CN112463481B - Method and system for testing BMC fault diagnosis function based on remote XDP function - Google Patents

Method and system for testing BMC fault diagnosis function based on remote XDP function Download PDF

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CN112463481B
CN112463481B CN202011319146.4A CN202011319146A CN112463481B CN 112463481 B CN112463481 B CN 112463481B CN 202011319146 A CN202011319146 A CN 202011319146A CN 112463481 B CN112463481 B CN 112463481B
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bmc
remote
ierr
errors
function
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CN112463481A (en
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闫利红
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Suzhou Inspur Intelligent Technology Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2294Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by remote test

Abstract

The invention provides a method and a system for testing a BMC fault diagnosis function based on a remote XDP function, which can both: injecting the same IERR error into the device of the same preset testing machine by adopting a plurality of remote terminals at the same time, and checking whether the BMC can analyze corresponding fault analysis information; injecting different IERR errors into the device of the same preset testing machine by adopting a plurality of remote terminals at the same time, and checking whether the BMC can analyze corresponding fault analysis information; adopting a plurality of remote terminals to simultaneously inject IERR errors into the devices of at least two preset testing machines, and checking whether the BMC can analyze correct fault analysis information; a plurality of remote terminals are adopted to simultaneously inject IERR errors and non-IERR errors into the device of the same preset testing machine, whether the BMC can correctly distinguish the injected IERR errors from the non-IERR errors is checked, and correct fault analysis is made. The invention is used for improving the reliability of the test result.

Description

Method and system for testing BMC fault diagnosis function based on remote XDP function
Technical Field
The invention relates to the field of server testing, in particular to a method and a system for testing a BMC fault diagnosis function based on a remote XDP function.
Background
An XDP (extended Debug Port) interface exists in a server motherboard, which is a JTAG (Joint Test Action Group) type interface, and the interface is an international standard Test protocol (IEEE 1149.1 compatible) and is mainly used for chip internal Test. Most advanced devices support the JTAG protocol, such as DSP (Digital Signal Processing), FPGA (Field Programmable Gate Array) devices, and the like.
Currently, a BMC (Baseboard management Controller) has a remote XDP function, and after the BMC starts a remote debug Server service, a software tool can be remotely used to connect the XDP, so that the functions of remote log capture, information acquisition, error injection and the like are realized.
The BMC has a fault diagnosis function, and when an equipment fault triggers IERR (Internal Error), the BMC needs to analyze relevant fault information so as to analyze later faults. At present, more and more enterprises put forward the requirement on the function, but at present, a mainboard generally has only one XDP interface, and is connected with a testing machine and a control machine by means of an XDP jig, so that the misinjection scene is single, and the reliability of the test result of the BMC IERR fault analysis function test is influenced to a certain extent.
Therefore, the invention provides a method and a system for testing the fault diagnosis function of BMC based on remote XDP function, which are used for solving the problems.
Disclosure of Invention
In view of the above defects in the prior art, the present invention provides a method and a system for testing a BMC fault diagnosis function based on a remote XDP function, which are used to test a BMC IERR fault analysis function and improve the reliability of a test result.
In a first aspect, the invention provides a method for testing a fault diagnosis function of a BMC based on a remote XDP function, the method is based on a group of remote terminals and a tester, each remote terminal opens a remote extended debugging port of the BMC, and each remote terminal is connected with a remote extended debugging port (remote XDP) of the tester; the method comprises the following steps:
injecting the same IERR error into the device of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information;
injecting different IERR errors into the devices of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information;
adopting each remote terminal to simultaneously inject IERR errors into the devices of at least two preset testing machines, and checking whether the BMC can analyze correct fault analysis information;
and simultaneously injecting IERR errors and non-IERR errors into the devices of the same preset testing machine by adopting each remote terminal, checking whether the BMC can correctly distinguish the injected IERR errors and non-IERR errors, and performing correct fault analysis.
Further, the method further comprises the steps of remote terminal management: for managing each remote terminal.
Further, the device of the tester comprises a CPU, a memory and a PCIE.
In a second aspect, the invention provides a system for testing a fault diagnosis function of a BMC based on a remote XDP function, which is based on a group of remote terminals and a testing machine, wherein each remote terminal opens a remote extended debugging port of the BMC and is connected with the remote extended debugging port of the testing machine;
the system comprises:
the first fault diagnosis module is used for adopting each remote terminal to simultaneously inject the same IERR errors into the device of the same preset testing machine and checking whether the BMC can analyze corresponding fault analysis information;
the second fault diagnosis module is used for adopting each remote terminal to simultaneously inject different IERR errors into the device of the same preset testing machine and checking whether the BMC can analyze corresponding fault analysis information;
the third fault diagnosis module is used for adopting each remote terminal to simultaneously inject the same IERR errors into the devices of at least two preset testing machines and checking whether the BMC can analyze correct fault analysis information;
and the fourth fault diagnosis module is used for adopting each remote terminal to simultaneously inject IERR errors and non-IERR errors into the device of the same preset testing machine, checking whether the BMC can correctly distinguish the injected IERR errors from the non-IERR errors and making correct fault analysis.
Further, the system further comprises: and the management terminal is used for managing each remote terminal.
Further, the system further comprises: and the first modification module is used for modifying the preset testing machine component related in the first fault diagnosis module.
Further, the system further comprises: and the second modification module is used for modifying the preset devices of the testing machine related in the second fault diagnosis module.
Further, the system further comprises: and the third modification module is used for modifying the devices of the preset testing machines related in the third fault diagnosis module.
Further, the system further comprises: and the fourth modification module is used for modifying the preset testing machine device related in the fourth fault diagnosis module.
Further, the devices of the tester include a CPU, a memory, and PCIE.
The beneficial effect of the invention is that,
the method and the system for testing the fault diagnosis function of the BMC based on the remote XDP function can adopt a plurality of remote terminals to simultaneously inject the same IERR error into the device of the same preset testing machine, adopt a plurality of remote terminals to simultaneously inject different IERR errors into the device of the same preset testing machine, adopt a plurality of remote terminals to simultaneously inject IERR errors into the devices of at least two preset testing machines and adopt a plurality of remote terminals to simultaneously inject IERR errors and non-IERR errors into the device of the same preset testing machine.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
Drawings
In order to more clearly illustrate the embodiments or prior art solutions of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention.
FIG. 2 is a schematic block diagram of a system of one embodiment of the present invention.
Fig. 3 is a schematic block diagram of a system of another embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, shall fall within the protection scope of the present invention.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention.
In this embodiment, the method is based on a group of remote terminals and a tester, each remote terminal opens a remote extended debug port of the BMC, and each remote terminal is connected to a remote extended debug port (remote XDP) of the tester.
As shown in fig. 1, the method 100 includes:
step 110, injecting the same IERR errors into the devices of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information;
step 120, injecting different IERR errors into the devices of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information;
step 130, adopting each remote terminal to simultaneously inject an IERR error into the devices of at least two preset testing machines, and checking whether the BMC can analyze correct fault analysis information;
step 140, each remote terminal is used to simultaneously inject an IERR error and a non-IERR error into a device of the same preset test machine, check whether the BMC can correctly distinguish the injected IERR error from the non-IERR error, and make a correct fault analysis.
Optionally, as an embodiment of the present invention, the method 100 further includes step 150, where the remote terminal management step: for managing each remote terminal.
In order to facilitate understanding of the present invention, the method for testing the BMC fault diagnosis function based on the remote XDP function provided by the present invention is further described below with reference to the principle of the method for testing the BMC fault diagnosis function based on the remote XDP function of the present invention, in combination with the process of performing the test fault diagnosis based on the BMC remote XDP function simulation complex injection fault scenario in the embodiment.
Specifically, the method for testing the fault diagnosis function of the BMC based on the remote XDP function includes:
1. configuring a remote terminal environment
Specifically, in this embodiment, 3 remote terminals are prepared in advance: remote terminal a, remote terminal B, and remote terminal C.
The test tools (for openIPC software) provided by Intel are respectively installed for the 3 remote terminals, specifically, in this embodiment, the following are installed: installvpt. Oe. Atscale.1.2.1947.12196 (with the suffix number in version).
2. Inspecting a test environment
(1) And checking the configuration of the tester to ensure that the tester can work normally.
The devices of the tester are checked, the existence of devices such as a CPU, a memory, PCIE and the like in the tester is ensured, and errors can be conveniently noted for different devices of the tester during testing.
And checking the test environment to ensure that the BMC of the test machine can work normally and obtain the BMC IP address of the test machine.
Whether the Remote XDP cap-jumping exists in the testing machine (namely the server to be tested) is checked, and the testing machine is ensured to be in an enabling state.
(2) And configuring files of each Remote terminal connection tester Remote XDP.
(3) And using an IPMI command to start the BMC remotedDebugServer service of each remote terminal.
(4) And simultaneously connecting the Remote terminal A, the Remote terminal B and the Remote terminal C with the Remote XDP of the tester.
3. Verifying BMC failure resolution function
The part adopts a complex scene to annotate errors and verifies the fault analysis function of the BMC.
Specifically, by using the characteristic of remote, each remote terminal is opened, multiple error types are triggered at the same time, and the BMC fault analysis function is verified. The specific verification steps comprise:
step S1: and simultaneously injecting the same IERR error into the device of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze the corresponding fault analysis information.
The preset device of the tester in step S1 may be any one of a CPU, a memory, and a PCIE of the tester, for example, the preset device is set as a CPU of the tester in this embodiment. In specific implementation, a person skilled in the art may replace the CPU of the tester with the memory of the tester or the PCIE.
Specifically, in this embodiment, when this step S1 is implemented, it is checked whether the BMC of the test machine can resolve the fault resolution information corresponding to the first IERR error for the CPU of the test machine by using the remote terminal a, the remote terminal B, and the remote terminal C to simultaneously inject the same IERR error (hereinafter, referred to as "first IERR error") to the CPU of the test machine. If the check result is that the BMC can resolve the corresponding fault resolution information, the test of step S1 passes, otherwise, the entire test fails.
Step S2: and simultaneously injecting different IERR errors into the devices of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information.
Specifically, the remote terminal a, the remote terminal B and the remote terminal C are adopted to simultaneously inject different IERR errors into preset devices of a tester of the tester, and check whether the BMC can analyze corresponding fault analysis information. If the check result is that the BMC can resolve the corresponding fault resolution information, the test of step S2 passes, otherwise, the entire test fails.
For example, in step S2, the IERR errors injected by the remote terminal a, the remote terminal B, and the remote terminal C to each relevant device of the tester are an IERR error 1, an IERR error 2, and an IERR error 3 in sequence, and the IERR error 1, the IERR error 2, and the IERR error 3 are different (i.e., all different).
In addition, similar to step S1, the device of the tester preset in step S2 may be any one of a CPU, a memory, and a PCIE of the tester, and is set as the memory of the tester in this embodiment. In specific implementation, a person skilled in the art may replace the memory of the tester at that location with the CPU or PCIE of the tester.
And step S3: and simultaneously injecting IERR errors into the devices of at least two preset testers by adopting each remote terminal, and checking whether the BMC can analyze correct fault analysis information.
For example, in this embodiment, the at least two preset devices of the tester are the CPU and the PCIE of the tester, and when the specific implementation is implemented, the CPU and the PCIE of the tester may be integrally replaced by the CPU, the memory, and the PCIE of the tester, or may be replaced by a combination of any other related devices of the tester.
In the implementation, the remote terminal a, the remote terminal B and the remote terminal C are adopted to simultaneously inject the IERR error into the CPU and the PCIE of the test machine, wherein the IERR error is respectively injected into the CPU and the PCIE of the test machine by the remote terminal a, the IERR error is respectively injected into the CPU and the PCIE of the test machine by the remote terminal B, and the IERR error is respectively injected into the CPU and the PCIE of the test machine by the remote terminal C, and after the injection of the IERR error is completed, whether the BMC of the test machine can analyze correct fault analysis information is checked, if the IERR error can be analyzed, the test in the step S3 is passed, otherwise, the whole test fails.
It should be noted that, in this embodiment, the IERR errors injected into the CPU of the tester and the PCIE of the tester by using the remote terminal a are different, the IERR errors injected into the CPU of the tester and the PCIE of the tester by using the remote terminal B are different, and the IERR errors injected into the CPU of the tester and the PCIE of the tester by using the remote terminal C are different.
And step S4: and simultaneously injecting IERR errors and non-IERR errors into the devices of the same preset testing machine by adopting each remote terminal, checking whether the BMC can correctly distinguish the injected IERR errors and non-IERR errors, and performing correct fault analysis.
The preset device of the tester in step S4 may be any one of a CPU, a memory, and a PCIE of the tester, and in the specific implementation, the preset device may be selectively set by a person skilled in the art, for example, the preset device is a PCIE of the tester in this embodiment (the PCIE may be modified by the person skilled in the art according to an actual situation, for example, the preset device may be modified into the CPU or the memory of the tester).
When the step S4 is specifically implemented, the remote terminal a, the remote terminal B, and the remote terminal C are used to simultaneously inject an IERR error and a non-IERR error into the PCIE of the test machine (where the steps include that the remote terminal a is used to inject an IERR error and a non-IERR error into the PCIE of the test machine, the remote terminal B is used to inject an IERR error and a non-IERR error into the PCIE of the test machine, and the remote terminal C is used to inject an IERR error and a non-IERR error into the PCIE of the test machine), check whether the BMC can correctly distinguish the IERR error and the non-IERR error injected by the test machine, and check whether the BMC can perform correct failure analysis. If the check result is that the BMC can correctly distinguish the injected IERR error from the non-IERR error and make a correct fault analysis, the entire test is successful (i.e., the BMC fault diagnosis test of the test machine passes), otherwise the entire test fails (i.e., the BMC fault diagnosis test of the test machine fails).
Further, to facilitate the management of each remote terminal, the method 100 further includes a remote terminal management step: for managing each remote terminal. During specific implementation, a single management terminal can be used for performing addition, deletion, modification and query management on each remote terminal before the functions of configuring the remote terminal environment, checking the test environment and verifying the fault analysis of the BMC are performed.
Fig. 2 is a diagram illustrating an embodiment of a system for testing a BMC fault diagnosis function based on a remote XDP function according to the present invention. The system is based on a group of remote terminals and a testing machine, wherein each remote terminal opens a remote expansion debugging port of the BMC, and each remote terminal is connected with a remote expansion debugging port of the testing machine.
As shown in fig. 2, the system 200 includes:
a first fault diagnosis module 201, configured to inject the same IERR error to a device of the same preset test machine at the same time by using each remote terminal, and check whether the BMC can resolve corresponding fault resolution information;
a second fault diagnosis module 202, configured to inject different IERR errors to a device of the same preset test machine at the same time by using each remote terminal, and check whether the BMC can resolve corresponding fault resolution information;
a third fault diagnosis module 203, configured to inject an IERR error into devices of at least two preset test machines at the same time by using each remote terminal, and check whether the BMC can resolve correct fault resolution information;
the fourth fault diagnosis module 204 is configured to inject an IERR error and a non-IERR error into a device of the same preset test machine at the same time by using each remote terminal, check whether the BMC can correctly distinguish the injected IERR error from the non-IERR error, and perform correct fault analysis.
Optionally, as an embodiment of the present invention, as shown in fig. 3, the system 200 further includes:
the remote terminal management module 205: for managing each remote terminal. In specific implementation, the remote terminal management module can be implemented by adopting a single management terminal.
Optionally, as an embodiment of the present invention, as shown in fig. 3, the system 200 further includes:
a first modifying module 206 is used to modify the devices of the predetermined tester involved in the first fault diagnosing module 201.
Optionally, as an embodiment of the present invention, as shown in fig. 3, the system 200 further includes:
a second modification module 207 for modifying the devices of the predetermined tester involved in the second fault diagnosis module 202.
Optionally, as an embodiment of the present invention, as shown in fig. 3, the system 200 further includes:
a third modifying module 208 for modifying the devices of each of the predetermined testers involved in the third fault diagnosing module 203.
Optionally, as an embodiment of the present invention, as shown in fig. 3, the system 200 further includes:
a fourth modification module 209 is used to modify the devices of the predetermined tester involved in the fourth fault diagnosis module 204.
Optionally, as an embodiment of the present invention, the device of the tester includes a CPU, a memory, and a PCIE.
The same and similar parts in the various embodiments in this specification may be referred to each other. In particular, for the system embodiment, since it is substantially similar to the method embodiment, the description is simple, and the relevant points can be referred to the description in the method embodiment.
The invention utilizes the function of the BMC remote XDP of the plurality of remote terminals to remotely connect the remote XDP of the tester, breaks through the limit of the test environment, is more convenient, and simultaneously utilizes the characteristic that the XDP supports multithreading to remotely open the plurality of remote terminals for IERR error injection, so that the error occurrence time is in the same time period, more complex scenes are simulated, and the function of BMC fault diagnosis is deeply tested.
Although the present invention has been described in detail in connection with the preferred embodiments with reference to the accompanying drawings, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (10)

1. A method for testing fault diagnosis function of BMC based on remote XDP function is characterized in that the method is based on a group of remote terminals and a tester, each remote terminal opens a remote extension debugging port of BMC, and each remote terminal is connected with a remote extension debugging port of the tester; the method comprises the following steps:
injecting the same IERR errors into the devices of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information;
injecting different IERR errors into the devices of the same preset testing machine by adopting each remote terminal, and checking whether the BMC can analyze corresponding fault analysis information;
adopting each remote terminal to simultaneously inject IERR errors into the devices of at least two preset testing machines, and checking whether the BMC can analyze correct fault analysis information;
and simultaneously injecting IERR errors and non-IERR errors into the devices of the same preset testing machine by adopting each remote terminal, checking whether the BMC can correctly distinguish the injected IERR errors from the non-IERR errors and performing correct fault analysis.
2. The method for testing the BMC fault diagnosis function based on the remote XDP function as claimed in claim 1, wherein the method further comprises a remote terminal management step of: for managing each remote terminal.
3. The method for testing fault diagnosis function of BMC based on remote XDP function as claimed in claim 1, wherein the devices of the tester include CPU, memory and PCIE.
4. A system for testing fault diagnosis function of BMC based on remote XDP function is characterized in that the system is based on a group of remote terminals and a testing machine, wherein each remote terminal opens a remote extended debugging port of BMC, and is connected with the remote extended debugging port of the testing machine; the system comprises:
the first fault diagnosis module is used for adopting each remote terminal to simultaneously inject the same IERR error into the device of the same preset testing machine and checking whether the BMC can analyze the corresponding fault analysis information;
the second fault diagnosis module is used for adopting each remote terminal to simultaneously inject different IERR errors into the device of the same preset testing machine and checking whether the BMC can analyze corresponding fault analysis information;
the third fault diagnosis module is used for adopting each remote terminal to simultaneously inject IERR errors into the devices of at least two preset test machines and checking whether the BMC can analyze correct fault analysis information;
and the fourth fault diagnosis module is used for adopting each remote terminal to simultaneously inject IERR errors and non-IERR errors into the device of the same preset testing machine, checking whether the BMC can correctly distinguish the injected IERR errors from the non-IERR errors and making correct fault analysis.
5. The system for testing fault diagnosis of BMC based on remote XDP function as claimed in claim 4, further comprising a remote terminal management module: for managing each remote terminal.
6. The system for testing fault diagnosis function of BMC based on remote XDP function as claimed in claim 4, further comprising:
and the first modification module is used for modifying the preset testing machine component related in the first fault diagnosis module.
7. The system for testing fault diagnosis function of BMC based on remote XDP function as claimed in claim 4, further comprising:
and the second modification module is used for modifying the preset devices of the testing machine related in the second fault diagnosis module.
8. The system for testing the fault diagnosis function of the BMC based on the remote XDP function as claimed in claim 4, further comprising:
and the third modification module is used for modifying the devices of the preset testing machines related in the third fault diagnosis module.
9. The system for testing the fault diagnosis function of the BMC based on the remote XDP function as claimed in claim 4, further comprising:
and the fourth modification module is used for modifying the preset devices of the testing machine related in the fourth fault diagnosis module.
10. The system for testing fault diagnosis function of BMC based on remote XDP function of claim 4, wherein the devices of the tester include CPU, memory and PCIE.
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