CN112635291A - Vacuum ion trap mass spectrometer system - Google Patents

Vacuum ion trap mass spectrometer system Download PDF

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Publication number
CN112635291A
CN112635291A CN202011544680.5A CN202011544680A CN112635291A CN 112635291 A CN112635291 A CN 112635291A CN 202011544680 A CN202011544680 A CN 202011544680A CN 112635291 A CN112635291 A CN 112635291A
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CN
China
Prior art keywords
vacuum
vacuum box
ion trap
mass spectrometer
ion
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CN202011544680.5A
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Chinese (zh)
Inventor
白钢
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Beijing Remnantech Technology Co ltd
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Beijing Remnantech Technology Co ltd
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Priority to CN202011544680.5A priority Critical patent/CN112635291A/en
Publication of CN112635291A publication Critical patent/CN112635291A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/062Ion guides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/025Detectors specially adapted to particle spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/24Vacuum systems, e.g. maintaining desired pressures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/42Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons

Abstract

The present application relates to a vacuum ion trap mass spectrometer system. The vacuum ion trap mass spectrometer system comprises a first vacuum box, a second vacuum box and a third vacuum box, wherein a first air inlet and a plurality of first air outlets are formed in the first vacuum box; a second air inlet of the second vacuum box is communicated with a first air outlet; the sample inlet interface is arranged on the first gas inlet; a radio frequency ion guide device disposed within the first vacuum chamber; an ion trap is arranged in a second vacuum box; an ion detector is arranged in a second vacuum box; and one control valve is arranged on one first air outlet. The application discloses vacuum ion trap mass spectrometer system can adopt one or more ion traps to detect as required to can acquire the result that different ion traps and ion detector obtained respectively, in addition, can also select suitable ion trap or ion detector to detect according to operating condition.

Description

Vacuum ion trap mass spectrometer system
Technical Field
The application relates to the technical field of mass spectrometers, in particular to a vacuum ion trap mass spectrometer system.
Background
A mass spectrometer is a modern analytical instrument with high resolution and sensitivity that identifies analytes by obtaining information about the molecular weight, molecular formula, and molecular structure of a substance.
Among various mass spectrometers, ion traps are considered the first choice for mass spectrometry miniaturization by virtue of their simple structure, time-tandem mass spectrometry capability, and high gas pressure analysis capability. In the aspect of a mass spectrometer sample injection method, the mass spectrum analysis capability of the continuous sample injection atmospheric pressure interface is regarded as the optimization of mass spectrum miniaturization.
For gas ions at room temperature (around 25 ° to 30 °), the larger the free path, the higher the effect of ion transport and mass analysis.
However, in some bad weather, the vacuum ion trap mass spectrometer cannot work in a room temperature environment, and therefore, the detection effect is affected.
Existing mass spectrometers do not allow for the simultaneous detection of multiple ion species or the use of different ion traps as required.
Therefore, in view of the above deficiencies, there is a need to provide a technical solution to overcome or at least alleviate at least one of the above-mentioned drawbacks of the prior art.
Disclosure of Invention
The technical problem to be solved by the present application is to provide a vacuum ion trap mass spectrometer system aiming at the defects in the prior art.
In order to solve the technical problem, the application provides a vacuum ion trap mass spectrometer system which comprises a first vacuum box, a second vacuum box and a mass spectrometer, wherein the first vacuum box is hollow, and is provided with a first air inlet and a plurality of first air outlets; the number of the second vacuum boxes is the same as that of the first air outlets, each second vacuum box comprises a second air inlet, and the second air inlets of the second vacuum boxes are communicated with the first air outlets;
the sample feeding interface is arranged on the first gas inlet;
a radio frequency ion guide device disposed within the first vacuum chamber;
the number of the ion traps is the same as that of the second vacuum boxes, and one ion trap is arranged in one second vacuum box;
the number of the ion detectors is the same as that of the second vacuum boxes, and one ion detector is arranged in one second vacuum box;
the number of the control valves is the same as that of the first air outlets, one control valve is arranged on one first air outlet, and the control valves are controlled to open and close so that the gas and ions in the first vacuum box can enter the first air outlet where the control valves are located in an open state, and then enter the second vacuum box through the first air outlet.
Optionally, each of the second vacuum boxes comprises a second air outlet; the vacuum ion trap mass spectrometer system further comprises vacuum pumps, the number of the vacuum pumps is the same as that of the second vacuum boxes, and one vacuum pump is arranged at one second air outlet and used for vacuumizing the second vacuum boxes connected with the vacuum pump.
Optionally, the vacuum ion trap mass spectrometer system further comprises: the third vacuum box, the inside cavity of third vacuum box, the third vacuum box includes a third air inlet and a third gas outlet, the third gas outlet with advance kind interface intercommunication.
Optionally, the vacuum ion trap mass spectrometer system further comprises a suction fan mounted at the third gas inlet location for drawing ambient gas into the third vacuum chamber.
Optionally, the vacuum ion trap mass spectrometer system further comprises a temperature regulation device, and the temperature regulation device is arranged on the third vacuum box and is used for regulating the temperature in the third vacuum box.
Optionally, the temperature regulating device includes a heating device, and the heating device is disposed outside the third vacuum box and is used for heating the third vacuum box.
Optionally, the vacuum ion trap mass spectrometer system further comprises:
a cooling duct disposed outside the second vacuum box;
the output end of the cooling pump is communicated with the cooling pipeline;
the cold source is arranged outside the second vacuum box and is communicated with the input end of the cooling pump; the cooling pump is used for pumping cooling liquid in the cold source to the cooling pipeline; the cooling pipeline is used for cooling the second vacuum box.
Optionally, the air pressure in the first vacuum box is higher than the air pressure in each second vacuum box.
Optionally, the sample inlet is one of a sampling cone, a metal tube or a non-metal capillary tube, and the aperture size of the sample inlet is smaller than 1 mm.
Optionally, the rf ion guide device is one of a quadrupole, an octupole or an ion funnel.
The application discloses vacuum ion trap mass spectrometer system can adopt one or more ion traps to detect as required to can acquire the result that different ion traps and ion detector obtained respectively, in addition, can also select suitable ion trap or ion detector to detect according to operating condition.
Drawings
Fig. 1 is a schematic structural diagram of a vacuum ion trap mass spectrometer according to the first embodiment of the present application.
Reference numerals:
the device comprises a first vacuum box 1, a second vacuum box 2 and a sample inlet 4; radio frequency ion guide 5, ion trap 6, ion detector 7.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Fig. 1 is a schematic structural diagram of a vacuum ion trap mass spectrometer according to the first embodiment of the present application.
The vacuum ion trap mass spectrometer system shown in fig. 1 comprises a first vacuum box 1, a second vacuum box 2, a sample introduction interface 4, a radio frequency ion guide device 5, an ion trap 6, an ion detector 7 and a control valve, wherein the first vacuum box 1 is hollow, and the first vacuum box 1 is provided with a first air inlet and a plurality of first air outlets; the number of the second vacuum boxes 2 is the same as that of the first air outlets, each second vacuum box 2 comprises a second air inlet, and the second air inlet of one second vacuum box 2 is communicated with one first air outlet; the sample inlet interface 4 is arranged on the first gas inlet; the radio frequency ion guide device 5 is arranged in the first vacuum box 1; the number of the ion traps 6 is the same as that of the second vacuum boxes 2, and one ion trap is arranged in one second vacuum box 2; the number of the ion detectors 7 is the same as that of the second vacuum boxes 2, and one ion detector is arranged in one second vacuum box 2; the number of the control valves is the same as that of the first air outlets, one control valve is arranged on one first air outlet, and the control valves are controlled to be opened and closed, so that the gas and ions in the first vacuum box enter the first air outlet where the control valves are located in an open state, and then enter the second vacuum box through the first air outlet.
The application discloses vacuum ion trap mass spectrometer system can adopt one or more ion traps to detect as required to can acquire the result that different ion traps and ion detector obtained respectively, in addition, can also select suitable ion trap or ion detector to detect according to operating condition.
In the present embodiment, a plurality means two or more.
It will be appreciated that the individual ion traps may be the same ion trap or may be different ion traps.
It will be appreciated that the individual ion detectors may be the same ion detector or different ion detectors.
Referring to fig. 1, in the present embodiment, each second vacuum box includes a second air outlet;
the vacuum ion trap mass spectrometer system further comprises vacuum pumps, the number of the vacuum pumps is the same as that of the second vacuum boxes 2, and one vacuum pump is arranged at one second air outlet and used for vacuumizing the second vacuum boxes 2 connected with the vacuum pump.
The second vacuum box can be vacuumized when needed by the vacuumizing pump.
In an alternative embodiment, the vacuum ion trap mass spectrometer system further comprises a third vacuum box, the third vacuum box is hollow inside, the third vacuum box comprises a third air inlet and a third air outlet, and the third air outlet is communicated with the sample inlet interface 4.
In an alternative embodiment, the vacuum ion trap mass spectrometer system further comprises a suction fan mounted at the third gas inlet location for drawing ambient gas into the third vacuum chamber.
In an alternative embodiment, the vacuum ion trap mass spectrometer system further comprises a temperature regulating device disposed on the third vacuum chamber for regulating the temperature within the third vacuum chamber.
The gas and ions can enter the ion trap at a suitable temperature through temperature adjustment.
In an alternative embodiment, the temperature regulating means comprises heating means arranged outside the third vacuum box for heating the third vacuum box.
In an alternative embodiment, the vacuum ion trap mass spectrometer system further comprises a cooling pipe, a pump for cooling and a cold source, wherein the cooling pipe is arranged outside the second vacuum box; the output end of the cooling pump is communicated with the cooling pipeline; the cold source is arranged outside the second vacuum box 2 and is communicated with the input end of the cooling pump; the cooling pump is used for pumping cooling liquid in the cold source to the cooling pipeline; the cooling pipeline is used for cooling the second vacuum box.
In this embodiment, the air pressure in the first vacuum boxes is higher than the air pressure in the respective second vacuum boxes. The air flow flows along the first vacuum box into the second vacuum box through different air pressures.
In this embodiment, the sample inlet is one of a sampling cone, a metal tube or a non-metal capillary, and the aperture size of the sample inlet is smaller than 1 mm.
In this embodiment, the rf ion guide device is one of a quadrupole, an octopole or an ion funnel.
In this embodiment, the ion trap is a three-dimensional ion trap or a two-dimensional ion trap.
In this embodiment, each control valve is the only passage for ions and air flow within the first vacuum box to the corresponding second vacuum box.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.

Claims (10)

1. A vacuum ion trap mass spectrometer system, comprising:
the vacuum box comprises a first vacuum box (1), wherein the first vacuum box (1) is hollow, and a first air inlet and a plurality of first air outlets are formed in the first vacuum box (1);
the number of the second vacuum boxes (2) is the same as that of the first air outlets, each second vacuum box (2) comprises a second air inlet, and the second air inlet of each second vacuum box (2) is communicated with one first air outlet;
the sample inlet interface (4), the sample inlet interface (4) is installed on the first air inlet;
a radio frequency ion guide device (5), the radio frequency ion guide device (5) being disposed within the first vacuum chamber (1);
the number of the ion traps (6) is the same as that of the second vacuum boxes (2), and one ion trap is arranged in one second vacuum box (2);
the number of the ion detectors (7) is the same as that of the second vacuum boxes (2), and one ion detector is arranged in one second vacuum box (2);
the number of the control valves is the same as that of the first air outlets, one control valve is arranged on one first air outlet, and the control valves are controlled to open and close so that the gas and ions in the first vacuum box can enter the first air outlet where the control valves are located in an open state, and then enter the second vacuum box through the first air outlet.
2. The vacuum ion trap mass spectrometer system of claim 1,
each second vacuum box comprises a second air outlet;
the vacuum ion trap mass spectrometer system further comprises vacuum pumps, the number of the vacuum pumps is the same as that of the second vacuum boxes (2), and one vacuum pump is arranged at one second air outlet and used for vacuumizing the second vacuum boxes (2) connected with the vacuum pump.
3. The vacuum ion trap mass spectrometer system of claim 2, further comprising:
third vacuum box (3), the inside cavity of third vacuum box (3), third vacuum box (3) include a third air inlet and a third gas outlet, the third gas outlet with advance kind interface (4) intercommunication.
4. The vacuum ion trap mass spectrometer system of claim 3, further comprising a suction fan mounted at the third gas inlet location for drawing ambient gas into the third vacuum box.
5. The vacuum ion trap mass spectrometer system of claim 4, further comprising a temperature regulating device disposed on the third vacuum chamber (3) for regulating the temperature within the third vacuum chamber.
6. The vacuum ion trap mass spectrometer system of claim 5, characterized in that the temperature regulating means comprises heating means arranged outside the third vacuum chamber (3) for heating the third vacuum chamber (3).
7. The vacuum ion trap mass spectrometer system of claim 6, further comprising:
a cooling duct (83) disposed outside the second vacuum box;
a cooling pump (84), an output end of the cooling pump (84) being in communication with the cooling duct;
the cold source (85), the cold source (85) is arranged outside the second vacuum box (2), and the cold source (85) is communicated with the input end of the cooling pump (84); wherein the content of the first and second substances,
the cooling pump is used for pumping cooling liquid in the cold source to the cooling pipeline;
the cooling pipeline is used for cooling the second vacuum box.
8. The vacuum ion trap mass spectrometer system of claim 7, wherein the gas pressure in the first vacuum chamber is higher than the gas pressure in each second vacuum chamber.
9. The vacuum ion trap mass spectrometer system of claim 8, wherein the sample inlet interface is one of a sampling cone, a metal tube, or a non-metal capillary, and the sample inlet interface has an aperture size of less than 1 mm.
10. The vacuum ion trap mass spectrometer of claim 9, wherein the radio frequency ion guide device is one of a quadrupole, an octupole, or an ion funnel.
CN202011544680.5A 2020-12-24 2020-12-24 Vacuum ion trap mass spectrometer system Pending CN112635291A (en)

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Application Number Priority Date Filing Date Title
CN202011544680.5A CN112635291A (en) 2020-12-24 2020-12-24 Vacuum ion trap mass spectrometer system

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Application Number Priority Date Filing Date Title
CN202011544680.5A CN112635291A (en) 2020-12-24 2020-12-24 Vacuum ion trap mass spectrometer system

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CN112635291A true CN112635291A (en) 2021-04-09

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