CN112506781B - Test monitoring method, device, electronic equipment, storage medium and program product - Google Patents

Test monitoring method, device, electronic equipment, storage medium and program product Download PDF

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Publication number
CN112506781B
CN112506781B CN202011435649.8A CN202011435649A CN112506781B CN 112506781 B CN112506781 B CN 112506781B CN 202011435649 A CN202011435649 A CN 202011435649A CN 112506781 B CN112506781 B CN 112506781B
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parameter information
test
record
application program
target
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CN112506781A (en
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禹龙晨
李平凉
李泽锋
李清意
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Industrial and Commercial Bank of China Ltd ICBC
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Industrial and Commercial Bank of China Ltd ICBC
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

The present disclosure provides a test monitoring method, apparatus, electronic device, storage medium, and program product, which can be applied to the financial field or other fields. Comprising the following steps: under the condition that the test behavior is monitored, a test record corresponding to the test behavior is obtained, wherein the test record comprises a first parameter set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used when an application program is written and is tested, and the test time set comprises test time corresponding to the first parameter information; acquiring a commit record after the application program is compiled, wherein the commit record comprises a second parameter information set and a commit time set, and the second parameter information set comprises M pieces of second parameter information; determining target second parameter information in the second parameter information set according to the submitting record and the testing record, wherein the target second parameter information comprises parameter information subjected to local testing; and determining a test monitoring result aiming at the application program according to the target second parameter information.

Description

Test monitoring method, device, electronic equipment, storage medium and program product
Technical Field
The embodiment of the disclosure relates to the technical field of computers, and more particularly relates to a test monitoring method, a test monitoring device, electronic equipment, a storage medium and a program product.
Background
Before the application program is on line, the application program is usually required to be tested to ensure that the application program can normally run, and the test work is usually completed by the cooperation of a developer and a tester, wherein the developer is required to test the written application program before submitting the written application program, so that the occurrence of low-level errors is reduced as much as possible, the robustness of the application program is enhanced, and the test efficiency is improved.
With the continuous development of business requirements, the iteration speed of the application program is also increased. Under the above circumstances, if the service requirement is urgent, the developer needs to complete as soon as possible, which may cause the developer to directly submit after writing the completed application program without performing the test before submitting, which may cause a large number of low-level errors in the test environment, greatly affecting the robustness and the test efficiency of the application program. In order to solve the above-mentioned problems, a manual monitoring method is generally adopted in the related art.
In the process of implementing the disclosed concept, the inventor finds that at least the following problems exist in the related art: the adoption of the related technology easily causes resource waste and has poor monitoring effect.
Disclosure of Invention
In view of this, embodiments of the present disclosure provide a test monitoring method, apparatus, electronic device, storage medium, and program product.
An aspect of an embodiment of the present disclosure provides a test monitoring method, including: under the condition that the test behavior is monitored, obtaining a test record corresponding to the test behavior, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used when an application program is compiled and is tested, the test time set comprises test time corresponding to the first parameter information, and the N is a positive integer; acquiring a commit record after the application program is compiled, wherein the commit record comprises a second parameter information set and a commit time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is parameter information actually used by the application program is compiled, and the commit time set comprises commit time corresponding to the second parameter information, wherein M is a positive integer greater than or equal to N; determining target second parameter information in the second parameter information set according to the submitting record and the testing record, wherein the target second parameter information comprises parameters subjected to local testing; and determining a test monitoring result for the application program according to the target second parameter information.
According to an embodiment of the present disclosure, the determining target second parameter information in the second parameter information set according to the submitting record and the testing record includes: determining, for each second parameter information in the second parameter information set, whether first parameter information consistent with the second parameter information exists in the test record; determining whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information when it is determined that the first parameter information consistent with the second parameter information exists in the test record; and determining the second parameter information as target second parameter information when it is determined that the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
According to an embodiment of the present disclosure, the first parameter information includes a first method name, which is a method name of a method used and tested when writing an application, and a first parameter list; the second parameter information comprises a second method name and a second parameter list, wherein the second method name is a method name for writing a method for completing the actual use of the application program; after determining whether the first parameter information consistent with the second parameter information exists in the test record for each second parameter information in the second parameter information set, the method further includes: when it is determined that the first parameter list which is identical to the second parameter list and identical to the first method name is present in the test record, it is determined that the first parameter information which is identical to the second parameter information is present in the test record.
According to an embodiment of the present disclosure, in the case where a test behavior is monitored, obtaining a test record corresponding to the test behavior includes: setting a target monitor program in a local environment where an application program is located; calling the target monitoring program to monitor test behaviors; and acquiring a test record corresponding to the test behavior under the condition that the test behavior is monitored.
According to an embodiment of the present disclosure, in the case where a test behavior is monitored, obtaining a test record corresponding to the test behavior includes: setting a target monitor program in a distributed version control system warehouse; calling the target monitor program from the distributed version control system warehouse through a starting instruction to monitor test behaviors; and acquiring a test record corresponding to the test behavior under the condition that the test behavior is monitored.
According to an embodiment of the present disclosure, the obtaining a commit record after writing the application program includes: and acquiring a commit record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
According to an embodiment of the present disclosure, the obtaining, by the distributed version control system instruction, a commit record from a distributed version control system repository after writing the application program includes: and under the condition that the timing task instruction is triggered, acquiring a commit record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
According to an embodiment of the present disclosure, the determining a test monitoring result for the application according to the target second parameter information includes: determining that the application program segment associated with the target second parameter information is subjected to local test; and determining that the application program segment associated with the non-target second parameter information is not subjected to the local test, wherein the non-target second parameter information is second parameter information except for the target second parameter information in the second parameter information set.
Another aspect of an embodiment of the present disclosure provides a test monitoring apparatus, including: the first acquisition module is used for acquiring a test record corresponding to the test behavior under the condition that the test behavior is monitored, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is the parameter information which is used when an application program is written and is tested, the test time set comprises test time corresponding to the first parameter information, and the N is a positive integer; the second acquisition module is used for acquiring a commit record after the application program is compiled, wherein the commit record comprises a second parameter information set and a commit time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is the parameter information actually used by the application program after the application program is compiled, and the commit time set comprises commit time corresponding to the second parameter information, wherein M is a positive integer greater than or equal to N; the first determining module is used for determining target second parameter information in the second parameter information set according to the submitting record and the testing record, wherein the target second parameter information comprises parameter information subjected to local testing; and the second determining module is used for determining a test monitoring result aiming at the application program according to the target second parameter information.
Another aspect of an embodiment of the present disclosure provides an electronic device, including: one or more processors; and a memory for storing one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method as described above.
Another aspect of an embodiment of the present disclosure provides a computer-readable storage medium having stored thereon executable instructions that, when executed by a processor, cause the processor to implement a method as described above.
Another aspect of the disclosed embodiments provides a computer program comprising a computer program for implementing a method as described above when executed by a processor.
According to the embodiment of the disclosure, under the condition that test behaviors are monitored, a test record corresponding to the test behaviors is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is parameter information which is used when an application program is compiled and is tested, the test time set comprises test time corresponding to the first parameter information, a submit record after the application program is compiled is obtained, the submit record comprises a second parameter information set and a submit time set, the second parameter information is parameter information which is actually used when the application program is compiled, the submit time set comprises submit time corresponding to the second parameter information, target second parameter information in the second parameter information set is determined according to the submit record and the test record, the target second parameter information comprises parameter information which is tested locally, and a test monitoring result for the application program is determined according to the target second parameter information. Because the test record corresponding to the test behavior and the submitted record after the application program is compiled are obtained, the parameter information which is tested by the second parameter information concentrated in the local area is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are easy to waste and the monitoring effect is poor due to the adoption of the related technology are at least partially overcome, the test efficiency is improved, and the robustness of the application program is ensured as much as possible.
Drawings
The above and other objects, features and advantages of the present disclosure will become more apparent from the following description of embodiments thereof with reference to the accompanying drawings in which:
FIG. 1 schematically illustrates an exemplary system architecture to which a test monitoring method may be applied, according to an embodiment of the present disclosure;
FIG. 2 schematically illustrates a flow chart of a test monitoring method according to an embodiment of the disclosure;
FIG. 3 schematically illustrates a flow chart of another test monitoring method according to an embodiment of the disclosure;
FIG. 4 schematically illustrates a flow chart of yet another test monitoring method in accordance with an embodiment of the present disclosure;
FIG. 5 schematically illustrates a block diagram of a test monitoring apparatus according to an embodiment of the disclosure; and
fig. 6 schematically illustrates a block diagram of an electronic device adapted to implement a test monitoring method according to an embodiment of the disclosure.
Detailed Description
Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It should be understood that the description is only exemplary and is not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the present disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. In addition, in the following description, descriptions of well-known structures and techniques are omitted so as not to unnecessarily obscure the concepts of the present disclosure.
The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and/or the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, or components.
All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art unless otherwise defined. It should be noted that the terms used herein should be construed to have meanings consistent with the context of the present specification and should not be construed in an idealized or overly formal manner.
Where expressions like at least one of "A, B and C, etc. are used, the expressions should generally be interpreted in accordance with the meaning as commonly understood by those skilled in the art (e.g.," a system having at least one of A, B and C "shall include, but not be limited to, a system having a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.). Where a formulation similar to at least one of "A, B or C, etc." is used, in general such a formulation should be interpreted in accordance with the ordinary understanding of one skilled in the art (e.g. "a system with at least one of A, B or C" would include but not be limited to systems with a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.).
The embodiment of the disclosure provides a test monitoring method, a test monitoring device and an electronic device capable of applying the method, and the test monitoring method, the test monitoring device and the electronic device of the embodiment of the disclosure can be applied to the financial field and also can be applied to any field except the financial field, and the application fields of the test monitoring method, the test monitoring device and the electronic device of the embodiment of the disclosure are not limited. The method comprises a test record acquisition process, a submit record acquisition process and a compare process of the submit record and the test record. In the process of acquiring the test record, under the condition that the test behavior is monitored, acquiring the test record corresponding to the test behavior, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is the parameter information which is used when an application program is written and is tested, the test time set comprises the test time corresponding to the first parameter information, and N is a positive integer. In the process of acquiring the commit record, acquiring the commit record after the application program is compiled, wherein the commit record comprises a second parameter information set and a commit time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is the parameter information actually used by the application program is compiled, the commit time set comprises the commit time corresponding to the second parameter information, and M is a positive integer greater than or equal to N. And in the comparison process of the submitted record and the test record, determining target second parameter information in the second parameter information set according to the submitted record and the test record, wherein the target second parameter information comprises the parameter information subjected to the test locally.
In implementing the disclosed concept, the inventors have discovered that since the JVM (Java Virtual Machine ) -Sandbox can provide a solution to AOP (Aspect Oriented Programming, slice-oriented programming) without restarting and without intruding the target JVM application, the disclosed embodiments provide a JVM-Sandbox based test monitoring scheme.
Fig. 1 schematically illustrates an exemplary system architecture 100 in which a test monitoring method may be applied according to an embodiment of the present disclosure. It should be noted that fig. 1 is only an example of a system architecture to which embodiments of the present disclosure may be applied to assist those skilled in the art in understanding the technical content of the present disclosure, but does not mean that embodiments of the present disclosure may not be used in other devices, systems, environments, or scenarios.
As shown in fig. 1, a system architecture 100 according to this embodiment may include terminal devices 101, 102, 103, a network 104, and a server 105. The network 104 is used as a medium to provide communication links between the terminal devices 101, 102, 103 and the server 105. The network 104 may include various connection types, such as wired and/or wireless communication links, and the like.
The user may interact with the server 105 via the network 104 using the terminal devices 101, 102, 103 to receive or send messages or the like. Various communication client applications may be installed on the terminal devices 101, 102, 103, such as shopping class applications, web browser applications, search class applications, instant messaging tools, mailbox clients and/or social platform software, to name a few.
The terminal devices 101, 102, 103 may be a variety of electronic devices having a display screen and supporting web browsing, including but not limited to smartphones, tablets, laptop and desktop computers, and the like.
The server 105 may be a server providing various services, such as a background management server (by way of example only) providing support for websites browsed by users using the terminal devices 101, 102, 103. The background management server may analyze and process the received data such as the user request, and feed back the processing result (e.g., the web page, information, or data obtained or generated according to the user request) to the terminal device.
It should be noted that the test monitoring method provided in the embodiments of the present disclosure may be generally performed by the server 105. Accordingly, the test monitoring apparatus provided by the embodiments of the present disclosure may be generally disposed in the server 105. The test monitoring method provided by the embodiments of the present disclosure may also be performed by a server or a server cluster that is different from the server 105 and is capable of communicating with the terminal devices 101, 102, 103 and/or the server 105. Accordingly, the test monitoring apparatus provided by the embodiments of the present disclosure may also be provided in a server or a server cluster different from the server 105 and capable of communicating with the terminal devices 101, 102, 103 and/or the server 105. Alternatively, the test monitoring method provided by the embodiment of the present disclosure may be performed by the terminal device 101, 102, or 103, or may be performed by another terminal device other than the terminal device 101, 102, or 103. Accordingly, the test monitoring apparatus provided by the embodiments of the present disclosure may also be provided in the terminal device 101, 102, or 103, or in another terminal device different from the terminal device 101, 102, or 103.
It should be understood that the number of terminal devices, networks and servers in fig. 1 is merely illustrative. There may be any number of terminal devices, networks, and servers, as desired for implementation.
Fig. 2 schematically illustrates a flow chart of a test monitoring method according to an embodiment of the present disclosure.
As shown in fig. 2, the method includes operations S210 to S240.
In operation S210, under the condition that the test behavior is monitored, a test record corresponding to the test behavior is obtained, where the test record includes a first parameter information set and a test time set, the first parameter information set includes N pieces of first parameter information, the first parameter information is parameter information used when writing an application program and being tested, and the test time set includes a test time corresponding to the first parameter information, where N is a positive integer.
In embodiments of the present disclosure, test behavior may refer to the behavior of a developer to test parameter information used to write an application. The test behavior can be monitored based on the target monitor, and a test record corresponding to the test behavior can be acquired when the test behavior is monitored. The test record may include parameter information used when writing the application program and being tested and a test time corresponding to the parameter information. The parameter information used when writing the application program and tested can be called first parameter information, and the test time is the time of testing the first parameter information used when writing the application program. The number of the first parameter information may be N, and correspondingly, the number of the test times may be N, the first parameter information set may include N first parameter information, and the test time set may include N test times.
According to an embodiment of the present disclosure, the parameter information used when writing the application program may include a method and a parameter list, and the first parameter information may include first method information and a first parameter list, respectively. The parameter information used in writing the application program can be tested by means of unit test or service access.
In operation S220, a commit record after writing the completed application program is obtained, where the commit record includes a second parameter information set and a commit time set, where the second parameter information set includes M second parameter information, the second parameter information is parameter information actually used by the written application program, and the commit time set includes a commit time corresponding to the second parameter information, where M is a positive integer greater than or equal to N.
In the embodiment of the disclosure, after the application program is completed, the parameter information actually used by the application program is completed and the commit time corresponding to the parameter information may be committed to form a commit record. The parameter information actually used by the writing completion application program may be referred to as second parameter information, and the commit time is the time when the second parameter information actually used by the writing completion application program is committed. The number of the second parameter information may be M, and correspondingly, the number of the commit time may be M, the second parameter information set may include M second parameter information, and the commit time set may include M commit times.
According to an embodiment of the present disclosure, N is a positive integer. M may be a positive integer greater than or equal to N.
In operation S230, target second parameter information in the second parameter information set is determined according to the commit record and the test record, wherein the target second parameter information includes parameter information that has been tested locally.
In the embodiment of the disclosure, since the parameter information actually used by the writing completion application program is submitted, but the parameter information actually used by the writing completion application program is not necessarily submitted, that is, the second parameter information is not necessarily submitted, but the second parameter information is not necessarily tested, in order to avoid the occurrence of low-level errors of the application program as much as possible, the robustness of the application program is enhanced, and the second parameter information needs to be tested before the submission, therefore, if the second parameter information is tested, a test record corresponding to the second parameter information can also be obtained, that is, the parameter information exists in the submit record and the test record, that is, the first parameter information and the second parameter information which are consistent exist, and the submit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
Based on the above, it can be determined whether each of the second parameter information in the second parameter information set is tested according to the commit record and the test record. The parameter information that is tested locally may be referred to as target second parameter information, i.e. the target second parameter information may be understood as parameter information that is tested locally. The number of the target second parameter information may include T, and T may be a positive integer less than or equal to N.
According to an embodiment of the present disclosure, if it is determined that there is first parameter information consistent with the second parameter information in the test record, but the commit time corresponding to the second parameter information is earlier than the test time corresponding to the first parameter information, the second parameter information is considered to be not tested locally.
In operation S240, a test monitoring result for the application program is determined according to the target second parameter information.
In embodiments of the present disclosure, the test monitor results may include the application segment being tested locally and the application segment not being tested locally. Wherein if the parameter information corresponding to the application program segment is subjected to the local test, it can be determined that the application program segment is subjected to the local test. Since the target second parameter information may be understood as parameter information that is tested locally, it may be determined that the application segment associated with the target second parameter information is tested locally. Correspondingly, the application program segments corresponding to the second parameter information except the target second parameter information in the second parameter information set are not subjected to local test.
According to the technical scheme of the embodiment of the disclosure, under the condition that test behaviors are monitored, a test record corresponding to the test behaviors is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is parameter information which is used when an application program is compiled and is tested, the test time set comprises test time corresponding to the first parameter information, a submit record after the application program is compiled is obtained, the submit record comprises a second parameter information set and a submit time set, the second parameter information is parameter information which is actually used when the application program is compiled, the submit time set comprises submit time corresponding to the second parameter information, target second parameter information in the second parameter information set is determined according to the submit record and the test record, the target second parameter information comprises parameter information which is tested locally, and a test monitoring result for the application program is determined according to the target second parameter information. Because the test record corresponding to the test behavior and the submitted record after the application program is compiled are obtained, the parameter information which is tested by the second parameter information concentrated in the local area is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are easy to waste and the monitoring effect is poor due to the adoption of the related technology are at least partially overcome, the test efficiency is improved, and the robustness of the application program is ensured as much as possible.
According to an embodiment of the present disclosure, determining target second parameter information in the second parameter information set from the commit record and the test record may include the following operations.
For each second parameter information in the second parameter information set, determining whether first parameter information consistent with the second parameter information exists in the test record. In the case that it is determined that the first parameter information consistent with the second parameter information exists in the test record, it is determined whether the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information. In the case where it is determined that the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information, the second parameter information is determined as target second parameter information.
In an embodiment of the present disclosure, for each second parameter information in the second parameter information set, it may be determined whether first parameter information consistent with the second parameter information exists in the test record, if it is determined that the first parameter information consistent with the second parameter information exists in the test record, it is determined whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information, and if it is determined that the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information, it may be determined that the second parameter information is the target second parameter information.
According to an embodiment of the present disclosure, if it is determined that there is no first parameter information consistent with the second parameter information in the test record, or it is determined that there is first parameter information consistent with the second parameter information in the test record and a commit time corresponding to the second parameter information is earlier than a test time corresponding to the first parameter information, it may be determined that the second parameter information is not target second parameter information.
According to an embodiment of the present disclosure, the first parameter information includes a first method name, which is a method name of a method used and tested when writing an application, and a first parameter list. The second parameter information includes a second method name, which is a method name of a method actually used by the writing completion application, and a second parameter list. After determining whether there is first parameter information consistent with the second parameter information in the test record for each of the second parameter information in the second parameter information set, the method may further include the following operation.
In the case that the first method name consistent with the second method name and the first parameter list consistent with the second parameter list exist in the test record, the first parameter information consistent with the second parameter information exists in the test record.
In an embodiment of the present disclosure, the first parameter information may include a first method name and a first parameter list, and the second parameter information may include a second method name and a second parameter list. Wherein the parameter list may include a category of the shape parameter, a quantity of the shape parameter, and a sequence of the shape parameter. Accordingly, the first parameter list may include a first category of parameters, a first quantity of parameters, and a first order of parameters. The second parameter list may include a second shape parameter category, a second shape parameter quantity, and a second shape parameter order. Among the M second method names, there is a target second method name, which may include a method name associated with a method that is tested locally.
For each second parameter information in the second parameter information set, if it is determined that there is a first method name consistent with the second method name in the test record and there is a first parameter list consistent with the second parameter list, it may be explained that there is first parameter information consistent with the second parameter information in the test record.
Determining the test monitoring result for the application program according to the target second parameter information may include determining the test monitoring result for the application program according to the target second method name.
According to an embodiment of the present disclosure, in a case where a test behavior is monitored, acquiring a test record corresponding to the test behavior may include the following operations.
The target listener is set in the local environment where the application is located. And calling the target monitor program to monitor the test behavior. And under the condition that the test behaviors are monitored, acquiring a test record corresponding to the test behaviors.
In the embodiment of the disclosure, monitoring of the test behavior can be achieved through a monitoring mechanism, namely, a target monitor program is arranged in a local environment where an application program is located, and the test behavior is monitored by calling the target monitor program, wherein the target monitor program can be achieved based on JVM-Sandbox, namely, a monitoring function is added before parameter information calling is conducted, so that a test record is obtained.
According to the embodiment of the disclosure, since the JVM-Sandbox has the characteristics of no intrusion, class isolation, pluggable, multi-tenant and high compatibility, the starting parameters of a starting service can be configured in the local environment where the application program is located, and the parameter information of the parameters tested locally can be obtained without other additional operations or modification of the application program itself.
According to an embodiment of the present disclosure, in a case where a test behavior is monitored, acquiring a test record corresponding to the test behavior may include the following operations.
The target listener is located at the distributed version control system repository. The target monitor is invoked from the distributed version control system repository by a launch instruction to monitor the test behavior. And under the condition that the test behaviors are monitored, acquiring a test record corresponding to the test behaviors.
In embodiments of the present disclosure, the target listener may be located in a distributed version control system repository in addition to the local environment in which the application is located. This is if the commit record is stored to the distributed version control system repository, then it may be achieved that the relative paths of the acquisition test record and the commit record are consistent.
According to the embodiment of the disclosure, the target monitor program is arranged in the distributed version control system warehouse where the application program is located, and a starting instruction for starting the target monitor program in the agent stage is added in the starting parameter when the local test is performed, so that the parameter information subjected to the local test and the test time corresponding to the parameter information can be obtained.
According to an embodiment of the present disclosure, acquiring a commit record after writing a completed application may include the following operations.
And acquiring a commit record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
In embodiments of the present disclosure, the commit record after the completion of the application program is written may be stored to a distributed version control system repository from which the commit record may be obtained by distributed version control system instructions.
According to embodiments of the present disclosure, obtaining a commit record after writing a complete application from within a distributed version control system repository by a distributed version control system instruction may include the following operations.
And under the condition that the timing task instruction is triggered, acquiring a commit record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
In embodiments of the present disclosure, a commit record after writing into an application may be obtained based on a timed task. The timing task can be triggered by a timing task instruction, and after the timing task is started, the submitting record can be obtained from the distributed version control system warehouse through a distributed version control system instruction.
According to an embodiment of the present disclosure, determining a test monitoring result for an application program according to target second parameter information may include the following operations.
It is determined that the application segment associated with the target second parameter information is locally tested. And determining that the application program segment associated with the non-target second parameter information is not subjected to the local test, wherein the non-target second parameter information is second parameter information except for the target second parameter information in the second parameter information set.
In the embodiment of the present disclosure, since the target second parameter information may be understood as parameter information that is locally tested, if the second parameter information in the second parameter information set is the target second parameter information, it may be determined that the application program segment associated with the target second parameter information is locally tested. If the second parameter information in the second parameter information set is non-target second parameter information, it may be determined that the application segment associated with the non-target second parameter information is not to be tested locally. The non-target second parameter information may be understood as other second parameter information in the second parameter information set except for the target second parameter information, that is, the non-target second parameter information is parameter information that is not tested locally.
Fig. 3 schematically illustrates a flow chart of another test monitoring method according to an embodiment of the disclosure.
As shown in fig. 3, the method includes operations S301 to S310.
In operation S301, a target listener is set in a local environment in which an application program is located.
In operation S302, a target listener is invoked to listen for test behavior.
In operation S303, in the case where the test behavior is monitored, a test record corresponding to the test behavior is acquired.
In operation S304, a commit record after writing the completed application is obtained from within the distributed version control system repository by the distributed version control system instructions.
In operation S305, for each second parameter information in the second parameter information set, determining whether there is first parameter information consistent with the second parameter information in the test record; if yes, executing operation S306; if not, operation S307 is performed.
In operation S306, it is determined whether the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information; if yes, executing operation S309; if not, operation S307 is returned to be executed.
In operation S307, the second parameter information is determined to be non-target second parameter information.
In operation S308, it is determined that the application program segment associated with the non-target second parameter information is not subjected to the local test.
In operation S309, the second parameter information is determined as target second parameter information.
In operation S310, it is determined that the application program segment associated with the target second parameter information is subjected to the local test.
According to the technical scheme of the embodiment of the disclosure, the target monitor program is set in a local environment where the application program is located, the target monitor program is called to monitor the test behavior, under the condition that the test behavior is monitored, a test record corresponding to the test behavior is acquired, the test record comprises a first parameter information set and a test time set, the first parameter information is used when the application program is compiled and is tested, the test time set comprises test time corresponding to the first parameter information, the commit record after the application program is compiled is acquired from a distributed version control system warehouse through a distributed version control system instruction, the commit record comprises a second parameter information set and a commit time set, the second parameter information is parameter information actually used when the application program is compiled, the commit time set comprises commit time corresponding to the second parameter information, target second parameter information in the second parameter information set is determined according to the commit record and the test record, the target second parameter information in the second parameter information set is included in the local test, the application program section related to the target second parameter information is determined, the local test is performed, and the application program section related to the target second parameter information is determined, and the local test is not performed on the application program section related to the non-target second parameter information is determined. Because the test record corresponding to the test behavior and the submitted record after the application program is compiled are obtained, the parameter information which is concentrated and tested locally is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are easy to waste and the monitoring effect is poor due to the adoption of the related technology are at least partially overcome, the test efficiency is improved, and the robustness of the application program is ensured as much as possible.
Fig. 4 schematically illustrates a flow chart of yet another test monitoring method according to an embodiment of the disclosure.
As shown in fig. 4, the method includes operations S401 to S410.
In operation S401, a target listener is set in a distributed version control system repository.
In operation S402, a target listener is invoked from a distributed version control system repository by a launch instruction to listen for test behavior.
In operation S403, in the case where the test behavior is monitored, a test record corresponding to the test behavior is acquired.
In operation S404, a commit record after writing the completed application is obtained from within the distributed version control system repository by the distributed version control system instructions.
In operation S405, for each second parameter information in the second parameter information set, determining whether first parameter information consistent with the second parameter information exists in the test record; if yes, executing operation S406; if not, operation S407 is performed.
In operation S406, it is determined whether the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information; if yes, executing operation S409; if not, the operation S407 is returned to be executed.
In operation S407, the second parameter information is determined to be non-target second parameter information.
In operation S408, it is determined that the application program segment associated with the non-target second parameter information is not subjected to the local test.
In operation S409, it is determined that the second parameter information is target second parameter information.
In operation S410, it is determined that the application program segment associated with the target second parameter information is subjected to the local test. According to the technical scheme of the embodiment of the disclosure, a target monitor program is arranged in a distributed version control system warehouse, a target monitor program is called from the distributed version control system warehouse through a starting instruction to monitor a test behavior, under the condition that the test behavior is monitored, a test record corresponding to the test behavior is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is used when an application program is compiled and is tested, the test time set comprises a test time corresponding to the first parameter information, a commit record after the application program is compiled is obtained from the distributed version control system warehouse through the distributed version control system instruction, the commit record comprises a second parameter information set and a commit time set, the second parameter information is parameter information actually used by the application program is compiled, the commit time set comprises a commit time corresponding to the second parameter information, the target second parameter information in the second parameter information set is determined according to the commit record and the test record, the application program related to the target second parameter information is determined, the application program related to the target second parameter information is subjected to local test, and the application program related to the target second parameter information is determined to be subjected to local test, and the application program related to the non-local test is determined to the target second parameter information. Because the test record corresponding to the test behavior and the submitted record after the application program is compiled are obtained, the parameter information which is concentrated and tested locally is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are easy to waste and the monitoring effect is poor due to the adoption of the related technology are at least partially overcome, the test efficiency is improved, and the robustness of the application program is ensured as much as possible.
Fig. 5 schematically illustrates a block diagram of a test monitoring apparatus according to an embodiment of the disclosure.
As shown in fig. 5, the test monitoring apparatus 500 may include a first acquisition module 510, a second acquisition module 520, a first determination module 530, and a second determination module 540.
The first acquisition module 510, the second acquisition module 520, the first determination module 530, and the second determination module 540 are communicatively coupled.
The first obtaining module 510 is configured to obtain, when the test behavior is monitored, a test record corresponding to the test behavior, where the test record includes a first parameter information set and a test time set, the first parameter information set includes N pieces of first parameter information, the first parameter information is parameter information that is used when writing an application program and is tested, and the test time set includes a test time corresponding to the first parameter information, where N is a positive integer.
The second obtaining module 520 is configured to obtain a commit record after writing the completed application program, where the commit record includes a second parameter information set and a commit time set, the second parameter information set includes M second parameter information, the second parameter information is parameter information actually used by the written application program, and the commit time set includes a commit time corresponding to the second parameter information, where M is a positive integer greater than or equal to N.
The first determining module 530 is configured to determine target second parameter information in the second parameter set according to the submitting record and the testing record, where the target second parameter information includes parameter information that is tested locally.
And a second determining module 540, configured to determine a test monitoring result for the application program according to the target second parameter information.
According to the technical scheme of the embodiment of the disclosure, under the condition that test behaviors are monitored, a test record corresponding to the test behaviors is obtained, the test record comprises a first parameter information set and a test time set, the first parameter information is parameter information which is used when an application program is compiled and is tested, the test time set comprises test time corresponding to the first parameter information, a submit record after the application program is compiled is obtained, the submit record comprises a second parameter information set and a submit time set, the second parameter information is parameter information which is actually used when the application program is compiled, the submit time set comprises submit time corresponding to the second parameter information, target second parameter information in the second parameter information set is determined according to the submit record and the test record, the target second parameter information comprises parameter information which is tested locally, and a test monitoring result for the application program is determined according to the target second parameter information. Because the test record corresponding to the test behavior and the submitted record after the application program is compiled are obtained, the parameter information which is concentrated and tested locally is determined based on the submitted record and the test record, and manual monitoring is not needed, the technical problems that resources are easy to waste and the monitoring effect is poor due to the adoption of the related technology are at least partially overcome, the test efficiency is improved, and the robustness of the application program is ensured as much as possible.
According to an embodiment of the present disclosure, the first determination module 530 may include a first determination sub-module, a second determination sub-module, and a third determination sub-module.
The first determining sub-module is used for determining whether first parameter information consistent with the second parameter information exists in the test record for each piece of second parameter information in the second parameter information set.
And the second determining submodule is used for determining whether the submitting time corresponding to the second parameter information is later than the testing time corresponding to the first parameter information or not under the condition that the first parameter information consistent with the second parameter information exists in the testing record.
And a third determination sub-module for determining the second parameter information as target second parameter information in case that it is determined that the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
According to an embodiment of the present disclosure, the first parameter information includes a first method name, which is a method name of a method used and tested when writing an application, and a first parameter list. The second parameter information includes a second method name, which is a method name of a method actually used by the writing completion application, and a second parameter list.
After determining whether there is first parameter information consistent with the second parameter information in the test record for each of the second parameter information in the second parameter information set, further comprising:
in the case that the first method name consistent with the second method name and the first parameter list consistent with the second parameter list exist in the test record, the first parameter information consistent with the second parameter information exists in the test record.
According to an embodiment of the present disclosure, the first obtaining module 510 may include a first setting sub-module, a first calling sub-module, and a first obtaining sub-module.
And the first setting submodule is used for setting the target monitor program in the local environment where the application program is located.
And the first calling sub-module is used for calling the target monitor program to monitor the test behavior.
The first acquisition sub-module is used for acquiring the test record corresponding to the test behavior under the condition that the test behavior is monitored.
According to an embodiment of the present disclosure, the first obtaining module 510 may further include a second setting sub-module, a second calling sub-module, and a second obtaining sub-module.
And the first setting submodule is used for setting the target monitor program in the distributed version control system warehouse.
And the second calling sub-module is used for calling the target monitor program to monitor the test behavior from the distributed version control system warehouse through a starting instruction.
And the second acquisition sub-module is used for acquiring the test record corresponding to the test behavior under the condition of monitoring the test behavior.
According to an embodiment of the present disclosure, the second acquisition module 520 may include a third acquisition sub-module.
And the third acquisition sub-module is used for acquiring the submitted record after the application program is written from the distributed version control system warehouse through the distributed version control system instruction.
According to an embodiment of the present disclosure, the third acquisition sub-module may include an acquisition unit.
And the acquisition unit is used for acquiring the submitted record after the application program is written from the distributed version control system warehouse through the distributed version control system instruction under the condition that the timing task instruction is triggered.
According to an embodiment of the present disclosure, the second determination module 540 may include a fourth determination sub-module and a fifth determination sub-module.
And the fourth determination submodule is used for determining that the application program segment associated with the target second parameter information is subjected to local test.
And a fifth determining submodule, configured to determine that the application program segment associated with the non-target second parameter information does not undergo the local test, where the non-target second parameter information is second parameter information except for the target second parameter information in the second parameter information set.
Any number of the modules, sub-modules, units, or at least some of the functionality of any number of the modules, sub-modules, units, may be implemented in one module in accordance with embodiments of the present disclosure. Any one or more of the modules, sub-modules, units according to embodiments of the present disclosure may be implemented as a split into multiple modules. Any one or more of the modules, sub-modules, units according to embodiments of the present disclosure may be implemented at least in part as a hardware circuit, such as a field programmable gate array (Field Programmable Gate Array, FPGA), a programmable logic array (Programmable Logic Arrays, PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (Application Specific Integrated Circuit, ASIC), or in hardware or firmware in any other reasonable manner of integrating or packaging the circuits, or in any one of or a suitable combination of any of the three. Alternatively, one or more of the modules, sub-modules, units according to embodiments of the present disclosure may be at least partially implemented as computer program modules, which when executed, may perform the corresponding functions.
For example, any of the first acquisition module 510, the second acquisition module 520, the first determination module 530, and the second determination module 540 may be combined in one module/sub-module/unit, or any of the modules/sub-modules/units may be split into a plurality of modules/sub-modules/units. Alternatively, at least some of the functionality of one or more of these modules/sub-modules/units may be combined with at least some of the functionality of other modules/sub-modules/units and implemented in one module/sub-module/unit. According to embodiments of the present disclosure, at least one of the first acquisition module 510, the second acquisition module 520, the first determination module 530, and the second determination module 540 may be implemented at least in part as hardware circuitry, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented in hardware or firmware in any other reasonable manner of integrating or packaging the circuitry, or in any one of or a suitable combination of three of software, hardware, and firmware. Alternatively, at least one of the first acquisition module 510, the second acquisition module 520, the first determination module 530, and the second determination module 540 may be at least partially implemented as computer program modules, which when executed, may perform the respective functions.
It should be noted that, in the embodiment of the present disclosure, the test monitoring device portion corresponds to the test monitoring method portion in the embodiment of the present disclosure, and the description of the test monitoring device portion specifically refers to the test monitoring method portion and is not described herein.
Fig. 6 schematically shows a block diagram of an electronic device adapted to implement the method described above, according to an embodiment of the disclosure. The electronic device shown in fig. 6 is merely an example and should not be construed to limit the functionality and scope of use of the disclosed embodiments.
As shown in fig. 6, an electronic device 600 according to an embodiment of the present disclosure includes a processor 601 that can perform various appropriate actions and processes according to a program stored in a Read-Only Memory (ROM) 602 or a program loaded from a storage section 608 into a random access Memory (Random Access Memory, RAM) 603. The processor 601 may include, for example, a general purpose microprocessor (e.g., a CPU), an instruction set processor and/or an associated chipset and/or a special purpose microprocessor (e.g., an Application Specific Integrated Circuit (ASIC)), or the like. Processor 601 may also include on-board memory for caching purposes. The processor 601 may comprise a single processing unit or a plurality of processing units for performing different actions of the method flows according to embodiments of the disclosure.
In the RAM 603, various programs and data necessary for the operation of the electronic apparatus 600 are stored. The processor 601, the ROM 602, and the RAM 603 are connected to each other through a bus 604. The processor 601 performs various operations of the method flow according to the embodiments of the present disclosure by executing programs in the ROM 602 and/or the RAM 603. Note that the program may be stored in one or more memories other than the ROM 602 and the RAM 603. The processor 601 may also perform various operations of the method flow according to embodiments of the present disclosure by executing programs stored in the one or more memories.
According to an embodiment of the present disclosure, the electronic device 600 may also include an input/output (I/O) interface 605, the input/output (I/O) interface 605 also being connected to the bus 604. The electronic device 600 may also include one or more of the following components connected to the I/O interface 605: an input portion 606 including a keyboard, mouse, etc.; an output portion 607 including a Cathode Ray Tube (CRT), a liquid crystal display (Liquid Crystal Display, LCD), and the like, and a speaker, and the like; a storage section 608 including a hard disk and the like; and a communication section 609 including a network interface card such as a LAN card, a modem, or the like. The communication section 609 performs communication processing via a network such as the internet. The drive 610 is also connected to the I/O interface 605 as needed. Removable media 611 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is installed as needed on drive 610 so that a computer program read therefrom is installed as needed into storage section 608.
According to embodiments of the present disclosure, the method flow according to embodiments of the present disclosure may be implemented as a computer software program. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable storage medium, the computer program comprising program code for performing the method shown in the flowcharts. In such an embodiment, the computer program may be downloaded and installed from a network through the communication portion 609, and/or installed from the removable medium 611. The above-described functions defined in the system of the embodiments of the present disclosure are performed when the computer program is executed by the processor 601. The systems, devices, apparatus, modules, units, etc. described above may be implemented by computer program modules according to embodiments of the disclosure.
The present disclosure also provides a computer-readable storage medium that may be embodied in the apparatus/device/system described in the above embodiments; or may exist alone without being assembled into the apparatus/device/system. The computer-readable storage medium carries one or more programs which, when executed, implement methods in accordance with embodiments of the present disclosure.
According to embodiments of the present disclosure, the computer-readable storage medium may be a non-volatile computer-readable storage medium. Examples may include, but are not limited to: portable computer diskette, hard disk, random Access Memory (RAM), read-Only Memory (ROM), erasable programmable read-Only Memory (EPROM (Erasable Programmable Read Only Memory) or flash Memory), portable compact disc read-Only Memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination of the foregoing. In the context of this disclosure, a computer-readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
For example, according to embodiments of the present disclosure, the computer-readable storage medium may include ROM 602 and/or RAM 603 and/or one or more memories other than ROM 602 and RAM 603 described above.
According to the embodiment of the disclosure, the test record corresponding to the test behavior and the submitted record after the application program is compiled are acquired, and the parameter information which is tested by the second parameter information concentrated in the local area is determined based on the submitted record and the test record, so that manual monitoring is not needed, the technical problems that resources are wasted easily and the monitoring effect is poor due to the adoption of the related technology are at least partially overcome, the test efficiency is improved, and the robustness of the application program is ensured as much as possible.
Embodiments of the present disclosure also include a computer program product comprising a computer program comprising program code for performing the methods provided by the embodiments of the present disclosure, when the computer program product is run on an electronic device, for causing the electronic device to implement the test monitoring methods provided by the embodiments of the present disclosure.
The above-described functions defined in the system/apparatus of the embodiments of the present disclosure are performed when the computer program is executed by the processor 601. The systems, apparatus, modules, units, etc. described above may be implemented by computer program modules according to embodiments of the disclosure.
In one embodiment, the computer program may be based on a tangible storage medium such as an optical storage device, a magnetic storage device, or the like. In another embodiment, the computer program may also be transmitted, distributed in the form of signals over a network medium, and downloaded and installed via the communication section 609, and/or installed from the removable medium 611. The computer program may include program code that may be transmitted using any appropriate network medium, including but not limited to: wireless, wired, etc., or any suitable combination of the foregoing.
According to embodiments of the present disclosure, program code for performing computer programs provided by embodiments of the present disclosure may be written in any combination of one or more programming languages, and in particular, such computer programs may be implemented in high-level procedural and/or object-oriented programming languages, and/or assembly/machine languages. Programming languages include, but are not limited to, such as Java, c++, python, "C" or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, partly on a remote computing device, or entirely on the remote computing device or server. In the case of remote computing devices, the remote computing device may be connected to the user computing device through any kind of network, including a local area network (Local Area Network, LAN) or wide area network (Wide Area Networks, WAN), or may be connected to an external computing device (e.g., connected through the internet using an internet service provider).
The flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams or flowchart illustration, and combinations of blocks in the block diagrams or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions. Those skilled in the art will appreciate that the features recited in the various embodiments of the disclosure and/or in the claims may be combined in various combinations and/or combinations, even if such combinations or combinations are not explicitly recited in the disclosure. In particular, the features recited in the various embodiments of the present disclosure and/or the claims may be variously combined and/or combined without departing from the spirit and teachings of the present disclosure. All such combinations and/or combinations fall within the scope of the present disclosure.
The embodiments of the present disclosure are described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments are described above separately, this does not mean that the measures in the embodiments cannot be used advantageously in combination. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be made by those skilled in the art without departing from the scope of the disclosure, and such alternatives and modifications are intended to fall within the scope of the disclosure.

Claims (10)

1. A test monitoring method comprising:
under the condition that test behaviors are monitored, a test record corresponding to the test behaviors is obtained, wherein the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used when an application program is written and is tested, the test time set comprises test time corresponding to the first parameter information, and N is a positive integer;
acquiring a commit record after the application program is compiled, wherein the commit record comprises a second parameter information set and a commit time set, wherein the second parameter information set comprises M pieces of second parameter information, the second parameter information is parameter information actually used by the application program is compiled, and the commit time set comprises commit time corresponding to the second parameter information, wherein M is a positive integer greater than or equal to N;
Determining target second parameter information in the second parameter information set according to the submitting record and the testing record, wherein the target second parameter information comprises parameter information subjected to local testing;
determining a test monitoring result aiming at the application program according to the target second parameter information;
wherein said determining target second parameter information in said second parameter information set from said commit record and said test record comprises:
determining, for each second parameter information in the second parameter information set, whether first parameter information consistent with the second parameter information exists in the test record;
determining whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information in the case that the first parameter information consistent with the second parameter information exists in the test record; and
and determining the second parameter information as target second parameter information in the case that the submitting time corresponding to the second parameter information is determined to be later than the testing time corresponding to the first parameter information.
2. The method of claim 1, wherein the first parameter information includes a first method name and a first parameter list, the first method name being a method name of a method used and tested when writing an application program; the second parameter information comprises a second method name and a second parameter list, wherein the second method name is a method name for writing a method actually used by the application program;
After determining, for each second parameter information in the second parameter information set, whether there is first parameter information consistent with the second parameter information in the test record, further including:
and determining that the first parameter information consistent with the second parameter information exists in the test record under the condition that the first method name consistent with the second method name exists in the test record and the first parameter list consistent with the second parameter list is determined.
3. The method of claim 1, wherein the acquiring a test record corresponding to a test behavior if the test behavior is monitored comprises:
setting a target monitor program in a local environment where an application program is located;
calling the target monitor program to monitor test behaviors; and
and under the condition that the test behaviors are monitored, acquiring a test record corresponding to the test behaviors.
4. The method of claim 1, wherein the acquiring a test record corresponding to a test behavior if the test behavior is monitored comprises:
setting a target monitor program in a distributed version control system warehouse;
Calling the target monitor program from the distributed version control system warehouse through a starting instruction to monitor test behaviors; and
and under the condition that the test behaviors are monitored, acquiring a test record corresponding to the test behaviors.
5. The method of claim 1, wherein the obtaining a commit record after writing the application is completed comprises:
and acquiring a commit record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
6. The method of claim 5, wherein the obtaining, by the distributed version control system instructions, a commit record from within the distributed version control system repository after writing the application program is completed comprises:
and under the condition that the timing task instruction is triggered, acquiring a commit record after the application program is written from a distributed version control system warehouse through a distributed version control system instruction.
7. The method of claim 1, wherein the determining a test monitoring result for the application program according to the target second parameter information comprises:
determining that an application program segment associated with the target second parameter information is subjected to local testing; and
And determining that the application program segment associated with non-target second parameter information is not subjected to local test, wherein the non-target second parameter information is second parameter information except for the target second parameter information in the second parameter information set.
8. A test monitoring apparatus comprising:
the system comprises a first acquisition module, a second acquisition module and a test module, wherein the first acquisition module is used for acquiring a test record corresponding to a test behavior under the condition that the test behavior is monitored, the test record comprises a first parameter information set and a test time set, the first parameter information set comprises N pieces of first parameter information, the first parameter information is used when an application program is written and is tested, the test time set comprises test time corresponding to the first parameter information, and N is a positive integer;
the second acquisition module is used for acquiring a commit record after the application program is compiled, wherein the commit record comprises a second parameter information set and a commit time set, the second parameter information set comprises M pieces of second parameter information, the second parameter information is parameter information actually used by the application program after the application program is compiled, and the commit time set comprises commit time corresponding to the second parameter information, wherein M is a positive integer greater than or equal to N;
The first determining module is used for determining target second parameter information in the second parameter information set according to the submitting record and the testing record, wherein the target second parameter information comprises parameter information subjected to local testing; and
the second determining module is used for determining a test monitoring result aiming at the application program according to the target second parameter information;
the first determining module comprises a first determining sub-module, a second determining sub-module and a third determining sub-module;
a first determining submodule, configured to determine, for each second parameter information in the second parameter information set, whether first parameter information consistent with the second parameter information exists in the test record;
a second determining sub-module, configured to determine, if it is determined that first parameter information consistent with the second parameter information exists in the test record, whether a commit time corresponding to the second parameter information is later than a test time corresponding to the first parameter information; and
and a third determining sub-module, configured to determine the second parameter information as target second parameter information if it is determined that the commit time corresponding to the second parameter information is later than the test time corresponding to the first parameter information.
9. An electronic device, comprising:
one or more processors;
a memory for storing one or more programs,
wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of any of claims 1-7.
10. A computer readable storage medium having stored thereon executable instructions which when executed by a processor cause the processor to implement the method of any of claims 1 to 7.
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CN111176973A (en) * 2018-11-13 2020-05-19 北京京东尚科信息技术有限公司 Test method, system, electronic device and computer readable medium

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