CN112697284A

CN112697284A - Remote laser light field pulse waveform distribution characteristic measurement system

Info

Publication number: CN112697284A
Application number: CN202011421294.7A
Authority: CN
Inventors: 吴梦瑶; 赵晓林; 赵博欣; 李宗哲; 冯国强
Original assignee: Air Force Engineering University of PLA
Current assignee: Air Force Engineering University of PLA
Priority date: 2020-12-08
Filing date: 2020-12-08
Publication date: 2021-04-23

Abstract

The invention discloses a remote laser light field pulse waveform distribution characteristic measurement system which is characterized by comprising a laser, a light path beam expanding system, a light path adjusting device, a light intensity attenuator, a shutter and a CCD/CMOS photosensitive device which are sequentially arranged in the light propagation direction. The system of the invention enables the laser pulse intensity at different positions of the light spot in the remote laser light field to be captured by each independent pixel unit in the CCD/CMOS photosensitive area, and the CCD/CMOS realizes the measurement requirement on the waveform distribution characteristic of the far-field laser pulse by quickly imaging the light field pulse on a time sequence.

Description

Remote laser light field pulse waveform distribution characteristic measurement system

Technical Field

The invention relates to the technical field of laser, in particular to a remote laser light field pulse waveform distribution characteristic measuring system.

Background

The research on the waveform distribution characteristics of the remote laser light field pulse is always a key problem to be solved in the laser application field, and the waveform distribution characteristics of the far-field pulse laser have important research values in the fields of laser fuze, laser guidance, laser three-dimensional imaging and the like.

At present, researchers usually measure laser pulse waveforms by combining a silicon photodetector and a transient digital oscilloscope, and the method has the defect that only laser pulse waveforms at a certain sampling point in a laser spot range can be acquired, and distribution characteristics of all laser pulse waveforms in the spot coverage range cannot be acquired under a long-distance condition. The methods adopted by researchers include time correlation methods (intensity autocorrelation, cross correlation, frequency resolution optical switch), fringe cameras and the like, but the dynamic response range is limited, the measurement method and the system are complex, and high-intensity pulses can cause the defects that a detector is saturated and even damages detection equipment and the like.

Disclosure of Invention

The embodiment of the invention provides a remote laser light field pulse waveform distribution characteristic measuring system, which can solve the problems in the prior art.

The invention provides a remote laser light field pulse waveform distribution characteristic measuring system, which comprises a laser, a light path beam expanding system, a light path adjusting device, a light intensity attenuator, a shutter and a CCD/CMOS photosensitive device which are sequentially arranged in the light propagation direction, wherein the working state of the shutter is controlled by a shutter control circuit, the shutter control circuit starts to work before laser enters the CCD/CMOS photosensitive device, the shutter is controlled to have different opening moments on a time sequence, and a series of light field images obtained by the method are integrated images of the laser at different moments.

Preferably, the optical path adjusting device transmits the incident laser pulse and irradiates the incident laser pulse into the light intensity attenuator along the horizontal direction.

Preferably, the optical path adjusting device reflects the incident laser pulses to the optical intensity attenuator in the opposite direction.

Preferably, the optical path adjusting device reflects the incident laser pulse to the optical intensity attenuator in a vertical direction.

Preferably, the shutter control circuit is a fast response control device, or an electro-optical transfer switch.

Preferably, the optical path beam expanding system is a coated lens assembly.

Preferably, the light intensity attenuator is a coated attenuation sheet combination.

The invention provides a remote laser light field pulse waveform distribution characteristic measurement system, which has the following advantages:

the invention comprises a laser, a light path beam expanding system, a light path adjusting device, a light intensity attenuator, a shutter and a CCD/CMOS photosensitive device, so that the laser pulse intensity at different positions of a light spot in a remote laser light field is captured by each independent pixel unit in a CCD/CMOS photosensitive area, and the CCD/CMOS realizes the measurement requirement on the waveform distribution characteristic of far-field laser pulses by quickly imaging the light field pulses on a time sequence. The method has the advantage of measuring the distribution characteristics of the laser pulse waveform in a long-distance full optical field range, and is a novel emerging technology capable of replacing the conventional pulse waveform detection method.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic diagram of a system for measuring pulse waveform distribution characteristics of a medium-and long-distance laser field according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a system for measuring the pulse waveform distribution characteristics of a remote laser field according to a second embodiment;

fig. 3 is a schematic composition diagram of a remote laser light field pulse waveform distribution characteristic measurement system in the third embodiment.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1, the present invention provides a remote laser light field pulse waveform distribution characteristic measurement system, which comprises a laser 100, a light path beam expanding system 200, a light path adjusting device 300, a light intensity attenuator 400, a shutter 500 and a CCD/CMOS photosensitive device 600, which are sequentially arranged in the light propagation direction, wherein the working state of the shutter 500 is controlled by a shutter control circuit.

In the first embodiment, the laser 100 emits a laser pulse beam with a certain wavelength, and after the laser pulse beam is expanded by the optical path beam expanding system 200, the laser pulse beam is transmitted by the optical path adjusting device 300 and irradiated into the CCD/CMOS photosensitive device 600 along the horizontal direction, so as to ensure that the laser field has a certain transmission distance. The light intensity attenuator 400 is placed in front of the CCD/CMOS photosensitive device 600 to prevent the CCD/CMOS photosensitive device 600 from saturation. The exposure time of the CCD/CMOS photosensitive device 600 is fixed and as short as possible, the delay step length of the shutter 500 is equal to the exposure time, the shutter control circuit starts to work before the laser pulse enters the CCD/CMOS photosensitive device 600, the shutter 500 is controlled to have different opening times on a time sequence, a series of light field images obtained by the method are integrated images of the laser pulse at different times, any pixel point respectively corresponds to a certain position in a light field range, and therefore the measurement of the waveform distribution characteristics of the laser light field pulse in a long distance is achieved.

In the second embodiment, as shown in FIG. 2, the optical path adjusting device 300 reflects the incident laser pulses to the optical intensity attenuator 400 in the opposite direction.

In the third embodiment, as shown in FIG. 3, the optical path adjusting device 300 reflects the incident laser pulses to the optical intensity attenuator 400 in the vertical direction.

In the above three embodiments, the shutter control circuit may be a fast response control device, or an electro-optical transfer switch. The CCD/CMOS photosensitive device 600 is a high-responsivity, high-sensitivity photodetection device. The shutter 500 can be triggered by internal circuitry or by external circuitry; meanwhile, the CCD/CMOS photosensitive device 600 has basic functions of adjusting exposure time (automatic/manual), shutter delay (automatic/manual), delay step length (automatic/manual), photosensitive gain and the like. The shutter control circuit controls the shutter 500 to be rapidly opened and closed, and the open/close period determines the scanning frequency of the pulse waveform.

The output light path of the laser 100 passes through the light path beam expanding system 200, the light path adjusting device 300 and the light intensity attenuator 400 and then coincides with the central axis of the photosensitive area of the CCD/CMOS photosensitive device 600. The optical path beam expanding system 200 and the optical intensity attenuator 400 are selected according to specific application.

The laser 100 is a pulsed laser.

The optical path beam expanding system 200 is a coated lens assembly.

The light intensity attenuator 400 is a coated attenuation sheet assembly.

While preferred embodiments of the present invention have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the invention.

It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.

Claims

1. A remote laser light field pulse waveform distribution characteristic measurement system is characterized by comprising a laser, a light path beam expanding system, a light path adjusting device, a light intensity attenuator, a shutter and a CCD/CMOS photosensitive device which are sequentially arranged in the light propagation direction, wherein the working state of the shutter is controlled by a shutter control circuit, the shutter control circuit starts to work before laser enters the CCD/CMOS photosensitive device, the shutter is controlled to have different opening moments on a time sequence, and a series of light field images obtained by the method are integrated images of the laser at different moments.

2. A remote laser light field pulse waveform distribution characteristic measurement system as claimed in claim 1, wherein said optical path adjustment device transmits the incident laser light and irradiates it into the light intensity attenuator along the horizontal direction.

3. A remote laser light field pulse waveform distribution characteristic measurement system as claimed in claim 1, wherein said optical path adjustment device reflects the incident laser light in the opposite direction to the light intensity attenuator.

4. A remote laser light field pulse waveform distribution characteristic measurement system as claimed in claim 1, wherein said optical path adjustment device reflects the incident laser pulse in a vertical direction to the optical intensity attenuator.

5. A remote laser light field pulse waveform profile characterization measurement system as claimed in claim 1, wherein said shutter control circuit is a fast response control device or an electro-optical switch.

6. A remote laser light field pulse waveform distribution characteristic measurement system as claimed in claim 1, wherein said optical path beam expanding system is a coated lens assembly.

7. A remote laser light field pulse waveform distribution characteristic measurement system as claimed in claim 1, wherein said light intensity attenuator is a coated attenuator sheet assembly.