CN112794332B - Method for removing boron impurities in metallurgical silicon by nitridation-purification - Google Patents

Method for removing boron impurities in metallurgical silicon by nitridation-purification Download PDF

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CN112794332B
CN112794332B CN202110038313.6A CN202110038313A CN112794332B CN 112794332 B CN112794332 B CN 112794332B CN 202110038313 A CN202110038313 A CN 202110038313A CN 112794332 B CN112794332 B CN 112794332B
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张立峰
李亚琼
任英
杨文�
罗艳
姜东滨
音正元
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University of Science and Technology Beijing USTB
Yanshan University
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Abstract

一种氮化‑净化去除冶金硅中硼杂质的方法,属于冶金材料领域。本发明向冶金级硅熔体中加入氮化剂,氮化剂的加入可将硅熔体中的硼杂质转化为氮化物颗粒,而后对氮化后的硅熔体施加电磁力将氮化物颗粒向硅熔体周围聚集,再将硅熔体和氮化物颗粒进行强制冷却并分离,并利用上述分离出的富含氮化物颗粒的多晶硅生产氮化硅;由于氮化物颗粒与硅熔体之间存在明显的导电率差异,因此在电磁力的作用下,氮化物颗粒会富集至熔体周围,从而实现硼杂质和硅熔体的有效分离;此外,将富含氮化物颗粒的多晶硅粉碎,加入氯化铵并在流动性N2气氛下氮化处理得到氮化硅产物;利用富含氮化物的多晶硅,实现资源的高效利用,提高技术经济性。

Figure 202110038313

A method for nitriding-purifying removal of boron impurities in metallurgical silicon belongs to the field of metallurgical materials. In the present invention, a nitriding agent is added to the metallurgical grade silicon melt. The addition of the nitriding agent can convert boron impurities in the silicon melt into nitride particles, and then electromagnetic force is applied to the nitrided silicon melt to convert the nitride particles. Aggregate around the silicon melt, then force the silicon melt and the nitride particles to cool and separate, and use the above-separated polysilicon rich in nitride particles to produce silicon nitride; due to the gap between the nitride particles and the silicon melt There is a significant difference in conductivity, so under the action of electromagnetic force, nitride particles will be enriched around the melt, so as to achieve effective separation of boron impurities and silicon melt; in addition, the polysilicon rich in nitride particles is pulverized, The silicon nitride product is obtained by adding ammonium chloride and nitriding in a fluid N 2 atmosphere; using the polysilicon rich in nitrides, the efficient utilization of resources is realized and the technical economy is improved.

Figure 202110038313

Description

一种氮化-净化去除冶金硅中硼杂质的方法A method for nitriding-purifying removal of boron impurities in metallurgical silicon

技术领域technical field

本发明涉及冶金、材料技术领域,更具体地说,涉及一种基于超细氮化物转化-净化冶金硅中杂质硼的方法。The invention relates to the technical fields of metallurgy and materials, and more particularly, to a method for converting and purifying impurity boron in metallurgical silicon based on ultrafine nitrides.

背景技术Background technique

我国是名副其实的硅生产大国,但目前国内硅材料供需却面临着严重的结构性失衡,一方面中低端硅材料供给严重过剩,价格持续下滑;另一方面,高品质硅供给不足,高度依赖进口。在此背景下,优化产品结构、提高产品质量是硅产业实现可持续发展的必由之路。my country is a veritable silicon producer, but at present, the domestic supply and demand of silicon materials is facing a serious structural imbalance. import. In this context, optimizing product structure and improving product quality is the only way for the silicon industry to achieve sustainable development.

太阳能级多晶硅是最具应用前景的高附加值硅制品之一,其纯度为5~7N,主要应用于太阳能电池器件制备。1865年美国杜邦公司发明了锌还原法,由此拉开了高纯多晶硅制备的序幕,随后相继产生了四氯化硅氢还原法、三氯氢硅热分解法、硅烷热分解法与改良西门子法,其中改良西门子法成为多晶硅的主流制备工艺。自20世纪70年代起,光伏产业发展迅猛,由此激发了行业对太阳能级多晶硅材料巨大需求,而改良西门子法已经无法满足多晶硅的大规模生产,以此为契机,研发出了诸如冶金法、金属还原法、熔盐电解等一批新型高纯多晶硅制备技术。对于太阳能级多晶硅材料,B杂质是关键杂质,其含量过高将使硅基太阳能电池电阻率过低,从而影响太阳能电池的光电转化效率。但B杂质与硅的性质相似,是新技术制备太阳能级多晶硅过程中最难除去的杂质,针对B杂质的去除,现有技术还都面临着“降低生产成本”和“提高产品质量”的共性问题。Solar-grade polysilicon is one of the most promising high-value-added silicon products, with a purity of 5-7N, and is mainly used in the preparation of solar cell devices. In 1865, the DuPont Company of the United States invented the zinc reduction method, which opened the prelude to the preparation of high-purity polysilicon. Among them, the modified Siemens method has become the mainstream preparation process of polysilicon. Since the 1970s, the photovoltaic industry has developed rapidly, which has stimulated the industry's huge demand for solar-grade polysilicon materials, and the improved Siemens method has been unable to meet the large-scale production of polysilicon. A batch of new high-purity polysilicon preparation technologies such as metal reduction method and molten salt electrolysis. For solar-grade polysilicon materials, B impurity is a key impurity, and if its content is too high, the resistivity of silicon-based solar cells will be too low, thereby affecting the photoelectric conversion efficiency of solar cells. However, B impurities are similar in properties to silicon, and are the most difficult impurities to remove in the process of preparing solar-grade polysilicon by new technologies. For the removal of B impurities, the existing technologies are still faced with the commonality of "reducing production costs" and "improving product quality" question.

目前去除硅中B杂质主要方法为造渣-吹气精炼法,在造渣精炼过程中向硅-渣熔体通入惰性或惰性-活性混合气体,利用惰性气体搅拌熔体,以促进元素传输、加快化学反应;利用活性气体与硅熔体之间的杂质发生反应,是一种除杂效率高、可操作性强、成本低的多晶硅提纯方法。经检索,发明创造名称为:一种低硼磷高纯硅的制备工艺(申请号:201811088653.4,申请日:2018-09-18),该申请案公开了一种低硼磷高纯硅的制备工艺,包括以下步骤:制备原料、酸洗除金属杂质、氧化精炼除磷、改进型热交换法除硼、还原提纯。该申请案采用酸洗的方式除去工业硅内的金属杂质,再通过氧化精炼和改进型热交换法除去工业硅内的磷和硼,使得磷和硼均被氧化形成易挥发物质,虽然可使得硅的纯度达到99.9%以上,但是其在除B过程中通入H2和水蒸气且需要抵押环境,造成了渣剂和硅的大量损失;同时上述过程使用了大量渣剂,不可避免的造成硅熔体的二次污染,还需要进一步通过渣金分离、酸洗等精炼方法获得低B多晶硅材料,因此成本高、流程长、除硼效率低。At present, the main method for removing B impurities in silicon is slagging-air refining method. In the process of slagging and refining, inert or inert-active mixed gas is introduced into the silicon-slag melt, and the melt is stirred with inert gas to promote element transfer. , speed up the chemical reaction; use the reactive gas to react with the impurities between the silicon melt, which is a polysilicon purification method with high impurity removal efficiency, strong operability and low cost. After searching, the name of the invention and creation is: a preparation process of high-purity silicon with low boron and phosphorus (application number: 201811088653.4, application date: 2018-09-18), which discloses the preparation of high-purity silicon with low boron and phosphorus The process includes the following steps: preparing raw materials, removing metal impurities by acid washing, removing phosphorus by oxidative refining, removing boron by an improved heat exchange method, and reducing and purifying. This application uses acid washing to remove metal impurities in industrial silicon, and then removes phosphorus and boron in industrial silicon by oxidative refining and improved heat exchange, so that both phosphorus and boron are oxidized to form volatile substances. The purity of silicon reaches more than 99.9%, but in the process of removing B, H2 and water vapor are introduced and the environment needs to be mortgaged, resulting in a large loss of slag agent and silicon; at the same time, the above process uses a large amount of slag agent, which inevitably causes Secondary pollution of silicon melt requires further refining methods such as slag gold separation and pickling to obtain low-B polysilicon materials, so the cost is high, the process is long, and the boron removal efficiency is low.

发明内容SUMMARY OF THE INVENTION

1.发明要解决的技术问题1. The technical problem to be solved by the invention

本发明的目的在于针对现有技术中去除硅中硼杂质成本高、流程长、效率低等问题,提供了一种氮化-净化去除冶金硅中硼杂质的方法,该方法通过向硅熔体中加入氮化剂,其和杂质反应生成氮化物,继而利用电磁净化手段高效去除氮化物,从而达到除硼目的。The purpose of the present invention is to solve the problems of high cost, long process and low efficiency in removing boron impurities in silicon in the prior art, and provide a method for removing boron impurities in metallurgical silicon by nitriding-purification. A nitriding agent is added to the nitriding agent, which reacts with impurities to form nitrides, and then uses electromagnetic purification means to efficiently remove the nitrides, so as to achieve the purpose of boron removal.

2.技术方案2. Technical solutions

为达到上述目的,本发明提供的技术方案为:In order to achieve the above object, the technical scheme provided by the invention is:

本发明的一种氮化-净化去除冶金硅中硼杂质的方法,向冶金级硅熔体中加入氮化剂,而后对氮化后的硅熔体施加电磁力将氮化物颗粒向硅熔体周围聚集,再将硅熔体和氮化物颗粒进行强制冷却并分离,并利用上述被分离出的、富含氮化物颗粒的多晶硅材料生产氮化硅。According to a method for nitriding-purifying and removing boron impurities in metallurgical silicon of the present invention, a nitriding agent is added to a metallurgical grade silicon melt, and then an electromagnetic force is applied to the silicon melt after nitridation to transfer the nitride particles to the silicon melt. Aggregate around, and then force the silicon melt and nitride particles to cool and separate, and use the separated polysilicon material rich in nitride particles to produce silicon nitride.

优选地,具体步骤如下:Preferably, the specific steps are as follows:

第一步:氮化吹炼Step 1: Nitriding blowing

先将冶金级硅加热至熔融状态,之后将氮化剂吹入冶金级硅熔体中进行氮化反应;First, the metallurgical grade silicon is heated to a molten state, and then the nitriding agent is blown into the metallurgical grade silicon melt for nitriding reaction;

第二步:电磁净化Step 2: Electromagnetic Purification

向步骤一氮化反应后得到的氮化熔体施加电磁力,将氮化物颗粒向硅熔体周围聚集;applying electromagnetic force to the nitrided melt obtained after the nitridation reaction in step 1, to gather the nitride particles around the silicon melt;

第三步:冷却分离The third step: cooling separation

将步骤二得到的硅熔体进行强制冷却,得到周围富含氮化物颗粒的多晶硅,之后将上述周围富含氮化物颗粒的多晶硅进行机械分离,分别得到富含氮化物的多晶硅和除硼后的多晶硅;The silicon melt obtained in step 2 is forcibly cooled to obtain surrounding polysilicon rich in nitride particles, and then the above-mentioned surrounding polysilicon rich in nitride particles is mechanically separated to obtain nitride-rich polysilicon and boron-removed polysilicon respectively. polysilicon;

第四步:氮化硅制备Step 4: Silicon Nitride Preparation

将第三步得到的富含杂质的多晶硅进行粉碎、氮化处理,得到氮化硅产物。The impurity-rich polysilicon obtained in the third step is pulverized and nitrided to obtain a silicon nitride product.

优选地,第一步的具体步骤为:先将冶金级硅加热至硅熔点以上并保温30~120min,以使其完全熔融形成冶金级硅熔体,之后将氮化剂以氩气为载气吹入冶金级硅熔体中进行氮化反应。Preferably, the specific steps of the first step are: firstly heating the metallurgical grade silicon to above the melting point of silicon and holding the temperature for 30-120 minutes to completely melt it to form a metallurgical grade silicon melt, and then using argon as the carrier gas for the nitriding agent Blown into metallurgical grade silicon melt for nitridation reaction.

优选地,第三步的具体步骤为:将步骤二得到的硅熔体外侧喷吹氮气进行强制冷却,此后关闭电磁力,得到周围富含氮化物颗粒的多晶硅,之后将上述周围富含氮化物颗粒的多晶硅进行机械分离,分别得到富含氮化物颗粒的多晶硅和除硼后的多晶硅。Preferably, the specific steps of the third step are: spraying nitrogen gas on the outside of the silicon melt obtained in step 2 for forced cooling, then turning off the electromagnetic force to obtain the surrounding polysilicon rich in nitride particles, and then enriching the surrounding nitride-rich polysilicon The polycrystalline silicon of the particles is mechanically separated to obtain polycrystalline silicon rich in nitride particles and polycrystalline silicon after boron removal, respectively.

优选地,第四步的具体步骤为:将第三步得到的富含氮化物颗粒的多晶硅进行粉碎,并加入氯化铵颗粒,在流动性N2气氛下进行氮化处理得到氮化硅产物。Preferably, the specific steps of the fourth step are: pulverizing the polycrystalline silicon rich in nitride particles obtained in the third step, adding ammonium chloride particles, and performing nitridation treatment in a fluid N 2 atmosphere to obtain a silicon nitride product .

优选地,所述电磁净化的电磁参数为:电流强度10~50A,电压:200~550V,频率:50~100kHz,功率:4~25kW,电磁净化时间:10~180s。Preferably, the electromagnetic parameters of the electromagnetic purification are: current intensity 10-50A, voltage: 200-550V, frequency: 50-100kHz, power: 4-25kW, electromagnetic purification time: 10-180s.

优选地,所述氮化剂为N2和/或NH3,氮化剂含氮浓度范围为0.1~10%,氮化时间为5~180s。Preferably, the nitriding agent is N 2 and/or NH 3 , the nitrogen concentration of the nitriding agent ranges from 0.1 to 10%, and the nitriding time is 5 to 180 s.

优选地,第四步中机械分离富氮化物颗粒的多晶硅和中心低含硼杂质的多晶硅的界面为第三步得到的多晶硅表面至内部5~15mm处。Preferably, in the fourth step, the interface between the polysilicon of the nitride-rich particles and the polysilicon with low boron impurities in the center is mechanically separated from the surface of the polysilicon obtained in the third step to 5-15 mm inside.

优选地,所述金属粉M纯度为高于99.9%,金属粉M为Al、Ti、Si中的一种或多种,其粒径为1~30μm。Preferably, the purity of the metal powder M is higher than 99.9%, the metal powder M is one or more of Al, Ti, and Si, and the particle size thereof is 1-30 μm.

优选地,所述富含氮化硅颗粒的多晶硅被粉碎到粒径范围为10~50μm,氯化铵加入量为富含氮化硅颗粒的多晶硅质量的20~100%,氯化铵颗粒粒径范围为10~50μm。Preferably, the polycrystalline silicon rich in silicon nitride particles is pulverized to a particle size range of 10-50 μm, the amount of ammonium chloride added is 20 to 100% of the mass of the polycrystalline silicon rich in silicon nitride particles, and the ammonium chloride particles are The diameter ranges from 10 to 50 μm.

优选地,所述氮化处理的温度范围为600~1200℃,流动性N2的流量为100~500mL/min,氮化时间为20~180min。Preferably, the temperature range of the nitriding treatment is 600-1200° C., the flow rate of fluid N 2 is 100-500 mL/min, and the nitriding time is 20-180 min.

3.有益效果3. Beneficial effects

采用本发明提供的技术方案,与已有的公知技术相比,具有如下显著效果:Adopting the technical scheme provided by the present invention, compared with the existing known technology, has the following remarkable effects:

(1)本发明的一种氮化-净化去除冶金硅中硼杂质的方法,向冶金级硅熔体中加入氮化剂,氮化剂的加入可将硅熔体中的硼杂质转化为氮化物颗粒,而后对氮化后的硅熔体施加电磁力将氮化物颗粒向硅熔体周围聚集,再将硅熔体和杂质进行强制冷却并分离,并利用上述分离出氮化物颗粒的硅料来生产氮化硅;由于氮化物颗粒与硅熔体之间存在明显的导电率差异,因此在电磁力的作用下,氮化物颗粒会富集至熔体周围,从而实现硼杂质和硅熔体的有效分离;(1) A method for nitriding-purifying removal of boron impurities in metallurgical silicon of the present invention, adding a nitriding agent to metallurgical grade silicon melt, and the addition of the nitriding agent can convert boron impurities in the silicon melt into nitrogen Then, electromagnetic force is applied to the nitrided silicon melt to gather the nitride particles around the silicon melt, and then the silicon melt and impurities are forcibly cooled and separated, and the silicon material from which the nitride particles are separated is used. to produce silicon nitride; due to the obvious difference in conductivity between the nitride particles and the silicon melt, under the action of electromagnetic force, the nitride particles will be enriched around the melt, thereby realizing boron impurities and silicon melt. effective separation;

(2)本发明的一种氮化-净化去除冶金硅中硼杂质的方法,将富含氮化硅颗粒的多晶硅粉碎,此外加入氯化铵颗粒;在流动性N2气氛下进行氮化处理得到氮化硅产物;合理利用富含氮化物颗粒的多晶硅,将其进行氮化处理,可实现资源的高效利用,提高了技术经济性;(2) A method for nitriding-purifying removal of boron impurities in metallurgical silicon of the present invention, pulverizing polysilicon rich in silicon nitride particles, adding ammonium chloride particles in addition ; nitriding treatment in a fluid N atmosphere The silicon nitride product is obtained; the polysilicon rich in nitride particles is rationally utilized and subjected to nitridation treatment, which can realize the efficient utilization of resources and improve the technical economy;

(3)本发明的一种氮化-净化去除冶金硅中硼杂质的方法,对氮化熔体施加电磁力,氮化物在电磁力的作用下向氮化熔体周围富集,实现氮化物和硅熔体之前的分离;电磁净化仅依靠电磁外场作用将氮化物颗粒与熔体分离,是一种非接触式的、洁净化的精炼技术,不会向硅熔体引入新的介质而造成二次污染,实现颗粒的高效富集、脱除;此外,电磁净化过程仅需要调控电流强度等参数进行氮化物颗粒与硅熔体的高效分离,操作简单、成本低、除硼效率高。(3) In a method for nitriding-purifying and removing boron impurities in metallurgical silicon of the present invention, an electromagnetic force is applied to the nitrided melt, and the nitrides are enriched around the nitrided melt under the action of the electromagnetic force, thereby realizing the nitrided melt. Separation from silicon melt; electromagnetic purification only relies on the action of electromagnetic external field to separate nitride particles from melt. It is a non-contact and clean refining technology, which will not introduce new media into silicon melt. In addition, the electromagnetic purification process only needs to adjust parameters such as current intensity for efficient separation of nitride particles and silicon melt, with simple operation, low cost and high boron removal efficiency.

附图说明Description of drawings

图1为本发明一种氮化-净化去除冶金硅中杂质的方法示意图。FIG. 1 is a schematic diagram of a method for nitriding-purifying removal of impurities in metallurgical silicon according to the present invention.

具体实施方式Detailed ways

下文对本发明的详细描述和示例实施例可结合附图来更好地理解,其中本发明的元件和特征由附图标记标识。The following detailed description and example embodiments of the invention can be better understood in conjunction with the accompanying drawings, wherein elements and features of the invention are identified by reference numerals.

实施例1Example 1

结合图1所示,本实施例的一种氮化-净化去除冶金硅中硼杂质的方法,其步骤为:向冶金级硅熔体中加入氮化剂,而后对氮化后的硅熔体施加电磁力将氮化物颗粒向硅熔体周围聚集,再将硅熔体和氮化物颗粒进行强制冷却并分离,并利用上述分离出的、富含氮化物的硅料生产氮化硅。具体步骤为:With reference to FIG. 1 , a method for nitriding-purifying removal of boron impurities in metallurgical silicon in this embodiment includes the following steps: adding a nitriding agent to metallurgical grade silicon melt, and then nitriding the silicon melt after nitriding. Electromagnetic force is applied to aggregate the nitride particles around the silicon melt, and the silicon melt and the nitride particles are forcedly cooled and separated, and the separated, nitride-rich silicon material is used to produce silicon nitride. The specific steps are:

第一步:氮化吹炼Step 1: Nitriding blowing

先将冶金级硅加热至硅熔点以上并保温30~120min以使其完全熔融形成冶金级硅熔体,本实施例将冶金级硅加热至1650℃,保温时间为120min,选用的冶金级硅纯度为95%,其中硼杂质含量为500ppm;之后将氮化剂以氩气为载气吹入冶金级硅熔体中进行氮化反应,其中氮化剂为N2和/或NH3,氮化剂含氮浓度范围为0.1~10%,氮化时间为5~180s。本实施例采用的氮化剂为N2,含N浓度为1%,氮化时间为180s;First, the metallurgical grade silicon is heated to above the melting point of silicon and kept for 30-120 minutes to make it melt completely to form a metallurgical grade silicon melt. In this embodiment, the metallurgical grade silicon is heated to 1650°C, and the holding time is 120 minutes. The selected metallurgical grade silicon is pure is 95%, and the boron impurity content is 500ppm; then the nitriding agent is blown into the metallurgical grade silicon melt with argon as the carrier gas to carry out the nitriding reaction, wherein the nitriding agent is N 2 and/or NH 3 , and the nitriding agent is The nitrogen concentration range of the agent is 0.1-10%, and the nitriding time is 5-180s. The nitriding agent used in this example is N 2 , the N concentration is 1%, and the nitriding time is 180s;

需要说明的是,向冶金级硅中加入氮化剂可让杂质硼氮化为BN,而BN在硅熔体中以固态颗粒形式存在,其不溶于硅熔体,可从硅熔体中去除;此外由于Si为基体,其与氮化剂反应的几率远远大于B与N反应的几率,因此硅熔体中Si与N反应生成Si3N4颗粒的数量多于BN颗粒数量,而生成的Si3N4颗粒会进一步吸附硅熔体未反应的硼杂质,氮化生成Si3N4-BN复合颗粒,且熔体中除硼的硼主要以Si3N4吸附、氮化去除硼杂质为主。It should be noted that adding a nitriding agent to metallurgical grade silicon can make impurities boron nitrided into BN, and BN exists in the form of solid particles in the silicon melt, which is insoluble in the silicon melt and can be removed from the silicon melt. In addition, since Si is the matrix, the probability of its reaction with the nitriding agent is much greater than the probability of the reaction between B and N, so the number of Si 3 N 4 particles generated by the reaction of Si and N in the silicon melt is more than the number of BN particles. The Si 3 N 4 particles will further adsorb the unreacted boron impurities in the silicon melt, nitriding to form Si 3 N 4 -BN composite particles, and the boron in the melt is mainly adsorbed by Si 3 N 4 and nitrided to remove boron Impurities predominate.

需要进一步说明的是,本实施例采用的氮化剂为N2,其不仅可用于生成BN颗粒和Si3N4-BN复合颗粒,还和载气Ar在硅熔体中以气泡形式存在,弥散于硅熔体的气泡有利于吸附BN颗粒、Si3N4颗粒和Si3N4-BN复合颗粒,促进B杂质从硅熔体中去除;It should be further explained that the nitriding agent used in this embodiment is N 2 , which can not only be used to generate BN particles and Si 3 N 4 -BN composite particles, but also exist in the form of bubbles in the silicon melt with the carrier gas Ar, The bubbles dispersed in the silicon melt are beneficial to adsorb BN particles, Si 3 N 4 particles and Si 3 N 4 -BN composite particles, and promote the removal of B impurities from the silicon melt;

第二步:电磁净化Step 2: Electromagnetic Purification

向步骤一氮化反应后得到的氮化熔体施加电磁力,将杂质向硅熔体周围聚集;其中,电磁力的电磁参数为:电流强度10~50A,电压:200~550V,频率:50~100kHz,功率:4~25kW,电磁净化时间:10~180s;具体到本实施例,电流强度50A,电压:200V,频率:50kHz,功率:10kW,净化时间:180s;Applying electromagnetic force to the nitrided melt obtained after the nitridation reaction in step 1, to gather impurities around the silicon melt; wherein, the electromagnetic parameters of the electromagnetic force are: current intensity 10-50A, voltage: 200-550V, frequency: 50 ~100kHz, power: 4~25kW, electromagnetic purification time: 10~180s; specific to this embodiment, the current intensity is 50A, the voltage: 200V, the frequency: 50kHz, the power: 10kW, the purification time: 180s;

值得注意的是,由于将硅中的杂质转化为BN颗粒、Si3N4颗粒和Si3N4-BN复合颗粒,虽然这些固态杂质可以逐渐上浮去除,但是其上浮速度较慢且效率低,无法满足生产需求,但高温下固相颗粒与硅熔体之间存在明显的导电率差异,在电磁作用下不导电或是导电性差的固相颗粒不受或是受到很小的电磁力作用;因此在电磁力的作用下,氮化吹炼阶段生成的Si3N4颗粒、BN颗粒、Si3N4-BN复合颗粒会富集至熔体外侧、底部、顶部;It is worth noting that due to the conversion of impurities in silicon into BN particles, Si 3 N 4 particles and Si 3 N 4 -BN composite particles, although these solid impurities can be gradually removed by floating up, their floating speed is slow and the efficiency is low. It cannot meet the production requirements, but there is a significant difference in conductivity between the solid phase particles and the silicon melt at high temperatures, and the solid phase particles that are non-conductive or poorly conductive under electromagnetic action are not affected by or are subject to very little electromagnetic force; Therefore, under the action of electromagnetic force, Si 3 N 4 particles, BN particles and Si 3 N 4 -BN composite particles generated in the nitriding blowing stage will be enriched to the outside, bottom and top of the melt;

第三步:冷却分离The third step: cooling separation

将步骤二得到的硅熔体外侧喷氮气剂进行强制冷却,此后关闭电磁力,得到周围富含氮化物颗粒的多晶硅。为将氮化物颗粒分离去除,将上述周围富含氮化物颗粒的多晶硅进行机械分离,具体操作为在富含氮化物颗粒的多晶硅表面至内部5~15mm处进行切割分离,在分别得到富含氮化物颗粒的多晶硅和除硼后的多晶硅;其中在强制冷却后再关闭电磁力的目的是:保证硅熔体的外侧或底部、顶部最先凝固,这就保证了电磁作用下氮化物颗粒都富集在这些先凝固的部分;The silicon melt obtained in step 2 is sprayed with nitrogen agent for forced cooling, and then the electromagnetic force is turned off to obtain surrounding polysilicon rich in nitride particles. In order to separate and remove the nitride particles, the above-mentioned surrounding polysilicon rich in nitride particles is mechanically separated. The purpose of turning off the electromagnetic force after forced cooling is to ensure that the outer or bottom and top of the silicon melt are solidified first, which ensures that the nitride particles are rich in the electromagnetic action. Collected in these first solidified parts;

第四步:氮化硅制备Step 4: Silicon Nitride Preparation

将第三步得到的富含氮化物颗粒的多晶硅粉碎至10~50μm的粒径,本实施例将其破碎粒径至10μm;此外加入氯化铵颗粒,其加入量为富含杂质的多晶硅质量的20~100%,氯化铵颗粒粒径范围为10~50μm;在流动性N2气氛下进行氮化处理得到氮化硅产物,其中氮化处理的温度范围为600~1200℃,流动性N2的流量为100~500mL/min,氮化时间为20~180min,具体到本实施例,氮化温度:600℃,流动性N2的流量为100mL/min,氮化时间:180min;The polysilicon rich in nitride particles obtained in the third step is pulverized to a particle size of 10-50 μm, and in this embodiment, the particle size is pulverized to 10 μm; in addition, ammonium chloride particles are added, and the amount added is the mass of the polycrystalline silicon rich in impurities 20-100% of the ammonium chloride particle size range is 10-50 μm; the silicon nitride product is obtained by nitriding in a fluid N 2 atmosphere, wherein the temperature range of the nitriding treatment is 600-1200 ℃, and the fluidity The flow rate of N 2 is 100-500 mL/min, and the nitriding time is 20-180 min. Specifically, in this embodiment, the nitriding temperature is 600°C, the flow rate of fluid N 2 is 100 mL/min, and the nitriding time is 180 min;

值得注意的是,为了合理利用富含氮化物颗粒的多晶硅,将其进行氮化处理,可实现资源的高效利用,提高了技术经济性。It is worth noting that, in order to reasonably utilize the polysilicon rich in nitride particles, nitriding it can realize the efficient utilization of resources and improve the technical economy.

本实施例最终获得多晶硅硼杂质含量为20ppm,氮化硅产物纯度达到99%。In this example, the content of polysilicon and boron impurities finally obtained is 20 ppm, and the purity of the silicon nitride product reaches 99%.

实施例2Example 2

本实施例和实施例1基本相同,不同之处在于:本实施例将冶金级硅加热至1600℃,保温时间为60min,所述冶金级硅纯度为99%,其中硼杂质含量为100ppm。采用的氮化剂为NH3,含N浓度为5%,氮化时间为120s。第二步中电流强度40A,电压:500V,频率:80kHz,功率:20kW,净化时间:120s。本实施例第四步中,将富含氮化物颗粒的多晶硅粉碎至30μm,加入氯化铵颗粒质量为富含氮化物颗粒的多晶硅质量的50%,氮化温度:800℃,流动性N2的流量为200mL/min,氮化时间:90min。This embodiment is basically the same as Embodiment 1, the difference is that in this embodiment, metallurgical grade silicon is heated to 1600° C. for 60 minutes, the metallurgical grade silicon has a purity of 99%, and the boron impurity content is 100 ppm. The nitriding agent used was NH 3 , the N concentration was 5%, and the nitriding time was 120 s. In the second step, the current intensity is 40A, the voltage: 500V, the frequency: 80kHz, the power: 20kW, and the purification time: 120s. In the fourth step of this example, the polysilicon rich in nitride particles is pulverized to 30 μm, the mass of ammonium chloride particles is 50% of the mass of polysilicon rich in nitride particles, nitriding temperature: 800 ° C, fluidity N 2 The flow rate was 200 mL/min, and the nitridation time was 90 min.

本实施例最终获得多晶硅硼杂质含量为5ppm,氮化硅产物纯度达到99.6%。In this example, the content of polysilicon and boron impurities finally obtained is 5 ppm, and the purity of the silicon nitride product reaches 99.6%.

值得注意的是,本实施例采用的氮化剂是NH3,其和N2作为氮化剂的区别在于NH3除了可硅中的杂质硼反应生成BN外,还可生成N3H6B3,该物质在硅熔体中以气相形式存在,不仅易于去除,还可吸附Si3N4颗粒、BN颗粒、Si3N4-BN复合颗粒一起上浮去除。It is worth noting that the nitriding agent used in this embodiment is NH 3 , which is different from N 2 as the nitriding agent in that NH 3 can generate N 3 H 6 B in addition to the reaction of impurity boron in silicon to generate BN 3. The substance exists in the form of gas phase in the silicon melt, which is not only easy to remove, but also can adsorb Si 3 N 4 particles, BN particles, and Si 3 N 4 -BN composite particles to float and remove together.

实施例3Example 3

本实施例和实施例1基本相同,不同之处在于:本实施例将冶金级硅加热至1500℃,保温时间为40min,所述冶金级硅纯度为99.5%,其中硼杂质含量为50ppm。采用的氮化剂为N2和NH3,含N浓度为8%,氮化时间为100s。第二步中电流强度35A,电压:300V,频率:70kHz,功率:10.5kW,净化时间:60s。本实施例第四步中,将富含氮化物颗粒的多晶硅粉碎至15μm,加入氯化铵颗粒质量为富含氮化物颗粒的多晶硅质量的100%,氮化温度:900℃,流动性N2的流量为300mL/min,氮化时间:60min。This embodiment is basically the same as Embodiment 1, except that: this embodiment heats metallurgical grade silicon to 1500° C. for 40 minutes, the metallurgical grade silicon has a purity of 99.5%, and the boron impurity content is 50 ppm. The nitriding agents used were N 2 and NH 3 , the N concentration was 8%, and the nitriding time was 100s. In the second step, the current intensity is 35A, the voltage: 300V, the frequency: 70kHz, the power: 10.5kW, and the purification time: 60s. In the fourth step of this embodiment, the polysilicon rich in nitride particles is pulverized to 15 μm, the mass of ammonium chloride particles is 100% of that of the polysilicon rich in nitride particles, the nitridation temperature is 900°C, and the fluidity is N 2 The flow rate was 300mL/min, and the nitridation time was 60min.

本实施例最终获得多晶硅硼杂质含量为3ppm,氮化硅产物纯度达到99.9%。In this example, the content of polysilicon and boron impurities finally obtained is 3 ppm, and the purity of the silicon nitride product reaches 99.9%.

在上文中结合具体的示例性实施例详细描述了本发明。但是,应当理解,可在不脱离由所附权利要求限定的本发明的范围的情况下进行各种修改和变型。详细的描述和附图应仅被认为是说明性的,而不是限制性的,如果存在任何这样的修改和变型,那么它们都将落入在此描述的本发明的范围内。此外,背景技术旨在为了说明本技术的研发现状和意义,并不旨在限制本发明或本申请和本发明的应用领域。The present invention has been described in detail above with reference to specific exemplary embodiments. However, it should be understood that various modifications and variations can be made without departing from the scope of the present invention as defined by the appended claims. The detailed description and drawings are to be regarded in an illustrative rather than a restrictive sense, and if any such modifications and variations exist, they will fall within the scope of the invention described herein. In addition, the background art is intended to illustrate the research and development status and significance of the present technology, and is not intended to limit the present invention or the application and application fields of the present invention.

Claims (8)

1. A method for removing boron impurities in metallurgical silicon by nitridation-purification is characterized in that a nitriding agent is added into a metallurgical-grade silicon melt, the nitriding agent has adsorption and nitridation effects on the boron impurities and can convert the boron impurities into nitrides, then electromagnetic force is applied to the nitrided silicon melt to gather nitride particles to the periphery of the silicon melt, then the silicon melt and the boron impurity particles are forcedly cooled and separated, and the polysilicon which is separated and is rich in the nitride particles is used for producing silicon nitride;
the method comprises the following specific steps:
the first step is as follows: nitriding blowing
Firstly, heating metallurgical-grade silicon to a molten state, and then blowing a nitridizing agent into a metallurgical-grade silicon melt to perform a nitriding reaction;
the second step is that: electromagnetic decontamination
Applying electromagnetic force to the nitrided melt obtained after the nitridation reaction in the step one to gather nitride particles around the silicon melt;
the third step: cooling and separating
Forcibly cooling the silicon melt obtained in the step two to obtain polycrystalline silicon rich in nitride particles around, and then mechanically separating the polycrystalline silicon rich in nitride particles around to respectively obtain polycrystalline silicon rich in nitride particles and polycrystalline silicon after boron removal;
the fourth step: silicon nitride preparation
Crushing the polycrystalline silicon rich in nitride particles obtained in the third step, and immediately carrying out nitridation treatment to obtain a silicon nitride product;
the mechanical separation interface is 5-15 mm from the surface to the inside of the polycrystalline silicon rich in nitride particles.
2. The method for removing boron impurities in metallurgical silicon by nitridation-purification according to claim 1, wherein the specific steps of the first step are as follows: firstly, heating metallurgical-grade silicon to be above a silicon melting point, preserving heat for 30-120 min to enable the metallurgical-grade silicon to be completely melted to form a metallurgical-grade silicon melt, and then blowing a nitriding agent into the metallurgical-grade silicon melt by taking argon as a carrier gas to carry out nitriding reaction.
3. The method for removing boron impurities in metallurgical silicon by nitridation-purification according to claim 1, wherein the third step comprises the following specific steps: and B, blowing nitrogen to the outer side of the silicon melt obtained in the step two for forced cooling, closing the electromagnetic force to obtain polycrystalline silicon rich in nitride particles around, and mechanically separating the polycrystalline silicon rich in the nitride particles around to respectively obtain polycrystalline silicon rich in the nitride particles and polycrystalline silicon subjected to boron removal.
4. The method for removing boron impurities in metallurgical silicon by nitridation-purification according to claim 1, wherein the fourth step comprises the following specific steps: the polycrystalline silicon rich in nitride particles obtained in the third step is crushed, and ammonium chloride particles are added, and the fluidity N is adjusted2And carrying out nitriding treatment under the atmosphere to obtain a silicon nitride product.
5. The method for removing boron impurities in metallurgical silicon by nitridation-purification according to claim 1 or 3, wherein the electromagnetic force has electromagnetic parameters as follows: current intensity is 10-50A, voltage: 200-550V, frequency: 50-100 kHz, power: 4 ~ 25kW, electromagnetism purifying time: 10 to 180 s.
6. A nitridation-purification method for removing boron impurities from metallurgical silicon according to claim 1 or 2, wherein: the nitriding agent is N2And/or NH3The nitrogen concentration of the nitriding agent is 0.1-10%, and the nitriding time is 5-180 s.
7. The nitridation-purification method for removing boron impurities in metallurgical silicon according to claim 4, wherein: the polycrystalline silicon rich in the nitride particles is crushed to a particle size range of 10-50 mu m, the adding amount of ammonium chloride is 20-100% of the mass of the polycrystalline silicon rich in the nitride particles, and the particle size range of the ammonium chloride particles is 10-50 mu m.
8. The method for removing boron impurities in metallurgical silicon by nitridation-purification according to claim 1 or 4, wherein: the temperature range of the nitriding treatment is 600-1200 ℃, and the fluidity N is2The flow rate of the nitrogen source is 100-500 mL/min, and the nitriding time is 20-180 min.
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