CN112596488B - Data acquisition method and device, electronic equipment and storage medium - Google Patents

Data acquisition method and device, electronic equipment and storage medium Download PDF

Info

Publication number
CN112596488B
CN112596488B CN202011549824.6A CN202011549824A CN112596488B CN 112596488 B CN112596488 B CN 112596488B CN 202011549824 A CN202011549824 A CN 202011549824A CN 112596488 B CN112596488 B CN 112596488B
Authority
CN
China
Prior art keywords
product
key
parameters
storage space
data acquisition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202011549824.6A
Other languages
Chinese (zh)
Other versions
CN112596488A (en
Inventor
姜允虎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Saimeite Software Technology Co ltd
Original Assignee
Shanghai Saimeite Software Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Saimeite Software Technology Co ltd filed Critical Shanghai Saimeite Software Technology Co ltd
Priority to CN202011549824.6A priority Critical patent/CN112596488B/en
Publication of CN112596488A publication Critical patent/CN112596488A/en
Application granted granted Critical
Publication of CN112596488B publication Critical patent/CN112596488B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/418Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM]
    • G05B19/4183Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS], computer integrated manufacturing [CIM] characterised by data acquisition, e.g. workpiece identification
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/32Operator till task planning
    • G05B2219/32252Scheduling production, machining, job shop
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Abstract

The embodiment of the invention relates to the field of control, in particular to a data acquisition method, a data acquisition device, electronic equipment and a computer-readable storage medium. In this embodiment, parameters of a product are acquired according to data acquisition plan information, and the parameters of the product are classified and stored according to a key field key value combination matched with product batch information of the product, so as to obtain parameters of various categories, where the key field key value combination is set in the data acquisition plan information, and the key field combination to which the key field key value combination belongs includes: the CKC key is a field configured in the SPC system, and the CKC key and the field of the product batch information in the MES system have an incidence relation.

Description

Data acquisition method and device, electronic equipment and storage medium
Technical Field
The embodiment of the invention relates to the field of control, in particular to a data acquisition method, a data acquisition device, electronic equipment and a computer-readable storage medium.
Background
In modern Manufacturing factories, in addition to Manufacturing Execution Systems (MES), SPC (Statistical Process Control) systems are generally introduced to assist the Manufacturing department and the quality department in monitoring and controlling the production quality in order to further improve the production quality, and are often used together to trace data information of the MES better in SPC.
The related technology selects a relation group to be associated with the SPC system according to the Product batch information of the MES system, such as the final Product number Finish Good ID, the Product ID, the Product Version, the Process Route, the production Equipment Process Equipment, the operation procedure operator, the Measurement Equipment Process Equipment, the Process Route Version Route and other related information, so as to acquire data. For example, 3 key value combinations are obtained in the MES system according to the ProductID, Route, Oper and the values of the three fields, the 3 key value combinations form a relationship group, and the user inputs data or automatically collects data in the storage space of the corresponding parameter according to the fed-back data collection Plan edcplan to achieve the purpose of data collection.
However, when there is a need for analyzing other dimension data, a new data collection plan is needed to collect and analyze multiple dimension data. For example, when the SPC has a data acquisition Plan to perform data acquisition according to a combination of 5 keys of Product, Product Version, Route Version, and Oper as a relationship group, however, data analysis is required according to the final finished Product number Finish Good ID during data analysis, data of Product batches with different Finish Good IDs may be mixed together according to parameters acquired by the original data acquisition Plan and cannot be analyzed separately, and related technologies may recreate different data acquisition plans edcplan according to different Finish Good IDs, thereby implementing data analysis according to products with different Finish Good IDs. However, the configuration of the newly added data acquisition plan is cumbersome, and the manual configuration cost is increased.
Disclosure of Invention
The embodiment of the invention aims to provide a data acquisition method, a data acquisition device, electronic equipment and a computer readable storage medium, so that data analysis can be carried out according to data of other dimensions without newly adding a data acquisition plan, and the manual configuration cost is reduced.
In order to solve the above technical problem, an embodiment of the present invention provides a data acquisition method, including the following steps: acquiring parameters of a product according to the data acquisition plan information; storing the parameters of the product in a classified manner according to key value combinations of key fields matched with the product batch information of the product to obtain parameters of various categories; the key field key value combination is arranged in data acquisition plan information; the key field to which the key field key value combination belongs comprises: at least one CKC Key (Key Combination Key, Key field); the CKC key is a field configured in the SPC system, and the CKC key has an incidence relation with a field in the product batch information in the MES system.
An embodiment of the present invention further provides a data acquisition apparatus, including: the parameter acquisition module is used for acquiring parameters of the product according to the data acquisition plan information; the parameter classification module is used for classifying and storing the parameters of the product according to key field key value combinations matched with the product batch information of the product to obtain parameters of various categories; the key field key value combination is arranged in data acquisition plan information; the key field combination to which the key field key value combination belongs comprises: at least one CKC key; the CKC key is a field configured in the SPC system, and the CKC key has an incidence relation with a field in the product batch information in the MES system.
An embodiment of the present invention further provides an electronic device, including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the data acquisition method.
An embodiment of the present invention further provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the data acquisition method is implemented.
Compared with the related art, the embodiment of the invention obtains the parameters of the product according to the data acquisition plan information, and classifies and stores the parameters of the product according to the key field key value combination matched with the product batch information of the product to obtain the parameters of each category, wherein the key field key value combination is arranged in the data acquisition plan information, and the key field combination to which the key field key value combination belongs comprises: the CKC key is a field configured in the SPC system, the CKC key has an incidence relation with fields of product batch information in the MES system, collected product parameters can be classified and stored according to key value combinations of key fields, when parameters of other dimensions have analysis requirements, data analysis is conveniently carried out on the parameters of various types collected according to the data collection plan, the additional collection of the parameters of other dimensions by adding the data collection plan is not needed, the cost of manual configuration is reduced, in addition, the problem that the newly added data collection plan causes the repetition of the parameters collected by the newly added data collection plan and the parameters collected by the original data collection plan is avoided, and the redundancy of the parameters collected in the SPC system is reduced.
In addition, the step of storing the parameters of the product in a classified manner according to key value combinations of key fields matched with the product batch information of the product comprises the following steps: acquiring the key field key value combination matched with the product batch information of the product according to the product batch information of the product; acquiring a sub-storage space according to the key field key value combination, wherein the sub-storage space is a space created in a total storage space, and the total storage space is a space for storing all the parameters acquired by the data acquisition plan information; and storing the parameters of the product into the sub-storage space. In the implementation, the parameters of the product are stored in the corresponding sub-storage spaces according to the matched key value combinations of the key fields, and one sub-storage space stores one category of parameters.
In addition, after the acquiring the parameters of the product according to the data acquisition plan information, the method further includes: if the key field key value combination fails to be matched with the product batch information of the product, determining a newly added key field key value combination according to the product batch information of the product and the value of each field matched with the key field combination; newly adding a sub-storage space corresponding to the newly added key field key value combination in the total storage space; and storing the parameters of the product into the newly added sub-storage space. In the implementation, key field key value combinations can be automatically added according to the product batch information of the product, a sub-storage space is created to store the product parameters of the category, and the cost of manual configuration is further reduced.
In addition, the method classifies and stores the parameters of the product according to the key value combination of the key fields matched with the product batch information of the product to obtain the parameters of each category, and further comprises the following steps: and if the key field key value combination fails to be matched with the product batch information of the product, storing the parameters of the product into a storage space except the sub-storage space in the total storage space. In this implementation, when there is no matching key field key combination, that is, when a sub-storage space storing the product parameter of the category is not created, the product parameter is stored to a storage space other than the sub-storage space in the total storage space.
In addition, before the parameters of the product are classified and stored according to the key value combination of the key fields matched with the product batch information of the product and the parameters of each category are obtained, the method further comprises the following steps: acquiring the value of the CKC key in the key field combination input by a user; obtaining a key field key value combination according to the key field combination and the value of the CKC key; and creating the sub-storage space according to the key field key value combination. In the implementation, the user can configure the value of the CKC key according to the own requirement, so that the CKC key is closer to the requirement of the user, and the configuration is more flexible.
In addition, the method also includes the following steps that the parameters of the product are classified and stored according to the key value combination of the key fields matched with the product batch information of the product, and after the parameters of each category are obtained: acquiring a viewing parameter category input by a user; and displaying a control chart according to the viewing parameter category. In the realization, for the parameters collected by the same data acquisition plan, control charts with different data dimensions can be checked according to different checking modes, the checking mode of the specification parameters is flexible, and the product quality analysis is convenient to carry out.
Additionally, viewing parameter categories includes: a general view and a partial view; the displaying a control chart according to the viewing parameter category comprises: if the viewed parameter type is the general graph, displaying a control graph according to all parameters collected by the data acquisition plan information; if the viewed parameter type is the sub-graph, displaying a control graph according to the parameters of the sub-graph; wherein the parameter of the sub-graph is a parameter of one of the parameters of each category.
Drawings
One or more embodiments are illustrated by the corresponding figures in the drawings, which are not meant to be limiting.
FIG. 1 is a flow chart of a data acquisition method according to a first embodiment of the invention;
FIG. 2 is a flow chart of a data acquisition method according to a second embodiment of the invention;
FIG. 3 is a flow chart for viewing control charts in a second embodiment in accordance with the present invention;
FIG. 4 is a schematic structural diagram of a data acquisition device according to a third embodiment of the present invention;
fig. 5 is a schematic structural diagram of an electronic device in a fourth embodiment according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, embodiments of the present invention will be described in detail below with reference to the accompanying drawings. However, it will be appreciated by those of ordinary skill in the art that numerous technical details are set forth in order to provide a better understanding of the present application in various embodiments of the present invention. However, the technical solution claimed in the present application can be implemented without these technical details and various changes and modifications based on the following embodiments. The following embodiments are divided for convenience of description, and should not constitute any limitation to the specific implementation manner of the present invention, and the embodiments may be mutually incorporated and referred to without contradiction.
Statistical Process Control (SPC) is a Process Control tool that relies on mathematical Statistical methods. The method analyzes and evaluates the production process, timely discovers the sign of the systematic factors according to the feedback information, and takes measures to eliminate the influence, so that the process is maintained in a controlled state only influenced by the random factors, and the purpose of controlling the quality is achieved. When the process is only affected by random factors, the process is in a statistical control state (called a controlled state for short); when the influence of system factors exists in the process, the process is in a statistical runaway state (simply called a runaway state). Because process fluctuations are statistically regular, when the process is controlled, the process characteristics generally follow a stable random distribution; and out of control, the process profile will change. SPC is precisely the statistical regularity of process fluctuations that is used to analytically control a process. Thus, it emphasizes that the process operates in a controlled and capable state, thereby enabling products and services to consistently meet customer requirements.
In the related art, a fixed key value combination collection parameter is used, for example, a scheme in which a combination of 3 key values such as a Product number Product id, a process Route, and an operating procedure Oper is used as one relationship group, or a scheme in which a key value combination of 5 keys such as a Product number Product id, a Product Version, a process Route Version, and a process Route Version is used as one relationship group collection parameter.
For example, with the Product number Product id as PA, the Product Version as PV1, the process Route as RA, the process Route Version as RV1, and 5 keys as relationship groups, the SPC system collects parameters of products in the Product lot information that have corresponding relationship groups, such as: the circuit etch slot width is collected to obtain parameters of 100 product lots lot, 100 product lots carry 100 product lot information, 20 final product number information are carried in the 100 product lot information, and when the data collection plan collects parameters of each product in the 100 product lots, the parameter Spec of products with different final product numbers contained in the product lot information is mixed together. When the control chart needs to be acquired according to different final product numbers, because the collected parameters are mixed together, quality analysis cannot be performed according to the parameters collected by a certain final product number, and great inconvenience is brought to quality department or process department engineers for quality condition analysis. In order to analyze data according to different final product numbers, a new data acquisition plan is required to collect the parameters. For example, if there are 20 different final product numbers, 20 different data acquisition plans need to be created, where the 20 different data acquisition plans correspond to the 20 different final product numbers, and except for the 20 newly added data acquisition plans, a field of a final product number and its value are added in comparison with the originally configured data acquisition plan in the configuration relationship group, most of the rest of the configuration processes are the same as the originally configured data acquisition plan, and the configuration processes are the same, which greatly increases the cost of manual configuration, increases the risk of erroneous input caused by manual configuration, and also causes redundant data to exist in the SPC system.
In order to solve the above problem, a first embodiment of the present invention proposes a data acquisition method. The data acquisition method of the embodiment is applied to electronic equipment such as computers. The embodiment of the invention comprises the following steps: obtaining a parameter Spec of a product according to data acquisition plan information, classifying and storing the parameter of the product according to a key field key value combination matched with product batch information of the product to obtain parameters of various categories, wherein the key field key value combination is arranged in the data acquisition plan information, and the key field combination to which the key field key value combination belongs comprises: the CKC key is a field configured in the SPC system, the CKC key has an incidence relation with fields of product batch information in the MES system, collected product parameters can be classified and stored according to key value combinations of key fields, when parameters of other dimensions have analysis requirements, data analysis is conveniently carried out on the parameters of various types collected according to the data collection plan, the additional collection of the parameters of other dimensions by adding the data collection plan is not needed, the cost of manual configuration is reduced, in addition, the problem that the newly added data collection plan causes the repetition of the parameters collected by the newly added data collection plan and the parameters collected by the original data collection plan is avoided, and the redundancy of the parameters collected in the SPC system is reduced.
A flow chart of a data acquisition method according to a first embodiment of the present invention is shown in fig. 1.
And step 101, acquiring parameters of the product according to the data acquisition plan information.
In one example, the data collection plan information is configured with collected parameters, and the parameters of the product are collected according to the product batch information and the data collection plan information of the product. Illustratively, taking the collected parameter as the circuit etching groove width as an example, the circuit etching groove width of the product is collected according to the data collection plan information and the product batch information of the product.
And 102, storing the parameters of the product in a classified manner according to key value combinations of key fields matched with the product batch information of the product to obtain parameters of various categories. Specifically, the key field combination to which the key field key value combination belongs is configured in advance by a user, the key field combination comprises at least one CKC key, the CKC key is a field configured in the SPC system, and the CKC key and a field in the product batch information in the MES system have an incidence relation. That is, the user may designate one or several CKC keys as key field combinations according to the needs of the user, the CKC keys in the SPC and the fields in the MES system having an association relationship, the field names may not be the same, but all have the same meaning, for example: the name of the field representing the process route in the MES system may be different from the name of the field representing the process route in the SPC system, but both fields represent the process route.
In one example, a key field key value combination matched with the product batch information of the product is obtained according to the product batch information of the product; acquiring a sub-storage space according to the key value combination of the key fields, wherein the sub-storage space is a space created in a total storage space, and the total storage space is a space for storing parameters acquired by the data acquisition plan information; and storing the parameters of the product into the sub-storage space.
In one example, if the key field key value combination fails to match with the product batch information of the product, determining a newly added key field key value combination according to the product batch information of the product and the value of each field matched with the key field combination; newly adding a sub-storage space corresponding to the newly added key field key value combination in the total storage space; and storing the parameters of the product into the newly added sub-storage space. In the implementation, key field key value combinations can be automatically added according to the product batch information of the product, a sub-storage space is created to store the product parameters of the category, and the cost of manual configuration is further reduced.
In one example, a flow diagram of the sub-steps of step 102 is shown in FIG. 1.
And a substep 1021, determining whether a key field key value combination matched with the product batch information of the product exists in the data acquisition plan information. If not, 1022 is performed, otherwise 1025 is performed. That is, whether the product batch information of the product is successfully matched with the key value combination of the key fields configured in the data acquisition plan information.
For example, taking the key field combination as the final product number as an example, the key field key values existing in the data acquisition plan information are the final product number F1 and the final product number F2, if the final product number in the product batch information of the product is F1, the key field key value combination matching the product batch information of the product exists, that is, the key field key value combination configured in the data acquisition plan information successfully matches the product batch information of the product, and if the final product number of the product batch information of the product is F3, the key field key value combination matching the product batch information of the product does not exist, that is, the key field key value combination configured in the data acquisition plan information fails to match the product batch information of the product.
And a substep 1022, determining a newly added key value combination of the key fields according to the product batch information of the product and the values of the fields matched with the key field combination.
In the above example, if the key field combination is the final product number, and the final product number in the product batch information of the product is F3, the key field key value combination is created: final product No. F3.
And a substep 1023 of adding a new sub-memory space corresponding to the key value combination of the new key field in the total memory space.
In the above example, a sub-storage space is created in the total storage space, that is, a newly added sub-storage space is obtained, and the sub-storage space is used for storing parameters of a product with a final product number of F3 in the product batch information and a width of a circuit etching slot.
And a substep 1024 of storing the parameters of the product into the newly added sub-storage space.
In the above example, the width of the circuit etching groove of the product is stored into the newly added sub-storage space.
If it is determined in step 1021 that there is a key field key value combination in the data collection plan information that matches the product lot information for the product, then step 1025 is entered.
And a substep 1025 of obtaining a sub-storage space according to the key field key value combination.
In the above example, the product lot information of the product includes the final product number F1, and a sub-storage space is obtained, where the sub-storage space is used to store the circuit etching slot width of the product with the final product number F1 in the product lot information.
Substep 1026 of storing the parameters of the product in the sub-storage space.
In the above example, the width of the circuit etching groove of the product is stored in the sub-storage space.
In this embodiment, parameters of a product are acquired according to data acquisition plan information, and the parameters of the product are classified and stored according to a key field key value combination matched with product batch information of the product, so as to obtain parameters of each category, where the key field key value combination includes: a key field combination, the key field combination comprising: the CKC key is a field configured in the SPC system, the CKC key has an incidence relation with fields of product batch information in the MES system, collected product parameters can be classified and stored according to key value combinations of key fields, when parameters of other dimensions have analysis requirements, data analysis is conveniently carried out on the parameters of various types collected according to the data collection plan, the additional collection of the parameters of other dimensions by adding the data collection plan is not needed, the cost of manual configuration is reduced, in addition, the problem that the newly added data collection plan causes the repetition of the parameters collected by the newly added data collection plan and the parameters collected by the original data collection plan is avoided, and the redundancy of the parameters collected in the SPC system is reduced.
A second embodiment of the present invention relates to a data acquisition method. The second embodiment is substantially the same as the first embodiment, and mainly differs therefrom in that: in the first embodiment, when there is no key value combination of key fields matching with the product batch information of the product, a newly added key value combination of key fields is obtained according to the product batch information of the product and the key value combination of key fields, and classified storage is automatically realized. In the second embodiment of the present invention, the user configures the value of each CKC key in the key field combination in advance, and if there is no key field key value combination matching with the product batch information of the product, the parameter of the product is stored in the total storage space.
A flow chart of a second embodiment of the present invention is shown in fig. 2.
Step 201, obtaining parameters of the product according to the data acquisition plan information.
Step 201 is substantially the same as step 101 of the first embodiment of the present invention, and is not described herein again.
In one example, before storing parameters of the product in a classified manner according to key field key value combinations matched with the product batch information of the product and obtaining parameters of various categories, obtaining values of the CKC keys in the key field combinations input by a user; obtaining a key field key value combination according to the key field combination and the value of the CKC key; and creating the sub-storage space according to the key field key value combination.
Illustratively, the key field combination is a final product number, and the value of the final product number input by the user is F1, then the final product number of the key field key value combination is F1, and a parameter for storing a product with the final product number of F1 in the product batch information is created in the total storage space, similarly, the user inputs F2, and then the final product number of the key field key value combination is F2, and a parameter for storing a product with the final product number of F2 in the product batch information is created in the total storage space, at this time, there are two key field key value combinations configured by the data collection plan information, which are respectively the final product number of F1 and the final product number of F2.
Step 202, whether a key field key value combination matched with the product batch information of the product exists in the data acquisition plan information or not is judged. If yes, go to step 201, and if not, go to step 205. Step 202 is substantially the same as step 201 of the first embodiment of the present invention, and is not described herein again.
And 203, acquiring a sub-storage space according to the key value combination of the key fields.
And step 204, storing the parameters of the product into the sub-storage space.
Steps 203 to 204 are substantially the same as steps 1025 to 1026 according to the second embodiment of the present invention, and are not described herein again.
And step 205, storing the parameters of the product into the storage space except the sub-storage space in the total storage space.
For example, the final product number in the product batch information of the product is F3, and there is no key field key value combination matching with the product batch information of the product, that is, there is no sub-storage space for storing parameters of the product with the final product number of F3 in the product batch information, and then the parameters of the product are stored in the storage space except the sub-storage space in the total storage space. It is understood that the total storage space includes: the sub-memory space for storing the parameters of each category, and the memory space for storing other parameters, i.e. other categories.
After the parameters of each category are obtained, the control chart of the parameters can be viewed according to other dimensions, for example, in the above example, the obtained parameters are stored in a classified manner according to different final product numbers, and a user can view the control chart according to different final product numbers.
In one example, after obtaining the parameters of each category, the viewing parameter categories input by the user may be obtained; the control chart is displayed according to the viewing parameter category.
In one example, if the viewed parameter type is the general graph, displaying a control graph according to all types of parameters collected by the data acquisition plan information; if the viewed parameter type is the sub-graph, displaying a control graph according to the parameters of the sub-graph; wherein the parameter of the sub-graph is a parameter of one of the parameters of each category.
Illustratively, a flow chart for a user viewing parameters is shown in FIG. 3.
Step 301, obtaining the viewing parameter category input by the user. The viewing parameter categories input by the user are a partial graph and a general graph respectively.
Step 302, judging the viewing parameter type, if the viewing parameter type is the general graph, executing step 303, otherwise, executing step 305.
Step 303, obtaining parameters of all categories of data collection plan information collection.
That is, when the parameter category is viewed as the general graph, the parameters stored in the created total storage space are acquired.
For example, if there are two sub-storage spaces in the total storage space, one of the sub-storage spaces stores parameters of a product with a final product number of F1 in the product batch information, the other of the sub-storage spaces stores parameters of a product with a final product number of F2 in the product batch information, and a storage space other than the two sub-storage spaces also exists in the total storage space, where the storage space stores parameters of products with final product numbers of neither F1 nor F2, such as final product numbers of F3 and F4, when the parameter type is viewed as a general graph, all the parameters stored in the total storage space are obtained.
And step 304, acquiring parameters of the partial graph. And the parameter of the sub-graph is the parameter of one of the parameters of each category.
Illustratively, the parameters of the partial graph are parameters in the sub-storage space, and if the user selects to view the control graph according to the parameters of the product with the completion number of F1 in the product batch information, the sub-storage space in which the parameters of the product with the completion number of F1 in the product batch information are stored is obtained; and if the user selects to check the control chart according to the parameters of the product with the final product number F2 in the product batch information of the product, acquiring the sub-storage space in which the parameters of the product with the final product number F2 in the product batch information are stored.
And 305, displaying a control chart on an interface according to the acquired parameters.
In addition, after the classification, for the parameters collected by the same data acquisition plan, control charts with different data dimensions can be checked according to different checking modes, namely the control charts of the parameters of each category can be checked according to the classification of the parameters generated by the key field key value combination matched with the product batch information of the product, the mode for checking the control charts is flexible, and the product quality analysis is facilitated.
The steps of the above methods are divided for clarity, and the implementation may be combined into one step or split some steps, and the steps are divided into multiple steps, so long as the same logical relationship is included, which are all within the protection scope of the present patent; it is within the scope of the patent to add insignificant modifications to the algorithms or processes or to introduce insignificant design changes to the core design without changing the algorithms or processes.
A third embodiment of the present invention relates to a data acquisition apparatus, as shown in fig. 4, including: a parameter obtaining module 401, configured to obtain parameters of a product according to the data acquisition plan information; the parameter classification module 402 is used for classifying and storing the parameters of the product according to key field key value combinations matched with the product batch information of the product to obtain parameters of various categories; the key field key value combination is arranged in data acquisition plan information; the key field combination to which the key field key value combination belongs comprises: at least one CKC key; the CKC key is a field configured in the SPC system, and the CKC key has an incidence relation with a field in the product batch information in the MES system.
In an example, the parameter classification module 402 is further configured to obtain the key field key value combination matching the product batch information of the product according to the product batch information of the product; acquiring a sub-storage space according to the key field key value combination, wherein the sub-storage space is a space created in a total storage space, and the total storage space is a space for storing all the parameters acquired by the data acquisition plan information; and storing the parameters of the product into the sub-storage space.
In an example, the parameter classification module 402 is further configured to determine, when the matching between the key field key value combination and the product batch information of the product fails, a newly added key field key value combination according to the product batch information of the product and values of fields matched with the key field combination; newly adding a sub-storage space corresponding to the newly added key field key value combination in the total storage space; and storing the parameters of the product into the newly added sub-storage space.
In one example, the parameter classification module 402 is further configured to store the parameter of the product in a storage space of the total storage space except for the sub-storage space if the key field key value combination fails to match the product batch information of the product.
In an example, the parameter classification module 402 is further configured to obtain a value of the CKC key in the key field combination input by the user; obtaining a key field key value combination according to the key field combination and the value of the CKC key; and creating the sub-storage space according to the key field key value combination.
In one example, the parameter classification module 402 is further configured to obtain a viewing parameter category input by a user; and displaying a control chart according to the viewing parameter category.
In one example, the parameter classification module 402 is further configured to display a control map according to the viewing parameter category, and if the viewing parameter category is the general map, display the control map according to all categories of the parameter collected by the data collection plan information; if the viewed parameter type is the sub-graph, displaying a control graph according to the parameters of the sub-graph; wherein the parameter of the sub-graph is a parameter of one of the parameters of each category.
It should be understood that this embodiment is a system example corresponding to the first embodiment, and may be implemented in cooperation with the first embodiment. The related technical details mentioned in the first embodiment are still valid in this embodiment, and are not described herein again in order to reduce repetition. Accordingly, the related-art details mentioned in the present embodiment can also be applied to the first embodiment.
It should be noted that each module referred to in this embodiment is a logical module, and in practical applications, one logical unit may be one physical unit, may be a part of one physical unit, and may be implemented by a combination of multiple physical units. In addition, in order to highlight the innovative part of the present invention, elements that are not so closely related to solving the technical problems proposed by the present invention are not introduced in the present embodiment, but this does not indicate that other elements are not present in the present embodiment.
A fourth embodiment of the present invention relates to an electronic apparatus, as shown in fig. 5, including: at least one processor 501; and a memory 502 communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the data acquisition method described above.
Where the memory and processor are connected by a bus, the bus may comprise any number of interconnected buses and bridges, the buses connecting together one or more of the various circuits of the processor and the memory. The bus may also connect various other circuits such as peripherals, voltage regulators, power management circuits, and the like, which are well known in the art, and therefore, will not be described any further herein. A bus interface provides an interface between the bus and the transceiver. The transceiver may be one element or a plurality of elements, such as a plurality of receivers and transmitters, providing a means for communicating with various other apparatus over a transmission medium. The data processed by the processor is transmitted over a wireless medium via an antenna, which further receives the data and transmits the data to the processor.
The processor is responsible for managing the bus and general processing and may also provide various functions including timing, peripheral interfaces, voltage regulation, power management, and other control functions. And the memory may be used to store data used by the processor in performing operations.
A fifth embodiment of the present invention relates to a computer-readable storage medium storing a computer program. The computer program realizes the above-described method embodiments when executed by a processor.
That is, as can be understood by those skilled in the art, all or part of the steps in the method for implementing the embodiments described above may be implemented by a program instructing related hardware, where the program is stored in a storage medium and includes several instructions to enable a device (which may be a single chip, a chip, or the like) or a processor (processor) to execute all or part of the steps of the method described in the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
It will be understood by those of ordinary skill in the art that the foregoing embodiments are specific examples for carrying out the invention, and that various changes in form and details may be made therein without departing from the spirit and scope of the invention in practice.

Claims (9)

1. A method of data acquisition, comprising:
acquiring parameters of a product according to the data acquisition plan information;
storing the parameters of the product in a classified manner according to key value combinations of key fields matched with the product batch information of the product to obtain parameters of various categories;
the key field key value combination is arranged in data acquisition plan information; the key field combination to which the key field key value combination belongs comprises: at least one CKC key; the CKC key is a field configured in the SPC system, and the CKC key has an incidence relation with a field in the product batch information in the MES system;
the classifying and storing of the parameters of the product according to the key field key value combination matched with the product batch information of the product specifically includes: acquiring the key field key value combination matched with the product batch information of the product according to the product batch information of the product; acquiring a sub-storage space according to the key field key value combination, wherein the sub-storage space is a space created in a total storage space, and the total storage space is a space for storing all the parameters acquired by the data acquisition plan information; and storing the parameters of the product into the sub-storage space.
2. The data collection method of claim 1, further comprising, after said obtaining parameters for a product according to data collection plan information:
if the key field key value combination fails to be matched with the product batch information of the product, determining a newly added key field key value combination according to the product batch information of the product and the value of each field matched with the key field combination;
newly adding a sub-storage space corresponding to the newly added key field key value combination in the total storage space;
and storing the parameters of the product into the newly added sub-storage space.
3. The data acquisition method according to claim 1, wherein the classifying and storing the parameters of the product according to the key value combination of the key fields matched with the product batch information of the product to obtain the parameters of each category, further comprises:
and if the key field key value combination fails to be matched with the product batch information of the product, storing the parameters of the product into a storage space except the sub-storage space in the total storage space.
4. The data acquisition method according to claim 2, wherein before the classifying and storing the parameters of the product according to the key value combination of the key fields matched with the product batch information of the product and obtaining the parameters of each category, the method further comprises:
acquiring the value of the CKC key in the key field combination input by a user;
acquiring the key field key value combination according to the key field combination and the value of the CKC key;
and creating the sub-storage space according to the key field key value combination.
5. The data acquisition method according to any one of claims 1 to 4, wherein the classifying and storing the parameters of the product according to the key field key value combination matched with the product batch information of the product to obtain the parameters of each category further comprises:
acquiring a viewing parameter category input by a user;
and displaying a control chart according to the viewing parameter category.
6. The data collection method of claim 5, wherein said viewing parameter categories comprises: a general view and a partial view; the displaying a control chart according to the viewing parameter category comprises:
if the viewed parameter type is the general graph, displaying a control graph according to the parameters of all types collected by the data acquisition plan information;
if the viewed parameter type is the sub-graph, displaying a control graph according to the parameters of the sub-graph; wherein the parameter of the sub-graph is a parameter of one of the parameters of each category.
7. A data acquisition device, comprising:
the parameter acquisition module is used for acquiring parameters of the product according to the data acquisition plan information;
the parameter classification module is used for classifying and storing the parameters of the product according to key field key value combinations matched with the product batch information of the product to obtain parameters of various categories; the key field key value combination is arranged in data acquisition plan information; the key field combination to which the key field key value combination belongs comprises: at least one CKC key; the CKC key is a field configured in the SPC system, and the CKC key has an incidence relation with a field in the product batch information in the MES system; the classifying and storing of the parameters of the product according to the key field key value combination matched with the product batch information of the product specifically includes: acquiring the key field key value combination matched with the product batch information of the product according to the product batch information of the product; acquiring a sub-storage space according to the key field key value combination, wherein the sub-storage space is a space created in a total storage space, and the total storage space is a space for storing all the parameters acquired by the data acquisition plan information; and storing the parameters of the product into the sub-storage space.
8. An electronic device, comprising:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform a data acquisition method as claimed in any one of claims 1 to 6.
9. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the data acquisition method of any one of claims 1 to 6.
CN202011549824.6A 2020-12-24 2020-12-24 Data acquisition method and device, electronic equipment and storage medium Active CN112596488B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011549824.6A CN112596488B (en) 2020-12-24 2020-12-24 Data acquisition method and device, electronic equipment and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011549824.6A CN112596488B (en) 2020-12-24 2020-12-24 Data acquisition method and device, electronic equipment and storage medium

Publications (2)

Publication Number Publication Date
CN112596488A CN112596488A (en) 2021-04-02
CN112596488B true CN112596488B (en) 2021-11-19

Family

ID=75200948

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011549824.6A Active CN112596488B (en) 2020-12-24 2020-12-24 Data acquisition method and device, electronic equipment and storage medium

Country Status (1)

Country Link
CN (1) CN112596488B (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103955546A (en) * 2014-05-22 2014-07-30 山东新华医疗器械股份有限公司 Configurable batch report generation method for film blowing machine
CN108701290A (en) * 2016-01-21 2018-10-23 斯堪的纳维亚微生物制剂公司 System and method for collecting food batch

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103955546A (en) * 2014-05-22 2014-07-30 山东新华医疗器械股份有限公司 Configurable batch report generation method for film blowing machine
CN108701290A (en) * 2016-01-21 2018-10-23 斯堪的纳维亚微生物制剂公司 System and method for collecting food batch

Also Published As

Publication number Publication date
CN112596488A (en) 2021-04-02

Similar Documents

Publication Publication Date Title
US11030167B2 (en) Systems and methods for providing data quality management
US8370181B2 (en) System and method for supply chain data mining and analysis
EP3493126A1 (en) Data analysis system and data analysis apparatus
CN105518654A (en) K-nearest neighbor-based method and system to provide multi-variate analysis on tool process data
US20020103620A1 (en) Apparatus management method, apparatus management system, and apparatus management program product
CN113313280A (en) Cloud platform inspection method, electronic equipment and nonvolatile storage medium
CN115408367A (en) Data testing method, storage medium and electronic device
CN111338869A (en) Configuration parameter management method, device, equipment and storage medium
CN114202256A (en) Architecture upgrading early warning method and device, intelligent terminal and readable storage medium
US11551169B2 (en) Industrial device matching method and apparatus
CN112596488B (en) Data acquisition method and device, electronic equipment and storage medium
CN112292644A (en) Constrained programming using block-based workflows
CN113887874A (en) Factory process capability index evaluation method, device, server and storage medium
CN113688116A (en) Data presentation system, method, device and computer readable storage medium
CN112668314A (en) Data standard conformance detection method, device, system and storage medium
CN112035286A (en) Method and device for determining fault cause, storage medium and electronic device
US11610273B2 (en) Enterprise-wide process stream analysis and grading engine with interactive user interface method, system, and computer program product
CN115496408A (en) Product quality control method and device, storage medium and electronic equipment
CN114745452A (en) Equipment management method and device and electronic equipment
CN114595216A (en) Data verification method and device, storage medium and electronic equipment
CN114330720A (en) Knowledge graph construction method and device for cloud computing and storage medium
CN112580997B (en) Data collection method and system, SPC system and computer storage medium
CN112612255B (en) Data acquisition method and device, electronic equipment and storage medium
US11132235B2 (en) Data processing method, distributed data processing system and storage medium
CN114564853B (en) Evaluation report generation method based on FMEA data and electronic equipment

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CB02 Change of applicant information

Address after: 201103 room 872, building 1, 1199 Wuzhong Road, Minhang District, Shanghai

Applicant after: Shanghai saimeite Software Technology Co.,Ltd.

Address before: 201103 room 872, building 1, 1199 Wuzhong Road, Minhang District, Shanghai

Applicant before: Temex software technology (Shanghai) Co.,Ltd.

CB02 Change of applicant information
GR01 Patent grant
GR01 Patent grant