CN112578214B - Power amplifier test method, device and system and electronic equipment - Google Patents
Power amplifier test method, device and system and electronic equipment Download PDFInfo
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Abstract
The present disclosure relates to the field of test technologies, and in particular, to a method, an apparatus, a system, an electronic device, and a storage medium for testing a power amplifier, where the method for testing a power amplifier includes: providing an initial input signal and an initial power supply signal to a power amplifier; acquiring the adjacent channel leakage ratio of the power amplifier; when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold value, adjusting the voltage of a power supply signal by a preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold value, and determining that the current power supply signal is a target power supply signal; acquiring the output power of a power amplifier under the drive of a target power supply; and when the output power of the power amplifier is smaller than the target power value, adjusting the power of the input signal by a preset power step length until the output power of the power amplifier is larger than or equal to the target power threshold, and determining that the current input signal is the target input signal. The power amplifier can be tested.
Description
Technical Field
The present disclosure relates to the field of test technologies, and in particular, to a method, an apparatus, a system, an electronic device, and a storage medium for testing a power amplifier.
Background
Power amplifiers are widely used in wireless communication electronic devices such as mobile phones, for example, radio frequency circuits or audio circuits of electronic devices are provided with a plurality of power amplifiers. Before the power amplifier is installed on a corresponding circuit of an electronic device, parameters such as power consumption of the power amplifier are often required to be measured, and thus a method and an apparatus for testing the power amplifier are urgently needed.
It is to be noted that the information disclosed in the above background section is only for enhancement of understanding of the background of the present disclosure, and thus may include information that does not constitute prior art known to those of ordinary skill in the art.
Disclosure of Invention
The present disclosure is directed to a method, an apparatus, a system, an electronic device, and a storage medium for testing a power amplifier, which are capable of testing power consumption of the power amplifier.
According to a first aspect of the present disclosure, there is provided a test method of a power amplifier, the test method comprising:
providing an initial input signal and an initial power supply signal to a power amplifier;
acquiring the adjacent channel leakage ratio of the power amplifier;
when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold value, adjusting the voltage of a power supply signal by a preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold value, and determining that the current power supply signal is a target power supply signal;
acquiring the power of a power amplifier under the drive of a target power supply signal;
and when the power of the power amplifier is smaller than a target power value, adjusting the power of the input signal by a preset power step length until the power of the power amplifier is larger than or equal to the target power threshold value, and determining that the current input signal is the target input signal.
According to a second aspect of the present disclosure, there is provided a power amplifier testing apparatus comprising:
the control module is used for providing an initial input signal and an initial power supply signal for the power amplifier;
the first acquisition module is used for acquiring the adjacent channel leakage ratio of the power amplifier;
a first determining module, configured to adjust a power supply signal voltage by a preset voltage step length when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, and determine that a current power supply signal is a target power supply signal when the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold;
the second acquisition module is used for acquiring the power of the power amplifier under the driving of a target power supply signal;
and the second determining module is used for adjusting the power of the input signal by a preset power step length when the power of the power amplifier is smaller than the target power value, and determining that the current input signal is the target input signal when the power of the power amplifier is larger than or equal to the target power threshold.
According to a third aspect of the present disclosure, there is provided an electronic device comprising
A processor; and
a memory having computer readable instructions stored thereon which, when executed by the processor, implement a method according to any of the above.
According to a fourth aspect of the present disclosure, there is provided a power amplifier test system comprising:
the electronic device described above;
the test board is connected with the electronic equipment and is used for connecting a power amplifier;
the signal generator is connected with the electronic equipment and the input end of the test board and is used for providing input signals under the control of the electronic equipment;
the signal analyzer is connected with the electronic equipment and the output end of the test board, and is used for analyzing the output signal of the power amplifier and feeding the output signal back to the electronic equipment;
and the power supply is connected with the electronic equipment and the test board and is used for providing a power supply signal for the power amplifier under the control of the electronic equipment.
According to a fifth aspect of the present disclosure, there is provided a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a method according to any one of the above.
According to the testing method of the power amplifier provided by the embodiment of the disclosure, when the adjacent channel leakage ratio is smaller than the preset leakage ratio threshold, the voltage of the power supply signal is adjusted by the preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, the current power supply signal is determined to be the target power supply signal, when the power of the power amplifier is smaller than the target power value, the power of the input signal is adjusted by the preset power step length until the power of the power amplifier is larger than or equal to the target power threshold, the current input signal is determined to be the target input signal, so that the target power supply signal and the target input signal corresponding to the target power can be determined, and a plurality of target powers are traversed, so that the target power supply signal and the target input signal corresponding to each target power can be determined, that is to ensure the linearity of the output signal of the power amplifier by adjusting the voltage of the power supply signal of the power amplifier, the power of the input signal is adjusted to control the power consumption of the power amplifier at different target powers (output powers), and the optimal power consumption of the power amplifier is determined, so as to guide the application of the power amplifier in the electronic device.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The above and other features and advantages of the present disclosure will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings.
Fig. 1 is a schematic block diagram of a power amplifier test system provided in an exemplary embodiment of the present disclosure;
fig. 2 is a flowchart of a second power amplifier testing method provided in an exemplary embodiment of the present disclosure;
fig. 3 is a flowchart of a second power amplifier testing method provided in an exemplary embodiment of the present disclosure;
fig. 4 is a flowchart of a third power amplifier testing method provided by an exemplary embodiment of the present disclosure;
fig. 5 is a block diagram of a power amplifier testing apparatus provided in an exemplary embodiment of the present disclosure;
fig. 6 is a block diagram of an electronic device provided by an exemplary embodiment of the present disclosure;
fig. 7 is a schematic diagram of a computer-readable storage medium provided in an exemplary embodiment of the present disclosure.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals denote the same or similar parts in the drawings, and thus, a repetitive description thereof will be omitted.
Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the disclosure. One skilled in the relevant art will recognize, however, that the embodiments of the disclosure can be practiced without one or more of the specific details, or with other methods, components, materials, devices, steps, and so forth. In other instances, well-known structures, methods, devices, implementations, materials, or operations are not shown or described in detail to avoid obscuring aspects of the disclosure.
The block diagrams shown in the figures are functional entities only and do not necessarily correspond to physically separate entities. That is, these functional entities may be implemented in the form of software, or in one or more software-hardened modules, or in different networks and/or processor devices and/or microcontroller devices.
An exemplary embodiment of the present disclosure first provides a power amplifier test system, as shown in fig. 1, the power amplifier test system including: electronic device 110 (host computer), test board 150, signal generator 140, signal analyzer 160, power supply 130, and mode control board 120. The test board 150 is connected to the electronic device 110 for connection to a power amplifier. The signal generator 140 is connected to the electronic device 110 and the input terminal of the test board 150 for providing an input signal under the control of the electronic device 110. The signal analyzer 160 is connected to the output terminals of the electronic device 110 and the test board 150, and is configured to analyze the output signal of the power amplifier and feed back the analyzed output signal to the electronic device 110. The power supply 130 is connected to the electronic device 110 and the test board 150 for providing a power supply signal to the power amplifier under the control of the electronic device 110. The mode control board 120 is connected to the electronic device 110 and the test board 150 for selecting a gain mode of the power amplifier under the control of the electronic device 110.
The test Board 150 may be an EVB Board (development Board), and a power amplifier test site for mounting a power amplifier may be disposed on the EVB Board 150. And multiple interfaces may be provided on the EVB board. Such as a signal source interface, a control signal interface, a power interface, an output interface, etc. The signal source interface is used to connect to the signal generator 140 to receive the input signal. The control interface is connected to the mode control board 120 to receive the mode selection signal. The power interface may be coupled to a power source 130 for receiving a power signal. The output interface may be connected to a signal analyzer 160 to output an output signal.
The electronic device 110 may be a computer, such as a personal computer, a server, a tablet computer, or a notebook computer. The mode control board 120 may be a MIPI control board, which may be connected to a computer through a USB interface and connected to the EVB board through a MIPI control line. The electronic device 110 may communicate with the signal generator 140, the signal analyzer 160, and the power supply 130 via a General Purpose Interface Bus (GPIB).
The exemplary embodiment of the present disclosure also provides a method for testing a power amplifier, as shown in fig. 2, the method for testing a power amplifier may include the following steps:
step S210, providing an initial input signal and an initial power supply signal to a power amplifier;
step S220, obtaining the adjacent channel leakage ratio of the power amplifier;
step S230, when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, adjusting the voltage of the power supply signal by a preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, and determining that the current power supply signal is a target power supply signal;
step S240, acquiring the output power of the power amplifier under the driving of a target power supply signal;
step S250, when the output power of the power amplifier is smaller than the target power value, adjusting the power of the input signal by a preset power step length until the output power of the power amplifier is greater than or equal to the target power threshold, and determining that the current input signal is the target input signal.
According to the testing method of the power amplifier provided by the embodiment of the disclosure, when the adjacent channel leakage ratio is smaller than the preset leakage ratio threshold, the voltage of the power supply signal is adjusted by the preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, the current power supply signal is determined to be the target power supply signal, when the power of the power amplifier is smaller than the target power value, the power of the input signal is adjusted by the preset power step length until the power of the power amplifier is larger than or equal to the target power threshold, the current input signal is determined to be the target input signal, so that the target power supply signal and the target input signal corresponding to the target power can be determined, and a plurality of target powers are traversed, so that the target power supply signal and the target input signal corresponding to each target power can be determined, that is to ensure the linearity of the output signal of the power amplifier by adjusting the voltage of the power supply signal of the power amplifier, the power of the input signal is adjusted to control the power consumption of the power amplifier at different target powers (output powers), and the optimal power consumption of the power amplifier is determined, so as to guide the application of the power amplifier in the electronic device.
Further, as shown in fig. 3, the method for testing a power amplifier provided in the embodiment of the present disclosure may further include:
step S310, sending a mode selection signal to the power amplifier to control the power amplifier to select an operating mode.
Step S320, determining power consumption of the power amplifier driven by the target power signal and the target input signal.
As shown in fig. 4, the method for testing a power amplifier provided in the embodiment of the present disclosure may further include:
step S410, when the adjacent channel leakage ratio is greater than or equal to a preset leakage ratio threshold, determining that the initial power signal is a target power signal.
Step S420, when the power of the power amplifier is greater than or equal to a target power value, determining that the initial input signal is a target input signal.
The following describes the steps of the method for testing a power amplifier provided in the embodiment of the present disclosure in detail:
the testing method of the power amplifier provided by the embodiment of the disclosure can be executed in a processor of an electronic device.
In step S310, a mode selection signal may be transmitted to the power amplifier to control the power amplifier to select an operating mode.
The power amplifier can have a plurality of gain modes, and the power amplifier can be controlled to operate in a corresponding operating mode by a mode selection signal when the power amplifier is tested. When testing, each working mode of the power amplifier needs to be traversed, and when testing is started, any gain mode is selected to start testing. And when the test of the power amplifier does not traverse each gain mode, switching the gain mode of the power amplifier after the test of the last gain mode is finished.
For example, when the power amplifier has a first gain operating mode and a second gain operating mode, transmitting the mode selection signal to the power amplifier may include: sending a first mode selection signal to the power amplifier to cause the power amplifier to operate in a first gain mode; and sending a second mode selection signal to the power amplifier to enable the power amplifier to work in a second gain mode, wherein the gain of the first gain mode is larger than that of the second gain mode.
In step S210, an initial input signal and an initial power supply signal may be provided to the power amplifier.
Wherein providing the input signal and the power supply signal to the power amplifier may be accomplished by the electronic device outputting the first control signal and the second control signal. The electronic device outputs a first control signal to the signal generator, which outputs an initial input signal in response to the first control signal. The input signal may be a test signal of the power amplifier, the input signal entering the power amplifier from an input of the power amplifier. The electronic device outputs a second control signal to the power supply, and the power supply outputs an initial power supply signal in response to the second control signal. The power supply signal may be a power control supply of the power amplifier, the power supply signal entering the power amplifier from a power control terminal of the power amplifier. The power supply signal may comprise Vcc (collector signal) input to the power amplifier.
It is noted that the power amplifier may be tested for different gain modes and different power consumption levels during the power amplifier test, and the initial input signal and the initial power supply signal may be the same or different during multiple tests.
In step S220, the adjacent channel leakage ratio of the power amplifier may be acquired.
After providing the initial input signal and the initial power signal to the power amplifier, the power amplifier outputs an amplified output signal in response to the initial input signal and the initial power signal. The signal analyzer receives the output signal, and the signal analyzer can determine an adjacent channel leakage ratio of the power amplifier according to the output signal. The electronic equipment is connected with the signal analyzer, and the electronic equipment acquires the adjacent channel leakage ratio of the power amplifier from the signal analyzer.
The adjacent channel leakage is used to measure the influence characteristic of the rf device on the channel outside the main operating frequency, or out-of-band radiation characteristic. The adjacent channel leakage ratio may be characterized by ACLR _ UTRA or ACLR _ EUTRA.
In step S220, when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, adjusting the voltage of the power signal by a preset voltage step until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, and determining that the current power signal is the target power signal.
Wherein, the adjacent channel leakage ratio of the power amplifier driven by the initial power signal and the initial input signal can be compared with the preset leakage ratio threshold. The preset leak ratio threshold may include a preset ACLR _ UTRA or a preset ACLR _ EUTRA. For example, the preset leakage ratio threshold may be ACLR _ UTRA = -36dBc or ACLR _ EUTRA = -38dBc.
When the adjacent channel leakage ratio is less than the preset leakage ratio threshold, the voltage of the power supply signal (Vcc) is adjusted so that the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold. When the voltage of the power supply signal is adjusted, the voltage of the power supply signal can be reduced according to a preset step length, an adjacent channel leakage ratio is obtained once when the power supply voltage is reduced once, whether the adjacent channel leakage ratio is larger than or equal to a preset leakage ratio threshold value or not is judged, and when the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold value, the power supply signal is used as a target power supply signal. The power amplifier meets linearity requirements under the drive of a target power supply signal.
For example, the preset voltage step may be 0.1V, the power signal is a collector signal, the power signal includes the collector signal, the voltage of the power signal is adjusted by the preset voltage step until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, and it is determined that the current power signal is the target power signal, which may be implemented by: and when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, adjusting the voltage of the collector signal by using the voltage step length as 0.1 volt until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, and determining that the current collector signal is a target collector signal.
In step S410, when the adjacent channel leakage ratio is greater than or equal to a preset leakage ratio threshold, it may be determined that the initial power signal is a target power signal.
When the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, it can be determined that the power amplifier meets the linearity requirement under the driving of the initial power supply signal, and therefore the initial power supply signal can be used as the target power supply signal.
In the target S230, the power of the power amplifier driven by the target power supply may be obtained.
Wherein, after the initial input signal and the target power supply signal are provided to the power amplifier, the power amplifier outputs an amplified output signal in response to the initial input signal and the target power supply signal. The signal analyzer receives the output signal and the signal analyzer can determine the current power of the power amplifier from the output signal. The electronic equipment is connected with the signal analyzer, and the electronic equipment obtains the current output power of the power amplifier from the signal analyzer.
In a target S240, when the output power of the power amplifier is smaller than a target power value, the power of the input signal is adjusted by a preset power step length until the output power of the power amplifier is greater than or equal to the target power threshold, and it is determined that the current input signal is the target input signal.
Wherein the target power threshold may be a design output power of the power amplifier. When the power amplifier is designed, the corresponding relation between the input signal power and the output signal power exists under the ideal condition. I.e. the ideal output signal that the power amplifier is capable of outputting, driven by an input signal. However, in practical applications, due to the influence of the manufacturing process or the use environment, the power of the input signal driving the output signal output by the power amplifier is not always equal to the corresponding ideal power. Therefore, the ideal power can be used as a preset power threshold value, and the output signal is adjusted to obtain a corresponding actual input signal.
When the input signal is adjusted to enable the power of the output signal to reach a preset power threshold, the power of the input signal can be adjusted by a preset power step length, the power of the output signal is obtained each time the power of the input signal is adjusted, when the power of the output signal is smaller than the preset power threshold, the power of the input signal is continuously increased, the power of the output signal is compared with the preset power threshold again, and when the output power of the power amplifier is larger than or equal to the target power threshold, the current input signal is determined to be the target input signal. The power of the target input signal can meet the power requirements of the output signal. After the target input signal and the target power signal are obtained, a relationship between the target input signal, the target power signal and a preset power threshold value can be established.
For example, the preset power step may be 1bB, and when the output power of the power amplifier is smaller than the target power value, the power of the input signal is adjusted by the preset power step until the output power of the power amplifier is greater than or equal to the target power threshold, and determining that the current input signal is the target input signal may be implemented as follows: and when the power of the power amplifier is smaller than a target power value, adjusting the power of the input signal by 1bB step length until the power of the power amplifier is larger than or equal to the target power threshold value, and determining that the current input signal is the target input signal.
In step S420, when the power of the power amplifier is greater than or equal to a target power value, the initial input signal may be determined to be a target input signal.
When the power of the output signal output by the power amplifier is greater than or equal to the preset power signal under the driving of the initial input signal and the target power supply signal, the power of the input signal of the power amplifier can be determined to meet the power requirement of the output signal, and the initial input signal is taken as the target input signal.
In step S320, power consumption of the power amplifier driven by the target power signal and the target input signal may be determined.
After the target input signal and the target power signal are determined, the current of the power signal and the current of the battery voltage VBAT output by the power supply can be detected. The power consumption of the power amplifier can be calculated by the above parameters. Therefore, power consumption curves of the power amplifier at different output powers can be obtained. The performance of the power amplifier can be intuitively reflected through the power consumption curve, and the applications such as type selection of the power amplifier can be guided.
In practical application, of course, the voltage error vector magnitude of the power amplifier when outputting the target power can also be obtained, and the power amplifier operates under the driving of the target power and the target input signal. The signal analyzer obtains the current voltage error vector magnitude.
According to the testing method of the power amplifier provided by the embodiment of the disclosure, when the adjacent channel leakage ratio is smaller than the preset leakage ratio threshold, the voltage of the power supply signal is adjusted by the preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, the current power supply signal is determined to be the target power supply signal, when the power of the power amplifier is smaller than the target power value, the power of the input signal is adjusted by the preset power step length until the power of the power amplifier is larger than or equal to the target power threshold, the current input signal is determined to be the target input signal, so that the target power supply signal and the target input signal corresponding to the target power can be determined, and a plurality of target powers are traversed, so that the target power supply signal and the target input signal corresponding to each target power can be determined, that is to ensure the linearity of the output signal of the power amplifier by adjusting the voltage of the power supply signal of the power amplifier, the power of the input signal is adjusted to control the power consumption of the power amplifier at different target powers (output powers), and the optimal power consumption of the power amplifier is determined, so as to guide the application of the power amplifier in the electronic device.
It should be noted that although the various steps of the methods of the present disclosure are depicted in the drawings in a particular order, this does not require or imply that these steps must be performed in this particular order, or that all of the depicted steps must be performed, to achieve desirable results. Additionally or alternatively, certain steps may be omitted, multiple steps combined into one step execution, and/or one step broken into multiple step executions, etc.
The exemplary embodiment of the present disclosure also provides a power amplifier testing apparatus, as shown in fig. 5, the power amplifier testing apparatus 500 includes:
a control module 510 for providing an initial input signal and an initial power supply signal to the power amplifier;
a first obtaining module 520, configured to obtain an adjacent channel leakage ratio of the power amplifier;
a first determining module 530, configured to, when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, adjust a voltage of a power supply signal by a preset voltage step length until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, and determine that a current power supply signal is a target power supply signal;
a second obtaining module 540, configured to obtain power of the power amplifier driven by the target power supply;
a second determining module 550, configured to adjust the power of the input signal by using a preset power step when the power of the power amplifier is smaller than the target power value, until the power of the power amplifier is greater than or equal to the target power threshold, and determine that the current input signal is the target input signal.
The testing apparatus for a power amplifier provided in the embodiments of the present disclosure adjusts a voltage of a power supply signal by a preset voltage step when an adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, determines that a current power supply signal is a target power supply signal when the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, adjusts a power of an input signal by a preset power step when the power of the power amplifier is smaller than a target power value, and determines that the current input signal is a target input signal when the power of the power amplifier is greater than or equal to the target power threshold, so that the target power supply signal and the target input signal corresponding to the target power can be determined, and a plurality of target powers are traversed, so that the target power supply signal and the target input signal corresponding to each target power can be determined, that is, linearity of an output signal of the power amplifier can be ensured by adjusting the voltage of the power supply signal of the power amplifier, the power of the input signal is adjusted to control the power of the output signal of the power amplifier, and an optimal power consumption of the power amplifier at different target powers (output powers) is determined, so as to guide an application of the power amplifier in an electronic device.
Optionally, the power amplifier testing apparatus provided in the embodiment of the present disclosure further includes:
and the selection module is used for sending a mode selection signal to the power amplifier so as to control the power amplifier to select the working mode.
Wherein, the selection module may include:
a first transmitting unit, configured to transmit a first mode selection signal to the power amplifier, so that the power amplifier operates in a first gain mode;
a second sending unit, configured to send a second mode selection signal to the power amplifier, so that the power amplifier operates in a second gain mode, where a gain of the first gain mode is greater than a gain of the second gain mode.
Optionally, the power amplifier testing apparatus provided in the embodiment of the present disclosure further includes:
and a third determining module, configured to determine that the initial power signal is a target power signal when the adjacent channel leakage ratio is greater than or equal to a preset leakage ratio threshold.
Optionally, the power amplifier testing apparatus provided in the embodiment of the present disclosure further includes:
and the fourth determining module is used for determining the initial input signal as a target input signal when the power of the power amplifier is greater than or equal to a target power value.
Optionally, the first determining module may include:
the first determining unit is configured to adjust the voltage of the collector signal by a preset voltage step until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, and determine that the current collector signal is a target collector signal.
When the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, adjusting the voltage of the collector signal by using a voltage step size of 0.1 volt until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, and determining that the current collector signal is a target collector signal.
Optionally, the second determining module may include:
and the second determining unit is used for adjusting the power of the input signal by 1bB step length when the output power of the power amplifier is smaller than a target power value, and determining that the current input signal is the target input signal when the output power of the power amplifier is larger than or equal to the target power threshold value.
Optionally, the power amplifier testing apparatus provided in the embodiment of the present disclosure further includes:
and the fifth determination module is used for determining the power consumption of the power amplifier driven by the target power supply signal and the target input signal.
It should be noted that although in the above detailed description several modules or units of the test arrangement of the power amplifier are mentioned, this division is not mandatory. Indeed, the features and functions of two or more modules or units described above may be embodied in one module or unit, according to embodiments of the present disclosure. Conversely, the features and functions of one module or unit described above may be further divided into embodiments by a plurality of modules or units.
In addition, in an exemplary embodiment of the present disclosure, an electronic device capable of implementing the above method is also provided.
As will be appreciated by one skilled in the art, aspects of the present invention may be embodied as a system, method or program product. Thus, various aspects of the invention may be embodied in the form of: an entirely hardware embodiment, an entirely software embodiment (including firmware, microcode, etc.) or an embodiment combining hardware and software aspects that may all generally be referred to herein as a "circuit," module "or" system.
An electronic device 600 according to such an embodiment of the invention is described below with reference to fig. 6. The electronic device 600 shown in fig. 6 is only an example, and should not bring any limitation to the functions and the scope of use of the embodiments of the present invention.
As shown in fig. 6, the electronic device 600 is embodied in the form of a general purpose computing device. The components of the electronic device 600 may include, but are not limited to: the at least one processing unit 610, the at least one memory unit 620, a bus 630 connecting different system components (including the memory unit 620 and the processing unit 610), and a display unit 640.
Wherein the storage unit stores program code that is executable by the processing unit 610 such that the processing unit 610 performs the steps according to various exemplary embodiments of the present invention as described in the above section "exemplary method" of the present specification.
The storage unit 620 may include readable media in the form of volatile storage units, such as a random access memory unit (RAM) 6201 and/or a cache storage unit 6202, and may further include a read-only memory unit (ROM) 6203.
The memory unit 620 may also include a program/utility 6204 having a set (at least one) of program modules 6205, such program modules 6205 including, but not limited to: an operating system, one or more application programs, other program modules, and program data, each of which, or some combination thereof, may comprise an implementation of a network environment.
The electronic device 600 may also communicate with one or more external devices 670 (e.g., keyboard, pointing device, bluetooth device, etc.), with one or more devices that enable a user to interact with the electronic device 600, and/or with any devices (e.g., router, modem, etc.) that enable the electronic device 600 to communicate with one or more other computing devices. Such communication may occur via an input/output (I/O) interface 650. Also, the electronic device 600 may communicate with one or more networks (e.g., a Local Area Network (LAN), a Wide Area Network (WAN), and/or a public network such as the Internet) via the network adapter 660. As shown, the network adapter 640 communicates with the other modules of the electronic device 600 via the bus 630. It should be appreciated that although not shown in the figures, other hardware and/or software modules may be used in conjunction with the electronic device 600, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems, to name a few.
Through the above description of the embodiments, those skilled in the art will readily understand that the exemplary embodiments described herein may be implemented by software, or by software in combination with necessary hardware. Therefore, the technical solution according to the embodiments of the present disclosure may be embodied in the form of a software product, which may be stored in a non-volatile storage medium (which may be a CD-ROM, a usb disk, a removable hard disk, etc.) or on a network, and includes several instructions to enable a computing device (which may be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to the embodiments of the present disclosure.
In an exemplary embodiment of the present disclosure, there is also provided a computer readable storage medium having stored thereon a program product capable of implementing the above-described method of the present specification. In some possible embodiments, aspects of the invention may also be implemented in the form of a program product comprising program code means for causing a terminal device to carry out the steps according to various exemplary embodiments of the invention described in the above-mentioned "exemplary methods" section of the present description, when said program product is run on the terminal device.
The power amplifier test system of the exemplary embodiment of the present disclosure includes the electronic device 110, the test board 150, the signal generator 140, the signal analyzer 160, and the power supply 130 described above; the test board 150 is connected with the electronic device 110 for connecting the power amplifier; the signal generator 140 is connected to the input terminals of the electronic device 110 and the test board 150, and is used for providing an input signal under the control of the electronic device 110; the signal analyzer 160 is connected to the output ends of the electronic device 110 and the test board 150, and is configured to analyze the output signal of the power amplifier and feed back the signal to the electronic device 110; a power supply 130 is connected to the electronic device 110 and the test board 150 for providing a power supply signal to the power amplifier under the control of the electronic device 110.
According to the power amplifier test system provided by the embodiment of the disclosure, when the adjacent channel leakage ratio is smaller than the preset leakage ratio threshold, the voltage of the power supply signal is adjusted by the preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold, the current power supply signal is determined to be the target power supply signal, when the power of the power amplifier is smaller than the target power value, the power of the input signal is adjusted by the preset power step length, until the power of the power amplifier is larger than or equal to the target power threshold, the current input signal is determined to be the target input signal, so that the target power supply signal and the target input signal corresponding to the target power can be determined, and a plurality of target powers are traversed, so that the target power supply signal and the target input signal corresponding to each target power can be determined, that the linearity of the output signal of the power amplifier can be ensured by adjusting the voltage of the power supply signal of the power amplifier, the power of the output signal of the power amplifier is controlled by adjusting the power of the input signal, and the optimal power consumption of the power amplifier under different target powers (output powers) is determined, so as to guide the application of the power amplifier in the electronic device.
The test Board may be an EVB Board (development Board), and a power amplifier test site may be disposed on the EVB Board, where the power amplifier test site is used to mount a power amplifier. And multiple interfaces may be provided on the EVB board. Such as a signal source interface, a control signal interface, a power supply interface, an output interface, etc. The signal source interface is used for connecting the signal generator to receive an input signal. The control interface is connected with the mode control board to receive the mode selection signal. The power interface may be connected to a power source for receiving a power signal. The output interface may be connected to a signal analyzer to output an output signal.
The electronic device may be a computer, such as a personal computer, a server, a tablet computer, or a notebook computer. The mode control board can be an MIPI control board, and the MIPI control board can be connected with a computer through a USB interface and connected with the EVB board through an MIPI control line. The electronic device may be connected to the signal generator, the signal analyzer, the power supply, and the mode control board via a General-Purpose Interface Bus (GPIB).
Referring to fig. 7, a program product 700 for implementing the above method according to an embodiment of the present invention is described, which may employ a portable compact disc read only memory (CD-ROM) and include program code, and may be run on a terminal device, such as a personal computer. However, the program product of the present invention is not limited in this respect, and in this document, a readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. A readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium include: an electrical connection having one or more wires, a portable disk, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
A computer readable signal medium may include a propagated data signal with readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A readable signal medium may also be any readable medium that is not a readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Program code for carrying out operations for aspects of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server. In the case of a remote computing device, the remote computing device may be connected to the user computing device through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computing device (e.g., through the internet using an internet service provider).
Furthermore, the above-described figures are merely schematic illustrations of processes involved in methods according to exemplary embodiments of the invention, and are not intended to be limiting. It will be readily appreciated that the processes illustrated in the above figures are not intended to indicate or limit the temporal order of the processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, e.g., in multiple modules.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is to be limited only by the terms of the appended claims.
Claims (14)
1. A method for testing a power amplifier, the method comprising:
providing an initial input signal and an initial power supply signal to a power amplifier;
acquiring the adjacent channel leakage ratio of the power amplifier;
when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold value, adjusting the voltage of a power supply signal by a preset voltage step length until the adjacent channel leakage ratio is larger than or equal to the preset leakage ratio threshold value, and determining that the current power supply signal is a target power supply signal;
acquiring the output power of a power amplifier under the drive of a target power supply signal;
and when the output power of the power amplifier is smaller than the target power value, adjusting the power of the input signal by a preset power step length until the output power of the power amplifier is larger than or equal to the target power threshold value, and determining that the current input signal is the target input signal.
2. The testing method of claim 1, further comprising:
and sending a mode selection signal to the power amplifier to control the power amplifier to select the working mode.
3. The test method of claim 2, wherein sending a mode selection signal to the power amplifier comprises:
sending a first mode selection signal to the power amplifier to cause the power amplifier to operate in a first gain mode;
and sending a second mode selection signal to the power amplifier to enable the power amplifier to work in a second gain mode, wherein the gain of the first gain mode is larger than that of the second gain mode.
4. The testing method of claim 1, further comprising:
and when the adjacent channel leakage ratio is greater than or equal to a preset leakage ratio threshold value, determining that the initial power supply signal is a target power supply signal.
5. The testing method of claim 1, further comprising:
and when the output power of the power amplifier is larger than or equal to a target power value, determining the initial input signal as a target input signal.
6. The method as claimed in claim 1, wherein the power signal comprises a collector signal, and the adjusting the power signal voltage by a preset voltage step until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold determines that the current power signal is a target power signal, comprises:
and adjusting the voltage of the collector signal by a preset voltage step length until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold value, and determining that the current collector signal is a target collector signal.
7. The test method of claim 6, wherein when the adjacent channel leakage ratio is less than a preset leakage ratio threshold, the voltage of the collector signal is adjusted by a voltage step of 0.1 volt until the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold, and the current collector signal is determined to be a target collector signal.
8. The test method of claim 1, wherein when the output power of the power amplifier is smaller than a target power value, the power of the input signal is adjusted by a preset power step size of 1bB until the output power of the power amplifier is greater than or equal to the target power threshold, and the current input signal is determined to be the target input signal.
9. The testing method of claim 1, further comprising:
determining a power consumption of a power amplifier driven by the target power supply signal and the target input signal.
10. A power amplifier test apparatus, characterized in that the power amplifier test apparatus comprises:
a control module for providing an initial input signal and an initial power supply signal to the power amplifier;
the first acquisition module is used for acquiring the adjacent channel leakage ratio of the power amplifier;
a first determining module, configured to adjust a power supply signal voltage by a preset voltage step length when the adjacent channel leakage ratio is smaller than a preset leakage ratio threshold, and determine that a current power supply signal is a target power supply signal when the adjacent channel leakage ratio is greater than or equal to the preset leakage ratio threshold;
the second acquisition module is used for acquiring the power of the power amplifier under the driving of the target power supply signal;
and the second determining module is used for adjusting the power of the input signal by a preset power step length when the power of the power amplifier is smaller than the target power value, and determining that the current input signal is the target input signal when the power of the power amplifier is larger than or equal to the target power threshold.
11. An electronic device, comprising
A processor; and
a memory having computer readable instructions stored thereon which, when executed by the processor, implement the method of any of claims 1 to 9.
12. A power amplifier test system, comprising:
the electronic device of claim 11;
the test board is connected with the electronic equipment and is used for connecting a power amplifier;
the signal generator is connected with the electronic equipment and the input end of the test board and is used for providing input signals under the control of the electronic equipment;
the signal analyzer is connected with the electronic equipment and the output end of the test board, and is used for analyzing the output signal of the power amplifier and feeding back the output signal to the electronic equipment;
and the power supply is connected with the electronic equipment and the test board and is used for providing a power supply signal for the power amplifier under the control of the electronic equipment.
13. The power amplifier test system of claim 12, wherein the power amplifier test system further comprises:
and the mode control board is connected with the electronic equipment and the test board and is used for selecting the gain mode of the power amplifier under the control of the electronic equipment.
14. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1 to 9.
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| US8583062B2 (en) * | 2010-04-15 | 2013-11-12 | Apple Inc. | Methods for determining optimum power supply voltages for radio-frequency power amplifier circuitry |
| US8983395B2 (en) * | 2011-12-12 | 2015-03-17 | Apple Inc. | Methods and apparatus for testing radio-frequency power amplifier performance |
| US9026391B2 (en) * | 2012-02-29 | 2015-05-05 | Intel Mobile Commnications GmbH | Distortion estimation apparatus and method |
| CN103376403B (en) * | 2012-04-26 | 2016-01-27 | 京信通信系统（中国）有限公司 | The reliability test system of digital pre-distorting power amplifier |
| CN103744010B (en) * | 2013-12-26 | 2017-01-18 | 中国电子科技集团公司第三十六研究所 | An automatic testing system and an automatic testing method of a continuous wave radio frequency power amplifier |
| CN107634725B (en) * | 2017-08-31 | 2021-09-10 | 深圳市远望谷信息技术股份有限公司 | Method and device for improving efficiency of power amplifier |
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