CN112710454A - System and method for testing and calibrating optical switch in optical switch array - Google Patents
System and method for testing and calibrating optical switch in optical switch array Download PDFInfo
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- CN112710454A CN112710454A CN202011566308.4A CN202011566308A CN112710454A CN 112710454 A CN112710454 A CN 112710454A CN 202011566308 A CN202011566308 A CN 202011566308A CN 112710454 A CN112710454 A CN 112710454A
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Abstract
The invention discloses a system and a method for testing and calibrating optical switches in an optical switch array.A host computer controls an optical switch control power supply to output voltage to each optical switch, scans a first voltage-optical power response curve of each optical switch, determines the voltage corresponding to an optical power extreme value, sets the voltage as the first working point voltage of each optical switch, and finishes the first scanning; and the upper computer controls the optical switch control power supply to output voltage to each optical switch again, scans a second voltage-optical power response curve of each optical switch, determines the voltage corresponding to the optical power extreme value, sets the voltage as a second working point voltage of each optical switch, completes the second scanning until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch scanned at the last time is smaller than a first preset threshold value, or the switch extinction ratio of each optical switch is larger than a second preset threshold value, and completes the testing and calibration of the optical switches.
Description
Technical Field
The invention relates to the technical field of photonic link testing, in particular to a system and a method for testing and calibrating an optical switch in an optical switch array.
Background
The optical switch can realize the switching of optical signal transmission on different optical paths, and a plurality of optical switches are combined into an array or a network, so that various devices such as an optical delay line, an optical switch and the like can be realized, and the optical switch has important application in the field of optical communication. The common implementation modes of the optical switch are various, including micro-electromechanical systems, silicon dioxide planar optical circuits, III-V materials, silicon-based optoelectronic integration and the like.
In order to realize optical path switching of an optical switch in a system link such as an optical delay line and an optical switch, the state of the optical switch needs to be set to an optimal operating point, and thus the operating point of the optical switch needs to be tested and calibrated. As shown in fig. 1, a single optical switch may include an MZI model and an MRR model, and the optical power at any output port of the optical switch may be scanned by applying a voltage, and a voltage value corresponding to an optical power extreme value of the optical switch may be found on a response curve of voltage-optical power, that is, the switch operating point of the optical switch is obtained. For the optical switches in the system links such as the optical delay line and the optical switch, if the system is built based on discrete devices, the optimal working point of each optical switch can be calibrated independently, although the method can accurately calibrate the state of each optical switch, the link needs to be changed frequently, and the testing efficiency is low; if the system is integrated on-chip, it is difficult to directly test a single optical switch. For this, there are two common methods. One is to adjust a certain optical switch, detect the output optical power at a certain output port corresponding to the optical switch, and find out the working point of the optical switch through the optical power extreme value. The other method is to set up output ports, detectors on the chip and the like, and set up optical power monitoring modes at multiple positions on the chip, so that each optical switch can be subjected to single voltage-optical power scanning, and the calibration of the state of the optical switch is relatively accurate.
Aiming at the problem that the optical switches in the optical switch array comprising a plurality of optical switch link structures are difficult to be individually tested and calibrated in the prior art, no effective solution is provided.
Disclosure of Invention
In view of this, embodiments of the present invention provide a system and a method for testing and calibrating an optical switch in an optical switch array, so as to solve the problem in the prior art that it is difficult to individually test and calibrate the optical switches in the optical switch array including a plurality of optical switch link structures.
Therefore, the embodiment of the invention provides the following technical scheme:
in a first aspect of the present invention, a system for testing and calibrating an optical switch in an optical switch array is provided, which includes: the device comprises a laser light source, an optical switch array to be detected, an optical switch control power supply, an optical power meter and an upper computer;
wherein the array of optical switches to be tested comprises a plurality of optical switches;
the laser light source is connected with the input end of the optical switch array to be detected; the optical power meter is connected with the output end of the optical switch array to be measured and is used for measuring the optical power value corresponding to each optical switch in the optical switch array to be measured;
the optical switch control power supply is connected with control electrodes of all optical switches in the optical switch to be tested, and the upper computer is used for controlling output voltage of all channels of the optical switch control power supply and reading optical power values from the optical power meter;
the upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scanning a first voltage-optical power response curve of each optical switch, determining voltage corresponding to an optical power extreme value, setting the voltage as first working point voltage of each optical switch, and finishing first scanning of each optical switch in the chain-shaped optical switch structure;
the upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scanning a second voltage-optical power response curve of each optical switch, determining voltage corresponding to an optical power extreme value, setting the voltage as second working point voltage of each optical switch, and finishing second scanning of each optical switch; and repeating the scanning step until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch corresponding to the last scanning is smaller than a first preset threshold value, or until the switch extinction ratio of each optical switch is larger than a second preset threshold value, and completing the test and calibration of each optical switch in the chain-shaped optical switch structure.
Optionally, the laser light source outputs a continuous optical signal with a single wavelength or a wide frequency within a working wavelength range with constant power to the optical switch array to be tested.
Optionally, the optical switch control power supply can output voltages of a plurality of channels simultaneously, and the output voltages of the channels are independent of each other.
Optionally, the upper computer establishes communication connection with the optical switch control power supply and the optical power meter, and can continuously set output voltages of each channel of the optical switch control power supply and continuously read an optical power value of the optical power meter.
In a second aspect of the present invention, a method for testing and calibrating an optical switch in an optical switch array is provided, where the method includes:
connecting a laser light source to the input end of the optical switch array to be tested; wherein the array of optical switches to be tested comprises a plurality of optical switches;
connecting an optical power meter to the output end of the optical switch array to be tested, and measuring the optical power value corresponding to each optical switch in the optical switch array to be tested through the optical power meter;
connecting an optical switch control power supply to the control electrode of each optical switch in the to-be-detected optical switch;
the upper computer controls the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scans a first voltage-optical power response curve of each optical switch, determines a voltage corresponding to an optical power extreme value, sets the voltage as a first working point voltage of each optical switch, and completes the first scanning of each optical switch in the chain-shaped optical switch structure;
the upper computer controls the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scans a second voltage-optical power response curve of each optical switch, determines the voltage corresponding to the optical power extreme value, sets the voltage as a second working point voltage of each optical switch, and completes second scanning of each optical switch; and repeating the scanning step until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch corresponding to the last scanning is smaller than a first preset threshold value, or until the switch extinction ratio of each optical switch is larger than a second preset threshold value, and completing the test and calibration of each optical switch in the chain-shaped optical switch structure.
The technical scheme of the embodiment of the invention has the following advantages:
the embodiment of the invention provides a system and a method for testing and calibrating an optical switch in an optical switch array, wherein the system for testing and calibrating comprises the following components: the device comprises a laser light source, an optical switch array to be detected, an optical switch control power supply, an optical power meter and an upper computer; the laser light source is connected with the input end of the optical switch array to be detected; the optical power meter is connected with the output end of the optical switch array to be measured and is used for measuring the optical power value corresponding to each optical switch in the optical switch array to be measured; the upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scanning a voltage-optical power response curve of each optical switch, determining the voltage corresponding to an optical power extreme value, taking the voltage as a first working point voltage, and finishing the first scanning of each optical switch in the chain-shaped optical switch structure; the upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scanning a voltage-optical power response curve of each optical switch, determining the voltage corresponding to the optical power extreme value, and taking the voltage as a second working point voltage to finish second scanning of each optical switch; and completing the test and calibration of each optical switch in the chain-shaped optical switch structure until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch corresponding to the last scanning is smaller than a first preset threshold value or until the switch extinction ratio of each optical switch is larger than a second preset threshold value. The problem that in the prior art, the optical switches in the optical switch optical array comprising a plurality of optical switch link structures are difficult to test and calibrate individually is solved. The accurate test and calibration of the states of the optical switches are realized through a simple manufacturing process.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a schematic diagram of a single optical switch MZI model and MRR model;
FIG. 2 is a schematic diagram of a step-type optical delay line structure;
FIG. 3 is a schematic diagram of actual optical path transmission and ideal optical path transmission of an optical signal in a step-type optical delay line;
FIG. 4 is a response curve for a single optical switch in the delay line;
FIG. 5 is a schematic diagram of the response curve of a single optical switch in the delay line as a function of the initial state of the other optical switches;
FIG. 6 is a schematic diagram of a system for testing and calibrating optical switches in an optical switch array according to an embodiment of the present invention;
FIG. 7 is a voltage-optical power response curve for each optical switch;
fig. 8 is a flowchart of a method for testing and calibrating optical switches in an optical switch array according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description of the present application, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are used merely for convenience of description and for simplicity of description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and thus should not be considered as limiting the present application. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more features. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In this application, the word "exemplary" is used to mean "serving as an example, instance, or illustration. Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments. The following description is presented to enable any person skilled in the art to make and use the application. In the following description, details are set forth for the purpose of explanation. It will be apparent to one of ordinary skill in the art that the present application may be practiced without these specific details. In other instances, well-known structures and processes are not set forth in detail in order to avoid obscuring the description of the present application with unnecessary detail. Thus, the present application is not intended to be limited to the embodiments shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
The step-type optical delay line is shown in fig. 2, and there is a structure in which a plurality of MZI type optical switches are cascaded. In an ideal case, since the difference between the upper and lower arm lengths is 0, light is input from port 1 of the MZI type optical switch and is completely output from port 4; however, in an actual process, the splitting ratio of devices such as the split MMI is not uniform and the difference in the upper and lower arm lengths is not 0, so that a part of the optical signal input from the port 1 is output from the port 3. From this analysis, it is inferred that the optical signal in the optical delay line in the initial state ideally travels completely along the solid path, and in the actual state, a part of the optical signal passes through the dashed path, as shown in fig. 3.
The step-type optical delay line is a structure in which waveguides with different lengths are connected among a plurality of MZI-type optical switches, and a certain optical switch in the optical delay line is individually calibrated, and fig. 4 is a curve in which the loss of a certain port of the optical switch changes with the phase shift amount of a thermal phase shift arm, where a dashed curve is a curve response of the optical switch, and a solid curve is a curve response of the optical switch in an optical delay line link. This is because in the test of the optical delay line, only the optical signal can be input from the input port of the delay line, and the switching state of the optical switch cannot be accurately obtained due to the random initial state of the front and rear optical switches after the cascade connection of the plurality of optical switches. As can be seen from fig. 4, the measured Extinction Ratio (ER) of the optical switch in the delay line is significantly worse than its actual extinction ratio.
Further, by changing the initial phase difference of other optical switches, it can be found that the response of the solid curve obtained by scanning the optical switch will also change, as shown in fig. 5, which means that it is difficult to obtain the accurate switching point voltage and the real extinction ratio only by scanning a single optical switch.
In a stepping type optical switch delay line structure, a plurality of MZI type optical switches have a cascade relation, and a single optical switch in the MZI type optical switches is difficult to separately calibrate.
In view of the above problems, in this embodiment, a system for testing and calibrating an optical switch in an optical switch array is provided, fig. 6 is a schematic diagram of a system for testing and calibrating an optical switch in an optical switch array according to an embodiment of the present invention, and as shown in fig. 6, the system for testing and calibrating an optical switch in an optical switch array includes: the device comprises a laser light source, an optical switch array to be detected, an optical switch control power supply, an optical power meter and an upper computer. The optical switch array to be tested comprises a plurality of optical switches, a laser light source is connected with the input end of the optical switch array to be tested, an optical power meter is connected with the output end of the optical switch array to be tested and used for measuring the optical power value corresponding to each optical switch in the optical switch array to be tested, an optical switch control power supply is connected with the control electrode of each optical switch in the optical switch to be tested, and the upper computer is used for controlling the output voltage of each channel of the optical switch control power supply and reading the optical power value from the optical power meter. The upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scanning a voltage-optical power response curve of each optical switch, wherein the voltage-optical power response curve of each optical switch is shown in fig. 7, determining a voltage corresponding to an optical power extreme value, setting the voltage as a first working point voltage, and completing the first scanning of each optical switch in the chain-shaped optical switch structure. For example, the voltages corresponding to the maximum value and the minimum value of the optical power are the voltages of the on/off working points, respectively, and in the actual control process, any optical switch can be set to be the on or off working point, and only an optical signal needs to be ensured to be transmitted to any input port of the next optical switch to be detected.
The upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scanning a voltage-optical power response curve of each optical switch, determining a voltage corresponding to an optical power extreme value, setting the voltage as a second working point voltage, finishing second scanning of each optical switch, repeating the scanning step until the difference value between the working point voltage of each optical switch scanned last and the working point voltage of each optical switch scanned last is smaller than a first preset threshold value, specifically, the first preset threshold value is 0, namely the working point voltage of each optical switch scanned last is equal to the working point voltage of each optical switch scanned last, so as to further ensure the accuracy of test calibration, certainly, in order to improve the efficiency of test calibration, the working point voltage of each optical switch scanned last is slightly different from the working point voltage of each optical switch scanned last, mainly within the error range.
Because the switch working voltage of the optical switch is easily influenced by factors such as temperature and the like to generate certain drift, in order to avoid the influence that the working point voltage difference value is not smaller than the first judgment threshold value, so that the program is infinitely circulated, a new judgment basis is added. The scanning step is repeated until the switch extinction ratio of each optical switch is larger than a second preset threshold (the setting of the second preset threshold refers to the extinction ratio of a single optical switch, for example, the extinction ratio of the single optical switch is 35dB, the second preset threshold can be set to 35dB or appropriate degradation, depending on the size of the optical switch array), and the testing and calibration of each optical switch in the chain optical switch structure are completed.
Through the test and calibration system of the optical switch in the switch array, compared with the prior art that a certain optical switch is adjusted, the output optical power is detected at the output port corresponding to the optical switch, the working point of the optical switch is found out through the optical power extreme value, and the influence of other optical switches in a link on the optical switch is ignored, so that the test error is larger. Compared with the prior art, the optical power monitoring device has the advantages that the optical power monitoring device is arranged at multiple positions on the chip, the difficulty in the manufacturing process is increased, the cost is increased, the manufacturing process is simple, and the cost is effectively reduced.
In an alternative embodiment, the laser source outputs a continuous optical signal of a single wavelength or a broad band within an operating wavelength range of constant power to the optical switch array under test. Specifically, the light source provides an optical signal that can be detected by the optical power meter, and usually a single-wavelength continuous optical signal is adopted, but in some special application scenarios (for example, a wider and higher-frequency-band microwave signal is modulated onto a certain single-wavelength optical signal), a wide-spectrum continuous optical signal in an operating wavelength range can be optionally adopted.
In order to further ensure that the optical switch test calibration is not affected by other optical switches, in an optional embodiment, the optical switch control power supply can simultaneously output the voltages of a plurality of channels, and the output voltages of the channels are independent of each other.
In an optional embodiment, the upper computer establishes communication connection with the optical switch control power supply and the optical power meter, and can continuously set the output voltage of each channel of the optical switch control power supply and continuously read the optical power value of the optical power meter.
In accordance with an embodiment of the present invention, there is provided an embodiment of a method for testing and calibrating optical switches in an optical switch array, it should be noted that the steps illustrated in the flowchart of the accompanying drawings may be performed in a computer system, such as a set of computer-executable instructions, and that while a logical order is illustrated in the flowchart, in some cases the steps illustrated or described may be performed in an order different than here.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
As shown in fig. 8, the method includes:
step S801, connecting a laser light source to the input end of the optical switch array to be tested;
step S802, connecting an optical power meter to the output end of the optical switch array to be measured, and measuring the optical power value corresponding to each optical switch in the optical switch array to be measured through the optical power meter;
step S803, connecting the optical switch control power supply to the control electrodes of each optical switch in the to-be-measured optical switch;
step S804, the upper computer controls the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scans the first voltage-optical power response curve of each optical switch, determines the voltage corresponding to the optical power extreme value, sets the voltage as the first working point voltage, and completes the first scanning of each optical switch in the chain-shaped optical switch structure;
step S805, the upper computer controls the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scans a second voltage-optical power response curve of each optical switch, determines a voltage corresponding to an optical power extreme value, sets the voltage as a second working point voltage, and completes second scanning of each optical switch; and repeating the scanning step until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch corresponding to the last scanning is smaller than a first preset threshold value, or until the switch extinction ratio of each optical switch is larger than a second preset threshold value, and completing the test and calibration of each optical switch in the chain-shaped optical switch structure.
Through the steps, compared with the prior art that a certain optical switch is adjusted, the output optical power is detected at the output port corresponding to the optical switch, the working point of the optical switch is found out through the optical power extreme value, the influence of other optical switches in a link on the optical switch is ignored, and the test error is larger. Compared with the prior art, the optical power monitoring device has the advantages that the optical power monitoring device is arranged at multiple positions on the chip, the difficulty in the manufacturing process is increased, the cost is increased, the manufacturing process is simple, and the cost is effectively reduced.
Although the embodiments of the present invention have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations fall within the scope defined by the appended claims.
Claims (5)
1. A system for testing and calibrating optical switches in an optical switch array, comprising: the device comprises a laser light source, an optical switch array to be detected, an optical switch control power supply, an optical power meter and an upper computer;
wherein the array of optical switches to be tested comprises a plurality of optical switches;
the laser light source is connected with the input end of the optical switch array to be detected; the optical power meter is connected with the output end of the optical switch array to be measured and is used for measuring the optical power value corresponding to each optical switch in the optical switch array to be measured;
the optical switch control power supply is connected with control electrodes of all optical switches in the optical switch to be tested, and the upper computer is used for controlling output voltage of all channels of the optical switch control power supply and reading optical power values from the optical power meter;
the upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scanning a first voltage-optical power response curve of each optical switch, determining voltage corresponding to an optical power extreme value, setting the voltage as first working point voltage of each optical switch, and finishing first scanning of each optical switch in the chain-shaped optical switch structure;
the upper computer is used for controlling the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scanning a second voltage-optical power response curve of each optical switch, determining voltage corresponding to an optical power extreme value, setting the voltage as second working point voltage of each optical switch, and finishing second scanning of each optical switch; and repeating the scanning step until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch corresponding to the last scanning is smaller than a first preset threshold value, or until the switch extinction ratio of each optical switch is larger than a second preset threshold value, and completing the test and calibration of each optical switch in the chain-shaped optical switch structure.
2. The system for testing and calibrating optical switches in an optical switch array according to claim 1, wherein said laser source outputs a continuous optical signal of a single wavelength or a broad band within an operating wavelength range with constant power to said optical switch array under test.
3. The system for testing and calibrating optical switches in an optical switch array according to claim 1, wherein the optical switch control power supply is capable of outputting voltages of a plurality of channels simultaneously, and the output voltages of the channels are independent of each other.
4. The system for testing and calibrating optical switches in an optical switch array according to any one of claims 1 to 3, wherein the upper computer establishes a communication connection with the optical switch control power supply and the optical power meter, and is capable of continuously setting the output voltage of each channel of the optical switch control power supply and continuously reading the optical power value of the optical power meter.
5. A method for testing and calibrating an optical switch in an optical switch array, the method comprising:
connecting a laser light source to the input end of the optical switch array to be tested; wherein the array of optical switches to be tested comprises a plurality of optical switches;
connecting an optical power meter to the output end of the optical switch array to be tested, and measuring the optical power value corresponding to each optical switch in the optical switch array to be tested through the optical power meter;
connecting an optical switch control power supply to the control electrode of each optical switch in the to-be-detected optical switch;
the upper computer controls the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure, scans a first voltage-optical power response curve of each optical switch, determines a voltage corresponding to an optical power extreme value, sets the voltage as a first working point voltage of each optical switch, and completes the first scanning of each optical switch in the chain-shaped optical switch structure;
the upper computer controls the optical switch control power supply to output voltage to each optical switch of any chain-shaped optical switch structure again, scans a second voltage-optical power response curve of each optical switch, determines the voltage corresponding to the optical power extreme value, sets the voltage as a second working point voltage of each optical switch, and completes second scanning of each optical switch; and repeating the scanning step until the difference value between the working point voltage of each optical switch scanned at the last time and the working point voltage of each optical switch corresponding to the last scanning is smaller than a first preset threshold value, or until the switch extinction ratio of each optical switch is larger than a second preset threshold value, and completing the test and calibration of each optical switch in the chain-shaped optical switch structure.
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