CN112684325A - Compression method and device for test vector instruction in ATE (automatic test equipment) - Google Patents
Compression method and device for test vector instruction in ATE (automatic test equipment) Download PDFInfo
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- CN112684325A CN112684325A CN202011629041.9A CN202011629041A CN112684325A CN 112684325 A CN112684325 A CN 112684325A CN 202011629041 A CN202011629041 A CN 202011629041A CN 112684325 A CN112684325 A CN 112684325A
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Abstract
The invention provides a compression method and equipment for test vector instructions in ATE equipment, wherein the method comprises the following steps: obtaining a test vector to be compressed; determining each instruction data in the test vector; the instruction data is the micro instruction and the micro instruction parameter which are related to each other in the test vector for carrying out the ATE test; for each instruction data, determining an identifier corresponding to the instruction data based on a pre-established relation table; wherein, the corresponding relation between the instruction data and the identification is stored in the relation table; the storage space occupied by the identifier is smaller than that occupied by the instruction data; and replacing the instruction data with the identification to complete the compression of the test vector and generate a compressed vector. According to the scheme, the instruction data is replaced by the identification, and the storage space occupied by the identification is smaller than the instruction data, so that the storage space occupied by the whole test vector can be effectively reduced, the speed of loading the test vector is accelerated, the storage space of the test vector is reduced, and the cost of the whole test process is also reduced.
Description
Technical Field
The present invention relates to the field of compression techniques for test vectors in ATE devices, and in particular, to a method and device for compressing test vector instructions in ATE devices.
Background
Ate (automatic Test equipment) is automatic Test equipment, which is a system for automatically testing integrated circuits through computers and special equipment. ATE is used to test the integrity of the function and performance of integrated circuits and is an important device in ensuring the quality of integrated circuits in the manufacturing process of integrated circuits.
Specifically, in the test, the test signal of ATE is synthesized by the test timing and the test vector, and the test timing defines the signal period (T) and the test waveform (Wave) of the device under test and the corresponding Edge (Edge) time point of each test waveform. The test vector is a collection of codes that control the tester to generate the signal waveforms required by the chip under test and determine whether the test chip responds correctly. With the continuous development of integrated circuits, the integration scale and complexity of the integrated circuits are increasing, so that the test complexity of the integrated circuits is also increasing, and the test vectors required for testing the integrated circuits are also increasing. The method not only continuously increases the loading time of the test vectors, but also continuously increases the requirements on the storage space of the test vectors, thereby not only bringing great challenges to the automatic test equipment, but also continuously reducing the test efficiency of the integrated circuit and continuously increasing the cost.
Thus, there is a need for a better solution to the problems of the prior art.
Disclosure of Invention
In view of the foregoing, the present invention provides a method and apparatus for compressing test vector instructions in ATE equipment. In the scheme, the instruction data is replaced by the identification, and the storage space occupied by the identification is smaller than the instruction data, so that the storage space occupied by the whole test vector can be effectively reduced, the speed of loading the test vector is accelerated, the storage space of the test vector is reduced, and the cost of the whole test process is also reduced.
Specifically, the present invention proposes the following specific examples:
the embodiment of the invention provides a compression method of a test vector instruction in ATE equipment, which comprises the following steps:
obtaining a test vector to be compressed;
determining each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test;
for each instruction data, determining an identifier corresponding to the instruction data based on a pre-established relation table; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data;
and replacing the instruction data with the identification to complete the compression of the test vector and generate a compressed vector.
In a specific embodiment, the number of identifications is greater than or equal to 256; different ones of the identifiers correspond to different ones of the instruction data.
In a specific embodiment, the identifier is an 8-bit binary number or an 8-bit 16-ary number.
In a specific embodiment, the method further comprises:
storing the compressed vector.
In a specific embodiment, the method further comprises:
traversing the compressed vector to determine each of the identifiers in the compressed vector when a decompression request is received;
for each identifier, determining the instruction data corresponding to the identifier based on the relation table;
replacing the identification in the compressed vector with the instruction data to decompress the compressed vector to generate the test vector.
In a specific embodiment, the method further comprises:
traversing the test vector, and determining all the instruction data in the test vector;
determining the category of all the instruction data by classifying the same instruction data;
establishing a corresponding relation between the instruction data and the identification under the category aiming at each category;
and generating a relation table based on the corresponding relation.
The embodiment of the present invention further provides a compression device for test vector instructions in ATE devices, including:
the acquisition module is used for acquiring a test vector to be compressed;
the determining module is used for determining each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test;
the identification module is used for determining an identification corresponding to the instruction data based on a pre-established relation table aiming at each instruction data; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data;
and the replacing module is used for replacing the instruction data with the identification so as to complete the compression of the test vector and generate a compressed vector.
The method, the number of said identifications is greater than or equal to 256; different ones of the identifiers correspond to different ones of the instruction data.
In the method, the identifier is 8-bit binary digits or 8-bit 16-ary digits.
The method, the device further comprises:
and the storage module is used for storing the compressed vectors.
Therefore, the embodiment of the present invention provides a method and an apparatus for compressing test vector instructions in ATE equipment, wherein the method includes: obtaining a test vector to be compressed; determining each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test; for each instruction data, determining an identifier corresponding to the instruction data based on a pre-established relation table; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data; and replacing the instruction data with the identification to complete the compression of the test vector and generate a compressed vector. In the scheme, the instruction data is replaced by the identification, and the storage space occupied by the identification is smaller than the instruction data, so that the storage space occupied by the whole test vector can be effectively reduced, the speed of loading the test vector is accelerated, the storage space of the test vector is reduced, and the cost of the whole test process is also reduced.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a flowchart illustrating a method for compressing test vector instructions in ATE equipment according to an embodiment of the present invention;
FIG. 2 is a block diagram illustrating a vector structure of a method for compressing test vector instructions in an ATE device according to an embodiment of the present invention;
FIG. 3 is a diagram illustrating vector replacement in a method for compressing test vector instructions in ATE equipment according to an embodiment of the present invention;
fig. 4 is a block diagram of a compression apparatus for test vector instructions in an ATE apparatus according to an embodiment of the present invention.
Detailed Description
Various embodiments of the present disclosure will be described more fully hereinafter. The present disclosure is capable of various embodiments and of modifications and variations therein. However, it should be understood that: there is no intention to limit the various embodiments of the disclosure to the specific embodiments disclosed herein, but rather, the disclosure is to cover all modifications, equivalents, and/or alternatives falling within the spirit and scope of the various embodiments of the disclosure.
The terminology used in the various embodiments of the present disclosure is for the purpose of describing particular embodiments only and is not intended to be limiting of the various embodiments of the present disclosure. As used herein, the singular forms are intended to include the plural forms as well, unless the context clearly indicates otherwise. Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of the present disclosure belong. The terms (such as those defined in commonly used dictionaries) should be interpreted as having a meaning that is consistent with their contextual meaning in the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined in various embodiments of the present disclosure.
Example 1
Embodiment 1 of the present invention discloses a method for compressing test vector instructions in ATE equipment, which includes the following steps, as shown in fig. 1:
specifically, the structure of the test vector is shown in fig. 2, which includes data of a plurality of channels, such as channel 0 data, channel 1 data, and the like, and further includes a waveform schedule address, a waveform format table address, and micro instructions and micro instruction parameters, specifically, as shown in fig. 2, the space occupied by the test vector is relatively large, wherein the micro instructions and the micro instruction parameters occupy most of the space, and according to the research of the inventor, it is found that the repetition rate of the micro instructions and the micro instruction parameters is relatively high, and the types or categories of the micro instructions and the micro instruction parameters in the same test vector are not more than 256.
based on traversing the test vector, the instruction data is determined, and the specific instruction data is the microinstruction and microinstruction parameter having the correlation relationship in the test vector for performing the ATE test, as shown in fig. 2, the microinstruction and microinstruction parameter in the same row, for example, the microinstruction and microinstruction parameter in the top row.
Specifically, when the micro instruction performs a test based on the test vector, the micro instruction plays a role in executing a predetermined operation, for example, the operation is to turn to the target vector, as for the associated micro instruction parameter, the position may be only the position of the target vector, and the position may be an address code, as for other micro instructions and micro instruction parameters, which are similar to each other, and details are not repeated here.
103, aiming at each instruction data, determining an identifier corresponding to the instruction data based on a pre-established relation table; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data;
specifically, the relationship table is shown as the instruction table in fig. 3, in which the corresponding relationship between the identifier and the instruction data is stored, for example, the relationship may include a relationship between instruction data 1 and identifier 1, where instruction data 1 is microinstruction 1 and microinstruction parameter 1, and identifier 1 may be, for example, an address code of 0x 00.
In this case, based on the relationship table, the identification corresponding to each instruction data can be determined.
And step 104, replacing the instruction data with the identification to complete the compression of the test vector and generate a compressed vector.
In a specific embodiment, after the identifier is determined based on step 103, the determined identifier is replaced with the corresponding instruction data, for example, microinstruction 1 and microinstruction parameter 1 in the test vector are replaced by identifier 1, so as to generate a compressed vector, as shown in the left diagram in fig. 3, in this way, the size of the test vector can be effectively compressed, and the occupied storage space is reduced.
Taking the size of the original test vector as 16 bytes as an example, the compressed vector is replaced, and the size is compressed to 6 bytes. In addition, the storage space occupied by the specific microinstruction 1 and the microinstruction parameter 1 may be larger than that in fig. 2, thereby realizing a larger compression ratio.
In a specific embodiment, considering that the types of the microinstructions and the microinstruction parameters are not more than 256, the number of the identifiers is greater than or equal to 256; preferably, the number of the identifiers is 256, and different identifiers correspond to different instruction data.
Further, the identifier is an 8-bit binary number or an 8-bit 16-ary number.
For example, identifying a binary number that may be 8 bits, such as may be 00000000,00000001, etc.; and 8 bits of 16-ary digits may be 0x00, 0x01, and so on.
In a specific embodiment, the method further comprises:
storing the compressed vector.
Specifically, after the compressed vector is generated, the compressed vector is stored for subsequent operations such as transmission and calling.
Further, the method further comprises:
traversing the compressed vector to determine each of the identifiers in the compressed vector when a decompression request is received;
for each identifier, determining the instruction data corresponding to the identifier based on the relation table;
replacing the identification in the compressed vector with the instruction data to decompress the compressed vector to generate the test vector.
Specifically, during testing, the test vector needs to be restored, that is, the test vector needs to be decompressed, and in this case, the inverse processing procedure of the compression procedure is executed based on the relationship table, so as to obtain the test vector corresponding to the compressed vector.
In a specific embodiment, before step 101, the method further includes:
traversing the test vector, and determining all the instruction data in the test vector;
determining the category of all the instruction data by classifying the same instruction data;
establishing a corresponding relation between the instruction data and the identification under the category aiming at each category;
and generating a relation table based on the corresponding relation.
Specifically, by establishing the relationship table in advance, the instruction data of each category in the table corresponds to different identifiers, so that compression or decompression can be performed based on the relationship table in the following.
Example 2
Embodiment 2 of the present invention further discloses a device for compressing test vector instructions in ATE equipment, which includes:
an obtaining module 201, configured to obtain a test vector to be compressed;
a determining module 202, configured to determine each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test;
an identification module 203, configured to determine, for each piece of instruction data, an identification corresponding to the instruction data based on a pre-established relationship table; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data;
a replacing module 204, configured to replace the instruction data with the identifier, so as to complete compression of the test vector, and generate a compressed vector.
In a specific embodiment, the number of identifications is greater than or equal to 256; different ones of the identifiers correspond to different ones of the instruction data.
In a specific embodiment, the identifier is an 8-bit binary number or an 8-bit 16-ary number.
In a specific embodiment, the method further comprises the following steps:
and the storage module is used for storing the compressed vectors.
In a specific embodiment, the method further comprises the following steps:
a decompression module configured to traverse the compressed vector to determine each of the identifiers in the test vector when a decompression request is received;
for each identifier, determining the instruction data corresponding to the identifier based on the relation table;
replacing the identification in the compressed vector with the instruction data to decompress the compressed vector to generate the test vector.
In a specific embodiment, the method further comprises the following steps:
the relation table module is used for traversing the test vector and determining all the instruction data in the test vector;
determining the category of all the instruction data by classifying the same instruction data;
establishing a corresponding relation between the instruction data and the identification under the category aiming at each category;
and generating a relation table based on the corresponding relation.
Therefore, the embodiment of the present invention provides a method and an apparatus for compressing test vector instructions in ATE equipment, wherein the method includes: obtaining a test vector to be compressed; determining each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test; for each instruction data, determining an identifier corresponding to the instruction data based on a pre-established relation table; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data; and replacing the instruction data with the identification to complete the compression of the test vector and generate a compressed vector. In the scheme, the instruction data is replaced by the identification, and the storage space occupied by the identification is smaller than the instruction data, so that the storage space occupied by the whole test vector can be effectively reduced, the speed of loading the test vector is accelerated, the storage space of the test vector is reduced, and the cost of the whole test process is also reduced.
Those skilled in the art will appreciate that the figures are merely schematic representations of one preferred implementation scenario and that the blocks or flow diagrams in the figures are not necessarily required to practice the present invention. Those skilled in the art will appreciate that the modules in the devices in the implementation scenario may be distributed in the devices in the implementation scenario according to the description of the implementation scenario, or may be located in one or more devices different from the present implementation scenario with corresponding changes. The modules of the implementation scenario may be combined into one module, or may be further split into a plurality of sub-modules. The above-mentioned invention numbers are merely for description and do not represent the merits of the implementation scenarios. The above disclosure is only a few specific implementation scenarios of the present invention, however, the present invention is not limited thereto, and any variations that can be made by those skilled in the art are intended to fall within the scope of the present invention.
Claims (10)
1. A method for compressing test vector instructions in an ATE device, comprising:
obtaining a test vector to be compressed;
determining each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test;
for each instruction data, determining an identifier corresponding to the instruction data based on a pre-established relation table; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data;
and replacing the instruction data with the identification to complete the compression of the test vector and generate a compressed vector.
2. The method of claim 1, wherein the number of identifications is greater than or equal to 256; different ones of the identifiers correspond to different ones of the instruction data.
3. A method according to claim 1 or 2, wherein the identity is an 8-bit binary number or an 8-bit 16-ary number.
4. The method of claim 1, further comprising:
storing the compressed vector.
5. The method of claim 1 or 4, further comprising:
traversing the compressed vector to determine each of the identifiers in the compressed vector when a decompression request is received;
for each identifier, determining the instruction data corresponding to the identifier based on the relation table;
replacing the identification in the compressed vector with the instruction data to decompress the compressed vector to generate the test vector.
6. The method of claim 1, further comprising:
traversing the test vector, and determining all the instruction data in the test vector;
determining the category of all the instruction data by classifying the same instruction data;
establishing a corresponding relation between the instruction data and the identification under the category aiming at each category;
and generating a relation table based on the corresponding relation.
7. A compression apparatus for test vector instructions in an ATE apparatus, comprising:
the acquisition module is used for acquiring a test vector to be compressed;
the determining module is used for determining each instruction data in the test vector; the instruction data is associated microinstruction and microinstruction parameters in a test vector for performing ATE test;
the identification module is used for determining an identification corresponding to the instruction data based on a pre-established relation table aiming at each instruction data; wherein, the relation table stores the corresponding relation between the instruction data and the identification; the storage space occupied by the identification is smaller than that occupied by the instruction data;
and the replacing module is used for replacing the instruction data with the identification so as to complete the compression of the test vector and generate a compressed vector.
8. The apparatus of claim 7, wherein the number of identifications is greater than or equal to 256; different ones of the identifiers correspond to different ones of the instruction data.
9. The apparatus of claim 7 or 8, wherein the identifier is an 8-bit binary number or an 8-bit 16-ary number.
10. The method of claim 7, further comprising:
and the storage module is used for storing the compressed vectors.
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