CN112557768A - On-chip antenna test system and test method - Google Patents
On-chip antenna test system and test method Download PDFInfo
- Publication number
- CN112557768A CN112557768A CN202011322627.0A CN202011322627A CN112557768A CN 112557768 A CN112557768 A CN 112557768A CN 202011322627 A CN202011322627 A CN 202011322627A CN 112557768 A CN112557768 A CN 112557768A
- Authority
- CN
- China
- Prior art keywords
- antenna
- coordinate system
- tested
- test
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Abstract
The invention provides an on-chip antenna test system and a test method implemented by the same, wherein the test system comprises: the three-dimensional imaging device is used for being arranged on the servo mechanism and driven by the servo mechanism to acquire an image of the antenna to be tested so as to acquire a local coordinate system of the antenna to be tested, and the test probe is used for replacing the three-dimensional imaging device and is arranged on the servo mechanism to carry out scanning test on the antenna to be tested. The antenna to be tested is subjected to image acquisition by adopting the three-dimensional imaging device, the accurate geometric position of the antenna to be tested is obtained, and then a local coordinate system and a scanning coordinate system of the antenna to be tested can be established.
Description
Technical Field
The invention relates to the technical field of antenna testing, in particular to an on-chip antenna testing system and a testing method implemented by the same.
Background
Currently, with the increase of communication frequency, the size of the antenna is smaller and smaller, and the antenna can be integrated on a chip, i.e. an on-chip antenna is formed. The testing of the on-chip antenna provides challenges for the existing antenna testing equipment and testing method, and an antenna testing system suitable for the on-chip antenna is urgently needed in the industry.
The key performance of the on-chip antenna test system is that the system can accurately determine the position of an antenna to be tested, only the position of a piece to be tested is accurately determined, a coordinate system taking the piece to be tested as a center is established, and then the servo system establishes various scanning coordinate systems by taking the coordinate system as a reference, so that near-field or far-field scanning of the antenna can be realized, and the accurate radiation performance of the antenna can be obtained. The low-frequency antenna is large enough to be easily aligned by the traditional physical method, while the size of the on-chip antenna is only a few millimeters or even smaller, the positioning precision must reach 1/100 of the size of the antenna, and the positioning of the to-be-measured piece must be realized in a touch-free manner to prevent the to-be-measured piece from being damaged. For the millimeter wave antenna, due to the limitation of a small caliber radiation surface and a wavelength, a weak difference can cause a large phase error source, and the influence on a test result is large, so that for the millimeter wave antenna, the typical antenna size is about 1mm, and the positioning accuracy requirement reaches 10 um.
The existing non-touch positioning technology comprises magnetic field positioning, inertial navigation positioning, optical positioning technology and the like. Various positioning technologies are available, for example, a high-precision GPS positioning technology is expensive, but the positioning precision is at most millimeter level, and obviously does not meet the positioning requirement of an on-chip antenna. The inertial navigation positioning technology is an autonomous positioning mode with high positioning accuracy in a short time, but accumulated errors exist, the positioning accuracy is influenced by long-time work, and the inertial navigation positioning technology is not suitable for continuous high-intensity operation in industrial production.
Disclosure of Invention
The invention aims to provide an on-chip antenna test system based on visual calibration, so as to improve the efficiency and the precision of on-chip antenna calibration and reduce the cost.
Another objective of the present invention is to provide an on-chip antenna testing method implemented by the above-mentioned on-chip antenna testing system.
In order to achieve the above purpose, the invention provides the following technical scheme:
in a first aspect, the present invention provides a system for testing an on-chip antenna, comprising: the three-dimensional imaging device is used for being arranged on the servo mechanism and driven by the servo mechanism to acquire an image of the antenna to be tested so as to acquire a local coordinate system of the antenna to be tested, and the test probe is used for replacing the three-dimensional imaging device and is arranged on the servo mechanism to carry out scanning test on the antenna to be tested.
Optionally, the servo mechanism comprises a six-axis industrial robot, and the test probe is a test antenna or a test probe.
Optionally, the test probe performs near-field test on the antenna to be tested according to a plane scanning coordinate system constructed based on the local coordinate system of the antenna to be tested; or the test probe carries out remote test on the antenna to be tested according to an arc scanning coordinate system constructed based on the local coordinate system of the antenna to be tested.
As a second aspect, the present invention relates to an on-chip antenna testing method implemented by the above-described on-chip antenna testing system, including the steps of:
the method comprises the following steps: acquiring an image of an antenna to be detected and acquiring a local coordinate system of the antenna to be detected based on the image;
step two: and constructing a scanning coordinate system based on the local coordinate system of the antenna to be tested, and scanning the antenna to be tested according to the scanning coordinate system to complete the test task.
Optionally, the first step includes: mounting a three-dimensional imaging device on the servo mechanism; adjusting the position of the servo mechanism, and acquiring an image of the antenna to be detected through a three-dimensional imaging device; and calculating a local coordinate system of the antenna to be measured according to the image acquired by the three-dimensional imaging device.
Optionally, the first step further includes a step of judging whether the image acquired by the three-dimensional imaging device meets a preset condition, if so, executing the next step, and calculating a local coordinate system of the antenna to be measured; if not, the relative position between the servo mechanism and the antenna to be measured is readjusted, and the image is obtained again until the image meets the preset condition.
Specifically, the preset conditions are integrity and clear edge of the antenna to be detected in the image.
Optionally, in the step of calculating the local coordinate system of the antenna to be measured according to the image, three non-collinear feature points A, B, C are selected, the midpoint of the connecting line of B, C two points is taken as the origin, the direction parallel to the connecting line of A, B two points is taken as the X axis, the direction parallel to the connecting line of A, C two points is taken as the Y axis, and the Z axis is determined by combining the right-hand rule, so that the local coordinate system of the antenna to be measured is constructed.
Optionally, step two includes the following steps: taking down the three-dimensional imaging device, and mounting a test probe on the servo mechanism; constructing a scanning coordinate system based on a local coordinate system of the antenna to be detected; the servo mechanism drives the test probe to move according to the scanning coordinate system to scan the antenna to be tested.
Optionally, the scanning coordinate system is a plane scanning coordinate system or an arc scanning coordinate system, and is correspondingly used for performing near-field testing and far-field testing on the antenna to be tested.
The technical scheme provided by the invention has the beneficial effects that: according to the on-chip antenna test system and the test method, the three-dimensional imaging device is adopted to acquire the image of the antenna to be tested, the accurate geometric position of the antenna to be tested is obtained, the local coordinate system and the scanning coordinate system of the antenna to be tested can be further established, the structure and the operation of the test system are simple, the calibration efficiency is improved, and the cost is reduced. In addition, the six-axis industrial robot is used as a driving mechanism to drive the three-dimensional imaging device to calibrate the antenna to be tested, the test probe is driven to scan the antenna to be tested, the antenna to be tested does not need to be horizontally placed and can be obliquely placed, after calibration, the servo robot can automatically scan according to an inclined coordinate system, and the autonomous degree of freedom of testing is large.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly described below.
FIG. 1 is a schematic structural diagram of an on-chip antenna testing system according to an embodiment of the present invention, illustrating a three-dimensional imaging device mounted on a servo mechanism for performing a visual calibration on an antenna to be tested;
fig. 2 is a 3D imaging point cloud diagram of the antenna to be tested, which is acquired by the imaging device of the on-chip antenna testing system of the present invention, and shows a 3D image point cloud of the antenna to be tested and a local coordinate system established based on the 3D image feature points;
FIG. 3 is a flowchart illustrating a visual calibration of an antenna under test by the on-chip antenna test system according to the present invention;
FIG. 4 is a schematic structural diagram of an on-chip antenna test system according to an embodiment of the present invention, showing a test probe installed in a servo mechanism for performing a scan test on an antenna to be tested;
FIG. 5 is a schematic diagram of a near field test performed by the on-chip antenna test system according to an embodiment of the present invention, showing a planar scanning coordinate system established based on a local coordinate system;
fig. 6 is a schematic diagram of a remote test of an on-chip antenna test system according to another embodiment of the present invention, which shows an arc scan coordinate system established based on a local coordinate system.
Detailed Description
Embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather are provided for a more thorough and complete understanding of the present invention. It should be understood that the drawings and the embodiments of the present invention are illustrative only and are not intended to limit the scope of the present invention.
It should be understood that the various steps recited in the method embodiments of the present invention may be performed in a different order and/or performed in parallel. Moreover, method embodiments may include additional steps and/or omit performing the illustrated steps. The scope of the invention is not limited in this respect.
The term "include" and variations thereof as used herein are open-ended, i.e., "including but not limited to". The term "coupled" may refer to direct coupling or indirect coupling via intermediate members (elements). The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions for other terms will be given in the following description.
It should be noted that the terms "first", "second", and the like in the present invention are only used for distinguishing the devices, modules or units, and are not used for limiting the devices, modules or units to be different devices, modules or units, and are not used for limiting the sequence or interdependence relationship of the functions executed by the devices, modules or units.
Referring to fig. 1 to 6, the present invention relates to a test system for an on-chip antenna (hereinafter referred to as "test system") and a test method implemented by the test system, which are used to test the radiation performance of the on-chip antenna. The test system and the test method adopt the principle of visual calibration to position the on-chip antenna, and have the advantages of high positioning precision, high efficiency and lower cost.
The test system comprises a probe station 3, a servo mechanism 1, a three-dimensional imaging device 2 and a test probe 5, wherein the probe station 3 is used for placing an on-chip antenna to be tested (hereinafter referred to as "antenna to be tested 4"); the three-dimensional imaging device 2 is used for being installed on the servo mechanism 1, acquiring a three-dimensional image 21 of the antenna 4 to be tested in a calibration link of antenna testing, and acquiring an accurate geometric position of the antenna to be tested so as to calculate a local coordinate system 22 of the antenna to be tested and further calculate a scanning coordinate system; the test probe is used for replacing the three-dimensional imaging device to be installed on the servo mechanism, and the antenna to be tested is scanned in a scanning link of antenna test, so that the radiation performance of the antenna to be tested is obtained.
It should be understood that the present invention also relates to a host computer (not shown) and a vector network analyzer (not shown), so that the motion trajectory adjustment of the three-dimensional imaging device 2 and the test probe 5 is realized through the host computer controlling the servo mechanism, the image transmission and reception are controlled, the test result is processed, the test signal is output through the vector network analyzer, and the test signal is received and processed.
Optionally, the servo mechanism 1 is a six-axis industrial robot, the imaging resolution of the three-dimensional imaging device 2 is 0.01mm, and the test probe 5 is a test antenna or a test probe. Through selecting for use six industrial robot as actuating mechanism, actuating mechanism drives three-dimensional imaging device and calibrates the antenna that awaits measuring, and drive test probe scans the antenna that awaits measuring, has great degree of freedom, and the antenna that awaits measuring need not place horizontally, and the antenna that awaits measuring tilting is placed promptly, and after the calibration, six industrial robot can drive test probe and scan according to the coordinate system of slope automatically, and the autonomic degree of freedom of test is great. The imaging resolution of the three-dimensional imaging device 2 is 0.01mm, and the requirement of the accuracy of on-chip antenna calibration is met.
Optionally, the scanning coordinate system may be a planar scanning coordinate system 23, and is used for performing near field testing on the antenna to be tested; the scan coordinate system may also be an arc scan coordinate system 24 for performing far field testing on the antenna under test. Specifically, according to the test task, the upper computer outputs a control instruction to control the robot to drive the test probe to move according to the scanning coordinate system, and the antenna to be tested is scanned.
The plane scanning coordinate system refers to that when a test probe is driven by a servo mechanism to perform scanning test on an antenna to be tested, a mounting flange of the servo mechanism moves along a plane, and during the test, the flange coordinate system is on the plane at the same height.
The arc scanning coordinate system means that when the test probe is driven by the servo mechanism to perform scanning test on the antenna to be tested, the mounting flange of the servo mechanism moves along an arc, and during the test, the flange coordinate system is embodied as an arc at different heights.
The test method is implemented by the test system, and after the antenna to be tested is placed on the probe station, the following steps are implemented:
the method comprises the following steps: and acquiring an image of the antenna to be detected and acquiring a local coordinate system of the antenna to be detected based on the image.
Specifically, a three-dimensional imaging device is mounted on a servo mechanism; adjusting the position of the servo mechanism, and acquiring an image of the antenna to be detected through a three-dimensional imaging device; and calculating a local coordinate system of the antenna to be measured according to the image acquired by the three-dimensional imaging device.
Optionally, the first step further includes a step of determining whether the image acquired by the three-dimensional imaging device satisfies a preset condition, that is, determining whether the imaging quality is ideal. If yes, executing the next step, and calculating a local coordinate system of the antenna to be measured; if not, the relative position between the servo mechanism and the antenna to be measured is readjusted, and the image is obtained again until the image meets the preset condition. Specifically, the preset conditions are integrity and clear edge of the antenna to be detected in the image.
Optionally, in the step of calculating the local coordinate system of the antenna to be measured according to the image, three non-collinear feature points A, B, C are selected, the midpoint of the connecting line of B, C two points is taken as the origin, the direction parallel to the connecting line of A, B two points is taken as the X axis, the direction parallel to the connecting line of A, C two points is taken as the Y axis, and the Z axis is determined by combining the right-hand rule, so that the local coordinate system of the antenna to be measured is constructed.
Step two: and constructing a scanning coordinate system based on the local coordinate system of the antenna to be tested, and scanning the antenna to be tested according to the scanning coordinate system to complete the test task.
Specifically, after the calibration (i.e., positioning of the antenna to be tested) is completed, the three-dimensional imaging device 2 is taken down, and the test probe is installed on the servo mechanism; constructing a scanning coordinate system based on a local coordinate system of the antenna to be detected; the servo mechanism drives the test probe to move according to the scanning coordinate system to scan the antenna to be tested.
Optionally, the scanning coordinate system is a plane scanning coordinate system or an arc scanning coordinate system, and is correspondingly used for performing near-field testing and far-field testing on the antenna to be tested.
During specific antenna test scanning, a flange coordinate system of the robot mounting flange is adjusted to be parallel to a coordinate system of an antenna to be tested, specifically, an X axis of the flange coordinate system is parallel to and in the same direction as an X axis of the antenna to be tested, a Y axis of the flange coordinate system is parallel to and in the opposite direction to a Y axis of the antenna to be tested, a Z axis of the flange coordinate system is parallel to and in the opposite direction to a Z axis of the antenna to be tested, and the specific scanning coordinate systems are respectively a plane scanning coordinate system and an arc scanning coordinate system as shown in fig. 5 and 6 and are used for respectively corresponding to the antenna to be tested to carry out near field testing and.
According to the on-chip antenna test system and the test method, the three-dimensional imaging device is adopted to acquire the image of the antenna to be tested, so that a local coordinate system and a scanning coordinate system of the antenna to be tested can be established, the test system is simple in structure and simple and easy to implement in operation steps, the calibration efficiency and the calibration accuracy are improved, and in addition, the cost is also reduced.
The foregoing description is only exemplary of the preferred embodiments of the invention and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the invention according to the present invention is not limited to the specific combination of the above-mentioned features, but also encompasses other embodiments in which any combination of the above-mentioned features or their equivalents is possible without departing from the scope of the invention as defined by the appended claims. For example, the above features and (but not limited to) features having similar functions of the present invention are mutually replaced to form the technical solution.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
Claims (10)
1. An on-chip antenna test system, comprising: the three-dimensional imaging device is used for being arranged on the servo mechanism and driven by the servo mechanism to acquire an image of the antenna to be tested so as to acquire a local coordinate system of the antenna to be tested, and the test probe is used for replacing the three-dimensional imaging device and is arranged on the servo mechanism to carry out scanning test on the antenna to be tested.
2. The on-chip antenna test system of claim 1, wherein the servo mechanism comprises a six-axis industrial robot and the test probe is a test antenna or a test probe.
3. The system for testing the on-chip antenna according to claim 1, wherein the test probe performs near-field testing on the antenna to be tested according to a plane scanning coordinate system constructed based on a local coordinate system of the antenna to be tested; or the test probe carries out remote test on the antenna to be tested according to an arc scanning coordinate system constructed based on the local coordinate system of the antenna to be tested.
4. A method for testing an on-chip antenna, implemented by the system for testing an on-chip antenna according to any one of claims 1 to 3, comprising the steps of:
the method comprises the following steps: acquiring an image of an antenna to be detected and acquiring a local coordinate system of the antenna to be detected based on the image;
step two: and constructing a scanning coordinate system based on the local coordinate system of the antenna to be tested, and scanning the antenna to be tested according to the scanning coordinate system to complete the test task.
5. The method of claim 4, wherein step one comprises:
mounting a three-dimensional imaging device on the servo mechanism;
adjusting the position of the servo mechanism, and acquiring an image of the antenna to be detected through a three-dimensional imaging device;
and calculating a local coordinate system of the antenna to be measured according to the image acquired by the three-dimensional imaging device.
6. The method for testing the on-chip antenna according to claim 5, wherein the first step further comprises the step of judging whether the image acquired by the three-dimensional imaging device meets a preset condition, if so, executing the next step of calculating a local coordinate system of the antenna to be tested; if not, the relative position between the servo mechanism and the antenna to be measured is readjusted, and the image is obtained again until the image meets the preset condition.
7. The method of claim 6, wherein the predetermined condition is integrity and edge definition of the antenna to be tested in the image.
8. The method as claimed in claim 6, wherein in the step of calculating the local coordinate system of the antenna under test from the image, three feature points A, B, C that are not collinear are selected, and a middle point of a line connecting two points B, C is used as an origin, a direction parallel to a line connecting two points A, B is used as an X-axis, a direction parallel to a line connecting two points A, C is used as a Y-axis, and a Z-axis is determined in combination with a right-hand rule to construct a three-dimensional coordinate system, thereby forming the local coordinate system of the antenna under test.
9. The method for testing the on-chip antenna according to claim 4, wherein the step two comprises the following steps:
taking down the three-dimensional imaging device, and mounting a test probe on the servo mechanism;
constructing a scanning coordinate system based on a local coordinate system of the antenna to be detected;
the servo mechanism drives the test probe to move according to the scanning coordinate system to scan the antenna to be tested.
10. The method for testing the on-chip antenna according to claim 9, wherein the scanning coordinate system is a planar scanning coordinate system or an arc scanning coordinate system, and the method is applied to near-field testing and far-field testing of the antenna to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011322627.0A CN112557768A (en) | 2020-11-23 | 2020-11-23 | On-chip antenna test system and test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011322627.0A CN112557768A (en) | 2020-11-23 | 2020-11-23 | On-chip antenna test system and test method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112557768A true CN112557768A (en) | 2021-03-26 |
Family
ID=75043092
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011322627.0A Pending CN112557768A (en) | 2020-11-23 | 2020-11-23 | On-chip antenna test system and test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112557768A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113139157A (en) * | 2021-04-22 | 2021-07-20 | 中山香山微波科技有限公司 | Method for calculating main energy direction of DUT (device under test) and computer equipment |
| CN115406354A (en) * | 2022-10-19 | 2022-11-29 | 成都瑞迪威科技有限公司 | Intelligent alignment correction method for linear polarization phased array antenna |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7876276B1 (en) * | 2006-08-02 | 2011-01-25 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Antenna near-field probe station scanner |
| CN102252653A (en) * | 2011-06-27 | 2011-11-23 | 合肥工业大学 | Position and attitude measurement method based on time of flight (TOF) scanning-free three-dimensional imaging |
| CN104931799A (en) * | 2015-04-30 | 2015-09-23 | 中国电子科技集团公司第四十一研究所 | On-chip antenna electrical property test system and method |
| CN106291134A (en) * | 2016-11-10 | 2017-01-04 | 成都锐芯盛通电子科技有限公司 | Antenna intelligent test system based on robot and method of testing |
| CN108180834A (en) * | 2018-02-05 | 2018-06-19 | 中铁二十二局集团有限公司 | A kind of industrial robot is the same as three-dimensional imaging instrument position orientation relation scene real-time calibration method |
| CN209551735U (en) * | 2019-01-14 | 2019-10-29 | 南京智造兴邦机器人有限公司 | A kind of simultaneous guiding sensor of robot three-dimensional imaging |
| CN110488099A (en) * | 2019-06-28 | 2019-11-22 | 成都华兴大地科技有限公司 | A kind of test macro and its application method for millimeter wave antenna near field calibration and width scanning phase |
| CN110618408A (en) * | 2019-08-30 | 2019-12-27 | 西安空间无线电技术研究所 | System calibration method for antenna phase center of precision distance measurement system |
| CN211374898U (en) * | 2019-10-09 | 2020-08-28 | 中山香山微波科技有限公司 | Antenna test system |
| CN111965439A (en) * | 2020-06-24 | 2020-11-20 | 中国电子科技集团公司第十四研究所 | Antenna testing system, method and device based on mechanical arm |
-
2020
- 2020-11-23 CN CN202011322627.0A patent/CN112557768A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7876276B1 (en) * | 2006-08-02 | 2011-01-25 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Antenna near-field probe station scanner |
| CN102252653A (en) * | 2011-06-27 | 2011-11-23 | 合肥工业大学 | Position and attitude measurement method based on time of flight (TOF) scanning-free three-dimensional imaging |
| CN104931799A (en) * | 2015-04-30 | 2015-09-23 | 中国电子科技集团公司第四十一研究所 | On-chip antenna electrical property test system and method |
| CN106291134A (en) * | 2016-11-10 | 2017-01-04 | 成都锐芯盛通电子科技有限公司 | Antenna intelligent test system based on robot and method of testing |
| CN108180834A (en) * | 2018-02-05 | 2018-06-19 | 中铁二十二局集团有限公司 | A kind of industrial robot is the same as three-dimensional imaging instrument position orientation relation scene real-time calibration method |
| CN209551735U (en) * | 2019-01-14 | 2019-10-29 | 南京智造兴邦机器人有限公司 | A kind of simultaneous guiding sensor of robot three-dimensional imaging |
| CN110488099A (en) * | 2019-06-28 | 2019-11-22 | 成都华兴大地科技有限公司 | A kind of test macro and its application method for millimeter wave antenna near field calibration and width scanning phase |
| CN110618408A (en) * | 2019-08-30 | 2019-12-27 | 西安空间无线电技术研究所 | System calibration method for antenna phase center of precision distance measurement system |
| CN211374898U (en) * | 2019-10-09 | 2020-08-28 | 中山香山微波科技有限公司 | Antenna test system |
| CN111965439A (en) * | 2020-06-24 | 2020-11-20 | 中国电子科技集团公司第十四研究所 | Antenna testing system, method and device based on mechanical arm |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113139157A (en) * | 2021-04-22 | 2021-07-20 | 中山香山微波科技有限公司 | Method for calculating main energy direction of DUT (device under test) and computer equipment |
| CN113139157B (en) * | 2021-04-22 | 2022-03-08 | 中山香山微波科技有限公司 | Method for calculating main energy direction of DUT (device under test) and computer equipment |
| CN115406354A (en) * | 2022-10-19 | 2022-11-29 | 成都瑞迪威科技有限公司 | Intelligent alignment correction method for linear polarization phased array antenna |
| CN115406354B (en) * | 2022-10-19 | 2023-01-31 | 成都瑞迪威科技有限公司 | Intelligent alignment correction method for linear polarization phased array antenna |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7436522B2 (en) | Method for determining the 3D coordinates of the surface of an object | |
| CN110618408B (en) | System calibration method for antenna phase center of precision distance measurement system | |
| JP2022039903A (en) | Calibration block and hand eye calibration method for line laser sensor | |
| CN110044293B (en) | Three-dimensional reconstruction system and three-dimensional reconstruction method | |
| JPH1183438A (en) | Position calibration method for optical measuring device | |
| CN112557768A (en) | On-chip antenna test system and test method | |
| US10913156B2 (en) | Robot system with end tool metrology position coordinates determination system | |
| CN107993958B (en) | Orthogonality compensation method and compensation system in semiconductor defect detection/photoetching | |
| US8171771B2 (en) | Calibration for a nondestructive material testing system | |
| JP2019100898A (en) | Measurement device, and assembling method of total station and two-dimensional scanner | |
| CN109719726A (en) | A kind of mechanical arm hand and eye calibrating device and method | |
| EP2743638A1 (en) | An apparatus for optical measurement and/or optical calibration of a position of an object in space | |
| CN112557769B (en) | On-chip antenna test system and test method | |
| JP2000074662A (en) | Method for calibrating coordinate axes squareness error and 3-dimension shape measuring device | |
| JP7414643B2 (en) | Shape measuring device and shape measuring method | |
| TWM508389U (en) | Image three-dimensional spatial error detection system | |
| JP2017053793A (en) | Measurement device, and manufacturing method of article | |
| CN114111578B (en) | Automatic pose determining method for large-caliber element | |
| CN115542024A (en) | Antenna pattern near field measurement method | |
| CN112444200B (en) | Workbench equipment and method for measuring vertical zero clearing error of workbench | |
| CN208937633U (en) | The placement position positioning correcting structure of comprehensive adjustment formula determinand | |
| JP2006098251A (en) | Shape measuring instrument and shape measuring method | |
| KR101480663B1 (en) | measuring method of underwater hydrophone array location using linear stage | |
| KR101005900B1 (en) | System for a movable coordinate measurement system with indoor GPS and measurement method thereof | |
| CN114019343B (en) | Calibration adapter plate positioning device of large-scale integrated circuit test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20210326 |