CN112564824A - Microwave equipment test system and test method - Google Patents

Abstract

A microwave device test system. The microwave equipment testing system is used for comprehensively testing the functions, the performances and the like of products in the research, development and production processes and meeting the requirements of informatization and automation. The system comprises a control computer, a power supply, an Ethernet HUB, a digital control module, an excitation switch, a first local oscillator, a second local oscillator and a response switch; the control computer runs a display control program through the Ethernet HUB and the digital control module to realize the functions of test mode selection, test control parameter issuing, instrument control, test data display and admission; and the second local oscillator generates a 9GHz radio frequency signal under the control of the digital control module to perform amplitude modulation, and the signal is divided into four paths to be output to a tested piece. The invention realizes the functions of test mode selection, test control parameter issuing, instrument control, test data display, admission and the like.

Description

Microwave equipment test system and test method

Technical Field

The invention relates to the technical field of microwaves, in particular to a multi-channel microwave equipment testing system and an informatization and automation testing method thereof.

Background

With the complexity of external electromagnetic environment and the complexity of electronic equipment composition, in the fields of radar, electronic communication and the like, multi-channel products (such as a multi-channel transceiver module, a multi-channel receiver, a multi-channel transmitter and the like in a phased array radar) exist, and the multi-channel products are characterized in that the number of channels and the number of interfaces of microwave equipment are large, how to ensure that technical performance indexes meet the expected technical index requirements in the development process and how to ensure the consistency of the technical performance of the products and the high efficiency of batch production tests in the production process are difficult problems in the development and production processes of microwave products. Therefore, how to design a microwave device and a test system while developing a certain device can be used to meet the informatization and automation requirements of function and performance test of a certain device in research and development and production processes, including setting of working state parameters of a to-be-tested device, automatic setting of state parameters of a test instrument device, automatic acquisition of test result data, automatic generation of test records and other control processes, and further improve test efficiency and quality level, which becomes a technical problem to be solved urgently in the field.

In the prior art, as CN106445758A disclosed by the national intellectual property office 2017-2-22, the name: an automatic test system and a test method for microwave products disclose the following technical scheme: the test system comprises an upper computer, external input equipment, a data memory, an Ethernet bus, a controller, a servo motor, a manipulator, an intermodulation instrument and an S parameter tester. The external input equipment inputs working parameters and instructions to the upper computer, the data storage stores test data and test results, and the upper computer and the controller realize data interaction through an Ethernet bus. The controller drives the servo motor to operate according to an instruction issued by the upper computer, the servo motor controls the manipulator to connect the test cable of the microwave product to be tested to the intermodulation instrument or the S parameter tester, the intermodulation instrument or the S parameter tester is started to measure the intermodulation parameter or the S parameter of the microwave product to be tested, and the controller uploads the measured data to the upper computer. The invention can accurately and timely acquire the S parameter and the intermodulation value of the microwave product, saves the human resource and improves the product percent of pass. However, the test device has a single function, and is difficult to meet the requirement of omnibearing test on the research and manufacture equipment.

Disclosure of Invention

Aiming at the problems, the invention provides a microwave equipment test system and a test method which can be used for comprehensively testing the functions, the performances and the like of products in the research and development and production processes and meet the requirements of informatization and automation.

The technical scheme of the invention is as follows: a microwave equipment test system comprises a control computer, a power supply and an Ethernet HUB, and is characterized by also comprising a digital control module, an excitation switch, a first local oscillator, a second local oscillator and a response switch;

the control computer runs a display control program through the Ethernet HUB and the digital control module to realize the functions of test mode selection, test control parameter issuing, instrument control, test data display and admission;

the digital control module receives an Ethernet command sent by a control computer through a network receiving and sending module, converts the Ethernet command into control commands of the excitation switch, the response switch, the first local oscillator, the second local oscillator and the tested piece through a message detection and distribution unit, and controls the state switching of the tested piece;

the excitation switch is externally connected with at least two excitation signal cables, and one of the at least two excitation signal cables is gated under the control of the digital control module to realize the switching of signal paths;

the response switch is externally connected with at least two excitation signal cables, and one path of the at least two response signal cables is gated under the control of the digital control module to realize the switching of signal paths;

the first local oscillator generates a 9-15 GHz radio frequency signal under the control of the digital control module for amplitude modulation, and the signal is divided into four paths of power and output to a tested piece;

and the second local oscillator generates a 9GHz radio frequency signal under the control of the digital control module to perform amplitude modulation, and the signal is divided into four paths to be output to a tested piece.

The exciting switch control unit controls the channel switching of the exciting switch, and after the microwave radio frequency signal is input into the exciting switch control unit, the exciting switch control unit switches the switch to the channel according to the requirement of the channel of the microwave tested piece.

The response switch control unit controls the channel switching of the response switch, and when the tested piece is tested, the switch is switched to the channel according to the requirement of the tested information.

The tested microwave piece can feed back the running state information after being controlled, and the information is sent to the test information reporting unit through the RS485 receiving and sending module.

The test information reporting unit transmits the data to the display control software through the network transceiving module. The self-checking state of the equipment is fed back by the feedback unit and is sent to the testing software through the network.

The Ethernet HUB is provided with four network connection ports.

The local oscillator I comprises a phase-locked loop I, a low-pass filter I, a voltage-controlled oscillator I, a numerical control frequency divider I, a first-stage numerical control attenuator I, an amplifier I, a second-stage numerical control attenuator I and two paths of power dividers I which are sequentially communicated;

the output ends of the two paths of power dividers I are connected with the power dividers I which are divided into two paths;

the output end of the power divider is divided into two paths and then sequentially outputs the two paths of signals through the first amplifier and the first low-pass filter;

and one output end of the first voltage-controlled oscillator is connected with the first phase-locked loop, and the other output end of the first voltage-controlled oscillator is connected with the first numerical control frequency divider.

The local oscillator II comprises a phase-locked loop II, a numerical control attenuator II, an amplifier II and two paths of power divider modules II which are sequentially communicated;

the output ends of the two paths of power dividers are connected with the power divider II divided into two paths;

and the output end of the second power divider is divided into two paths and then respectively output through the second amplifier and the second low-pass filter in sequence.

The excitation switch comprises a first-stage single-pole four-throw switch and a plurality of first second-stage single-pole four-throw switches;

and the excitation signal passes through the first single-pole four-throw switch of the first stage and then is output to the first single-pole four-throw switch of the second stage, and the excitation signal passes through the first single-pole four-throw switch of the second stage and then is output to the first single-pole single-throw switches.

The first second-stage single-pole four-throw switch is provided with 3 paths;

and the first single-pole four-throw switch of the second stage outputs to the first single-pole four-throw switch of the 4 paths.

The response switch comprises a first-stage single-pole four-throw switch II and a second-stage single-pole four-throw switch II;

and the excitation signal passes through the second first-stage single-pole four-throw switch and then is output to the second-stage single-pole four-throw switch, and is output to the plurality of second single-pole single-throw switches through the second-stage single-pole four-throw switch.

The second-stage single-pole four-throw switch is provided with 4 paths;

and the second-stage single-pole four-throw switch II is output to the 4 single-pole single-throw switches II.

A test method of a microwave equipment test system comprises the following steps:

1) after the software normally runs, firstly, performing power-on self-test, after the software self-test is completed, setting running parameters of a program by a user, and after the parameter setting is completed, performing self-calibration on the system;

2) self-calibration

2.1) excitation switch calibration

2.11) selecting a signal source and a spectrometer for the test instrument;

the microwave cabinet is sequentially communicated with an Ethernet HUB, a digital control module and an excitation switch;

the frequency spectrograph is communicated with an excitation switch through a cable 1-1, and the excitation switch is connected with a tested piece through cables 2-1-2-12;

selecting an excitation switch channel, a signal frequency and excitation switch output power to be calibrated on a control computer; forming an excitation switch calibration system;

2.12) starting an excitation switch calibration system, and controlling a computer to respectively control signal source initialization and spectrometer initialization;

2.13) the control computer sends a switch control command to the digital control module;

2.14) the digital control module controls the excitation switch switching port;

2.15) controlling the computer to control the signal source to output signals;

2.16) controlling the computer to control the frequency spectrograph to read the signal power;

2.17) comparing the signal power read in the step 2.16) with the input power of the exciting switch set in the step 2.11);

2.171) when the two are equal, step 2.18) is performed;

2.172) when the two are not equal, controlling the computer to adjust the power of the output signal of the signal source, and skipping to the step 2.15) to operate downwards in sequence;

2.18) controlling the computer to record the current signal source power and finishing the calibration of the excitation switch;

2.2) responsive switch calibration

2.21) the test instrument still selects a signal source and a spectrometer;

connecting a control computer with a signal source and a spectrometer through an Ethernet HUB in a microwave cabinet by a test cable;

the signal source is connected to the frequency spectrograph;

2.22) selecting the frequency of a signal source of an input response switch to be calibrated and the power of the signal source on a control computer, then calibrating the output power of the signal source by controlling the signal source and recording the frequency and power reading of a frequency spectrograph;

2.23) connecting the control computer with a digital control module through an Ethernet HUB, wherein the digital control module is connected with a response switch;

the signal source is connected with a response switch through a double-cathode adapter and cables 5-1-5-16, and the response switch is connected with a frequency spectrograph to form a response switch calibration system;

2.24) selecting a response switch channel, a signal frequency and a signal power which need to be calibrated on a control computer;

2.25) starting a response switch calibration system, and controlling a computer to respectively control signal source initialization and spectrometer initialization;

2.26) the control computer sends a switch control command to the digital control module;

2.27) the digital control module controls the response switch to switch the port;

2.28) controlling the output signal of the signal source controlled by the computer;

2.29) controlling the computer to control the frequency spectrograph to read the power of the measured signal;

2.210) comparing the signal power read in step 2.29) with the response switch input power set in step 2.24);

2.2101) when the two are equal, step 2.211) is performed;

2.2102) when the two are not equal, the control computer adjusts the output signal power of the signal source, and jumps to the step 2.28) to operate in turn;

2.211) controlling the computer to record the current signal source power and finishing the calibration of the response switch;

2.3) local oscillator calibration

2.31) jointing equipment, the test instrument chooses for use the frequency spectrograph:

the Ethernet HUB, the digital control module, the first local oscillator and the second local oscillator are connected in sequence in the microwave case;

the first local oscillator and the second local oscillator are connected with a frequency spectrograph through cables 3-1-3-4 and 4-1-4 respectively to form a local oscillator calibration system;

2.32) selecting a local oscillator, a local oscillator channel, a local oscillator output frequency and power which need to be calibrated on a control computer; starting a local oscillator calibration system, and controlling a computer to control the initialization of a frequency spectrograph;

2.33) the control computer sends a local oscillation control command to the digital control module;

2.34) the digital control module controls the frequency and the power of the local oscillator output signal;

2.35) controlling a computer to control a frequency spectrograph to read and record the signal power;

2.36) determining whether to adjust the output of the local oscillator power according to the power of the reading signal of the frequency spectrograph;

2.361) when the output of the local oscillator power needs to be adjusted, updating the local oscillator power control word, adjusting the local oscillator power, and skipping to execute the step 2.34);

2.362) when the output of the local oscillation power does not need to be adjusted, executing the step 2.37);

2.37) finishing local oscillation calibration;

2.4) testing the tested equipment.

10. The method as claimed in claim 9, wherein the channel gain calibration test is performed on the device under test, and comprises the following steps:

10.1) starting a test system, and controlling a computer to sequentially control a signal source and the initialization of a frequency spectrometer so as to make the equipment perform relevant configuration;

10.2) controlling the computer to send a channel gain calibration test control command to the digital control module;

10.3) the digital control module controls an excitation switch, a response switch, a first local oscillator, a second local oscillator and a tested piece;

10.4) controlling the computer to control the signal source to output signals;

10.5) controlling a computer to control a frequency spectrograph to read power and record the channel gain of the tested piece;

10.6) determining whether to adjust the power of the tested piece according to the channel gain of the tested piece read by the frequency spectrograph;

10.61) when the power of the measured piece measured by the frequency spectrograph is not equal to the calculated power of the measured piece, updating a control word of the measured piece and skipping to the step 10.2;

10.62) when the measured piece power measured by the spectrometer is equal to the calculated measured piece power, executing the step 10.7);

10.7) the channel gain test flow ends.

The testing system consists of a control computer, an Ethernet HUB, a digital control module, a power supply, an excitation switch, a first local oscillator, a second local oscillator, a response switch and a matching cable. The Ethernet HUB, the digital control module, the power supply, the excitation switch, the first local oscillator, the second local oscillator and the response switch are installed in the microwave cabinet, and the control computer is a notebook computer. The control computer runs a display control program through the Ethernet HUB and the digital control module to realize the functions of test mode selection, test control parameter issuing, instrument control, test data display, admission and the like.

The invention designs a microwave equipment test system, which has the following characteristics:

(1) the test capability of multi-channel multi-stage frequency conversion is realized;

(2) the test capability of microwave parameters and general parameters is provided;

(3) the capability that the user can edit different test plans is provided, and the test plans can be stored in a file form;

(4) the capability of displaying the test state and the test progress is provided;

(5) the capability of tracking the state of a test instrument in real time in the whole test process is realized;

(6) the method can automatically input information such as test data and the like into a customized EXCEL template (record forms such as touch-down, screening, acceptance inspection and the like), and extract unqualified items according to the qualification criterion;

(7) the method can automatically input and customize the EXCEL template (record forms of touch-down, screening, acceptance inspection and the like) for information such as test data and the like, and various information can be counted according to the product requirements;

(8) the system has self-test and calibration capabilities.

Drawings

FIG. 1 is a block diagram of a test system of the present disclosure;

FIG. 2 is a schematic block diagram of a local oscillator assembly;

FIG. 3 is a schematic block diagram of a local oscillator II;

FIG. 4 is a schematic block diagram of the activation switch assembly;

FIG. 5 is a functional block diagram of a response switch assembly;

FIG. 6 is a schematic diagram of the test system software operation flow;

FIG. 7 is a block diagram of an excitation switch calibration connection;

FIG. 8 is an excitation switch calibration flow chart;

FIG. 9 is a first block diagram of the responsive switch calibration connections;

FIG. 10 is a first block diagram of the responsive switch calibration connections;

FIG. 11 is a responsive switch calibration flow diagram;

FIG. 12 is a block diagram of a local oscillator calibration connection;

fig. 13 is a local oscillator calibration flow chart;

FIG. 14 is a block diagram of a channel gain test connection;

FIG. 15 is a flow chart of a channel gain test;

FIG. 16 is a block diagram of a noise figure test connection;

FIG. 17 is a noise figure test flow chart;

FIG. 18 is a flow chart of an in-band fluctuation test of the IF;

FIG. 19 is an intermodulation test flow diagram;

FIG. 20 is a flow chart of attenuation accuracy testing;

fig. 21 is a schematic structural diagram of a digital control module.

Detailed Description

As shown in fig. 1 to 21, the microwave device testing system of the present invention includes a control computer, a power supply, and an ethernet HUB, and is characterized by further including a digital control module, an excitation switch, a first local oscillator, a second local oscillator, and a response switch, wherein the ethernet HUB, the digital control module, the power supply, the excitation switch, the first local oscillator, the second local oscillator, and the response switch are installed in a microwave chassis, and the control computer is a notebook computer.

The control computer controls the digital control module to run a display control program through the Ethernet HUB, so that the functions of test mode selection, test control parameter issuing, instrument control, test data display and admission are realized;

the digital control module receives an Ethernet command sent by a control computer, converts the Ethernet command into control commands of the excitation switch, the response switch, the first local oscillator, the second local oscillator and the tested piece, and controls the state switching of the tested piece (microwave device);

the excitation switch is externally connected with at least two excitation signal cables, and one of the at least two excitation signal cables is gated under the control of the digital control module to realize the switching of signal paths; in the scheme, the excitation switch gates one of the twelve paths under the control of the digital control module to realize the switching of signal paths.

The response switch is externally connected with at least two excitation signal cables, and one path of the at least two response signal cables is gated under the control of the digital control module to realize the switching of signal paths; in the scheme, the response switch is controlled by the digital control module to gate one of the sixteen paths, so that the switching of signal paths is realized.

The first local oscillator generates a 9-15 GHz radio frequency signal under the control of the digital control module for amplitude modulation, and the signal is divided into four paths of power and output to a tested piece;

and the second local oscillator generates a 9GHz radio frequency signal under the control of the digital control module to perform amplitude modulation, and the signal is divided into four paths to be output to a tested piece.

The first local oscillator and the second local oscillator provide radio frequency signals required by the microwave part, the first local oscillator and the second local oscillator need to change frequency and signal power, and the control computer sends control messages to switch local oscillator frequency codes and attenuation according to parameters required by the microwave part to be detected.

The exciting switch control unit controls the channel switching of the exciting switch, and after the microwave radio frequency signal is input into the exciting switch control unit, the exciting switch control unit switches the switch to the channel according to the requirement of the channel of the microwave tested piece.

The response switch control unit controls the channel switching of the response switch, and when the tested piece is tested, the switch is switched to the channel according to the requirement of the tested information.

The tested microwave piece can feed back the running state information after being controlled, and the information is sent to the test information reporting unit through the RS485 receiving and sending module.

The Ethernet HUB is provided with four network connection ports. As shown in fig. 1, four network connection ports are respectively used for a control computer, a digital control module and a test instrument.

The radio frequency cables in the scheme are 39, and comprise 1 meter to an excitation switch, 12 excitation switches to a tested piece, 4 local oscillators from one local oscillator to the tested piece, two local oscillators from the two local oscillators to the 4 tested piece, 16 tested pieces to a response switch, 1 meter to the response switch and 1 test cable.

The test system supports test parameters: channel gain, noise coefficient, out-of-band rejection, intermediate frequency in-band fluctuation, output P-1, intermodulation, clutter, attenuation accuracy, standing waves, channel phase difference and the like; measuring the number of channels: 12, input, 16 output; excitation and response signal frequency ranges: 50MHz to 6 GHz; excitation power range: -85 dBm- +20 dBm; the power measurement range is-110 dBm- +30 dBm; interfacing with a control computer: a network port and a serial port; software operating environment: WinXP and Win7 apply.

The local oscillator I comprises a phase-locked loop I (PLL), a low-pass filter I (LF), a voltage controlled oscillator I (VCO), a numerical control frequency divider I, a first-stage numerical control attenuator I, an amplifier I, a second-stage numerical control attenuator I and two paths of power dividers I which are sequentially communicated;

the output ends of the two paths of power dividers I are connected with the power dividers I which are divided into two paths;

the output end of the power divider is divided into two paths and then sequentially outputs the two paths of signals through the first amplifier and the first low-pass filter;

and one output end of the first voltage-controlled oscillator is connected with the first phase-locked loop, and the other output end of the first voltage-controlled oscillator is connected with the first numerical control frequency divider.

The local oscillator one components are shown in fig. 2. The frequency is synthesized in a phase-locked loop I (PLL) phase-locked mode, a 100MHz reference signal is input into the phase-locked loop I, the output of the phase-locked loop I is sent into a voltage controlled oscillator I (VCO) after passing through a low-pass filter I (LF), and the output of the voltage controlled oscillator I is fed back and input into the phase-locked loop I to adjust the output phase in real time on one hand and is sent to a numerical control frequency divider I on the other hand.

Because the output frequency of the voltage controlled oscillator I (VCO) is 10-20 GHz, the frequency of the VCO needs to be divided by the numerical control frequency divider I to output 9-15 GHz. The first-stage numerical control attenuator I output after passing through the first numerical control frequency divider is used for calibrating the flatness of output power, signals are amplified by the first amplifier and then pass through the second-stage numerical control attenuator I to realize a power step adjustment function, then the signals are sent to the first two-path power divider, the first two-path power divider is divided into the first 2-path power divider, and the power is divided into 4 paths. The power is divided into four paths, amplified by the first amplifier and then output by the first low-pass filter.

The local oscillator II comprises a phase-locked loop II, a numerical control attenuator II, an amplifier II and two paths of power divider modules II which are sequentially communicated;

the output ends of the two paths of power dividers are connected with the power divider II divided into two paths;

and the output end of the second power divider is divided into two paths and then respectively output through the second amplifier and the second low-pass filter in sequence.

The local oscillator two components are shown in figure 3. The 100MHz reference signal is directly synthesized into a 9GHz dot frequency signal by a phase-locked loop II (PLL chip) of the integrated VCO, the output power flatness is calibrated by a numerical control attenuator, and the dot frequency signal is amplified by an amplifier II. Then the signal is sent to the second power divider of 2 paths, and the second power divider of 2 paths is divided into 4 paths by the second power divider of 2 paths. The power is divided into four paths, amplified by the second amplifier and then output by the second low-pass filter.

The design of the local oscillator I and the local oscillator II mainly comprises the following steps: power control, spurious suppression, harmonic suppression, phase noise suppression, and the like. Stray generation mainly comes from mutual leakage of two local oscillators and phase demodulation leakage of a phase-locked loop. For stray generated by mutual leakage of two local oscillators, the two local oscillators are reasonably divided into cavities in design, and different low dropout regulators (LDOs) are adopted for power supply of the two local oscillators. For spurs generated by phase detection leakage, the invention is mainly realized by adjusting a loop filter. Because the output frequency is higher, in order to reduce the harmonic level, the invention adopts the cavity dielectric filter to filter, and the filter can achieve the suppression effect of about-30 dBc. The phase noise suppression is realized by selecting a phase-locked loop with high phase noise characteristics.

The excitation switch comprises a first-stage single-pole four-throw switch and a plurality of first second-stage single-pole four-throw switches;

and the excitation signal passes through the first single-pole four-throw switch of the first stage and then is output to the first single-pole four-throw switch of the second stage, and the excitation signal passes through the first single-pole four-throw switch of the second stage and then is output to the first single-pole single-throw switches.

The first second-stage single-pole four-throw switch is provided with 3 paths;

and the first single-pole four-throw switch of the second stage outputs to the first single-pole four-throw switch of the 4 paths.

The excitation switch is composed of a schematic block diagram as shown in figure 4. The excitation switch consists of a 4-way single-pole four-throw switch (SP 4T) and a 12-way single-pole single-throw switch one (SPST). The excitation signal is respectively output to the 3-path single-pole four-throw switch of the second stage after passing through the first single-pole four-throw switch of the first stage, and the output of the 3-path single-pole four-throw switch of the second stage is respectively sent to the 12-path single-pole single-throw switch and is output together.

The response switch comprises a first-stage single-pole four-throw switch II and a second-stage single-pole four-throw switch II;

and the excitation signal passes through the second first-stage single-pole four-throw switch and then is output to the second-stage single-pole four-throw switch, and is output to the plurality of second single-pole single-throw switches through the second-stage single-pole four-throw switch.

The second-stage single-pole four-throw switch is provided with 4 paths;

and the second-stage single-pole four-throw switch II is output to the 4 single-pole single-throw switches II.

The response switch is composed of a schematic block diagram as shown in fig. 5. The response switch is composed of a 5-way single-pole four-throw switch (SP 4T) and a 16-way single-pole single-throw switch (SPST). The excitation signal passes through the second first-stage single-pole four-throw switch and is respectively output to the second 4 paths of second-stage single-pole four-throw switches, and the outputs of the second 4 paths of second-stage single-pole four-throw switches are respectively sent to and output from the corresponding 16 paths of single-pole single-throw switches.

The key design technologies of the response switch mainly comprise: isolation design, insertion loss design, flatness design and anti-burning power design. The isolation of the switch module is determined by the isolation of the switch SP4T and the SPDT. The insertion loss of the switch module is determined by the losses of the switch SP4T and the SPDT, the losses of the peripheral circuits and the radio frequency connector. The flatness of the switch module is determined by the flatness of the switches SP4T and SPDT, the performance of the peripheral circuitry and the rf connectors. The burn-up resistance of the switch module is mainly determined by the maximum withstand power of the switch SP4T and the SPDT.

The digital control module comprises a network transceiving module, a message detection and distribution unit, a test information reporting unit, an excitation switch control unit, a local oscillator one control unit, a local oscillator two control unit, a response switch control unit and an RS485 transceiving module; the control computer sends a test command message to the message detection and distribution unit through the network transceiver module, the message detection and distribution unit analyzes the command message and then respectively sends the analyzed command message to the excitation switch control unit, the local oscillator I control unit, the local oscillator II control unit, the response switch control unit and the RS485 transceiver module to control the tested piece, test information of the tested piece is sent to the test information return unit through the RS485 transceiver module, and the test return information is sent to the control computer through the network transceiver module.

A test method of a microwave equipment test system comprises the following steps:

1) after the software normally runs, firstly, power-on self-test is carried out, a self-test result is given, and a user judges the working condition of the test system according to the self-test result and processes the working condition in time. After the software self-check is completed, the user loads the program parameters as required and restores the program state to the last working state. The user can also reset the running parameters of the program, and after the parameter setting is finished, the user carries out self-calibration (system calibration) on the system according to the requirement;

before the test starts, the user needs to complete the parameter setting of the test mode and the setting of the test scheme. And after the setting is finished, the user tests the tested equipment by selecting the test scheme. In the testing process, a user can determine the working state of the test through software state display. After the test is completed, the user can generate a test report by using the test data. As shown in fig. 6;

2) self-calibration

2.1) excitation switch calibration

2.11) selecting a signal source and a spectrometer for the test instrument as shown in FIG. 7;

the microwave cabinet is sequentially communicated with an Ethernet HUB, a digital control module and an excitation switch;

the frequency spectrograph is communicated with an excitation switch through a cable 1-1, and the excitation switch is connected with a tested piece through cables 2-1-2-12;

selecting an excitation switch channel, a signal frequency and excitation switch output power to be calibrated on a control computer; forming an excitation switch calibration system;

2.12) starting an excitation switch calibration system, and controlling a computer to respectively control signal source initialization and spectrometer initialization;

2.13) the control computer sends a switch control command to the digital control module;

2.14) the digital control module controls the excitation switch switching port;

2.15) controlling the computer to control the signal source to output signals;

2.16) controlling the computer to control the frequency spectrograph to read the signal power;

2.17) comparing the signal power read in the step 2.16) with the input power of the exciting switch set in the step 2.11);

2.171) when the two are equal, step 2.18) is performed;

2.172) when the two are not equal, controlling the computer to adjust the power of the output signal of the signal source, and skipping to the step 2.15) to operate downwards in sequence;

2.18) controlling the computer to record the current signal source power and finishing the calibration of the excitation switch.

2.2) responsive switch calibration

2.21) as shown in FIG. 9, the signal source and the spectrometer are still selected as the test instrument;

connecting a control computer with a signal source and a spectrometer through an Ethernet HUB in a microwave cabinet by a test cable;

the signal source is connected to the frequency spectrograph;

2.22) selecting the frequency of a signal source of an input response switch to be calibrated and the power of the signal source on a control computer, then calibrating the output power of the signal source by controlling the signal source and recording the frequency and power reading of a frequency spectrograph;

2.23) as shown in fig. 10, connecting the control computer with the digital control module through the ethernet HUB, the digital control module being connected with the response switch;

the signal source is connected with a response switch through a double-cathode adapter and cables 5-1-5-16, and the response switch is connected with a frequency spectrograph to form a response switch calibration system;

2.24) selecting a response switch channel, a signal frequency and a signal power which need to be calibrated on a control computer;

2.25) starting the response switch calibration system as shown in FIG. 11, and controlling the signal source initialization and the spectrometer initialization by the control computer respectively;

2.26) the control computer sends a switch control command to the digital control module;

2.27) the digital control module controls the response switch to switch the port;

2.28) controlling the output signal of the signal source controlled by the computer;

2.29) controlling the computer to control the frequency spectrograph to read the power of the measured signal;

2.210) comparing the signal power read in step 2.29) with the response switch input power set in step 2.24);

2.2101) when the two are equal, step 2.211) is performed;

2.2102) when the two are not equal, the control computer adjusts the output signal power of the signal source, and jumps to the step 2.28) to operate in turn;

2.211) controlling the computer to record the current signal source power and finishing the calibration of the response switch.

2.3) calibrating the local oscillator, as shown in FIG. 12;

2.31) jointing equipment, the test instrument chooses for use the frequency spectrograph:

the Ethernet HUB, the digital control module, the first local oscillator and the second local oscillator are connected in sequence in the microwave case;

the first local oscillator and the second local oscillator are connected with a frequency spectrograph through cables 3-1-3-4 and 4-1-4 respectively to form a local oscillator calibration system;

2.32) selecting a local oscillator, a local oscillator channel, a local oscillator output frequency and power which need to be calibrated on a control computer; starting a local oscillator calibration system, and controlling a computer to control the initialization of a frequency spectrograph;

2.33) the control computer sends a local oscillation control command to the digital control module;

2.34) the digital control module controls the frequency and the power of the local oscillator output signal;

2.35) controlling a computer to control a frequency spectrograph to read and record the signal power;

2.36) determining whether to adjust the output of the local oscillator power according to the power of the reading signal of the frequency spectrograph;

2.361) when the output of the local oscillator power needs to be adjusted, updating the local oscillator power control word, adjusting the local oscillator power, and skipping to execute the step 2.34);

2.362) when the output of the local oscillator power does not need to be adjusted, the step 2.37 is executed

2.37) finishing local oscillation calibration;

2.4) testing the device under test

Channel gain calibration test:

connecting equipment according to the attached figure 14, selecting parameters such as an excitation switch channel, a response switch channel, a local oscillator frequency, an input signal frequency, an output signal power and the like on a control computer, automatically reading the signal power measured by a frequency spectrograph, and calculating channel gain and reading by combining the excitation switch output power and the response switch insertion loss in self-calibration data. The channel gain test flow is shown in fig. 15.

The method for testing the tested equipment into the channel gain calibration test comprises the following steps:

the test instrument respectively selects a signal source and a frequency spectrograph; as shown in fig. 14;

10.1) starting a test system, and controlling a computer to sequentially control a signal source and the initialization of a frequency spectrometer so as to make the equipment perform relevant configuration;

10.2) controlling the computer to send a channel gain calibration test control command to the digital control module;

10.3) the digital control module controls an excitation switch, a response switch, a first local oscillator, a second local oscillator and a tested piece;

10.4) controlling the computer to control the signal source to output signals;

10.5) controlling a computer to control a frequency spectrograph to read power and record the channel gain of the tested piece;

10.6) determining whether to adjust the power of the tested piece according to the channel gain of the tested piece read by the frequency spectrograph;

10.61) when the power of the measured piece measured by the frequency spectrograph is not equal to the calculated power of the measured piece, updating a control word of the measured piece and skipping to the step 10.2;

10.62) when the measured piece power measured by the spectrometer is equal to the calculated measured piece power, executing the step 10.7);

10.8) the channel gain test flow is finished.

Noise figure test

The equipment is connected according to the attached figure 16, parameters such as an excitation switch channel, a response switch channel, an input signal frequency, an output signal power and the like are selected on a control computer, and test data of the noise coefficient tester are automatically read. The noise figure test flow is shown in figure 17.

In-band fluctuation testing of intermediate frequency

Connecting equipment according to the attached figure 14, selecting parameters such as an excitation switch channel, a response switch channel, a local oscillation frequency, an input signal frequency, an output signal power and the like on a control computer, automatically reading the signal power of each frequency point in an intermediate frequency band measured by a frequency spectrograph, calculating the fluctuation in the band and recording the fluctuation. The flow of the fluctuation test in the intermediate frequency band is shown in figure 18.

Intermodulation test

Connecting the devices according to the attached figure 14, selecting parameters such as an excitation switch channel, a response switch channel, a local oscillation frequency, an input signal frequency, an output signal power and the like on a control computer, and automatically reading and recording each intermodulation signal power measured by a frequency spectrograph. The intermodulation test flow is shown in figure 19.

Attenuation accuracy test

The device is connected according to the attached figure 14, parameters such as an excitation switch channel, a response switch channel, a local oscillation frequency, an input signal frequency, attenuation stepping and a range are selected on a control computer, and output signal power measured by a frequency spectrograph is automatically read and recorded. The attenuation accuracy test flow is shown in figure 20.

Modes of testing systems

The mode of the test system comprises 11 test modes of channel gain calibration, channel gain playback, clutter, out-of-band rejection, fluctuation in intermediate frequency band, P-1, intermodulation, attenuation precision, noise coefficient, standing wave and phase difference;

calibrating channel gain: and (4) a drop-down menu design mode is adopted, and a popup channel gain calibration dialog box is clicked. And setting channel gain calibration parameters including an excitation channel number, a response channel number, input power, input frequency, a control code change rule and the like through a dialog box.

Channel gain playback: and (4) a drop-down menu design mode is adopted, and a popup channel gain playback dialog box is clicked. Channel gain playback parameters are set via a dialog box, including excitation channel number, response channel number, input power, input frequency, playback files, etc.

Clutter: and (5) a menu design mode is pulled down, and a clutter dialog box is clicked and popped up. Clutter parameters including excitation channel number, response channel number, input power, input frequency, frequency bandwidth, reference amplitude, etc. are set via a dialog box.

Out-of-band suppression: and (5) a drop-down menu design mode is adopted, and a pop-up out-of-band suppression dialog box is clicked. Out-of-band rejection parameters are set via a dialog box, including excitation channel number, response channel number, input power, input frequency, out-of-band start frequency, out-of-band stop frequency, reference amplitude, and the like.

Fluctuation in the intermediate frequency band: and (4) a drop-down menu design mode is adopted, and a fluctuation dialog box in the intermediate frequency band is clicked and popped up. And setting fluctuation parameters in the intermediate frequency band through a dialog box, wherein the fluctuation parameters comprise an excitation channel number, a response channel number, input power, input frequency, frequency bandwidth, reference amplitude and the like.

P-1: and (5) in a menu pull-down mode, clicking a pop-up P-1 dialog box. The P-1 parameters are set through the dialog box, including the excitation channel number, the response channel number, the input power, the input frequency, the frequency bandwidth, the reference amplitude, the amplitude code law, etc.

Cross modulation: and (4) pulling down a menu mode, and clicking a pop-up intermodulation dialog box. And setting intermodulation parameters including an excitation channel number, a response channel number, input power, input frequency, frequency bandwidth, reference amplitude, amplitude code rule and the like through a dialog box.

Attenuation precision: and (4) a drop-down menu design mode is adopted, and a pop-up attenuation precision dialog box is clicked. Attenuation accuracy parameters including excitation channel numbers, response channel numbers, data source files, output files, and the like are set through the dialog boxes.

Noise coefficient: and (4) a drop-down menu design mode is adopted, and a pop-up noise coefficient dialog box is clicked. The noise figure parameters are set through a dialog box, including excitation channel number, response channel number, input power, input frequency, frequency bandwidth, reference amplitude, etc.

Standing waves: and (5) a menu design mode is pulled down, and a standing wave dialog box is clicked and popped up. The standing wave parameters, including excitation channel number, response channel number, input power, input frequency, frequency bandwidth, etc., are set via the dialog box.

Phase difference: and (5) a drop-down menu design mode is adopted, and a phase difference dialog box is clicked and popped up. Phase difference parameters including excitation channel number, response channel number, input power, input frequency, frequency bandwidth, etc. are set via a dialog box.

The present invention is not limited to the above-mentioned embodiments, and based on the technical solutions disclosed in the present invention, those skilled in the art can make some substitutions and modifications to some technical features without creative efforts according to the disclosed technical contents, and these substitutions and modifications are all within the protection scope of the present invention.

Claims (10)

1. A microwave equipment test system comprises a control computer, a power supply and an Ethernet HUB, and is characterized by also comprising a digital control module, an excitation switch, a first local oscillator, a second local oscillator and a response switch;

the control computer runs a display control program through the Ethernet HUB and the digital control module to realize the functions of test mode selection, test control parameter issuing, instrument control, test data display and admission;

the digital control module receives an Ethernet command sent by a control computer through a network receiving and sending module, converts the Ethernet command into control commands of the excitation switch, the response switch, the first local oscillator, the second local oscillator and the tested piece through a message detection and distribution unit, and controls the state switching of the tested piece;

the excitation switch is externally connected with at least two excitation signal cables, and one of the at least two excitation signal cables is gated under the control of the digital control module to realize the switching of signal paths;

the response switch is externally connected with at least two excitation signal cables, and one path of the at least two response signal cables is gated under the control of the digital control module to realize the switching of signal paths;

the first local oscillator generates a 9-15 GHz radio frequency signal under the control of the digital control module for amplitude modulation, and the signal is divided into four paths of power and output to a tested piece;

the second local oscillator generates a 9GHz radio frequency signal under the control of the digital control module to perform amplitude modulation, and the signal is divided into four paths to be output to a tested piece;

the excitation switch control unit controls the channel switching of the excitation switch, and after the microwave radio frequency signal is input into the unit, the switch is switched to the channel according to the requirement of the channel of the microwave tested piece;

the response switch control unit controls the channel switching of the response switch, and when the tested piece is tested, the switch is switched to the channel according to the requirement of the tested information;

the tested microwave piece can feed back running state information after being controlled, and the information is sent to the test information reporting unit through the RS485 receiving and sending module;

the test information reporting unit transmits the data to the display control software through the network transceiving module;

the self-checking state of the equipment is fed back by the feedback unit and is sent to the testing software through the network.

2. A microwave device test system in accordance with claim 1, characterized in that the ethernet HUB is provided with four network connection ports.

3. The microwave equipment testing system of claim 1, wherein the local oscillator I comprises a phase-locked loop I, a low-pass filter I, a voltage-controlled oscillator I, a numerical control frequency divider I, a first-stage numerical control attenuator I, an amplifier I, a second-stage numerical control attenuator I and a two-path power divider I which are sequentially communicated;

the output ends of the two paths of power dividers I are connected with the power dividers I which are divided into two paths;

the output end of the power divider is divided into two paths and then sequentially outputs the two paths of signals through the first amplifier and the first low-pass filter;

and one output end of the first voltage-controlled oscillator is connected with the first phase-locked loop, and the other output end of the first voltage-controlled oscillator is connected with the first numerical control frequency divider.

4. The microwave equipment testing system of claim 1, wherein the local oscillator II comprises a phase-locked loop II, a numerical control attenuator II, an amplifier II and two-path power divider module II which are sequentially communicated;

the output ends of the two paths of power dividers are connected with the power divider II divided into two paths;

and the output end of the second power divider is divided into two paths and then respectively output through the second amplifier and the second low-pass filter in sequence.

5. A microwave device testing system in accordance with claim 1, wherein the excitation switch comprises a first stage single pole four throw switch one and a plurality of second stage single pole four throw switches one;

and the excitation signal passes through the first single-pole four-throw switch of the first stage and then is output to the first single-pole four-throw switch of the second stage, and the excitation signal passes through the first single-pole four-throw switch of the second stage and then is output to the first single-pole single-throw switches.

6. A microwave device testing system in accordance with claim 5, wherein there are 3 paths for the first stage single pole four throw switch;

and the first single-pole four-throw switch of the second stage outputs to the first single-pole four-throw switch of the 4 paths.

7. A microwave device testing system in accordance with claim 1, wherein the response switch comprises a first stage single pole four throw switch two and a second stage single pole four throw switch two;

and the excitation signal passes through the second first-stage single-pole four-throw switch and then is output to the second-stage single-pole four-throw switch, and is output to the plurality of second single-pole single-throw switches through the second-stage single-pole four-throw switch.

8. A microwave device testing system in accordance with claim 7, wherein there are 4 switches for the second stage single pole four throw switch;

and the second-stage single-pole four-throw switch II is output to the 4 single-pole single-throw switches II.

9. A method for testing a microwave device testing system, comprising a microwave device testing system as claimed in claim 1, characterized by the steps of:

1) after the software normally runs, firstly, performing power-on self-test, after the software self-test is completed, setting running parameters of a program by a user, and after the parameter setting is completed, performing self-calibration on the system;

2) self-calibration

2.1) excitation switch calibration

2.11) selecting a signal source and a spectrometer for the test instrument;

the microwave cabinet is sequentially communicated with an Ethernet HUB, a digital control module and an excitation switch;

the frequency spectrograph is communicated with an excitation switch through a cable 1-1, and the excitation switch is connected with a tested piece through cables 2-1-2-12;

selecting an excitation switch channel, a signal frequency and excitation switch output power to be calibrated on a control computer; forming an excitation switch calibration system;

2.12) starting an excitation switch calibration system, and controlling a computer to respectively control signal source initialization and spectrometer initialization;

2.13) the control computer sends a switch control command to the digital control module;

2.14) the digital control module controls the excitation switch switching port;

2.15) controlling the computer to control the signal source to output signals;

2.16) controlling the computer to control the frequency spectrograph to read the signal power;

2.17) comparing the signal power read in the step 2.16) with the input power of the exciting switch set in the step 2.11);

2.171) when the two are equal, step 2.18) is performed;

2.172) when the two are not equal, controlling the computer to adjust the power of the output signal of the signal source, and skipping to the step 2.15) to operate downwards in sequence;

2.18) controlling the computer to record the current signal source power and finishing the calibration of the excitation switch;

2.2) responsive switch calibration

2.21) the test instrument still selects a signal source and a spectrometer;

connecting a control computer with a signal source and a spectrometer through an Ethernet HUB in a microwave cabinet by a test cable;

the signal source is connected to the frequency spectrograph;

2.22) selecting the frequency of a signal source of an input response switch to be calibrated and the power of the signal source on a control computer, then calibrating the output power of the signal source by controlling the signal source and recording the frequency and power reading of a frequency spectrograph;

2.23) connecting the control computer with a digital control module through an Ethernet HUB, wherein the digital control module is connected with a response switch;

the signal source is connected with a response switch through a double-cathode adapter and cables 5-1-5-16, and the response switch is connected with a frequency spectrograph to form a response switch calibration system;

2.24) selecting a response switch channel, a signal frequency and a signal power which need to be calibrated on a control computer;

2.25) starting a response switch calibration system, and controlling a computer to respectively control signal source initialization and spectrometer initialization;

2.26) the control computer sends a switch control command to the digital control module;

2.27) the digital control module controls the response switch to switch the port;

2.28) controlling the output signal of the signal source controlled by the computer;

2.29) controlling the computer to control the frequency spectrograph to read the power of the measured signal;

2.210) comparing the signal power read in step 2.29) with the response switch input power set in step 2.24);

2.2101) when the two are equal, step 2.211) is performed;

2.2102) when the two are not equal, the control computer adjusts the output signal power of the signal source, and jumps to the step 2.28) to operate in turn;

2.211) controlling the computer to record the current signal source power and finishing the calibration of the response switch;

2.3) local oscillator calibration

2.31) jointing equipment, the test instrument chooses for use the frequency spectrograph:

the Ethernet HUB, the digital control module, the first local oscillator and the second local oscillator are connected in sequence in the microwave case;

the first local oscillator and the second local oscillator are connected with a frequency spectrograph through cables 3-1-3-4 and 4-1-4 respectively to form a local oscillator calibration system;

2.32) selecting a local oscillator, a local oscillator channel, a local oscillator output frequency and power which need to be calibrated on a control computer; starting a local oscillator calibration system, and controlling a computer to control the initialization of a frequency spectrograph;

2.33) the control computer sends a local oscillation control command to the digital control module;

2.34) the digital control module controls the frequency and the power of the local oscillator output signal;

2.35) controlling a computer to control a frequency spectrograph to read and record the signal power;

2.36) determining whether to adjust the output of the local oscillator power according to the power of the reading signal of the frequency spectrograph;

2.361) when the output of the local oscillator power needs to be adjusted, updating the local oscillator power control word, adjusting the local oscillator power, and skipping to execute the step 2.34);

2.362) when the output of the local oscillation power does not need to be adjusted, executing the step 2.37);

2.37) finishing local oscillation calibration;

2.4) testing the tested equipment.

10. The method as claimed in claim 9, wherein the channel gain calibration test is performed on the device under test, and comprises the following steps:

10.1) starting a test system, and controlling a computer to sequentially control a signal source and the initialization of a frequency spectrometer so as to make the equipment perform relevant configuration;

10.2) controlling the computer to send a channel gain calibration test control command to the digital control module;

10.3) the digital control module controls an excitation switch, a response switch, a first local oscillator, a second local oscillator and a tested piece;

10.4) controlling the computer to control the signal source to output signals;

10.5) controlling a computer to control a frequency spectrograph to read power and record the channel gain of the tested piece;

10.6) determining whether to adjust the power of the tested piece according to the channel gain of the tested piece read by the frequency spectrograph;

10.61) when the power of the measured piece measured by the frequency spectrograph is not equal to the calculated power of the measured piece, updating a control word of the measured piece and skipping to the step 10.2;

10.62) when the measured piece power measured by the spectrometer is equal to the calculated measured piece power, executing the step 10.7);

10.7) the channel gain test flow ends.

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