CN112504900A - 一种模拟复合绝缘子内部发热的装置 - Google Patents
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Abstract
为了解决现在模拟复合绝缘子内部发热的方法中存在的加热不均匀、无法控制加热位置等导致不能完美复制发热复合绝缘子的状况,本发明提出一种模拟复合绝缘子内部发热的装置,包括含有温度传感器的电磁感应加热器、与电磁感应加热器相连的水冷系统、热像仪和数据采集及处理系统,数据采集和处理系统连接并控制热像仪和电磁感应加热器的电磁激励源;数据采集及处理系统包括工控机、数字硅箱、控制盒和显示器及键盘。本发明基于涡流效应,实现了玻璃钢芯棒与硅橡胶护套界面上的局部加热,而非传统的绝缘子整体加热。通过温度传感器控制最终加热温度,调整电磁线圈输出功率及加热时间,可以得到不同老化程度的复合绝缘子。
Description
技术领域
本发明涉及电力系统安全领域,更具体涉及一种模拟复合绝缘子内部发热的装置。
背景技术
复合绝缘子因为其优良的憎水性能,从而有着较强的耐污闪能力,解决了长期困扰电力部门的绝缘子污闪问题。再加上复合绝缘子比强度高,安装维护方便等优点被广泛应用,起着保护电力系统和设备的作用。但近年来运行中的复合绝缘子出现了酥朽断裂的异常断裂现象,引发了极为恶劣的电网安全事故。初步的实验研究表明高温是导致复合绝缘子酥朽断裂的关键因素。因此,希望能够尽可能模拟现场复合绝缘子发热现象,进一步研究高温对于复合绝缘子酥朽断裂的影响,提出高温导致复合绝缘子酥朽断裂的机理,以此找到预防复合绝缘子酥朽断裂的有效措施。
实际运行中复合绝缘子酥朽断裂均发生在高压侧,首先发生在芯棒和绝缘护套的交界处,局部放电产生的能量在硅橡胶护套包裹的较为封闭的环境里产生高温,温升常常可以达到几十度。因此,复合绝缘子的异常发热现象产生于玻璃钢芯棒与绝缘护套的交界面处,通常位于高压端的前几个伞裙的某一部位。现有的实验室加热手段难以模拟界面处的发热,传统的方法是对绝缘子(包括绝缘护套)加热,热量传递由护套表面逐渐向内发展,或者是对芯棒加热,不再考虑绝缘护套的影响,且各种热老化模拟实验往往是对完整的样品加热,不符合现场复合绝缘子局部发热的特点,模拟出来的酥朽劣化形貌与现场酥朽断裂的绝缘子差别较大,难以在实验室中复现绝缘子热老化过程,对酥朽断裂的机理的进一步研究造成障碍。
发明内容
为了解决现在模拟复合绝缘子内部发热的方法中存在的加热不均匀、无法控制加热位置等导致不能完美复制发热复合绝缘子的状况,本发明提出以下解决方案。
一种模拟复合绝缘子内部发热的装置,包括含有温度传感器的电磁感应加热器、与电磁感应加热器相连的水冷系统、热像仪和数据采集及处理系统,数据采集和处理系统连接并控制热像仪和电磁感应加热器的电磁激励源。
进一步的,数据采集及处理系统包括工控机、数字硅箱、控制盒和显示器及键盘。
进一步的,还包括模拟复合绝缘子样品,模拟复合绝缘子样品为一个最外层为硅橡胶护套的圆柱形器件,内部为玻璃钢芯棒,芯棒和硅橡胶护套交界处埋藏小型金属材质的人工缺陷。
优选的,电磁感应加热器输入电压范围为180-240V,最大工作电流为1000A,最大输出功率为15kW,振荡频率控制范围为100-150kHz。
优选的,水冷系统的冷却水压为0.2-0.3MPa,用以对感应线圈进行冷却降温。
本发明的有益效果为:
电磁加热相比其他实验室加热手段,在模拟复合绝缘子异常发热方面有响应速度快、便于控制功率、逼近工程实际发热情况诸多优势。本发明基于涡流效应,实现了玻璃钢芯棒与硅橡胶护套界面上的局部加热,而非传统的绝缘子整体加热。通过温度传感器控制最终加热温度,调整电磁线圈输出功率及加热时间,可以得到不同老化程度的复合绝缘子。
本发明为研究高温对复合绝缘子的破坏作用提供了一种行之有效的实验手段。
附图说明
图1为本发明所述装置结构示意图,
其中,1-水冷系统,2-电磁感应加热器,3-热像仪,4-数据采集和处理系统,5-模拟复合绝缘子样品。
具体实施方式
下面将结合附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。
实施例1
一种模拟复合绝缘子内部发热的装置,包括含有温度传感器的电磁感应加热器(2)、与电磁感应加热器相连的水冷系统(1)、热像仪(3)和数据采集及处理系统(4),数据采集和处理系统连接并控制热像仪和电磁感应加热器的电磁激励源;数据采集及处理系统包括工控机、数字硅箱、控制盒和显示器及键盘。
电磁感应加热器输入电压范围为180-240V,最大工作电流为1000A,最大输出功率为15kW,振荡频率控制范围为100-150kHz,水冷系统的冷却水压为0.2-0.3MPa,用以对感应线圈进行冷却降温,红外热像仪型号为Telops FAST M200,红外图像分辨率可达640×512pixels,光谱响应波段范围为1.5μm~5.1μm,典型NETD为18mK,热像仪采集帧频可达210Hz,在窗口模式下最高帧频能达到5600Hz。
使用时,将模拟复合绝缘子样品(5)放入电磁感应加热器,所述模拟复合绝缘子样品为一个最外层为硅橡胶护套的圆柱形器件,内部为玻璃钢芯棒,所述芯棒和硅橡胶护套交界处埋藏小型金属材质的人工缺陷(如钢针或线圈)。
实验人员可以通过温度传感器实时监测模拟复合绝缘子的温度,调整电磁线圈的输出功率和加热时间来模拟不同复合绝缘子的老化程度;可以通过改变模拟复合绝缘子样品人工缺陷的位置来模拟不同位置异常发热的状况。
用本发明的模拟复合绝缘子内部发热的装置进行模拟老化的效果与真实的现场酥朽老化样品对比如下表所示。
综合上述老化结果对比,酥朽老化芯棒与本发明电磁加热老化芯棒外观极为相似,微观结构均能观察到环氧树脂基体分解、玻璃纤维裸露;化学组成上,环氧树脂基体中的苯环结构、甲基、芳香族结构、玻璃纤维中的Si-O键均被破坏;元素组成上,两者各元素质量占比相近,相似度达到95%以上。
实施例2
模拟复合绝缘子的人工缺陷使用曲率半径为1μm的镀金钨针及线圈,位于未打磨和涂覆偶联剂的芯棒和硅橡胶护套之间,紧贴针尖处有长径10mm,短径 2mm的半椭球面的空气间隙。
样品长度统一为50mm,芯棒直径24mm,护套厚度6mm,针尖距离底部(即距离护套最外层的最大垂直距离)20mm。
以上所述仅为本发明的优选实施例而已,并不用于限制本发明,尽管参照前述实施例对本发明进行了详细的说明,对于本领域的技术人员来说,其依然可以对前述各实施例所记载的技术方案进行修改,或者对其中部分技术特征进行等同替换。凡在本发明的精神和原则之内,所作的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。
Claims (5)
1.一种模拟复合绝缘子内部发热的装置,其特征在于,包括含有温度传感器的电磁感应加热器(2)、与电磁感应加热器相连的水冷系统(1)、热像仪(3)和数据采集及处理系统(4),所述数据采集和处理系统连接并控制热像仪和电磁感应加热器的电磁激励源。
2.根据权利要求1所述的模拟复合绝缘子内部发热的装置,其特征在于,所述数据采集及处理系统包括工控机、数字硅箱、控制盒和显示器及键盘。
3.根据权利要求1所述的模拟复合绝缘子内部发热的装置,其特征在于,还包括模拟复合绝缘子样品(5),所述模拟复合绝缘子样品为一个最外层为硅橡胶护套的圆柱形器件,内部为玻璃钢芯棒,所述芯棒和硅橡胶护套交界处埋藏小型金属材质的人工缺陷。
4.根据权利要求1所述的模拟复合绝缘子内部发热的装置,其特征在于,所述电磁感应加热器输入电压范围为180-240V,最大工作电流为1000A,最大输出功率为15kW,振荡频率控制范围为100-150kHz。
5.根据权利要求1所述的模拟复合绝缘子内部发热的装置,其特征在于,所述水冷系统的冷却水压为0.2-0.3MPa,用以对感应线圈进行冷却降温。
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