CN112485562B - Memory seat testing method and device, electronic equipment and storage medium - Google Patents
Memory seat testing method and device, electronic equipment and storage medium Download PDFInfo
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- CN112485562B CN112485562B CN202011251542.8A CN202011251542A CN112485562B CN 112485562 B CN112485562 B CN 112485562B CN 202011251542 A CN202011251542 A CN 202011251542A CN 112485562 B CN112485562 B CN 112485562B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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- G01M99/001—Testing of furniture, e.g. seats or mattresses
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Abstract
The invention belongs to the technical field of vehicle memory seats, and discloses a memory seat testing method and device, electronic equipment and a storage medium. The method comprises the following steps: when the memory seat executes the automatic position adjusting function, acquiring a current rotating electric signal of a memory seat motor; counting pulses according to the current rotation electric signal; stopping pulse counting when the memory seat motor does not output a rotating electric signal within a first preset time, and acquiring a current pulse counting value; and when the current pulse count value is different from a preset pulse count value, judging that the memory seat has a fault. According to the method, the actual pulse number corresponding to the rotating electric signal of the motor when the memory seat performs the automatic position adjusting function is compared with the preset pulse number, so that the method is not influenced by a real vehicle, and the testing precision of the memory seat is improved.
Description
Technical Field
The invention relates to the technical field of automobile memory seats, in particular to a memory seat testing method and device, electronic equipment and a storage medium.
Background
The memory seat can store the seat position, and when the vehicle has a plurality of users, the position of the one-key seat can be adjusted by calling each seat position stored in the memory seat, so that repeated adjustment is avoided.
In the prior art, a memory seat is usually tested on a real vehicle, the memory seat stores a preset seat position by adjusting the seat position, and then the memory seat is measured to judge whether a memory function is realized according to the position automatically adjusted by the preset seat position; however, the actual vehicle environment is poor, the test error is large, it is impossible to accurately measure whether the adjusted positions are consistent, and it is also impossible to test whether the logic judgment of the MCU (Microcontroller Unit) on the seat position processing is wrong.
Disclosure of Invention
The invention mainly aims to provide a memory seat testing method, a memory seat testing device, electronic equipment and a storage medium, and aims to solve the technical problem of low testing precision of a memory seat in the prior art.
In order to achieve the above object, the present invention provides a memory seat testing method, including:
when the memory seat executes the automatic position adjusting function, acquiring a current rotating electric signal of a memory seat motor;
counting pulses according to the current rotation electric signal;
stopping pulse counting when the memory seat motor does not output a rotating electric signal within a first preset time, and acquiring a current pulse counting value;
and when the current pulse count value is different from a preset pulse count value, judging that the memory seat has a fault.
Optionally, before the step of obtaining the current rotation electric signal of the memory seat motor when the memory seat performs the automatic position adjustment function, the method further includes:
acquiring preset memory seat position information according to a preset test task;
adjusting the memory seat from a preset initial position to a preset memory position according to the preset memory seat position information so that the memory seat stores the preset memory position;
and acquiring a current rotating electric signal of a memory seat motor in the adjustment process, counting pulses according to the current rotating electric signal, and taking a counting result as a preset pulse counting value.
Optionally, after the step of acquiring a current rotation electric signal of the seat motor during the adjustment process, performing pulse counting according to the current rotation electric signal, and taking a counting result as a preset pulse count value, the method further includes:
and sending a position restoration instruction to the memory seat so that the memory seat is adjusted to the preset initial position according to the position restoration instruction.
Optionally, the step of counting pulses according to the current rotation electric signal specifically includes:
acquiring the motion frequency of the memory seat motor according to the current rotation electric signal;
and generating a pulse electric signal according to the motion frequency, and counting pulses according to the pulse number of the pulse electric signal.
Optionally, before the step of obtaining the current rotation electric signal of the memory seat motor when the memory seat performs the automatic position adjustment function, the method further includes:
generating a position adjusting instruction according to a preset test task;
and sending the position adjusting instruction to the memory seat so that a controller of the memory seat obtains a corresponding preset memory position according to the position adjusting instruction and executes an automatic position adjusting function according to the preset memory position.
Optionally, after the step of stopping pulse counting and obtaining a current pulse count value when the memory seat motor does not output a rotation electric signal within a first preset time, the method further includes:
when the current pulse count value is the same as a preset pulse count value, judging whether the current position of the memory seat is the same as a preset memory position;
and when the current position of the memory seat is different from the preset memory position, judging that the memory seat has an initial position recording fault.
Optionally, when the current pulse count value is different from a preset pulse count value, after the step of determining that the memory seat has a fault, the method further includes:
detecting whether an obstacle exists in a preset range of a memory seat slideway;
and when the obstacle exists in the preset range of the memory seat slideway, judging that the memory seat fault is an external fault.
In addition, in order to achieve the above object, the present invention also provides a memory seat testing apparatus, including:
the motor detection module is used for acquiring a current rotation electric signal of a memory seat motor when the memory seat executes an automatic position adjustment function;
the sensing counting module is used for counting pulses according to the current rotating electric signal;
the counting and counting module is used for stopping pulse counting and acquiring a current pulse counting value when the memory seat motor does not output a rotating electric signal within a first preset time;
and the fault detection module is used for judging that the memory seat has a fault when the current pulse counting value is different from the preset pulse counting value.
In addition, to achieve the above object, the present invention further provides an electronic device, including: a memory, a processor and a memory seat test program stored on the memory and executable on the processor, the memory seat test program configured to implement the steps of the memory seat test method as described above.
In addition, to achieve the above object, the present invention further provides a storage medium, which stores a memory seat test program, and the memory seat test program implements the steps of the memory seat test method as described above when executed by a processor.
According to the invention, when the memory seat executes an automatic position adjusting function, the current rotating electric signal of the memory seat motor is obtained; counting pulses according to the current rotation electric signal; stopping pulse counting when the memory seat motor does not output a rotating electric signal within a first preset time, and acquiring a current pulse counting value; and when the current pulse count value is different from a preset pulse count value, judging that the memory seat has a fault. According to the method, the actual pulse number corresponding to the rotating electric signal of the motor when the memory seat performs the automatic position adjusting function is compared with the preset pulse number, so that the method is not influenced by a real vehicle, and the testing precision of the memory seat is improved.
Drawings
Fig. 1 is a schematic structural diagram of an electronic device in a hardware operating environment according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart illustrating a first embodiment of a method for testing a memory seat according to the present invention;
FIG. 3 is a flowchart illustrating a second embodiment of a method for testing a memory seat of the present invention;
FIG. 4 is a flowchart illustrating a testing method for a memory seat according to a third embodiment of the present invention;
FIG. 5 is a flowchart illustrating a testing method for a memory seat according to a fourth embodiment of the present invention;
FIG. 6 is a block diagram of a memory seat testing device according to a first embodiment of the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an electronic device in a hardware operating environment according to an embodiment of the present invention.
As shown in fig. 1, the electronic device may include: a processor 1001, such as a Central Processing Unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. Wherein a communication bus 1002 is used to enable connective communication between these components. The user interface 1003 may include a Display screen (Display), an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a WIreless interface (e.g., a WIreless-FIdelity (WI-FI) interface). The Memory 1005 may be a Random Access Memory (RAM) Memory, or may be a Non-Volatile Memory (NVM), such as a disk Memory. The memory 1005 may alternatively be a storage device separate from the processor 1001.
Those skilled in the art will appreciate that the configuration shown in fig. 1 does not constitute a limitation of the electronic device and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components.
As shown in fig. 1, a memory 1005, which is a storage medium, may include therein an operating system, a network communication module, a user interface module, and a memory seat test program.
In the electronic apparatus shown in fig. 1, the network interface 1004 is mainly used for data communication with a network server; the user interface 1003 is mainly used for data interaction with a user; the processor 1001 and the memory 1005 in the electronic device according to the present invention may be provided in the electronic device, and the electronic device calls the memory seat test program stored in the memory 1005 through the processor 1001 and executes the memory seat test method provided by the embodiment of the present invention.
An embodiment of the invention provides a memory seat testing method, and referring to fig. 2, fig. 2 is a schematic flow chart of a first embodiment of the memory seat testing method according to the invention.
In this embodiment, the memory seat testing method includes the following steps:
step S10: and when the memory seat executes the automatic position adjusting function, acquiring a current rotating electric signal of a memory seat motor.
It should be noted that, the execution main body of this embodiment is a memory seat testing device, the object to be tested in this embodiment is a microcontroller MCU of a memory seat, before the test, an external input environment of the microcontroller MCU is constructed, and a hall sensor model and a memory seat motor model are constructed, that is, in this embodiment, the memory seat motor and the hall sensor performing pulse counting are generated by model simulation, and the simulation hardware is supported by an I/O board. Triggering the memory seat microcontroller MCU to execute an automatic position adjusting function, then sending a control signal to the simulated memory seat motor by the microcontroller MCU, triggering the memory seat motor to send a current rotation electric signal to the simulated Hall sensor, and starting to send a pulse number to the memory seat microcontroller MCU when the Hall sensor receives the current rotation electric signal of the memory seat motor, thereby forming a set of closed-loop system.
Step S20: and counting pulses according to the current rotation electric signal.
It should be noted that, in the real vehicle, the memory seat is mutually matched with the memory seat motor through the hall sensor, the memory seat motor rotates for one circle and sends a rotation electric signal to the hall sensor, and the hall sensor can generate and send a corresponding pulse number to the microcontroller MCU according to the rotation electric signal, so that under the condition that each device in the memory seat works normally, a linear relationship exists between the stroke of the memory seat motor and the pulse number of the hall sensor.
Further, to accurately perform pulse counting, step S20 specifically includes: acquiring the motion frequency of the memory seat motor according to the current rotation electric signal; and generating a pulse electric signal according to the motion frequency, and counting pulses according to the pulse number of the pulse electric signal.
It should be noted that the hall sensor model provides a hall sensor counter value. When the memory seat motor outputs positive rotation, the counter value is increased according to the corresponding current rotation electric signal, and the increasing frequency is determined by the movement speed of the memory seat motor model; when the motor output of the memory seat is reversed, the counter value is reduced according to the corresponding current rotating electric signal, and the reduction frequency is also determined by the movement speed of the motor model. When the output motor stops rotating, the counter value is kept unchanged. The counter change is consistent with the hall sensor pulse.
Step S30: and when the memory seat motor does not output a rotation electric signal within a first preset time, stopping pulse counting and acquiring a current pulse counting value.
It is easily understood that the first preset time may be set to a shorter time, such as 3s, 5 s; the memory seat motor does not output a rotation electric signal within a first preset time, which indicates that the memory seat is adjusted in position, the micro control unit MCU stops outputting control signals to the memory seat motor, the memory seat motor does not output the rotation electric signal any more, and the Hall sensor stops pulse counting and records a current pulse counting value if a subsequent rotation electric signal is not received.
Step S40: and when the current pulse count value is different from a preset pulse count value, judging that the memory seat has a fault.
It is easy to understand that, the preset pulse count value is a value preset according to the test task of the memory seat, and the value is stored in the microcontroller MCU through seat position adjustment simulation, or the preset pulse count value is directly recorded in the microcontroller MCU, so that the microcontroller MCU executes the automatic position adjustment function of the memory seat according to the preset pulse count value, and if the finally obtained current pulse count value is different from the preset pulse count value, the memory seat has a fault.
It should be understood that, in this embodiment, an external input environment of the microcontroller MCU is constructed, and a hall sensor model and a memory seat motor model are constructed, in this embodiment, the memory seat motor and the hall sensor performing pulse counting are generated by model simulation, a simulation model device confirms that the memory seat motor and the hall sensor perform pulse counting are normal working devices, and if a current pulse count value is different from a preset pulse count value, the microcontroller MCU has a fault.
Through constructing the simulation model in this embodiment, carry out the pulse count through the rotation signal of telecommunication to the motor, realized having avoided the inaccuracy of real vehicle test to memory seat microcontroller MCU, the troubleshooting of being convenient for reduces testing cost, provides convenience for technical staff develops.
Referring to fig. 3, fig. 3 is a schematic flow chart of a memory seat testing method according to a second embodiment of the invention. Based on the first embodiment, before step S10, the method for testing a memory seat of the present embodiment further includes:
step S101: and acquiring preset memory seat position information according to the preset test task.
It should be noted that the preset test task is a test task for performing automatic position adjustment on the memory seat according to a memory function, for example: the preset test task is to test whether the memory seat can store a plurality of preset positions or not, and to automatically adjust the positions according to the preset positions. And confirming a plurality of preset memory seat position information according to the prediction test task, wherein the position information comprises positions and pulse count values corresponding to the positions.
Step S102: and adjusting the memory seat from a preset initial position to a preset memory position according to the preset memory seat position information so that the memory seat stores the preset memory position.
It is easy to understand that, based on the first embodiment, the adjustment may be based on a simulation environment, and the microcontroller MCU passively performs position adjustment according to the preset memory seat position information, so that the microcontroller MCU stores the corresponding preset memory position. And automatically initializing by the microcontroller MCU to obtain the preset initial position, wherein the preset initial position is the initial position of the memory seat in the adjustment process, recovering the initial position from the current position before each adjustment, and then adjusting. At the initial position, the pulse count value is 0.
Step S103: and acquiring a current rotating electric signal of a memory seat motor in the adjustment process, counting pulses according to the current rotating electric signal, and taking a counting result as a preset pulse counting value.
It should be noted that, based on the simulation environment, in the adjustment process, the microcontroller sends a control signal to the simulated seat motor, the seat motor outputs a rotation electric signal, the hall sensor performs pulse counting according to the rotation electric signal and outputs a counting value to the microcontroller MCU to form a closed-loop system, and the microcontroller MCU records the preset pulse counting value, so that the microcontroller MCU can perform automatic position adjustment control according to the preset pulse counting value.
Step S104: and sending a position restoration instruction to the memory seat so that the memory seat is adjusted to the preset initial position according to the position restoration instruction.
In the concrete implementation, after adjusting the position of the memory seat every time to make the microcontroller MCU of the memory seat memorize the position, a position recovery command is given to make the memory seat return to the initial position so as to set the memory position for the next time, or so as to carry out the test of automatic position adjustment.
Through constructing the simulation model in this embodiment, carry out the pulse count through the rotation signal of telecommunication to the motor, realized having avoided the inaccuracy of real vehicle test to memory seat microcontroller MCU, the troubleshooting of being convenient for reduces testing cost, provides convenience for technical staff develops.
Referring to fig. 4, fig. 4 is a schematic flow chart illustrating a memory seat testing method according to a third embodiment of the present invention. Based on the first embodiment, before the step S10, the method for testing a memory seat of the present embodiment further includes:
step S105: and generating a position adjusting instruction according to a preset test task.
It is easy to understand that the preset test task is a test task for performing automatic position adjustment on the memory seat according to a memory function, such as: the preset test task is to test whether the memory seat can store a plurality of preset positions or not, and to automatically adjust the positions according to the preset positions. Selecting a target preset position from a plurality of preset positions, and issuing a position adjusting instruction corresponding to the target preset position so as to adjust the memory seat to the target preset position.
Step S106: and sending the position adjusting instruction to the memory seat so that a controller of the memory seat obtains a corresponding preset memory position according to the position adjusting instruction and executes an automatic position adjusting function according to the preset memory position.
It is easy to understand that, after the memory seat receives the position adjusting instruction, the microcontroller MCU acquires a pre-stored preset position according to the position adjusting instruction, and generates a control signal according to the preset position to control the memory seat motor to adjust the seat position.
Further, after the step S30, the method for determining an actual failure of a memory seat further includes:
step S301: and when the current pulse count value is the same as a preset pulse count value, judging whether the current position of the memory seat is the same as a preset memory position.
It is easy to understand that, in a simulation environment, the seat motor is a simulation device, so that the seat motor does not malfunction, the number of pulses is counted, when the seat motor outputs a forward rotation electric signal, the seat motor performs a positive count, when the seat motor outputs a reverse rotation electric signal, the seat motor performs a negative count, and when the number of pulses counted (the number of times of sending the rotation electric signal) is the same, there may also be a difference in the position corresponding to the pulse count value, so as to further determine whether the current position is the same as the preset memory position.
Step S302: and when the current position of the memory seat is different from the preset memory position, judging that the memory seat has an initial position recording fault.
In specific implementation, for example, when the position is adjusted, the number of actually-sent rotation electrical signals is the same as the preset number, but the finally-obtained position is different from the memory position, the number of pulses corresponding to the initial position is 0, the number of pulses corresponding to the preset memory position is 6, the number of actually-sent rotation electrical signals is 5, but the number of actually-sent rotation electrical signals is normal, the initial position of the microcontroller MCU records a fault or the memory seat does not return to the initial seat after the last position adjustment, and the microcontroller MCU initializes the fault.
In this embodiment, through constructing simulation model, carry out the pulse count through the rotation signal of telecommunication to the motor, realized having avoided the inaccuracy of real car test to memory seat microcontroller MCU, the troubleshooting of being convenient for reduces test cost, provides convenience for technical staff develops and develops.
Referring to fig. 5, fig. 5 is a schematic flow chart illustrating a memory seat testing method according to a fourth embodiment of the invention. Based on the first embodiment, the method for testing a memory seat of the present embodiment further includes, after the step S40:
in this embodiment, the test environment is taken as an example of an actual vehicle environment.
Step S50: whether an obstacle exists in a preset range of the memory seat slideway is detected.
It should be understood that there are more variable factors in the real vehicle environment, and the final adjusted position may be different from the preset memory position when the devices inside the memory seat work normally, so that when the method in the above embodiment is applied in the real vehicle environment, the external factors of the memory seat in the real vehicle environment need to be considered. Such as: obstacles exist in the slide way, the slide way has large fouling resistance, the front and the back of the seat are blocked by the obstacles, the position can not be adjusted, and the like,
step S60: and when the obstacle exists in the preset range of the memory seat slideway, judging that the memory seat fault is an external fault.
It is easy to understand that, in the real vehicle test, if the current pulse number is the same as the preset pulse count value, but the actual position is different from the memory position, if an obstacle exists in the preset range of the slide way, the obstacle may obstruct the movement of the memory seat to cause a fault, and the memory seat itself is not a fault as an external fault.
In the embodiment, the testing method for both the simulation environment and the real vehicle environment is realized by testing the MCU of the memory seat, the accuracy is high, and convenience is provided for technical personnel to research, develop and analyze products.
Referring to fig. 6, fig. 6 is a block diagram illustrating a first embodiment of a testing device for a memory seat of the present invention.
As shown in fig. 6, the apparatus according to the embodiment of the present invention includes:
and the motor detection module 10 is used for acquiring a current rotation electric signal of a memory seat motor when the memory seat executes an automatic position adjustment function.
It should be noted that, the execution main body of this embodiment is a memory seat testing device, the object to be tested in this embodiment is a microcontroller MCU of a memory seat, before the test, an external input environment of the microcontroller MCU is constructed, and a hall sensor model and a memory seat motor model are constructed, that is, in this embodiment, the memory seat motor and the hall sensor performing pulse counting are generated by model simulation, and the simulation hardware is supported by an I/O board. Triggering the memory seat microcontroller MCU to execute an automatic position adjustment function, then the microcontroller MCU sends a control signal to the emulated memory seat motor, triggering the memory seat motor to send a current rotation electric signal to the emulated Hall sensor, and when the Hall sensor receives the current rotation electric signal of the memory seat motor, starting to send a pulse number to the memory seat microcontroller MCU, thereby forming a set of closed-loop system.
And the sensing counting module 20 is used for counting pulses according to the current rotating electric signal.
It should be noted that, in the real vehicle, the memory seat is mutually matched with the memory seat motor through the hall sensor, the memory seat motor rotates for one circle and sends a rotation electric signal to the hall sensor, and the hall sensor can generate and send a corresponding pulse number to the microcontroller MCU according to the rotation electric signal, so that under the condition that each device in the memory seat works normally, a linear relationship exists between the stroke of the memory seat motor and the pulse number of the hall sensor.
Further, for accurate pulse counting, the sensing and counting module 20 is further configured to obtain a motion frequency of the memory seat motor according to the current rotation electrical signal; and generating a pulse electric signal according to the motion frequency, and counting pulses according to the pulse number of the pulse electric signal.
It should be noted that the hall sensor model provides a hall sensor counter value. When the memory seat motor outputs positive rotation, the counter value is increased according to the corresponding current rotation electric signal, and the increasing frequency is determined by the movement speed of the memory seat motor model; when the output of the motor of the memory seat is reversed, the value of the counter is reduced according to the corresponding current rotating electric signal, and the reduction frequency is also determined by the movement speed of the motor model. When the output motor stops rotating, the counter value is kept unchanged. The counter change is consistent with the hall sensor pulse.
And the counting and counting module 30 is used for stopping pulse counting when the memory seat motor does not output a rotating electric signal within a first preset time, and acquiring a current pulse counting value.
It is easily understood that the first preset time may be set to a shorter time, such as 3s, 5 s; when the memory seat motor does not output a rotation electric signal within a first preset time, which indicates that the memory seat is adjusted in position, the micro control unit MCU stops outputting control signals to the memory seat motor, the memory seat motor does not output the rotation electric signal any more, and the Hall sensor stops pulse counting and records the current pulse counting value if the subsequent rotation electric signal is not received.
And the fault detection module 40 is used for judging that the memory seat has a fault when the current pulse count value is different from a preset pulse count value.
It is easy to understand that, the preset pulse count value is a value preset according to the test task of the memory seat, and the value is stored in the microcontroller MCU through seat position adjustment simulation, or the preset pulse count value is directly recorded in the microcontroller MCU, so that the microcontroller MCU executes the automatic position adjustment function of the memory seat according to the preset pulse count value, and if the finally obtained current pulse count value is different from the preset pulse count value, the memory seat has a fault.
It should be understood that, in this embodiment, an external input environment of the microcontroller MCU is constructed, and a hall sensor model and a memory seat motor model are constructed, in this embodiment, the memory seat motor and the hall sensor performing pulse counting are generated by model simulation, a simulation model device confirms that the memory seat motor and the hall sensor perform pulse counting are normal working devices, and if the current pulse count value is different from the preset pulse count value, the microcontroller MCU has a fault.
Through constructing the simulation model in this embodiment, carry out the pulse count through the rotation signal of telecommunication to the motor, realized having avoided the inaccuracy of real car test to memory seat microcontroller MCU, the troubleshooting of being convenient for reduces testing cost, provides convenience for technical staff develops and develops.
In addition, an embodiment of the present invention further provides a storage medium, where a memory seat test program is stored on the storage medium, and the memory seat test program is executed by a processor to perform the steps of the memory seat test method described above.
Since the storage medium adopts all technical solutions of all the above embodiments, at least all the beneficial effects brought by the technical solutions of the above embodiments are achieved, and details are not repeated herein.
It should be understood that the above is only an example, and the technical solution of the present invention is not limited in any way, and in a specific application, a person skilled in the art may set the technical solution as needed, and the present invention is not limited thereto.
It should be noted that the above-described work flows are only exemplary, and do not limit the scope of the present invention, and in practical applications, a person skilled in the art may select some or all of them to achieve the purpose of the solution of the embodiment according to actual needs, and the present invention is not limited herein.
In addition, the technical details that are not elaborated in the present embodiment can be referred to the memory seat testing method provided in any embodiment of the present invention, and are not described herein again.
Furthermore, it should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or system in which the element is included.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the description of the foregoing embodiments, it is clear to those skilled in the art that the method of the foregoing embodiments may be implemented by software plus a necessary general hardware platform, and certainly may also be implemented by hardware, but in many cases, the former is a better implementation. Based on such understanding, the technical solution of the present invention or a part contributing to the prior art may be embodied in the form of a software product, where the computer software product is stored in a storage medium (e.g. Read Only Memory (ROM)/RAM, magnetic disk, optical disk), and includes several instructions for enabling a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to execute the method according to the embodiments of the present invention.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (7)
1. A memory seat testing method, the method comprising:
when the memory seat executes the automatic position adjusting function, acquiring a current rotating electric signal of a memory seat motor;
counting pulses according to the current rotation electric signal;
stopping pulse counting when the memory seat motor does not output a rotating electric signal within a first preset time, and acquiring a current pulse count value;
when the current pulse count value is different from a preset pulse count value, judging that the memory seat has a fault;
wherein, when the memory seat executes the automatic position adjustment function, before the step of obtaining the current rotation electric signal of the memory seat motor, the method further comprises the following steps:
constructing an external input environment of the microcontroller MCU, and constructing a Hall sensor model and a memory seat motor model;
simulating the Hall sensor model and the memory seat motor model through an I/O board card to obtain a Hall sensor and a memory seat motor;
wherein, when memory seat carries out automatic position control function, obtain the step of the present rotation signal of telecommunication of memory seat motor specifically includes:
when the memory seat performs the automatic position adjusting function, the microcontroller MCU sends a control signal to the memory seat motor so that the memory seat motor sends a current rotation electric signal to the Hall sensor;
the step of counting pulses according to the current rotation electrical signal specifically includes:
acquiring the motion frequency of the memory seat motor according to the current rotation electric signal;
and generating a pulse electric signal according to the motion frequency, and counting pulses according to the pulse number of the pulse electric signal.
2. The method for testing a memory seat according to claim 1, wherein the step of obtaining the current rotation electric signal of the motor of the memory seat when the memory seat performs the automatic position adjustment function further comprises:
acquiring preset memory seat position information according to a preset test task;
adjusting the memory seat from a preset initial position to a preset memory position according to the preset memory seat position information so that the memory seat stores the preset memory position;
and acquiring a current rotating electric signal of a memory seat motor in the adjustment process, counting pulses according to the current rotating electric signal, and taking a counting result as a preset pulse counting value.
3. The method for testing a memory seat according to claim 2, wherein the step of acquiring the current rotation electric signal of the seat motor during the adjustment, counting pulses according to the current rotation electric signal, and using the counting result as the preset pulse count value further comprises:
and sending a position restoration instruction to the memory seat so that the memory seat is adjusted to the preset initial position according to the position restoration instruction.
4. The memory seat test method of claim 3, wherein the step of obtaining the current rotation electric signal of the memory seat motor when the memory seat performs the automatic position adjustment function further comprises, before the step of obtaining the current rotation electric signal of the memory seat motor:
generating a position adjusting instruction according to a preset test task;
and sending the position adjusting instruction to the memory seat so that a microcontroller MCU of the memory seat obtains a corresponding preset memory position according to the position adjusting instruction and executes an automatic position adjusting function according to the preset memory position.
5. The memory seat test method of claim 4, wherein after the steps of stopping pulse counting and obtaining a current pulse count value when the memory seat motor does not output a rotation electric signal within a first preset time, further comprising:
when the current pulse count value is the same as a preset pulse count value, judging whether the current position of the memory seat is the same as a preset memory position;
and when the current position of the memory seat is different from the preset memory position, judging that the memory seat has an initial position recording fault.
6. An electronic device, characterized in that the electronic device comprises: a memory, a processor, and a memory seat test program stored on the memory and executable on the processor, the memory seat test program configured to implement the steps of the memory seat test method of any of claims 1-5.
7. A storage medium having stored thereon a memory seat test program which, when executed by a processor, implements the steps of the memory seat test method of any of claims 1 to 5.
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