CN112579371B - Testing method, testing device and testing system of storage device - Google Patents
Testing method, testing device and testing system of storage device Download PDFInfo
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Abstract
The application relates to the technical field of storage device testing, and discloses a testing method, a testing device and a testing system of a storage device. The method is used for testing a first storage device installed in a first electronic device by the first electronic device, and comprises the following steps: the method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the first operation data; during operation of the first storage device, the first storage device is tested. By the mode, the test effect on the storage device is improved.
Description
Technical Field
The present application relates to the field of storage device testing technologies, and in particular, to a storage device testing method, a storage device testing system, and a computer readable storage medium.
Background
With the continuous development and upgrade of the storage device, the types and models of the existing storage device are more and more rich. Such as a usb disk, a mechanical hard disk, a solid state hard disk, a memory bank, etc. Each type of storage device is used in a different electronic apparatus, and the storage device needs to be tested before the storage device is applied to the electronic apparatus, or the storage device is abnormal in use, and the storage device of the type needs to be tested.
The method has the defects that the mode of testing different storage devices in the related technology adopts specific virtual data for testing, and the test result cannot reflect the actual use scene of the storage device.
Disclosure of Invention
The application mainly solves the technical problem of providing a testing method, a testing device and a testing system for a storage device, and can improve the testing effect on the storage device.
The application adopts a technical scheme that a method for testing a storage device is provided, and is used for testing a first storage device installed in first electronic equipment by first electronic equipment, and the method comprises the following steps: the method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the first operation data; during operation of the first storage device, the first storage device is tested.
Wherein the method further comprises: acquiring behavior data of the second storage device running in the second electronic equipment; and analyzing the behavior data to obtain first operation data.
Analyzing the behavior data to obtain first operation data, wherein the analyzing includes: acquiring a command type of behavior data of a current line; classifying the behavior data of the current line based on the command type and storing the behavior data into a first analysis list; and resolving the first resolving list to generate first operation data.
The method for classifying the behavior data of the current line based on the command type and storing the behavior data into an analysis list comprises the following steps: if the command type is a current command, judging whether the behavior data of the current line exceeds a threshold value, and if so, storing the behavior data of the current line into an analysis list; or if the command type is a control command, storing the behavior data of the current row into a temporary list; or if the command type is a read-write data command, analyzing the behavior data of the current line, and storing the behavior data of the current line into a temporary list based on the command type of the behavior data of the previous line; and storing the behavior data in the temporary list into a first analysis list.
The method for storing the behavior data of the current line into the temporary list based on the command type of the behavior data of the previous line comprises the following steps: if the command type of the behavior data of the previous line is a read-write data command, merging the behavior data of the current line with the behavior data of the previous line; or if the command type of the behavior data of the previous line is a control command, storing the behavior data of the current line into a temporary list.
The parsing the first parsing list to generate first operation data includes: merging the behavior data in the first analysis list into a structural body; setting a delay type in the structure body to obtain a second analysis list; the second parse list is preprocessed to generate the first operation data.
The preprocessing of the second parsing list to generate first operation data includes: clearing the verification command in the second analysis list; deleting the repeated first control command in the second analysis list; adjusting parameters of a second control command in a second analysis list; and setting a combined mark for part of the behavior data in the second analysis list, and further generating first operation data.
Wherein operating the first storage device based on the first operation data includes: intercepting the first operation data to obtain second operation data; the first storage device is operated using the second operation data.
The method for intercepting the first operation data to obtain second operation data comprises the following steps: acquiring first behavior data corresponding to power-on and initialization from the first operation data; determining a starting position and an ending position of interception, and intercepting based on the starting position and the ending position to obtain second behavior data; the first behavior data and the second behavior data are formed into second operation data.
Determining a starting position and an ending position of interception, and intercepting based on the starting position and the ending position to obtain second behavior data, wherein the method comprises the following steps: judging whether the starting position is positioned between the first combined marks; if yes, taking the starting mark position of the first combined mark as a starting position; judging whether the end position is positioned between the second combined marks; if yes, the ending mark position of the second combined mark is taken as an ending position; and intercepting based on the starting position and the ending position to obtain second behavior data.
Wherein operating the first storage device based on the first operation data includes: playback is performed on the first storage device using the first operation data; during operation of the first storage device, testing the first storage device includes: acquiring a command type of behavior data of a current line in first operation data; if the command type is a delay command, delay processing is carried out according to the last execution data; or if the command type is a control command, determining the subtype of the control command, and if the subtype is a read command, checking the read command; if the subtype is a write command, performing write protection verification; if the subtype is a write protection command, recording a write protection state; if the subtype is an erase command, the erase state is recorded and the write state is removed.
Wherein the method further comprises: acquiring a first capacity of a first storage device and a second capacity of a second storage device; and if the first capacity is larger than the second capacity, performing repeated replay on the first storage device based on the first operation data until all address spaces of the first storage device are tested.
Another technical scheme adopted by the application is to provide a testing device of a storage device, which comprises a processor and a memory connected with the processor; the memory is used for storing program data, and the processor is used for executing the program data so as to realize the method provided by the technical scheme.
Another aspect of the present application is to provide a computer readable storage medium storing program data, which when executed by a processor, is configured to implement the method provided in the above aspect.
Another technical solution adopted by the present application is to provide a test system of a storage device, the test system comprising: the testing device is used for acquiring first operation data, operating the first storage device based on the first operation data and testing the first storage device in the operation process of the first storage device; the first operation data are acquired behavior data of the acquired storage device when the second storage device runs in the second electronic equipment.
Wherein the test system further comprises: the acquisition device is used for acquiring behavior data of the second storage device running in the second electronic equipment; the analysis device is used for acquiring the behavior data from the acquisition device and analyzing the behavior data to obtain first operation data.
The beneficial effects of the application are as follows: in contrast to the prior art, the method for testing a first storage device installed in a first electronic device according to the present application includes: the first electronic equipment acquires operation data; the operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the operation data; during operation of the first storage device, the first storage device is tested. By the mode, the storage device is tested by utilizing the behavior data of the real scene of the storage device, and the test effect on the storage device is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art. Wherein:
FIG. 1 is a flow chart of an embodiment of a method for testing a memory device according to the present application;
FIG. 2 is a schematic diagram of the composition of operation data in the test method of the memory device according to the present application;
FIG. 3 is a flowchart illustrating another embodiment of a method for testing a memory device according to the present application;
FIG. 4 is a schematic flow chart of step 34 in FIG. 3 according to the present application;
FIG. 5 is a schematic flow chart of step 343 in FIG. 4 according to the present application;
FIG. 6 is a flowchart illustrating another embodiment of a method for testing a memory device according to the present application;
FIG. 7 is a schematic flow chart of step 62 in FIG. 6 according to the present application;
FIG. 8 is a schematic flow chart of step 622 in FIG. 7 according to the present application;
FIG. 9 is a flowchart illustrating another embodiment of a method for testing a memory device according to the present application;
FIG. 10 is a schematic diagram of a testing device of a memory device according to an embodiment of the present application;
FIG. 11 is a schematic diagram illustrating the structure of an embodiment of a computer-readable storage medium provided by the present application;
FIG. 12 is a schematic diagram of a testing system of a memory device according to an embodiment of the present application;
FIG. 13 is a schematic diagram of another embodiment of a testing system for a memory device according to the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. It is to be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present application are shown in the drawings. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
Referring to fig. 1, fig. 1 is a flowchart illustrating an embodiment of a method for testing a memory device according to the present application. The method is used for testing a first storage device installed in a first electronic device by the first electronic device, and comprises the following steps:
Step 11: the method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the acquired storage device when the second storage device runs in the second electronic equipment.
In this embodiment, the first electronic device and the second electronic device may be the same electronic device or different electronic devices. The first storage device and the second storage device may be the same-sized storage device or may be different-sized devices. For example, the first storage device and the second storage device may be a RAM (Random-Access Memory), a ROM (Read-Only Memory), a mechanical hard disk, a solid state hard disk, a removable hard disk, CF (Compact Flash) cards, flash Memory cards, and a U disk. Accordingly, the electronic device can be any device which can be used for installing the storage device, such as a mobile phone, a computer, a wearable device, a camera, a monitoring device and the like.
The behavior Data of the storage device refers to all operation behaviors of the electronic apparatus on the storage device, such as CMD (Command Prompt), data, latency, power-up, power-down, and reset, and the like, which are behavior Data related to storage. The CMD is used to send command sequences and to determine the reply status. The role of Data is to determine the Data length that the tape Data command needs to operate on. The effect of latex is to record the time interval from the end of the last behavioural data to the start of the next behavioural data. VCC is used to record the course of the supply voltage of the circuit. VCCQ (signal line voltage) is used to record the change in signal line voltage. Reset is used for a Reset operation in the recording circuit.
In some embodiments, specifically, the first operation data may be configured as shown in fig. 2, and as shown in fig. 2, the previous 1,2, 3, and 4 indicate an execution sequence of the first operation data, where Latency1 indicates a delay time before CMD & RESP in the execution sequence of 1 is executed in the second storage device. Latency2 represents the Latency time before Data1 in the 2 execution order is executed in the second storage. Latex 3 represents the Latency time before CMD & RESP in 3 execution order is executed in the second storage device. Latency4 represents the Latency time before Data2 in the 4 execution order is executed in the second storage. As can be seen in FIG. 2, data follows CMD & RESP, and Data is only manipulated if there is a command or reply. It is to be understood that fig. 2 is merely illustrative of constituent elements of the first operation data, and is not limited to the specific configuration of the first operation data. The first operation data is obtained according to the behavior data of the storage device which is actually collected.
In some embodiments, the first operation data may be stored in the server after the collection is completed, and the first electronic device is downloaded from the server after being connected to the server.
In some embodiments, the first operation data may be stored in a designated storage device, such as a usb disk, after the collection is completed, and when the first electronic device is used, the first operation data is acquired from the usb disk after the first electronic device is connected to the usb disk.
It can be understood that the first operation data of a plurality of different storage devices can be stored in the server or the usb disk, so that the first electronic device can select the required target first operation data to test the first storage device arranged on the first electronic device. By the method, the storage device can be tested based on massive first operation data, the acquisition time of the first operation data is shortened, and the testing efficiency of the storage device is improved.
Step 12: the first storage device is operated based on the first operation data.
In this embodiment, the execution may be performed in the first storage device in the sequence of the data in the first operation data to cause the first storage device to replay the behavior data of the second storage device.
In some embodiments, a piece of the first operation data may be randomly acquired from the pair of first operation data as the data to be replayed in the first storage device.
Step 13: during operation of the first storage device, the first storage device is tested.
In the present embodiment, during the operation of the first storage device, the behavior data of the second storage device is played back based on the setting of the first storage device itself. If the behavior data of the second storage device is write data at the current replay moment, and the first storage device is set as write protection and does not allow data writing operation, after the behavior data is executed, confirming whether the first storage device writes data, if the writing is successful, indicating that the first storage device has defects, and taking the defects as test results; if the first storage device is not written in, the write protection function of the first storage device is normal, and the normal result is taken as a test result.
In some embodiments, the first storage device and the second storage device belong to the same specification and the same batch of products, and the behavior data of the second storage device can be replayed through the first storage device so as to reproduce the behavior data of the second storage device. If the second storage device fails in the operation process, the failure process of the second storage device can be reproduced by using the first storage device, the failure cause of the second storage device can be obtained based on the failure process, and the test result can be obtained based on the failure cause.
In some embodiments, the first storage device of the first electronic apparatus may be replaced to test more storage devices, while the transfer protocol of the replaced storage device may be different from the transfer protocol of the first storage device. A unified interface is encapsulated in the first electronic device for the first operational data, but multi-protocol compatibility is achieved.
In some embodiments, the method further adapts to different types of first electronic devices, and step 11 is performed after adapting the first electronic device. Specifically, through adapting to the bottom layer interface of the first electronic device, different functions can be dynamically called in a function pointer manner, so as to realize the support of the operation and protocol test of the first electronic device. If the read operation is performed, the adaptive interface provides the initial address and the data length, the first electronic device invokes its own read data interface, and the initial address and the data length provided by the adaptive interface are transmitted.
In this embodiment, first operation data is acquired by a first electronic device; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the first operation data; and in the operation process of the first storage device, testing the first storage device, and testing the storage device by utilizing the behavior data of the real scene of the storage device, so that the testing effect of the storage device is improved.
Referring to fig. 3, fig. 3 is a flowchart illustrating another embodiment of a testing method of a memory device according to the present application. The method comprises the following steps:
Step 31: behavior data of the second storage device running in the second electronic equipment is collected.
In this embodiment, the collection device is in communication connection with the second electronic device, and after the connection relationship is established, the behavior data of the second storage device running in the second electronic device and the behavior data of the second electronic device are collected. The behavior data of the second electronic device may be a protocol processing threshold and an exception handling manner of the second electronic device. For example, the transmission protocol between the second electronic device and the second storage device is eMMC (Embedded multimedia card) protocol. After the protocol analyzer is adapted to the eMMC protocol, the behaviors of the eMMC commands on the plurality of second electronic devices after timeout are captured, the behaviors are recorded in eMMC firmware, when the eMMC commands run on the second electronic devices, the firmware increases the command processing delay from low to high, and when any timeout behavior of the second electronic devices is detected, the delay value is considered to be the command timeout value of the second electronic devices. Therefore, after the eMMC command runs on the second electronic device, the timeout values of the plurality of common eMMC commands can be automatically detected, and the timeout values are recorded in the private data blocks of the eMMC.
The acquisition device can be a protocol analyzer or a logic analyzer.
Specifically, the acquisition device can be simultaneously connected with a plurality of second electronic devices in a communication way, and acquire behavior data of the operation of the second storage device in each second electronic device.
Step 32: the command type of the behavior data of the current line is acquired.
In this embodiment, the collecting device stores the collected behavior data in a text type, and uploads the collected behavior data to the analyzing device.
It is understood that the command types in the behavior data mainly include a current command, a control command, and a read/write data command. The current command includes power-on, power-off, etc. of the storage device. The control commands include various command indicators, such as cmd1 is a query storage ready command, cmd12 is a data termination operation command, cmd13 is a query status operation command, cmd18 is a read data operation command, and cmd23 is a set data length command. The read-write data command includes read data and write data.
Step 33: and classifying the behavior data of the current line based on the command type and storing the behavior data into a first analysis list.
In some embodiments, if the command type is a current command, it is determined whether the behavior data of the current line exceeds a threshold, and if so, the behavior data of the current line is saved in the parse list.
Specifically, during power-up of the second storage device, the corresponding voltage continuously rises, and when the voltage rises to the first threshold value, the second storage device is determined to be powered up. In this process, the second storage device has a plurality of corresponding current commands, and in the subsequent replay, only the device needs to be confirmed to be powered on, no other redundant current commands are needed, only the current command when the voltage rises to the threshold value is reserved, and the rest of commands before the voltage rises to the first threshold value are discarded. And in the power-down process of the second storage device, the corresponding voltage continuously drops, and when the voltage drops to a second threshold value, the power-down of the second storage device is determined. The second memory device has a plurality of corresponding current commands in the process, and when the second memory device is replayed later, the second memory device only needs to confirm that the device is powered down, and other redundant current commands are not needed, and only current commands when the voltage drops to the second threshold value are reserved, and the other commands in the process of dropping the voltage to the threshold value are discarded.
In some embodiments, if the command type is a control command, the behavior data of the current row is saved to a temporary list. The control command may be a CMD command or a RESPONSE command. In an application scene, if the command type is a control command, determining whether a temporary list exists, if the temporary list does not exist, creating the temporary list, analyzing structural bodies corresponding to CMD and RESPONSE, and storing the structural bodies in the temporary list. If the temporary list exists, confirming whether the CMD command is repeated when the CMD command is CMD1, and if so, replacing the current CMD1 with the CMD1 in the temporary list. If not, directly storing the data into a temporary list. It will be appreciated that since cmd1 is a command to query whether a storage device is ready, there are multiple cmd 1's to confirm whether the storage device is ready when the storage device is started, and only one command to confirm that the storage device is ready is needed when replayed, the command is the last cmd1 command, and the other redundant cmd 1's indicate that the storage device is not ready.
In some embodiments, if the command type is a read/write data command, the behavior data of the current row is parsed, and the behavior data of the current row is saved in the temporary list based on the command of the behavior data of the previous row. In an application scene, if the command type is a read-write data command, analyzing the behavior data of the current line into a data structure body, judging the command type of the behavior data of the previous line, and if the command type is the read-write data command, merging the behavior data of the current line and the behavior data of the previous line. If the command type of the behavior data of the previous line is a control command, storing the behavior data of the current line into a temporary list, wherein the behavior data of the current line is associated with the behavior data of the previous line. And storing the behavior data in the temporary list into a first analysis list.
It will be appreciated that if the behavior data of the previous row is a read/write data command, the description is integral with the behavior data of the current row.
Step 34: and resolving the first resolving list to generate first operation data.
In some embodiments, referring to fig. 4, the flow of step 34 may be specifically:
step 341: and merging the behavior data in the first analysis list into a structural body.
In this embodiment, the first analysis list includes a corresponding read/write data structure, CMD structure, and RESPONSE structure, and the three structures are combined into a structure of a predetermined format.
Step 342: and setting a delay type in the structure body to obtain a second analysis list.
The delay type corresponds to a specific delay time set to represent the execution time between each row of data.
In some examples, after the processing of the behavior data in the first parse list according to step 341 and step 342 is completed, a second parse list is obtained.
Step 343: the second parse list is preprocessed to generate the first operation data.
In this embodiment, the commands that are not useful for the repetition may be cleaned up or partially deleted.
Specifically, referring to fig. 5, the flow of step 343 may be:
step 3431: and clearing the check command in the second analysis list.
In this embodiment, the check command is a CRC (Cyclic Redundancy Check, cyclic redundancy check code) command for checking data. In the behavior data of the second storage means, a data check is required, but in the playback process, the check is meaningless, since the result of the check is already present in the behavior data, and the check command is therefore deleted.
Step 3432: and deleting the repeated first control command in the second analysis list.
In some embodiments, the first control command is cmd13, cmd13 being a query status operation command. Since there is only one result of the actual second storage device, the extra cmd13 can be deleted. The last occurring cmd13 is retained.
Step 3433: and adjusting parameters of a second control command in the second analysis list.
In this embodiment, the second control command includes cmd23.cmd23 is a set data length command. Typically with cmd12 and cmd 18. If the read data operation is under the control of the cmd18 command, but the read data operation has not been completed, cmd12 terminates the read data operation, and cmd23 will acquire the data length for the actual read data and set.
Step 3434: and setting a combined mark for part of the behavior data in the second analysis list, and further generating first operation data.
In this embodiment, if the behavior data that continuously appears is a cmd23, cmd18, cmd12 command, which is an integer, it is necessary to insert a start tag of the combination tag before the cmd23 command and insert an end tag of the combination tag after the cmd12 command. The timeliness of the sequence is improved when replaying. If the parsed device does not support multithreading, then the cmd12 commands need to be discarded and the parameters of the cmd18 or cmd23 commands adjusted. Thereby generating operation data.
In some embodiments, the above-mentioned steps 3431, 3432, 3433 and 3434 of clearing the check command in the second resolution list, deleting the first control command repeated in the second resolution list, adjusting the parameters of the second control command in the second resolution list and setting the combination flag on the second resolution list may be performed out of the order in the present embodiment.
In some embodiments, by converting the behavior data collected from the second storage device from the text type into the binary file in the above manner, the occupation of the storage space and the network transmission pressure can be reduced.
By the method, the acquired real behavior data of the storage device can be deleted, the behavior data which is actually executed successfully by the storage device is left, the behavior data is more true, and the test result can be improved when the behavior data is used for testing later.
Referring to fig. 6, fig. 6 is a flowchart illustrating another embodiment of a testing method of a memory device according to the present application. The method comprises the following steps:
Step 61: the method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the acquired storage device when the second storage device runs in the second electronic equipment.
In this embodiment, the behavior data of the collecting and storing device is the same or similar to the above embodiment, and will not be described herein.
Step 62: and intercepting the first operation data to obtain second operation data.
In some embodiments, the first operational data sets authentication information that needs to be verified, and step 62 may be performed after the verification is passed. By setting the verification information, the first operation data can be prevented from being tampered, and the data security is increased.
In this embodiment, when the first electronic device operates the first storage device later, it is not necessary to use all of the first operation data, and part of the first operation data may be acquired therefrom for operation.
Specifically, referring to fig. 7, the flow of step 62 may be:
step 621: first behavior data corresponding to power-up and initialization is obtained from the first operation data.
The first row of data that is powered up and initialized is related to the start-up and initial configuration of the first storage device, so this is the necessary data without which the first storage device cannot start up. The portion of the behavior data is typically located in the front of the entire first operation data.
Step 622: determining a starting position and an ending position of interception, and intercepting based on the starting position and the ending position to obtain second behavior data.
It will be appreciated that after the behavior data of the storage device is collected, it is ordered to obtain the first operation data. For example, each piece of behavior data in the first operation data is ordered according to the time series of execution, for example, 100 pieces of data in total, and then ordered according to the time series of execution from 1 to 100. And randomly determining that the starting position of interception is 10 and the ending position is 30, and intercepting second operation data corresponding to 10 th to 30 th operation data from the operation data.
In some embodiments, part of the behavior data in the first operation data is marked in a combination to form a combination, and when the behavior data of the combination is randomly intercepted, the whole combination needs to be intercepted. Specifically, referring to fig. 8, the flow of step 622 may be:
step 6221: it is determined whether the start position is located between the first combination marks.
If the starting position is not located between the first combined marks, the piece of behavior data is taken as the starting position. If the start position is located between the first combined marks, step 6222 is performed because the data of the first combined mark is a complete execution logic and cannot be split.
Step 6222: the start mark position of the first combination mark is taken as a start position.
For example, taking 100 pieces of behavior data as the first operation data as an example, the first combined mark marks 20 pieces of behavior data-40 pieces of behavior data, where 20 pieces of behavior data are start mark positions and 40 pieces of behavior data are end mark positions. When the starting position of the interception is the 30 th piece of behavior data, the 30 th piece of behavior data is positioned between the first combined marks, and the 20 th piece of behavior data is taken as the starting position.
Step 6223: it is determined whether the end position is located between the second combined marks.
If the end position is not located between the second combined marks, the piece of behavior data is taken as the end position. If the end position is located between the second combined marks, step 6224 is performed because the data of the second combined mark is a complete execution logic and cannot be split.
Step 6224: and taking the end mark position of the second combined mark as an end position.
For example, taking 100 pieces of behavior data as an example of the first operation data, the second combined mark marks the 50 th piece of behavior data-the 70 th piece of behavior data, wherein the 50 th piece of behavior data is a start mark position, and the 70 th piece of behavior data is an end mark position. When the ending position of the interception is the 60 th piece of behavior data, the 60 th piece of behavior data is positioned between the second combined marks, and the 50 th piece of behavior data is taken as the ending position.
In some embodiments, the first combined mark and the second combined mark may be the same combined mark. For example, 200 pieces of behavior data are taken as an example of the operation data, and the 20 th piece of behavior data-150 th piece of behavior data are marked by the combined mark. If the starting position of the interception is randomly determined to be 10 and the ending position is determined to be 30, the 10 th piece of behavior data is taken as the starting position and the 150 th piece of behavior data is taken as the ending position at the moment. If the starting position of the interception is determined to be 50 and the ending position is determined to be 100 at random, the 20 th piece of behavior data is taken as the starting position and the 150 th piece of behavior data is taken as the ending position at the moment. If the starting position of the interception is determined to be 50 and the ending position is determined to be 170 at random, the 20 th piece of behavior data is taken as the starting position and the 170 th piece of behavior data is taken as the ending position at the moment.
Step 6225: and intercepting based on the starting position and the ending position to obtain second behavior data.
Step 623: the first behavior data and the second behavior data are formed into second operation data.
And combining the first behavior data and the second behavior data to form second operation data for operating the first storage device at this time.
Step 63: the first storage device is operated using the second operation data.
In this embodiment, the first storage device is powered on and configured initially by using the first behavior data, and then the first storage device is caused to replay the second behavior data.
Step 64: during operation of the first storage device, the first storage device is tested.
By the method, part of behavior operation data in the first operation data can be randomly intercepted to serve as the second operation data, the first storage device is tested based on the second operation data, the tested data size is reduced, and the testing efficiency is improved.
Referring to fig. 9, fig. 9 is a flowchart illustrating another embodiment of a testing method of a memory device according to the present application. The method comprises the following steps:
Step 91: the method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the acquired storage device when the second storage device runs in the second electronic equipment.
In this embodiment, the behavior data of the collecting and storing device is the same or similar to the above embodiment, and will not be described herein.
Step 92: playback is performed on the first storage device using the first operation data.
In this embodiment, if the capacity of the second storage device generating the first operation data is an integer multiple of less than the capacity of the first storage device, an address amplification function may be set, and when the current multiple is less than the address amplification multiple, the first operation data is replayed in the first storage device again to test each address space of the first storage device. If the capacity of the second storage device is 32GB and the capacity of the first storage device is 64GB, the capacities of the first storage device and the second storage device are compared when the first electronic device acquires the operation data, and if the capacity of the first storage device is larger than the second storage device, the address amplification function is turned on. The address amplification function may be set when the first electronic device acquires the first operation data.
It will be appreciated that the capacity of the current storage devices is a multiple of the capacity of one storage device, e.g., 8GB, 16GB, 32GB, 64GB, 128GB, 256GB, 512GB, and 1TB, if one storage device is larger than the other storage device, then the capacity must be an integer multiple of the capacity of the other storage device.
Step 93: and acquiring the command type of the behavior data of the current line in the first operation data.
Step 94: the first storage device is tested based on the command type.
In this embodiment, if the command type is a delay command, delay processing is performed according to the behavior data of the previous line, for example, delay correction is performed. If the command type is a control command, determining the subtype of the control command, and if the subtype is a read command, performing read data verification. If the subtype is a write command, write protection verification is performed. If the subtype is a set write protection command, the write protection state is recorded. If the subtype is an erase command, the erase state is recorded and the write state is removed.
Specifically, the above operations are performed to verify the correctness of the read-write-erase data. And in the writing operation, generating data according to the address and the address writing times, writing and marking the address as writing. The erase operation erases the address data and marks the status as erased. And in the reading operation, if the address is in an erasing state, the data are all 0 and pass the checking, if the address is in a writing state, the data are generated according to the address and the writing times and are compared with the read data, and if the address is consistent with the writing times, the data pass the reading checking. Write protection verification supports verifying whether write protection is valid. If the address is set with write protection, the address data is read and stored before writing, and the address data is read again after the writing operation is executed, and the two data are consistent and pass the verification. In this way, the first storage device is tested with the operation data to test the compatibility of the first storage device based on the real behavior data of the storage device and the behavior data of the electronic apparatus.
In some embodiments, when the behavior data of the storage device is collected, the performance data of the electronic device corresponding to the storage device can be obtained at the same time, when the performance data of the electronic device where the storage device is currently replayed is obtained, and the performance data of the electronic device where the storage device is currently replayed are compared, so that the performance between different electronic devices can be verified, and the performance card is realized. For example, the two storage devices belong to the same type of storage device, and are installed in different electronic devices, for example, the second electronic device is a mobile phone, the first electronic device is a wearable device, and behavior data of the second electronic device and behavior data of the storage device disposed in the second electronic device, and performance data of the second electronic device are acquired from the second electronic device. And then, playing back the behavior data of the storage device in the second electronic equipment in the storage device of the first electronic equipment so as to acquire the performance data of the first electronic equipment, and testing the performance of the storage device in different electronic equipment if the storage devices of the first electronic equipment and the second electronic equipment are in the same specification. In this way, the first storage device is tested with the operation data to test the compatibility of the first storage device based on the real behavior data of the storage device and the behavior data of the electronic apparatus.
Referring to fig. 10, fig. 10 is a schematic structural diagram of a testing device of a memory device according to an embodiment of the application. The test apparatus 100 includes a processor 101 and a memory 102 connected to the processor 101; the memory 102 is configured to store program data, and the processor 101 is configured to execute the program data to implement the following method:
The method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the first operation data; during operation of the first storage device, the first storage device is tested.
It will be appreciated that the processor 101 in this embodiment may also implement any of the methods in the foregoing embodiments, which will not be described herein.
Referring to fig. 11, fig. 11 is a schematic structural diagram of an embodiment of a computer readable storage medium according to the present application. The computer readable storage medium 110 is for storing program data 111, which program data 111, when executed by a processor, is for implementing the method of:
The method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the first operation data; during operation of the first storage device, the first storage device is tested.
It will be appreciated that the computer readable storage medium 110 in this embodiment may also implement any of the methods of the above embodiments, and will not be described here again.
Referring to fig. 12, fig. 12 is a schematic structural diagram of a testing system of a memory device according to an embodiment of the application. The test system 120 comprises a test device 121. The testing device 121 is configured to obtain first operation data, operate the first storage device based on the first operation data, and test the first storage device during operation of the first storage device; the first operation data are acquired behavior data of the acquired storage device when the second storage device runs in the second electronic equipment.
In other embodiments, the testing device 121 may also test multiple storage devices simultaneously, where each storage device may be a different data transfer protocol. The testing device may adapt each data transfer protocol to enable simultaneous testing of multiple storage devices.
In some embodiments, the first storage device of the test device 121 may be replaced to test more storage devices, while the transport protocol of the replaced storage device may be different from the transport protocol of the first storage device. A unified interface is encapsulated in the test device 121 for the first operational data, however, multiprotocol compatibility is achieved.
In some embodiments, the different types of test devices 121 are also adapted for the different types of test devices 121, and after the test devices 121 are adapted, testing of the storage devices is performed. Specifically, by adapting to the underlying interface of the test device 121, different functions may be dynamically invoked, such as by way of function pointers, to enable support of test device 121 operation and protocol testing. For example, in a read operation, the adaptation interface provides the start address and the data length, and the test device 121 invokes its own read data interface and passes the start address and the data length provided by the adaptation interface.
Referring to fig. 13, the test system 120 further includes an acquisition device 122 and an analysis device 123. Wherein the acquisition device 122 is used for acquiring behavior data of the second storage device running in the second electronic device. The analyzing device 123 is configured to obtain the behavior data from the collecting device 122, and analyze the behavior data to obtain the operation data.
The collection device 122 is further configured to collect the protocol processing threshold and the exception handling mode of the second electronic device when the second storage device is configured to collect the behavior data of the second electronic device, and store all the processed data in the form of a structure.
The collection device 122 is configured to adapt to various transmission protocols, such as Emmc, UFS (UNIX file system), SCSI (Small Computer SYSTEM INTERFACE), PCIE (PERIPHERAL COMPONENT INTERCONNECT EXPRESS, high-speed serial Computer expansion bus standard), and the like. When the system is connected with the second electronic equipment, the transmission protocol of the storage device in the second electronic equipment is adapted, and then the behavior data of the storage device are collected.
The parsing device 123 is further configured to obtain a command type of behavior data of a current line; classifying the behavior data of the current line based on the command type and storing the behavior data into a first analysis list; and resolving the first resolving list to generate first operation data.
The parsing device 123 is further configured to determine whether the behavior data of the current line exceeds a threshold if the command type is a current command, and if yes, save the behavior data of the current line to a parse list; or if the command type is a control command, storing the behavior data of the current row into a temporary list; or if the command type is a read-write data command, analyzing the behavior data of the current line, and storing the behavior data of the current line into a temporary list based on the command type of the behavior data of the previous line; and storing the behavior data in the temporary list into a first analysis list.
The parsing device 123 is further configured to combine the behavior data of the current line with the behavior data of the previous line if the command type of the behavior data of the previous line is a read/write data command; or if the command type of the behavior data of the previous line is a control command, storing the behavior data of the current line into a temporary list.
The parsing means 123 is further configured to merge the behavior data in the first parse list into a structure; setting a delay type in the structure body to obtain a second analysis list; the second parse list is preprocessed to generate the first operation data.
The parsing device 123 is further configured to clear the check command in the second parse list; deleting the repeated first control command in the second analysis list; adjusting parameters of a second control command in a second analysis list; and setting a combined mark for part of the behavior data in the second analysis list, and further generating first operation data.
The testing device 121 is further configured to intercept the first operation data to obtain second operation data; the first storage device is operated using the second operation data.
The testing device 121 is further configured to obtain first behavior data corresponding to power-up and initialization from the first operation data; determining a starting position and an ending position of interception, and intercepting based on the starting position and the ending position to obtain second behavior data; the first behavior data and the second behavior data are formed into second operation data.
The testing device 121 is further configured to determine whether the start position is located between the first combined marks; if yes, taking the starting mark position of the first combined mark as a starting position; judging whether the end position is positioned between the second combined marks; if yes, the ending mark position of the second combined mark is taken as an ending position; and intercepting based on the starting position and the ending position to obtain second behavior data.
The test device 121 is further configured to replay at the first storage device using the first operation data; during operation of the first storage device, testing the first storage device includes: acquiring a command type of behavior data of a current line in first operation data; if the command type is a delay command, delay processing is carried out according to the last execution data; or if the command type is a control command, determining the subtype of the control command, and if the subtype is a read command, checking the read command; if the subtype is a write command, performing write protection verification; if the subtype is a write protection command, recording a write protection state; if the subtype is an erase command, the erase state is recorded and the write state is removed.
The testing device 121 is further configured to obtain a first capacity of the first storage device and a second capacity of the second storage device; and if the first capacity is larger than the second capacity, performing repeated replay on the first storage device based on the first operation data until all address spaces of the first storage device are tested.
In this embodiment, operation data is acquired by a first electronic device; the operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment; operating the first storage device based on the operation data; in the operation process of the first storage device, the first storage device is tested by using the behavior data of the real scene of the storage device, so that the test effect of the storage device is improved. The performance card of the real behaviors of the electronic devices can be realized, so that one-time operation testing of different electronic devices is possible; and the unified data management scheme greatly facilitates the analysis and the solution of the problems.
In the several embodiments provided in the present application, it should be understood that the disclosed method and apparatus may be implemented in other manners. For example, the above-described device embodiments are merely illustrative, e.g., the division of the above modules or units is merely a logical functional division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed.
The units described above as separate components may or may not be physically separate, and components shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units of the other embodiments described above may be stored in a computer readable storage medium if implemented in the form of software functional units and sold or used as stand alone products. Based on such understanding, the technical solution of the present application may be embodied in essence or a part contributing to the prior art or all or part of the technical solution in the form of a software product stored in a storage medium, including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) or a processor (processor) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing description is only of embodiments of the present application, and is not intended to limit the scope of the application, and all equivalent structures or equivalent processes using the descriptions and the drawings of the present application or directly or indirectly applied to other related technical fields are included in the scope of the present application.
Claims (18)
1. A method for testing a storage device, the method for testing a first storage device installed in a first electronic device by the first electronic device, the method comprising:
The method comprises the steps that first electronic equipment obtains first operation data; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment;
operating the first storage device based on the first operation data;
testing the first storage device during operation of the first storage device;
wherein the method further comprises:
acquiring behavior data of the second storage device running in the second electronic equipment;
acquiring a command type of behavior data of a current line;
If the command type is a current command, judging whether the behavior data of the current line exceeds a threshold value, and if so, storing the behavior data of the current line into a first analysis list; or if the command type is a control command, storing the behavior data of the current line into a temporary list; or if the command type is a read-write data command, analyzing the behavior data of the current line, and storing the behavior data of the current line into the temporary list based on the command type of the behavior data of the previous line;
Storing the behavior data in the temporary list into a first analysis list;
merging the behavior data in the first analysis list into a structural body;
Setting a delay type in the structure body to obtain a second analysis list;
And preprocessing the second parsing list to generate the first operation data.
2. The method of claim 1, wherein the step of determining the position of the substrate comprises,
The command type based on the behavior data of the previous line stores the behavior data of the current line into the temporary list, including:
if the command type of the behavior data of the previous line is the read-write data command, merging the behavior data of the current line with the behavior data of the previous line; or alternatively, the first and second heat exchangers may be,
And if the command type of the behavior data of the previous line is the control command, storing the behavior data of the current line into the temporary list.
3. The method of claim 1, wherein the step of determining the position of the substrate comprises,
The preprocessing the second parsing list to generate the first operation data includes:
Clearing the verification command in the second analysis list;
Deleting the repeated first control command in the second analysis list;
adjusting parameters of a second control command in the second analysis list;
and setting a combined mark for part of the behavior data in the second analysis list, so as to generate the first operation data.
4. The method of claim 1, wherein the step of determining the position of the substrate comprises,
The operating the first storage device based on the first operation data includes:
intercepting the first operation data to obtain second operation data;
and operating the first storage device by using the second operation data.
5. The method of claim 4, wherein the step of determining the position of the first electrode is performed,
The intercepting the first operation data to obtain second operation data includes:
acquiring first behavior data corresponding to power-on and initialization from the first operation data;
Determining a starting position and an ending position of interception, and intercepting based on the starting position and the ending position to obtain second behavior data;
And forming the first behavior data and the second behavior data into the second operation data.
6. The method of claim 5, wherein the step of determining the position of the probe is performed,
The determining a starting position and an ending position of the interception, and intercepting based on the starting position and the ending position to obtain second behavior data, including:
judging whether the starting position is positioned between the first combined marks;
if yes, taking the starting mark position of the first combined mark as the starting position;
and determining whether the end position is located between the second combined marks;
if yes, taking the end mark position of the second combined mark as the end position;
and intercepting based on the starting position and the ending position to obtain second behavior data.
7. The method of claim 1, wherein the step of determining the position of the substrate comprises,
The operating the first storage device based on the first operation data includes:
Reproducing at the first storage device using the first operation data;
The testing the first storage device during the operation of the first storage device includes:
acquiring a command type of behavior data of a current line in the first operation data;
if the command type is a delay command, delay processing is carried out according to the last execution data;
Or if the command type is a control command, determining the subtype of the control command, and if the subtype is a read command, performing read data verification; if the subtype is a write command, performing write protection verification; if the subtype is a write protection command, recording a write protection state; and if the subtype is an erasure command, recording an erasure state and removing a writing state.
8. The method of claim 7, wherein the step of determining the position of the probe is performed,
The method further comprises the steps of:
acquiring a first capacity of the first storage device and a second capacity of the second storage device;
And if the first capacity is larger than the second capacity, performing repeated replay on the first storage device based on the first operation data until all address spaces of the first storage device are tested.
9. A testing device for a memory device, the testing device comprising a processor and a memory coupled to the processor;
Wherein the memory is for storing program data and the processor is for executing the program data to implement the method of any of claims 1-8.
10. A computer readable storage medium for storing program data which, when executed by a processor, is adapted to carry out the method of any one of claims 1-8.
11. A test system for a storage device, the test system comprising:
The testing device is used for acquiring first operation data, operating the first storage device based on the first operation data and testing the first storage device in the operation process of the first storage device; the first operation data are acquired behavior data of the storage device when the second storage device runs in the second electronic equipment;
the acquisition device is used for acquiring behavior data of the second storage device running in the second electronic equipment;
the analyzing device is used for acquiring the command type of the behavior data of the current line;
If the command type is a current command, judging whether the behavior data of the current line exceeds a threshold value, and if so, storing the behavior data of the current line into a first analysis list;
Or if the command type is a control command, storing the behavior data of the current line into a temporary list; or if the command type is a read-write data command, analyzing the behavior data of the current line, and storing the behavior data of the current line into the temporary list based on the command type of the behavior data of the previous line;
storing the behavior data in the temporary list into the first analysis list;
merging the behavior data in the first analysis list into a structural body;
Setting a delay type in the structure body to obtain a second analysis list;
And preprocessing the second parsing list to generate the first operation data.
12. The test system of claim 11, wherein the test system comprises a plurality of test cells,
The analyzing device is further configured to combine the behavior data of the current line with the behavior data of the previous line if the command type of the behavior data of the previous line is the read-write data command; or if the command type of the behavior data of the previous line is the control command, storing the behavior data of the current line into the temporary list.
13. The test system of claim 11, wherein the test system comprises a plurality of test cells,
The analysis device is further used for cleaning the verification command in the second analysis list; deleting the repeated first control command in the second analysis list; adjusting parameters of a second control command in the second analysis list; and setting a combined mark for part of the behavior data in the second analysis list, so as to generate the first operation data.
14. The test system of claim 11, wherein the test system comprises a plurality of test cells,
The testing device is also used for intercepting the first operation data to obtain second operation data; and operating the first storage device by using the second operation data.
15. The test system of claim 14, wherein the test device is further configured to obtain first behavior data corresponding to power-up and initialization from the first operational data; determining a starting position and an ending position of interception, and intercepting based on the starting position and the ending position to obtain second behavior data; and forming the first behavior data and the second behavior data into the second operation data.
16. The test system of claim 15, wherein the test device is further configured to determine whether the start position is located between a first combination of markers; if yes, taking the starting mark position of the first combined mark as the starting position; and determining whether the end position is located between the second combined marks; if yes, taking the end mark position of the second combined mark as the end position; and intercepting based on the starting position and the ending position to obtain second behavior data.
17. The test system of claim 11, wherein the test device is further configured to replay at the first storage device using the first operational data; acquiring a command type of behavior data of a current line in the first operation data; if the command type is a delay command, delay processing is carried out according to the last execution data; or if the command type is a control command, determining the subtype of the control command, and if the subtype is a read command, performing read data verification; if the subtype is a write command, performing write protection verification; if the subtype is a write protection command, recording a write protection state; and if the subtype is an erasure command, recording an erasure state and removing a writing state.
18. The test system of claim 17, wherein the test device is further configured to obtain a first capacity of the first storage device and a second capacity of the second storage device; and if the first capacity is larger than the second capacity, performing repeated replay on the first storage device based on the first operation data until all address spaces of the first storage device are tested.
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