CN112731815B - Method for improving analog quantity acquisition precision - Google Patents
Method for improving analog quantity acquisition precision Download PDFInfo
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- CN112731815B CN112731815B CN202011490713.2A CN202011490713A CN112731815B CN 112731815 B CN112731815 B CN 112731815B CN 202011490713 A CN202011490713 A CN 202011490713A CN 112731815 B CN112731815 B CN 112731815B
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Abstract
In order to solve the technical problem that the existing embedded computer equipment cannot meet the requirement of analog acquisition precision in the working temperature range due to component parameter drift, the invention provides a method for improving the analog acquisition precision. And then calculating the functional relation, the functional relation coefficient and the check value thereof between the analog quantity excitation value and the acquisition value in different temperature intervals, and storing the functional relation coefficient and the check value thereof in a product storage unit. When the embedded computer equipment collects analog quantity, firstly, reading the stored function relation coefficient and the check value thereof, and checking, if the check is passed, obtaining the environmental temperature of the equipment through a temperature collection unit in the equipment, and outputting the analog quantity collection result after calibrating; if the verification is not passed, calibration is not performed, and an analog quantity acquisition result is directly output.
Description
Technical Field
The invention relates to a method for improving analog quantity acquisition accuracy.
Background
In the field of aviation and industrial control, the method has higher requirements on analog quantity acquisition precision of embedded computer equipment in a working temperature range. The usual solutions are: hardware methods such as components with high precision, and AD converters with high numbers of bits are used in the signal conditioning circuit. However, when the environmental temperature changes greatly, the analog acquisition precision is reduced due to the drift of component parameters, so that the equipment cannot meet the system requirements.
Disclosure of Invention
The invention provides a method for improving the analog acquisition precision, which aims to solve the technical problem that the existing embedded computer equipment cannot meet the analog acquisition precision requirement in the working temperature range due to component parameter drift.
The technical scheme of the invention is as follows:
the method for improving the analog quantity acquisition precision is characterized by comprising the following steps of:
step 1: calibrating analog quantity to be acquired under different temperature conditions
Dividing the working temperature range of the equipment into a plurality of temperature intervals according to the system requirement, selecting at least one temperature point in each temperature interval, respectively providing calibrated analog quantity excitation for the equipment at each selected temperature point, and acquiring analog quantity acquisition values after equipment conditioning, acquisition and processing;
step 2: calculation of functional relation coefficient and its check value
Determining the functional relation between the analog quantity excitation value and the acquisition value in different temperature intervals according to the analog quantity excitation value provided in the step 1 and the acquired corresponding analog quantity acquisition value and a calibration algorithm, calculating a functional relation coefficient, and calculating a calibration value of the functional relation coefficient by using a calibration method;
step 3: functional relation coefficient and storage of check value thereof
Designing a storage unit in the embedded computer equipment, and storing the functional relation coefficient and the check value thereof in the storage unit;
step 4: acquisition of device ambient temperature
The temperature acquisition unit is arranged in the embedded computer equipment to acquire the working environment temperature of the equipment. The temperature acquisition unit can be flexibly selected, and comprises and is not limited to an independent temperature sensor or an on-chip temperature acquisition unit with a processor.
Step 5: analog quantity acquisition calibration operation
When analog quantity acquisition is carried out, the embedded computer equipment firstly reads the function relation coefficient and the check value thereof in the storage unit of the equipment, calculates the check value of the read function relation coefficient by adopting the check method same as that in the step 2, compares the calculated check value with the read check value, and if the calculated check value and the read check value are consistent, the check is passed, and at the moment, the equipment working environment temperature is acquired through the temperature acquisition unit in the equipment, and the equipment analog quantity acquisition result is calibrated and then output; if the two are inconsistent, the verification is not passed, and the calibration is not carried out, so that the device analog quantity acquisition result is directly output.
Further, the calibration algorithm adopted in step 2 is a difference method or a least square method.
Further, the checking method adopted in step 2 is sum check or parity check.
Further, in step 3, the data packet header, the function relation coefficient, the check value and the data packet tail are stored in a storage unit.
Further, the method for calibrating the device analog quantity acquisition result in the step 5 specifically comprises the following steps:
substituting the equipment analog quantity acquisition value and the equipment working environment temperature acquired by the equipment internal temperature acquisition unit into the functional relation determined in the step 2, and calculating to obtain a calibrated analog quantity acquisition value by using the functional relation determined in the step 2 and the functional relation coefficient read in the step 5.
The beneficial effects of the invention are as follows:
1. the invention firstly calibrates the analog acquisition of the equipment under different temperature conditions by an analog acquisition processing method combining software and hardware, calculates the functional relation between the analog excitation value and the acquisition value in different temperature intervals, and stores the functional relation coefficient and the check value thereof in an internal memory of the equipment according to a certain rule. In the using process of the device, the environmental temperature of the device is obtained through a temperature sensor configured in the device, and the analog quantity acquisition result is calibrated according to a calibration algorithm and the function relation coefficient and the calibration value in the memory, so that the analog quantity acquisition precision is improved.
2. According to the invention, the verification mechanism is designed for the function relation coefficient, so that the calibration error caused by the error reading of the function relation coefficient is prevented, and the reliability of analog quantity acquisition is improved.
3. The invention can ensure the acquisition and processing requirements of the embedded computer equipment on the analog quantity signals with high precision, high stability and high reliability in the range of the full temperature area.
Drawings
FIG. 1 is a block diagram of a hardware implementation of the method for improving analog acquisition accuracy of the present invention.
FIG. 2 is a software flow chart of the method for improving analog acquisition accuracy of the present invention.
Detailed Description
The invention is further described below with reference to the accompanying drawings.
Before analog quantity acquisition and calibration are carried out, the working temperature range of the equipment is divided into a plurality of temperature intervals, and the equipment acquisition value (without calibration) is obtained by giving an analog quantity excitation value. And then calculating the functional relation, the functional relation coefficient and the check value thereof between the analog quantity excitation value and the acquisition value in different temperature intervals according to a given algorithm, and storing the functional relation, the functional relation coefficient and the check value thereof in a product storage unit. When the embedded computer equipment collects analog quantity, firstly, reading functional relation coefficients and check values thereof in an equipment storage unit, checking according to a preset checking method, and if the check is passed, acquiring the equipment environment temperature through an equipment temperature acquisition unit, and outputting after calibration according to a preset calibration algorithm; if the verification is not passed, calibration is not performed, and an analog quantity acquisition result is directly output.
Referring to fig. 1 and 2, the method for improving analog acquisition accuracy according to the present invention comprises the following specific implementation processes:
step 1: calibrating analog quantity to be acquired under different temperature conditions
Dividing the working temperature range of the equipment into a plurality of temperature intervals according to the system requirement, selecting at least one temperature point in each temperature interval, respectively providing calibrated analog quantity excitation for the equipment at each selected temperature point, and obtaining analog quantity acquisition values after equipment conditioning, acquisition and processing.
Step 2: calculation of functional relation coefficient and its check value
And (3) determining the functional relation between the analog excitation value and the acquisition value in different temperature intervals according to a given calibration algorithm (such as an interpolation method, a least square method and the like) according to the analog excitation value provided in the step (1) and the acquired corresponding analog acquisition value, calculating a functional relation coefficient, and calculating a check value of the functional relation coefficient by using a check method (for example, calculating a check value of calibration data by using sum check, parity check and the like).
Step 3: functional relation coefficient and storage of check value thereof
The storage unit is designed in the embedded computer equipment, the functional relation coefficient is stored in the storage unit according to the forms of the data packet head, the functional relation coefficient, the check value and the data packet tail, and the reliability of the functional relation coefficient storage is improved. The storage unit can be flexibly selected, including but not limited to an independent memory and a storage unit in the processor.
Step 4: acquisition of device ambient temperature
The temperature acquisition unit is arranged in the embedded computer equipment to acquire the working environment temperature of the equipment. The temperature acquisition unit can be flexibly selected, and comprises and is not limited to an independent temperature sensor or an on-chip temperature acquisition unit with a processor.
Step 5: analog quantity acquisition calibration operation
When the embedded computer equipment collects analog quantity, firstly, the function relation coefficient and the check value in the storage unit of the equipment are read, the check value of the read function relation coefficient is calculated according to the same check method as the step 2, the calculated check value is compared with the read check value,
if the two parameters are consistent, the verification is passed, at the moment, the temperature of the working environment of the equipment is obtained through a temperature acquisition unit in the equipment, and the analog acquisition value of the equipment is calibrated according to the same calibration algorithm as the step 2 and then output;
if the two are inconsistent, the verification is not passed, and the device analog quantity acquisition value is not calibrated, but the device analog quantity acquisition result is directly output.
The specific method for calibration is as follows: substituting the equipment analog quantity acquisition value and the equipment working environment temperature acquired by the equipment internal temperature acquisition unit into the functional relation determined in the step 2, and calculating to obtain a calibrated analog quantity acquisition result by using the functional relation determined in the step 2 and the functional relation coefficient read in the step 5.
Claims (5)
1. The method for improving the analog quantity acquisition precision is characterized by comprising the following steps of:
step 1: calibrating analog quantity to be acquired under different temperature conditions
Dividing the working temperature range of the equipment into a plurality of temperature intervals according to the system requirement, selecting at least one temperature point in each temperature interval, respectively providing calibrated analog quantity excitation for the equipment at each selected temperature point, and acquiring analog quantity acquisition values after equipment conditioning, acquisition and processing;
step 2: calculation of functional relation coefficient and its check value
Determining the functional relation between the analog quantity excitation value and the acquisition value in different temperature intervals according to the analog quantity excitation value provided in the step 1 and the acquired corresponding analog quantity acquisition value and a calibration algorithm, calculating a functional relation coefficient, and calculating a calibration value of the functional relation coefficient by using a calibration method;
step 3: functional relation coefficient and storage of check value thereof
Designing a storage unit in the embedded computer equipment, and storing the functional relation coefficient and the check value thereof in the storage unit;
step 4: acquisition of device ambient temperature
Acquiring the working environment temperature of the equipment by arranging a temperature acquisition unit in the embedded computer equipment; the temperature acquisition unit can be flexibly selected, and comprises and is not limited to an independent temperature sensor or an on-chip temperature acquisition unit with a processor;
step 5: analog quantity acquisition calibration operation
When analog quantity acquisition is carried out, the embedded computer equipment firstly reads the function relation coefficient and the check value thereof in the storage unit of the equipment, calculates the check value of the read function relation coefficient by adopting the check method same as that in the step 2, compares the calculated check value with the read check value, and if the calculated check value and the read check value are consistent, the check is passed, and at the moment, the equipment working environment temperature is acquired through the temperature acquisition unit in the equipment, and the equipment analog quantity acquisition result is calibrated and then output; if the two are inconsistent, the verification is not passed, and the calibration is not carried out, so that the device analog quantity acquisition result is directly output.
2. The method for improving analog quantity acquisition accuracy according to claim 1, wherein: the calibration algorithm adopted in the step 2 is a difference method or a least square method.
3. The method for improving analog quantity acquisition accuracy according to claim 1, wherein: the checking method adopted in the step 2 is sum check or parity check.
4. A method for improving analog acquisition accuracy according to any one of claims 1 to 3, wherein: and 3, storing the data packet in a storage unit according to the forms of the data packet header, the function relation coefficient, the check value and the data packet tail.
5. The method for improving analog quantity acquisition accuracy according to claim 4, wherein: the method for calibrating the equipment analog quantity acquisition result in the step 5 specifically comprises the following steps:
substituting the equipment analog quantity acquisition value and the equipment working environment temperature acquired by the equipment internal temperature acquisition unit into the functional relation determined in the step 2, and calculating to obtain a calibrated analog quantity acquisition value by using the functional relation determined in the step 2 and the functional relation coefficient read in the step 5.
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