CN112697076A - Device for detecting surface flatness of high-entropy alloy remelting layer and imaging of remelted layer contour - Google Patents

Device for detecting surface flatness of high-entropy alloy remelting layer and imaging of remelted layer contour Download PDF

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Publication number
CN112697076A
CN112697076A CN202011491150.9A CN202011491150A CN112697076A CN 112697076 A CN112697076 A CN 112697076A CN 202011491150 A CN202011491150 A CN 202011491150A CN 112697076 A CN112697076 A CN 112697076A
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China
Prior art keywords
imaging
remelting layer
horizontal guide
layer
entropy alloy
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Pending
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CN202011491150.9A
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Chinese (zh)
Inventor
高国奔
郑思路
李亚飞
陈刚强
周州
欧阳俊鑫
蔡姚杰
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Zhejiang University of Technology ZJUT
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Zhejiang University of Technology ZJUT
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Priority to CN202011491150.9A priority Critical patent/CN112697076A/en
Publication of CN112697076A publication Critical patent/CN112697076A/en
Pending legal-status Critical Current

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Abstract

The invention relates to a device for detecting surface flatness of a high-entropy alloy remelting layer and outline imaging of a remelting layer, which comprises an outline mechanism, a remelting layer surface flatness measuring mechanism, a remelting layer outline imaging mechanism and a workpiece to be detected; the remelting layer surface flatness measuring mechanism is assembled on the outline mechanism and is arranged opposite to the position of the workpiece to be measured, and the remelting layer outline imaging mechanism is positioned at the end part of the outline mechanism and is arranged corresponding to the position of the workpiece to be measured; the invention has simple structure and ingenious design, compared with the prior art, the invention has clear and simple and understandable mechanism function, and adjusts the size of the sensor according to the size of the sample; in addition, the movement of the sensor is driven by a hydraulic device, so that the sensor can be stably and accurately positioned; and the single imaging mechanism can meet the requirement of three-dimensional imaging of the remelted layer. In addition, the sensor, the imaging camera and the computer terminal jointly act to ensure the detection precision.

Description

Device for detecting surface flatness of high-entropy alloy remelting layer and imaging of remelted layer contour
Technical Field
The invention relates to the technical field of flatness detection devices, in particular to a device for detecting surface flatness of a high-entropy alloy remelting layer and imaging a remelting layer profile.
Background
The metal plate is widely applied to the manufacturing industry, in order to ensure the final yield and the quality of products, the requirements on the properties of the metal plate in all aspects are met, the surface of the high-entropy alloy plate subjected to electron beam surface lap joint remelting is uneven due to the repetition of different remelting channels, and the flatness of the metal plate is detected by a conventional frequently-used flat ruler, so that the workload is large, and the time and the labor are consumed; bringing inconvenience to the use.
In view of the above problems, it is necessary to improve them.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provides a device for detecting the surface flatness of a high-entropy alloy remelting layer and the outline imaging of the remelting layer, which can detect the surface flatness of a high-entropy alloy sheet after surface remelting and ensure the detection precision under the combined action of a sensor, an imaging camera and a computer terminal; has the characteristics of simple structure, ingenious design, convenience and practicability.
In order to achieve the purpose of the invention, the invention adopts the following technical scheme: a device for detecting surface flatness of a high-entropy alloy remelting layer and imaging of a remelting layer profile comprises a profile mechanism, a remelting layer surface flatness measuring mechanism, a remelting layer profile imaging mechanism and a workpiece to be detected; the workpiece to be measured is placed on the outline mechanism, the remelting layer surface flatness measuring mechanism is assembled on the outline mechanism and is arranged opposite to the position of the workpiece to be measured, and the remelting layer outline imaging mechanism is positioned at the end part of the outline mechanism and is arranged corresponding to the position of the workpiece to be measured.
As a preferred scheme of the invention, the profile mechanism consists of a base, a first slide block, a longitudinal horizontal guide rail, a vertical bracket, a second slide block and an upper transverse horizontal guide rail; the longitudinal horizontal guide rails are symmetrically fixed on the base, the longitudinal horizontal guide rails are connected with first sliding blocks in a sliding mode, and symmetrical vertical supports are fixed on the first sliding blocks; an upper horizontal guide rail is fixedly arranged at the top between the two vertical supports, a second sliding block is arranged on the upper horizontal guide rail, and a remelting layer surface flatness measuring mechanism is arranged at the bottom of the second sliding block.
As a preferred scheme of the invention, the remelting layer surface flatness measuring mechanism comprises an upper hydraulic rod, a lower hydraulic rod and a sensor; one end of the lower hydraulic rod is sleeved in the upper hydraulic rod, and the other end of the lower hydraulic rod is connected with the sensor.
As a preferable scheme of the invention, a contact surface between the upper hydraulic rod and the lower hydraulic rod is coated with a lubricant; the sensor drives the lower hydraulic rod to move up and down through the hydraulic device, and is used for contacting the surface of the workpiece to be measured.
In a preferred embodiment of the present invention, the bottom of the sensor is provided with a sensing element, and the sensing element is used for transmitting signals emitted from the surface of the workpiece to be measured.
As a preferred scheme of the present invention, the remelted layer profile imaging mechanism comprises a lower horizontal guide rail, a third slider, a camera base, and an imaging camera, wherein the lower horizontal guide rail is fixedly disposed at an end of the base, the lower horizontal guide rail is slidably connected to the third slider, the third slider is fixedly disposed on the camera base, and the imaging camera is fixedly disposed on the camera base.
As a preferable aspect of the present invention, a space is left between the third slider and the base.
As a preferred scheme of the invention, the signals and images generated by the imaging camera and the sensor are finally received and analyzed by a computer terminal.
As a preferable scheme of the present invention, the first slider and the longitudinal horizontal guide rail, the second slider and the upper horizontal guide rail, and the third slider and the lower horizontal guide rail are driven by a stepping motor.
As a preferable scheme of the present invention, the longitudinal horizontal guide rail, the upper horizontal guide rail and the lower horizontal guide rail are all i-shaped guide rails.
The invention has the beneficial effects that: the invention has simple structure and ingenious design, compared with the prior art, the invention has clear and simple and understandable mechanism function, and adjusts the size of the sensor according to the size of the sample; in addition, the movement of the sensor is driven by a hydraulic device, so that the sensor can be stably and accurately positioned; and the single imaging mechanism can meet the requirement of three-dimensional imaging of the remelted layer. In addition, the sensor, the imaging camera and the computer terminal jointly act to ensure the detection precision.
Drawings
Fig. 1 is a schematic structural view of the present invention.
FIG. 2 is a structural view of a mechanism for measuring the surface flatness of a remelted layer according to the present invention.
FIG. 3 is a block diagram of a remelted layer profile imaging mechanism according to the present invention.
Wherein, 1-a base; 2-a first slide; 3-longitudinal horizontal guide rails; 4-a vertical support; 5-a second slide block; 6-upper horizontal guide rails; 7-upper hydraulic rod; 8-lower hydraulic rod; 9-a sensor; 10-lower transverse horizontal guide rails; 11-a third slide; 12-a camera mount; 13-an imaging camera; 14-workpiece to be measured.
Detailed Description
The following describes embodiments of the present invention in detail with reference to the accompanying drawings.
Example (b): as shown in fig. 1-3, the apparatus for detecting surface flatness of a remelting layer and imaging a remelting layer profile provided in this embodiment includes a profile mechanism, a remelting layer surface flatness measuring mechanism, a remelting layer profile imaging mechanism, and a workpiece 14 to be measured; the workpiece 14 to be measured is placed on the outline mechanism, the remelting layer surface flatness measuring mechanism is assembled on the outline mechanism and is arranged opposite to the workpiece 14 to be measured, and the remelting layer outline imaging mechanism is positioned at the end part of the outline mechanism and is arranged corresponding to the workpiece 14 to be measured.
The profile mechanism consists of a base 1, a first sliding block 2, a longitudinal horizontal guide rail 3, a vertical support 4, a second sliding block 5 and an upper transverse horizontal guide rail 6; the longitudinal horizontal guide rails 3 are symmetrically fixed on the base 1, the longitudinal horizontal guide rails 3 are connected with first sliding blocks 2 in a sliding mode, and symmetrical vertical supports 4 are fixed on the first sliding blocks 2; an upper horizontal guide rail 6 is fixedly arranged at the top between the two vertical supports 4, a second sliding block 5 is arranged on the upper horizontal guide rail 6, and a remelting layer surface flatness measuring mechanism is arranged at the bottom of the second sliding block 5; the second slide block 5 is used for transverse movement of the remelting layer surface flatness measuring mechanism.
The remelting layer surface flatness measuring mechanism comprises an upper hydraulic rod 7, a lower hydraulic rod 8 and a sensor 9; one end of the lower hydraulic rod 8 is sleeved in the upper hydraulic rod 7, and the other end is connected with the sensor 9. The flatness of the remelted layer enables the sensor 9 to be in contact with the surface of the workpiece 14 to be detected through the extension and retraction of the upper hydraulic rod and the lower hydraulic rod, related signals are transmitted to a conversion original through a sensitive element on the lower surface of the sensor 9, and finally the converted signals are received and analyzed by a computer terminal; wherein, the contact surface between the upper hydraulic rod 7 and the lower hydraulic rod 8 is coated with lubricant; the sensor 9 drives the lower hydraulic rod 8 to move up and down through a hydraulic device, and the sensor 9 is used for being in contact with the surface of the workpiece 14 to be measured.
The remelted layer contour imaging mechanism consists of a lower transverse horizontal guide rail 10, a third sliding block 11, a camera base 12 and an imaging camera 13, wherein the lower transverse horizontal guide rail 10 is fixedly arranged at the end part of the base 1, the lower transverse horizontal guide rail 10 is connected with the third sliding block 11 in a sliding way, the camera base 12 is fixedly arranged on the third sliding block 11, and the imaging camera 13 is fixedly arranged on the camera base 12; a space is reserved between the third sliding block 11 and the base 12; the third sliding block 11 can slide more smoothly and safely along the lower transverse horizontal guide rail 10; wherein the signals and images generated by the imaging camera 13 and the sensor 9 are finally received and analyzed by a computer terminal.
The first slide block 2 and the longitudinal horizontal guide rail 3, the second slide block 5 and the upper horizontal guide rail 6, and the third slide block 11 and the lower horizontal guide rail 10 are driven by a stepping motor; the longitudinal horizontal guide rail 3, the upper horizontal guide rail 6 and the lower horizontal guide rail 10 are all I-shaped guide rails.
The device of the invention has the following specific working principle: the invention provides a device for detecting surface flatness of a high-entropy alloy remelting layer and contour imaging of the remelting layer, which can detect the surface flatness of the high-entropy alloy sheet after surface remelting and ensure the detection precision by the combined action of a sensor, an imaging camera and a computer terminal under the condition that the precision and the efficiency of a traditional detection method cannot be ensured. The main principle of the invention is as follows: the device involves two main mechanisms: the remelting layer surface flatness measuring mechanism and the remelting layer profile imaging mechanism are arranged on the remelting layer surface; the remelting layer surface flatness measuring mechanism comprises an upper hydraulic rod, a lower hydraulic rod and a sensor, the surface flatness of the workpiece to be measured enables the sensor to be in contact with the surface of the workpiece to be measured through the extension and retraction of the upper hydraulic rod and the lower hydraulic rod of the remelting layer surface flatness measuring mechanism, related signals are transmitted to a conversion original piece through a sensitive element on the lower surface of the sensor, and finally the conversion original piece is received and analyzed by a computer terminal. The remelted layer contour imaging mechanism consists of a lower transverse horizontal guide rail, a third sliding block, a camera base and an imaging camera, wherein the third sliding block is placed on the lower transverse horizontal guide rail and used for driving the imaging camera to move. The two main mechanisms not only meet the detection of the surface flatness of the remelting layer, but also meet the three-dimensional representation of the remelting layer profile.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention; thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Although the reference numerals in the figures are used more here: 1-a base; 2-a first slide; 3-longitudinal horizontal guide rails; 4-a vertical support; 5-a second slide block; 6-upper horizontal guide rails; 7-upper hydraulic rod; 8-lower hydraulic rod; 9-a sensor; 10-lower transverse horizontal guide rails; 11-a third slide; 12-a camera mount; 13-an imaging camera; 14-workpiece to be measured, etc., without excluding the possibility of using other terms; these terms are used merely to more conveniently describe and explain the nature of the present invention; they are to be construed as being without limitation to any additional limitations that may be imposed by the spirit of the present invention.

Claims (10)

1. The utility model provides a detect high entropy alloy remelting layer surface smoothness and remelted layer profile formation of image device which characterized in that: comprises a profile mechanism, a remelting layer surface flatness measuring mechanism, a remelting layer profile imaging mechanism and a workpiece (14) to be measured; the workpiece (14) to be measured is placed on the outline mechanism, the remelting layer surface flatness measuring mechanism is assembled on the outline mechanism and is arranged opposite to the workpiece (14) to be measured, and the remelting layer outline imaging mechanism is positioned at the end part of the outline mechanism and is arranged corresponding to the workpiece (14) to be measured.
2. The device for detecting surface flatness of the high-entropy alloy remelting layer and imaging of the remelting layer profile as claimed in claim 1, wherein: the profile mechanism consists of a base (1), a first sliding block (2), a longitudinal horizontal guide rail (3), a vertical support (4), a second sliding block (5) and an upper transverse horizontal guide rail (6); the longitudinal horizontal guide rails (3) are symmetrically fixed on the base (1), the longitudinal horizontal guide rails (3) are connected with first sliding blocks (2) in a sliding mode, and symmetrical vertical supports (4) are fixed on the first sliding blocks (2); an upper horizontal guide rail (6) is fixedly arranged at the top between the two vertical supports (4), a second sliding block (5) is installed on the upper horizontal guide rail (6), and a remelting layer surface flatness measuring mechanism is installed at the bottom of the second sliding block (5).
3. The device for detecting surface flatness of the high-entropy alloy remelting layer and imaging of the remelting layer profile as claimed in claim 2, wherein: the remelting layer surface flatness measuring mechanism comprises an upper hydraulic rod (7), a lower hydraulic rod (8) and a sensor (9); one end of the lower hydraulic rod (8) is sleeved in the upper hydraulic rod (7), and the other end is connected with the sensor (9).
4. The apparatus for detecting surface flatness of the remelting layer of high-entropy alloy and imaging the contour of the remelting layer of the high-entropy alloy according to claim 3, wherein: a lubricant is coated on the contact surface between the upper hydraulic rod (7) and the lower hydraulic rod (8); the sensor (9) drives the lower hydraulic rod (8) to move up and down through a hydraulic device, and the sensor (9) is used for being in contact with the surface of a workpiece (14) to be measured.
5. The apparatus for detecting surface flatness of the remelting layer of high-entropy alloy and imaging the contour of the remelting layer of high-entropy alloy according to claim 4, wherein: the bottom of the sensor (9) is provided with a sensing element in a rotating mode, and the sensing element is used for transmitting signals emitted by the surface of a workpiece (14) to be measured.
6. The device for detecting surface flatness of the high-entropy alloy remelting layer and imaging of the remelting layer profile as claimed in claim 1, wherein: remelted layer profile imaging mechanism comprises horizontal guide rail (10) down, third slider (11), camera base (12) and formation of image camera (13), and horizontal guide rail (10) set firmly in base (1) tip down, and sliding connection has third slider (11) on horizontal guide rail (10) down, has set firmly camera base (12) on third slider (11), has set firmly formation of image camera (13) on camera base (12).
7. The apparatus for detecting surface flatness of the remelting layer of high-entropy alloy and imaging the contour of the remelting layer of high-entropy alloy according to claim 6, wherein: and a space is reserved between the third sliding block (11) and the base (12).
8. The apparatus for detecting surface flatness of the remelting layer of high-entropy alloy and imaging the contour of the remelting layer of high-entropy alloy according to claim 6, wherein: the signals and images generated by the imaging camera (13) and the sensor (9) are finally received and analyzed by a computer terminal.
9. The apparatus for detecting surface flatness of the remelting layer of high-entropy alloy and imaging the contour of the remelting layer of high-entropy alloy according to claim 6, wherein: the first sliding block (2) and the longitudinal horizontal guide rail (3), the second sliding block (5) and the upper horizontal guide rail (6), and the third sliding block (11) and the lower horizontal guide rail (10) are driven by a stepping motor.
10. The apparatus for detecting surface flatness of the remelting layer of high-entropy alloy and imaging the contour of the remelting layer of high-entropy alloy according to claim 6, wherein: the longitudinal horizontal guide rail (3), the upper horizontal guide rail (6) and the lower horizontal guide rail (10) are all I-shaped guide rails.
CN202011491150.9A 2020-12-17 2020-12-17 Device for detecting surface flatness of high-entropy alloy remelting layer and imaging of remelted layer contour Pending CN112697076A (en)

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CN202011491150.9A CN112697076A (en) 2020-12-17 2020-12-17 Device for detecting surface flatness of high-entropy alloy remelting layer and imaging of remelted layer contour

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Application Number Priority Date Filing Date Title
CN202011491150.9A CN112697076A (en) 2020-12-17 2020-12-17 Device for detecting surface flatness of high-entropy alloy remelting layer and imaging of remelted layer contour

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114710103A (en) * 2022-06-02 2022-07-05 浙江晴天太阳能科技股份有限公司 Photovoltaic module installation method capable of accurately identifying optimal installation angle

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CN104776823A (en) * 2015-05-08 2015-07-15 河海大学 Detecting device and detecting method for surface evenness of gate
CN204741622U (en) * 2015-07-22 2015-11-04 卢靓 Tin foot roughness of SMT paster product detects and adjusting device
CN107677206A (en) * 2017-11-03 2018-02-09 中国科学院自动化研究所(洛阳)机器人与智能装备创新研究院 A kind of lithium battery pole slice dimension measuring apparatus
CN109387523A (en) * 2018-10-23 2019-02-26 广州量子激光智能装备有限公司 A kind of burr detection machine and its detection method
CN209263939U (en) * 2019-01-16 2019-08-16 嘉善正通自润滑复合轴承厂 Sliding bearing plate flatness detecting device
CN212082336U (en) * 2020-05-14 2020-12-04 武汉芯锋芯电子科技有限公司 Chip flatness detection device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104776823A (en) * 2015-05-08 2015-07-15 河海大学 Detecting device and detecting method for surface evenness of gate
CN204741622U (en) * 2015-07-22 2015-11-04 卢靓 Tin foot roughness of SMT paster product detects and adjusting device
CN107677206A (en) * 2017-11-03 2018-02-09 中国科学院自动化研究所(洛阳)机器人与智能装备创新研究院 A kind of lithium battery pole slice dimension measuring apparatus
CN109387523A (en) * 2018-10-23 2019-02-26 广州量子激光智能装备有限公司 A kind of burr detection machine and its detection method
CN209263939U (en) * 2019-01-16 2019-08-16 嘉善正通自润滑复合轴承厂 Sliding bearing plate flatness detecting device
CN212082336U (en) * 2020-05-14 2020-12-04 武汉芯锋芯电子科技有限公司 Chip flatness detection device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114710103A (en) * 2022-06-02 2022-07-05 浙江晴天太阳能科技股份有限公司 Photovoltaic module installation method capable of accurately identifying optimal installation angle
CN114710103B (en) * 2022-06-02 2022-10-04 浙江晴天太阳能科技股份有限公司 Photovoltaic module installation method capable of accurately identifying optimal installation angle

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Application publication date: 20210423