CN112685322A - Customized test method, device and system - Google Patents
Customized test method, device and system Download PDFInfo
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- CN112685322A CN112685322A CN202110037319.1A CN202110037319A CN112685322A CN 112685322 A CN112685322 A CN 112685322A CN 202110037319 A CN202110037319 A CN 202110037319A CN 112685322 A CN112685322 A CN 112685322A
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Abstract
The invention relates to a customized test method, a device and a system, wherein the method comprises the following steps: building a customized test environment and acquiring manufacturer information selected by a user; inquiring and matching in a stored test scheme database according to manufacturer information, and determining a corresponding test application scheme; according to the test application scheme, determining corresponding tested equipment and a first predictive command, and automatically connecting to the tested equipment through a serial port; acquiring version information of the tested equipment, and judging whether the test condition is met or not according to the version information and manufacturer information; and if so, executing the first prediction command in the tested equipment, and recording and storing corresponding test result data. According to the invention, related operations are not required to be performed manually, the operation time and energy of testers are reduced, the accuracy is greatly improved, and effective test result data are output and provided for a user to check and analyze.
Description
Technical Field
The present invention relates to the field of network technologies, and in particular, to a customized test method, apparatus, and system.
Background
At present, when a product is tested in a customized manner, because the types of devices to be tested and the versions of manufacturers to be tested are diversified, and the quantity of function configurations required by each type of device and each type of device manufacturer is inconsistent, when testing is to be performed, function differentiation and re-configuration of related automatic scripts are required according to the requirements of the types of devices, and the specification of the devices with the types of devices needs to be inquired each time and then manually adjusted, so that the time is consumed when testing each function, one test item needs to be stopped and re-adjusted each time, and the accuracy and the working efficiency are very low. In summary, how to perform a customized test method with high efficiency and low labor cost is an urgent problem to be solved.
Disclosure of Invention
In view of the above, it is desirable to provide a customized test method, apparatus and system, which can solve the problem of how to perform a customized test method with high efficiency and low labor cost.
The invention provides a customized test method applied to a test machine, which comprises the following steps:
building a customized test environment and acquiring manufacturer information selected by a user;
inquiring and matching in a stored test scheme database according to the manufacturer information, and determining a corresponding test application scheme;
according to the test application scheme, determining corresponding tested equipment and a first prediction command, and automatically connecting to the tested equipment through a serial port;
acquiring version information of the tested equipment, and judging whether a test condition is met according to the version information and the manufacturer information;
and if so, executing the first prediction command in the tested equipment, and recording and storing corresponding test result data.
Further, the building of the customized test environment comprises:
connecting the tester and the tested equipment, wherein the tested equipment is connected with an internal switch;
judging whether the communication between the tester and the tested equipment is normal or not;
if the communication is normal, automatically configuring the IP address of the tested equipment;
and if the communication is abnormal, generating network abnormity prompt information to remind a user to debug until the communication between the tester and the tested equipment is normal.
Further, the acquiring manufacturer information selected by the user includes:
generating selection prompt information, wherein the selection prompt information is used for prompting a user to select a customized manufacturer;
and generating the manufacturer information according to the customized manufacturer selected by the user.
Further, the version information includes an operation version and a hardware model of the device under test, and the obtaining the version information of the device under test and determining whether the test condition is satisfied according to the version information and the vendor information includes:
checking the running version and the hardware model of the tested equipment according to the execution result of the first prediction command in the tested equipment;
and if the running version is consistent with version information in the manufacturer information and the hardware model is consistent with model information in the manufacturer information, the test condition is met.
Further, before checking the running version and the hardware model of the device under test according to the execution result of the first predictive command in the device under test, the method further includes:
judging whether the operation language corresponding to the first prediction command is consistent with the operation language corresponding to the running version of the tested equipment or not;
if not, updating the operation language in the first predictive command until the operation language corresponding to the first predictive command is matched with the operation language corresponding to the running version of the tested equipment;
and if so, executing the first predictive command on the tested equipment.
Further, the executing the first predictive command in the device under test, and the recording and storing the corresponding test result data includes:
determining a test point and a parameter threshold corresponding to the tested equipment according to the first prediction command;
executing the first predictive command at the test point, and determining a corresponding test point parameter value;
determining corresponding test result data according to the comparison result of the parameter values of the test points and the parameter threshold values;
judging whether the test result accords with the test application scheme or not according to the test result data;
and recording and storing the corresponding test result data.
Further, the test result data includes at least one of current test version data, current test equipment hardware model data, test function module data, and problem module data.
Further, the customized test method further comprises:
obtaining a user-defined test point and a user-defined parameter threshold;
determining a self-defined test scheme according to the self-defined test point and the self-defined parameter threshold;
according to the self-defined test scheme, determining the corresponding tested equipment and a second prediction command, and automatically connecting to the tested equipment through a serial port;
acquiring version information of the tested equipment, and judging whether the test condition is met according to the version information and the manufacturer information;
and if so, executing the second prediction command in the tested equipment, and recording and storing corresponding test result data.
The invention also provides a customized test device, which comprises a processor and a memory, wherein the memory is stored with a computer program, and the computer program is executed by the processor to realize the customized test method.
The invention also provides a customized test system which comprises a test machine, a tested device, an internal switch and the customized test device.
Compared with the prior art, the invention has the beneficial effects that: firstly, building a customized test environment to ensure normal communication connection, and then acquiring manufacturer information selected by a user through a test machine so as to effectively determine manufacturer information corresponding to tested equipment to be tested by the user; then, a test application scheme corresponding to manufacturer information is determined through query matching in a test scheme database, so that different test application schemes are automatically matched according to different manufacturer information, the test intelligence and efficiency are ensured, and the flow steps of manually distinguishing functions according to different tested equipment and different manufacturers are reduced; furthermore, according to various information in the test application scheme, the tested equipment and the first predictive command are determined, and the management interface IP is automatically configured to carry out serial port connection, so that complicated test processes such as manual debugging connection and the like are avoided; furthermore, after the connection is successful, the version information is matched again, whether the manufacturer information required to be tested by the user is consistent with the version information of the tested equipment or not is determined, and the accuracy of subsequent testing is ensured; and finally, only under the condition of consistent matching, executing the first predictive command in the test application scheme in the tested equipment so as to effectively store corresponding test result data and facilitate the analysis and the checking of testers. In summary, according to manufacturer information selected by a user, the invention automatically matches a corresponding test application scheme in a test scheme database on a testing machine, performs selection of a device to be tested and determination of a first predictive command through the test application scheme, automatically configures related predictive commands according to devices of different models to execute tests of multiple functional quantities, does not need to stop modifying any parameter in the middle, does not need to manually perform related operations, reduces operation time and energy of a tester, greatly improves accuracy, outputs effective test result data to the user, helps the tester to verify and analyze a functional module in actual research and development, realizes quick positioning of a problem module, saves labor cost of research and development, and greatly improves test performance.
Drawings
FIG. 1 is a first flowchart illustrating a customized testing method according to the present invention;
FIG. 2 is a schematic flow chart of building a customized test environment according to the present invention;
FIG. 3 is a schematic structural diagram of a topology environment provided by the present invention;
FIG. 4 is a schematic view of a process for obtaining vendor information according to the present invention;
FIG. 5 is a schematic flow chart of the present invention for determining whether the test condition is satisfied;
FIG. 6 is a flow chart illustrating matching operation languages provided by the present invention;
FIG. 7 is a schematic flow chart of determining test result data according to the present invention;
FIG. 8 is a second flowchart illustrating a customized testing method according to the present invention;
fig. 9 is a schematic structural diagram of a customized testing apparatus provided in the present invention.
Detailed Description
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate preferred embodiments of the invention and together with the description, serve to explain the principles of the invention and not to limit the scope of the invention.
Example 1
An embodiment of the present invention provides a customized testing method, and referring to fig. 1, fig. 1 is a first flowchart of the customized testing method provided by the present invention, where the customized testing method includes steps S1 to S5, where:
in step S1, a customized test environment is established, and vendor information selected by the user is acquired;
in step S2, query and match are performed in the stored test scheme database according to the manufacturer information, and a corresponding test application scheme is determined;
in step S3, according to the test application scheme, determining the corresponding device under test and the first predictive command, and automatically connecting to the device under test through the serial port;
in step S4, version information of the device under test is acquired, and whether the test condition is satisfied is determined according to the version information and the manufacturer information;
in step S5, if yes, a first prediction command is executed in the device under test, and corresponding test result data is recorded and stored.
In the embodiment of the invention, firstly, the construction of a customized test environment is carried out to ensure that the communication connection is normal, and then manufacturer information selected by a user is obtained through a test machine, so that the manufacturer information corresponding to the tested equipment to be tested by the user is effectively determined; then, a test application scheme corresponding to manufacturer information is determined through query matching in a test scheme database, so that different test application schemes are automatically matched according to different manufacturer information, the test intelligence and efficiency are ensured, and the flow steps of manually distinguishing functions according to different tested equipment and different manufacturers are reduced; furthermore, according to various information in the test application scheme, the tested equipment and the first predictive command are determined, and the management interface IP is automatically configured to carry out serial port connection, so that complicated test processes such as manual debugging connection and the like are avoided; furthermore, after the connection is successful, the version information is matched again, whether the manufacturer information required to be tested by the user is consistent with the version information of the tested equipment or not is determined, and the accuracy of subsequent testing is ensured; and finally, only under the condition of consistent matching, executing the first predictive command in the test application scheme in the tested equipment so as to effectively store corresponding test result data and facilitate the analysis and the checking of testers.
Preferably, referring to fig. 2, fig. 2 is a schematic flowchart of the process of building the customized test environment provided by the present invention, where the step S1 includes steps S11 to S14, where:
in step S11, connecting the tester and the device under test, wherein the device under test is connected to the internal switch;
in step S12, it is determined whether or not the communication between the tester and the device under test is normal;
in step S13, if the communication is normal, automatically configuring an IP address of the device under test;
in step S14, if the communication is not normal, a network abnormality prompt message is generated to prompt the user to debug until the communication between the tester and the device under test is normal.
As a specific embodiment, the test environment is built according to the topological graph, the test machine is directly connected with the tested equipment, and the tested equipment is connected to the internal switch, so that the tested equipment is ensured to be a customized factory environment; after the topology environment is successfully built, a customized test system is operated on a test machine, the customized test system tries to connect to the tested equipment at the moment, whether the connection communication between the test machine and the tested equipment is normal or not is confirmed, if the customized test system cannot be connected to the tested equipment, network abnormity prompt information is generated to give a user clear prompt, and the user is reminded to check the test machine to the tested equipment network; after the connection communication between the testing machine and the tested equipment is normal, the IP address of the tested equipment is automatically configured, so that a stable and efficient customized testing environment is built.
It should be noted that, referring to fig. 3, fig. 3 is a schematic structural diagram of a topology environment provided by the present invention, wherein a tester is directly connected to a device to be tested, the device to be tested is connected to an internal switch, and network communication between the three devices is ensured.
It should be noted that the test scheme database provides a plurality of predefined test schemes, there are default module test schemes corresponding to the needs of manufacturers, and also a plurality of similar UAC test schemes, IPS test schemes, FW test schemes, etc., and when these predefined test schemes are selected, the automatic test can be performed one by one according to the module functions included in the test schemes, and the test points outside the test schemes will not be tested.
Preferably, referring to fig. 4, fig. 4 is a schematic flow chart of obtaining vendor information provided by the present invention, and the step S1 further includes steps S15 to S16, where:
in step S15, generating selection prompt information for prompting the user to select the customized vendor;
in step S16, vendor information is generated based on the customized vendor selected by the user.
As a specific embodiment, the embodiment provides a plurality of choices to the user on the test machine by using the selection prompt information, the user selects the corresponding customized manufacturer according to the test requirement, and the test machine generates the corresponding manufacturer information according to the selected customized manufacturer, where the manufacturer information includes the running version and the hardware model of the device to be tested corresponding to the manufacturer, so as to facilitate the determination of the subsequent test application scheme. It can be understood that different tested devices correspond to a plurality of customized manufacturers, the tester provided by the invention stores the relevant information of the customized manufacturers to form a manufacturer information database, and the corresponding manufacturer information can be generated by querying the database according to the selection of a user.
Preferably, if the user selects a customized manufacturer not included in the manufacturer information database, the user is prompted to perform operations of customizing manufacturer information and customizing a corresponding test application scheme, the manufacturer information database is subjected to data expansion according to the user-defined manufacturer information, and the test scheme database is subjected to data expansion according to the user-defined manufacturer information and the customized test application scheme.
Preferably, referring to fig. 5, fig. 5 is a schematic flow chart illustrating the method for determining whether the test condition is satisfied, where the step S4 further includes steps S41 to S42, where:
in step S41, checking the running version and the hardware model of the device under test according to the execution result of the first predictive command in the device under test;
in step S42, if the running version is consistent with the version information in the vendor information and the hardware model is consistent with the model information in the vendor information, the test condition is satisfied.
As a specific embodiment, before testing, the present embodiment verifies whether the running version and the hardware model of the device under test are consistent with the running version and the hardware model in the vendor information, so as to ensure that the device under test is indeed selected by the user through the testing machine, thereby ensuring the stability of subsequent testing.
Preferably, referring to fig. 6, fig. 6 is a schematic flow chart of the matching operation language provided by the present invention, and step S4 further includes step S401 to step S403 before step S, where:
in step S401, determining whether the operation language corresponding to the first language-predictive command is consistent with the operation language corresponding to the running version of the device under test;
in step S402, if the operation languages in the first predictive command are inconsistent, the operation language in the first predictive command is updated until the operation language corresponding to the first predictive command matches the operation language corresponding to the version information;
in step S403, if the two commands match, a first prediction command is executed on the device under test.
As a specific embodiment, before testing, the embodiment first matches the operation language corresponding to the first predictive command with the operation language corresponding to the running version of the device under test to ensure that the first predictive command can be accurately executed in the device under test, and updates and converts the operation language of the first predictive command if the first predictive command does not match the operation language of the device under test until the operation languages of the first predictive command and the device under test are consistent in form.
Preferably, referring to fig. 7, fig. 7 is a schematic flowchart of determining test result data provided by the present invention, and the step S5 includes steps S51 to S55, where:
in step S51, determining a test point and a parameter threshold corresponding to the device under test according to the first predictive command;
in step S52, a first predictive command is executed at the test point to determine a corresponding test point parameter value;
in step S53, determining corresponding test result data according to the comparison result of the parameter value of the test point and the parameter threshold value;
in step S54, determining whether the test result conforms to the test application scenario according to the test result data;
in step S55, the corresponding test result data is recorded and stored.
As a specific embodiment, in the functional test of this embodiment, there are a plurality of test points, a corresponding test point and a parameter threshold corresponding to each test point are determined by a first predictive command, the corresponding first predictive command is executed at each test point to obtain a corresponding test point parameter value, and by comparing the test point parameter value with the parameter threshold, whether the test point meets the test requirement can be effectively determined, so that the customized test of this item is completed, and corresponding test result data is generated to the user, which is convenient for the user to visually check and analyze.
To illustrate a specific embodiment, the first prediction command includes a "subinterface configuration test command", corresponding to a maximum configuration value of 50, and a "response time test command", corresponding to a maximum configuration value of 0.5. When a 'subinterface configuration test command' is executed on the tested equipment, the corresponding parameter value of the test point is 60, if the parameter value is more than 50, the test result does not meet the test requirement, and corresponding test result data is generated to display the test data and the test result of the test point; when the 'response time test command' is executed on the tested equipment, the corresponding parameter value of the test point is 0.1 and is less than 0.5, the test result meets the test requirement, and corresponding test result data is generated to display the test data and the test result of the test point. The first prediction command realizes the test of a plurality of test points, generates test result data of the plurality of test points, forms a corresponding test report and feeds the test report back to a user, and the user can conveniently check and analyze the test report.
Preferably, the test result data includes at least one of current test version data, current test device hardware model data, test function module data, and problem module data. Therefore, test result data are comprehensively formed according to the test results of the plurality of test points, and a related test report is generated, so that the user can conveniently and quickly position.
Preferably, referring to fig. 8, fig. 8 is a flowchart illustrating a second customized testing method provided by the present invention, where the customized testing method further includes steps S6 to S10, where:
in step S6, a user-defined test point and a user-defined parameter threshold are obtained;
in step S7, determining a custom test scheme according to the custom test point and the custom parameter threshold;
in step S8, according to the custom test scheme, determining the corresponding device under test and the second predictive command, and automatically connecting to the device under test through the serial port;
in step S9, version information of the device under test is acquired, and whether the test condition is satisfied is determined according to the version information and the manufacturer information;
in step S10, if yes, a second prediction command is executed in the device under test, and corresponding test result data is recorded and stored.
As a specific embodiment, if there is no test scheme meeting the current test requirements in the test scheme database (there is no corresponding vendor information or the user needs to define in general), the user selects to add a custom test scheme, clicks the new custom test scheme, pops up all test function points and corresponding test point object specification value configuration parameter input boxes, and the user can select the custom test points to be tested and the custom parameter threshold according to the own requirements, so that the customized test can be effectively performed according to the specified test points, and the flexibility and reliability of the test method are increased.
In a specific embodiment of the present invention, the specific test flow is as follows:
the first step is as follows: correctly building a customized test environment (see steps S11 to S14);
the second step is that: a user selects a tested manufacturer (including GY, LZ, AH and the like) on a testing machine to generate corresponding manufacturer information;
the third step: the user self-defines the test scheme;
the fourth step: if the user does not select the custom scheme, inquiring and matching in the test scheme database according to the manufacturer information, determining a corresponding test application scheme, and determining corresponding tested equipment and a first predictive command according to the test application scheme;
the fifth step: if the user selects the custom scheme, selecting a test point, selecting a parameter threshold corresponding to the test point, for example: selecting a test point ' subinterface configuration ', filling in a ' subinterface configuration maximum value parameter: 50 "; determining a self-defined test scheme according to the self-defined test points and the self-defined parameter threshold; determining corresponding tested equipment and a second predictive command according to the self-defined test scheme, and automatically connecting the tested equipment and the second predictive command to the tested equipment through a serial port;
and a sixth step: obtaining user confirmation selection correct information, including but not limited to confirming that a tester is correct, and a test scheme (a test application scheme or a custom scheme) is correct;
the seventh step: the testing machine automatically connects to the tested device, after the testing machine is correctly connected to the tested device, the operation language corresponding to the predictive test command (the first predictive command or the second predictive command) is used for matching with the operation language corresponding to the running version of the tested device, wherein due to the diversity of manufacturers and the involvement of a plurality of manufacturers, the operation command of each manufacturer is inconsistent, a plurality of commands need to be tried, if the operation command is a mismatch command, a new language command is replaced for execution, and finally a legal test command can be found;
eighth step: after the usable test command is correctly predicted, the predicted test command (the first predicted command or the second predicted command) is executed in the tested equipment, the running version and the hardware model of the tested equipment are checked, whether the selected manufacturer in the test scheme is the same as the manufacturer of the actual test equipment is compared, and if the manufacturer is the same as the manufacturer of the actual test equipment, the test scheme is tested.
The ninth step: the test is performed according to the selected function in the selected test scenario (test application scenario or custom scenario), for example: in this example, the test of 'subinterface configuration' and 'the maximum value of the current manufacturer configuration is 50' are selected, the automatic test system performs subinterface configuration test according to the predictive command, predicts that the maximum value of a single test point is 50 +/-10, checks whether the test requirement is met, executes various predictive test commands, determines corresponding test result data, forms a test report output, compares the test result with a test scheme, checks whether the test result meets the test scheme, and completes the customized test.
Example 2
An embodiment of the present invention provides a customized test apparatus, and with reference to fig. 9, fig. 9 is a schematic structural diagram of the customized test apparatus provided in the present invention, where the customized test apparatus 900 includes:
an obtaining unit 901, configured to build a customized test environment and obtain manufacturer information selected by a user;
the processing unit 902 is configured to query and match in a stored test scheme database according to manufacturer information, and determine a corresponding test application scheme; the device is also used for determining corresponding tested equipment and a first prediction command according to the test application scheme, and automatically connecting to the tested equipment through a serial port; the system is also used for acquiring version information of the tested equipment and judging whether the test conditions are met according to the version information and manufacturer information;
and the test unit 903 is used for executing the first prediction command in the tested device if the first prediction command is satisfied, and recording and storing corresponding test result data.
Example 3
An embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the customized test method as above is implemented.
Example 4
The embodiment of the invention provides a customized test system which comprises a test machine, a tested device, an internal switch and the customized test device.
The invention discloses a customized test method, a customized test device and a customized test system, wherein firstly, the customized test environment is established to ensure normal communication connection, and then manufacturer information selected by a user is acquired through a test machine, so that manufacturer information corresponding to tested equipment to be tested by the user is effectively determined; then, a test application scheme corresponding to manufacturer information is determined through query matching in a test scheme database, so that different test application schemes are automatically matched according to different manufacturer information, the test intelligence and efficiency are ensured, and the flow steps of manually distinguishing functions according to different tested equipment and different manufacturers are reduced; furthermore, according to various information in the test application scheme, the tested equipment and the first predictive command are determined, and the management interface IP is automatically configured to carry out serial port connection, so that complicated test processes such as manual debugging connection and the like are avoided; furthermore, after the connection is successful, the version information is matched again, whether the manufacturer information required to be tested by the user is consistent with the version information of the tested equipment or not is determined, and the accuracy of subsequent testing is ensured; and finally, only under the condition of consistent matching, executing the first predictive command in the test application scheme in the tested equipment so as to effectively store corresponding test result data and facilitate the analysis and the checking of testers.
According to the technical scheme, the corresponding test application scheme is automatically matched in the test scheme database on the testing machine according to manufacturer information selected by a user, the tested equipment is selected and the first predictive command is determined through the test application scheme, the related predictive commands are automatically configured according to different types of equipment to execute the test of multiple functional quantities, any parameter is not required to be stopped and modified, manual operation is not required, the operation time and energy of a tester are reduced, the accuracy is greatly improved, effective test result data is output and provided for the user, the tester is helped to verify and analyze the functional module in actual research and development, the problem module is quickly positioned, the research and development labor cost is saved, and the test efficiency is greatly improved.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (10)
1. A customized test method is applied to a test machine and comprises the following steps:
building a customized test environment and acquiring manufacturer information selected by a user;
inquiring and matching in a stored test scheme database according to the manufacturer information, and determining a corresponding test application scheme;
according to the test application scheme, determining corresponding tested equipment and a first prediction command, and automatically connecting to the tested equipment through a serial port;
acquiring version information of the tested equipment, and judging whether a test condition is met according to the version information and the manufacturer information;
and if so, executing the first prediction command in the tested equipment, and recording and storing corresponding test result data.
2. The customized test method according to claim 1, wherein the building of the customized test environment comprises:
connecting the tester and the tested equipment, wherein the tested equipment is connected with an internal switch;
judging whether the communication between the tester and the tested equipment is normal or not;
if the communication is normal, automatically configuring the IP address of the tested equipment;
and if the communication is abnormal, generating network abnormity prompt information to remind a user to debug until the communication between the tester and the tested equipment is normal.
3. The customized test method according to claim 1, wherein the obtaining of the vendor information selected by the user comprises:
generating selection prompt information, wherein the selection prompt information is used for prompting a user to select a customized manufacturer;
and generating the manufacturer information according to the customized manufacturer selected by the user.
4. The customized test method according to claim 1, wherein the version information includes an operation version and a hardware model of the device under test, and the obtaining the version information of the device under test and determining whether the test condition is satisfied according to the version information and the vendor information includes:
checking the running version and the hardware model of the tested equipment according to the execution result of the first prediction command in the tested equipment;
and if the running version is consistent with version information in the manufacturer information and the hardware model is consistent with model information in the manufacturer information, the test condition is met.
5. The customized test method according to claim 4, wherein before checking the running version and the hardware model of the device under test according to the execution result of the first predictive command in the device under test, the method further comprises:
judging whether the operation language corresponding to the first prediction command is consistent with the operation language corresponding to the running version of the tested equipment or not;
if not, updating the operation language in the first predictive command until the operation language corresponding to the first predictive command is matched with the operation language corresponding to the running version of the tested equipment;
and if so, executing the first predictive command on the tested equipment.
6. The customized test method according to claim 1, wherein the executing the first predictive command in the device under test, and the recording and storing corresponding test result data comprises:
determining a test point and a parameter threshold corresponding to the tested equipment according to the first prediction command;
executing the first predictive command at the test point, and determining a corresponding test point parameter value;
determining corresponding test result data according to the comparison result of the parameter values of the test points and the parameter threshold values;
judging whether the test result accords with the test application scheme or not according to the test result data;
and recording and storing the corresponding test result data.
7. The customized test method according to claim 6, wherein the test result data comprises at least one of current test version data, current test equipment hardware model data, test function module data, and problem module data.
8. The customized test method according to any one of claims 1-7, further comprising:
obtaining a user-defined test point and a user-defined parameter threshold;
determining a self-defined test scheme according to the self-defined test point and the self-defined parameter threshold;
according to the self-defined test scheme, determining the corresponding tested equipment and a second prediction command, and automatically connecting to the tested equipment through a serial port;
acquiring version information of the tested equipment, and judging whether the test condition is met according to the version information and the manufacturer information;
and if so, executing the second prediction command in the tested equipment, and recording and storing corresponding test result data.
9. A customized testing apparatus comprising a processor and a memory, wherein the memory stores a computer program, and the computer program, when executed by the processor, implements the customized testing method according to any one of claims 1-8.
10. A customized test system comprising a tester, a device under test, an internal switch, and the customized test apparatus according to claim 9.
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