CN112697821B - Multi-energy spectrum CT scanning method and device, electronic equipment and CT equipment - Google Patents

Multi-energy spectrum CT scanning method and device, electronic equipment and CT equipment Download PDF

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CN112697821B
CN112697821B CN202011390994.4A CN202011390994A CN112697821B CN 112697821 B CN112697821 B CN 112697821B CN 202011390994 A CN202011390994 A CN 202011390994A CN 112697821 B CN112697821 B CN 112697821B
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任彦
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Sinovision Technology Beijing Co ltd
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Abstract

The application provides a multi-energy spectrum CT scanning method, a multi-energy spectrum CT scanning device, electronic equipment and CT equipment, wherein the multi-energy spectrum CT scanning method comprises the following steps: sampling the voltage of a ray source according to the number of exposure points to obtain a plurality of sampling voltages, wherein the voltage of the ray source changes periodically, and the sampling voltages correspond to the exposure points one by one; acquiring first scanning data of an exposure point corresponding to each sampling voltage; performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage; and reconstructing the second scanning data to obtain a CT image under each sampling voltage. The first scanning data is the scanning data of the current sampling voltage under a certain angle, and the scanning data of the current sampling voltage under all angles is obtained by a scanning data complementing method, so that the multi-energy spectrum CT can be realized, and the material resolution capability of the CT is greatly enhanced.

Description

Multi-energy spectrum CT scanning method and device, electronic equipment and CT equipment
Technical Field
The present application relates to the field of imaging technologies, and in particular, to a multi-energy spectrum CT scanning method and apparatus, an electronic device, and a CT device.
Background
The energy spectrum CT technology is a technology frequently adopted by high-end medical CT in recent years. The traditional CT has no energy resolution capability and can only obtain an attenuation coefficient image under one energy. The energy spectrum CT uses two or more sets of data with different energies simultaneously, so that the CT has certain energy resolution capability, the material decomposition of the CT image becomes possible, and the CT image has a plurality of potential application scenes clinically.
There are three different technical solutions for the existing energy spectrum CT:
1. two sets of X-ray sources and detectors are used simultaneously, with each source being set to a different energy.
2. The peak X-ray energy emitted by the light source is switched between two values using a device that can rapidly switch high voltage.
3. The specially designed double-layer detector is used, the upper layer is mainly used for detecting low-energy photons, and the lower layer is mainly used for detecting high-energy photons.
The existing scheme has the main problems that an additional original piece or special equipment is needed, and the cost is high. Using two energy scans, there is some material resolving power compared to a single energy, but the resolving power is also very limited.
Disclosure of Invention
The application provides a multi-energy spectrum CT scanning method, a multi-energy spectrum CT scanning device, electronic equipment and CT equipment, and aims to at least solve the problem that the resolving power of the C equipment is limited in the related technology.
According to an aspect of an embodiment of the present application, there is provided a multi-energy spectrum CT scanning method, including: sampling the voltage of a ray source according to the number of exposure points to obtain a plurality of sampling voltages, wherein the voltage of the ray source changes periodically, and the sampling voltages correspond to the exposure points one by one; acquiring first scanning data of an exposure point corresponding to each sampling voltage; performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage; and reconstructing the second scanning data to obtain a CT image under each sampling voltage.
Optionally, the performing scan data completion on each sampling voltage based on the first scan data includes: establishing a mapping relation between first scanning data corresponding to different sampling voltages; and obtaining second scanning data of all the exposure points under each sampling voltage based on the mapping relation.
Optionally, the establishing a mapping relationship between the first scan data corresponding to different sampling voltages includes: acquiring a voltage value of each sampling voltage; obtaining third scanning data of each sampling voltage under the same preset condition based on the voltage value; and establishing a mapping relation between the first scanning data corresponding to different sampling voltages based on the third scanning data.
Optionally, the establishing a mapping relationship between first scan data corresponding to different sampling voltages based on the third scan data includes: determining scanning attributes of a preset scanned object based on the preset conditions, wherein the scanning attributes comprise the length of the scanned object material and an attenuation coefficient; acquiring an energy spectrum of the sampling voltage; calculating a ray attenuation signal received by the detector at the sampling voltage based on the scanning attributes and the energy spectrum; and establishing a mapping relation between the attenuation signals to obtain a mapping relation between the first scanning data.
Optionally, the scanned object comprises scan data of at least one material combination and/or at least one material thickness; establishing a mapping relationship between the attenuation signals to obtain a mapping relationship between the first scanning data comprises: acquiring materials contained in a scanned object; a mapping relationship between the first scan data is established by polynomial fitting based on the property of each material.
Optionally, reconstructing the second scan data to obtain a CT image at each sampling voltage includes: the material of the scanned object is resolved based on the CT image.
According to yet another aspect of the embodiments of the present application, there is also provided a multi-spectral CT scanning apparatus, including: the sampling module is used for sampling the modulation voltage according to the number of the exposure points to obtain a plurality of sampling voltages, the modulation voltage is a source voltage which changes periodically, and the sampling voltages correspond to the exposure points one to one; the acquisition module is used for acquiring first scanning data of an exposure point corresponding to each sampling voltage; the scanning data completion module is used for performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage; and the reconstruction module is used for reconstructing the second scanning data to obtain a CT image under each sampling voltage.
According to another aspect of the embodiments of the present application, there is also provided an electronic device, including a processor, a communication interface, a memory, and a communication bus, where the processor, the communication interface, and the memory communicate with each other through the communication bus; wherein the memory is used for storing the computer program; a processor for performing the method steps in any of the above embodiments by running the computer program stored on the memory.
According to a further aspect of the embodiments of the present application, there is also provided a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to perform the method steps of any of the above embodiments when the computer program is executed.
According to still another aspect of an embodiment of the present application, there is also provided a CT apparatus including: the voltage generator is used for generating a source voltage which changes periodically; the ray source is used for emitting scanning rays under the driving of the voltage of the ray source; the electronic device described in the above embodiments.
In the embodiment of the application, the voltage of a radiation source is modulated into the gradual-change voltage which changes periodically, the voltage of the radiation source is sampled based on the number of exposure points, first scanning data of each sampling voltage is obtained, the first scanning data are scanning data of the current sampling voltage at a certain angle, and the scanning data of the current sampling voltage at all angles, namely second scanning data of all the exposure points at the sampling voltage, are obtained by a scanning data completion method. And reconstructing the second scanning data to obtain a CT image under each sampling voltage, thereby realizing multi-energy spectrum CT and greatly enhancing the material resolution capability of the CT.
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The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious for those skilled in the art to obtain other drawings without inventive labor.
FIG. 1 is a schematic diagram of a hardware environment of an alternative multi-spectral CT scanning method in accordance with embodiments of the present invention;
FIG. 2 is a schematic flow chart diagram of an alternative method of multi-energy spectral CT scanning according to an embodiment of the present application;
FIG. 3 is a schematic diagram of an alternative sampling of the source voltage according to an embodiment of the present application;
FIG. 4 is a schematic diagram of another alternative sampling of the source voltage according to an embodiment of the present application;
FIG. 5 is a block diagram of an alternative multi-spectral CT scanning device according to an embodiment of the present application;
fig. 6 is a block diagram of an alternative electronic device according to an embodiment of the present application.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an aspect of an embodiment of the present application, a method of multi-energy spectrum CT scanning is provided. Alternatively, in this embodiment, the above-mentioned multi-energy spectrum CT scanning method can be applied in a hardware environment as shown in fig. 1. As shown in fig. 1 in the hardware environment formed by the terminal 102 and the server 104. As shown in fig. 1, the server 104 is connected to the terminal 102 through a network, and a database may be provided on or independent of the server, for providing a data storage service for the server 104, and also for processing a cloud service, where the network includes but is not limited to: the terminal 102 is not limited to a PC, a mobile phone, a tablet computer, a CT device, etc. The multi-energy spectrum CT scanning method of the embodiment of the application may be executed by the server 104, or executed by the terminal 102, or executed by both the server 104 and the terminal 102. The terminal 102 may also be installed on a client to perform the multi-energy spectrum CT scanning method according to the embodiment of the present application.
Taking the multispectral CT scanning method in the present embodiment executed by the server 104 and/or the terminal 102 as an example, fig. 2 is a schematic flowchart of an alternative multispectral CT scanning method according to an embodiment of the present application, and as shown in fig. 2, the flowchart of the method may include the following steps:
step S202, sampling the voltage of the ray source according to the number of the exposure points to obtain a plurality of sampling voltages, wherein the voltage of the ray source changes periodically, and the sampling voltages correspond to the exposure points one by one. As an exemplary embodiment, the CT apparatus has a fixed scan angle during scanning, and a fixed exposure point during one rotation (described below by taking view as an example), and the source voltage kV may be modulated, for example, so that the source voltage kV varies periodically during the scanning process. For example, the minimum voltage is 80kV, and the maximum voltage is 140kV, the source voltage shown in fig. 3 can be sampled according to the triangular wave variation shown in fig. 3, and the sampling voltage is 80,82,84, …, and kV of each view varies by 2 kV. Of course, stepped sampling voltages may be used in practical implementations, such as 80,90,100,110,120,130,140 alone, varying 10 kV every 5 views at the same settings as before.
For data acquisition, 3600 views can be set in one circle, and data can be acquired by exposing at 3600 angles at equal angle intervals.
1 view, kV =80
View 2, kV =82
60 th view, KV =82.
Thus completing one cycle of kV gradual change. Circulating for 60 times in one circle. After completing one circle of scanning:
kV =80 view has 1,61,121, …
kV =82 view has 2,60,62,120, …
For the minimum value of 80 and the maximum value of 140KV of the sampling voltage, there are 60 view data. For sample voltages between 82 and 138, there are 120 views of data. Of course, the voltage of the radiation source shown in fig. 4 may also be changed according to a sine wave, and sampling may be performed according to the sine wave when the voltage is used, wherein sampling is not equidistant, and the interval of each sampling voltage may also be unequal.
Because the penetrating power of rays is weak under the low ray source voltage kV, the ray source current mA needs to be matched with the ray source voltage kV for synchronous change.
Step S204, acquiring first scanning data of an exposure point corresponding to each sampling voltage. As an exemplary embodiment, each sampling voltage corresponds to a plurality of scan data, and there are illustratively 60 view data for the minimum 80 and maximum 140KV of sampling voltages. For sample voltages between 82 and 138, there are 120 views of data. .
Step S206, performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage. For example, sparse angular reconstruction may be used for data collected at each sampled voltage. According to the acquisition method, the voltage of the ray source is from 80kV to 140kV, first scanning data under 30 sampling voltages are obtained, and are respectively reconstructed, so that CT images under 30 sampling voltages are obtained. As an optional embodiment, the data under the gradient kV may also be converted into scanning data under all angles under each acquisition kV, that is, 3600 sets of data under each sampling kV. According to the invention, a large number of die bodies are scanned under different kV, and the mapping relation between different kV data is established, so that the data under all angles can be obtained. For example, establishing a mapping relationship of different kV data requires scanning data of various materials under different thicknesses, data of different thickness combinations of two materials, data of different thickness combinations of three materials, and the like under a fixed kV. The final experimental materials and the number of experiments required can be determined from the design experiments and the test results. Illustratively, one rotation has 60 exposure points, and taking the first sampling voltage and the first exposure point as an example, the first scan data may be scan data of the first exposure point at the first sampling voltage, and the second scan data may be scan data of all 60 exposure points at the first sampling voltage.
And S208, reconstructing the second scanning data to obtain a CT image under each sampling voltage. After the data of the sampling voltages at all angles are completed, various common reconstruction methods can be adopted to reconstruct and obtain images under all the sampling voltages.
Through the steps S202 to S208, the source voltage is modulated to a gradual change voltage that changes periodically, the source voltage is sampled based on the number of the exposure points, and first scan data of each sampling voltage is obtained, where the first scan data is scan data of a current sampling voltage at a certain angle, and scan data of the current sampling voltage at all angles, that is, second scan data of all exposure points at the sampling voltage, is obtained through a scan data complementing method. And reconstructing the second scanning data to obtain a CT image under each sampling voltage, thereby realizing multi-energy spectrum CT and greatly enhancing the material resolution capability of the CT.
As an alternative embodiment, the performing scan data completion on each sampling voltage based on the first scan data includes: establishing a mapping relation between first scanning data corresponding to different sampling voltages, and specifically acquiring a voltage value of each sampling voltage;
obtaining third scanning data of each sampling voltage under the same preset condition based on the voltage values, wherein the third scanning data are a set of a plurality of scanning data, and the plurality of scanning data are obtained by different materials and/or different thicknesses; establishing a mapping relation between the first scanning data corresponding to different sampling voltages based on the third scanning data, wherein the establishing of the mapping relation can determine scanning attributes of a preset scanned object based on the preset condition, and the scanning attributes comprise the length of the scanned object material and an attenuation coefficient; acquiring an energy spectrum of the sampling voltage; calculating a ray attenuation signal received by the detector at the sampling voltage based on the scanning attributes and the energy spectrum; establishing a mapping relation between the attenuation signals to obtain a mapping relation between the first scanning data, specifically, the scanned object includes scanning data of at least one material combination and/or at least one material thickness; acquiring materials contained in a scanned object; a mapping relationship between the first scan data is established by polynomial fitting based on the property of each material. And obtaining second scanning data of all the exposure points under each sampling voltage based on the mapping relation.
For the establishment of the mapping relationship, the following specific description may be referred to in this embodiment:
for a given material combination X, let the length of each material be X i Attenuation coefficient of mu i The energy spectra at two kV are respectively S m (E) And S n (E) The attenuation signal received by the detector is:
Figure BDA0002812789180000081
Figure BDA0002812789180000082
to translate between P (m) and P (n), a mapping Ψ:
Figure BDA0002812789180000083
for each given X, the relationship between P (m) and P (n) can be established by polynomial fitting:
Figure BDA0002812789180000091
wherein alpha is j The relation between P (m) and P (n) after fitting the polynomial.
Because the material contained in the scanned object is unknown, it can be stepped through the current step of single-energy scan hardening calibration, assuming that the scanned object is a single material, and then gradually adding correction terms for other materials.
As an exemplary embodiment, after reconstructing the second scan data to obtain a CT image at each sampling voltage, the method includes: the material of the scanned object is resolved based on the CT image.
It should be noted that for simplicity of description, the above-mentioned embodiments of the method are described as a series of acts, but those skilled in the art should understand that the present application is not limited by the described order of acts, as some steps may be performed in other orders or simultaneously according to the present application. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required in this application.
Through the above description of the embodiments, those skilled in the art can clearly understand that the method according to the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium (e.g., a ROM (Read-Only Memory)/RAM (Random Access Memory), a magnetic disk, an optical disk) and includes several instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, or a network device) to execute the methods according to the embodiments of the present application.
According to another aspect of the embodiments of the present application, there is also provided a multi-energy spectrum CT scanning apparatus for implementing the multi-energy spectrum CT scanning method. Fig. 5 is a schematic diagram of an alternative multi-spectral CT scanning apparatus according to an embodiment of the present application, which may include, as shown in fig. 5:
(1) The sampling module 302 is configured to sample the modulation voltage according to the number of sampling points to obtain multiple sampling voltages, where the modulation voltage is a source voltage that changes periodically, and the sampling voltages correspond to the exposure points one to one;
(2) An acquiring module 304, configured to acquire first scan data of an exposure point corresponding to each sampling voltage.
(3) And a scan data completion module 306, configured to perform scan data completion on each sampling voltage based on the first scan data, so as to obtain second scan data of all exposure points under each sampling voltage.
(4) And a reconstruction module 308, configured to reconstruct the second scan data to obtain a CT image at each sampling voltage.
It should be noted here that the modules described above are the same as the examples and application scenarios implemented by the corresponding steps, but are not limited to the disclosure of the above embodiments. It should be noted that the modules described above as a part of the apparatus may be operated in a hardware environment as shown in fig. 1, and may be implemented by software, or may be implemented by hardware, where the hardware environment includes a network environment.
According to another aspect of the embodiments of the present application, there is also provided an electronic device for implementing the above-mentioned multi-energy spectrum CT scanning method, where the electronic device may be a server, a terminal, or a combination thereof.
Fig. 6 is a block diagram of an alternative electronic device according to an embodiment of the present application, as shown in fig. 6, including a processor 402, a communication interface 404, a memory 406, and a communication bus 408, where the processor 402, the communication interface 404, and the memory 406 communicate with each other through the communication bus 408, where,
a memory 406 for storing a computer program;
the processor 402, when executing the computer program stored in the memory 406, performs the following steps:
s1, sampling a ray source voltage according to the number of exposure points to obtain a plurality of sampling voltages, wherein the ray source voltage changes periodically, and the sampling voltages correspond to the exposure points one by one;
s2, acquiring first scanning data of an exposure point corresponding to each sampling voltage;
s3, performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage;
and S4, reconstructing the second scanning data to obtain a CT image under each sampling voltage.
Alternatively, in this embodiment, the communication bus may be a PCI (Peripheral Component Interconnect) bus, an EISA (extended industry Standard Architecture) bus, or the like. The communication bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is shown in FIG. 6, but this is not intended to represent only one bus or type of bus.
The communication interface is used for communication between the electronic equipment and other equipment.
The memory may include RAM, and may also include non-volatile memory, such as at least one disk memory. Alternatively, the memory may be at least one memory device located remotely from the processor.
As an example, as shown in fig. 6, the memory 402 may include, but is not limited to, the sampling module 302, the obtaining module 304, the scan data complementing module 306 and the reconstructing module 308 of the multi-spectrum CT scanning apparatus. In addition, other module units in the aforementioned multi-energy spectrum CT scanning apparatus may also be included, but are not limited to these, and are not described in detail in this example.
The processor may be a general-purpose processor, and may include but is not limited to: a CPU (Central Processing Unit), an NP (Network Processor), and the like; but also a DSP (Digital Signal Processing), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array) or other Programmable logic device, discrete Gate or transistor logic device, discrete hardware component.
Optionally, the specific examples in this embodiment may refer to the examples described in the above embodiments, and this embodiment is not described herein again.
It can be understood by those skilled in the art that the structure shown in fig. 6 is only an illustration, and the device implementing the multi-energy spectrum CT scanning method may be a terminal device, and the terminal device may be a terminal device such as a smart phone (e.g., an Android phone, an iOS phone, etc.), a tablet computer, a palm computer, a Mobile Internet Device (MID), a PAD, and the like. Fig. 6 is a diagram illustrating a structure of the electronic device. For example, the terminal device may also include more or fewer components (e.g., network interfaces, display devices, etc.) than shown in FIG. 6, or have a different configuration than shown in FIG. 6.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by a program instructing hardware associated with the terminal device, where the program may be stored in a computer-readable storage medium, and the storage medium may include: flash disk, ROM, RAM, magnetic or optical disk, and the like.
According to still another aspect of an embodiment of the present application, there is also provided a storage medium. Optionally, in this embodiment, the storage medium may be used for a program code for executing a multi-energy spectrum CT scanning method.
Optionally, in this embodiment, the storage medium may be located on at least one of a plurality of network devices in a network shown in the above embodiment.
Optionally, in this embodiment, the storage medium is configured to store program code for performing the following steps:
s1, sampling a ray source voltage according to the number of exposure points to obtain a plurality of sampling voltages, wherein the ray source voltage changes periodically, and the sampling voltages correspond to the exposure points one by one;
s2, acquiring first scanning data of an exposure point corresponding to each sampling voltage;
s3, performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage;
and S4, reconstructing the second scanning data to obtain a CT image under each sampling voltage.
Optionally, the specific example in this embodiment may refer to the example described in the above embodiment, which is not described again in this embodiment.
Optionally, in this embodiment, the storage medium may include, but is not limited to: various media capable of storing program codes, such as a U disk, a ROM, a RAM, a removable hard disk, a magnetic disk, or an optical disk.
The above-mentioned serial numbers of the embodiments of the present application are merely for description and do not represent the merits of the embodiments.
The integrated unit in the above embodiments, if implemented in the form of a software functional unit and sold or used as a separate product, may be stored in the above computer-readable storage medium. Based on such understanding, the technical solution of the present application may be substantially implemented or a part of or all or part of the technical solution contributing to the prior art may be embodied in the form of a software product stored in a storage medium, and including instructions for causing one or more computer devices (which may be personal computers, servers, network devices, or the like) to execute all or part of the steps of the method described in the embodiments of the present application.
In the above embodiments of the present application, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the several embodiments provided in the present application, it should be understood that the disclosed client may be implemented in other manners. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one type of division of logical functions, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, and may also be distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution provided in the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The foregoing is only a preferred embodiment of the present application and it should be noted that those skilled in the art can make several improvements and modifications without departing from the principle of the present application, and these improvements and modifications should also be considered as the protection scope of the present application.

Claims (9)

1. A method of multi-energy spectral CT scanning, comprising:
sampling the voltage of a ray source according to the number of exposure points to obtain a plurality of sampling voltages, wherein the voltage of the ray source changes periodically, and the sampling voltages correspond to the exposure points one by one;
acquiring first scanning data of an exposure point corresponding to each sampling voltage;
performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage;
reconstructing the second scanning data to obtain a CT image under each sampling voltage;
wherein performing scan data completion on each sampling voltage based on the first scan data comprises:
establishing a mapping relation between first scanning data corresponding to different sampling voltages;
and obtaining second scanning data of all the exposure points under each sampling voltage based on the mapping relation.
2. The method for multi-energy spectrum CT scanning according to claim 1, wherein said establishing a mapping relationship between the first scan data corresponding to different sampling voltages comprises:
acquiring a voltage value of each sampling voltage;
obtaining third scanning data of each sampling voltage under the same preset condition based on the voltage value;
and establishing a mapping relation between the first scanning data corresponding to different sampling voltages based on the third scanning data.
3. The method of claim 2, wherein the mapping between the first scan data corresponding to different sampling voltages based on the third scan data comprises:
determining scanning attributes of a preset scanned object based on the preset conditions, wherein the scanning attributes comprise the length of the scanned object material and an attenuation coefficient;
acquiring an energy spectrum of the sampling voltage;
calculating a ray attenuation signal received by the detector at the sampling voltage based on the scanning attributes and the energy spectrum;
and establishing a mapping relation between the attenuation signals to obtain a mapping relation between the first scanning data.
4. The method of claim 3, wherein the scanned object comprises scan data of at least one material combination and/or at least one material thickness;
establishing a mapping relationship between the attenuation signals to obtain a mapping relationship between the first scanning data comprises:
acquiring materials contained in a scanned object;
a mapping relationship between the first scan data is established by polynomial fitting based on the property of each material.
5. The method of multi-energy spectrum CT scanning of claim 1, after reconstructing the second scan data to obtain a CT image at each sample voltage, comprising:
the material of the scanned object is resolved based on the CT image.
6. A multi-spectral CT scanning apparatus, comprising:
the sampling module is used for sampling the modulation voltage according to the number of the exposure points to obtain a plurality of sampling voltages, the modulation voltage is a source voltage which changes periodically, and the sampling voltages correspond to the exposure points one to one;
the acquisition module is used for acquiring first scanning data of an exposure point corresponding to each sampling voltage;
the scanning data completion module is used for performing scanning data completion on each sampling voltage based on the first scanning data to obtain second scanning data of all exposure points under each sampling voltage; wherein performing scan data completion on each sampling voltage based on the first scan data comprises: establishing a mapping relation between first scanning data corresponding to different sampling voltages; obtaining second scanning data of all exposure points under each sampling voltage based on the mapping relation;
and the reconstruction module is used for reconstructing the second scanning data to obtain a CT image under each sampling voltage.
7. An electronic device comprising a processor, a communication interface, a memory and a communication bus, wherein said processor, said communication interface and said memory communicate with each other via said communication bus,
the memory for storing a computer program;
the processor for performing the method steps of the multi-energy spectrum CT scan of any one of claims 1 to 5 by running the computer program stored on the memory.
8. A computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to carry out the method steps of a multi-spectral CT scan according to any one of claims 1 to 5 when executed.
9. A CT apparatus, comprising:
the voltage generator is used for generating a source voltage which changes periodically;
the ray source is used for emitting scanning rays under the driving of the voltage of the ray source;
the electronic device of claim 7.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009125250A (en) * 2007-11-22 2009-06-11 Hitachi Medical Corp X-ray ct equipment
CN103654818A (en) * 2012-09-04 2014-03-26 沈阳东软医疗系统有限公司 Method and device for achieving multi-energy CT scanning reconstruction
CN108921282A (en) * 2018-05-16 2018-11-30 深圳大学 A kind of construction method and device of deep neural network model
CN109875593A (en) * 2019-02-02 2019-06-14 中北大学 CT imaging method, storage medium and device
CN110189389A (en) * 2019-05-31 2019-08-30 首都师范大学 Dual intensity spectrum CT projection domain sill decomposition method and device based on deep learning

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007054372A (en) * 2005-08-25 2007-03-08 Ge Medical Systems Global Technology Co Llc X-ray ct apparatus
DE102005049586A1 (en) * 2005-10-17 2007-04-26 Siemens Ag Method for generating computerized tomography displays in x-ray computed tomography, comprises scanning an object and reconstructing a first computerized tomography display from an absorption data of an energy spectrum
CN103892859A (en) * 2012-12-28 2014-07-02 Ge医疗系统环球技术有限公司 CT (computed tomography) imaging method and CT imaging system based on multi-mode Scout scanning
CN104091329B (en) * 2014-06-25 2017-02-15 清华大学 Calibration method and device for CT image as well as CT system
DE102015226489B4 (en) * 2015-12-22 2024-05-16 Siemens Healthineers Ag X-ray system and method for image reconstruction

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009125250A (en) * 2007-11-22 2009-06-11 Hitachi Medical Corp X-ray ct equipment
CN103654818A (en) * 2012-09-04 2014-03-26 沈阳东软医疗系统有限公司 Method and device for achieving multi-energy CT scanning reconstruction
CN108921282A (en) * 2018-05-16 2018-11-30 深圳大学 A kind of construction method and device of deep neural network model
CN109875593A (en) * 2019-02-02 2019-06-14 中北大学 CT imaging method, storage medium and device
CN110189389A (en) * 2019-05-31 2019-08-30 首都师范大学 Dual intensity spectrum CT projection domain sill decomposition method and device based on deep learning

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
CT不完全数据重建算法研究;张瀚铭;《中国优秀硕士学位论文全文数据库 信息科技辑》;20180615;全文 *
双能谱CT的迭代重建模型及重建方法;赵云松 等;《电子学报》;20140430;第42卷(第4期);全文 *
面向双能CT成像的医用X射线能谱重构解析方法;史再峰等;《南开大学学报(自然科学版)》;20200620(第03期);全文 *

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