CN112667452B - Disk array testing method, system and medium - Google Patents

Abstract

The invention discloses a disk array test method. According to the level of the disk array card, a virtual disk array corresponding to the level is established; according to the level of the virtual disk array, the corresponding hot spare disk in the virtual disk array is selected; the test steps are set, and according to the test The step is to carry out a stress test on the virtual disk array and a hot spare disk in the virtual disk array to obtain the test result of the test step; set a backup measure, execute the corresponding backup measure according to the test result, and detect according to the backup measure The test situation of the virtual disk array; according to the test situation, the loop measures are executed; the present invention can fully automate the disk array card of the server to establish a virtual disk array and test it through the mutual cooperation of various instructions and units, which greatly improves the performance of the disk array card. High test efficiency and reduced test cost.

Description

A disk array test method, system and medium

technical field

The invention relates to the technical field of disk testing, in particular to a disk array testing method, system and medium.

Background technique

At present, many storage devices use disk array cards to store data to prevent data failure and disappearance. In order to ensure the accuracy and stability of disk array cards, it is necessary to test the disk array of disk array cards.

Currently, there are three testing methods:

Test method 1: Use the hard disk information reading module to capture the hard disk information of the storage system, and confirm whether the hard disk configuration in the hard disk information is correct, and then perform the hard disk plug-in test. After all hard disks have passed the plug-in test, store the corresponding Test records; wherein the plug-in test is manually operated, and the specific steps of the plug-in test are: manually randomly extract the hard disks in the hard disk array group and then perform the read-write test; wherein the manual operation and random extraction do not conform to the system standardized testing requirements;

Test method 2: Use the controller to perform an interactive test of reading and writing on the solid-state hard disk, judge the working status of the solid-state hard disk through this test, generate and save the test results corresponding to its working status, and give feedback on the test results in the form of voice broadcast, This feedback method is inconvenient and has poor applicability;

Test method 3: enter the system manually, establish the corresponding disk array through the graphical interface, and then conduct the test, and complete the hot spare replacement test of the disk array by manually plugging and unplugging the disk during the test; many steps involve manual settings, and the efficiency low and high cost;

In the above three methods, there is manual operation, and in the face of disk array cards of multiple servers, the test efficiency will be greatly reduced, and there are many uncontrollable factors in manual operation, so the test cost will also be greatly increased.

Contents of the invention

The invention mainly solves the problems of reduced testing efficiency and increased testing cost caused by manual testing when the disk array is tested.

In order to solve the above-mentioned technical problems, a technical solution adopted by the present invention is to provide a disk array testing method, comprising the following steps:

Create a virtual disk array: Create a virtual disk array of the corresponding level according to the level of the disk array card;

Selecting a hot spare disk: selecting a corresponding hot spare disk in the virtual disk array according to the level of the virtual disk array;

Test and obtain test results: set the test steps, perform a stress test on the virtual disk array according to the test steps and perform a hot spare test on the hot spare disk in the virtual disk array, and obtain the results of the test steps Test Results;

Detecting test conditions: setting backup measures, executing the corresponding backup measures according to the test results, and detecting the test conditions of the virtual disk array according to the backup measures;

Cyclic measures are carried out according to the test situation described.

Further, the step of detecting the test situation is specifically:

The backup measures include unfinished indication measures and circular judgment measures;

When the test result is that the test is successful, the test step ends, and the loop judgment measure is executed, and the test conditions of all the virtual disk arrays are detected according to the loop judgment measure;

When the test result is a test failure, the test step ends, and the incomplete indication measure is executed.

Further, the test steps are:

Invoking a formatting command to generate a log file system corresponding to the virtual disk array;

After the log-type file system of the virtual disk array is generated, a test time is set, and the test time includes an initial time period and a step-down time period;

Executing a stress testing step, performing the stress test on the virtual disk array according to the stress testing step and performing the hot spare test on the hot spare disk in the virtual disk array;

After the stress testing step is executed, the test completion judging step is executed according to the test time to obtain the test result, and the test result is packaged into a test log file and stored in the log file system.

Further, after the hot standby test is performed, after the downscaling time period, the hot standby test ends, and the test completion judging step is performed;

The steps for determining the completion of the test are:

Invoking the test completion judgment instruction to obtain the completion status of the pressure test step, and invoking the state detection instruction to obtain the index level of the virtual disk array;

According to the completion situation of the pressure testing step and the index level of the virtual disk array, the test result is judged, and the specific steps are:

When the completion status of the pressure testing step is incomplete or the index level of the virtual disk array is not up to standard, the test result is a test failure;

When the completion status of the pressure testing step is completed and the index level of the virtual disk array is up to standard, the test result is a successful test.

Further, the loop judgment measures are:

Mark the test condition of the virtual disk array corresponding to the test step as test completion, and detect whether the test conditions of all the virtual disk arrays are test completion, if not, execute the loop measure ; The loop measure is: execute the test step on the virtual disk array except that the test is completed;

If so, perform the indicated action to complete.

Further, the steps of establishing a virtual disk array are specifically:

Calling an array command corresponding to the level of the disk array card, using the disk corresponding to the array command to establish the virtual disk array corresponding to the level of the disk array card;

If the level of the disk array card is primary, a primary virtual disk array is established; if the level of the disk array card is an intermediate level, an intermediate virtual disk array is established; if the level of the disk array card is If it is advanced, create an advanced virtual disk array.

Further, the pressure measurement steps are:

calling a stress test start command, performing the stress test on the virtual disk array, and performing the hot spare test on the hot spare disk in the virtual disk array after the initial time period;

The stress test is: performing a test corresponding to the stress test start instruction on the virtual disk array;

The hot standby test is: judging whether the virtual disk array is the primary virtual disk array, and if so, executing the test to complete the judging step; if not, calling the step-down command, and removing The disk in the virtual disk array corresponding to the downscaling instruction, and performing the stress test on the virtual disk array.

Further, the step of selecting a hot spare disk is specifically:

performing the testing step when it is determined that the level of the virtual disk array is the primary virtual disk array;

When it is judged that the level of the virtual disk array is the intermediate virtual disk array, call the hot spare instruction corresponding to the intermediate virtual disk array, and select the hot spare instruction corresponding to the intermediate virtual disk array disk as said hot spare disk;

When it is judged that the level of the virtual disk array is the advanced virtual disk array, call the hot spare instruction corresponding to the advanced virtual disk array, and select the hot spare instruction corresponding to the advanced virtual disk array The corresponding disk is used as the hot spare disk.

The present invention also provides a disk array testing system, comprising:

initialization unit, installation unit, test unit and processing unit;

The initialization unit is used to initialize the level of the disk array card and the test time, and send the test time to the test unit;

The installation unit is used to establish a virtual disk array whose level corresponds to the level of the disk array card, and select a hot spare disk corresponding to the level of the virtual disk array in the virtual disk array;

The test unit is used to set the test steps; the test unit performs a stress test on the virtual disk array and a hot spare test on the hot spare disk in the virtual disk array through the test steps, and obtains the the test results of the above test steps;

The processing unit is used to set backup measures and execute the backup measures corresponding to the test results;

The processing unit detects a test condition of the virtual disk array through the backup measure, and executes a loop measure corresponding to the test condition.

The present invention also provides a computer-readable storage medium, where a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the steps of the disk array testing method are realized.

The beneficial effects of the present invention are:

1. The disk array testing method of the present invention can realize fully automatic establishment of a virtual disk array on the disk array card of the server and test it, which greatly improves the test efficiency of the disk array card and reduces the test cost.

2. The disk array test system of the present invention can realize that the disk array card of the server is automatically established and tested by the mutual cooperation of the initialization unit, the installation unit, the test unit and the processing unit, which greatly improves the performance of the disk array. The test efficiency of the array card reduces the test cost.

3. The computer-readable storage medium of the present invention can realize that the boot initialization unit, the installation unit, the test unit and the processing unit cooperate with each other, and automatically establish a virtual disk array for the disk array card of the server, and then test it, which improves the performance of the virtual disk array. The operability of the described disk array test method.

Description of drawings

Fig. 1 is the flow chart of a kind of disk array test method provided by embodiment 1 of the present invention;

FIG. 2 is an operation flowchart of a disk array testing method provided in Embodiment 1 of the present invention;

FIG. 3 is a schematic structural diagram of a disk array testing system provided in Embodiment 2 of the present invention.

detailed description

The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

In the description of the present invention, it should be noted that the terms "primary", "intermediate" and "advanced" are only used for descriptive purposes, and should not be understood as indicating or implying relative importance. It should be noted that, in the description of the present invention, RAID (RedundantArray of Independent Disks) is a disk array, RAID0 (RAID Level 0) is a disk array level 0, RAID1 (RAID Level 1) is a disk array level 1, RAID5 (RAID Level 5) is disk array level 5, RAID10 (RAID Level 10) is disk array level 10, RAID6 (RAID Level 6) is disk array level 6, NVRAM (Non-Volatile Random Access Memory) is non-volatile random access memory, Disk Striping is a hard disk partitioning technology, EXT4 (Fourth EXTended filesystem) is the fourth-generation extended file system, ipmitool is a command-line IPMI platform management tool that can be used in Linux systems, and IPMI (IntelligentPlatform Management Interface) is a representative intelligent platform The management interface is a new generation of general interface standard that makes hardware management "intelligent". Linux (GNU/Linux) is a UNIX-like operating system that is free to use and spread freely. LED is a light-emitting diode.

Example 1

The present embodiment provides a disk array test method, as shown in Figure 1 and Figure 2, comprising the following steps:

S100, initialization; set the test system, after the system initialization is successful, start testing; in the present embodiment, select the Linux system to operate;

In this embodiment, the method is implemented using an automated script, and the specific implementation process is shown in Figure 2;

S200, establish a virtual disk array; according to the level of the disk array card, select different numbers of disks, and use the virtualization storage technology to call the corresponding array command to establish a number of virtual disk arrays corresponding to the level of the disk array card; if the disk in the system If the quantity is N, when the level of the disk array card is RAID0 (that is, the primary disk array card), use N disks in the system to establish a primary virtual disk array; when the level of the disk array card is RAID1 or RAID5 or array card), use (N-1) disks to build a mid-level virtual disk array; when the level of the disk array card is RAID6 (that is, an advanced disk array card), use (N-2) disks to build an advanced virtual disk array;

Among them, the disk array card has the following characteristics: the disk array card is provided with a processor, and does not rely on the CPU of the server for data processing. It has fast read and write performance, does not occupy server resources, and can be used in any operating system. It can also record the remaining read and write operations contained in the disk read and write log in the memory after the system is powered off. NVRAM retrieves the log data, and then completes the read and write operations to ensure the integrity of the read and write;

The virtual disk array has the following characteristics: the virtual disk array is generated by combining multiple disks through virtual storage technology to form one or more disk array groups, which can improve performance or data redundancy, or both at the same time; During operation, data will be scattered across hard disks in various modes depending on the RAID level. The name of the RAID level will start with RAID and include numbers, for example: RAID 0, RAID 1, RAID 5, RAID 6, RAID 01, RAID 10. RAID 50, RAID 60. Each level has its theoretical advantages and disadvantages. Different levels achieve a balance between two goals, which are to increase data reliability and increase memory read and write performance;

Among them, the RAID0-level disk array card has the following characteristics: it connects more than two disks in parallel to form a large-capacity disk; Parallel processing is possible, so among all levels, RAID 0 is the fastest; but RAID 0 has neither redundancy nor fault tolerance, and if one disk is damaged, all data will be lost;

Among them, the RAID1 level disk array card has the following characteristics: it is more than two sets of N disks mirroring each other, and it can have a good reading speed in some multi-threaded operating systems. In theory, its reading speed is equal to that of the disk. The multiple of the number is the same as RAID 0; in addition, the writing speed of the disk array card at the RAID1 level is slightly reduced, but it can maintain operation as long as one disk is normal, and the reliability is the highest; the principle is to store data on the main disk At the same time, the same data is also written on the mirror disk. When the primary disk is damaged, the mirror disk will replace the work of the primary disk; because there is a mirror disk for data backup, the data security of the RAID1-level disk array card is at all RAID levels. It is said to be the best; but no matter how many disks are used to form a RAID1 level disk array card, only the capacity of one disk is counted, which is the lowest level of disk utilization among all RAIDs;

Among them, RAID5-level disk array cards have the following characteristics: RAID5-level disk array cards are a storage solution that balances storage performance, data security, and storage costs; it uses Disk Striping technology; RAID5-level disk array cards are at least Three disks are required, and the RAID5 level disk array card will store the data and the parity information corresponding to the data on each disk of the RAID5 disk array, and the parity information and the corresponding data will be stored on different disks. Above; when one of the disk data in the RAID 5-level disk array card is damaged, the remaining data and the corresponding parity information can be used to restore the damaged data; the RAID 5-level disk array card can be understood as RAID A compromise between RAID 0 and RAID 1 level disk array cards;

RAID 10-level disk array cards have the following characteristics: RAID 10-level disk array cards first divide data and then mirror images, and then divide all disks into two groups. It can be regarded as the minimum combination of RAID 1-level disk array cards, and then Each group of RAID 1 disk array cards is regarded as a disk combination and operates as a RAID 0 disk array card; when one disk in a RAID 10 disk array card is damaged, the remaining disks will continue to operate;

RAID6-level disk array cards have the following characteristics: Compared with RAID 5-level disk array cards, RAID 6-level disk array cards add a second independent parity check information block; two independent parity systems use different Algorithm, the reliability of the data is very high, when any two disks fail at the same time, the data integrity will not be affected; the RAID 6 disk array card needs to allocate more disk space and additional check calculation for the parity information, relatively The disk array card at the RAID 5 level has a greater amount of operations and calculations;

Among them, the level RAID50 and RAID60 of the disk array use the threshold too high, and will not be described too much in this embodiment;

The corresponding array command for creating a disk array is: "arcconf CREATE disk array card code LOGICALDRIVE disk array card level code N noprompt", for example, if the disk array card code is 3, the disk array card level is RAID5, and the number of disks in the system If it is 3, the corresponding array command for creating a disk array is: "arcconfCREATE 3 LOGICALDRIVE 5 01 02 03 noprompt", where "01 02 03" are the codes of the three disks in the virtual disk array, and the disk array card code corresponds to the disk Array card level, RAID0 corresponds to the disk array card code 1, RAID1 or RAID5 or RAID10 corresponds to the disk array card code 2, RAID6 corresponds to the disk array card code 3;

S300, judge the level of the disk array card, according to the judgment result, call the corresponding hot standby command, select the corresponding disk in the virtual disk array as the hot spare disk; if the level of the disk array card is RAID0, then directly perform the test step; if When the level of the disk array card is RAID1, RAID5 or RAID10, select the Nth disk in the mid-level disk array card as a hot spare disk, and perform the test procedure; if the level of the disk array card is RAID6, select The Nth and (N-1)th disks are hot spare disks, and the test steps are performed;

The corresponding hot spare command to create a hot spare disk is: "arcconf setstate 1 device 0 8 hsparray 1 sparetype 1", where device 0 8 represents the disk code of the hot spare disk, and hsp array1 represents the disk to the virtual disk array The first disk array is used as a hot spare disk; sparetype 1 means that this disk is limited to a hot spare disk of a corresponding disk array, if the hot spare instruction is sparetype 2, this disk can be used as a hot spare disk for each disk array ;

The test steps are as follows:

S301, perform a formatting step; call a formatting command to generate a log file system of a virtual disk array, in this embodiment, use EXT4 under Linux, and the corresponding formatting command is "mkfs.ext4/dev/sdb";

S302. After the formatting step is completed, set the test time and start the pressure test step for the virtual disk array:

S303. Invoke a stress test start command to start a stress test on the virtual disk array;

The stress test start command is:

"fio-filename=/dev/sdb1-direct=1-iodepth1-rw=randread-ioengine=psync-bs=16k -size=200G -numjobs=10 -runtime=86400 --output TestResult.log";

Among them, -filename=/dev/sdb1 represents the test file directory; -size=200G represents the test file size; numjobs=10 represents the test thread is 10 threads; -runtime=86400 represents the completion time period is 24 hours, that is, 86400 seconds;- -output TestResult.log means to generate log files;

The test time set above is the sum of the initial time period and the step-down time period;

S304. After the stress test starts, after an initial period of time, perform a hot standby test, specifically:

Judging whether the virtual disk array is a primary virtual disk array, if so, then directly enter the test to complete the judgment step; if not, then call the downgrade command, remove the disk in the virtual disk array corresponding to the downgrade command according to the downgrade command, and Perform a stress test on the virtual disk array after removing the disk;

The move-out command is: "arcconf setstate 1 device 0 0 ddd"; where, the step-down command contains the code corresponding to the virtual disk array;

Among them, after performing the hot spare test, the virtual disk array will add its corresponding hot spare disk to its array, replace the disk removed in the hot spare test measures, and continue the stress test;

S305. After performing the hot standby test, after the de-escalation period, the hot standby test ends, a test log file is generated, the test log file is saved to the log file system, and then enters the test to complete the judgment step;

The test completion judgment steps are as follows:

Call the test completion judgment command to obtain whether the stress test step is completed, and call the status detection command to obtain the index level of the virtual disk array in the stress test step; if the stress test step is completed and the index level of the virtual disk array in the stress test step is If the standard is met, the test step ends, and the cyclic judgment measures are executed; if the pressure test step is not completed or the indicator level of the virtual disk array for the stress test step is not up to the standard, the test step ends, and the incomplete indication measures are executed;

The test completion judgment command is "cat TesResult.log | grep -i error"; the state detection command is "arcconfgetconfig1pd|grep state";

Among them, the initial file is pre-set in the system. When calling the test completion judgment command, if the screen outputs "error", the stress test step is not completed, otherwise, the stress test step is completed;

When the state detection command is invoked, compare the test log file with the initial file. If the data in the log file is equal to the data in the initial file, the indicator level of the virtual disk array in the pressure test step is up to standard. Otherwise, the virtual disk in the pressure test step The metric level of the array is not met.

The loop judgment measures are specifically: mark the test status of the virtual disk array corresponding to the test step as the test completion, and judge whether the test status of all virtual disk arrays is the test completion, if not, then judge that the loop is not completed, and execute the loop measure : Establish virtual disk arrays and corresponding hot spare disks except for the test completion class, and carry out corresponding test steps;

If the test status of all the virtual disk arrays is that the test is completed, it is judged that the cycle is completed, and the completion indicating measure is executed.

The specific measures for completing the instructions are: call the ipmitool command to light up the LED on the baseboard management controller to a constant light state;

The unfinished indication measures are as follows: call the ipmitool command to turn on the LED on the baseboard management controller to blink.

This embodiment only shows the situation of testing the disk array in the Linux system, but this method can be applied to several different users testing the disk array in different systems.

Example 2

This embodiment provides a disk array testing system, as shown in FIG. 3 , including: an initialization unit, an installation unit, a test unit, and a processing unit;

The initialization unit is used to initialize the level of the disk array card and the test time, and send the test time to the test unit;

The installation unit is used to establish a virtual disk array whose level corresponds to the level of the disk array card, and select a hot spare disk corresponding to the level of the virtual disk array in the virtual disk array;

The test unit is used to set a test step; the test unit performs a stress test on the virtual disk array and a hot spare disk in the virtual disk array through the test step to obtain the test step Test Results;

The processing unit is used to set backup measures and execute the backup measures corresponding to the test results;

The processing unit detects a test condition of the virtual disk array through the backup measure, and executes a loop measure corresponding to the test condition.

Based on the same inventive concept as the disk array testing method in the preceding embodiments, the embodiment of this specification also provides a computer-readable storage medium, on which a computer program is stored, and the computer program is processed The step of implementing the disk array testing method when the controller is executed.

Different from the prior art, the disk array test method, system and medium of the present application can realize the complete automatic test of the disk array in the server system through the mutual cooperation of each unit and various instructions, and will test the different disk array cards. The type establishes a complete disk array system and conducts a cyclic test, and makes corresponding instructions according to the test results, which greatly improves the test efficiency of the disk array and saves the test cost.

The above is only an embodiment of the present invention, and does not limit the patent scope of the present invention. Any equivalent structure or equivalent process conversion made by using the description of the present invention and the contents of the accompanying drawings, or directly or indirectly used in other related technologies fields, all of which are equally included in the scope of patent protection of the present invention.

Claims (9)

1. A disk array testing method, is characterized in that, comprises the following steps: Create a virtual disk array: Create a virtual disk array of the corresponding level according to the level of the disk array card; Selecting a hot spare disk: selecting a corresponding hot spare disk in the virtual disk array according to the level of the virtual disk array; Test and obtain test results: set the test steps, perform a stress test on the virtual disk array according to the test steps and perform a hot spare test on the hot spare disk in the virtual disk array, and obtain the results of the test steps Test Results; Detecting test conditions: setting backup measures, executing the corresponding backup measures according to the test results, and detecting the test conditions of the virtual disk array according to the backup measures; Carry out cyclical measures according to the test situation; The steps for the detection and test situation are specifically: The backup measures include unfinished indication measures and circular judgment measures; When the test result is that the test is successful, the test step ends, and the loop judgment measure is executed, and the test conditions of all the virtual disk arrays are detected according to the loop judgment measure; When the test result is a test failure, the test step ends, and the unfinished indication measure is executed; the unfinished indication measure is: calling the ipmitool command to turn on the LED on the baseboard management controller in a blinking state. 2. according to the disk array test method described in claim 1, it is characterized in that, described test step is: Invoking a formatting command to generate a log file system corresponding to the virtual disk array; After the log-type file system of the virtual disk array is generated, a test time is set, and the test time includes an initial time period and a step-down time period; Executing a stress testing step, performing the stress test on the virtual disk array according to the stress testing step and performing the hot spare test on the hot spare disk in the virtual disk array; After the stress testing step is executed, the test completion judging step is executed according to the test time to obtain the test result, and the test result is packaged into a test log file and stored in the log file system. 3. according to the disk array test method described in claim 2, it is characterized in that, after carrying out described hot spare test, through described step-down time period, described hot spare test finishes, and execution described test completes judging step ; The steps for determining the completion of the test are: Invoking the test completion judgment instruction to obtain the completion status of the pressure test step, and invoking the state detection instruction to obtain the index level of the virtual disk array; According to the completion situation of the pressure testing step and the index level of the virtual disk array, the test result is judged, and the specific steps are: When the completion status of the pressure testing step is incomplete or the index level of the virtual disk array is not up to standard, the test result is a test failure; When the completion status of the pressure testing step is completed and the index level of the virtual disk array is up to standard, the test result is a successful test. 4. according to the disk array testing method described in claim 2, it is characterized in that, described loop judgment measure is: Mark the test condition of the virtual disk array corresponding to the test step as test completion, and detect whether the test conditions of all the virtual disk arrays are test completion, if not, execute the loop measure ; The loop measure is: execute the test step on the virtual disk array except that the test is completed; If so, perform the indicated action to complete. 5. according to the disk array testing method described in claim 2, it is characterized in that, the described step of establishing virtual disk array is specifically: Calling an array command corresponding to the level of the disk array card, using the disk corresponding to the array command to establish the virtual disk array corresponding to the level of the disk array card; If the level of the disk array card is primary, a primary virtual disk array is established; if the level of the disk array card is an intermediate level, an intermediate virtual disk array is established; if the level of the disk array card is If it is advanced, create an advanced virtual disk array. 6. The disk array testing method according to claim 5, wherein the pressure testing step is: calling a stress test start command, performing the stress test on the virtual disk array, and performing the hot spare test on the hot spare disk in the virtual disk array after the initial time period; The stress test is: performing a test corresponding to the stress test start instruction on the virtual disk array; The hot standby test is: judging whether the virtual disk array is the primary virtual disk array, and if so, executing the test to complete the judging step; if not, calling the step-down command, and removing The disk in the virtual disk array corresponding to the downscaling instruction, and performing the stress test on the virtual disk array. 7. according to the disk array test method described in claim 5, it is characterized in that, the step of described selecting hot spare disk is specifically: performing the testing step when it is determined that the level of the virtual disk array is the primary virtual disk array; When it is judged that the level of the virtual disk array is the intermediate virtual disk array, call the hot spare instruction corresponding to the intermediate virtual disk array, and select the hot spare instruction corresponding to the intermediate virtual disk array disk as said hot spare disk; When it is judged that the level of the virtual disk array is the advanced virtual disk array, call the hot spare instruction corresponding to the advanced virtual disk array, and select the hot spare instruction corresponding to the advanced virtual disk array The corresponding disk is used as the hot spare disk. 8. A disk array test system, characterized in that, comprising: an initialization unit, an installation unit, a test unit and a processing unit; The initialization unit is used to initialize the level of the disk array card and the test time, and send the test time to the test unit; The installation unit is used to establish a virtual disk array whose level corresponds to the level of the disk array card, and select a hot spare disk corresponding to the level of the virtual disk array in the virtual disk array; The test unit is used to set the test steps; the test unit performs a stress test on the virtual disk array and a hot spare test on the hot spare disk in the virtual disk array through the test steps, and obtains the the test results of the above test steps; The processing unit is used to set backup measures and execute the backup measures corresponding to the test results; The processing unit detects the test condition of the virtual disk array through the backup measure, and executes a loop measure corresponding to the test condition; The backup measures include an unfinished indication measure and a loop judgment measure; when the test result is a successful test, the test step ends, and the loop judgment measure is executed, and all virtual disks are detected according to the loop judgment measure The test situation of the array; when the test result is a test failure, the test step ends, and the unfinished indication measure is executed; the unfinished indication measure is: call the ipmitool command to light up the baseboard management controller LED is blinking. 9. A computer-readable storage medium, wherein a computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the disk array described in any one of claims 1 to 7 is realized The steps of the test method.

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