CN112712513A - 产品缺陷检测方法、装置、设备及计算机可读存储介质 - Google Patents

产品缺陷检测方法、装置、设备及计算机可读存储介质 Download PDF

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Publication number
CN112712513A
CN112712513A CN202110009783.XA CN202110009783A CN112712513A CN 112712513 A CN112712513 A CN 112712513A CN 202110009783 A CN202110009783 A CN 202110009783A CN 112712513 A CN112712513 A CN 112712513A
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China
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product
anchor
defect
defects
image
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CN202110009783.XA
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English (en)
Chinese (zh)
Inventor
于瑞涛
高巍
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Goertek Inc
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Goertek Inc
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Priority to CN202110009783.XA priority Critical patent/CN112712513A/zh
Publication of CN112712513A publication Critical patent/CN112712513A/zh
Priority to PCT/CN2021/126935 priority patent/WO2022148109A1/fr
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/60—Rotation of whole images or parts thereof
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • G06T7/68—Analysis of geometric attributes of symmetry
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854—Grading and classifying of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10004—Still image; Photographic image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Data Mining & Analysis (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Artificial Intelligence (AREA)
  • General Engineering & Computer Science (AREA)
  • Evolutionary Biology (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Computation (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geometry (AREA)
  • Quality & Reliability (AREA)
  • Image Analysis (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN202110009783.XA 2021-01-05 2021-01-05 产品缺陷检测方法、装置、设备及计算机可读存储介质 Pending CN112712513A (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN202110009783.XA CN112712513A (zh) 2021-01-05 2021-01-05 产品缺陷检测方法、装置、设备及计算机可读存储介质
PCT/CN2021/126935 WO2022148109A1 (fr) 2021-01-05 2021-10-28 Procédé et appareil de détection de défauts de produits, dispositif et support de stockage lisible par ordinateur

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202110009783.XA CN112712513A (zh) 2021-01-05 2021-01-05 产品缺陷检测方法、装置、设备及计算机可读存储介质

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CN112712513A true CN112712513A (zh) 2021-04-27

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CN (1) CN112712513A (fr)
WO (1) WO2022148109A1 (fr)

Cited By (3)

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CN114187269A (zh) * 2021-12-07 2022-03-15 北京工业大学 小零器件表面缺陷边缘快速检测方法
WO2022148109A1 (fr) * 2021-01-05 2022-07-14 歌尔股份有限公司 Procédé et appareil de détection de défauts de produits, dispositif et support de stockage lisible par ordinateur
WO2023218441A1 (fr) * 2022-05-11 2023-11-16 Inspekto A.M.V. Ltd. Optimisation d'un groupe de référence pour inspection visuelle

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CN116563237B (zh) * 2023-05-06 2023-10-20 大连工业大学 一种基于深度学习的鸡胴体缺陷高光谱图像检测方法
CN117351062B (zh) * 2023-12-04 2024-02-23 尚特杰电力科技有限公司 风机扇叶缺陷诊断方法、装置、系统及电子设备

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WO2022148109A1 (fr) * 2021-01-05 2022-07-14 歌尔股份有限公司 Procédé et appareil de détection de défauts de produits, dispositif et support de stockage lisible par ordinateur
CN114187269A (zh) * 2021-12-07 2022-03-15 北京工业大学 小零器件表面缺陷边缘快速检测方法
CN114187269B (zh) * 2021-12-07 2024-04-05 北京工业大学 小零器件表面缺陷边缘快速检测方法
WO2023218441A1 (fr) * 2022-05-11 2023-11-16 Inspekto A.M.V. Ltd. Optimisation d'un groupe de référence pour inspection visuelle

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