CN112526248B - Diagnostic method for light emitting device - Google Patents
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- 238000002405 diagnostic procedure Methods 0.000 title claims abstract description 35
- 230000002159 abnormal effect Effects 0.000 claims abstract description 47
- 238000000034 method Methods 0.000 abstract description 11
- 238000003745 diagnosis Methods 0.000 abstract description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000005192 partition Methods 0.000 description 6
- 238000003860 storage Methods 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 239000002096 quantum dot Substances 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
Abstract
The present disclosure provides a diagnostic method for a light emitting device. The light emitting device includes at least one region, and each region of the at least one region has a plurality of light emitting units. The diagnostic method comprises the steps of: illuminating the plurality of light emitting cells of one of the at least one region by a current; comparing the voltage value corresponding to the current with a first standard voltage value corresponding to a first standard current corresponding to one of the at least one region; and judging whether one of the at least one area is abnormal according to the result of comparing the voltage value with the first standard voltage value. Therefore, the diagnosis method disclosed by the invention can effectively diagnose whether the at least one area of the light emitting device is abnormal or not.
Description
Technical Field
The present disclosure relates to a device diagnosis method, and more particularly, to a diagnosis method of a light emitting device.
Background
For a light emitting device including a plurality of light emitting units, a portion of the light emitting units may be abnormal (disable) after a lapse of a certain period of time. In this regard, how to automatically and effectively diagnose the plurality of light emitting units is one of the important subjects in the art. In view of this, several embodiments of the solution will be presented below.
Disclosure of Invention
The present disclosure provides a diagnostic method for a light emitting device, which can effectively diagnose whether at least one area of the light emitting device is abnormal.
According to an embodiment of the present disclosure, a light emitting device of the present disclosure includes at least one region, and each region of the at least one region has a plurality of light emitting units. The diagnostic method of the light emitting device disclosed by the invention comprises the following steps of: illuminating the plurality of light emitting cells of one of the at least one region by a current; comparing the voltage value corresponding to the current with a first standard voltage value corresponding to a first standard current corresponding to one of the at least one region; and judging whether one of the at least one area is abnormal according to the result of comparing the voltage value with the first standard voltage value.
Based on the above, the diagnostic method of the light emitting device of the present disclosure can sense the current of the lighting area of the light emitting device, and effectively determine whether the lighting area of the light emitting device is abnormal by comparing the result of the voltage values corresponding to the current and the first standard current, respectively.
In order to make the above features and advantages of the present disclosure more comprehensible, embodiments accompanied with figures are described in detail below.
Drawings
The accompanying drawings are included to provide a further understanding of the disclosure, and are incorporated in and constitute a part of this specification. The accompanying drawings illustrate embodiments of the present disclosure and, together with the description, serve to explain the principles of the present disclosure.
FIG. 1 is a block diagram of an electronic device according to an embodiment of the disclosure;
FIG. 2 is a schematic diagram of a light emitting device according to an embodiment of the present disclosure;
FIG. 3 is a flowchart of recording voltage values corresponding to a first standard current according to an embodiment of the present disclosure;
FIG. 4 is a timing diagram illustrating an operation of a display panel according to an embodiment of the disclosure;
FIG. 5 is a flow chart of a diagnostic method of the light emitting device of the embodiment of FIG. 1 of the present disclosure;
FIG. 6 is a flow chart of a single light emitting unit diagnostic procedure of the embodiment of FIG. 1 of the present disclosure;
FIG. 7 is a block diagram of an electronic device according to another embodiment of the disclosure;
FIG. 8 is a flow chart of a diagnostic method of the light emitting device of the embodiment of FIG. 7 of the present disclosure;
FIG. 9 is a flow chart of a single light emitting unit diagnostic procedure according to the embodiment of FIG. 7 of the present disclosure.
Description of the reference numerals
100. 700, an electronic device;
110. 710 a light emitting device;
110_1 to 110_4, 710_1 to 710_4, 111_1 to 111_N, 711_1 to 711_N;
120. 720 a display panel;
130. 730, a timing control circuit;
140. 740, a microcontroller;
150. 750, a power supply module;
160. 760 a current detector;
170. 770, a memory module;
761 a comparator;
762 a digital-to-analog converter;
BT1, BT2, non-display period;
CS1, CS 2;
SS, selecting signals;
DT is the display period;
OT, operation time sequence;
time is t0, t1, t2 and t 3;
S310-S360, S510-S570, S610-S660, S810-S870, S910-S960.
Detailed Description
Reference will now be made in detail to the exemplary embodiments of the present disclosure, examples of which are illustrated in the accompanying drawings. Wherever possible, the same reference numbers will be used throughout the drawings and the description to refer to the same or like parts.
Certain terms are used throughout the description and following claims to refer to particular components. Those skilled in the art will appreciate that electronic device manufacturers may refer to a component by different names. It is not intended to distinguish between components that differ in function but not name. In the following description and in the claims, the terms "include" and "comprise" are used in an open-ended fashion, and thus should be interpreted to mean "include, but not limited to …".
Directional terms mentioned herein, such as: "upper", "lower", "front", "rear", "left", "right", etc., are merely directions with reference to the drawings. Thus, the directional terminology is used for purposes of illustration and is not intended to be limiting of the disclosure. In the drawings, the various figures illustrate the general features of methods, structures and/or materials used in certain embodiments. However, these drawings should not be construed as defining or limiting the scope or nature of what is covered by these embodiments. For example, the relative dimensions, thicknesses, and locations of various layers, regions, and/or structures may be reduced or exaggerated for clarity.
In some embodiments of the disclosure, terms such as "connected," "interconnected," and the like, with respect to joining, connecting, and the like, may refer to two structures being in direct contact, or may refer to two structures not being in direct contact, with other structures being disposed between the two structures, unless otherwise specified. And the term coupled, connected, may also include situations where both structures are movable, or where both structures are fixed. Furthermore, the term "coupled" includes any direct or indirect electrical connection.
As used in this specification and in the claims, the terms "first," "second," and the like, are used to modify a component, which itself is not intended to and does not denote that, or that the component has any order of the preceding components, nor does it denote that the component is ordered with respect to another component, or that the component is ordered in a manufacturing process, and the use of such an order is merely used to make a component having a certain designation clearly distinguishable from another component having the same designation. The same words may not be used in the claims and the specification, whereby a first element in the description may be a second element in the claims. It should be understood that the following embodiments may be used to replace, reorganize, and mix features of several different embodiments to accomplish other embodiments without departing from the spirit of the present disclosure.
In embodiments of the present disclosure, the electronic device may include, for example, a liquid crystal, a light emitting diode, a Quantum Dot (QD), a fluorescent (fluorescent), a phosphorescent (Phosphor), a display device or a display panel of other suitable materials, or a combination of the above materials, but is not limited thereto. The light emitting diode may include, for example, an organic light emitting diode (Organic Light Emitting Diode, OLED), a sub-millimeter light emitting diode (Mini LED), a Micro light emitting diode (Micro LED) or a Quantum Dot Light Emitting Diode (QDLED), fluorescent (fluorescent), phosphorescent (Phosphor) or other suitable materials, and the materials thereof may be arranged and combined at random, but not limited thereto.
FIG. 1 is a block diagram of an electronic device according to an embodiment of the disclosure. Referring to fig. 1, the electronic device 100 includes a light emitting device 110, a display panel 120, a timing control circuit (Timing controller, TCON) 130, a microcontroller (Microcontroller unit, MCU) 140, a power supply module 150, a current detector 160, and a storage module 170. In the present embodiment, the microcontroller 140 is coupled to the timing control circuit 130 and receives the vertical synchronization signal VS. The micro-controller 140 generates a selection signal SS to the timing control circuit 130 according to the vertical synchronization signal VS, so that the timing control circuit 130 determines to select and control the light emitting device 110 or the display panel 120 according to the selection signal SS. In the present embodiment, the timing control circuit 130 is coupled to the light emitting device 110 and the display panel 120, and is configured to provide control signals CS1 and CS2 to the light emitting device 110 and the display panel 120 to control the operation and the operation period of the light emitting device 110 and the display panel 120, wherein the control signals CS1 and CS2 further include timing signals, respectively. In this embodiment, the light emitting device 110 may be a backlight module of a display, and the light emitting device 110 may include a plurality of light emitting units arranged in an array, wherein the plurality of light emitting units may be, for example, a plurality of micro light emitting diodes, and the light emitting device 110 and the display panel 120 may form the display. However, the light emitting device 110 of the present disclosure may be other types of backlight modules or other light emitting devices, and is not limited to the above-mentioned backlight modules. In other words, in some embodiments of the present disclosure, the electronic device 100 may not be a display, and may not include the display panel 120.
In the present embodiment, the microcontroller 140 is coupled to the power supply module 150 to control the power supply module 150 to provide current to illuminate the plurality of light emitting units of at least one region of the light emitting device 110 via a power supply path, and the current detector 160 is coupled to the power supply path to detect the current passing through the power supply path. The current detector 160 can detect the current level driving the at least one region of the light emitting device 110 to provide a corresponding voltage value to the microcontroller 140. In the present embodiment, the microcontroller 140 is further coupled to the current detector 160 and the memory module 170. The memory module 170 may include, for example, flash memory (Flash memory) or other memory such as dynamic random access memory (Dynamic Random Access Memory, DRAM) or nonvolatile random access memory (Non-Volatile Random Access Memory, NVRAM), but the disclosure is not limited thereto.
In this embodiment, the micro-controller 140 can read the storage module 170 to obtain a pre-stored first standard voltage value corresponding to the first standard current, and can receive the voltage value provided by the current detector 160 corresponding to the current level driving the at least one region of the light emitting device 110. The microcontroller 140 may determine whether the at least one region of the light emitting device 110 is abnormal (disable) by comparing the voltage value corresponding to the current driving the at least one region of the light emitting device 110 with the first standard voltage value. For more clarity, the anomaly may be a flicker, a dark spot or an abnormally bright spot in at least one area of the light emitting device, but the disclosure is not limited thereto. The method for diagnosing whether at least one area of the light emitting device is abnormal may be light intensity comparison, current comparison or voltage comparison, but the disclosure is not limited thereto. The embodiment describes a voltage comparison example. And, when the micro controller 140 determines that the at least one area of the light emitting device 110 is abnormal, the micro controller 140 may further diagnose the plurality of light emitting units of the at least one area.
Fig. 2 is a schematic diagram of a light emitting device according to an embodiment of the disclosure. Referring to fig. 2, the light emitting device 110 may include a plurality of light emitting units 111_1 to 111_n arranged in an array, where N is a positive integer. In the present embodiment, the light emitting units 111_1 to 111_n may be divided into four areas 110_1 to 110_4, and the light emitting units 111_1 to 111_n may be micro light emitting diodes, for example, but the disclosure is not limited thereto. In some embodiments of the present disclosure, the light emitting units 111_1 to 111_n may be divided into one or more partitions, which is not limited to the one shown in fig. 2. Referring to fig. 1 and 2, in the present embodiment, before the electronic device 100 is manufactured and shipped, the microcontroller 140 may sense the current level of the first standard current of each of the bright areas 110_1 to 110_4 in advance, and store the first standard voltage value corresponding to the first standard current of each of the areas 110_1 to 110_4 in the form of digital data (which will be described in detail below with reference to the embodiment of fig. 3). Thus, after the electronic device 100 is manufactured or used for a period of time, the microcontroller 140 may utilize the first standard voltage value of the first standard current corresponding to each of the regions 110_1-110_4 to perform an automatic diagnostic operation on the light emitting device 110.
In the present embodiment, the current detector 160 sequentially senses the current magnitude of the current for each of the spot-lighting areas 110_1 to 110_4, and provides a voltage value (analog value) corresponding to the current for each of the spot-lighting areas 110_1 to 110_4 to the microcontroller 140. The microcontroller 140 may convert the voltage value from an analog value to a digital value, and sequentially compare the first standard voltage value corresponding to the corresponding first standard current with the voltage value (digital value) corresponding to the current for lighting each of the areas 110_1 to 110_4 to sequentially determine whether the areas 110_1 to 110_4 are abnormal. Next, if the micro-controller 140 determines that one of the areas 110_1 to 110_4 is abnormal, such as the lighting area 110_3, the micro-controller 140 can further perform an independent diagnosis on each light emitting unit in the lighting area 110_3 to further determine whether there is an abnormal (disable) light emitting unit in the lighting area 110_3 (as will be described in detail below with reference to the embodiment of fig. 4). In other words, the micro controller 140 of the present embodiment can diagnose whether the light emitting device 110 has an abnormal area, and then diagnose the plurality of light emitting units in the abnormal area.
In the present embodiment, when the microcontroller 140 determines that one of the areas 110_1 to 110_4 is abnormal, the microcontroller 140 can sequentially illuminate the plurality of light emitting units of the one of the areas 110_1 to 110_4 through the timing control circuit 130 and the power supply module 150. In the present embodiment, the micro-controller 140 can determine whether the plurality of light emitting units of one of the sequentially lighted areas 110_1 to 110_4 are abnormal or not through a second standard voltage corresponding to a preset second standard current. Therefore, the electronic device 100 of the present embodiment can provide an efficient diagnostic effect of the light emitting device 110 compared to diagnosing each of the light emitting units 111_1 to 111_n individually. It is noted that the second standard voltage corresponding to the second standard current is default and is suitable for each of the light emitting units 111_1 to 111_n to determine whether the abnormality occurs.
Incidentally, in some embodiments of the present disclosure, if the microcontroller 140 determines that one of the areas 110_1 to 110_4 is abnormal, such as the lighting area 110_3, the microcontroller 140 may further diagnose a plurality of partitions in the lighting area 110_3. Also, when a certain partition among the lighting areas 110_3 is judged as abnormal by the microcontroller 140, the microcontroller 140 may then diagnose each light emitting unit of the certain partition among the lighting areas 110_3 to judge whether or not there is an abnormal light emitting unit of the certain partition among the lighting areas 110_3. In other words, the micro-controller 140 can perform multiple region diagnoses according to the number of the light emitting units 111_1 to 111_n or different types of the light emitting devices 110, and then perform independent diagnoses for each light emitting unit of the abnormal region or partition, so as to provide an efficient diagnostic effect of the light emitting devices 110.
Fig. 3 is a flowchart of recording a first standard voltage value corresponding to a first standard current according to an embodiment of the disclosure. Referring to fig. 1 to 3, in the present embodiment, before the electronic device 100 is manufactured and shipped, the microcontroller 140 may perform the following steps S310 to S360 to pre-establish a database with a first standard voltage value corresponding to a first standard current corresponding to each of the areas 110_1 to 110_4. In step S310, the microcontroller 140 lights one of the plurality of areas 110_1 to 110_4 of the light emitting device 110. In step S320, the current detector 160 senses the current level of the first standard current that illuminates one of the plurality of areas 110_1 to 110_4 to obtain a first standard voltage value (analog value) corresponding to the first standard current. In step S330, the microcontroller 140 converts the first standard voltage value from an analog value to a digital value. In step S340, the microcontroller 140 executes the memory module 170. In step S350, the microcontroller 140 stores the first standard voltage value in the storage module 170. In step S360, the micro controller 140 determines whether the first standard voltage value corresponding to each of the areas 110_1 to 110_4 has been stored. If not, the micro-controller 140 re-executes step S310 to obtain the analog voltage value corresponding to the next zone, and converts the analog voltage value into a digital voltage value for storing in the storage module 170. If yes, the microcontroller 140 ends the process of recording the first standard voltage value corresponding to the first standard current.
That is, since each of the light emitting units 111_1 to 111_n of the different backlight modules 110 may have different initial current characteristics, each of the light emitting units 111_1 to 111_n of the different backlight modules may need to be normally lighted by different initial driving currents. Therefore, the microcontroller 140 of the electronic device 100 of the present embodiment may, for example, pre-establish a Look-up Table (LUT) of standard voltage values corresponding to the respective standard currents of each of the regions 110_1 to 110_4 suitable for the current characteristics thereof before manufacturing the light emitting device 110, and store the Look-up Table in the memory module 170 so that the microcontroller 140 can read and utilize the Look-up Table when the microcontroller 140 diagnoses the light emitting device 110.
Fig. 4 is an operation timing diagram of a display panel according to an embodiment of the disclosure. It should be noted that, since the following embodiments will be described with reference to the light emitting device 110 as an example of the backlight module, referring to fig. 1, 2 and 4, the light emitting device 110 and the display panel 120 can be integrated to operate as the operation timing OT of fig. 4. In the operation timing OT, when the micro controller 140 receives the vertical synchronization signal VS at time t0, the micro controller 140 may control the display panel 120 to first enter a non-display period (Blanking period) BT1 (time t0 to time t 1) through the timing controller 150, and the micro controller 140 may light and sense the current of one of the regions 110_1 to 110_4 of the light emitting device 110 or one of the plurality of light emitting units of the abnormal region through the timing controller 150 and the current detector 160. Next, the micro controller 140 may control the display panel 120 to enter the display period (displaying period) DT (time t1 to time t 2) at time t1 to display the image frame through the timing controller 150, and the micro controller 140 may read the storage module 170 and set the judgment conditions of the plurality of light emitting units corresponding to one of the regions 110_1 to 110_4 or the abnormal region. When the microcontroller 140 receives the next vertical synchronization signal at time t2 and the timing controller 150 causes the display panel 120 to perform the next non-display period BT2 (time t2 to time t 3), the microcontroller 140 may compare the voltage value corresponding to the current sensed during the non-display period BT1 with the corresponding determination information to determine whether one of the regions 110_1 to 110_4 is abnormal or whether one of the plurality of light emitting units of the abnormal region is abnormal.
However, in an embodiment of the disclosure, the micro-controller 140 may also diagnose the light emitting device 110 when the display panel 120 is in a sleep mode or an off mode, for example. In this regard, when the display panel 120 is operated in the sleep mode or the off mode, the light emitting device 110 can also be independently operated by the micro controller 140. In other words, the diagnostic process and timing of the embodiments of the present disclosure may not be limited to the operation timing OT according to fig. 4.
Fig. 5 is a flowchart of a diagnostic method of the light emitting device of the embodiment of fig. 1 of the present disclosure. Referring to fig. 1, 2 and 5, in the present embodiment, the electronic device 100 may execute steps S510 to S570 to perform the region diagnosis procedure of the light emitting device 110. In step S510, the micro-controller 140 may read the memory module 170 during the current non-display period (e.g. the non-display period BT1 of fig. 4) to obtain a first standard voltage value (digital value) corresponding to the first standard current of one of the plurality of regions 110_1-110_4. In step S520, the microcontroller 140 may also illuminate the plurality of light emitting units of the one of the plurality of regions 110_1 to 110_4 with a current during the current non-display period, and the current detector 150 may sense the current illuminating the one of the plurality of regions 110_1 to 110_4 to provide a voltage value (analog value) corresponding to a current magnitude of the current to the microcontroller 140. The microcontroller 140 may convert the voltage value corresponding to the current magnitude of the current from an analog value to a digital value. In step S530, the microcontroller 140 may set a first voltage threshold th1_ocp of the over-current protection (Over Current Protection, OCP) and a second voltage threshold th1_ucp of the under-current protection (Under Current Protection, UCP) corresponding to the one of the plurality of regions according to the first standard voltage value (digital value) corresponding to the first standard current during the display (e.g., the display period DT of fig. 4). In the present embodiment, the microcontroller 140 can set the first threshold th1_ocp of the over-current protection and the second voltage threshold th1_ucp of the under-current protection as shown in the following formulas (1) and (2), wherein V1 is a first standard voltage value corresponding to the first standard current, and Δv1 and Δv2 are preset variations.
Th1_ocp=v1+Δv … … … formula (1)
Th1_ucp=v1- Δv … … … formula (2)
In step S540, the microcontroller 140 waits for receiving the next vertical synchronization signal. When the microcontroller 140 receives the next vertical synchronization signal, the microcontroller 140 performs step S550. In step S550, the microcontroller 140 may compare whether the voltage value (v_ir) corresponding to the current for lighting the one of the plurality of regions 110_1 to 110_4 is greater than the under-current protection second voltage threshold th1_ucp and less than the over-current protection first voltage threshold th1_ocp by performing the determination as shown in the following equation (3) during the next non-display period (e.g., the non-display period BT2 of fig. 4). If yes, the microcontroller 140 executes step S570. If not, the microcontroller 140 first performs step S560, and then performs step S570. In step S560, the microcontroller 140 sequentially executes a single light emitting unit diagnostic procedure for the plurality of light emitting units of the one of the plurality of regions 110_1 to 110_4. In step S570, the microcontroller 140 determines whether each of the diagnostic regions 110_1-110_4 has been completed. If not, the microcontroller 140 re-executes step S520 to illuminate the plurality of light emitting units of another one of the plurality of regions 110_1 to 110_4 with another current. If so, the microcontroller 140 ends the area diagnostic procedure. Therefore, the diagnostic method of the present embodiment can effectively diagnose whether the plurality of areas 110_1 to 110_4 of the light emitting device 110 are abnormal.
Th1_ucp < v_ir < th1_ocp … … … formula (3)
FIG. 6 is a flow chart of a single light emitting unit diagnostic procedure according to the embodiment of FIG. 1 of the present disclosure. Referring to fig. 1, 2 and 6, in the present embodiment, the electronic device 100 may perform steps S610 to S660 to perform the region diagnosis procedure, and steps S610 to S660 of the present embodiment may be the embodiment of step S560 of fig. 5. The following assumes that the microcontroller 140 determines that the region 110_3 is abnormal. In step S610, the microcontroller 140 may pass through one of the plurality of light emitting units among the current lighting area 110_3 during the current non-display period (e.g., the non-display period BT1 of fig. 4), and the current detector 150 may sense the current that lights the one of the plurality of light emitting units to provide a voltage value (analog value) corresponding to a current magnitude of the current to the microcontroller 140. The microcontroller 140 may convert the voltage value corresponding to the current magnitude of the current from an analog value to a digital value. In step S620, the microcontroller 140 may set the corresponding third voltage threshold th2_ocp for over-current protection and the fourth voltage threshold th2_ucp for under-current protection according to the second standard voltage value (digital value) corresponding to the second standard current during the display period (e.g., the display period DT of fig. 4). In the present embodiment, the microcontroller 140 may set the third voltage threshold th2_ocp of the over-current protection and the fourth voltage threshold th2_ucp of the under-current protection as shown in the following formulas (4) and (5), wherein V2 is a second standard voltage value corresponding to the second standard current, and Δv3 and Δv4 are preset variations. It is noted that the second standard current refers to a table standard current of the light emitting units, and each light emitting unit is adapted to the same second standard current. Therefore, the second standard voltage value is a fixed value, and each light emitting unit is suitable for the following third voltage threshold th2_ocp for overcurrent protection and the fourth voltage threshold th2_ucp for undercurrent protection.
Th2_ocp=v2+Δv … … … equation (4)
Th2_ucp=v2- Δv … … … formula (5)
In step S630, the microcontroller 140 waits for receiving the next vertical synchronization signal. When the microcontroller 140 receives the next vertical synchronization signal, the microcontroller 140 performs step S640. In step S640, the microcontroller 140 may compare whether the voltage value (v_is) of the current corresponding to the one of the plurality of light emitting units of the region 110_3 IS greater than the fourth voltage threshold th2_ucp of the undercurrent protection and less than the third voltage threshold th2_ocp of the overcurrent protection by performing the determination as shown in the following equation (6) during the next non-display period (e.g., the non-display period BT2 of fig. 4). If not, the microcontroller 140 executes step S660. If yes, the micro-controller 140 first executes step S650, and then executes step S660. In step S650, the microcontroller 140 reports that the one of the light emitting units of the area 110_3 is abnormal. In step S660, the microcontroller 140 determines whether each light emitting unit of the diagnostic region 110_3 has been completed. If not, the microcontroller 140 re-executes step S610 to illuminate another one of the plurality of light emitting units of the region 110_3 with another current. If so, the microcontroller 140 ends the single light unit diagnostic procedure. Therefore, the single light emitting unit diagnostic program of the present embodiment can efficiently and rapidly diagnose abnormal light emitting units among the plurality of light emitting units 111_1 to 110_n of the light emitting device 110.
Th2_ucp < v_is < th2_ocp … … … formula (6)
Fig. 7 is a block diagram of an electronic device according to another embodiment of the disclosure. Referring to fig. 7, the electronic device 700 includes a light emitting device 710, a display panel 720, a timing control circuit 130, a microcontroller 740, a power supply module 750, a current detector 760, a Comparator 761, a digital-to-analog converter (Digital to analog converter, DAC) 762, and a storage module 770. In the present embodiment, the microcontroller 740 is coupled to the timing control circuit 730 and receives the vertical synchronization signal VS. The micro controller 740 generates a selection signal SS to the timing control circuit 730 according to the vertical synchronization signal VS, so that the timing control circuit 730 determines to select and control the light emitting device 710 or the display panel 720 according to the selection signal SS. In the present embodiment, the timing control circuit 730 is coupled to the light emitting device 710 and the display panel 720, and is configured to provide control signals CS1 and CS2 to the light emitting device 710 and the display panel 720 to control the operation and the operation period of the light emitting device 710 and the display panel 720, wherein the control signals CS1 and CS2 further comprise timing signals, respectively.
In the present embodiment, the microcontroller 740 is coupled to the power supply module 750 to control the power supply module 750 to supply current via a power supply path to illuminate the plurality of light emitting units of at least one region of the light emitting device 710, and the current detector 760 is coupled to the power supply path to detect the current passing through the power supply path. The current detector 760 can detect the magnitude of the current driving the at least one region of the light emitting device 710 to provide a corresponding voltage value to the comparator 761. In the present embodiment, the microcontroller 740 is further coupled to a current detector 760, a comparator 761, a digital-to-analog converter 762, and a memory module 770. The microcontroller 740 may read the memory module 770 to obtain a pre-stored first standard voltage value corresponding to the first standard current and provide the first standard voltage value to the digital-to-analog converter 762 through the serial peripheral interface (Serial Peripheral Interface, SPI). The digital-to-analog converter 762 converts the first standard voltage value from a digital value to an analog value, and supplies the first standard voltage value, which is analog, to the comparator 761. Accordingly, the comparator 761 can compare the voltage value corresponding to the current magnitude driving the at least one region of the light emitting device 710 with the first standard voltage value to output the comparison result to the microcontroller 740. In this embodiment, the microcontroller 740 can determine whether the at least one area of the light emitting device 710 is abnormal according to the comparison result. And, when the micro controller 740 determines that the at least one area of the light emitting device 710 is abnormal, the micro controller 740 may further diagnose the plurality of light emitting units of the at least one area.
Unlike the electronic device 100 of fig. 1, the electronic device 700 of the present embodiment compares the voltage value corresponding to the current level driving the at least one region of the light emitting device 710 with the first standard voltage value in an analog manner. Also, the light emitting device 710 of the present embodiment may be equally applicable to fig. 2. Referring to fig. 2, the light emitting device 710 may include a plurality of light emitting units 711_1 to 711_n arranged in an array, and the light emitting units 711_1 to 711_n may be divided into four regions 710_1 to 710_4, where N is a positive integer. In this regard, other circuit operations and implementations of the electronic device 700 of the present embodiment may be the same as those of the embodiments of fig. 1 and 2, and thus the description thereof is omitted herein. In addition, the electronic device 700 of the present embodiment is also applicable to the process of recording the first standard voltage value corresponding to the first standard current in fig. 3, and is also applicable to the operation timing sequence in fig. 4, so that the description thereof is omitted herein.
Fig. 8 is a flowchart of a diagnostic method of the light emitting device of the embodiment of fig. 7 of the present disclosure. Referring to fig. 2, 7 and 8, in the present embodiment, the electronic device 700 may perform steps S810 to S870 to perform the region diagnosis procedure of the light emitting device 710. In step S810, the microcontroller 740 may read the memory module 770 during the current non-display period (e.g., the non-display period BT1 of fig. 4) to obtain a first standard voltage value (digital value) of the first standard current corresponding to one of the plurality of regions 710_1-710_4. In step S820, the microcontroller 140 may also illuminate the plurality of light emitting units of the one of the plurality of regions 710_1 to 710_4 with a current during the current non-display period, and the current detector 760 may sense the current illuminating the one of the plurality of regions 710_1 to 710_4 to provide a voltage value (analog value) corresponding to a current magnitude of the current to the comparator 761. In step S830, the microcontroller 740 may set the first voltage threshold th1_ocp of the over-current protection corresponding to the one of the plurality of regions as in the above formula (1) and the second voltage threshold th1_ucp of the under-current protection as in the above formula (2) according to the first standard voltage value (digital value) corresponding to the first standard current during the display (e.g., the display period DT of fig. 4), and provide the first voltage threshold th1_ocp of the over-current protection and the second voltage threshold th1_ucp of the under-current protection to the digital-to-analog converter 762 to convert the first voltage threshold th1_ocp of the over-current protection and the second voltage threshold th1_ucp of the under-current protection from digital values to analog values.
In step S840, the microcontroller 740 waits for receiving the next vertical synchronization signal. When the microcontroller 740 receives the next vertical synchronization signal, the microcontroller 740 performs step S850. In step S850, the comparator 761 may implement the determination of the above formula (3) during the next non-display period (for example, the non-display period BT2 of fig. 4), wherein the comparator 761 compares whether the voltage value (v_ir) corresponding to the current for lighting the one of the plurality of regions 710_1 to 710_4 provided by the current detector 760 is greater than the first voltage threshold th1_ucp of the under-current protection provided by the digital-to-analog converter 762 and less than the second voltage threshold th1_ocp of the over-current protection, and outputs the comparison result to the microcontroller 740. If yes, the microcontroller 140 executes step S870. If not, the microcontroller 740 first performs step S860, and then performs step S870. In step S860, the microcontroller 740 sequentially performs a single light-emitting unit diagnostic procedure on the plurality of light-emitting units of the one of the plurality of regions 710_1-710_4. In step S870, the microcontroller 740 determines whether each of the diagnostic areas 710_1 to 710_4 has been completed. If not, the microcontroller 740 re-executes step S820 to light another one of the light emitting units of the plurality of regions 710_1 to 710_4 by another current. If so, microcontroller 740 ends the area diagnostic routine. Therefore, the diagnostic method of the present embodiment can effectively diagnose whether the plurality of regions 710_1 to 710_4 of the light emitting device 710 are abnormal.
FIG. 9 is a flow chart of a single light emitting unit diagnostic procedure according to the embodiment of FIG. 7 of the present disclosure. Referring to fig. 2, 7 and 9, in the present embodiment, the electronic device 700 may perform steps S910 to S960 to perform the region diagnosis procedure, and steps S910 to S960 of the present embodiment may be the embodiment of step S860 of fig. 8. The following assumes that microcontroller 740 determines that region 710_3 is abnormal. In step S910, the microcontroller 740 may pass one of the plurality of light emitting units among the current lighting region 710_3 during the current non-display period (e.g., the non-display period BT1 of fig. 4), and the current detector 760 may sense the current that lights the one of the plurality of light emitting units to provide a voltage value (analog value) corresponding to the current to the comparator 761. In step S920, the microcontroller 740 may set the corresponding over-current protected third voltage threshold th2_ocp as in the above formula (3) and the under-current protected fourth voltage threshold th2_ucp as in the above formula (4) according to the second standard voltage value (digital value) corresponding to the second standard current during the display period (e.g., the display period DT of fig. 4), and provide the over-current protected third voltage threshold th2_ocp and the under-current protected fourth voltage threshold th2_ucp to the digital-to-analog converter 762 to convert the over-current protected third voltage threshold th2_ocp and the under-current protected fourth voltage threshold th2_ucp from digital values to analog values.
In step S930, the microcontroller 740 waits for receiving the next vertical synchronization signal. When the microcontroller 740 receives the next vertical synchronization signal, the microcontroller 740 performs step S940. In step S940, the comparator 761 may implement the determination of the above formula (6) during the next non-display period (e.g., the non-display period BT2 of fig. 4), wherein the comparator 761 compares whether the voltage value (v_is) of the current provided by the current detector 760 corresponding to the one of the plurality of light emitting cells for lighting the region 710_3 IS greater than the third voltage threshold th2_ucp of the under-current protection provided by the digital-to-analog converter 762 and less than the fourth voltage threshold th2_ocp of the over-current protection. If not, the microcontroller 740 performs step S960. If yes, the microcontroller 740 first performs step S950, and then performs step S960. In step S950, the microcontroller 740 reports that the one of the light emitting units of the area 710_3 is abnormal. In step S960, the microcontroller 740 determines whether each light emitting unit of the diagnostic region 710_3 has been completed. If not, the microcontroller 740 re-executes step S710 to light another one of the plurality of light emitting units of the region 710_3 by another current. If so, the microcontroller 740 ends the single lighting unit diagnostic procedure. Therefore, the single light emitting unit diagnostic program of the present embodiment can efficiently and rapidly diagnose an abnormal light emitting unit among the plurality of light emitting units 711_1 to 710_n of the light emitting device 710.
In summary, the diagnostic method of the light emitting device of the present disclosure may divide the plurality of light emitting units of the light emitting device into a plurality of regions and sequentially diagnose whether the plurality of regions are abnormal. When one of the plurality of regions is diagnosed as abnormal, the diagnostic method of the light emitting device of the present disclosure may then sequentially diagnose whether all light emitting units of the abnormal region are abnormal. Therefore, the diagnostic method of the light emitting device of the present disclosure can provide an efficient diagnostic effect.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present disclosure, but not for limiting the same, wherein the features of the embodiments can be mixed and matched at will without departing from the spirit of the invention or conflicting therewith; although the present disclosure has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art will appreciate that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present disclosure.
Claims (8)
1. A diagnostic method of a light emitting device, wherein the light emitting device includes at least one region, and each region of the at least one region has a plurality of light emitting units, the diagnostic method comprising:
illuminating the plurality of light emitting cells of one of the at least one region by a current;
comparing the voltage value corresponding to the current with a first standard voltage value corresponding to a first standard current corresponding to one of the at least one region;
judging whether one of the at least one area is abnormal according to the result of comparing the voltage value with the first standard voltage value;
if one of the at least one area is judged to be abnormal, the plurality of light-emitting units of the one of the at least one area are sequentially lightened; and
and respectively judging whether the plurality of luminous units which are lighted in sequence are abnormal or not through a second standard voltage value corresponding to the second standard current.
2. The diagnostic method of claim 1, wherein the at least one region comprises a plurality of regions.
3. The diagnostic method of claim 2, further comprising:
illuminating the plurality of light emitting cells of another one of the plurality of regions by another current;
comparing another voltage value corresponding to the another current with another first standard voltage value corresponding to another first standard current corresponding to the another area in the plurality of areas; and
judging whether the other area of the plurality of areas is abnormal according to the result of comparing the other voltage value with the other first standard voltage value.
4. A diagnostic method as set forth in claim 3, further comprising:
and if the other area of the plurality of areas is judged to be abnormal, sequentially illuminating the plurality of light emitting units of the other area of the plurality of areas.
5. The diagnostic method of claim 4, wherein sequentially lighting the plurality of light emitting units of the other one of the plurality of regions comprises:
and respectively judging whether the plurality of luminous units which are lighted in sequence are abnormal or not through the second standard voltage value corresponding to the second standard current.
6. The diagnostic method of claim 1, wherein said one of said at least one region is determined to be abnormal if the difference between said voltage value and said first standard voltage value is greater than a default value.
7. The diagnostic method of claim 1, wherein the light emitting device is a backlight module of a display.
8. The diagnostic method of claim 1, wherein the step of lighting the plurality of light emitting units of one of the at least one region by the current and the step of judging whether the one of the at least one region is abnormal according to a result of comparing the voltage value with the first standard voltage value are performed in different non-display periods, respectively.
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