 64 output signals of a switch card to form a set of 32-core test buses; leading-out signals CH0+ and CH 0-of the switch card are combined into a test bus No. 1 line in parallel, signals CH31+ and CH 31-are combined into a test bus No. 32 line, and the rest signals are analogized; the same applies to the case where another switch card is combined into another set of test buses. The embodiment finally completes the test bus socket with two groups of 32 cores on the left/right, and can complete the on-line continuous test of the multi-core cable or equipment within 32 paths, namely, the total number n of the channels of the switch card is 32.
(8) And the measurement and control software is used for selecting a test object, setting parameters, completing the automatic and continuous measurement of the multi-path on-resistance and the insulation resistance, displaying a test result and the like.
(9) And the comprehensive control box is used for installing a combined power supply, a comprehensive control circuit board, a test bus interface socket and the like.
The connection relationship among the components is as follows: a zero slot controller, a multifunctional data acquisition card, a multi-way switch card and the like are arranged on a PXI bus interface cabinet, measurement and control software is arranged on the zero slot controller, and a combined power supply, a comprehensive control circuit board, a test bus socket and the like are arranged on a comprehensive control box; the comprehensive control circuit board is connected with the multifunctional data acquisition card through a special shielded cable; the multi-way switch card is connected with the test bus socket through a special cable.
The specific working process of the device/system is as follows:
running measurement and control software on a zero slot controller of a PXI main control computer, respectively selecting and switching on one relay of two (four) multi-way switch cards by the software in the test process, and connecting a tested circuit connected with a (mounted on a (nine) comprehensive control box (CCC)) test bus socket to a (fifthly) comprehensive control circuit board through four public ends of the (four) two switch cards; the working power supply (such as +5V and +24V power supply) required on the comprehensive control circuit board is directly provided by the combined power supply module, and other types of power supplies (such as constant current source and high voltage power supply) are obtained by circuit conversion. And the measurement and control software calls a driving program of the multifunctional data acquisition card to obtain voltage data of corresponding positions on the comprehensive control panel, and the voltage data and the feedback voltage data are obtained after conversion, so that the on-resistance or the insulation resistance value of the tested line is calculated.
In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. A device for measuring multi-channel on-resistance and insulation resistance in a four-wire system is characterized by comprising a measuring and controlling computer, a data card, a comprehensive control circuit, a first switch card, a second switch card and a tested circuit;
the first switch card and the second switch card have the same structure, the front end comprises two testing public ports, the rear end comprises n pairs of testing bus port pairs, and the testing public ports and the testing bus port pairs in the switch cards are in gating connection; the test common port is connected to the integrated control circuit; measuring
The testing public port comprises a testing positive end and a testing negative end, wherein the testing positive end is used for inputting a testing signal, and the testing negative end is used for outputting the testing signal; a pair of test bus ports corresponds to one channel, and n is the total number of the channels;
one end of the tested circuit is connected with a pair of test bus port pairs on the first switch card, and the other end of the tested circuit is connected with a pair of test bus port pairs on the second switch card;
the comprehensive control circuit is used for adjusting the input of a test control signal of the test positive terminal on one hand and obtaining the output of a test signal of the test negative terminal on the other hand;
the data card is an AD sampling card and is used for carrying out AD sampling on the test signal acquired by the comprehensive control end and outputting the test signal;
the measurement and control computer is used for controlling the comprehensive control circuit and the data card.
2. The apparatus of claim 1, wherein the integrated control circuit comprises a 250V power supply, a constant current source, an attenuator, a differential amplifier, a signal isolator, first and second switches, and a resistor;
the first change-over switch is a single-pole double-throw switch and comprises a movable end and two immovable ends, and the movable end of the first change-over switch is connected with the test positive end COM1+ of the first switch card; one of the fixed ends of the first change-over switch is connected with a power supply 250 through a first resistor, and the other fixed end of the first change-over switch is connected with a constant current source through a second resistor;
the second change-over switch is a single-pole double-throw switch and comprises a movable end and two immovable ends, and the movable end of the second change-over switch is connected with the test positive end COM2+ of the second switch card; two fixed ends of the second change-over switch are grounded through a third resistor and a fourth resistor respectively;
the 250V power supply is connected with the attenuator; the attenuator leads out a first test signal sampling end;
the test negative terminal COM 1-of the first switch card and the test negative terminal COM 2-of the second switch card are both connected with the input end of the signal isolator;
the output end of the signal isolator is connected with the differential amplifier; a second test signal sampling end is led out from the output end of the differential amplifier;
the second change-over switch is connected with the immobile end of the third resistor to lead out a third test signal sampling end, and the second change-over switch is connected with the immobile end of the fourth resistor to lead out a fourth test signal sampling end;
the first to fourth test signal sampling ends are connected to the AD sampling card.
3. The apparatus of claim 2, wherein the first resistance is 1 Μ Ω, the second resistance is 50 Ω, the third resistance is 50 Ω, and the fourth resistance is 10k Ω.
4. The apparatus of claim 3, wherein the measurement and control computer controls the first switch to switch connection to a second resistor, the second switch to switch connection to the third resistor; obtaining an on-resistance detection circuit of the tested circuit;
excitation current loop of on-resistance detection circuit: the constant current source → the second resistor → the first switch → the testing positive terminal COM1+ of the first switch card → the testing bus port pair of the channel selected by the first switch card → the line under test → the testing bus port pair of the channel selected by the second switch card → the testing positive terminal COM2+ of the second switch card → the third resistor → the power ground;
the third test signal sampling end outputs the detection current of the tested line, and the detection current is acquired by the AD sampling card and is sent to the test control computer;
the test negative terminal COM 1-of the first switch card and the test negative terminal COM 2-of the second switch card output feedback voltages, the detection voltages of the line to be tested are obtained after differential processing is carried out through a differential amplifier, the detection voltages are output through a second test signal sampling terminal, and the detection voltages are acquired by the AD sampling card and are sent to a test control computer;
and the test control computer calculates the on-resistance test value of the tested line according to the detection voltage and the detection current of the tested line.
5. The apparatus of claim 3, wherein the measurement and control computer controls the first switch to be switchably connected to a first resistor, and the second switch to be switchably connected to the fourth resistor;
the insulation resistance test loop is obtained: the 250V power supply → the first resistor → the first change-over switch → the testing positive terminal of the first switch card → the positive terminal of the testing bus port pair corresponding to the channel selected by the first switch card → the circuit to be tested → the positive terminal of the testing bus port pair corresponding to the channel selected by the second switch card → the testing positive terminal of the second switch card → the second change-over switch → the fourth resistor → the power ground;
at the moment, the detection current of the tested circuit is obtained at the sampling end of the fourth test signal; and obtaining a test value of the insulation resistor according to the resistance values of the 250V power supply, the first resistor and the fourth resistor.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114113791A (en) * | 2021-11-30 | 2022-03-01 | 北京邦卓尔微电子有限公司 | System and method for testing insulation resistance and on-resistance of connector |
| CN114264879A (en) * | 2021-12-13 | 2022-04-01 | 航天新长征大道科技有限公司 | Insulation resistance and on-resistance measuring device and system |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114113791A (en) * | 2021-11-30 | 2022-03-01 | 北京邦卓尔微电子有限公司 | System and method for testing insulation resistance and on-resistance of connector |
| CN114113791B (en) * | 2021-11-30 | 2022-06-10 | 北京邦卓尔微电子有限公司 | System and method for testing insulation resistance and on-resistance of connector |
| CN114264879A (en) * | 2021-12-13 | 2022-04-01 | 航天新长征大道科技有限公司 | Insulation resistance and on-resistance measuring device and system |
| CN116819309A (en) * | 2023-08-31 | 2023-09-29 | 中核控制系统工程有限公司 | Standardized testing device and method for on-resistance of relay sampling switch product |
| CN116819309B (en) * | 2023-08-31 | 2023-11-21 | 中核控制系统工程有限公司 | Standardized testing device and method for on-resistance of relay sampling switch product |
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