CN112798918A - Test system and test method - Google Patents
Test system and test method Download PDFInfo
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- CN112798918A CN112798918A CN202011604586.4A CN202011604586A CN112798918A CN 112798918 A CN112798918 A CN 112798918A CN 202011604586 A CN202011604586 A CN 202011604586A CN 112798918 A CN112798918 A CN 112798918A
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- 238000012360 testing method Methods 0.000 title claims abstract description 62
- 238000010998 test method Methods 0.000 title claims abstract description 9
- 238000004458 analytical method Methods 0.000 claims abstract description 51
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 17
- 238000001816 cooling Methods 0.000 claims description 16
- 238000004088 simulation Methods 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 10
- 230000001939 inductive effect Effects 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2619—Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
Abstract
The embodiment of the invention provides a test system and a test method. Acquiring a low-voltage current value of a low-voltage power supply, a current value of alternating current output by a motor controller, a direct-current voltage value between a first line and a second line and a temperature value of an Insulated Gate Bipolar Transistor (IGBT) of the motor controller through a data acquisition and analysis processor; judging whether the low-voltage current value is within a first set range, whether the current value is within a second set range, whether the direct-current voltage value is within a third set range and whether the temperature value is within a fourth set range; if the first condition is judged to be established, the second condition is established, the third condition is established and the fourth condition is established, the test is determined to be successful, wherein the first condition comprises that the low-voltage current value is located in a first set range, the second condition comprises that the current value is located in a second set range, the third condition comprises that the direct-current voltage value is located in a third set range, and the fourth condition comprises that the temperature value is located in a fourth set range.
Description
[ technical field ] A method for producing a semiconductor device
The invention relates to the technical field of vehicles, in particular to a test system and a test method.
[ background of the invention ]
The test system in the related art is complex, comprises a direct current power supply, a measurement system, a control system and an assembly rack system, and cannot realize automatic test, so that the test time is long, and the test efficiency is low.
[ summary of the invention ]
In view of this, embodiments of the present invention provide a test system and a test method, so as to improve test efficiency.
In one aspect, an embodiment of the present invention provides a test system, including: the low-voltage power supply is connected with the motor controller, the data acquisition and analysis processor is connected with the first line, the data acquisition and analysis processor is connected with the second line, and the data acquisition and analysis processor is connected with the motor controller;
the low-voltage power supply is used for supplying power to the motor controller;
the direct current power supply is used for providing direct current for the motor controller;
and the motor controller is used for converting the direct current output by the direct current power supply into alternating current and outputting the alternating current to the inductance simulation load.
Optionally, the method further comprises: the water cooling machine is connected with the motor controller;
the water cooling machine is used for providing cooling circulating water for the motor controller.
Optionally, the method further comprises: the water cooling machine is connected with the PLC, the PLC is connected with the direct-current power supply, the PLC is connected with the low-voltage power supply, and the PLC is connected with the data acquisition analysis processor;
and the PLC is used for indicating the operation of the direct current power supply, the motor controller, the inductance analog load, the low-voltage power supply, the water cooling machine and the data acquisition analysis processor according to the stored operation logic.
Optionally, the method further comprises: the relay is connected with the motor controller and the inductive simulation load;
the inductance simulation load is also used for converting electric energy provided by the alternating current into heat energy;
the relay is used for opening or closing a path for outputting the alternating current to the inductance simulation load.
In another aspect, an embodiment of the present invention provides a test method based on the test system, including:
the data acquisition analysis processor acquires a low-voltage current value of the low-voltage power supply, a current value of alternating current output by the motor controller, a direct-current voltage value between the first line and the second line and a temperature value of an Insulated Gate Bipolar Transistor (IGBT) of the motor controller;
the data acquisition analysis processor judges whether the low-voltage current value is in a first set range, whether the current value is in a second set range, whether the direct-current voltage value is in a third set range and whether the temperature value is in a fourth set range;
and if the data acquisition and analysis processor judges that a first condition is established, a second condition is established, a third condition is established and a fourth condition is established, the successful test is determined, wherein the first condition comprises that the low-voltage current value is positioned in a first set range, the second condition comprises that the current value is positioned in a second set range, the third condition comprises that the direct-current voltage value is positioned in a third set range, and the fourth condition comprises that the temperature value is positioned in a fourth set range.
Optionally, the method further comprises:
and if the data acquisition and analysis processor judges that any one of the first condition, the second condition, the third condition and the fourth condition is not satisfied, determining that the test fails.
Optionally, the test failure comprises:
the data acquisition and analysis processor sends an error instruction to the PLC;
the PLC responds to the error instruction and sends a first power-off instruction to the direct-current power supply;
and the direct current power supply is powered off in response to the first power-off instruction.
Optionally, after determining that the test fails, the method further includes:
the data acquisition and analysis processor sends an error instruction to the PLC;
the PLC responds to the error instruction and sends a second power-off instruction to the low-voltage power supply;
the low-voltage power supply is powered off in response to the second power-off command.
In the technical scheme of the testing method provided by the embodiment of the invention, a data acquisition analysis processor is used for acquiring the low-voltage current value of a low-voltage power supply, the current value of alternating current output by a motor controller, the direct-current voltage value between a first line and a second line and the temperature value of an insulated gate bipolar transistor IGBT of the motor controller; judging whether the low-voltage current value is within a first set range, whether the current value is within a second set range, whether the direct-current voltage value is within a third set range and whether the temperature value is within a fourth set range; if the first condition is judged to be established, the second condition is established, the third condition is established and the fourth condition is established, the test is determined to be successful, wherein the first condition comprises that the low-voltage current value is located in a first set range, the second condition comprises that the current value is located in a second set range, the third condition comprises that the direct-current voltage value is located in a third set range, and the fourth condition comprises that the temperature value is located in a fourth set range. The technical scheme provided by the embodiment of the invention simplifies the test system and improves the test efficiency.
[ description of the drawings ]
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive labor.
FIG. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention;
FIG. 2 is a flow chart of a testing method according to an embodiment of the present invention;
fig. 3 is a flowchart of another testing method according to an embodiment of the present invention.
[ detailed description ] embodiments
For better understanding of the technical solutions of the present invention, the following detailed descriptions of the embodiments of the present invention are provided with reference to the accompanying drawings.
It should be understood that the described embodiments are only some embodiments of the invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terminology used in the embodiments of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in the examples of the present invention and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be understood that the term "and/or" as used herein is merely one type of associative relationship that describes an associated object, meaning that three types of relationships may exist, e.g., A and/or B, may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
An embodiment of the present invention provides a test system, and fig. 1 is a schematic structural diagram of the test system provided in the embodiment of the present invention, as shown in fig. 1, the system includes: direct current power supply 1, machine controller 2, inductance analog load 3, low voltage power supply 4 and data acquisition analysis processor 5, direct current power supply 1 passes through first line connection with machine controller 2, direct current power supply 1 passes through the second line connection with machine controller 2, machine controller 2 is connected with inductance analog load 3, low voltage power supply 4 is connected with machine controller 2, data acquisition analysis processor 5 is connected with first line connection, data acquisition analysis processor 5 is connected with the second line, data acquisition analysis processor 5 is connected with machine controller 2.
The low voltage power supply 4 is used to power the motor controller 2.
The dc power supply 1 is used to supply dc power to the motor controller 2.
The motor controller 2 is configured to convert the dc power output by the dc power supply 1 into ac power and output the ac power to the inductance simulation load 3.
In the embodiment of the present invention, the dc power supply 1 includes a three-phase power supply.
In the embodiment of the present invention, the data acquisition and analysis processor 5 is connected to the motor Controller 2 through a Controller Area Network (CAN).
In the embodiment of the present invention, the ac power includes a three-phase ac power, and the motor controller 2 can output the three-phase ac power to the inductance simulation load 3.
In the embodiment of the present invention, the system further includes: and the water cooler 6 is connected with the motor controller 2.
The water cooler 6 is used for providing cooling circulating water for the motor controller 2.
In the embodiment of the invention, the water cooling machine 6 provides cooling circulating water for the motor controller 2 so as to dissipate heat of the motor controller 2.
In the embodiment of the present invention, the system further includes: programmable Logic Controller (PLC) 7, water-cooling machine 6 are connected with PLC 7, PLC 7 is connected with DC power supply 1, PLC 7 is connected with low voltage power supply 4, PLC 7 is connected with data acquisition analysis processor 5.
The PLC 7 is used for indicating the operation of the direct current power supply 1, the motor controller 2, the inductance analog load 3, the low-voltage power supply 4, the water cooling machine 6 and the data acquisition analysis processor 5 according to the stored operation logic.
In the embodiment of the invention, the operation logic comprises the operation rules among the direct current power supply 1, the motor controller 2, the inductance analog load 3, the low-voltage power supply 4, the water cooling machine 6 and the data acquisition analysis processor 5, so that the PLC can realize automatic test.
In the embodiment of the present invention, the PLC 7 is further configured to adjust a dc current magnitude and a dc current frequency output by the dc power supply 1. For example, the PLC 7 can adjust the dc current output from the dc power supply 1 to 250A and adjust the dc current frequency to 150 HZ.
In the embodiment of the present invention, the system further includes: and the relay 8 is connected with the motor controller 2, and the relay 8 is connected with the inductance simulation load 3.
The inductive analogue load 3 is also used for converting electric energy provided by alternating current into heat energy.
The relay 8 is used to open or close a path for outputting the alternating current to the inductive dummy load 3.
In the technical scheme provided by the embodiment of the invention, a data acquisition and analysis processor is used for acquiring the low-voltage current value of a low-voltage power supply, the current value of alternating current output by a motor controller, the direct-current voltage value between a first line and a second line and the temperature value of an Insulated Gate Bipolar Transistor (IGBT) of the motor controller; judging whether the low-voltage current value is within a first set range, whether the current value is within a second set range, whether the direct-current voltage value is within a third set range and whether the temperature value is within a fourth set range; if the first condition is judged to be established, the second condition is established, the third condition is established and the fourth condition is established, the test is determined to be successful, wherein the first condition comprises that the low-voltage current value is located in a first set range, the second condition comprises that the current value is located in a second set range, the third condition comprises that the direct-current voltage value is located in a third set range, and the fourth condition comprises that the temperature value is located in a fourth set range. The technical scheme provided by the embodiment of the invention simplifies the test system and improves the test efficiency.
Based on the above test system, an embodiment of the present invention provides a test method, and fig. 2 is a flowchart of the test method provided by the embodiment of the present invention, as shown in fig. 2, the method includes:
In the embodiment of the invention, the motor controller is provided with the IGBT.
In the embodiment of the invention, the data acquisition and analysis processor is provided with the sensor, and can acquire the low-voltage current value of the low-voltage power supply, the current value of alternating current output by the motor controller, the direct-current voltage value between the first line and the second line and the temperature value of an IGBT (insulated gate bipolar translator) of the motor controller through the sensor.
And 104, judging whether the low-voltage current value is in a first set range, whether the current value is in a second set range, whether the direct-current voltage value is in a third set range and whether the temperature value is in a fourth set range by the data acquisition analysis processor.
In the embodiment of the present invention, the first setting range, the second setting range, the third setting range, and the fourth setting range can be set according to actual conditions.
In the embodiment of the invention, if the data acquisition and analysis processor determines that the first condition is satisfied, the second condition is satisfied, the third condition is satisfied, and the fourth condition is satisfied, the data acquisition and analysis processor indicates that the low-voltage current value, the direct-current voltage value and the temperature value in the test system are all located in a normal range, wherein the first condition includes that the low-voltage current value is located in a first set range, the second condition includes that the current value is located in a second set range, the third condition includes that the direct-current voltage value is located in a third set range, and the fourth condition includes that the temperature value is located in a fourth set range.
And if the data acquisition analysis processor judges that any one of the first condition, the second condition, the third condition and the fourth condition is not satisfied, the data acquisition analysis processor indicates that one or more values of the low-voltage current value, the direct-current voltage value and the temperature value in the test system are not in a normal range.
And 106, if the data acquisition and analysis processor judges that a first condition is established, a second condition is established, a third condition is established and a fourth condition is established, the successful test is determined, wherein the first condition comprises that the low-voltage current value is positioned in a first set range, the second condition comprises that the current value is positioned in a second set range, the third condition comprises that the direct-current voltage value is positioned in a third set range, and the fourth condition comprises that the temperature value is positioned in a fourth set range.
In the technical scheme provided by the embodiment of the invention, a data acquisition and analysis processor is used for acquiring the low-voltage current value of a low-voltage power supply, the current value of alternating current output by a motor controller, the direct-current voltage value between a first line and a second line and the temperature value of an Insulated Gate Bipolar Transistor (IGBT) of the motor controller; judging whether the low-voltage current value is within a first set range, whether the current value is within a second set range, whether the direct-current voltage value is within a third set range and whether the temperature value is within a fourth set range; if the first condition is judged to be established, the second condition is established, the third condition is established and the fourth condition is established, the test is determined to be successful, wherein the first condition comprises that the low-voltage current value is located in a first set range, the second condition comprises that the current value is located in a second set range, the third condition comprises that the direct-current voltage value is located in a third set range, and the fourth condition comprises that the temperature value is located in a fourth set range. The technical scheme provided by the embodiment of the invention simplifies the test system and improves the test efficiency.
An embodiment of the present invention provides a testing method, and fig. 2 is a flowchart of the testing method provided in the embodiment of the present invention, and as shown in fig. 2, the method includes:
In the embodiment of the present invention, please refer to step 104 for a detailed description of step 204.
And step 208, the data acquisition and analysis processor determines that the test fails.
As an alternative, step 208 may be followed by:
and step S1, the data acquisition and analysis processor sends an error instruction to the PLC.
As an alternative, step S1 may be followed by: and the data acquisition analysis processor sends error information to the display screen, and the display screen displays the error information. At this time, the staff can check the test system according to the error information displayed by the display screen.
And step S2, the PLC responds to the error command and sends a second power-off command to the low-voltage power supply.
And step S3, the low-voltage power supply responds to the second power-off instruction and powers off.
And step 210, the data acquisition and analysis processor sends an error instruction to the PLC.
As an alternative, step 210 may be followed by: and the data acquisition analysis processor sends error information to the display screen, and the display screen displays the error information. At this time, the staff can check the test system according to the error information displayed by the display screen.
And step 214, the direct current power supply is powered off in response to the first power-off instruction.
In the step, the direct current power supply is powered off, so that the worker can conveniently check, the test safety is improved, and the damage to elements in the test system is avoided.
In the technical scheme provided by the embodiment of the invention, a data acquisition and analysis processor is used for acquiring the low-voltage current value of a low-voltage power supply, the current value of alternating current output by a motor controller, the direct-current voltage value between a first line and a second line and the temperature value of an Insulated Gate Bipolar Transistor (IGBT) of the motor controller; judging whether the low-voltage current value is within a first set range, whether the current value is within a second set range, whether the direct-current voltage value is within a third set range and whether the temperature value is within a fourth set range; if the first condition is judged to be established, the second condition is established, the third condition is established and the fourth condition is established, the test is determined to be successful, wherein the first condition comprises that the low-voltage current value is located in a first set range, the second condition comprises that the current value is located in a second set range, the third condition comprises that the direct-current voltage value is located in a third set range, and the fourth condition comprises that the temperature value is located in a fourth set range. The technical scheme provided by the embodiment of the invention simplifies the test system and improves the test efficiency.
According to the technical scheme provided by the embodiment of the invention, automatic testing can be realized through the PLC, the testing efficiency is improved, and the testing failure caused by errors in manual operation is avoided.
In the technical scheme provided by the embodiment of the invention, the inductance analog load is adopted to replace a motor butt-supporting test bench in the related technology so as to test the motor controllers, and the defects of any performance of each controller can be detected, so that the fault tolerance rate of the test is lower, the test system is simplified, the test energy consumption is reduced, and the manufacturing cost of the test system is also reduced.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (8)
1. A test system, comprising: the low-voltage power supply is connected with the motor controller, the data acquisition and analysis processor is connected with the first line, the data acquisition and analysis processor is connected with the second line, and the data acquisition and analysis processor is connected with the motor controller;
the low-voltage power supply is used for supplying power to the motor controller;
the direct current power supply is used for providing direct current for the motor controller;
and the motor controller is used for converting the direct current output by the direct current power supply into alternating current and outputting the alternating current to the inductance simulation load.
2. The system of claim 1, further comprising: the water cooling machine is connected with the motor controller;
the water cooling machine is used for providing cooling circulating water for the motor controller.
3. The system of claim 2, further comprising: the water cooling machine is connected with the PLC, the PLC is connected with the direct-current power supply, the PLC is connected with the low-voltage power supply, and the PLC is connected with the data acquisition analysis processor;
and the PLC is used for indicating the operation of the direct current power supply, the motor controller, the inductance analog load, the low-voltage power supply, the water cooling machine and the data acquisition analysis processor according to the stored operation logic.
4. The system of claim 1, further comprising: the relay is connected with the motor controller and the inductive simulation load;
the inductance simulation load is also used for converting electric energy provided by the alternating current into heat energy;
the relay is used for opening or closing a path for outputting the alternating current to the inductance simulation load.
5. A test method according to claim 1, comprising:
the data acquisition analysis processor acquires a low-voltage current value of the low-voltage power supply, a current value of alternating current output by the motor controller, a direct-current voltage value between the first line and the second line and a temperature value of an Insulated Gate Bipolar Transistor (IGBT) of the motor controller;
the data acquisition analysis processor judges whether the low-voltage current value is in a first set range, whether the current value is in a second set range, whether the direct-current voltage value is in a third set range and whether the temperature value is in a fourth set range;
and if the data acquisition and analysis processor judges that a first condition is established, a second condition is established, a third condition is established and a fourth condition is established, the successful test is determined, wherein the first condition comprises that the low-voltage current value is positioned in a first set range, the second condition comprises that the current value is positioned in a second set range, the third condition comprises that the direct-current voltage value is positioned in a third set range, and the fourth condition comprises that the temperature value is positioned in a fourth set range.
6. The method of claim 5, further comprising:
and if the data acquisition and analysis processor judges that any one of the first condition, the second condition, the third condition and the fourth condition is not satisfied, determining that the test fails.
7. The method of claim 6, wherein the test failure comprises:
the data acquisition and analysis processor sends an error instruction to the PLC;
the PLC responds to the error instruction and sends a first power-off instruction to the direct-current power supply;
and the direct current power supply is powered off in response to the first power-off instruction.
8. The method of claim 6, wherein said determining that the test failed further comprises:
the data acquisition and analysis processor sends an error instruction to the PLC;
the PLC responds to the error instruction and sends a second power-off instruction to the low-voltage power supply;
the low-voltage power supply is powered off in response to the second power-off command.
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| CN202011604586.4A CN112798918A (en) | 2020-12-30 | 2020-12-30 | Test system and test method |
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| CN202011604586.4A CN112798918A (en) | 2020-12-30 | 2020-12-30 | Test system and test method |
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