CN112540262A - Voltage time type feeder automation test system and test method thereof - Google Patents
Voltage time type feeder automation test system and test method thereof Download PDFInfo
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- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
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Abstract
本申请公开了一种电压时间型馈线自动化测试系统及其测试方法，所述系统包括：包括终端、控制后台及多个测试仪，终端与控制后台连接，控制后台与多个测试仪连接，多个测试仪与被测线路中各个开关上的馈线终端一一对应连接；终端用于获取针对多个测试仪的多个测试用例，将测试用例发送至控制后台；控制后台用于根据各测试用例的获取顺序，形成测试序列后，向各测试仪同时发送控制信号；测试仪用于根据控制信号，从控制后台的测试序列中依次抽取测试用例进行测试，并将测试获取到的测试信号实时发送至控制后台，直至完成测试序列中各测试用例的测试。
The present application discloses a voltage-time feeder automatic testing system and a testing method thereof. The system includes: a terminal, a control background and multiple testers, the terminal is connected to the control background, the control background is connected to the multiple testers, and Each tester is connected to the feeder terminals on each switch in the line under test in a one-to-one correspondence; the terminal is used to obtain multiple test cases for multiple testers, and send the test cases to the control background; the control background is used for each test case After the test sequence is formed, the control signal is sent to each tester at the same time; the tester is used to sequentially extract test cases from the test sequence in the control background according to the control signal for testing, and send the test signal obtained by the test in real time. to the control background until the test of each test case in the test sequence is completed.
Description
Technical Field
The application relates to the technical field of distribution automation, in particular to a voltage time type feeder automation test system and a test method thereof.
Background
Distribution network automation is an important component of a smart power grid, and can automatically and quickly realize positioning and isolation of distribution network faults and ensure that users can quickly recover power. Feeder automation is an indispensable part of distribution automation, and rapid fault positioning can be realized through feeder automation.
The automatic system of the feed-forward line mainly takes a voltage-time type as a main part, and realizes primary closing to isolate a fault section by matching the working characteristics of a switch, namely no-voltage opening and incoming call delay closing, with secondary closing of a wire outlet switch of a transformer substation, and the secondary closing restores power supply of a non-fault section. Since the parameter configuration of the voltage-time type feeder automation is complicated, in order to ensure that the feeder automation operates normally according to a predetermined logic, the feeder terminal must be tested before commissioning. In the existing test mode for completely testing a line comprising a plurality of switches, a tester is connected to a feeder terminal connected with one switch to test the area, and after the test of the area is completed, the tester is connected to the feeder terminal connected with other switches to test. However, the efficiency of the test mode is low, and due to the characteristic of the simultaneity of the electrical data, the test result of the local test at the current time cannot well reflect the test condition of the whole line at the current time, so that the test result is inaccurate.
Disclosure of Invention
The present application is directed to at least solve one of the technical problems in the prior art, and provides a voltage time type feeder automation test system and a test method thereof, which improve the accuracy and efficiency of the test.
The embodiment of the application provides a voltage time type feeder automatic test system, which comprises a terminal, a control background and a plurality of testers, wherein the terminal is connected with the control background, the control background is connected with the testers, and the testers are connected with feeder terminals on switches in a tested circuit in a one-to-one correspondence manner;
the terminal is used for acquiring a plurality of test cases aiming at a plurality of testers and sending the test cases to the control background, the test cases comprise test state sections of the switches, and the starting time and the ending time of the test state sections of the switches are the same;
the control background is used for simultaneously sending control signals to the testers after forming a test sequence according to the acquisition sequence of the test cases, and the control signals are used for indicating the testers to synchronously execute the test operation indicated by the control signals and carry out state feedback;
the tester is used for sequentially extracting the test cases from the test sequence of the control background to test according to the control signal, and sending the test signals obtained by the test to the control background in real time until the test of each test case in the test sequence is completed.
Further, the tester is specifically configured to:
and acquiring the corresponding test state section from the extracted test case, and controlling the corresponding feeder terminal to test according to the acquired test state section until the test duration reaches the section duration of the acquired test state section.
Further, the control background is further configured to:
and receiving the current test signals of each tester, performing signal operation on each current test signal, generating corresponding current test data, and sending each current test data to the terminal so that the terminal displays each current test data in a display interface.
Further, the terminal is further configured to:
and displaying the current test data in each pre-divided area of the display interface, wherein each tester corresponds to each pre-divided area one to one.
Further, the control background comprises a controller and a plurality of sub-modules which are all configured with an MCU, each sub-module is correspondingly connected with each tester one by one through a first connecting wire for transmitting control signals, each sub-module is respectively connected with the controller, and the controller is connected with the terminal;
and the controller is used for simultaneously sending the control signals to the testers through the first-type connecting lines of the submodules after forming a test sequence according to the acquisition sequence of the test cases.
Furthermore, each sub-module is connected with each tester in a one-to-one correspondence manner through a second type connecting line for transmitting the test signal, and each sub-module is connected with the controller through the second type connecting line;
each sub-module is used for receiving the current test signal of each tester through the second-type connecting wire, performing signal operation on each current test signal respectively, generating corresponding current test data, and then sending each current test data to the terminal through the controller.
Further, the test state section comprises a test voltage signal, a test current signal, a state quantity, a control input quantity and a communication control quantity.
Further, there is provided a testing method of the voltage-time feeder automation testing system according to the above embodiment, including:
the terminal acquires a plurality of test cases aiming at a plurality of testers and sends the test cases to the control background, wherein the test cases comprise test state sections of the switches, and the starting time and the ending time of the test state sections of the switches are the same;
the control background forms a test sequence according to the acquisition sequence of each test case, and simultaneously sends control signals to each tester, wherein the control signals are used for instructing each tester to synchronously execute the test operation indicated by the control signals and carry out state feedback;
and the tester sequentially extracts the test cases from the test sequence of the control background for testing according to the control signal, and sends the test signals obtained by testing to the control background in real time until the test of each test case in the test sequence is completed.
Further, the extracting the test case for testing includes:
and acquiring the corresponding test state section from the extracted test case, and controlling the corresponding feeder terminal to test according to the acquired test state section until the test duration reaches the section duration of the acquired test state section.
Further, the method also comprises the following steps:
and the control background receives the current test signals of each tester, performs signal operation on each current test signal, generates corresponding current test data, and sends each current test data to the terminal so that the terminal displays each current test data in a display interface.
Compared with the prior art, the embodiment is based on the characteristic of electrical data simultaneity, the control background is utilized to simultaneously send the test cases to each tester corresponding to each feeder terminal, so that each tester synchronously tests according to the same test case switching principle and ending principle, synchronous testing of each feeder terminal in a tested line is realized, and the testing accuracy and the testing efficiency are improved. And by means of sending the test cases to each tester when testing is needed, the problem that the tester cannot store all the test cases due to the problem of memory and further cannot test part of the test cases due to excessive test cases is avoided.
In the embodiment, after the terminal receives the real-time test data of each tester, each current test data is displayed in each pre-divided area of the display interface, so that a user can determine which area of the tested line has a problem according to the display in real time and independently debug the test result.
In addition, in this embodiment, the workload of one MCU is distributed to a plurality of sub-modules, each sub-module can be configured with one MCU, and each sub-module is connected to each tester, so that the control signal sent to each tester and the test signal fed back by each tester are processed and operated by each sub-module, thereby reducing the operation burden. In addition, the control signals are transmitted through the first type of connecting lines, and the test signals are transmitted through the second type of connecting lines, so that signal isolation is realized.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a system architecture of a voltage-time feeder automation test system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of another system architecture of the VSC-feeder automated test system according to an embodiment of the present invention;
FIG. 3 is a flowchart illustrating a testing method of the voltage-time feeder automation testing system according to an embodiment of the present invention;
fig. 4 is another flow chart illustrating a testing method of the automated testing system for voltage-time feeder according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the system architecture of the voltage time type feeder automation test system in an embodiment is schematically illustrated, and the system architecture includes a terminal 101, a control background 102, and a plurality of testers 103, where the terminal 101 is connected to the control background 102, the control background 102 is connected to the plurality of testers 103, and the plurality of testers 103 are connected to the feeder terminals 101 on each switch in a tested line in a one-to-one correspondence manner.
The terminal 101 is configured to obtain a plurality of test cases for a plurality of testers 103, and send the test cases to the control background 102, where the test cases include a plurality of test periods and test state sections of each switch in the test periods, and start time and end time of the test state sections of each switch in the same test period are the same. The control background 102 is configured to form a test sequence according to an acquisition sequence of each test case, and then send a control signal to each tester 103 at the same time, where the control signal is used to instruct each tester 103 to synchronously execute a test operation indicated by the control signal and perform state feedback. The tester 103 is configured to sequentially extract test cases from the test sequence of the control background 102 for testing according to the control signal, and send the test signal obtained by the test to the control background 102 in real time until the test of each test case in the test sequence is completed.
In an embodiment, the terminal 101 may refer to any intelligent terminal such as a notebook computer, a desktop computer, a smart phone, and a tablet computer, and is used for providing a user with configuration of a test case. Preferably, each test case includes a plurality of test periods and a test profile of each switch in each test period. The test section of each switch in the simultaneous test period starts and lasts for a long time, and the test state sections of each switch are sequentially arranged according to the test time sequence. Each test section is provided with a unique section serial number in the test case, and each test section comprises a test voltage signal, a test current signal, a state quantity, a control input quantity and a communication control quantity. The testing voltage signal comprises a three-phase testing voltage signal and a zero line testing voltage signal, the testing current signal comprises a three-phase testing current signal and a zero line testing current signal, and the state quantity comprises a switching-off state of a switch, a switching-on state of the switch, a fault indicator state in a tested line, an overcurrent indicator state in the tested line, a grounding switch state, a switching-on locking state, a remote local state and a switching-off locking state; the control input quantity comprises a control component and a control combination quantity.
After receiving each test case, the control background 102 forms a control signal according to the test voltage signal, the test current signal, the state quantity, the control input quantity and the communication control quantity of the test section in the test case, and sends the control signal to each tester, so that each tester 103 performs testing according to the control signal. The control background 102 sequentially sends corresponding control signals to each tester 103 according to the sequence of the test sequence, and after each tester 103 completes the test according to the previous control signal, the control background 102 continues to send the next control signal to each tester 103, so that inconsistency of tests performed on each tester 103 at the same time is avoided, and accuracy of the test result is improved.
In one embodiment, the tester 103 is specifically configured to: and acquiring a corresponding test state section from the extracted test case, and controlling a corresponding feeder terminal to test according to the acquired test state section until the test duration reaches the section duration of the acquired test state section.
In one embodiment, the control back office 102 is further configured to: and receiving current test signals of each tester, performing signal operation on each current test signal, generating corresponding current test data, and sending each current test data to the terminal so that the terminal displays each current test data in a display interface.
In an embodiment, the control background 102 performs digital-to-analog conversion on the test signals received from the respective testers 103 in real time, generates corresponding test data, and then sends the test data corresponding to the respective testers 103 to the terminal 101 in real time. The terminal 101 is configured to display each current test data in each pre-divided area of the display interface after receiving the real-time test data of each tester 103, where each tester corresponds to each pre-divided area one to one, so that a user can determine which area of the tested line has a problem according to the display in real time.
In an embodiment, a user may observe the test condition of each tester 103 in the display interface of the terminal, and if it is found that there is a test instrument 103 out of synchronization with other tester 103, it indicates that the test of the tester 103 is abnormal. At this time, the background can be controlled to control other abnormal testers 103 to close the test, and then the abnormal testers 103 are independently debugged until the abnormal testers 103 are recovered to normal.
Compared with the prior art, the embodiment is based on the characteristic of electrical data simultaneity, the control background is utilized to simultaneously send the test cases to each tester corresponding to each feeder terminal, so that each tester synchronously tests according to the same test case switching principle and ending principle, synchronous testing of each feeder terminal in a tested line is realized, and the testing accuracy and the testing efficiency are improved. And by means of sending the test cases to each tester when testing is needed, the problem that the tester cannot store all the test cases due to the problem of memory and further cannot test part of the test cases due to excessive test cases is avoided.
Because signal operation is required in the voltage time type feeder automation test, if a single MCU is adopted to perform signal operation on a plurality of signals, the load of the MCU is too heavy. To solve the above problem, fig. 2 is a schematic diagram of a system architecture of a voltage-time feeder automation test system according to another embodiment of the present application.
In this embodiment, the control background 102 includes a controller 201 and a plurality of sub-modules 202 each configured with an MCU, each sub-module 202 is connected to each tester 103 in a one-to-one correspondence manner through a first-type connection line for transmitting a control signal, each sub-module 202 is connected to the controller 201, and the controller 201 is connected to the terminal 101.
The controller 201 is configured to form a test sequence according to the acquisition sequence of each test case, and then send a control signal to each tester 103 through the first connection line of each sub-module 202.
In one embodiment, each sub-module 202 is connected to a detection (CK) signal line of the controller 201, each CK port of the controller 201 is connected to one sub-module 202 through a detection (CK) signal line, and the controller 201 is further configured to determine whether to connect the sub-module 202 in response to a detection (CK) signal transmitted through the detection (CK) signal line.
In one embodiment, each sub-module 202 is connected to each tester 203 in a one-to-one correspondence via a second type of connection line for transmitting test signals, and each sub-module 202 is connected to the controller 201 via the second type of connection line. Each sub-module 202 is configured to receive a current test signal of each tester 203 through a second type connection line, perform signal operation on each current test signal, generate corresponding current test data, and send each current test data to the terminal 101 through the controller 201.
In one embodiment, the second type of connection line comprises an RS485 bidirectional serial data line, and the RS485 communication ports of all the sub-modules are connected to the RS485 communication port of the bus controller through the RS485 bidirectional serial data line; in this embodiment, the plurality of RS485 bidirectional serial data lines may be connected in parallel through the distributor and then connected to the RS485 communication port of the bus controller.
The work load of one MCU is distributed to a plurality of sub-modules, each sub-module can be configured with one MCU and is respectively connected with each tester, so that the control signal sent to each tester and the test signal fed back by each tester are respectively processed and operated by each sub-module, and the operation burden is reduced. In addition, the control signals are transmitted through the first type of connecting lines, and the test signals are transmitted through the second type of connecting lines, so that signal isolation is realized.
Further, referring to fig. 3, a flowchart of a testing method of the voltage-time feeder automation testing system according to an embodiment of the present application is shown. Wherein a voltage time-type feeder automation test system is shown in fig. 1. The test method comprises the following steps:
and step S11, the terminal acquires a plurality of test cases aiming at a plurality of testers and sends the test cases to the control background, the test cases comprise test state sections of all switches, and the starting time and the ending time of the test state sections of all switches are the same.
And step S12, after forming a test sequence according to the acquisition sequence of each test case, the control background sends a control signal to each tester at the same time, and the control signal is used for indicating each tester to synchronously execute the test operation indicated by the control signal and carry out state feedback.
And step S13, the tester sequentially extracts the test cases from the test sequence of the control background according to the control signal to test, and sends the test signals obtained by the test to the control background in real time until the test of each test case in the test sequence is completed.
In one embodiment, step S13 further includes:
and acquiring a corresponding test state section from the extracted test case, and controlling a corresponding feeder terminal to test according to the acquired test state section until the test duration reaches the section duration of the acquired test state section.
Compared with the prior art, the embodiment is based on the characteristic of electrical data simultaneity, the control background is utilized to simultaneously send the test cases to each tester corresponding to each feeder terminal, so that each tester synchronously tests according to the same test case switching principle and ending principle, synchronous testing of each feeder terminal in a tested line is realized, and the testing accuracy and the testing efficiency are improved. And by means of sending the test cases to each tester when testing is needed, the problem that the tester cannot store all the test cases due to the problem of memory and further cannot test part of the test cases due to excessive test cases is avoided.
In an embodiment, as shown in fig. 2, the control background includes a controller and a plurality of sub-modules each configured with an MCU, each sub-module is connected to each tester one-to-one through a first connection line for transmitting a control signal, each sub-module is connected to the controller, and the controller is connected to the terminal. Wherein, step S12 further includes: and after a test sequence is formed according to the acquisition sequence of each test case, a control signal is simultaneously sent to each tester through the first-class connecting line of each submodule.
Furthermore, each submodule is used for receiving the current test signal of each tester through the second connecting line, performing signal operation on each current test signal respectively, generating corresponding current test data, and then sending each current test data to the terminal through the controller. Step S13 further includes: and each submodule receives the current test signal of each tester through the second connecting wire, performs signal operation on each current test signal respectively, generates corresponding current test data, and sends each current test data to the terminal through the controller.
The work load of one MCU is distributed to a plurality of sub-modules, each sub-module can be configured with one MCU and is respectively connected with each tester, so that the control signal sent to each tester and the test signal fed back by each tester are respectively processed and operated by each sub-module, and the operation burden is reduced. In addition, the control signals are transmitted through the first type of connecting lines, and the test signals are transmitted through the second type of connecting lines, so that signal isolation is realized.
In one embodiment, as shown in fig. 4, a schematic flow chart of a testing method of a voltage time type feeder automation testing system in another embodiment of the present application is shown. Wherein a voltage time-type feeder automation test system is shown in fig. 1. In addition to the steps shown in fig. 3, the method further includes:
and step S14, the control background receives the current test signals of each tester, performs signal operation on each current test signal, generates corresponding current test data, and sends each current test data to the terminal, so that the terminal displays each current test data in the display interface.
In one embodiment, step S14 further includes: and displaying the current test data in each pre-divided area of the display interface, wherein each tester corresponds to each pre-divided area one to one.
Based on the characteristic of electrical data simultaneity, the control background is utilized to simultaneously send the test cases to each tester corresponding to each feeder terminal, so that each tester synchronously tests according to the same test case switching principle and ending principle, synchronous testing of each feeder terminal in the tested circuit is realized, and the testing accuracy and testing efficiency are improved. And by means of sending the test cases to each tester when testing is needed, the problem that the tester cannot store all the test cases due to the problem of memory and further cannot test part of the test cases due to excessive test cases is avoided.
In the embodiment, after the terminal receives the real-time test data of each tester, each current test data is displayed in each pre-divided area of the display interface, so that a user can determine which area of the tested line has a problem according to the display in real time and independently debug the test result.
In this embodiment, the workload of one MCU is distributed to a plurality of sub-modules, each sub-module can be configured with one MCU, and each sub-module is connected to each tester, so that the control signal sent to each tester and the test signal fed back by each tester are processed and operated by each sub-module, thereby reducing the operation burden. In addition, the control signals are transmitted through the first type of connecting lines, and the test signals are transmitted through the second type of connecting lines, so that signal isolation is realized.
The above embodiments of the present invention are described in detail, and the principle and the implementation manner of the present invention should be described herein by using specific embodiments, and the above description of the embodiments is only used to help understanding the method of the present invention and the core idea thereof; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113484612A (en) * | 2021-08-19 | 2021-10-08 | 广东电网有限责任公司东莞供电局 | Insulation resistance test system and test method based on automatic identification |
Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63139263A (en) * | 1986-12-01 | 1988-06-11 | Kansai Electric Power Co Inc:The | Automatic test apparatus for distribution line section |
| CN1582393A (en) * | 2001-11-05 | 2005-02-16 | 奥林巴斯株式会社 | Substrate inspecting device |
| KR20090119058A (en) * | 2008-05-15 | 2009-11-19 | 고윤석 | Intelligent FRT-based Fault Section Determination and Autonomous Separation Method in Distribution System |
| CN102901896A (en) * | 2012-10-12 | 2013-01-30 | 上海晟东电力科技有限公司 | Preset automatic feeder test method for distribution network |
| CN103323691A (en) * | 2013-03-13 | 2013-09-25 | 湖北省电力公司电力科学研究院 | Novel, intelligent and multifunctional comprehensive tester and testing method |
| CN104020761A (en) * | 2014-06-12 | 2014-09-03 | 国网上海市电力公司 | Automatic feeder testing system free of networking |
| CN104020762A (en) * | 2014-06-12 | 2014-09-03 | 国网上海市电力公司 | Automatic feeder testing method free of networking |
| CN203811717U (en) * | 2014-04-26 | 2014-09-03 | 广西电网公司电力科学研究院 | Automatic FTU (feeder terminal unit) / DTU (distribution terminal unit) testing device |
| CN104635095A (en) * | 2015-03-11 | 2015-05-20 | 上海金智晟东电力科技有限公司 | Testing system of feeder line automatic system |
| CN104933844A (en) * | 2014-03-20 | 2015-09-23 | 日本光电工业株式会社 | Terminal device and telemetry system |
| CN105515191A (en) * | 2015-12-22 | 2016-04-20 | 刘莹瑜 | Automation system for power plants |
| CN106597169A (en) * | 2016-12-26 | 2017-04-26 | 广州山锋测控技术有限公司 | Measuring apparatus for electronic equipment |
| CN108152689A (en) * | 2017-12-27 | 2018-06-12 | 国家电网公司 | High voltage electric equipment experimental bench and experimental system |
| CN207601245U (en) * | 2017-11-15 | 2018-07-10 | 李勇 | A kind of networking test system of distribution terminal automatic detection |
| US20190277904A1 (en) * | 2018-03-07 | 2019-09-12 | Southern States, Llc | Autonomous electric power fault detection, isolation and restoration systems |
| CN110865277A (en) * | 2019-12-04 | 2020-03-06 | 国网冀北电力有限公司电力科学研究院 | Feeder automation function testing device |
| CN211577297U (en) * | 2019-12-25 | 2020-09-25 | 深圳市小牛测控技术有限公司 | Test calibration instrument |
-
2020
- 2020-11-18 CN CN202011291120.3A patent/CN112540262A/en active Pending
Patent Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63139263A (en) * | 1986-12-01 | 1988-06-11 | Kansai Electric Power Co Inc:The | Automatic test apparatus for distribution line section |
| CN1582393A (en) * | 2001-11-05 | 2005-02-16 | 奥林巴斯株式会社 | Substrate inspecting device |
| KR20090119058A (en) * | 2008-05-15 | 2009-11-19 | 고윤석 | Intelligent FRT-based Fault Section Determination and Autonomous Separation Method in Distribution System |
| CN102901896A (en) * | 2012-10-12 | 2013-01-30 | 上海晟东电力科技有限公司 | Preset automatic feeder test method for distribution network |
| CN103323691A (en) * | 2013-03-13 | 2013-09-25 | 湖北省电力公司电力科学研究院 | Novel, intelligent and multifunctional comprehensive tester and testing method |
| CN104933844A (en) * | 2014-03-20 | 2015-09-23 | 日本光电工业株式会社 | Terminal device and telemetry system |
| CN203811717U (en) * | 2014-04-26 | 2014-09-03 | 广西电网公司电力科学研究院 | Automatic FTU (feeder terminal unit) / DTU (distribution terminal unit) testing device |
| CN104020761A (en) * | 2014-06-12 | 2014-09-03 | 国网上海市电力公司 | Automatic feeder testing system free of networking |
| CN104020762A (en) * | 2014-06-12 | 2014-09-03 | 国网上海市电力公司 | Automatic feeder testing method free of networking |
| CN104635095A (en) * | 2015-03-11 | 2015-05-20 | 上海金智晟东电力科技有限公司 | Testing system of feeder line automatic system |
| CN105515191A (en) * | 2015-12-22 | 2016-04-20 | 刘莹瑜 | Automation system for power plants |
| CN106597169A (en) * | 2016-12-26 | 2017-04-26 | 广州山锋测控技术有限公司 | Measuring apparatus for electronic equipment |
| CN207601245U (en) * | 2017-11-15 | 2018-07-10 | 李勇 | A kind of networking test system of distribution terminal automatic detection |
| CN108152689A (en) * | 2017-12-27 | 2018-06-12 | 国家电网公司 | High voltage electric equipment experimental bench and experimental system |
| US20190277904A1 (en) * | 2018-03-07 | 2019-09-12 | Southern States, Llc | Autonomous electric power fault detection, isolation and restoration systems |
| CN110865277A (en) * | 2019-12-04 | 2020-03-06 | 国网冀北电力有限公司电力科学研究院 | Feeder automation function testing device |
| CN211577297U (en) * | 2019-12-25 | 2020-09-25 | 深圳市小牛测控技术有限公司 | Test calibration instrument |
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