CN112697187A - Device and method for realizing measurement of parallel sensors - Google Patents
Device and method for realizing measurement of parallel sensors Download PDFInfo
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- CN112697187A CN112697187A CN201911012641.8A CN201911012641A CN112697187A CN 112697187 A CN112697187 A CN 112697187A CN 201911012641 A CN201911012641 A CN 201911012641A CN 112697187 A CN112697187 A CN 112697187A
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Abstract
The device and the method for realizing the measurement of the parallel sensors firstly check whether the parallel sensor group has problems or not, then poll and detect the sensors in the parallel sensor group, check one by one to find out the damaged sensor, automatically position the damaged sensor and ensure the normal use of a circuit.
Description
Technical Field
The present application relates to, but not limited to, electronic circuit technology, and more particularly, to an apparatus and method for performing parallel sensor measurements.
Background
In a practical application scenario, a scheme in which a plurality of sensors are used in parallel exists. If any sensor in the parallel sensors is damaged, the damaged sensor needs to be positioned for replacement and maintenance, so that the normal use of the circuit where the parallel sensors are located is ensured.
Disclosure of Invention
The application provides a device and a method for realizing measurement of parallel sensors, which can automatically position damaged sensors and ensure normal use of circuits.
The application provides a realize parallelly connected sensor measuring device includes: the device comprises a first measuring circuit, a second measuring circuit, a sampling control circuit and a parallel sensor group comprising n parallel sensors; wherein the content of the first and second substances,
the first measuring circuit is used for detecting the parallel sensor group under the control of the sampling control circuit;
the second measurement circuit is used for polling and detecting any sensor in the parallel sensor group under the control of the sampling control circuit;
the sampling control circuit is used for controlling the first measuring circuit to detect the parallel sensor group, sampling the output of the first measuring circuit and determining whether a damaged sensor exists in the parallel sensor group according to a first sampling result; and when damaged sensors exist in the parallel sensor group, controlling the second measuring circuit to detect a single sensor in the parallel sensor group, sampling the output of the second measuring circuit, and determining the damaged sensor in the parallel sensor group according to a second sampling result.
In one illustrative example, the sampling control circuit is further configured to:
and controlling the parallel sensor group to be connected into a working circuit when the parallel sensor group is initialized or damaged sensors do not exist in the parallel sensor group.
In one illustrative example, the first measurement circuit is a resistor-capacitor, RC, circuit; the method comprises the following steps:
a first resistor and the parallel sensor group as a first capacitor.
In one illustrative example, the second measurement circuit is an RC circuit; the method comprises the following steps:
a second resistor, any one sensor of the parallel sensor group as a second capacitor, and a change-over switch;
and the selector switch is used for taking one sensor in the parallel sensor group as a second capacitor under the control of the sampling control circuit.
In an exemplary embodiment, if the parallel sensor groups include two or more groups, the sampling control circuit uses a switching circuit to switch each parallel sensor group into the first measuring circuit one by one, so as to detect whether there is sensor damage for each parallel sensor group.
In an exemplary embodiment, the capacitance values of the sensors constituting the same parallel sensor group have a lower limit value.
In an exemplary embodiment, the sampling control circuit, when the excitation signal of the first measurement circuit is given, for determining whether there is a damaged sensor in the parallel sensor group according to the first sampling result, includes:
if the first sampling result shows the first measurement signal amplitude A11Less than a signal amplitude threshold Ath1Determining that a damaged sensor exists in the parallel sensor group;
recording signal amplitude threshold Ath1With the first measurement signal amplitude A11And calculating the signal amplitude difference value H of the two signals;
when the excitation signal is given, if the sensors in the parallel sensors work normally, the first sampling result shows a first measurement signal amplitude A11As a signal amplitude threshold Ath1。
In an exemplary embodiment, the sensor in the sampling control circuit that determines the occurrence of the failure in the parallel sensor group according to the second sampling result when the excitation signal of the second measurement circuit is given, includes:
and detecting the sensors in the parallel sensor group one by one until the sum of the amplitude difference values detected each time is equal to the signal amplitude difference value H, and determining the sensor with the detected signal amplitude difference value as a damaged sensor.
In an exemplary embodiment, the determining a damaged sensor in a parallel sensor group specifically includes:
detecting the sensor q, if the second sampling result shows the second measuring signal amplitude A2qLess than a signal amplitude threshold Ath2Detecting that the sensor q is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2qAnd calculating the signal amplitude difference H of the two2qIf H is present2qIf the number of the sensors in the parallel sensor group is equal to H, determining that the damaged sensor in the parallel sensor group is a sensor q, and ending; if not, then,
if H is present2qLess than H, detecting the sensor p, and displaying a second measurement signal amplitude A by the second sampling result2pLess than a signal amplitude threshold Ath2Detecting that the sensor p is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2pAnd calculating the signal amplitude difference H of the two2pIf (H)2p+H2q) If the number of the sensors is equal to H, determining that the damaged sensors in the parallel sensor group are the sensor q and the sensor p, and ending; otherwise;
if (H)2p+H2q) If the sum of the detected signal amplitude difference values is less than H, continuing to perform polling detection on the sensors in the parallel sensor group until the sum of the detected signal amplitude difference values is equal to H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor;
when the excitation signal is given, if each sensor i in the parallel sensors works normally, the second sampling result displays a second measurement signal amplitude A2iAs a signal amplitude threshold Ath2(ii) a Wherein i is 1-n, n is the number of sensors in the parallel sensor group, and p and q are any one of the sensors of n.
The application also provides a method for realizing measurement of the parallel sensors, which comprises the following steps:
controlling a first measuring circuit to detect the parallel sensor group, sampling the output of the first measuring circuit, and determining whether a damaged sensor exists in the parallel sensor group according to a first sampling result;
and when damaged sensors exist in the parallel sensor group, controlling the second measuring circuit to detect a single sensor in the parallel sensor group, sampling the output of the second measuring circuit, and determining the damaged sensor in the parallel sensor group according to a second sampling result.
In one illustrative example, the first measurement circuit is a first resistor-capacitor, RC, circuit; the second measurement circuit is a second resistor-capacitor (RC) circuit;
the control of the first measuring circuit to detect the parallel sensor group comprises the following steps: the parallel sensor group is used as a first capacitor in a first RC circuit, the output of the first RC circuit is sampled, and whether a damaged sensor exists in the parallel sensor group or not is detected according to a first sampling result;
the controlling the second measuring circuit to detect a single sensor in the parallel sensor group comprises: and polling and detecting the sensors in the parallel sensor group by taking the sensors in the parallel sensor group as a second capacitor in a second RC circuit, respectively sampling the output of the second RC circuit, and determining damaged sensors according to a second sampling result.
In one illustrative example, the sensor for detecting the presence of damage in a parallel sensor group comprises:
if the first sampling result shows the first measuring signal amplitude A when the excitation signal is given11Less than a signal amplitude threshold Ath1Then, detecting that a damaged sensor exists in the parallel sensor group; recording signal amplitude threshold Ath1With the first measurement signal amplitude A11And calculating the signal amplitude difference value H of the two signals;
when the excitation signal is given, if the sensors in the parallel sensors work normally, the first sampling result shows a first measurement signal amplitude A11As a signal amplitude threshold Ath1。
In one illustrative example, the sensor for determining damage comprises:
and detecting the sensors in the parallel sensor group one by one until the sum of the amplitude difference values detected each time is equal to the signal amplitude difference value H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor.
In an exemplary embodiment, the determining that the sensor corresponding to the detected signal amplitude difference is a damaged sensor includes:
detecting the sensor q, if the second sampling result shows the second measuring signalAmplitude A2qLess than a signal amplitude threshold Ath2Detecting that the sensor q is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2qAnd calculating the signal amplitude difference H of the two2qIf H is present2qIf the number of the sensors in the parallel sensor group is equal to H, determining that the damaged sensor in the parallel sensor group is a sensor q, and ending; if not, then,
if H is present2qLess than H, detecting the sensor p, and displaying a second measurement signal amplitude A by the second sampling result2pLess than a signal amplitude threshold Ath2Detecting that the sensor p is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2pAnd calculating the signal amplitude difference H of the two2pIf (H)2p+H2q) If the number of the sensors is equal to H, determining that the damaged sensors in the parallel sensor group are the sensor q and the sensor p, and ending; otherwise;
if (H)2p+H2q) If the sum of the detected signal amplitude difference values is less than H, continuing to perform polling detection on the sensors in the parallel sensor group until the sum of the detected signal amplitude difference values is equal to H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor;
when the excitation signal is given, if each sensor i in the parallel sensors works normally, the second sampling result displays a second measurement signal amplitude A2iAs a signal amplitude threshold Ath2(ii) a Wherein i is 1-n, n is the number of sensors in the parallel sensor group, and p and q are any one of the sensors of n.
In one illustrative example, the method further comprises:
and controlling the parallel sensor group to be connected into a working circuit when the parallel sensor group is initialized or when the parallel sensor group is detected to have no damaged sensor.
In an exemplary example, if the parallel sensor groups include two or more groups, polling detection is performed on different parallel sensor groups according to the method, and each parallel sensor group is connected to the first RC circuit one by one, so as to detect whether there is sensor damage for each parallel sensor group.
According to the method and the device, whether the parallel sensor group has problems is firstly checked, then the sensors in the parallel sensor group are polled and detected one by one to find out the damaged sensors, the damaged sensors are automatically positioned, and the normal use of the circuit is ensured.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The accompanying drawings are included to provide a further understanding of the claimed subject matter and are incorporated in and constitute a part of this specification, illustrate embodiments of the subject matter and together with the description serve to explain the principles of the subject matter and not to limit the subject matter.
FIG. 1 is a schematic diagram of the structure of the device for realizing the measurement of the parallel sensors;
FIG. 2 is a circuit diagram illustrating an embodiment of switching between a first measurement circuit and an operating circuit according to the present application;
FIG. 3 is a circuit schematic of an embodiment of the second measurement circuit operating principle of the present application;
FIG. 4 is a circuit schematic of an embodiment of the present application in which the first and second measurement circuits are RC series circuits;
FIG. 5 is a schematic flow chart illustrating an embodiment of the present application for implementing parallel sensor measurement using an RC circuit.
Detailed Description
In one exemplary configuration of the present application, a computing device includes one or more processors (CPUs), input/output interfaces, a network interface, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include non-transitory computer readable media (transient media), such as modulated data signals and carrier waves.
To make the objects, technical solutions and advantages of the present application more apparent, embodiments of the present application will be described in detail below with reference to the accompanying drawings. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.
Fig. 1 is a schematic structural diagram of a device for implementing parallel sensor measurement according to the present invention, as shown in fig. 1, the device at least includes: the device comprises a first measuring circuit, a second measuring circuit, a sampling control circuit and a parallel sensor group comprising n parallel sensors; wherein the content of the first and second substances,
the first measuring circuit is used for detecting the parallel sensor group under the control of the sampling control circuit; in one illustrative example, the first measurement circuit is a Resistor-capacitor circuit (RC) comprising a first Resistor and a parallel sensor group as a first capacitor; the first measuring circuit detects the parallel sensor group under the control of the sampling control circuit;
the second measurement circuit is used for polling and detecting any sensor in the parallel sensor group under the control of the sampling control circuit; in an exemplary instance, the second measurement circuit is an RC circuit including a second resistor, any one of the parallel sensor groups as a second capacitor, and a switch for regarding one of the parallel sensor groups as a second capacitor under the control of the sampling control circuit; the second measuring circuit respectively detects each sensor in the parallel sensor group under the control of the sampling control circuit;
the sampling control circuit is used for controlling the first measuring circuit to detect the parallel sensor group when a system of a device to which the sampling control circuit belongs is powered on and operated or according to a preset period or when a detection instruction is received, sampling the output of the first measuring circuit, and determining whether a damaged sensor exists in the parallel sensor group according to a first sampling result; and when damaged sensors exist in the parallel sensor group, controlling the second measuring circuit to detect a single sensor in the parallel sensor group, sampling the output of the second measuring circuit, and determining the damaged sensor in the parallel sensor group according to a second sampling result.
The sensor is an elastic wave sensor. In particular, the elastic wave sensor includes, but is not limited to, a piezoelectric sensor, a strain sensor, etc., and the piezoelectric sensor may include a piezoelectric ceramic sensor, a piezoelectric thin film sensor, a piezoelectric crystal sensor, or other sensors having a piezoelectric effect, etc.
In one illustrative example, the sampling control circuit is further configured to: and controlling the parallel sensor group to be connected into the working circuit when the sensor group is initialized or damaged does not exist in the parallel sensor group.
In an exemplary embodiment, the capacitance values of the sensors constituting one and the same parallel sensor group have a lower limit value CLAnd performing hardware replacement or other processing when the capacity value is smaller than the lower limit value through the conversion of the filter circuit.
According to the method and the device, whether the parallel sensor group has problems is firstly checked, then the sensors in the parallel sensor group are polled and detected, the sensors which are damaged are found out one by one, the damaged sensors are automatically positioned, and the normal use of the circuit is ensured.
In an exemplary embodiment, the sampling control circuit may select the first measuring circuit, the second measuring circuit, and the operating circuit by switching circuits such as switches.
In an exemplary example, if the parallel sensor groups include two or more groups, the detection of different parallel sensor groups may be polled by using a switching circuit, that is, the sampling control circuit uses the switching circuit to switch each parallel sensor group into the first measuring circuit one by one, so as to detect whether there is sensor damage for each parallel sensor group.
Fig. 2 is a schematic circuit diagram of an embodiment of switching between a first measurement circuit and a working circuit according to the present application, and as shown in fig. 2, a parallel sensor group is connected to the working circuit or the first measurement circuit by controlling a switch. In the embodiment shown in fig. 2, by controlling the switch, if the parallel sensor group is connected to the working circuit, the port a of the parallel sensor group is connected to one end (Work _ +) of the working circuit, and the port B of the parallel sensor group is connected to the other end (Work _ -) of the working circuit; by controlling the change-over switch, if the parallel sensor group is connected to the first measuring circuit, the port A of the parallel sensor group is used as one end (Check1_ +) of the first capacitor in the first measuring circuit, and the port B of the parallel sensor group is used as the other end (Check _ -) of the first capacitor in the first measuring circuit.
Fig. 3 is a schematic circuit diagram of an embodiment of an operating principle of a second measurement circuit according to the present application, and as shown in fig. 3, in this embodiment, it is assumed that a parallel sensor group includes n sensors, and a switch includes n switches that can be independently controlled, where the switch shown in fig. 3 may be an internal switch of the parallel sensor group. And controlling the change-over switch to connect one sensor in the parallel sensor group into the second measuring circuit, wherein the port A of the parallel sensor group is used as one end (Check2_ +) of the second capacitor in the second measuring circuit, and the port B of the parallel sensor group is used as the other end (Check _) of the second capacitor in the second measuring circuit.
Taking the first measuring circuit and the second measuring circuit as RC series circuits as an example, as shown in fig. 4, under the control of the acquisition control circuit, the parallel sensor group is connected as a capacitor and becomes a part of the first measuring circuit or the second measuring circuit. In the RC circuit shown in this embodiment, since a capacitor exists and a direct current cannot flow, both the resistor and the capacitor have a blocking effect on the current, the total impedance is determined by the resistor and the capacitive reactance, and the total impedance changes with the frequency. The RC series circuit has a transition frequency f0：f01/(2 pi × R × C), when the frequency of the input signal is greater than f0The total impedance of the entire RC series circuit is substantially unchanged, and its magnitude is equal to the resistance value.
For the case of a parallel sensor group controlled to be switched in and to be part of the first measuring circuit, the transition frequency f is now011/(2 pi × R1 × C1), wherein the value of the resistor R1 is a given value, the error accuracy requirement is less than 1%, and the capacitor C1 is the sum of the capacitance values of the sensors in the parallel sensor group. When the excitation signal is given, if the sensors in the parallel sensors all work normally, the amplitude of the signal output by the sampling control circuit after passing through the first measuring circuit is certain (assumed as a signal amplitude threshold A)th1) If any sensor in the parallel sensor group is damaged, the total capacitance value of the parallel sensor group is reduced, namely C1 is reduced, which means that the turning frequency f is reduced01Becomes larger, then, the amplitude of the signal obtained by the sampling control circuit and outputted after passing through the first measurement circuit is reduced (assuming that the first measurement signal amplitude A is the first measurement signal amplitude A)11) The sampling control circuit records the signal amplitude threshold Ath1With the first measurement signal amplitude A11And calculating the signal amplitude difference H of the two. Here, the signal amplitude threshold Ath1May be a value or a range.
For the case of a parallel sensor group controlled to be switched in and to be part of the second measuring circuit, the transition frequency f is now021/(2 pi × R2 × C2), wherein the value of the resistor R2 is a given value and the error accuracy requirement is less than1 percent, and the capacitor C2 is the capacitance value of the sensor which is connected with the second measuring circuit in the parallel sensor group at present. The sensors in the parallel sensor group are detected one by the change-over switches in the parallel sensor group shown in fig. 3 until the sum of the amplitude differences detected each time is equal to the signal amplitude difference H.
Specifically, if a particular sensor q (assuming a capacitance value of C) of the currently switched parallel sensors is present when the excitation signal is given2q) When the circuit works normally, the amplitude of the signal output by the sampling control circuit after passing through the second measurement circuit is constant (assumed as the signal amplitude threshold A)th2) If the sensor is damaged, its capacitance will be reduced, i.e. C2qDecrease, i.e. meaning the transition frequency f02Becomes larger, then, the amplitude of the signal obtained by the sampling control circuit and outputted after passing through the second measurement circuit is reduced (assuming that the second measurement signal amplitude A is the second measurement signal amplitude A)2q) The sampling control circuit corresponds to the amplitude threshold A of the recorded signalth2And the second measurement signal amplitude A2qAnd calculating the signal amplitude difference H of the two2qIf H is present2qIf the current value is equal to H, stopping the polling detection by adopting the second measuring circuit, and determining that the damaged sensor in the parallel sensor group is the sensor q;
if H is present2qIf the capacitance value is less than H, the polling detection is continued to the sensors in the parallel sensor group, if a certain sensor p (assuming the capacitance value is C) in the parallel sensor group which is switched to currently2p) When the circuit works normally, the amplitude of the signal output by the sampling control circuit after passing through the second measurement circuit is constant (assumed as the signal amplitude threshold A)th2) If the sensor is damaged, its capacitance will be reduced, i.e. C2pDecrease, i.e. meaning the transition frequency f02Becomes larger, then, the amplitude of the signal obtained by the sampling control circuit and outputted after passing through the second measurement circuit is reduced (assuming that the second measurement signal amplitude A is the second measurement signal amplitude A)2p) The sampling control circuit corresponds to the amplitude threshold A of the recorded signalth2And the second measurement signal amplitude A2pAnd calculating the signal amplitude difference H of the two2pIf (H)2p+H2q) If the current value is equal to H, stopping the polling detection by adopting the second measuring circuit, and determining the damaged sensors in the parallel sensor group as a sensor q and a sensor p; here, the signal amplitude threshold Ath2May be a value or a range.
If (H)2p+H2q) And if the sum of the detected signal amplitude difference values is less than H, continuing to perform polling detection on the sensors in the parallel sensor group until the sum of the detected signal amplitude difference values is equal to H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor.
It should be noted that the excitation signal is given, meaning that the excitation signal remains constant throughout the measurement.
The application also provides a method for realizing measurement of the parallel sensors, which comprises the following steps:
controlling a first measuring circuit to detect the parallel sensor group, sampling the output of the first measuring circuit, and determining whether a damaged sensor exists in the parallel sensor group according to a first sampling result;
and when damaged sensors exist in the parallel sensor group, controlling the second measuring circuit to detect a single sensor in the parallel sensor group, sampling the output of the second measuring circuit, and determining the damaged sensor in the parallel sensor group according to a second sampling result.
In one illustrative example, the first measurement circuit is a first resistor-capacitor, RC, circuit; the second measuring circuit is a second resistor-capacitor RC circuit;
controlling a first measuring circuit to detect a parallel sensor group, comprising: taking the parallel sensor group as a first capacitor in a first RC circuit, sampling the output of the first RC circuit, and detecting whether a damaged sensor exists in the parallel sensor group according to a first sampling result;
controlling a second measurement circuit to detect a single sensor in the parallel sensor group, comprising: and polling and detecting the sensors in the parallel sensor group by taking the sensors in the parallel sensor group as a second capacitor in a second RC circuit, respectively sampling the output of the second RC circuit, and determining damaged sensors according to a second sampling result.
Fig. 5 is a schematic flow chart of an embodiment of the present application for implementing parallel sensor measurement by using an RC circuit, as shown in fig. 5, in this embodiment, the method includes:
step 500: and taking the parallel sensor group as a first capacitor in a first RC circuit, sampling the output of the first measuring circuit, and detecting whether a damaged sensor exists in the parallel sensor group according to a first sampling result.
In an exemplary embodiment, the detecting whether there is a damaged sensor in the parallel sensor group in this step includes:
when the excitation signal is given, if relative to the signal amplitude threshold Ath1First measurement signal amplitude A displayed by first sampling result11Reducing, i.e. reducing, the first measurement signal amplitude A11Less than a signal amplitude threshold Ath1Then, detecting that a damaged sensor exists in the parallel sensor group; recording signal amplitude threshold Ath1With the first measurement signal amplitude A11And calculating the signal amplitude difference value H of the two signals; here, the signal amplitude threshold Ath1May be a value or a range;
when the excitation signal is given, if the sensors in the parallel sensors work normally, the first sampling result shows a first measurement signal amplitude A11Is constant, i.e. is the signal amplitude threshold Ath1。
Step 501: when a damaged sensor exists in the parallel sensor group, the sensor in the parallel sensor group is used as a second capacitor in a second RC circuit to carry out polling detection on the sensor in the parallel sensor group, the output of a second measuring circuit is respectively sampled, and the damaged sensor is determined according to a second sampling result.
In one illustrative example, a sensor for determining damage includes:
when an excitation signal is given, the sensors in the parallel sensor group are detected one by one until the sum of the amplitude difference detected each time is equal to the signal amplitude difference H, and the sensor corresponding to the detected signal amplitude difference is determined to be a damaged sensor.
In an exemplary embodiment, determining that the sensor corresponding to the detected signal amplitude difference is a damaged sensor specifically includes:
when the excitation signal is given, the sensor q is detected relative to a signal amplitude threshold Ath2And the second measurement signal amplitude A displayed by the second sampling result2qDecrease, i.e. if the second sampling result indicates a second measurement signal amplitude A2qLess than a signal amplitude threshold Ath2Then, it is detected that the sensor q is a damaged sensor, and the sampling control circuit records a signal amplitude threshold value Ath2And the second measurement signal amplitude A2qAnd calculating the signal amplitude difference H of the two2qIf H is present2qIf the number of the sensors is equal to H, determining that the damaged sensor in the parallel sensor group is the sensor q; here, the signal amplitude threshold Ath1May be a value or a range;
if H is present2qIf the signal amplitude is less than H, the polling detection is continuously carried out on the sensors in the parallel sensor group, the sensor p is detected, and the signal amplitude is relative to the signal amplitude threshold Ath2And the second measurement signal amplitude A displayed by the second sampling result2pDecrease, i.e. if the second sampling result indicates a second measurement signal amplitude A2pLess than a signal amplitude threshold Ath2Then, it is detected that the sensor p is a damaged sensor, and the sampling control circuit records the signal amplitude threshold value Ath2And the second measurement signal amplitude A2pAnd calculating the signal amplitude difference H of the two2pIf (H)2p+H2q) If the number of the sensors is equal to H, determining that the damaged sensors in the parallel sensor group are the sensor q and the sensor p;
if (H)2p+H2q) If the sum of the detected signal amplitude difference values is less than H, continuing to perform polling detection on the sensors in the parallel sensor group until the sum of the detected signal amplitude difference values is equal to H, and determining that the sensor corresponding to the detected signal amplitude difference value is damagedA bad sensor;
when the excitation signal is given, if each sensor i in the parallel sensors works normally, the second sampling result displays a second measurement signal amplitude A2iIs constant, i.e. is the signal amplitude threshold Ath2. Wherein i is 1 to n, n is the number of sensors in the parallel sensor group, and p and q are any one of the sensors of n.
In an exemplary embodiment, the parallel sensor group is controlled to be connected to the working circuit at the time of initialization or when detecting that no damaged sensor exists in the parallel sensor group.
In an exemplary example, if the parallel sensor groups include two or more groups, polling detection is performed on different parallel sensor groups in the manner of steps 500 to 501, that is, each parallel sensor group is connected to the first RC circuit one by one, so as to detect whether there is sensor damage or not for each parallel sensor group.
The above description is only a preferred example of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (16)
1. An apparatus for enabling parallel sensor measurements, comprising: the device comprises a first measuring circuit, a second measuring circuit, a sampling control circuit and a parallel sensor group comprising n parallel sensors; wherein the content of the first and second substances,
the first measuring circuit is used for detecting the parallel sensor group under the control of the sampling control circuit;
the second measurement circuit is used for polling and detecting any sensor in the parallel sensor group under the control of the sampling control circuit;
the sampling control circuit is used for controlling the first measuring circuit to detect the parallel sensor group, sampling the output of the first measuring circuit and determining whether a damaged sensor exists in the parallel sensor group according to a first sampling result; and when damaged sensors exist in the parallel sensor group, controlling the second measuring circuit to detect a single sensor in the parallel sensor group, sampling the output of the second measuring circuit, and determining the damaged sensor in the parallel sensor group according to a second sampling result.
2. The apparatus of claim 1, the sampling control circuit further to:
and controlling the parallel sensor group to be connected into a working circuit when the parallel sensor group is initialized or damaged sensors do not exist in the parallel sensor group.
3. The apparatus of claim 1 or 2, wherein the first measurement circuit is a resistor-capacitor, RC, circuit; the method comprises the following steps:
a first resistor and the parallel sensor group as a first capacitor.
4. The apparatus of claim 1 or 2, wherein the second measurement circuit is an RC circuit; the method comprises the following steps:
a second resistor, any one sensor of the parallel sensor group as a second capacitor, and a change-over switch;
and the selector switch is used for taking one sensor in the parallel sensor group as a second capacitor under the control of the sampling control circuit.
5. The apparatus according to claim 1 or 2, wherein if the parallel sensor groups include two or more groups, the sampling control circuit employs a switching circuit to switch each parallel sensor group into the first measuring circuit one by one, so as to detect whether there is sensor damage for each parallel sensor group separately.
6. The device according to claim 5, wherein there is a lower limit value for the capacitance values of the sensors that make up the same group of parallel sensors.
7. The apparatus according to claim 1 or 2, wherein the determining whether there is a damaged sensor in the parallel sensor group according to the first sampling result in the sampling control circuit when the excitation signal of the first measurement circuit is given comprises:
if the first sampling result shows the first measurement signal amplitude A11Less than a signal amplitude threshold Ath1Determining that a damaged sensor exists in the parallel sensor group;
recording signal amplitude threshold Ath1With the first measurement signal amplitude A11And calculating the signal amplitude difference value H of the two signals;
when the excitation signal is given, if the sensors in the parallel sensors work normally, the first sampling result shows a first measurement signal amplitude A11As a signal amplitude threshold Ath1。
8. The apparatus of claim 7, wherein the sensor in the sampling control circuit that determines the occurrence of the failure in the parallel sensor group according to the second sampling result given the excitation signal of the second measurement circuit comprises:
and detecting the sensors in the parallel sensor group one by one until the sum of the amplitude difference values detected each time is equal to the signal amplitude difference value H, and determining the sensor with the detected signal amplitude difference value as a damaged sensor.
9. The apparatus according to claim 8, wherein the determining the damaged sensor in the parallel sensor group specifically includes:
detecting the sensor q, if the second sampling result shows the second measuring signal amplitude A2qLess than a signal amplitude threshold Ath2Detecting that the sensor q is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2qAnd calculating the signal amplitude difference H of the two2qIf H is present2qIf the number of the sensors is equal to H, determining the damaged sensor in the parallel sensor group as the sensorQ, ending; if not, then,
if H is present2qLess than H, detecting the sensor p, and displaying a second measurement signal amplitude A by the second sampling result2pLess than a signal amplitude threshold Ath2Detecting that the sensor p is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2pAnd calculating the signal amplitude difference H of the two2pIf (H)2p+H2q) If the number of the sensors is equal to H, determining that the damaged sensors in the parallel sensor group are the sensor q and the sensor p, and ending; otherwise;
if (H)2p+H2q) If the sum of the detected signal amplitude difference values is less than H, continuing to perform polling detection on the sensors in the parallel sensor group until the sum of the detected signal amplitude difference values is equal to H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor;
when the excitation signal is given, if each sensor i in the parallel sensors works normally, the second sampling result displays a second measurement signal amplitude A2iAs a signal amplitude threshold Ath2(ii) a Wherein i is 1-n, n is the number of sensors in the parallel sensor group, and p and q are any one of the sensors of n.
10. A method of implementing parallel sensor measurements, comprising:
controlling a first measuring circuit to detect the parallel sensor group, sampling the output of the first measuring circuit, and determining whether a damaged sensor exists in the parallel sensor group according to a first sampling result;
and when damaged sensors exist in the parallel sensor group, controlling the second measuring circuit to detect a single sensor in the parallel sensor group, sampling the output of the second measuring circuit, and determining the damaged sensor in the parallel sensor group according to a second sampling result.
11. The method of claim 10, wherein the first measurement circuit is a first resistor-capacitor (RC) circuit; the second measurement circuit is a second resistor-capacitor (RC) circuit;
the control of the first measuring circuit to detect the parallel sensor group comprises the following steps: the parallel sensor group is used as a first capacitor in a first RC circuit, the output of the first RC circuit is sampled, and whether a damaged sensor exists in the parallel sensor group or not is detected according to a first sampling result;
the controlling the second measuring circuit to detect a single sensor in the parallel sensor group comprises: and polling and detecting the sensors in the parallel sensor group by taking the sensors in the parallel sensor group as a second capacitor in a second RC circuit, respectively sampling the output of the second RC circuit, and determining damaged sensors according to a second sampling result.
12. The method of claim 11, wherein said detecting the presence of a damaged sensor in a parallel sensor group comprises:
if the first sampling result shows the first measuring signal amplitude A when the excitation signal is given11Less than a signal amplitude threshold Ath1Then, detecting that a damaged sensor exists in the parallel sensor group; recording signal amplitude threshold Ath1With the first measurement signal amplitude A11And calculating the signal amplitude difference value H of the two signals;
when the excitation signal is given, if the sensors in the parallel sensors work normally, the first sampling result shows a first measurement signal amplitude A11As a signal amplitude threshold Ath1。
13. The method of claim 11, wherein the determining a damaged sensor comprises:
and detecting the sensors in the parallel sensor group one by one until the sum of the amplitude difference values detected each time is equal to the signal amplitude difference value H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor.
14. The method of claim 12, wherein the determining that the sensor corresponding to the detected signal amplitude difference is a damaged sensor comprises:
detecting the sensor q, if the second sampling result shows the second measuring signal amplitude A2qLess than a signal amplitude threshold Ath2Detecting that the sensor q is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2qAnd calculating the signal amplitude difference H of the two2qIf H is present2qIf the number of the sensors in the parallel sensor group is equal to H, determining that the damaged sensor in the parallel sensor group is a sensor q, and ending; if not, then,
if H is present2qLess than H, detecting the sensor p, and displaying a second measurement signal amplitude A by the second sampling result2pLess than a signal amplitude threshold Ath2Detecting that the sensor p is a damaged sensor, the sampling control circuit recording a signal amplitude threshold Ath2And the second measurement signal amplitude A2pAnd calculating the signal amplitude difference H of the two2pIf (H)2p+H2q) If the number of the sensors is equal to H, determining that the damaged sensors in the parallel sensor group are the sensor q and the sensor p, and ending; otherwise;
if (H)2p+H2q) If the sum of the detected signal amplitude difference values is less than H, continuing to perform polling detection on the sensors in the parallel sensor group until the sum of the detected signal amplitude difference values is equal to H, and determining that the sensor corresponding to the detected signal amplitude difference value is a damaged sensor;
when the excitation signal is given, if each sensor i in the parallel sensors works normally, the second sampling result displays a second measurement signal amplitude A2iAs a signal amplitude threshold Ath2(ii) a Wherein i is 1-n, n is the number of sensors in the parallel sensor group, and p and q are any one of the sensors of n.
15. The method of claims 10-14, further comprising:
and controlling the parallel sensor group to be connected into a working circuit when the parallel sensor group is initialized or when the parallel sensor group is detected to have no damaged sensor.
16. The method of claim 11, wherein if the parallel sensor groups include two or more groups, polling different parallel sensor groups according to the method, and accessing each parallel sensor group to the first RC circuit one by one to detect whether there is sensor damage for each parallel sensor group separately.
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