CN112465919B - Infrared thermal imaging camera calibration device - Google Patents

Infrared thermal imaging camera calibration device Download PDF

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Publication number
CN112465919B
CN112465919B CN202011413825.8A CN202011413825A CN112465919B CN 112465919 B CN112465919 B CN 112465919B CN 202011413825 A CN202011413825 A CN 202011413825A CN 112465919 B CN112465919 B CN 112465919B
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China
Prior art keywords
heat
heat conduction
substrate
water tank
thermal imaging
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CN202011413825.8A
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CN112465919A (en
Inventor
刘�东
林远长
何国田
刘宗辉
尚明生
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Chongqing University
Chongqing Institute of Green and Intelligent Technology of CAS
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Chongqing University
Chongqing Institute of Green and Intelligent Technology of CAS
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/80Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10048Infrared image

Abstract

The invention provides an infrared thermal imaging camera calibration device which is used for solving the problem of infrared thermal imaging calibration in the prior art. Comprising the following steps: the substrate is provided with a plurality of through holes in a lattice mode; the heat source system is provided with a plurality of heat conduction bulges in a lattice mode, the heat conduction bulges are matched with the through holes, the heat conduction bulges are embedded into the through holes, the upper surfaces of the heat conduction bulges embedded into the through holes are flush with the upper surface of the substrate, and a flat surface is formed on the surface of the substrate; and a thermal insulation structure for blocking or reducing heat transfer between the heat source system and the substrate, and the heat conductive protrusions pass through the thermal insulation structure. The method realizes a plurality of hot spots of the spot array and can adapt to the calibration of the thermal imaging camera.

Description

Infrared thermal imaging camera calibration device
Technical Field
The invention relates to the field of camera calibration equipment, in particular to an infrared thermal imaging camera calibration device.
Background
The machine vision technology is widely applied to various fields of medicine, industry, agriculture, aerospace, remote sensing and the like by virtue of the advantages of non-contact, high speed, high precision and the like. When the machine vision technology is adopted for measurement, image stitching and three-dimensional reconstruction, one of the key steps is the calibration of a camera. The structural parameters of the camera are directly related to the accuracy of image acquisition and detection, and these parameters can be divided into internal parameters and external parameters. The internal parameters comprise a camera lens distortion center, a lens distortion coefficient, an effective focal length of a camera and an equivalent proportional coefficient of horizontal and vertical pixel conversion of an image plane; the external parameters include a transformation matrix and a translation matrix between the camera coordinate system and the world coordinate system.
The infrared thermal imaging camera (thermal infrared imager) is basically the same as the imaging principle of a common camera. After an infrared thermal imaging camera is adopted to collect thermal images of objects, internal parameters, external parameters and distortion parameters of the camera are required to be obtained. However, since the infrared thermal imaging camera can only shoot a thermal distribution diagram and cannot shoot a traditional machine vision calibration plate lattice diagram, the traditional machine vision calibration plate cannot be used for calibrating an infrared thermal imaging system.
Disclosure of Invention
In view of the above-mentioned drawbacks of the prior art, an object of the present invention is to provide an infrared thermal imaging camera calibration device for solving the problem of infrared thermal imaging calibration in the prior art.
To achieve the above and other related objects, the present invention provides an infrared thermal imaging camera calibration apparatus, comprising:
the substrate is provided with a plurality of through holes in a lattice mode;
the heat source system is provided with a plurality of heat conduction bulges in a lattice mode, the heat conduction bulges are matched with the through holes, the heat conduction bulges are embedded into the through holes, the upper surfaces of the heat conduction bulges embedded into the through holes are flush with the upper surface of the substrate, and a flat surface is formed on the surface of the substrate;
and a thermal insulation structure for blocking or reducing heat transfer between the heat source system and the substrate, and the heat conductive protrusions pass through the thermal insulation structure.
Optionally, the through hole is a circular hole, and the heat conduction protrusion is a cylinder.
Optionally, the heat source system includes the water tank, be equipped with the inlet on the water tank, be equipped with the sealing plug on the inlet, the heat conduction arch is established on the water tank.
Optionally, the heat source system includes water tank and heat source, be equipped with inlet and liquid outlet on the water tank, the heat source through the pipeline with inlet and liquid outlet intercommunication form the circulation channel, the heat conduction arch is established on the water tank.
Optionally, the heat conducting protrusions are n×m dot matrixes, wherein N is greater than or equal to 3, M is greater than or equal to 3, the radius of each heat conducting protrusion is R, and the height of each heat conducting protrusion is H 0 Between the heat-conducting protrusionsThe distance is S, the length, width and height of the box body are L, W, H respectively, wherein S is more than or equal to 4R, L is more than H, and W is more than H.
Optionally, the heat conducting protrusion is in contact with the liquid in the water tank.
Optionally, a sanding layer is arranged on the surface of the substrate.
Optionally, the color brightness of the surface of the substrate is I 1 The color brightness of the surface of the heat conduction bulge is I 2 The following should be satisfied:
wherein:
optionally, the heat insulation structure is a heat insulation coating, a heat insulation board or a heat insulation sandwich structure.
Optionally, the heat insulation structure is disposed on the substrate, or the heat insulation structure is disposed on the water tank, or the heat insulation structure is located in an interlayer between the substrate and the water tank.
As described above, the infrared thermal imaging camera calibration device provided by the invention has at least the following beneficial effects:
through the through-hole is offered to the base plate for the heat conduction protruding can pass, and the heat exchange takes place for the heat conduction protruding can effectually with the heat source system, and it is thermal-insulated with heat source and base plate through thermal-insulated structure simultaneously, makes only carry out the heat gathering in the through-hole position, thereby realizes a plurality of hot spots of point array, thereby can adapt to the demarcation of thermal imaging camera.
Drawings
Fig. 1 is a schematic perspective view of an infrared thermal imaging camera calibration apparatus according to the present invention.
Fig. 2 shows a schematic view of the insulation structure of the present invention.
Fig. 3 is a schematic view of a substrate according to the present invention.
Detailed Description
Further advantages and effects of the present invention will become apparent to those skilled in the art from the disclosure of the present invention, which is described by the following specific examples.
Please refer to fig. 1 to 3. It should be understood that the structures, proportions, sizes, etc. shown in the drawings are for illustration purposes only and are not intended to limit the scope of the present invention, which is defined by the claims, unless otherwise indicated, and that any structural modifications, proportional changes, or adjustments of size, which would otherwise be used in the practice of the present invention, would be apparent to those skilled in the art without departing from the spirit and scope of the present invention. Also, the terms such as "upper," "lower," "left," "right," "middle," and "a" and the like recited in the present specification are merely for descriptive purposes and are not intended to limit the scope of the invention, but are intended to provide relative positional changes or modifications without materially altering the technical context in which the invention may be practiced.
The following examples are given by way of illustration only. Various embodiments may be combined and are not limited to only what is presented in the following single embodiment.
Referring to fig. 1 to 3, an embodiment of an infrared thermal imaging camera calibration apparatus according to the present invention includes: a substrate 1, a heat source system and a heat insulation structure 2, wherein a plurality of through holes 11 are arranged on the substrate 1 in a lattice mode; the heat source system is provided with a plurality of heat conduction bulges 3 in a lattice mode, the heat conduction bulges 3 are matched with the through holes 11, the heat conduction bulges 3 are embedded into the through holes 11, the upper surfaces of the heat conduction bulges 3 embedded into the through holes 11 are flush with the upper surface of the substrate 1, and a flat surface is formed on the surface of the substrate 1; the heat insulating structure 2 is used to block or reduce heat transfer between the heat source system and the substrate 1, and the heat conducting protrusions 3 pass through the heat insulating structure 2. Through the through-hole 11 is offered through the base plate 1 for heat conduction protruding 3 can pass, and heat exchange takes place for heat conduction protruding 3 can effectually with the heat source system, and it is thermal-insulated with base plate 1 to insulate against heat the heat source through thermal-insulated structure 2 simultaneously, makes only carry out the heat gathering in through-hole 11 positions, thereby realizes a plurality of hot spots of spot array, thereby can adapt to the demarcation of thermal imaging camera.
In this embodiment, referring to fig. 1 to 3, optionally, the through hole 11 is a circular hole, and the heat conducting protrusion 3 is a cylinder. The round structure enables the edge of the hot spot to be better captured, and specifically, the center position can be determined so as to determine the edge of the hot spot. In the case of other non-circular structures, the edge boundaries are poorly defined.
In this embodiment, referring to fig. 1 to 3, the heat source system includes a water tank 4, a liquid inlet 41 is provided on the water tank 4, a sealing plug 410 is provided on the liquid inlet 41, and the heat conducting protrusion 3 is provided on the water tank 4. That is, in use, the heated liquid is filled into the water tank 4, and then the liquid inlet 41 is closed by the sealing plug 410.
In this embodiment, the heat source system includes a water tank 4 and a heat source, a liquid inlet 41 and a liquid outlet are disposed on the water tank 4, the heat source is communicated with the liquid inlet 41 and the liquid outlet through a pipeline to form a circulation channel, and the heat conduction protrusion 3 is disposed on the water tank 4. I.e. the temperature in the water tank 4 is kept constant by the circulation of the liquid and can be adjusted as desired.
In this embodiment, referring to fig. 1 to 3, the heat conducting protrusions 3 are n×m dot matrixes, where N is greater than or equal to 3, M is greater than or equal to 3, the radius of each heat conducting protrusion 3 is R, and the height of each heat conducting protrusion 3 is H 0 The distance between the heat conduction bulges 3 is S, and the length, the width and the height of the box body are L, W, H respectively, wherein S is more than or equal to 4R, L is more than or equal to H, and W is more than or equal to H. By defining S and R, the problem of blurring the boundary of the hot spot caused by too close proximity between the heat conducting protrusions 3 is avoided.
In this embodiment, the heat conduction protrusion 3 is in contact with the liquid in the water tank 4. The heat conduction protrusion 3 is in contact with the water tank 4 so that the heat conduction effect is better.
In this embodiment, the heat insulation structure 2 is a heat insulation coating, a heat insulation board or a heat insulation sandwich structure.
In this embodiment, the heat insulation structure 2 is disposed on the base plate 1, or the heat insulation structure 2 is disposed on the water tank 4, or the heat insulation structure 2 is located in an interlayer between the base plate 1 and the water tank 4. Referring to fig. 2, the heat insulation structure 2 is a plate structure, and has a through hole 11 corresponding to the base plate 1, which is located between the base plate 1 and the interlayer of the water tank 4.
In this embodiment, a polishing layer is disposed on the surface of the substrate 1. The sanding layer can reduce reflection of light as much as possible when being used for the calibration of a visible light camera, so that the camera has a better calibration effect.
In the present embodiment, the surface color brightness of the substrate 1 is I 1 The color brightness of the surface of the heat conduction bulge 3 is I 2 The following should be satisfied:
wherein:
for example: when the heat conduction protrusion 3 is black, the color of the substrate 1 should be white, and when the heat conduction protrusion 3 is white, the color of the substrate 1 is black. The chromatic aberration can meet the calibration of the visible light camera, so that the method has higher recognition degree.
In summary, the through holes 11 are formed in the substrate 1, so that the heat conducting protrusions 3 can pass through the through holes, the heat conducting protrusions 3 can effectively exchange heat with a heat source system, and meanwhile, the heat source and the substrate 1 are insulated through the heat insulation structure 2, so that heat is only collected at the positions of the through holes 11, a plurality of hot spots of the spot array are realized, and the calibration of the thermal imaging camera can be adapted.
The above embodiments are merely illustrative of the principles of the present invention and its effectiveness, and are not intended to limit the invention. Modifications and variations may be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of the invention. Accordingly, it is intended that all equivalent modifications and variations of the invention be covered by the claims, which are within the ordinary skill of the art, be within the spirit and scope of the present disclosure.

Claims (6)

1. An infrared thermal imaging camera calibration apparatus, comprising:
the substrate is provided with a plurality of through holes in a lattice mode;
the heat source system is provided with a plurality of heat conduction bulges in a lattice mode, the heat conduction bulges are matched with the through holes, the heat conduction bulges are embedded into the through holes, the upper surfaces of the heat conduction bulges embedded into the through holes are flush with the upper surface of the substrate, and a flat surface is formed on the surface of the substrate;
a thermal insulation structure for blocking or reducing heat transfer between the heat source system and the substrate, and through which the thermally conductive protrusions pass;
the heat conducting bulges are N multiplied by M dot matrixes, wherein N is more than or equal to 3, M is more than or equal to 3, the radius of each heat conducting bulge is R, and the height of each heat conducting bulge is H 0 The distance between the heat conduction bulges is S, and the length, the width and the height of the box body are L, W, H respectively, wherein S is more than or equal to 4R, L is more than H, and W is more than H;
the heat source system comprises a water tank, and the heat conduction protrusion is in contact with liquid in the water tank; the surface of the substrate is provided with a sand grinding layer;
the color brightness of the surface of the substrate is I 1 The color brightness of the surface of the heat conduction bulge is I 2 The following should be satisfied:
wherein:
2. an infrared thermal imaging camera calibration apparatus according to claim 1, wherein: the through holes are round holes, and the heat conduction protrusions are cylinders.
3. An infrared thermal imaging camera calibration apparatus according to claim 1, wherein: the water tank is provided with a liquid inlet, the liquid inlet is provided with a sealing plug, and the heat conduction protrusion is arranged on the water tank.
4. An infrared thermal imaging camera calibration apparatus according to claim 1, wherein: the heat source system comprises a heat source, a liquid inlet and a liquid outlet are formed in the water tank, the heat source is communicated with the liquid inlet and the liquid outlet through pipelines to form a circulating channel, and the heat conduction protrusions are arranged on the water tank.
5. An infrared thermal imaging camera calibration apparatus according to claim 1, wherein: the heat insulation structure is a heat insulation coating, a heat insulation board or a heat insulation sandwich structure.
6. An infrared thermal imaging camera calibration apparatus according to claim 3 or 4, wherein: the heat insulation structure is arranged on the base plate, or the heat insulation structure is arranged on the water tank, or the heat insulation structure is positioned in an interlayer of the base plate and the water tank.
CN202011413825.8A 2020-12-04 2020-12-04 Infrared thermal imaging camera calibration device Active CN112465919B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104374547A (en) * 2014-11-17 2015-02-25 国家电网公司 Method and device for jointly calibrating parameters of visible light camera and thermal infrared imager camera
CN104375375A (en) * 2014-11-17 2015-02-25 国家电网公司 Method and device for calibrating visible light camera and thermal infrared imager camera through checkerboard
CN204287725U (en) * 2014-11-17 2015-04-22 国家电网公司 Gridiron pattern is adopted to demarcate the device of visible ray and thermal infrared imager camera
CN111279258A (en) * 2018-10-31 2020-06-12 深圳市大疆创新科技有限公司 Double-light camera, holder system and mobile platform

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11192665B2 (en) * 2019-03-04 2021-12-07 The Boeing Company Thermographic inspection of lanes of tape laid-up by tape layup machines, based on acquired thermographic images

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104374547A (en) * 2014-11-17 2015-02-25 国家电网公司 Method and device for jointly calibrating parameters of visible light camera and thermal infrared imager camera
CN104375375A (en) * 2014-11-17 2015-02-25 国家电网公司 Method and device for calibrating visible light camera and thermal infrared imager camera through checkerboard
CN204287725U (en) * 2014-11-17 2015-04-22 国家电网公司 Gridiron pattern is adopted to demarcate the device of visible ray and thermal infrared imager camera
CN111279258A (en) * 2018-10-31 2020-06-12 深圳市大疆创新科技有限公司 Double-light camera, holder system and mobile platform

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