CN112733356B - Method, apparatus and storage medium for predicting lifetime of switching device - Google Patents
Method, apparatus and storage medium for predicting lifetime of switching device Download PDFInfo
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- CN112733356B CN112733356B CN202110003417.3A CN202110003417A CN112733356B CN 112733356 B CN112733356 B CN 112733356B CN 202110003417 A CN202110003417 A CN 202110003417A CN 112733356 B CN112733356 B CN 112733356B
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Abstract
The invention relates to a method for predicting the lifetime of a switching device, comprising: acquiring mechanical life parameters of a switching device; acquiring an electrical life parameter of the switching device; and determining the predicted service life of the switching device according to the mechanical service life parameter and the electrical service life parameter. The problem of carry out life-span prediction to switching device is solved, have higher security, can predict its life before the switching device breaks down, the maintainer of being convenient for overhauls corresponding device, can save a large amount of manpowers, material resources and financial resources. The invention also discloses a device and a storage medium for predicting the service life of the switching device.
Description
Technical Field
The present application relates to the technical field of rail transit trains, and in particular, to a method, an apparatus, and a storage medium for predicting a lifetime of a switching device.
Background
In rail transit, the high-voltage switch device is responsible for switching on and off between a power grid and a traction converter, and the high-voltage switch device has important significance for reliable work of the traction converter.
In the prior art, the state monitoring of the high-voltage switch device is mainly based on the monitoring of the state of a railway vehicle, so that the state of the high-voltage switch device is monitored, or the high-voltage switch device is replaced in a manual regular maintenance mode when the service life of the high-voltage switch device expires.
In the process of implementing the embodiments of the present disclosure, it is found that at least the following problems exist in the related art: the technical scheme for monitoring the state of the high-voltage switch device based on monitoring the state of the rail vehicle has hysteresis and low safety; the manual regular maintenance mode wastes a large amount of manpower and material resources.
Disclosure of Invention
The embodiment of the disclosure provides a method, a device and a storage medium for predicting the service life of a switching device, so as to solve the technical problems of low timeliness, low safety and great waste of manpower and material resources in the existing technical scheme for monitoring the state of a high-voltage switching device to a certain extent.
In a first aspect, a method for predicting a lifetime of a switching device is provided, the method comprising: acquiring a mechanical life parameter of the switching device; acquiring an electrical life parameter of the switching device; and determining the predicted service life of the switching device according to the mechanical service life parameter and the electrical service life parameter.
With reference to the first aspect, in a first possible implementation manner of the first aspect, the acquiring an electrical lifetime parameter of the switching device includes: acquiring the switching times of the switching device under the breaking current and the switching times of the switching device under the breaking current; and calculating the electric service life parameter according to the switched times and the switchable times.
With reference to the first possible implementation of the first aspectIn a second possible implementation manner of the first aspect, the electrical lifetime parameter Life is obtained by the following formula electri ：
Wherein n is k For said number of switched times, N k Is the switchable number.
With reference to the first possible implementation manner of the first aspect or the second possible implementation manner of the first aspect, in a third possible implementation manner of the first aspect, the obtaining the switchable number includes: and acquiring the switching times of at least one switching device under the test current before failure, and calculating the average value of the switching times, wherein the average value is the switchable times, and the test current value is any current value between the minimum current value and the maximum current value which can be divided by the switching device.
With reference to the first aspect, in a fourth possible implementation manner of the first aspect, the acquiring a mechanical life parameter of the switching device includes: acquiring the number of times of the switch device which is operated and the rated number of times of the switch device which is operated; and calculating to obtain the mechanical life parameter according to the actuated times and the rated actuated times.
With reference to the fourth possible implementation manner of the first aspect, in a fifth possible implementation manner of the first aspect, the acquiring the number of times the switching device has been operated includes: and acquiring the actuated times by monitoring a feedback contact of the switching device.
With reference to the fourth possible implementation manner of the first aspect, in a sixth possible implementation manner of the first aspect, the mechanical Life parameter Life is obtained through the following formula machi ：
Wherein n is machi For said number of acted times, N machi Is the rated action times.
With reference to the first aspect, in a seventh possible implementation manner of the first aspect, the determining a predicted lifetime of the switching device includes: and acquiring the smaller value of the mechanical life parameter and the electrical life parameter, wherein the smaller value is the predicted life.
In a second aspect, an apparatus for predicting a lifetime of a switching device is provided, comprising: the mechanical life module is used for acquiring mechanical life parameters of the switching device; the electric service life module is used for acquiring electric service life parameters of the switching device; and the predicted service life module is used for determining the predicted service life of the switching device according to the mechanical service life parameter and the electrical service life parameter.
In a third aspect, a storage medium is provided, the storage medium storing a computer program comprising program instructions which, when executed by a processor, cause the processor to perform the aforementioned method for predicting a lifetime of a switching device.
The method, the device and the storage medium for predicting the service life of the switching device provided by the embodiment of the disclosure can realize the following technical effects:
the problem of carry out life-span prediction to the switching device is solved, have higher security, can predict its life before the switching device breaks down, the maintainer of being convenient for overhauls corresponding device, can save a large amount of manpowers, material resources and financial resources.
The foregoing general description and the following description are exemplary and explanatory only and are not restrictive of the application.
Drawings
One or more embodiments are illustrated in the accompanying drawings, which correspond to the accompanying drawings and not in a limiting sense, in which elements having the same reference numeral designations represent like elements, and in which:
FIG. 1 is a schematic flow diagram of a method for predicting switching device life provided by an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of an electrical lifetime curve of a switching device provided by an embodiment of the present disclosure;
FIG. 3 is a schematic diagram illustrating a flow of predicting an electrical lifetime of a switching device provided by an embodiment of the present disclosure;
fig. 4 is a schematic flow chart of predicting mechanical life of a switching device according to an embodiment of the present disclosure.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided in the present application without any inventive step are within the scope of protection of the present application.
It is obvious that the drawings in the following description are only examples or embodiments of the present application, and that it is also possible for a person skilled in the art to apply the present application to other similar contexts on the basis of these drawings without inventive effort. Moreover, it should be appreciated that such a development effort might be complex and tedious, but would nevertheless be a routine undertaking of design, fabrication, and manufacture for those of ordinary skill having the benefit of this disclosure, given the benefit of this disclosure, without departing from the scope of this disclosure.
Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the specification. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of ordinary skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments without conflict.
Unless defined otherwise, technical or scientific terms referred to herein shall have the ordinary meaning as understood by those of ordinary skill in the art to which this application belongs. Reference to "a," "an," "the," and similar words throughout this application are not to be construed as limiting in number, and may refer to the singular or the plural. The present application is directed to the use of the terms "including," "comprising," "having," and any variations thereof, which are intended to cover non-exclusive inclusions; for example, a process, method, system, article, or apparatus that comprises a list of steps or modules (elements) is not limited to the listed steps or elements, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
The failure mechanism of the high-voltage switch device comprises three types of contact failure, electromagnetic mechanism failure and peripheral device failure, wherein the contact failure is caused by the fact that contact electric abrasion is too serious, main contacts are welded or damaged to cause poor contact, so that the contacts cannot be normally closed or opened, the electromagnetic mechanism failure is caused by the fact that electromagnetic coils are in failure or mechanical structures such as spring iron cores are not normally closed, and the peripheral device failure is caused by the fact that an intermediate relay monitoring board card is abnormal. The failure rate of the high-voltage switch device caused by contact failure is more than 80%. The switching device in the embodiments of the present disclosure is responsible for switching between the grid and the traction converter, and includes, but is not limited to, a high voltage switching device.
In the following, the concepts involved in the embodiments of the present disclosure are described, and in the embodiments of the present disclosure, the mechanical lifetime of the switching device refers to the mechanical wear resistance of the switching device, which can be characterized by the number of times the switching device is unloaded.
Fig. 1 is a schematic flow diagram of a method for predicting a lifetime of a switching device provided by an embodiment of the present disclosure. As shown in fig. 1, an embodiment of the present disclosure provides a method for predicting a lifetime of a switching device, the method including: step S1: acquiring mechanical life parameters of a switching device; step S2: acquiring an electrical life parameter of a switching device; and step S3: and determining the predicted service life of the switching device according to the mechanical service life parameter and the electrical service life parameter.
The method for predicting the service life of the switching device provided by the embodiment of the disclosure can realize the following technical effects: the problem of carry out life-span prediction to switching device is solved, compare in prior art, based on monitoring rail vehicle's state, and then the technical scheme of monitoring switching device's state, have higher security, can predict its life before switching device breaks down, and the timeliness is high, and the maintainer of being convenient for overhauls corresponding device, can save a large amount of manpowers, material resources and financial resources.
In some embodiments, obtaining an electrical lifetime parameter of the switching device comprises: acquiring the switching times of the switching device under the breaking current and the switching times of the switching device under the breaking current; and calculating to obtain the electric service life parameter through the number of times of switching and the number of times of switching. The electric service life of the switching device is predicted based on the breaking current of the main contact and the breaking relation curve.
In some embodiments, the electrical Life parameter Life is obtained by the following equation electri ：
Wherein n is k To a switched number of times, N k Is a switchable number. The actual breaking current of the switching device is monitored in state and combined with a calculation formula, so that the electric service Life parameter Life can be calculated electri To evaluate the damage condition of the contact of the switching device. When Life electri When =0, the contact is invalid, and the maintainer needs to be informed in time to replace the switching device, so that the situation that the switching device cannot be normally disconnected and potential safety hazards are brought to train operation can be effectively prevented.
In some embodiments, obtaining the switchable number comprises: obtaining the switching times of at least one switching device under test current before failure, calculating the average value of the switching times, wherein the average value is the switchable times, and the test current value is the maximum disjunction time of the switching deviceLow current value I min To a maximum current value I max Any current value in between. Fig. 2 is a schematic diagram of an electrical lifetime curve of a switching device provided by an embodiment of the disclosure. In fig. 2, the abscissa is the switchable frequency, the ordinate is the test current value, and a curve obtained by fitting the relationship between the switchable frequency of the switching device and the current at each test current is shown in fig. 2. The point k on the curve in FIG. 2 indicates the current value I k Before failure of the switching device is at I k The number of switchable times is N k Wherein, I k The current sensor can detect the action moment of the switching device, and the service life coefficient loss of the switching device is 1/N after the switching device acts k 。
Fig. 3 is a schematic diagram of a flow of predicting an electrical lifetime of a switching device according to an embodiment of the present disclosure. As shown in FIG. 3, for an un-failed switching device, the test switching device is tested for current I k The number of times of switching; judging the electrical Life parameter Life electri Whether or not it is 0, if the electric Life parameter Life electri =0, the switch device is invalid, and the switch device is replaced; if electrical Life parameter Life electri Not equal to 0, the number of times the switching device has been switched is continuously detected.
In some embodiments, obtaining a mechanical lifetime parameter of the switching device comprises: acquiring the number of times of the switch device acting and the rated number of times of the switch device acting; and calculating to obtain the mechanical life parameter according to the operated times and the rated operated times.
In some embodiments, obtaining the number of times the switching device has been actuated comprises: the number of times of action has been obtained by monitoring the feedback contacts of the switching device. Taking a normally open contact as an example, assuming that voltages at two sides of the contact are 110V and 0V respectively, when a switching device is closed, the normally open contact is closed, voltages at two ends are both 110V, a voltage difference is 0V, and a potential is a low level; when the switch device is switched off, the normally open contact is switched off, the voltage at two ends is 110V, and the potential is high level. The number of times of action of the switch device can be obtained by detecting the potential change at two ends of the normally open contact, and the number of times of action is compared with the rated number of times of action provided in a data manual, so that the mechanical life of the switch device can be predicted through a mechanical life parameter formula. When the action times of the switching device reach the rated action times, the switching device is considered to be failed, and the corresponding switching device needs to be replaced.
In some embodiments, the mechanical Life parameter Life is obtained by the following formula machi ：
Wherein n is machi For the number of times of action, N machi Is the rated number of actions. The prediction of the mechanical life of a switching device is made by comparing the number of times the device has been actuated with the nominal number of times. A switching frequency counter may be provided which increments by one each time the switching device is actuated. The rated action times of the switching device is about 200 ten thousand, and the rated action times of the switching device is determined according to the specific model of the switching device.
Fig. 4 is a schematic diagram illustrating a mechanical life prediction process of a switching device according to an embodiment of the disclosure. As shown in fig. 4, for an unvalidated switching device, the number of times the switching device has been actuated is detected; judging whether the rated action times are reached, if so, failing the switch device, and replacing the switch device; if the number of times of operation does not reach the rated number of times of operation, the number of times of operation of the switching device is continuously detected.
In some embodiments, determining the predicted lifetime of the switching device comprises: and acquiring the smaller value of the mechanical life parameter and the electrical life parameter, wherein the smaller value is the predicted life. Compare Life machi And Life electri And taking the smaller value as the predicted service life of the switching device. When the predicted service life is equal to 0, the failure of the switching device can be judged, and a maintainer is informed to replace the failed switching device so as to avoid accidents.
The embodiment of the present disclosure also provides an apparatus for predicting a lifetime of a switching device, including: the mechanical life module is used for acquiring mechanical life parameters of the switching device; the electric service life module is used for acquiring electric service life parameters of the switching device; and the life predicting module is used for determining the predicted life of the switching device according to the mechanical life parameter and the electrical life parameter.
The above modules may be functional modules or program modules, and may be implemented by software or hardware. For a module implemented by hardware, the modules may be located in the same processor; or the modules can be respectively positioned in different processors in any combination form
Embodiments of the present disclosure also provide a storage medium storing a computer program comprising program instructions which, when executed by a processor, cause the processor to perform the aforementioned method for predicting lifetime of a switching device.
The method, the device and the storage medium for predicting the service life of the switching device provided by the embodiment of the disclosure determine a prediction method of the mechanical service life of the switching device, namely, the number of times of the switch device acting is compared with the rated number of times of the switch device acting, when the rated number of times of the switch device acting is reached, the mechanical service life of the switching device is reached, and the switching device fails; the method for predicting the electric life of the switching device is also determined, a relation curve of the test current value and the switchable times is fitted, and the electric life of the switching device is determined according to an electric life parameter formula by detecting the switchable times under the test current value; the predicted lifetime of the switching device will be determined in combination with the mechanical lifetime parameter and the electrical lifetime parameter. The switch device is convenient for maintenance personnel to replace the switch device in time, the safety is high, the timeliness is good, a large amount of manpower and material resources can be saved, and the economic value is high.
The foregoing description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in other forms, so that those skilled in the art may apply the above-described modifications and variations to the disclosed embodiments without departing from the spirit of the present invention.
Claims (3)
1. A method for predicting switching device lifetime, comprising:
acquiring mechanical life parameters of the switching device; acquiring mechanical life parameters of the switching device, including:
acquiring the operated times of the switching device and the rated operated times of the switching device; acquiring the number of times the switching device has been actuated, including: acquiring the operated times by monitoring a feedback contact of the switching device; calculating to obtain the mechanical life parameter according to the actuated times and the rated actuated times; the mechanical life parameter is obtained by the following formula
：
Wherein the content of the first and second substances,
for said number of actuated times>
The rated action times are taken;
acquiring an electrical life parameter of the switching device; obtaining an electrical lifetime parameter of the switching device, comprising:
acquiring the switching times of the switching device under the breaking current and the switching times of the switching device under the breaking current; acquiring the switchable number of times, including: acquiring switching times of at least one switching device under test current before failure, and calculating an average value of the switching times, wherein the average value is the switching times, and the test current value is any current value between a minimum current value and a maximum current value which can be divided by the switching device; calculating the electric service life parameter according to the switched times and the switchable times; obtained by the following formulaTo the electrical life parameter
：
Wherein, the first and the second end of the pipe are connected with each other,
for said switched times>
Is the switchable number;
determining a predicted lifetime of the switching device according to the mechanical lifetime parameter and the electrical lifetime parameter; determining a predicted lifetime of the switching device, comprising: and acquiring the smaller value of the mechanical service life parameter and the electrical service life parameter, wherein the smaller value is the predicted service life.
2. An apparatus for predicting a lifetime of a switching device, comprising a mechanical lifetime module, an electrical lifetime module, and a predicted lifetime module;
the mechanical life module is used for acquiring mechanical life parameters of the switching device; acquiring mechanical life parameters of the switching device, including:
acquiring the operated times of the switching device and the rated operated times of the switching device; acquiring the number of times the switching device has been actuated, including: acquiring the operated times by monitoring a feedback contact of the switching device; calculating to obtain the mechanical life parameter according to the acted times and the rated acted times; the mechanical life parameter is obtained by the following formula
：
Wherein the content of the first and second substances,
for said actuated number of times, is selected>
The rated action times are taken;
the electric service life module is used for acquiring electric service life parameters of the switching device; obtaining an electrical lifetime parameter of the switching device, comprising:
acquiring the switching times of the switching device under the breaking current and the switchable times of the switching device under the breaking current; acquiring the switchable number, including: acquiring switching times of at least one switching device under test current before failure, and calculating an average value of the switching times, wherein the average value is the switching times, and the test current value is any current value between a minimum current value and a maximum current value which can be divided by the switching device; calculating to obtain the electric service life parameter through the number of times of switching and the number of times of switching; the electrical lifetime parameter is obtained by the following formula
：
Wherein the content of the first and second substances,
for said switched number of times, is>
The number of times that the switch can be switched is the number of times that the switch can be switched;
a predicted life module for determining a predicted life of the switching device based on the mechanical life parameter and the electrical life parameter; determining a predicted lifetime of the switching device, comprising: and acquiring the smaller value of the mechanical service life parameter and the electrical service life parameter, wherein the smaller value is the predicted service life.
3. A storage medium, characterized in that the storage medium stores a computer program comprising program instructions which, when executed by a processor, cause the processor to carry out the method for predicting a lifetime of a switching device according to claim 1.
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| CN103616634A (en) * | 2013-11-30 | 2014-03-05 | 国家电网公司 | Method and device for transformer on-load tap switch contact service life online monitoring |
| CN110737569A (en) * | 2018-07-19 | 2020-01-31 | 苏州西门子电器有限公司 | Data processing method, device and system for monitoring service life of equipment and storage medium |
| CN111104643B (en) * | 2018-10-29 | 2023-03-21 | 北京圣涛平试验工程技术研究院有限责任公司 | Switch life evaluation method and system |
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