CN112630699A - Tantalum capacitance measuring device - Google Patents
Tantalum capacitance measuring device Download PDFInfo
- Publication number
- CN112630699A CN112630699A CN202011417930.9A CN202011417930A CN112630699A CN 112630699 A CN112630699 A CN 112630699A CN 202011417930 A CN202011417930 A CN 202011417930A CN 112630699 A CN112630699 A CN 112630699A
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- rail
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- plate
- testing station
- tantalum
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- 229910052715 tantalum Inorganic materials 0.000 title claims abstract description 57
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 title claims abstract description 57
- 238000012360 testing method Methods 0.000 claims abstract description 104
- 230000007246 mechanism Effects 0.000 claims abstract description 71
- 239000003990 capacitor Substances 0.000 claims abstract description 24
- 230000009471 action Effects 0.000 claims abstract description 19
- 239000000523 sample Substances 0.000 claims abstract description 15
- 239000000463 material Substances 0.000 claims description 18
- 238000007599 discharging Methods 0.000 claims description 6
- 238000003780 insertion Methods 0.000 claims description 6
- 230000037431 insertion Effects 0.000 claims description 6
- 230000001502 supplementing effect Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 abstract description 2
- 229910000831 Steel Inorganic materials 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000010959 steel Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/64—Testing of capacitors
Abstract
The invention provides a tantalum capacitance measuring device, which comprises a track and a tooling plate, wherein the tooling plate is suitable for moving along the track under the driving action of a moving mechanism, and a plurality of tantalum capacitances are arranged in the tooling plate; the measuring mechanism at least comprises a surge testing station, an electric leakage testing station and a three-parameter testing station which move synchronously, and the testing stations are correspondingly arranged along the moving path of the tooling plate respectively; the tooling plate moves to the measuring mechanism along the track under the driving action of the moving mechanism, probes at the testing stations are respectively contacted with the tantalum capacitor, and the surge testing station, the electric leakage testing station and the three-parameter testing station are respectively used for carrying out surge, electric leakage and three-parameter testing. This technical scheme can test a plurality of performances of tantalum electric capacity respectively simultaneously, and its measurement work efficiency is high.
Description
Technical Field
The invention relates to a tantalum capacitance measuring device.
Background
It is known that in order to ensure the quality and reliability of chip tantalum capacitor products, performance tests are required during the production process. Such as:
CN201320638670.7 discloses a chip tantalum capacitor measuring tool, which comprises a measuring instrument with a power supply, a discharge resistor and a clamp; the double-control switch is fixed on the base, the measuring instrument and the discharge resistor are respectively connected with two output ends of the double-control switch, and the other ends of the measuring instrument and the discharge resistor are connected in parallel and then electrically connected with the input end of the double-control switch through the clamp; the pedal is hinged on the base above the double-control switch, and the back of the pedal is provided with a spring fixed on the base. The phenomenon that the traditional measuring clamp cannot be synchronously contacted with two electrodes of a capacitor to cause discharging and ignition is thoroughly avoided.
CN201420108863.6 discloses a tantalum capacitance wet test device, which includes an anode steel bar, a sliding block, an adjusting screw, a sliding rail, a base, a test meter, and a plurality of tantalum cups and switches disposed on the base, wherein the sliding rail is respectively and fixedly mounted at two ends of the base, the anode steel bar is movably mounted on the two sliding rails through the sliding block, and the positions of the anode steel bar on the sliding rails are fixed through the adjusting screw, the tantalum cups are arranged under the anode steel bar and are connected in parallel to the negative pole of the test meter through a wire, the anode steel bar is connected to the positive pole of the test meter through a wire, and the switches are connected with the tantalum cups in a one-to-. The position of the sliding block on the sliding rail is adjusted, and the anode core block is fixed through the adjusting screw, so that the depth of the anode core block immersed in the measuring liquid is adjusted, human errors are well avoided, the testing accuracy is guaranteed, and the testing efficiency is improved.
CN201520175280.X discloses a tantalum capacitor short circuit testing device, which comprises a PCB and a testing unit arranged on the PCB, wherein the testing unit comprises a capacitor to be tested, an indicating device, a discharge diode and a current-limiting resistor, the capacitor to be tested, the indicating device and the current-limiting resistor are connected in series and then connected between a positive electrode and a negative electrode of a power supply, and the discharge diode is connected with the indicating device and the current-limiting resistor in parallel; the device makes up the defects of low speed and high false detection rate of the measuring equipment; the method has the advantages that special measuring equipment does not need to be input, the testing steps are simple, the equipment input cost is reduced, the working efficiency is greatly improved, the production cost is reduced, the misdetection can be effectively avoided, and the reliability of products on the spot is improved.
However, the above-mentioned tantalum capacitance measuring devices respectively test the single performance of the tantalum capacitance, the working efficiency of measuring the tantalum capacitance is slow, and the working efficiency is to be improved.
Disclosure of Invention
The invention aims to provide a tantalum capacitance measuring device which can simultaneously test a plurality of performances of a tantalum capacitance respectively and has high measuring work efficiency.
In order to solve the technical problems, the technical means adopted by the invention are as follows:
a tantalum capacitance measurement device, comprising:
the device comprises a track and a tooling plate which is suitable for moving along the track under the driving action of a moving mechanism, wherein a plurality of tantalum capacitors are arranged in the tooling plate;
the measuring mechanism at least comprises a surge testing station, an electric leakage testing station and a three-parameter testing station which move synchronously, and the testing stations are correspondingly arranged along the moving path of the tooling plate respectively;
the tooling plate moves to the measuring mechanism along the track under the driving action of the moving mechanism, probes at the testing stations are respectively contacted with the tantalum capacitor, and the surge testing station, the electric leakage testing station and the three-parameter testing station are respectively used for carrying out surge, electric leakage and three-parameter testing.
Preferably, in the tantalum capacitance measuring device, the rail is a linear rail, and the surge testing station, the leakage testing station and the three-parameter testing station are respectively arranged linearly above the rail.
Preferably, foretell tantalum capacitance measuring device, wherein measuring mechanism includes the mount pad, the mount pad is close to orbital one side is connected with first mounting panel, first mounting panel be connected with a level to the second mounting panel that the track direction extends, the second mounting panel is equipped with 3 at least, respectively with surge test station, electric leakage test station and three parameter test station are corresponding, the bottom of second mounting panel erection joint has probe sectional fixture respectively, be connected with test probe on the probe sectional fixture respectively.
Preferably, in the tantalum capacitance measuring device, a transplanting mechanism is further disposed on one side of the rail, the transplanting mechanism includes a pin, a jack corresponding to the pin in size is disposed on the tooling plate, the pin is correspondingly inserted into the jack under the action of the horizontal transverse movement mechanism, and the tooling plate is driven to move forward along the rail under the action of the horizontal longitudinal movement mechanism.
Preferably, foretell tantalum capacitance measuring device, wherein transplant mechanism from bottom to top and include first track mounting panel, second track mounting panel and third track mounting panel in proper order, second track mounting panel bottom is connected with the axial cylinder, and it is suitable for the axial cylinder is followed down the horizontal longitudinal sliding of length direction of first track mounting panel, fixedly connected with contact pin mounting panel on the third track mounting panel, one side of contact pin mounting panel is connected with horizontal cylinder, and it is suitable for follow under the horizontal cylinder effect the horizontal transverse sliding of width direction of second track mounting panel.
Preferably, in the tantalum capacitance measuring device, a cutter station is further disposed at the tail end of the test station, the cutter station includes cutter modules corresponding to the surge test station, the leakage test station and the three-parameter test station, and corresponding material boxes are disposed below the cutter modules.
Preferably, in the tantalum capacitance measuring device, the cutter station further includes a cutter supplementing module disposed at a rear end of the cutter module.
Preferably, in the tantalum capacitance measuring device, the cutter station further includes a rail plate adapted to be connected to the rail, a pin corresponding to the insertion hole of the tool plate is disposed on one side of the rail plate, the pin is connected to a mechanism adapted to drive the tool plate to move laterally and longitudinally, and during lateral movement, the pin is inserted into the insertion hole of the tool plate and slides forward to the cutter module along the longitudinal direction of the rail plate under the driving of the mechanism.
Preferably, in the tantalum capacitance measuring device, the mechanism includes a guide rail, a mounting plate slidably connected to the guide rail, and a cylinder and a pin mounting seat connected to the cylinder are connected to one side of the mounting plate close to the track plate; the opposite side of mounting panel is connected with a screw-nut connecting block, the screw-nut connecting block is connected with a lead screw, the lead screw is connected with the personal clothes motor.
Preferably, in the tantalum capacitance measuring device, a feeding mechanism and a discharging mechanism are respectively arranged at two ends of the track; the feeding mechanism and the discharging mechanism are respectively provided with a material cage and a driving mechanism for driving the material cage to ascend and descend, and the material cage is suitable for containing a plurality of mounting plates.
Compared with the prior art, the invention has the technical advantages that: according to the technical scheme, at least a surge testing station, an electric leakage testing station and a three-parameter testing station which move synchronously are arranged along a working track for measuring the tantalum capacitor, a tooling plate moves to a measuring mechanism along the track under the driving action of a moving mechanism, probes at the testing station are respectively contacted with the tantalum capacitor, and the surge testing station, the electric leakage testing station and the three-parameter testing station are respectively used for simultaneously testing the surge, the electric leakage and the three parameters, so that a plurality of performances of the tantalum capacitor can be respectively measured through one piece of equipment, and the measuring working efficiency is greatly improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1: the invention has a schematic structure;
FIG. 2: the invention discloses a structural schematic diagram of a measuring mechanism;
FIG. 3: the invention is a schematic structural diagram of a transplanting mechanism;
FIG. 4: the invention is a structural schematic diagram of a mechanism at a cutter station;
FIG. 5: the structure of the cutter module of the invention is shown schematically;
FIG. 6: the structure of the feeding mechanism is schematic;
FIG. 7: the invention discloses an explosion schematic diagram of a feeding mechanism structure;
FIG. 8: the invention discloses a structural schematic diagram of a blanking mechanism.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The present invention will be described in further detail below with reference to specific embodiments and with reference to the attached drawings.
As shown in fig. 1, a tantalum capacitance measuring device includes:
the device comprises a track 1 and a tooling plate 2 which is suitable for moving along the track 1 under the driving action of a moving mechanism, wherein a plurality of tantalum capacitors are arranged in the tooling plate 2;
the measuring mechanism 3 at least comprises a surge testing station 30, an electric leakage testing station 31 and a three-parameter testing station 32 which move synchronously, and the testing stations are correspondingly arranged along the moving path of the tooling plate 2 respectively;
the plate 2 of the tool moves to the measuring mechanism 3 along the track 1 under the driving action of the moving mechanism, probes at the testing stations are respectively contacted with the tantalum capacitor, and the surge testing station 30, the electric leakage testing station 31 and the three-parameter testing station 32 are respectively used for carrying out surge, electric leakage and three-parameter testing.
The rail 1 is a linear rail, and the surge testing station 30, the leakage testing station 31 and the three-parameter testing station 32 are respectively in linear arrangement above the rail 1.
As shown in fig. 2, the measuring mechanism 3 includes a mounting seat 33, the mounting seat 33 is close to one side of the track 1 is connected with a first mounting plate 34, the first mounting plate 34 is connected with a level to a second mounting plate 35 extending in the track direction 1, the second mounting plate 35 is at least provided with 3 blocks, which correspond to the surge testing station 30, the electric leakage testing station 31 and the three-parameter testing station 32, the bottom of the second mounting plate 35 is respectively and fixedly connected with a probe mounting fixture 36, and the probe mounting fixture 36 is respectively and fixedly connected with a testing probe.
The first mounting plate 34 is connected with a connecting block 39, the slide base 300 is matched with a vertical slide rail of the mounting base 33, the connecting block 39 is connected with a screw rod 38, the top of the screw rod 38 is connected with an output shaft of a personal clothing motor 37, the personal clothing motor 37 drives a screw rod 38-level connecting block to lift up and down, so that the first mounting plate 34 and the second mounting plate 35 are driven to lift up and down, the surge testing station 30, the electric leakage testing station 31 and the three-parameter testing station 32 are driven to lift up and down, and meanwhile the first mounting plate 34 and the second mounting plate 35 can also be matched with a drag chain 301 to perform auxiliary motion in the lifting process.
As shown in fig. 3, a transplanting mechanism 4 is further disposed on one side of the rail 1, the transplanting mechanism 4 includes a pin 40, a jack 20 corresponding to the pin 40 is disposed on the tooling plate 2, the pin 40 is correspondingly inserted into the jack 20 under the action of the horizontal transverse motion mechanism, and the tooling plate 2 is driven to move forward along the rail 1 under the action of the horizontal longitudinal motion mechanism.
Specifically, transplant mechanism 4 from bottom to top and include first track mounting panel 41, second track mounting panel 42 and third track mounting panel 43 in proper order, second track mounting panel 42 bottom is connected with axial cylinder 44, and it is suitable for axial cylinder 44 is followed down the horizontal longitudinal sliding of length direction of first track mounting panel 41, fixedly connected with contact pin mounting panel 45 on the third track mounting panel 43, one side of contact pin mounting panel 45 is connected with horizontal cylinder 46, and it is suitable for horizontal cylinder 46 is followed down the horizontal transverse sliding of width direction of second track mounting panel 42.
The contact pin mounting plate 45 is in under the effect of horizontal cylinder 46 along the horizontal lateral sliding of width direction of second track mounting plate 42 inserts contact pin 40 into the jack 20 of frock board 2 for frock board 2 realizes the linkage with contact pin mounting plate 45, so, is in second track mounting plate 42 is in under the effect of axial cylinder 44 along when the horizontal longitudinal sliding of length direction of first track mounting plate 41, frock board 2 also slides forward along track 1.
As shown in fig. 1, a cutter station 5 is further disposed at the tail end of the test station, the cutter station 5 includes cutter modules 50 corresponding to the surge test station 30, the leakage test station 31 and the three-parameter test station 32, and corresponding material boxes 51 are disposed below the cutter modules 50.
When the surge testing station 30, the leakage testing station 31 and the three-parameter testing station 32 respectively detect that the performance of a certain tantalum capacitor is unqualified, when the tantalum capacitor moves to the corresponding cutter module 50, the cutter module 50 cuts off the unqualified tantalum capacitor and collects the unqualified tantalum capacitor in the material box 51.
In addition, the cutter station 5 further comprises a cutter supplementing module 52 arranged at the rear end of the cutter module 50, and the cutter supplementing module is mainly used for preventing the tantalum capacitor from moving too fast, effectively finishing cutting at the front cutter module 50 and performing compensation cutting at the cutter supplementing module 52.
As shown in fig. 4, the cutter station 5 further includes a rail plate 53 adapted to engage with the rail 1, a pin 54 corresponding to the insertion hole of the tooling plate 2 is disposed on one side of the rail plate 53, the pin 54 is connected to a mechanism adapted to drive the lateral and longitudinal movement of the pin 54, and during the lateral movement, the pin 54 is inserted into the insertion hole of the tooling plate 2 and slides forward to the cutter module 50 along the longitudinal direction of the rail plate 53 under the driving of the mechanism.
The mechanism comprises a guide rail 55, a mounting plate 56 connected to the guide rail 55 in a sliding manner, wherein one side of the mounting plate 56 close to the track plate 53 is connected with an air cylinder 57, and a pin mounting seat 58 connected with the air cylinder 57; the opposite side of mounting panel 56 is connected with a screw-nut connecting block 59, screw-nut connecting block 59 is connected with a lead screw, the lead screw is connected with the personal motor.
As shown in fig. 5, the cutter module 50 includes an upper cutter 500 and a lower cutter 501.
As shown in fig. 1, a feeding mechanism 6 and a discharging mechanism 7 are respectively arranged at two ends of the track 1; the feeding mechanism 6 and the blanking mechanism 7 are respectively provided with a material cage 8 and a driving mechanism for driving the material cage 8 to ascend and descend, and the material cage 8 is internally suitable for placing a plurality of mounting plates 2.
As shown in fig. 6 and 7, the feeding mechanism 6 includes a feeding frame 60, a channel 61 for up-and-down movement of the material cage 8 is provided at the feeding frame 60, a feeding frame 62 is provided at the channel 61, the back of the feeding frame 62 is connected to a feeding screw nut mounting seat 63, the feeding screw nut mounting seat 63 is connected to a feeding screw and a feeding servo motor, and the feeding servo motor drives the screw to move to drive the feeding screw nut mounting seat 63 to up-and-down movement, so as to drive the material cage 8 to up-and-down movement under the bearing effect of the feeding frame 62, and certainly, the movement of the material cage can be assisted by a drag chain.
In addition, a feeding support 64 is further arranged on one side of the material cage 8, the bottom of the feeding support 64 is connected with a connecting block 65, the connecting block 65 is connected with an air cylinder 66, the air cylinder 66 drives the feeding support 64 to move through the connecting block 65, so that the tooling plates in the material cage 8 are fed into the track 1, meanwhile, a pushing block 67 is further arranged at the head end of the track 1, the pushing block 67 is connected with an air cylinder 68, the pushing block 67 is driven to slide forwards along the track 1 under the action of the air cylinder 68, so that the tooling plates 2 are pushed to slide in the track 1, and the reciprocating motion is carried out, so that the feeding and the movement along the track of the tooling plates 2 can be realized.
As shown in fig. 8, the blanking mechanism 7 and the feeding mechanism 8 have substantially similar structures and principles, and are not described in detail herein.
According to the technical scheme, at least a surge testing station, an electric leakage testing station and a three-parameter testing station which move synchronously are arranged along a working track for measuring the tantalum capacitor, a tooling plate moves to a measuring mechanism along the track under the driving action of a moving mechanism, probes at the testing station are respectively contacted with the tantalum capacitor, and the surge testing station, the electric leakage testing station and the three-parameter testing station are respectively used for simultaneously testing the surge, the electric leakage and the three parameters, so that a plurality of performances of the tantalum capacitor can be respectively measured through one piece of equipment, and the measuring working efficiency is greatly improved.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A tantalum capacitance measuring device, comprising:
the device comprises a track and a tooling plate which is suitable for moving along the track under the driving action of a moving mechanism, wherein a plurality of tantalum capacitors are arranged in the tooling plate;
the measuring mechanism at least comprises a surge testing station, an electric leakage testing station and a three-parameter testing station which move synchronously, and the testing stations are correspondingly arranged along the moving path of the tooling plate respectively;
the tooling plate moves to the measuring mechanism along the track under the driving action of the moving mechanism, probes at the testing stations are respectively contacted with the tantalum capacitor, and the surge testing station, the electric leakage testing station and the three-parameter testing station are respectively used for carrying out surge, electric leakage and three-parameter testing.
2. The tantalum capacitance measuring device of claim 1, wherein the rail is a linear rail, and the surge testing station, the leakage testing station and the three-parameter testing station are respectively arranged linearly corresponding to the upper part of the rail.
3. The tantalum capacitance measuring device according to claim 1 or 2, wherein the measuring mechanism comprises a mounting base, a first mounting plate is connected to one side of the mounting base close to the rail, a second mounting plate horizontally extending towards the rail is connected to the first mounting plate, at least 3 second mounting plates are arranged and correspond to the surge testing station, the leakage testing station and the three-parameter testing station respectively, probe mounting fixtures are mounted and connected to the bottoms of the second mounting plates respectively, and testing probes are connected to the probe mounting fixtures respectively.
4. The tantalum capacitance measuring device according to claim 1, wherein a transplanting mechanism is further arranged on one side of the rail, the transplanting mechanism comprises a pin, a jack corresponding to the pin is arranged on the tooling plate, the pin is correspondingly inserted into the jack under the action of the horizontal transverse movement mechanism, and the tooling plate is driven to move forward along the rail under the action of the horizontal longitudinal movement mechanism.
5. The tantalum capacitance measuring device according to claim 4, wherein the transplanting mechanism comprises a first rail mounting plate, a second rail mounting plate and a third rail mounting plate from bottom to top in sequence, an axial cylinder is connected to the bottom of the second rail mounting plate and is suitable for horizontally and longitudinally sliding along the length direction of the first rail mounting plate under the action of the axial cylinder, a contact pin mounting plate is fixedly connected to the third rail mounting plate, and a transverse cylinder is connected to one side of the contact pin mounting plate and is suitable for horizontally and transversely sliding along the width direction of the second rail mounting plate under the action of the transverse cylinder.
6. The tantalum capacitance measuring device according to claim 1, wherein a cutter station is further arranged at the tail end of the test station, the cutter station comprises cutter modules corresponding to the surge test station, the leakage test station and the three-parameter test station, and corresponding material boxes are arranged below the cutter modules.
7. The tantalum capacitance measuring device of claim 6, wherein the cutter station further comprises a cutter supplementing module disposed at a rear end of the cutter module.
8. The tantalum capacitance measuring device according to claim 6 or 7, wherein the cutter station further comprises a rail plate adapted to engage with the rail, one side of the rail plate is provided with a pin corresponding to the insertion hole of the tool plate, the pin is connected to a mechanism adapted to drive the pin to move laterally and longitudinally, and the pin is inserted into the insertion hole of the tool plate during lateral movement and slides forward to the cutter module along the longitudinal direction of the rail plate under the driving of the mechanism.
9. The tantalum capacitance measuring device of claim 8, wherein the mechanism comprises a guide rail, a mounting plate slidably connected to the guide rail, a cylinder connected to one side of the mounting plate close to the track plate, and a pin mounting seat connected to the cylinder; the opposite side of mounting panel is connected with a screw-nut connecting block, the screw-nut connecting block is connected with a lead screw, the lead screw is connected with the personal clothes motor.
10. The tantalum capacitance measuring device according to claim 1, wherein a feeding mechanism and a discharging mechanism are respectively arranged at two ends of the track; the feeding mechanism and the discharging mechanism are respectively provided with a material cage and a driving mechanism for driving the material cage to ascend and descend, and the material cage is suitable for containing a plurality of mounting plates.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011417930.9A CN112630699A (en) | 2020-12-05 | 2020-12-05 | Tantalum capacitance measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011417930.9A CN112630699A (en) | 2020-12-05 | 2020-12-05 | Tantalum capacitance measuring device |
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| Publication Number | Publication Date |
|---|---|
| CN112630699A true CN112630699A (en) | 2021-04-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011417930.9A Pending CN112630699A (en) | 2020-12-05 | 2020-12-05 | Tantalum capacitance measuring device |
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| CN (1) | CN112630699A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115356584A (en) * | 2022-10-21 | 2022-11-18 | 四川省科学城久信科技有限公司 | Automatic detection tool for power electronic capacitor |
| CN115400960A (en) * | 2022-09-02 | 2022-11-29 | 广州诺顶智能科技有限公司 | Shaping test braid equipment of metal tantalum capacitor |
-
2020
- 2020-12-05 CN CN202011417930.9A patent/CN112630699A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115400960A (en) * | 2022-09-02 | 2022-11-29 | 广州诺顶智能科技有限公司 | Shaping test braid equipment of metal tantalum capacitor |
| CN115400960B (en) * | 2022-09-02 | 2023-08-11 | 广州诺顶智能科技有限公司 | Shaping test braid equipment of metal tantalum capacitor |
| CN115356584A (en) * | 2022-10-21 | 2022-11-18 | 四川省科学城久信科技有限公司 | Automatic detection tool for power electronic capacitor |
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